Lighting method and device of display module, computer device and storage medium

By acquiring and generating the target waveform and verification waveform of the display module, multiple signal channels can be lit up simultaneously, solving the problem of cumbersome steps in the traditional method of frequently switching channels and improving debugging efficiency and speed.

CN116013178BActive Publication Date: 2025-12-09SUZHOU HUAXING YUANCHUANG TECH CO LTD
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Patent Information

Application Number
CN202310073290.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-01-19
Publication Date
2025-12-09
Estimated Expiration
2043-01-19

AI Technical Summary

Technical Problem

When lighting up the display module, the traditional method requires frequently switching oscilloscope channels to observe the waveform, which is cumbersome and results in low debugging efficiency.

Method used

By acquiring target waveforms from multiple target channels, the display module parameters are determined, a verification waveform is generated, and the parameters and waveform information are sent to multiple signal channels of the inspection machine to enable multiple signal channels to simultaneously illuminate the display module.

Benefits of technology

The waveform verification process has been simplified, the efficiency of waveform verification has been improved, the debugging time has been reduced, and operators can observe the verification waveforms of multiple channels at the same time, thus improving the debugging speed.

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Abstract

The application relates to a display module lighting method and device, computer equipment and a storage medium. The method comprises the following steps: obtaining target waveform graphs of multiple target channels; determining display module parameters; generating multiple check waveform graphs based on the display module parameters and the target waveform graphs; simultaneously previewing the multiple check waveform graphs, and sending the display module parameters and waveform information corresponding to the check waveform graphs to multiple signal channels of an inspection machine, so that the multiple signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform graphs. By obtaining the target waveform graphs of the multiple target channels, determining the display module parameters, generating the multiple check waveform graphs based on the display module parameters and the target waveform graphs, and finally simultaneously previewing the multiple check waveform graphs and lighting up the display module, the multiple channels do not need to be frequently switched by an oscilloscope, multiple waveforms can be simultaneously observed, and the efficiency of checking whether the edited waveforms are correct is improved.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of display module, in particular to a display module lighting method and device, computer equipment and storage medium. BACKGROUND

[0002] With the development of display technology, the signal data and the number of channels required for lighting the display module are increasing. When lighting the display module, not only different waveforms need to be edited for different signals, but also it is necessary to check whether the edited waveforms are correct.

[0003] In the traditional technology, an oscilloscope is often used to check whether the edited waveforms are correct. Because the number of channels involved is large, when debugging, the oscilloscope needs to be frequently switched to observe the waveforms, which is tedious. SUMMARY

[0004] Therefore, it is necessary to provide a display module lighting method and device capable of quickly observing waveforms, computer equipment and computer readable storage medium.

[0005] A display module lighting method, the method comprising:

[0006] obtaining target waveform diagrams of a plurality of target channels;

[0007] determining display module parameters, and generating a plurality of check waveform diagrams based on the display module parameters and the target waveform diagrams;

[0008] simultaneously previewing the plurality of check waveform diagrams, and sending the display module parameters and waveform information corresponding to the check waveform diagrams to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform diagrams.

[0009] In one embodiment, simultaneously previewing the plurality of check waveform diagrams, and sending the display module parameters and waveform information corresponding to the check waveform diagrams to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform diagrams, comprises:

[0010] simultaneously previewing the plurality of check waveform diagrams in a plurality of display areas.

[0011] In one embodiment, determining display module parameters, and generating a plurality of check waveform diagrams based on the display module parameters and the target waveform diagrams, comprises:

[0012] determining a waveform model based on the target waveform diagrams;

[0013] The waveform function is calculated based on the display module parameters and the waveform model.

[0014] In one embodiment, multiple verification waveforms are previewed simultaneously, and the display module parameters and the waveform information corresponding to the verification waveforms are sent to multiple signal channels of the inspection machine, so that the multiple signal channels of the inspection machine illuminate the display module based on the display module parameters and the waveform information corresponding to the verification waveforms, including:

[0015] The display module parameters and the waveform function are sent to multiple signal channels of the inspection machine, and the waveform function includes a set of function coordinates.

[0016] In one embodiment, multiple verification waveforms are previewed simultaneously, and the display module parameters and the waveform information corresponding to the verification waveforms are sent to multiple signal channels of the inspection machine. This allows the multiple signal channels of the inspection machine to illuminate the display module based on the display module parameters and the waveform information corresponding to the verification waveforms, including:

[0017] If the display module is working normally, save the waveform function.

