Large non-visibility base and its flatness detection method

By selecting multiple predetermined installation points on a large non-line-of-sight base for planar measurement, and combining height difference and angle detection, the problems of base surface flatness and installation accuracy were solved, achieving rapid and accurate detection results.

CN116045890BActive Publication Date: 2026-03-20JIANGNAN SHIPYARD (GRP) CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-02-20
Publication Date
2026-03-20

AI Technical Summary

Technical Problem

Existing methods for detecting the flatness, levelness, and bow-stern deviation of the base cannot meet the installation requirements of large non-line-of-sight bases, resulting in difficulties in detection and insufficient accuracy.

Method used

The planarity of the base surface is analyzed by selecting at least three predetermined installation points around the obstruction on the base surface and setting up a planar measuring instrument. The height difference of the overlapping area is measured, and the planarity of the base surface is tested in conjunction with the installation level of the base surface and the deviation angle of the bow and stern lines.

Benefits of technology

A simple and rapid detection method is provided, which can effectively analyze the flatness and installation accuracy of the base surface, and meet the needs of rapid measurement and monitoring of large non-line-of-sight bases.

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Abstract

The application provides a large non-communication base and a detection method for flatness of the base, which comprises the following steps: selecting at least three predetermined erecting points for erecting a plane measuring instrument around a communication obstacle on the base surface, and erecting the plane measuring instrument on the predetermined erecting points respectively; measuring the height value of a reflecting target on the base surface in the visual field of the plane measuring instrument along the direction away from the obstacle by the plane measuring instrument; wherein the visual fields of the plane measuring instruments on two adjacent erecting points have an overlapping area on the base surface; selecting the real height of the highest point and the lowest point of the overlapping area, obtaining the height difference of the measurement system of the adjacent predetermined erecting points according to the heights of the adjacent predetermined erecting points, and analyzing to obtain the flatness of the base surface. The application also provides a detection method for a large non-communication base, which is convenient for on-site implementation, error feedback and adjustment of the base, and meets the requirements of rapid measurement, implementation monitoring and inspection of the non-communication high base.
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Description

TECHNICAL FIELD

[0001] The present application relates to the field of ships, in particular to a large non-visual base and a method for detecting the flatness thereof. BACKGROUND

[0002] With the rapid development of equipment production technology, more and more technological products are installed on ships. Many devices are large in size, high in precision, interrelated, demanding, and different in installation mode. Some of the devices are installed on the ship in the form of multi-segment, integrated, and non-visual ring-shaped set to ensure unobstructed view. In order to meet the device installation requirements and ensure the shipbuilding quality and speed, the existing detection methods for the flatness, levelness, and bow and stern deviation of the base need to be improved. SUMMARY

[0003] In view of the above-mentioned shortcomings of the prior art, the technical problem to be solved by the present application is to provide a large non-visual base and a method for detecting the flatness thereof.

[0004] The present application provides a method for detecting the flatness of a large non-visual base, comprising the following steps: selecting at least three predetermined erection points for erecting a plane measuring instrument around the visual obstacle on the base surface in a circumferential direction, and erecting a plane measuring instrument at each predetermined erection point; measuring the height of the reflecting target on the base surface within the visual field of the plane measuring instrument in a direction away from the obstacle by the plane measuring instrument; wherein the visual fields of the plane measuring instruments at two adjacent erection points have an overlapping area on the base surface; selecting the true heights of the highest point and the lowest point of the overlapping area, and obtaining the height difference of the measurement system of the adjacent predetermined erection points according to the heights of the adjacent predetermined erection points, and then analyzing the flatness of the base surface.

[0005] Preferably, the two adjacent predetermined erection points are a first predetermined erection point and a second predetermined erection point, respectively, and the heights of the first predetermined erection point and the second predetermined erection point are H K1 and H K2 , respectively, and the true heights of the highest point and the lowest point of the overlapping area of the first predetermined erection point and the second predetermined erection point are (H T , L T ); the heights of the highest point and the lowest point of the overlapping area measured at the first predetermined erection point are (H1, L1), and the heights of the highest point and the lowest point of the overlapping area measured at the second predetermined erection point are (H2, L2);

[0006] wherein H1 = H T + H K1 (1)

[0007] L1 = L T + H K1(2)

[0008] H2= H T + H K2 (3)

[0009] L2= L T + H K2 (4)

[0010] The second predetermined erection point can be obtained by the following formula:

[0011] H K2 -H K1 =(H2-H1+L2-L1) / 2.

