Defective Chip Screening Method, System, Device and Storage Medium

Abstract

The present invention discloses a method, system, device and storage medium for screening defective chips. The method for screening defective chips includes: when the set-top box is in a high-load working state, obtaining a first program load rate of the chips in the set-top box; obtaining a second program load rate of the chips in the set-top box according to the first program load rate and a preset load stability threshold; obtaining a load rate difference according to the first program load rate and the second program load rate; within a preset time period, taking the second program load rate as a new first program load rate and repeatedly executing the steps of obtaining the second program load rate and subsequent steps for multiple times to obtain multiple load rate differences; screening out defective chips according to multiple load rate differences. The present invention screens defective chips through the number of times the load rate of the chips is continuously stable under high temperature and high load conditions, achieving the effect of quickly screening defective chips.

Description

Technical Field

[0001] The present invention relates to the technical field of set-top box chip testing, and in particular to a defective chip screening method, system, device and storage medium. Background Art

[0002] During the set-top box production process, due to environmental or human factors, the set-top box mainboard parts may be defective or the set-top box welding may be loose, resulting in the production of set-top boxes with process defects. Set-top boxes with process defects will reduce the yield rate of the production line.

[0003] Nowadays, people often screen out set-top boxes with chips with process defects by loading high-load subroutines and continuously running complex calculations to keep the CPU (central processing unit) in a high-load working state. However, although this screening method can increase the CPU temperature in a short period of time and allow the test to enter the state quickly, it can only be used on the Linux (GNU / Linux, an operating system) platform and cannot be adjusted adaptively. The size of the allocated memory can only be adjusted manually by engineers, which greatly wastes development resources.

[0004] In summary, how to quickly screen out defective chips without restricting the use of the platform is a technical problem that needs to be solved urgently in this field. Summary of the invention

[0005] The main purpose of the present invention is to provide a method, system, device and storage medium for screening defective chips, aiming to quickly screen out defective chips without limiting the use of the platform.

[0006] To achieve the above object, the present invention provides a defective chip screening method, which is applied to screen defective chips for set-top boxes. The defective chip screening method comprises:

[0007] When the set-top box is in a high-load working state, obtaining a first program load rate of a chip in the set-top box;

[0008] Acquire a second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold;

[0009] Obtaining a load rate difference according to the first program load rate and the second program load rate;

[0010] Within a preset time period, the second program load rate is used as a new first program load rate to repeatedly perform the step of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold and subsequent steps to obtain a plurality of load rate differences;

[0011] Screen out defective chips based on multiple of the load rate differences.

[0012] Optionally, before the step of obtaining the first program load rate of the chips in the set-top box when the set-top box is in a high-load working state, the defective chip screening method further includes:

[0013] Control the set-top box to run multiple programs to make the set-top box in a high-load working state.

[0014] Optionally, the step of obtaining the second program load rate of the chips in the set-top box according to the first program load rate and a preset load stability threshold includes:

[0015] When the first program load rate is less than the preset load stability threshold, increase the number of programs run by the chip to obtain the second program load rate of the chips in the set-top box;

[0016] When the first program load rate is greater than the load stability threshold, reduce the number of programs run by the chip to obtain the second program load rate;

[0017] When the first program load rate is equal to the load stability threshold, use the first program load rate as the second program load rate.

[0018] Optionally, the step of screening out defective chips based on multiple of the load rate differences includes:

[0019] Calculate the consecutive stability times of the chip according to multiple of the load rate differences;

[0020] Screen out defective chips according to the consecutive stability times.

[0021] Optionally, the step of screening out defective chips according to the consecutive stability times includes:

[0022] If the consecutive stability times are greater than or equal to a preset number stability threshold and the set-top box operates normally during the time period, determine that the chip is in a stable state and is a qualified chip;

[0023] If the consecutive stability times are less than the number stability threshold, or the set-top box malfunctions during the time period, determine that the chip is a defective chip.

[0024] Optionally, after the step of determining that the chip is in a stable state and is a qualified chip, the defective chip screening method further includes:

[0025] Record the program parameters when the qualified chip is in a stable state as the optimal load parameters, and determine whether other chips are defective according to the optimal load parameters.

[0026] Optionally, the method further includes:

[0027] Control the set-top box to execute a playback task, and obtain the performance metrics of the set-top box when executing the playback task;

[0028] Judge whether the playback state of the chip in the set-top box is qualified under high-temperature and high-load conditions according to the performance metrics.