[0018] In one embodiment, multiple verification waveforms are previewed simultaneously, and the display module parameters and the waveform information corresponding to the verification waveforms are sent to multiple signal channels of the inspection machine. This allows the multiple signal channels of the inspection machine to illuminate the display module based on the display module parameters and the waveform information corresponding to the verification waveforms, including:

[0019] In the event that the display module is not working properly, compare the verification waveform with the target waveform.

[0020] The verification waveform and the target waveform Figure One If the results are inconsistent, the verification waveform diagram and the waveform model are redefined, and the waveform function is calculated based on the redefined target waveform diagram and the waveform model.

[0021] In one embodiment, when the display module is malfunctioning, comparing the verification waveform with the target waveform includes:

[0022] If the verification waveform diagram is inconsistent with the target waveform diagram, the display module parameters are redefined, and the waveform function is calculated based on the redefined display module parameters.

[0023] A device for lighting up a display module, the device comprising:

[0024] The acquisition module is used to acquire target waveforms from multiple target channels;

[0025] determining a display module parameter, generating a plurality of check waveform graphs based on the display module parameter and the target waveform graph;

[0026] previewing the plurality of check waveform graphs, and sending the display module parameter and waveform information corresponding to the check waveform graphs to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameter and the waveform information corresponding to the check waveform graphs.

[0027] A computer device, comprising a memory and a processor, the memory stores a computer program, and the processor implements the steps of the method of any one of the preceding embodiments when executing the computer program.

[0028] A computer readable storage medium, which stores a computer program, and the computer program implements the steps of the method of any one of the preceding embodiments when executed by a processor.

[0029] The display module lighting method, device, computer device and storage medium described above, by obtaining target waveform graphs of a plurality of target channels, determining a display module parameter, generating a plurality of check waveform graphs based on the display module parameter and the target waveform graphs, and finally previewing the plurality of check waveform graphs and sending the display module parameter and waveform information corresponding to the check waveform graphs to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameter and the waveform information corresponding to the check waveform graphs, without the need to frequently switch channels through an oscilloscope, multiple waveforms can be observed at the same time, and the display module is lighted up, thereby improving the efficiency of checking whether the edited waveform is correct. BRIEF DESCRIPTION OF DRAWINGS

[0030] Figure 1 A flowchart of the display module lighting method in one embodiment;

[0031] Figure 2 A flowchart of the display module lighting in one embodiment;

[0032] Figure 3 A device connection relationship diagram in one embodiment;

[0033] Figure 4 A waveform function calculation flowchart in one embodiment;

[0034] Figure 5 A structural block diagram of the display module lighting device in one embodiment. DETAILED DESCRIPTION

[0035] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not intended to limit the present application.

[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application.

[0037] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through a central element. In addition, "connected" in the following embodiments should be understood as "electrically connected", "communicatively connected" and the like if there is a transmission of electrical signals or data between the connected objects.

[0038] As used herein, the singular forms "a", "an" and "the" can include plural forms unless the context clearly indicates otherwise. It should also be understood that the terms "comprise / comprising" or "have / having" specify the presence of stated features, integers, steps, operations, components, parts or combinations thereof, but do not exclude the presence or addition of one or more other features, integers, steps, operations, components, parts or combinations thereof.

[0039] In one embodiment, referring to Figure 1 and Figure 2 , a lighting method of a display module is provided, which can be applied in a computer or the like. The method comprises the following steps:

[0040] Step S100: obtaining a target waveform diagram of a plurality of target channels.

[0041] Step S200: determining display module parameters, and generating a plurality of check waveform diagrams based on the display module parameters and the target waveform diagram.

[0042] Step S300: simultaneously previewing the plurality of check waveform diagrams, and sending the display module parameters and waveform information corresponding to the check waveform diagrams to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform diagrams.

[0043] In step S100, the target channels can include a plurality of signal channels of the display module. As an example, the signal channels of the display module can be gray-white color channels of the display module, or red-green-blue color channels.

[0044] The target waveform diagram can be used to display the waveform signal of each target channel. As an example, the target waveform diagram can include a step waveform diagram, a square wave diagram, etc.

[0045] It can be understood that one display module can have multiple target channels, and each target channel can have a corresponding target waveform diagram.

