Optical element pose measurement system for large aperture telescopes

Abstract

The application provides an optical element position measurement system of a large aperture telescope, which controls staggered output of at least three wideband light beams from a wideband light source through an optical switch, each wideband light beam is irradiated onto a five-prism through a photonic lead, the five-prism reflects the wideband light beam onto a first reflecting surface, and the first reflecting surface reflects the wideband light beam onto a second reflecting surface, the second reflecting surface reflects the wideband light beam onto a multimode optical fiber, the multimode optical fiber transmits the wideband light beam to a wavelength division multiplexer for wave division, and a back-end joint point detector obtains light information of the wideband light beam, and the light information is calculated through a calculation network to obtain six-dimensional position information of the optical element. The application can effectively measure the position data of the optical element of the large aperture telescope, solves the problem of difficult position measurement of the optical element of the large aperture telescope, and performs element adjustment and error correction based on the measurement data, avoids repeated movement of the optical element, and can predict and correct imaging errors.

Description

Technical Field

[0001] This invention relates to the field of telescope technology, specifically providing a system for measuring the pose of optical components in a large-aperture telescope. Background Technology

[0002] As the aperture of telescopes continues to increase, the corresponding structural dimensions also increase and become more complex. Although the overall design and manufacturing of optical telescopes have made great progress, the assembly, measurement and adjustment of optical components in large-aperture telescopes are still important factors that restrict the improvement of the imaging performance of large-aperture telescopes.

[0003] Optical element pose measurement is fundamental to high-precision imaging in large-aperture telescopes. It determines the propagation path of light waves and the pose data of the optical elements, making it a key technology in telescope system assembly. Existing optical element assembly and adjustment methods primarily rely on adjusting the optical elements to improve imaging accuracy and quality. However, the optical elements in large-aperture telescopes are more complex and larger, making existing methods difficult to implement. Frequent adjustments to the optical element pose are extremely complex, significantly increasing economic and labor costs, and the adjustment process relies heavily on the technical experience of specialized personnel.

[0004] To address the challenges of assembling and adjusting optical components in large-aperture telescopes, current research focuses on measuring the pose of these components and then adjusting them based on the measurement results and theoretical requirements. However, there is currently no suitable method, device, or system for measuring the pose of optical components in large-aperture telescopes. Summary of the Invention

[0005] To solve the above problems, this invention provides an optical element pose measurement system for a large-aperture telescope, comprising: an optical element, a light output end, a pentaprism, a light receiver end, and a solution network;

[0006] The optical element includes a first reflecting surface and a second reflecting surface;

[0007] The optical output end includes a broadband light source, an optical switch, and photonic leads;

[0008] The optical receiver includes multimode fiber, wavelength division multiplexer, and point detector;

[0009] At least three broadband beams are output at staggered times by controlling a broadband light source through an optical switch. Each broadband beam is irradiated onto a pentaprism through a photonic lead. The number of pentaprisms is equal to the number of broadband beams. All pentaprisms are set on the same circular track. The pentaprisms irradiate different points on the first reflecting surface and are reflected by the first reflecting surface to the second reflecting surface. The second reflecting surface reflects the broadband beam to a multimode fiber. The multimode fiber transmits the broadband beam to a wavelength division multiplexer for wavelength division multiplexing. The optical information of the broadband beam is acquired by a detector at the connection point of the wavelength division multiplexer and the optical information of the broadband beam is solved by a solution network to obtain the six-dimensional position information of the optical element.

[0010] Preferably, a pentaprism is used to precisely deflect a broadband beam by 90 degrees.

[0011] Preferably, the optical switch is used to switch the output broadband beam, ensuring that only one broadband beam is output at any given time.

[0012] Preferably, the multimode fiber is positioned at the focal plane of the system. When the optical element shifts, it will generate a defocusing amount, allowing the multimode fiber to receive different spectral information.

[0013] Preferably, all broadband beams can be emitted from the same photon lead or from different photon leads.