[0029] In addition, to achieve the above object, the present invention also provides a defective chip screening system, and the defective chip screening system includes:

[0030] A first acquisition module, configured to acquire the first program load rate of the chip in the set-top box when the set-top box is in a high-load working state;

[0031] A second acquisition module, configured to acquire the second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold;

[0032] A difference calculation module, configured to obtain a load rate difference according to the first program load rate and the second program load rate;

[0033] A repeated adjustment module, configured to, within a preset time period, use the second program load rate as the new first program load rate to repeatedly execute the step of acquiring the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps to obtain multiple load rate differences;

[0034] A defective chip screening module, configured to screen out defective chips according to multiple load rate differences.

[0035] In addition, to achieve the above object, the present invention also provides a defective chip screening device, and the defective chip screening device includes: a memory, a processor, and a defective chip screening program stored on the memory and executable on the processor. When the defective chip screening program is executed by the processor, the steps of the defective chip screening method described above are implemented.

[0036] In addition, to achieve the above object, the present invention also provides a storage medium, characterized in that a defective chip screening program is stored on the storage medium, and when the defective chip screening program is executed by a processor, the steps of the defective chip screening method described above are implemented.

[0037] A method, system, device, and storage medium for screening defective chips provided by the present invention. The method for screening defective chips is applied to a set-top box. The method for screening defective chips includes: when the set-top box is in a high-load working state, obtaining a first program load rate of the chips in the set-top box; obtaining a second program load rate of the chips in the set-top box according to the first program load rate and a preset load stability threshold; obtaining a load rate difference according to the first program load rate and the second program load rate;

[0038] Within a preset time period, using the second program load rate as the new first program load rate to repeatedly execute the steps of obtaining the second program load rate of the chips in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps for multiple times to obtain multiple load rate differences; screening out defective chips according to the multiple load rate differences.

[0039] The present invention first obtains the program load rate of the chips in the set-top box in a high-load working state as the first program load rate, then obtains the second program load rate according to the first program load rate and a pre-set load stability threshold, then calculates the difference between the two program load rates as the load rate difference according to the first program load rate and the second program load rate. Within a preset time period, using the second program load rate as the new first program load rate to repeatedly execute the steps of obtaining the second program load rate of the chips in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps to obtain multiple load rate differences, and finally screening out defective chips according to the multiple load rate differences.

[0040] Compared with the traditional method of screening defective chips by loading high-load subroutines to make the set-top box enter a high-load working state, the present invention not only solves the problem of platform limitation of the traditional solution, but also can quickly screen out defective chips on the premise of reducing the repetitive workload of research and development by automatically adjusting the program load rate of the chips in the set-top box and then judging whether the chips are defective according to the multiple load rate differences obtained by adjusting the program load rate multiple times. Description of the Drawings

[0041] Figure 1 It is a schematic diagram of the device structure of the device hardware operating environment related to the solution of the embodiment of the present invention;

[0042] Figure 2 It is a schematic diagram of the implementation process of an embodiment of the method for screening defective chips of the present invention;

[0043] Figure 3 It is a schematic diagram of the defective chip judgment process of an embodiment of the method for screening defective chips of the present invention;

[0044] Figure 4Schematic diagram of the LED lamp flashing process for an embodiment of the defective chip screening method of the present invention;

[0045] Figure 5 Schematic diagram of the process for determining whether the burn-in test is successful for an embodiment of the defective chip screening method of the present invention; Figure 6 Functional module diagram for an embodiment of the defective chip screening method of the present invention.

[0046] The realization of the object, functional features and advantages of the present invention will be further described in conjunction with the embodiments and with reference to the accompanying drawings. Specific embodiments

[0047] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0048] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0049] It should be noted that all directional indications (such as up, down, left, right, front, back...) in the embodiments of the present invention are only used to explain the relative positional relationship and movement conditions between components in a specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indications will also change accordingly.

[0050] In the present invention, unless otherwise clearly defined and limited, terms such as "connection" and "fixation" should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the internal communication of two components or the interaction relationship between two components, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0051] In addition, in the present invention, descriptions such as "first" and "second" are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between various embodiments can be combined with each other, but it must be based on the fact that those of ordinary skill in the art can implement it. When the combination of technical solutions appears to be contradictory or unable to be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the protection scope required by the present invention.

[0052] As Figure 1 shown, Figure 1 is a schematic diagram of the device structure of the hardware operating environment of the defective chip screening device involved in the embodiment of the present invention.

[0053] As Figure 1 shown, in the hardware operating environment of the defective chip screening device, the device may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, and a communication bus 1002. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display) and an input unit such as a keyboard (Keyboard). Optionally, the user interface 1003 may further include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a WI-FI interface). The memory 1005 may be a high-speed RAM memory or a stable memory (non-volatile memory), such as a disk memory. Optionally, the memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0054] Those skilled in the art can understand that Figure 1 the structure of the defective chip screening device shown in

[0055] As Figure 1 shown, in the memory 1005 as a computer storage medium, there may be included an operating system, a network communication module, a user interface module, and a defective chip screening program.