[0046] In step S200, the display module parameters can be used to characterize the specific conditions of the display module. As an example, the display module parameters can include the refresh frequency of the display module, etc. Since different display modules have different parameters, different display modules need to edit different waveform diagrams for the same target channel.

[0047] The verification waveform diagram can be used to display the waveform edited based on the display module parameters and the target waveform diagram for a specific display module. At this time, the verification waveform diagram and the target waveform diagram jointly display the signal waveform of the same target channel.

[0048] In step S300, since the target channel can have multiple, the verification waveform diagram can also have multiple. As an example, the PC host computer and other computer devices can simultaneously display multiple verification waveform diagrams. The operator can preview multiple verification waveform diagrams through the PC host computer and other computer devices.

[0049] The waveform information can include the waveform type of the verification waveform diagram.

[0050] The inspection machine is used to send the display module parameters and the waveform information of each target channel determined by the PC host computer and other computer devices to the display module, and the display module is lit based on the display module parameters and the waveform information. Please refer to Figure 3 , the connection mode of the PC host computer, the inspection machine and the display module is shown in the figure. Specifically, the PC host computer can be connected with the PG inspection machine, and the PG inspection machine can be connected with the display module.

[0051] The inspection machine has multiple signal channels, and each target channel can correspond to a signal channel. The signal channel of the inspection machine can receive the display module parameters of each target channel and the waveform information corresponding to the verification waveform diagram sent by the PC host computer and other devices, and the inspection machine can send the display module parameters and the waveform information corresponding to the verification waveform diagram to the display module, so that the display module emits light.

[0052] In the conventional technology, an oscilloscope is usually used to display the waveform. However, the oscilloscope can only display a single waveform. In the process of debugging the parameters of the display module, the oscilloscope needs to be manually adjusted frequently to switch different signal channels, which is tedious and increases the debugging time.

[0053] In the above embodiment, the target waveform diagram of the plurality of target channels is acquired, the display module parameters are determined, the plurality of check waveform diagrams are generated based on the display module parameters and the target waveform diagram, and finally the plurality of check waveform diagrams are simultaneously previewed, and the display module parameters and the waveform information corresponding to the check waveform diagram are sent to the plurality of signal channels of the inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform diagram. Not only the oscilloscope is avoided from being frequently adjusted to switch different signal channels, but also the efficiency of the check waveform is improved, and the debugging time of the display module is reduced.

[0054] In addition, the computer equipment such as PC host computer can simultaneously and intuitively preview the check waveform diagrams of each channel, which is more convenient for the operator to check the waveform, and further improves the rate of debugging the display module. Moreover, the computer equipment such as PC host computer displays the check waveform diagrams of each channel at a faster speed, which further shortens the test time.

[0055] In one embodiment, step S300 comprises:

[0056] Step S310: simultaneously previewing the plurality of check waveform diagrams in the plurality of display areas.

[0057] For example, the PC host computer display interface can include a plurality of display areas. For example, the plurality of display areas are arranged in an array. Each display area can preview a check waveform diagram. The number of display areas and the arrangement manner of the display areas are not limited in the present application.

[0058] In the above embodiment, a plurality of display areas are provided, and different check waveform diagrams are previewed in each display area, so that the worker can simultaneously observe a plurality of check waveform diagrams, the frequency of switching channels is reduced, and the efficiency of the check waveform is improved.

[0059] In one embodiment, step S200 comprises:

[0060] Step S210: determining a waveform model based on the target waveform diagram.

[0061] Step S220: calculating a waveform function based on the display module parameters and the waveform model.

[0062] In step S210, different target waveform diagrams correspond to waveform models. For example, the waveform model corresponding to the step waveform is different from the waveform model corresponding to the square waveform.

[0063] In step S220, the display module parameters can be brought into the waveform model to calculate the waveform function. For example, the waveform function can include a set of coordinates of the waveform.

[0064] In the above embodiment, in order to obtain the check waveform diagram, the waveform model needs to be determined based on the target waveform diagram, and then the waveform function is calculated based on the display module parameters and the waveform model. The waveform function can be displayed in the form of the check waveform diagram.

[0065] In one embodiment, after step S310, the method further comprises:

[0066] Step S320: sending the display module parameters and the waveform function to the multiple signal channels of the inspection machine, wherein the waveform function comprises a function coordinate set.