[0012] The application also provides a detection method for a large non-visibility base, which comprises the base surface flatness detection method, installation level detection of the base surface, and deviation angle detection of a predetermined stern line and a bow line on the base surface.

[0013] Preferably, the installation level detection of the base surface comprises the following steps: selecting a height reference point on the obstacle (400), selecting at least two reference directions on the base surface, and measuring the level of the base surface in the at least two reference directions one by one.

[0014] According to the reference direction, a reference direction straight line is selected on the base surface, a first predetermined reference point and a second predetermined reference point are selected on the reference direction straight line, and a light target is arranged on the first predetermined reference point and the second predetermined reference point; error values ΔL1 and ΔL2 between the first predetermined reference point and the second predetermined reference point and the height reference point are measured respectively; the distance L of the first predetermined reference point and the second reference point on the reference level is determined, and the level of the base surface in the reference direction relative to the reference level is obtained:

[0015] α=arc tan(|ΔL1-ΔL2| / L).

[0016] Preferably, the base surface error of the deviation angle of the predetermined stern line and the bow line on the base surface comprises the following steps: selecting a third predetermined reference point and a fourth predetermined reference point on the predetermined stern line; taking the ship centerline surface as a reference, measuring the distances ΔS1 and ΔS2 of the third predetermined reference point and the fourth predetermined reference point from the ship centerline surface respectively; determining the distance S between the third predetermined reference point and the fourth predetermined reference point, and obtaining the deviation angle of the predetermined stern line and the bow line on the base surface:

[0017] β=arc tan(|ΔS1-ΔS2| / S).

[0018] As described above, the large non-visibility base flatness detection method of the present application, by selecting at least three predetermined erection points to erect the plane measuring instrument, and the adjacent two erection points have an overlapping area on the base surface, selecting the true height of the highest point and the lowest point of the overlapping area, according to the height of the adjacent predetermined erection point, the height difference of the measurement system of the adjacent predetermined erection point is obtained, and the flatness of the base surface is analyzed; the detection method is simple to operate, convenient to measure, and can quickly detect the flatness of the base; the present application also provides a large non-visibility base detection method, which is convenient for on-site base implementation, error feedback and adjustment, and meets the requirements of rapid measurement, implementation monitoring and inspection of large non-visibility base. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 An embodiment schematic diagram of the large non-visibility base flatness detection method of the present application.

[0020] Figure 2 An embodiment schematic diagram of the installation level of the base surface of the present application.

[0021] Figure 3 Another embodiment schematic diagram of the installation level of the base surface of the present application.

[0022] Figure 4 A schematic diagram of the predetermined stern knuckle line and bow stern line deviation angle of the base surface of the present application.

[0023] BRIEF DESCRIPTION OF DRAWINGS

[0024] 100, a predetermined erection point; 110, a region; 120, a two overlapping area; 310, a three overlapping area; 200, a predetermined erection point two; 220, a two region; 230, a two three overlapping area; 300, a predetermined erection point three; 330, a three region; 400, an obstacle; 500, a base surface. DETAILED DESCRIPTION

[0025] The embodiments of the present application are described below by specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the content disclosed in the specification.

[0026] It is to be understood that the structures, proportions, sizes, etc. shown in the drawings accompanying the present specification are merely intended to facilitate the understanding of the content disclosed in the present specification for those skilled in the art to understand and read, and are not intended to limit the defined conditions under which the present application can be implemented, and therefore do not have technical significance. Any modification of the structure, change of the proportional relationship, or adjustment of the size, without affecting the effects that can be produced by the present application and the purposes that can be achieved, should still fall within the scope of the technical content disclosed by the present application. At the same time, the terms such as "upper", "lower", "left", "right", "middle" and the like used in the present specification are merely for the purpose of clear understanding of the description, and are not intended to limit the scope of the present application that can be implemented, and the change or adjustment of the relative relationship, without substantially changing the technical content, is also considered as the scope of the present application that can be implemented.