[0056] In Figure 1 the device shown, the network interface 1004 is mainly used to connect to the background server and perform data communication with the background server; the user interface 1003 is mainly used to connect to the client (user side) and perform data communication with the client; and the processor 1001 may be used to call the defective chip screening program stored in the memory 1005 and perform the following operations:

[0057] When the set-top box is in a high-load working state, obtain the first program load rate of the chips in the set-top box;

[0058] Obtain the second program load rate of the chips in the set-top box according to the first program load rate and a preset load stability threshold;

[0059] Obtain a load rate difference according to the first program load rate and the second program load rate;

[0060] Within a preset time period, use the second program load rate as the new first program load rate to repeatedly execute the step of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps for multiple times to obtain multiple load rate differences;

[0061] Screen out defective chips based on multiple load rate differences.

[0062] Optionally, the processor 1001 may be used to call the defective chip screening program stored in the memory 1005 and perform the following operations:

[0063] Control the set-top box to run multiple programs to make the set-top box in a high-load working state.

[0064] Optionally, the processor 1001 may be used to call the defective chip screening program stored in the memory 1005 and perform the following operations:

[0065] When the first program load rate is less than the preset load stability threshold, increase the number of programs run by the chip to obtain the second program load rate of the chip in the set-top box;

[0066] When the first program load rate is greater than the load stability threshold, reduce the number of programs run by the chip to obtain the second program load rate;

[0067] When the first program load rate is equal to the load stability threshold, use the first program load rate as the second program load rate.

[0068] Optionally, the processor 1001 may be used to call the defective chip screening program stored in the memory 1005 and perform the following operations:

[0069] Calculate the continuous stability times of the chip based on multiple load rate differences;

[0070] Screen out defective chips based on the continuous stability times.

[0071] Optionally, the processor 1001 may be used to call the defective chip screening program stored in the memory 1005 and perform the following operations:

[0072] If the continuous stability times are greater than or equal to the preset times stability threshold and the set-top box operates normally within the time period, determine that the chip is in a stable state and is a qualified chip;

[0073] If the continuous stability times are less than the times stability threshold, or the set-top box malfunctions within the time period, determine that the chip is a defective chip.

[0074] Optionally, the processor 1001 may be used to call a defective chip screening program stored in the memory 1005, and perform the following operations:

[0075] The program parameters when the qualified chip is in a stable state are recorded as the optimal load parameters, and whether other chips are defective products is determined based on the optimal load parameters.

[0076] Optionally, the processor 1001 may be used to call a defective chip screening program stored in the memory 1005, and perform the following operations:

[0077] Controlling the set-top box to execute a playback task, and obtaining a performance indicator of the set-top box when executing the playback task;

[0078] Whether the playing state of the chip in the set-top box is qualified under high temperature and high load conditions is determined according to the performance index.

[0079] Based on the above hardware structure, the overall concept of each embodiment of the defective chip screening method of the present invention is proposed.

[0080] In the embodiment of the present invention, during the set-top box production process, due to environmental or human factors, it is easy for the set-top box mainboard parts to be defective, the set-top box welding to be loose, etc., resulting in the production of set-top boxes with process defects, and the set-top boxes with process defects will reduce the yield rate of the production line.

[0081] Nowadays, people often screen out set-top boxes with chips with process defects by loading high-load subroutines and continuously running complex calculations to keep the CPU in a high-load working state. However, although this screening method can increase the CPU temperature in a short period of time and allow the test to enter the state quickly, it can only be used on the Linux platform and cannot be adjusted adaptively. The size of the allocated memory can only be adjusted manually by engineers, which greatly wastes development resources.

[0082] In summary, how to quickly screen out defective chips without restricting the use of the platform is a technical problem that needs to be solved urgently in this field.

[0083] In view of the above problems, the present invention provides a method, a system, a device and a storage medium for screening defective chips. The method for screening defective chips is applied to screening defective chips for a set-top box, and the method for screening defective chips includes: when the set-top box is in a high-load working state, obtaining a first program load rate of the chips in the set-top box; obtaining a second program load rate of the chips in the set-top box according to the first program load rate and a preset load stability threshold; obtaining a load rate difference according to the first program load rate and the second program load rate; within a preset time period, taking the second program load rate as a new first program load rate to repeatedly execute the step of obtaining the second program load rate of the chips in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps for multiple times to obtain multiple load rate differences; and screening out defective chips according to the multiple load rate differences.