[0067] Referring to Figure 3 The inspection machine can be used to provide signals and power, and the multiple signal channels of the inspection machine send the display module parameters and the waveform function to the display module and make it enter the preset lighting state. As an example, the inspection machine can comprise a PG inspection machine.

[0068] As an example, the function coordinate set can comprise a function set of the X axis and a function set of the Y axis. Of course, the waveform function is not limited to the function coordinate set.

[0069] The display module parameters can be determined, the waveform function can be obtained, and the multiple check waveform diagrams can be generated and previewed on the PC host computer. After the waveform function is determined, the PC host computer can send the waveform function to the PG inspection machine, and the PG inspection machine can send each data to the display module. The display module operates according to each data, that is, the light-emitting chip of the display module lights up according to the waveform function.

[0070] In one embodiment, after step S300, the method further comprises:

[0071] Step S330: saving the waveform function in the case that the display module works normally.

[0072] After the display module is lit by the inspection machine based on the waveform function, if the display module operates normally without abnormal phenomena such as flashing screen and image, the waveform function and the determined display module parameters are saved, that is, the display module can operate normally based on the waveform function and the determined display module parameters in the future.

[0073] In one embodiment, after step S300, the method further comprises:

[0074] Step S340: comparing the check waveform diagram with the target waveform diagram in the case that the display module does not work normally.

[0075] Step S341: re-determining the target waveform diagram and the waveform model, and calculating the waveform function based on the re-determined target waveform diagram and the waveform model in the case that the check waveform diagram is different from the target waveform diagram. Figure One

[0076] ​In step S340, after the inspection machine lights the display module based on the waveform function, if the display module has abnormal phenomena such as flashing screen and picture, it can be considered that the target waveform diagram is incorrect, and needs to be determined again.

[0077] At this time, the target waveform diagram can be compared with the verification waveform diagram. Those skilled in the art should know that the waveform of the target display module needs to be consistent with the waveform of the verification display module. As an example, the waveform of the target display module is a square wave, and the waveform of the verification display module also needs to be a square wave. If the waveform of the verification display module is a sawtooth wave, it means that the previous step has an error and needs to be corrected.

[0078] In some cases, the verification waveform diagram and the target waveform diagram can be compared by manual comparison. In other cases, the server or PC host computer and other devices can compare the verification waveform diagram and the target waveform diagram. Specifically, the server can extract part of the waveform diagram of the verification waveform diagram and the target waveform diagram, and compare the two. As an example, the structural information or feature point information of the two can be extracted, and the similarity of the two can be calculated.

[0079] In step S341, when the verification waveform diagram and the target waveform diagram Figure One are inconsistent, it is considered that the target waveform diagram has an error. At this time, the target waveform diagram can be checked and determined again, the waveform model can be determined again according to the determined target waveform diagram, the waveform function can be calculated again according to the determined waveform model, and the display module can be lit again until the display module operates normally.

[0080] At the same time, since multiple verification waveform diagrams are previewed at the same time, the operator can also observe the adjustment of multiple target channels at the same time to more accurately fine-tune the waveform and make the screen in the best lighting state to the greatest extent.

[0081] In one embodiment, after step S340, it includes:

[0082] Step S342: In the case where the verification waveform diagram and the target waveform diagram are inconsistent, the display module parameters are determined again, and the waveform function is calculated based on the determined display module parameters.

[0083] In the case where the verification waveform diagram and the target waveform diagram are inconsistent, it means that the display module parameters determined in the previous step have an error. At this time, the display module parameters can be modified or determined again, and the waveform function can be calculated again, and the above step of lighting the display module can be repeated.

[0084] Of course, the verification waveform diagram and the target waveform diagram can be determined by manual comparison, or the server or PC host computer and other devices can determine the verification waveform diagram and the target waveform diagram after analysis.

[0085] It should be understood that, although the steps in the flowcharts are shown in a sequential order following the arrows, the steps are not necessarily performed in the order shown by the arrows. Unless otherwise explicitly stated herein, there is no strict order limitation on the performance of the steps, and the steps can be performed in other orders. Moreover, Figure 1 At least some of the steps in the flowcharts can include multiple steps or stages, which are not necessarily performed at the same time, but can be performed at different times, and the order of the steps or stages is not necessarily sequential, but can be performed alternately or alternately with at least some of the other steps or stages. Figure 1

[0086] Please refer to Figure 4 Here, a specific embodiment of a lighting method of the display module is shown. For example, connect the PC host computer, the PG inspection machine and the display module in sequence. Assuming that the refresh frequency of a display module is Hz, the time length of a frame is A, and the calculation method of A is:

[0087] 1 (MHz) / 60 (Hz) = 16667 (us).