[0014] Preferably, the solution network adopts a deep learning neural network that has been calibrated, and the input layer of the solution network is the energy intensity obtained by the point detector, i.e., the light information.

[0015] Preferably, the first reflecting surface is an annular reflecting surface and the second reflecting surface is a circular reflecting surface.

[0016] Compared with the prior art, the present invention can achieve the following beneficial effects:

[0017] This invention can effectively measure the pose data of optical elements in large-aperture telescopes, solving the problem of difficult pose measurement of optical elements in large-aperture telescopes. It can also perform component assembly and adjustment or error correction based on the measurement data, avoiding repeated movement of optical elements, and can predict and correct imaging errors.

[0018] The measurement system of the present invention has a simple structure and is easy to operate, which greatly reduces economic costs, and simplifies the calculation of position information of optical elements by combining neural networks. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the structure of an optical element pose measurement system for a large-aperture telescope according to an embodiment of the present invention.

[0020] The reference numerals in the figures include:

[0021] Broadband light source and optical switch 1, photon lead 2, output head 21, pentaprism 3, optical element 4, first reflecting surface 41, second reflecting surface 42, multimode fiber 5, wavelength division multiplexer 6, point detector 7, solution network 8, energy distribution curve 9. Detailed Implementation

[0022] In the following description, embodiments of the invention will be described with reference to the accompanying drawings. In the description below, the same modules are denoted by the same reference numerals. Where the same reference numerals are used, their names and functions are also the same. Therefore, their detailed description will not be repeated.

[0023] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not constitute a limitation thereof.

[0024] Figure 1 The structure of an optical element pose measurement system for a large-aperture telescope according to an embodiment of the present invention is shown.

[0025] like Figure 1 As shown, the optical element pose measurement system for a large-aperture telescope proposed in this embodiment of the invention includes: a pentaprism 3, an optical element 4, a light output end, a light receiving end, and a solution network 8.

[0026] The system's optical output end employs a broadband light source and optical switch 1. Specifically, a broadband laser generates the broadband light source, and the optical switch is linked or integrated with the broadband light source. Optical path switching is achieved by controlling the optical switch. In this embodiment, only three broadband beams located at the telescope path tube are described. To improve measurement accuracy and reduce random errors, more broadband beams can be used. When the optical switch switches, only one of the three broadband beams is output, ensuring staggered output of the three broadband beams in the system. After the broadband light source and optical switch 1 generate the broadband beam, the beam first enters the photonic lead 2 and is emitted through the output head 21 at the end of the photonic lead 2. The photonic lead 2 can be a single-mode optical fiber.

[0027] As an optional embodiment, the optical output end of the system can also adopt a combination of three sets of light sources and photonic leads 2, with broadband beams emitted from different photonic leads 2, while still ensuring that the three broadband beams are output in staggered time.

[0028] Three broadband beams are respectively irradiated onto three corresponding pentaprisms 3, with the number of pentaprisms 3 equal to the number of broadband beams. All three pentaprisms 3 are mounted on the same annular track and can move along it. The pentaprisms 3 reflect the broadband beams onto three different points on the first reflecting surface 41. The first reflecting surface 41 is an annular reflecting surface, with the outer ring being the reflecting area and the center being the transmission area. Since at least three points are needed to define the plane, the irradiation points cannot overlap or fall within the transmission area. The first reflecting surface 41 reflects the broadband beams to the second reflecting surface 42, which then reflects the broadband beams through the transmission area of ​​the first reflecting surface 41 to irradiate the focal plane of the system. The first reflecting surface 41 and the second reflecting surface 42 can both be the optical element under test, or only one of them can be the optical element under test 4. When the optical element 4 is a lens, the first reflecting surface 41 and the second reflecting surface 42 can be constructed using a reflective film.