[0084] The present invention first obtains the program load rate of the chips in the set-top box in a high-load working state as the first program load rate, then obtains the second program load rate according to the first program load rate and a preset load stability threshold, and then calculates the difference between the two program load rates as the load rate difference according to the first program load rate and the second program load rate. Within a preset time period, taking the second program load rate as a new first program load rate to repeatedly execute the step of obtaining the second program load rate of the chips in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps to obtain multiple load rate differences, and finally screening out defective chips according to the multiple load rate differences.

[0085] Compared with the traditional method of loading high-load subroutines to make the set-top box enter a high-load working state and then screening defective chips, the present invention automatically adjusts the program load rate of the chips in the set-top box, and then judges whether the chips are defective by the multiple load rate differences obtained by adjusting the program load rate multiple times. This method not only solves the problem of platform limitation in the traditional solution, but also can quickly screen out defective chips on the premise of reducing the repeated workload of research and development.

[0086] Based on the overall concept of the method for screening defective chips of the present invention, various embodiments of the method for screening defective chips of the present invention are proposed.

[0087] Please refer to Figure 2 , Figure 2 which is a schematic flowchart of the first embodiment of the method for screening defective chips of the present invention. It should be noted that although the logical order is shown in the flowchart, in some cases, of course, the steps of the method for screening defective chips of the present invention can be executed in a different order from here.

[0088] In addition, in this embodiment, the execution subject of the defective chip screening method of this application can be the set-top box itself, or the execution subject of the defective chip screening method of this application can also be the data processing terminal integrated and assembled inside the set-top box of this application or the terminal device externally connected to the set-top box. For the convenience of description and reading comprehension, in the following, the terminal device for controlling or managing the set-top box is used as the execution subject to describe the embodiments of the defective chip screening method of this application.

[0089] In this embodiment, the defective chip screening method of the present invention is applied to the above-mentioned defective chip screening device. In this embodiment, the defective chip screening method of the present invention includes:

[0090] Step S10: When the set-top box is in a high-load working state, obtain the first program load rate of the chips in the set-top box;

[0091] In this embodiment, after setting the set-top box to the burn-in mode, the set-top box is in a high-load working state, and the terminal device will obtain the first program load rate of the chips set inside the set-top box.

[0092] Step S20: Obtain the second program load rate of the chips in the set-top box according to the first program load rate and a preset load stability threshold;

[0093] In this embodiment, after the terminal device obtains the first program load rate of the chips, the terminal device then compares the obtained first program load rate with the preset load stability threshold, and adjusts the first program load rate so that the first program load rate is close to the load stability threshold, thereby obtaining the second program load rate of the chips in the set-top box.

[0094] It should be noted that making the first program load rate close to the load stability threshold means reducing the absolute value of the difference between the first program load rate and the load stability threshold. It should be understood that the load stability threshold can be a value determined according to actual needs, or a value range determined according to actual needs.

[0095] Step S30: Obtain a load rate difference according to the first program load rate and the second program load rate;

[0096] In this embodiment, after the terminal device obtains the first program load rate and the second program load rate, the terminal device then calculates the load rate difference between the two load rates according to the first program load rate and the second program load rate.

[0097] Step S40: Within a preset time period, use the second program load rate as the new first program load rate to repeatedly execute the step of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps for multiple cycles, so as to obtain multiple load rate differences;

[0098] In this embodiment, the terminal device uses the obtained second program load rate as the new first program load rate within a preset time period, and repeatedly executes the step of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and the load stability threshold, and the step of obtaining the load rate difference according to the first program load rate and the second program load rate, calculates a new load rate difference based on the program load rate of each cycle, and within this time period, multiple load rate differences can be obtained.

[0099] Step S50: Screen out defective chips according to multiple load rate differences.

[0100] In this embodiment, the terminal device adjusts the program load rate multiple times through the set-top box within a preset time period, thereby obtaining multiple load rate differences, and then screens out defective chips according to the multiple load rate differences.

[0101] Exemplarily, after the set-top box enters the burn-in mode and is in a high-load working state, assuming the first program load rate is 70%, the load stability threshold is 75%, and the preset time period is 4 hours, the terminal device first obtains the first program load rate of 70% of the chip, then compares the first program load rate of 70% with the load stability threshold of 75%, and then obtains the second program load rate according to the first program load rate of 70% and the load stability threshold of 75%. Assuming the second program load rate is 73%, then calculates the load rate difference between the two program load rates as 3% through the second program load rate of 73% and the first program load rate of 70% before adjustment. Then the terminal device uses the second program load rate of 73% as the new first program load rate, and repeatedly executes the step of obtaining the second program load rate according to the first program load rate and the load stability threshold, and the step of obtaining the load rate difference according to the first program load rate and the second program load rate within 4 hours for multiple cycles, obtains multiple load rate differences, and then determines whether the chip is a defective chip through the multiple load rate differences.