[0088] The total time length of a complete waveform cycle of the target channel is the result of adding the wave bands of N M widths (starting voltage V, incremental voltage F (V)) according to the number of cycles C. The total time length of a complete waveform cycle is B, and the calculation method of B is:

[0089] N1*M1*C1+ N2*M2*C2+…+Nn*Mn*Cn.

[0090] The cycle period of the waveform is calculated as:

[0091] A (frame length) / B (complete waveform cycle length) = Q (number of complete waveform cycles) R (remaining incomplete waveform cycles).

[0092] When the remainder R is 0, the waveform coordinates corresponding to the complete waveform cycle corresponding to Q can be directly brought into the waveform model to calculate the waveform function.

[0093] For example, when the waveform model is a step wave, the X coordinate set of the waveform function is:

[0094] {(X)}={(Q1*0), (Q1*M1), (Q1*M1), (Q1*M2), (Q1*M2)…(Q1*Mn), (Q1*Mn), (Q2*M1), (Q2*M1), (Q2*M2)…(Q2*Mn)……(Qn*Mn)}.​

[0095] The Y coordinate set of the waveform function is:

[0096] {(Y)}={(V1), (V1), (V1+F(V1)), (V1+F(V1)), (V1+2*F(V1))…(V1+N*F(V1)), (V2), (V2), (V2+F(V2)), (V2+F(V2), (V2+2*F(V2))…(V2+N*F(V2))……(Vq+N*F(Vq))}.

[0097] When the remainder R is not 0, the waveform coordinates corresponding to the complete waveform period corresponding to Q can be brought into the waveform model first, and then the coordinates of the remaining waveforms are added in a loop until the total length accumulated is equal to the length of a frame, that is, 16667 (us).

[0098] At this time, the X coordinate set is:

[0099] { (X)} = { (Q*B+0), (Q*B+M1), (Q*B+M2)…(Q*B+R)}.

[0100] The Y coordinate set is:

[0101] {(Y)}={(V1), (V1), (V1+F(V1))…(Vc +F(Vc))} (Note: c=R / M).

[0102] The X coordinate set and the Y coordinate set are summarized, and the set data is graphically displayed to obtain the verification waveform diagram.

[0103] When there are multiple target channels, the above calculation method can be performed on multiple target channels to obtain verification waveform diagrams of multiple target channels. Simultaneous display of verification waveform diagrams of multiple target channels allows the operator to more clearly and intuitively see the verification waveform diagrams of each target channel, improving the detection efficiency of the verification waveform diagram.

[0104] Of course, the X coordinate set and the Y coordinate set corresponding to each verification waveform diagram can also be sent to the inspection machine, and the inspection machine can drive the display module to light up.

[0105] The above display module lighting method specific embodiments are only used to display the formation process of the verification waveform diagram. In actual applications, it is not limited to the above specific embodiments. The waveform model of the target channel of the display module is not limited to the function model displayed above.

[0106] Based on the same inventive concept, please refer to Figure 5 A display module lighting device is also provided, comprising: an acquisition module 901, a determination module 902, and a preview module 903.

[0107] The acquisition module 901 is configured to acquire a target waveform diagram of a plurality of target channels.

[0108] The determination module 902 is configured to determine display module parameters, and generate a plurality of check waveform diagrams based on the display module parameters and the target waveform diagram.

[0109] The preview module 903 is configured to simultaneously preview the plurality of check waveform diagrams, and send the display module parameters and waveform information corresponding to the check waveform diagrams to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform diagrams.

[0110] In an embodiment, the lighting device of the display module is further configured to simultaneously preview the plurality of check waveform diagrams in the plurality of display areas.

[0111] In an embodiment, the lighting device of the display module is further configured to determine a waveform model based on the target waveform diagram, and calculate a waveform function based on the display module parameters and the waveform model.

[0112] In an embodiment, the lighting device of the display module is further configured to send the display module parameters and the waveform function to the plurality of signal channels of the inspection machine, and the waveform function includes a function coordinate set.