[0027] The present application provides an embodiment of a large non-visibility base flatness detection method, comprising the following steps: selecting at least three predetermined erection points for erecting a plane measurement instrument around the visibility obstacle 400 on the base surface 500, and erecting a plane measurement instrument at each predetermined erection point;

[0028] Measuring the height value of the reflecting target on the base surface 500 within the field of view of the plane measurement instrument along the direction away from the obstacle 400 by the plane measurement instrument; wherein the fields of view of the plane measurement instruments at adjacent two erection points have an overlapping area on the base surface 500, and the fields of view of the plane measurement instruments at all erection points can cover the base surface 500 in the direction away from the obstacle 400;

[0029] Selecting the true heights of the highest point and the lowest point of the overlapping area, and obtaining the height difference of the measurement system of adjacent predetermined erection points according to the heights of the adjacent predetermined erection points, and then analyzing to obtain the flatness of the base surface 500.

[0030] Wherein, the two adjacent predetermined erection points are respectively a first predetermined erection point and a second predetermined erection point, the heights of the first predetermined erection point and the second predetermined erection point are respectively H K1 and H K2 , and the true heights of the highest point and the lowest point of the overlapping area of the first predetermined erection point and the second predetermined erection point are (H T , L T ); the heights of the highest point and the lowest point of the overlapping area measured at the first predetermined erection point are (H1, L1), and the heights of the highest point and the lowest point of the overlapping area measured at the second predetermined erection point are (H2, L2);

[0031] Wherein, H1=H T +H K1

[0032] L1=L T +H K1

[0033] H2= H T + H K2

[0034] L2= L T + H K2

[0035] The measurement system height difference of the second predetermined erection point relative to the first predetermined erection point is:

[0036] H K2 - H K1 = (H2- H1+ L2- L1) / 2

[0037] Specifically, three predetermined erection points are selected for erecting the plane measurement instrument, which are predetermined erection point one 100, predetermined erection point two 200, and predetermined erection point three 300, and the three predetermined erection points are circumferentially distributed around the obstacle. The field of view of the plane measurement instrument erected on the predetermined erection point one 100 covers the areas on the base respectively as a one-two overlapping area 120, a one-three overlapping area 310, and a one area 110. The one-two overlapping area 120 is the overlapping area on the base surface 500 covered by the field of view of the plane measurement instrument erected on the predetermined erection point one 100 and the field of view of the plane measurement instrument erected on the predetermined erection point two 200, and the one area 110 is the area on the base surface 500 falling only within the field of view of the plane measurement instrument erected on the predetermined erection point one 100. The one-three overlapping area 310 is the overlapping area on the base covered by the field of view of the plane measurement instrument erected on the predetermined erection point one 100 and the field of view of the plane measurement instrument erected on the predetermined erection point three 300. Correspondingly, the field of view of the plane measurement instrument erected on the predetermined erection point two 200 covers the areas on the base respectively as a two area 220, a one-two overlapping area 120, and a two-three overlapping area 230. The two area 200 is the area on the base surface 500 falling only within the field of view of the plane measurement instrument erected on the predetermined erection point two 200, and the two-three overlapping area 230 is the overlapping area on the base covered by the field of view of the plane measurement instrument erected on the predetermined erection point two 200 and the field of view of the plane measurement instrument erected on the predetermined erection point three 300. The field of view of the plane measurement instrument erected on the predetermined erection point three 300 covers the areas on the base respectively as a three area 330, a one-three overlapping area 310, and a two-three overlapping area 230, and the three area 330 is the area on the base surface 500 falling only within the field of view of the plane measurement instrument erected on the predetermined erection point three 300.

[0038] The highest point and the lowest point of the one-two overlapping area, the two-three overlapping area, and the one-three overlapping area are (H trueij , L trueij), i = 1, 2, 3; j = 1, 2, 3. The heights of the predetermined erection site one, the predetermined erection site two and the predetermined erection site three are H basej , j = 1, 2, 3. The overlapping area of the visual angle of the two adjacent plane measuring instruments on the base surface is (H measureij , L measureij ), i, j = 1, 2, 3, ij represents the number of the overlapping area, i represents the number of the erection position, and the possible values are: (H measure12 , L measure12 ); (H measure13 , L measure13 ); (Hmeasure21, Lmeasure21); (H measure23 , L measure23 ); (H measure31 , L measure31 ); (H measure32 , L measure32 );

[0039] Then, for a two-overlapping area, when the predetermined erection site one is measured, there are:

[0040] H measure12 = H true12 + H base1 (5)

[0041] L measure12 = L true12 + H base1 (6)

[0042] When the predetermined erection site two is measured, there are:

[0043] H measure21 = H true12 + H base2 (7)

[0044] L measure21 = L true12 + H base2 (8)

[0045] Equations (7)-(5), (8)-(6)

[0046] H base2 - H base1 = H measure21 - H measure12

[0047] H base2 - H base1 = L measure21 - L measure12

[0048] It can be obtained that the predetermined erection site two has the following systematic difference relative to the predetermined erection site one:

[0049] H base2 -H base1 =(H measure21 -H measure12 +L measure21 -L measure12 ) / 2;

[0050] Similarly, the predetermined erection point three has the following system difference relative to the predetermined erection point one;

[0051] H base3 -H base1 =(H measure31 -H measure13 +L measure31 -L measure13 ) / 2;

[0052] Since the same device is used, the measurement accuracy is consistent, and the random error distribution is consistent, so by using the above two system differences, all measurement values can be converted to the measurement value equivalent to the height of the predetermined erection point one, so as to analyze the flatness of the entire plane.

[0053] The through-plane flatness detection method, the erection plane measuring instrument is erected at least three predetermined erection points, and the field of view of the plane measuring instrument of the adjacent two predetermined erection points has an overlapping area on the base surface 500, the true height of the highest point and the lowest point of the overlapping area is selected, the measurement system height difference of the adjacent predetermined erection points is obtained according to the height of the adjacent predetermined erection points, and the flatness of the base surface 500 is analyzed; the detection method is simple to operate, convenient to measure, and can quickly detect the flatness of the base;

[0054] The embodiment of the detection method of the large non-communication base provided by the application includes the flatness detection method for detecting the flatness of the base, measuring the installation levelness of the base surface 500, and measuring the deviation angle of the predetermined stern waterline and bow stern line of the base surface 500

[0055] Wherein, when measuring the installation levelness of the base surface 500, the following steps are included: selecting a height reference point on the obstacle 400, and selecting at least two reference directions on the base surface 500; measuring the levelness of the base surface 500 in each reference direction one by one; selecting a reference direction straight line on the base surface 500 according to the reference direction, selecting a first predetermined reference point and a second predetermined reference point on the same reference direction straight line, and setting a light target on the first predetermined reference point and the second predetermined reference point; respectively measuring the error values ΔL1 and ΔL2 between the first predetermined reference point and the second predetermined reference point and the height reference point; determining the distance L of the first predetermined reference point and the second reference point on the reference horizontal plane, and then obtaining the levelness of the base surface 500 in the reference direction relative to the reference horizontal plane:

[0056] α=arc tan(|ΔL1-ΔL2| / L).

[0057] In this embodiment, a height reference point E can be set on the mast as the zero point for subsequent height measurements. The earth can be used as the reference horizontal plane. The selected reference directions are the forward / reverse direction and the left / right direction. The forward / reverse direction is the bow / stern direction of the ship, and the left / right direction is the direction perpendicular to the bow / stern direction.

[0058] Taking the measurement of the levelness of the base surface relative to the reference horizontal plane in the left-right direction as an example, a reference straight line L is selected on the base surface in the left-right direction. CD Points C and D, the two endpoints of the reference direction line on the base surface, are selected as the first and second predetermined reference points.

[0059] A total station is mounted on the main deck, with a line of sight to the left and right of the antenna base. The dedicated laser emission target for the antenna base is placed at points C and D. The total station is used to measure the error value ΔL between points C and D and the mast height reference point. CD 1. ΔL CD 2. Measure the straight-line distance between points C and D on the reference horizontal plane (approximately equal to the distance between points C and D on the base surface), and calculate the levelness of the base surface relative to the reference horizontal plane in the left and right directions.

[0060] α CD =arc tan(|ΔL CD 1-ΔL CD 2| / L CD );

[0061] Accordingly, the levelness of the base surface relative to the reference horizontal plane in the front-rear direction can be determined:

[0062] α AB =arc tan(|ΔL AB 1-ΔL AB 2| / L AB ).

[0063] It should be noted that, in order to ensure that the equipment is installed on the base surface in the same direction as the stern of the ship, a predetermined stern line will be engraved on the base surface first, and then the deviation angle between the predetermined stern line and the stern line will be measured.