[0102] In this embodiment, the present invention obtains the first program load rate of the chip, then obtains the second program load rate according to the first program load rate and the load stability threshold, calculates the load rate difference through the first program load rate and the second program load rate, and uses the second program load rate as the new first program load rate to repeatedly execute the steps of obtaining the second program load rate and obtaining the load rate difference in a preset time period, obtaining multiple load rate differences, and then screening out defective chips through the multiple load rate differences, achieving the effect of quickly screening defective chips in the set-top box without restricting the usage platform.

[0103] Further, based on the first embodiment of the defective chip screening method of the present invention, a second embodiment of the defective chip screening method of the present invention is proposed.

[0104] In this embodiment, the above step S20: obtaining the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold includes:

[0105] Step S201: When the first program load rate is less than the preset load stability threshold, increase the number of programs running on the chip to obtain the second program load rate of the chip in the set-top box;

[0106] In this embodiment, after the terminal device obtains the first program load rate, the terminal device compares the first program load rate with the load stability threshold. If the first program load rate is less than the load stability threshold, the terminal device will control the set-top box to increase the number of programs running on the chip in the set-top box, and record the program load rate after increasing the number of programs as the second program load rate of the chip.

[0107] Step S202: When the first program load rate is greater than the load stability threshold, reduce the number of programs running on the chip to obtain the second program load rate;

[0108] In this embodiment, after the terminal device obtains the first program load rate, the terminal device compares the first program load rate with the load stability threshold. If the first program load rate is greater than the load stability threshold, the terminal device controls the set-top box to reduce the number of programs running on the chip in the set-top box, and records the program load rate after reducing the number of programs as the second program load rate.

[0109] It should be noted that increasing or decreasing the number of programs can be directly increasing or decreasing the number of programs, or increasing or decreasing the number of programs running per unit time through other technologies such as delaying.

[0110] Step S203: When the first program load rate is equal to the load stability threshold, use the first program load rate as the second program load rate.

[0111] In this embodiment, after the terminal device obtains the first program load rate, the terminal device compares the first program load rate with the load stability threshold. If the first program load rate is equal to the load stability threshold, the terminal device uses the first program load rate as the second program load rate.

[0112] Exemplarily, when the first program load rate is 70% and the load stability threshold is 75%, after the terminal device obtains the first program load rate, it compares the first program load rate of 70% with the load stability threshold of 75%, and gets the result that the first program load rate is less than the load stability threshold. Then it increases the number of programs running on the chip, and records the program load rate after increasing the number of program runs as the second program load rate; when the first program load rate is 80% and the load stability threshold is 75%, after the terminal device obtains the first program load rate, it compares the first program load rate of 80% with the load stability threshold of 75%, and gets the result that the first program load rate is greater than the load stability threshold. Then it reduces the number of programs running on the chip, and records the program load rate after reducing the number of program runs as the second program load rate; when the first program load rate is 75% and the load stability threshold is 75%, the terminal device does not adjust the number of programs running on the chip, and uses the first program load rate as the second program load rate.

[0113] Optionally, in a feasible embodiment, the above step S50: screening out defective chips according to multiple load rate differences includes:

[0114] Step S501: calculating the consecutive stability times of the chip according to multiple load rate differences;

[0115] In this embodiment, after obtaining multiple load rate differences, the terminal device compares each obtained load rate difference with a preset load rate deviation threshold. If the load rate difference does not exceed the load rate deviation threshold, the chip is in a load stable state. If the chip was also in a load stable state in the adjacent previous adjustment period, the consecutive stability times of the chip is incremented by one.

[0116] Step S502: screening out defective chips according to the consecutive stability times.

[0117] In this embodiment, after obtaining the consecutive stability times of the chip within a preset time period, the terminal device determines whether the chip is a defective chip according to the value of the consecutive stability times of the chip.

[0118] Exemplarily, Figure 3 is the defective chip judgment flowchart of an embodiment of the defective chip screening method of the present invention. In Figure 3In the flowchart for judging defective chips shown, the load stability threshold is a numerical range, and the terminal device can increase the program load rate by reducing the control delay function, or reduce the program load rate by increasing the control delay function. Assume the load rate deviation threshold is 2, that is Figure 3 the load threshold in

[0119] is 2, then the load rate difference should be between -2% and 2%. Assume that among the load rate differences obtained by the terminal device, there are 80 consecutive load rate differences between -2% and 2%. Then the consecutive stability count is 80. Next, judge whether the consecutive stability count of 80 meets the requirement of the consecutive stability count when the chip is qualified. If it meets the requirement, it is a qualified chip; if it does not meet the requirement, it is a defective chip. If the load rate difference of this chip exceeds the load rate deviation threshold, it is judged that the chip is not yet stable at this time, and the consecutive stability count needs to be cleared, or the consecutive stability count is set to 0.