[0113] In an embodiment, the lighting device of the display module is further configured to save the waveform function in a case where the display module is working normally.

[0114] In an embodiment, the lighting device of the display module is further configured to compare the check waveform diagram with the target waveform diagram in a case where the display module is not working normally, and in a case where the check waveform diagram is inconsistent with the target waveform diagram, redetermine the target waveform diagram and the waveform model, and calculate the waveform function based on the redetermined target waveform diagram and the waveform model. Figure One

[0115] In an embodiment, the lighting device of the display module is further configured to redetermine the display module parameters in a case where the check waveform diagram is inconsistent with the target waveform diagram, and calculate the waveform function based on the redetermined display module parameters.

[0116] The specific limitations of the lighting device of the display module can be referred to the limitations of the lighting method of the display module described above, which will not be repeated here. The above modules of the lighting device of the display module can be realized by software, hardware and combinations thereof, in whole or in part. The above modules can be embedded in or independent of the processor in the computer device in hardware form, or stored in the memory in the computer device in software form, so as to be called and executed by the processor to perform the operations corresponding to the above modules.

[0117] ​In one embodiment, a computer device is provided, comprising a memory and a processor, the memory storing a computer program, the processor implementing the following steps when executing the computer program:

[0118] Step S100: Obtain target waveform graphs of a plurality of target channels.

[0119] Step S200: Determine display module parameters, and generate a plurality of verification waveform graphs based on the display module parameters and the target waveform graphs.

[0120] Step S300: Simultaneously preview the plurality of verification waveform graphs, and send the display module parameters and waveform information corresponding to the verification waveform graphs to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up display modules based on the display module parameters and the waveform information corresponding to the verification waveform graphs.

[0121] Those skilled in the art should know that the computer device can also implement the other steps described above, and thus no more details are given here.

[0122] In one embodiment, a computer readable storage medium is provided, storing a computer program, the computer program being executed by a processor to implement the following steps:

[0123] Step S100: Obtain target waveform graphs of a plurality of target channels.

[0124] Step S200: Determine display module parameters, and generate a plurality of verification waveform graphs based on the display module parameters and the target waveform graphs.

[0125] Step S300: Simultaneously preview the plurality of verification waveform graphs, and send the display module parameters and waveform information corresponding to the verification waveform graphs to a plurality of signal channels of an inspection machine, so that the plurality of signal channels of the inspection machine light up display modules based on the display module parameters and the waveform information corresponding to the verification waveform graphs.

[0126] Those skilled in the art should know that the computer readable storage medium can also implement the other steps described above, and thus no more details are given here.

[0127] In one embodiment, a computer program product is provided, comprising a computer program, the computer program being executed by a processor to implement the following steps:

[0128] Step S100: Obtain target waveform graphs of a plurality of target channels.

[0129] Step S200: Determine display module parameters, and generate a plurality of verification waveform graphs based on the display module parameters and the target waveform graphs.

[0130] Step S300: previewing the plurality of check waveform diagrams simultaneously, and sending the display module parameters and the waveform information corresponding to the check waveform diagrams to the plurality of signal channels of the inspection machine, so that the plurality of signal channels of the inspection machine light up the display module based on the display module parameters and the waveform information corresponding to the check waveform diagrams.

[0131] Those skilled in the art shall know that the computer program product can also implement the other steps described above, and details are not described herein.

[0132] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by a computer program instructing related hardware.

[0133] In the description of the present specification, the description of the terms "some embodiments", "other embodiments", "ideal embodiments" and the like means that the specific features, structures, materials or characteristics described in combination with the embodiments or examples are contained in at least one embodiment or example of the present application. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example.

[0134] The technical features of the above embodiments can be combined arbitrarily, and in order to make the description simple, not all possible combinations of the technical features in the above embodiments are described, however, as long as the combination of the technical features does not exist contradictory, it shall be considered as the scope of the present specification.

[0135] The above embodiments only express several implementation manners of the present application, the description is more specific and detailed, but it shall not be understood as the limitation of the patent scope of the present application. It shall be pointed out that, for those skilled in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the patent protection scope of the present application shall be subject to the appended claims.