[0064] When the angle between the predetermined aft draft line and the bow-stern line of the base is measured, the following steps are included: selecting a third predetermined reference point A and a fourth predetermined reference point B on the predetermined aft draft line; measuring the distances between the third predetermined reference point A and the fourth predetermined reference point B and the centerline plane of the ship, ΔS1 and ΔS2, respectively, taking the centerline plane of the ship as the reference; determining the distance S between the third predetermined reference point A and the fourth predetermined reference point B, and obtaining the angle between the reference direction straight line in the fore-aft direction of the base and the bow-stern line of the ship:

[0065] β = arc tan(|ΔS1-ΔS2| / S)

[0066] The detection method of the large non-visibility base is convenient for the implementation, error feedback and adjustment of the base on site, and meets the requirements of rapid measurement, implementation monitoring and inspection of the large non-visibility base.

[0067] The above embodiments only exemplarily illustrate the principles and effects of the present application, and are not used to limit the present application. Any person skilled in the art can modify or change the above embodiments without departing from the spirit and scope of the present application. Therefore, all equivalent modifications or changes completed by those skilled in the art without departing from the spirit and technical thought disclosed by the present application should be covered by the claims of the present application.

Claims

1. A method for detecting the flatness of a large non-visual-view base, characterized in that, Includes the following steps: Select at least three predetermined mounting points for mounting plane measuring instruments on the base surface (500) around the visibility obstacle (400), and mount the plane measuring instruments at the predetermined mounting points respectively. The height of the reflective target on the base surface (500) within the field of view of the plane measuring instrument is measured along the direction away from the obstruction (400); wherein the field of view of the plane measuring instrument at two adjacent predetermined installation points overlaps on the base surface (500); The actual heights of the highest and lowest points in the overlapping area are selected. Based on the heights of adjacent predetermined erection points, the height difference of the measurement system at the adjacent predetermined erection points is obtained, and then the flatness of the base surface (500) is analyzed. To detect the flatness of the base, the installation level of the base surface also needs to be measured. When measuring the installation level of the base surface (500), the following steps are included: selecting a height reference point on the obstacle (400) and selecting at least two reference directions on the base surface (500); measuring the levelness of the base surface in the at least two reference directions one by one. A reference direction straight line is selected on the base surface according to the reference direction. A first predetermined reference point and a second predetermined reference point are selected on the same reference direction straight line. A light target is set on the first predetermined reference point and the second predetermined reference point. The error values ​​ΔL1 and ΔL2 between the first predetermined reference point, the second predetermined reference point and the height reference point are measured respectively. The distance L between the first predetermined reference point and the second predetermined reference point on the reference horizontal plane is determined, and the levelness of the base surface relative to the reference horizontal plane in this reference direction is obtained. α=arc tan(|ΔL1-ΔL2| / L).

2. The method for detecting the flatness of a large non-visual-view base according to claim 1, characterized in that, Choose any two adjacent predetermined erection points as the first predetermined erection point and the second predetermined erection point, with the heights of the first predetermined erection point and the second predetermined erection point being H respectively. K1 and H K2 The actual height of the highest and lowest points in the overlapping area of ​​the first and second predetermined erection points is (H). T L T The heights of the highest and lowest points of the overlapping area are measured at the first predetermined erection point as (H1, L1), and the heights of the highest and lowest points of the overlapping area are measured at the second predetermined erection point as (H2, L2). Where, H1=H T +H K1 (1) L1= L T + H K1 (2) H2= H T + H K2 (3) L2= L T + H K2 (4) The height difference of the measurement system between the second predetermined erection point and the first predetermined erection point can be obtained as follows: H K2 -H K1 =(H2-H1+L2-L1) / 2。 3. A method for detecting large non-line-of-sight bases, characterized in that, The method for detecting the flatness of the base includes using the base flatness detection method described in claim 1 or 2, and also requires measuring the deviation angle between the predetermined stern marking and the bow and stern marking on the base surface.

4. The detection method for a large non-line-of-sight base according to claim 3, characterized in that, Measuring the deviation angle between the predetermined stern marking and the bow-stern line on the base surface, and the base surface error, includes the following steps: selecting a third and a fourth predetermined reference point on the predetermined stern marking; using the ship's centerline as a reference, measuring the distances ΔS1 and ΔS2 between the third and fourth predetermined reference points and the ship's centerline, respectively; determining the distance S between the third and fourth predetermined reference points; and calculating the deviation angle between the predetermined stern marking and the bow-stern line on the base surface. β=arc tan(|ΔS1-ΔS2| / S).

Citation Information

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