[0120] Step S5021: If the consecutive stability count is greater than or equal to the preset stability count threshold and the set-top box operates normally during this time period, then judge that the chip is in a stable state and is a qualified chip;

[0121] In this embodiment, if the consecutive stability count of the chip load rate calculated by the terminal device is greater than or equal to the preset stability count threshold and the chip operates normally during the test time period, then the terminal device can judge that the chip has reached a stable state and the chip is a qualified chip.

[0122] Step S5022: If the consecutive stability count is less than the stability count threshold, or the set-top box works abnormally during this time period, then judge that the chip is a defective chip.

[0123] In this embodiment, if the consecutive stability count of the chip load rate calculated by the terminal device is less than the stability count threshold, or the chip works abnormally during the test time period, then the terminal device can judge that the chip is a defective chip.

[0124] It should be noted that the abnormal operation of the chip can be that the chip freezes, or other abnormal situations. After the terminal device judges whether the chip is a defective chip, it can prompt the technician whether the chip is a defective chip through the blinking frequency and color of the LED light on the set-top box, or use other distinguishing methods to distinguish whether the chip is a defective chip.

[0125] Exemplarily, Figure 4 is a schematic diagram of the LED light blinking process for an embodiment of the defective chip screening method of the present invention. Figure 5This is a schematic diagram of whether the burn-in test is successful for an embodiment of the defective chip screening method of the present invention. If the number stability threshold is set to 80, when the consecutive stable times of the chip are less than 80 times, the terminal device can determine that the chip is a defective chip, and mark the chip by controlling the LED light to turn off to remind the technician to screen out the chip. When the stable times of the chip are greater than or equal to 80 times and the chip runs normally during the test time period, the set-top box can determine that the chip has reached a stable state and the chip is a qualified chip. Then the terminal device can control the LED light to flash the green light for 100 ms and turn off the light for 100 ms as a cycle, and display words such as "Burn-in test successful" on the display device to remind the technician that the chip is a qualified chip.

[0126] In this embodiment, the present invention realizes the effect of quickly screening defective chips in the set-top box without restricting the use platform by obtaining the program load rate of the chip in the set-top box multiple times within a preset time period, adjusting the program load rate multiple times, then calculating multiple load rate differences based on the program load rates before and after the adjustment, and finally judging whether the chip is a defective chip through the multiple load rate differences.

[0127] Furthermore, based on the first and second embodiments of the defective chip screening method of the present invention, a third embodiment of the defective chip screening method of the present invention is proposed.

[0128] In this embodiment, before step S10: obtaining the first program load rate of the chip in the set-top box when the set-top box is in a high-load working state, the method further includes:

[0129] Step S60: Controlling the set-top box to run multiple programs to make the set-top box in a high-load working state.

[0130] In this embodiment, before the terminal device obtains the first program load rate of the chip in the set-top box, the set-top box will run multiple programs to make the set-top box in a high-load working state.

[0131] Exemplarily, before the terminal device obtains the first program load rate of the chip in the set-top box, the set-top box can continuously run programs such as OSD screen drawing and serial port data printing, making the set-top box in a high-load working state.

[0132] Furthermore, in a feasible embodiment, the defective chip screening method further includes:

[0133] Step S70: Controlling the set-top box to execute a playback task and obtaining the performance index of the set-top box when executing the playback task;

[0134] In this embodiment, after the set-top box enters the burn-in mode, it enters a high-load working state by running multiple program tasks. To obtain the performance indicators of the set-top box under high-load working conditions, the terminal device can control the set-top box to execute a playback task.

[0135] Step S80: Determine whether the playback state of the chip in the set-top box is qualified under high-temperature and high-load conditions according to the performance indicators.

[0136] In this embodiment, after obtaining the performance indicators of the set-top box when it is in a high-temperature and high-load working state and the set-top box is executing a playback task, the terminal device can determine whether the playback state of the chip in the set-top box is qualified according to the performance indicators.

[0137] Exemplarily, the set-top box first enters the burn-in mode and runs multiple program tasks to enter a high-load working state. Then the terminal device controls the set-top box to play programs or videos for 4 hours, and obtains data such as the tuner error rate, whether there are mosaics in the video, and the usage of chip registers when the set-top box is playing programs or videos as the performance indicators of the chip. Then, it is determined whether the playback state of the chip is qualified according to the various performance indicators of the chip under high-temperature and high-load conditions. For example, if the chip to be tested has no abnormal playback situations such as mosaics or stuttering when playing videos under high-temperature and high-load conditions, and there is no crash phenomenon during the 4-hour test period, then the playback state of the chip is qualified.