Claims

1. A lighting method of a display module, characterized by, The method comprises: acquiring target waveform graphs of multiple target channels; determining display module parameters, and generating multiple verification waveform graphs based on the display module parameters and the target waveform graphs, comprising: determining a waveform model based on the target waveform graphs; and calculating a waveform function based on the display module parameters and the waveform model; simultaneously previewing the multiple verification waveform graphs, and sending the display module parameters and waveform information corresponding to the verification waveform graphs to multiple signal channels of an inspection machine, so that the multiple signal channels of the inspection machine light up display modules based on the display module parameters and the waveform information corresponding to the verification waveform graphs, comprising: sending the display module parameters and the waveform function to the multiple signal channels of the inspection machine, wherein the waveform function comprises a function coordinate set; in the case of abnormal operation of the display modules, comparing the verification waveform graphs with the target waveform graphs; in the case of consistency between the verification waveform graphs and the target waveform graphs, redetermining the target waveform graphs and the waveform model, and calculating the waveform function based on the redetermined target waveform graphs and the waveform model; in the case of inconsistency between the verification waveform graphs and the target waveform graphs, redetermining the display module parameters, and calculating the waveform function based on the redetermined display module parameters.

2. The display module lighting method according to claim 1, wherein simultaneously previewing the multiple verification waveform graphs, and sending the display module parameters and waveform information corresponding to the verification waveform graphs to multiple signal channels of an inspection machine, so that the multiple signal channels of the inspection machine light up display modules based on the display module parameters and the waveform information corresponding to the verification waveform graphs, comprising: simultaneously previewing the multiple verification waveform graphs in multiple display areas.

3. The display module lighting method according to claim 2, wherein Each of the display areas previews one of the verification waveform graphs.

4. The display module lighting method according to claim 1, wherein After simultaneously previewing the multiple verification waveform graphs and sending the display module parameters and waveform information corresponding to the verification waveform graphs to multiple signal channels of an inspection machine, so that the multiple signal channels of the inspection machine light up display modules based on the display module parameters and the waveform information corresponding to the verification waveform graphs, comprising: in the case of normal operation of the display modules, saving the waveform function.

5. The method of Claim 1, wherein The waveform information comprises a waveform type of the verification waveform graphs.

6. A lighting device for a display module, characterized by The apparatus comprises: an acquisition module, configured to acquire target waveform graphs of multiple target channels; a determination module, configured to determine display module parameters, and generate multiple verification waveform graphs based on the display module parameters and the target waveform graphs, comprising: determining a waveform model based on the target waveform graphs; and calculating a waveform function based on the display module parameters and the waveform model; a previewing module, configured to simultaneously preview the multiple verification waveform graphs, and send the display module parameters and waveform information corresponding to the verification waveform graphs to multiple signal channels of an inspection machine, so that the multiple signal channels of the inspection machine light up display modules based on the display module parameters and the waveform information corresponding to the verification waveform graphs, comprising: sending the display module parameters and the waveform function to the multiple signal channels of the inspection machine, wherein the waveform function comprises a function coordinate set; in the case of abnormal operation of the display modules, comparing the verification waveform graphs with the target waveform graphs; in the case of consistency between the verification waveform graphs and the target waveform graphs, redetermining the target waveform graphs and the waveform model, and calculating the waveform function based on the redetermined target waveform graphs and the waveform model; in the case of inconsistency between the verification waveform graphs and the target waveform graphs, redetermining the display module parameters, and calculating the waveform function based on the redetermined display module parameters. The lighting device of the display module is further configured to compare the verification waveform diagram with the target waveform diagram in the case that the display module does not work normally; in the case that the verification waveform diagram is consistent with the target waveform diagram, the target waveform diagram and the waveform model are re-determined, and the waveform function is calculated based on the re-determined target waveform diagram and the waveform model; in the case that the verification waveform diagram is not consistent with the target waveform diagram, the display module parameters are re-determined, and the waveform function is calculated based on the re-determined display module parameters.

7. The lighting device of the display module according to claim 6, wherein The lighting device of the display module is further configured to preview multiple verification waveform diagrams simultaneously in multiple display areas.

8. The lighting device of the display module according to claim 6, wherein The lighting device of the display module is further configured to save the waveform function in the case that the display module works normally. 9.A computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the computer device is configured to perform the method according to any one of claims 1-8 when the computer program is executed by the processor. The processor implements the steps of the method of any one of claims 1 to 5 when executing the computer program.

10. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program, when executed by the processor, implements the steps of the method of any one of claims 1 to 5.

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