[0029] A multimode fiber 5 is installed at the system's focal plane. This fiber receives the broadband light beam, which converges at the focal plane to form multiple focal points with different spectra. When the focal point is located at the entrance of the multimode fiber 5, the corresponding spectral band of light can enter the fiber 5 for further transmission, exhibiting a high-energy state. Light from other spectral bands cannot enter the fiber 5 and exhibits a low-energy state. The multimode fiber 5 transmits the broadband light beam to a wavelength division multiplexer 6 for spectral analysis. The multiplexer 6 splits the broadband beam into multiple paths, with a point detector 7 connected to the end of each path. Each path is detected using a single point detector 7, effectively improving detection speed and accuracy. The point detector 7 transmits the detected optical information to a computational network 8. This network employs a calibrated deep learning neural network, with the input layer being the energy intensity obtained from the point detector 7, i.e., the optical information reflected in the energy distribution curve 9. By analyzing the changes in dispersion information under different pathways and using light information from different spectra as input, the six-dimensional position information of optical element 4 can be obtained by using the calibrated and trained solution network 8 to solve the input layer information. Based on the comparison between the six-dimensional position information and the theoretical position, an adjustment scheme for optical element 4 can be obtained. When the difference between the six-dimensional position information and the theoretical position is small, only error prediction and correction need to be performed. The solution network 8 can be a traditional electrical neural network based on deep learning. The training, calibration, and solution of the solution network 8 are all existing mature technologies and are not the focus of this invention, so they will not be elaborated upon here.

[0030] As an optional embodiment, if the optical element 4 is offset, a slight defocus will occur at the focal plane position, causing the multimode fiber 5 to receive different spectral information, which can be reflected by the energy distribution curve 9. The amount of defocus can be determined based on the energy distribution curve 9, and the optical element 4 can be corrected based on the amount of defocus.

[0031] Although embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present invention.

[0032] The specific embodiments of the present invention described above do not constitute a limitation on the scope of protection of the present invention. Any other corresponding changes and modifications made in accordance with the technical concept of the present invention should be included within the scope of protection of the claims of the present invention.

Claims

1. A system for measuring the pose of optical components in a large-aperture telescope, characterized in that, include: Optical components, light output terminal, pentaprism, light receiver, and solution network; The optical element includes a first reflecting surface and a second reflecting surface; The optical output terminal includes a broadband light source, an optical switch, and a photon lead; The optical receiver includes a multimode fiber, a wavelength division multiplexer, and a point detector. The optical switch controls the broadband light source to output at least three broadband beams at staggered times. Each broadband beam illuminates a pentaprism through the photon lead. The number of pentaprisms is equal to the number of broadband beams. All pentaprisms are arranged on the same annular track. The pentaprisms illuminate different points on the first reflecting surface and are reflected by the first reflecting surface to the second reflecting surface. The second reflecting surface reflects the broadband beam to the multimode fiber. The multimode fiber transmits the broadband beam to the wavelength division multiplexer for wavelength division multiplexing. The optical information of the broadband beam is acquired by the detector at the connection point of the wavelength division multiplexer, and the optical information of the broadband beam is calculated by the solution network to obtain the six-dimensional position information of the optical element.

2. The optical element pose measurement system for a large-aperture telescope as described in claim 1, characterized in that, The pentaprism is used to precisely deflect a broadband beam of light by 90 degrees.

3. The optical element pose measurement system for a large-aperture telescope as described in claim 1, characterized in that, The optical switch is used to switch the output broadband beam, ensuring that only one broadband beam is output at any given time.

4. The optical element pose measurement system for a large-aperture telescope as described in claim 1, characterized in that, The multimode fiber is positioned at the focal plane of the system. When the optical element shifts, it generates a defocusing amount, causing the multimode fiber to receive different spectral information.

5. The optical element pose measurement system for a large-aperture telescope as described in claim 1, characterized in that, All broadband beams may be emitted from the same photon lead, or from different photon leads.

6. The optical element pose measurement system for a large-aperture telescope as described in claim 1, characterized in that, The solution network employs a deep learning neural network that has completed calibration. The input layer of the solution network is the energy intensity obtained by the point detector, i.e., the light information.

7. The optical element pose measurement system for a large-aperture telescope as described in claim 1, characterized in that, The first reflecting surface is an annular reflecting surface, and the second reflecting surface is a circular reflecting surface.

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