[0138] In this embodiment, the present invention can obtain the playback state indicators of the chip under high-temperature and high-load conditions by making the set-top box run multiple programs and execute a playback task, and then can assist in determining whether the chip is a defective chip through the playback state indicators.

[0139] Furthermore, based on the first and second embodiments of the defective chip screening method of the present invention described above, a fourth embodiment of the defective chip screening method of the present invention is proposed.

[0140] Further, in a feasible embodiment, after step S5021: Determine that the chip is in a stable state and is a qualified chip, the defective product screening method further includes:

[0141] Step S90: Record the program parameters of the qualified chip in the stable state as the optimal load parameters, and determine whether other chips are defective according to the optimal load parameters.

[0142] In this embodiment, after determining that the chip is in a stable state and is a qualified chip, the terminal device records the program parameters of the qualified chip in the stable state as the optimal load parameters, and tests whether other chips are defective according to the optimal load parameters.

[0143] Exemplarily, assume that when the currently tested chip runs 10 layer drawing tasks and 5 serial port data printing tasks in a unit cycle, it is in a stable state, and it is determined that the chip is a qualified chip through other data. Then, the terminal device takes the 10 layer drawing tasks and 5 serial port data printing tasks as the optimal load parameters, and uses these optimal load parameters to test whether other chips are qualified.

[0144] In this embodiment, the present invention reduces the workload of repetitive work of technicians and improves the chip screening efficiency by saving the optimal load parameters of qualified chips and then using the optimal load parameters to test other chips.

[0145] In addition, an embodiment of the present invention also proposes a defective chip screening system.

[0146] Please refer to Figure 6 , the defective chip screening system of the present invention includes:

[0147] The first acquisition module 10 is used to acquire the first program load rate of the chip in the set-top box when the set-top box is in a high-load working state;

[0148] The second acquisition module 20 is used to acquire the second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold;

[0149] The difference calculation module 30 is used to obtain a load rate difference according to the first program load rate and the second program load rate;

[0150] The repeated adjustment module 40 is used to, within a preset time period, use the second program load rate as the new first program load rate to repeatedly execute the step of acquiring the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps for multiple times to obtain multiple load rate differences;

[0151] The defective chip screening module 50 is used to screen out defective chips according to multiple load rate differences.

[0152] Optionally, the defective chip screening system further includes:

[0153] The program control module is used to control the set-top box to run multiple programs so that the set-top box is in a high-load working state.

[0154] Optionally, the second acquisition module 20 includes:

[0155] The load rate increase unit is used to increase the number of programs run by the chip to obtain the second program load rate of the chip in the set-top box when the first program load rate is less than the preset load stability threshold;

[0156] A load rate reduction unit, configured to reduce the number of programs running on the chip to obtain the second program load rate when the first program load rate is greater than the load stability threshold;

[0157] A load rate unchanged unit, configured to use the first program load rate as the second program load rate when the first program load rate is equal to the load stability threshold.

[0158] Optionally, the defective chip screening module 50 includes:

[0159] A stability times calculation unit, configured to calculate the continuous stability times of the chip according to a plurality of the load rate differences;

[0160] A chip judgment unit, configured to screen out defective chips according to the continuous stability times.

[0161] Optionally, the chip judgment unit includes:

[0162] A chip qualified sub-unit, configured to judge that the chip is in a stable state and is a qualified chip if the continuous stability times is greater than or equal to a preset times stability threshold and the set-top box operates normally during the time period;

[0163] A chip unqualified sub-unit, configured to judge that the chip is a defective chip if the continuous stability times is less than the times stability threshold, or the set-top box malfunctions during the time period.

[0164] Optionally, the defective chip screening system further includes:

[0165] A stability parameter recording module, configured to record the program parameters of the qualified chip in the stable state as the optimal load parameters, and judge whether other chips are defective according to the optimal load parameters.

[0166] Optionally, the defective chip screening system further includes:

[0167] A performance index acquisition module, configured to control the set-top box to execute a playback task, and acquire the performance indexes of the set-top box when executing the playback task;

[0168] An auxiliary judgment module, configured to judge whether the playback state of the chip in the set-top box is qualified under high temperature and high load conditions according to the performance indexes.

[0169] Wherein, the functions of each module in the above defective chip screening system correspond to the steps in the above embodiments of the defective chip screening method, and their functions and implementation processes are not described in detail here.

[0170] In addition, the present invention also provides a storage medium, on which a defective chip screening program is stored. When the defective chip screening program is executed by a processor, the steps of the defective chip screening method of the present invention as described above are implemented.

[0171] The specific embodiments of the storage medium of the present invention are substantially the same as those of the above-mentioned defective chip screening method embodiments, and will not be described in detail here.

Claims

1. A method for screening defective chips, characterized in that, The defective chip screening method is applied to screen defective chips for a set-top box, and the defective chip screening method includes: When the set-top box is in a high-load working state, obtain the first program load rate of the chip in the set-top box; Obtain the second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold. The second program load rate is obtained by adjusting the first program load rate to make the first program load rate close to the load stability threshold; Obtain a load rate difference according to the first program load rate and the second program load rate; Within a preset time period, use the second program load rate as the new first program load rate to repeatedly execute the step of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps to obtain multiple load rate differences; Screen out defective chips according to multiple load rate differences; The step of screening out defective chips according to multiple load rate differences includes: Calculate the continuous stability times of the chip according to multiple load rate differences. The continuous stability times are calculated based on comparing each load rate difference with a preset load rate deviation threshold. If the load rate difference does not exceed the load rate deviation threshold, it is determined that the chip is in a load stable state. If the chip was also in a load stable state in the adjacent previous adjustment cycle, add one to the continuous stability times of the chip; Screen out defective chips according to the continuous stability times; 2. The method for screening defective chips as claimed in claim 1, wherein Before the step of obtaining the first program load rate of the chip in the set-top box when the set-top box is in a high-load working state, the method further includes: Control the set-top box to run multiple programs to make the set-top box in a high-load working state; 3. The defective chip screening method according to claim 1, wherein The step of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold includes: When the first program load rate is less than the preset load stability threshold, increase the number of programs running on the chip to obtain the second program load rate of the chip in the set-top box; When the first program load rate is greater than the load stability threshold, reduce the number of programs running on the chip to obtain the second program load rate; When the first program load rate is equal to the load stability threshold, use the first program load rate as the second program load rate; 4. The defective chip screening method according to claim 1, wherein The step of screening out defective chips according to the continuous stability times includes: If the continuous stability times are greater than or equal to a preset number stability threshold and the set-top box runs normally within the time period, determine that the chip is in a stable state and is a qualified chip; If the continuous stability times are less than the number stability threshold, or the set-top box works abnormally within the time period, determine that the chip is a defective chip; 5. The method for screening defective chips according to claim 4, characterized in that After the step of determining that the chip is in a stable state and is a qualified chip, the defective chip screening method further includes: Record the program parameters when the qualified chip is in a stable state as the optimal load parameters, and determine whether other chips are defective according to the optimal load parameters.

6. The defective chip screening method according to claim 1, wherein, The method further includes: Controlling the set-top box to execute a playback task, and obtaining performance metrics of the set-top box when executing the playback task; Judging whether the playback state of the chip in the set-top box is qualified under high-temperature and high-load conditions according to the performance metrics.

7. A defective chip screening system, characterized in that, The defective chip screening system includes: A first acquisition module, configured to obtain a first program load rate of the chip in the set-top box when the set-top box is in a high-load working state; A second acquisition module, configured to obtain a second program load rate of the chip in the set-top box according to the first program load rate and a preset load stability threshold, where the second program load rate is obtained by adjusting the first program load rate to make the first program load rate close to the load stability threshold; A difference calculation module, configured to obtain a load rate difference according to the first program load rate and the second program load rate; A repeated adjustment module, configured to, within a preset time period, use the second program load rate as the new first program load rate to repeatedly execute the steps of obtaining the second program load rate of the chip in the set-top box according to the first program load rate and the preset load stability threshold and subsequent steps for multiple times to obtain multiple load rate differences; A defective chip screening module, configured to screen out defective chips according to multiple load rate differences; The defective chip screening module is further configured to: Calculate the consecutive stability times of the chip according to multiple load rate differences. The consecutive stability times are calculated based on comparing each load rate difference with a preset load rate deviation threshold. If the load rate difference does not exceed the load rate deviation threshold, the chip is in a load stable state. If the chip was also in a load stable state in the previous adjacent adjustment cycle, the consecutive stability times of the chip are incremented by one; Screen out defective chips according to the consecutive stability times.

8. A defective chip screening device, characterized in that, The defective chip screening device includes: a memory, a processor, and a defective chip screening program stored on the memory and executable on the processor. When the defective chip screening program is executed by the processor, the steps of the defective chip screening method according to any one of claims 1 to 6 are implemented.

9. A storage medium, characterized in that, A defective chip screening program is stored on the storage medium. When the defective chip screening program is executed by the processor, the steps of the defective chip screening method according to any one of claims 1 to 6 are implemented.

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