Stress testing apparatus, method and system for an axi master interface

Abstract

Embodiments of the present disclosure provide an AXI master interface-oriented stress testing device, method and system, applied to the technical field of simulation testing. The device comprises a handshake module configured to complete handshake transmission with an AXI master within a preset random transformed reverse pressure ratio of a target channel corresponding to a first preset time, to test the response time irregularity and response intensity of the AXI master; wherein the random transformed reverse pressure ratio is a reverse pressure ratio under a coverage pressure and a boundary test condition, and the target channel comprises a write address channel, a write data channel and a write response channel. In this way, an AXI master interface-oriented stress testing method can be provided, thereby realizing coverage verification of the AXI master.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of computer, in particular, to the technical field of simulation test, and specifically, to an AXI master interface-oriented stress testing device, method and system. BACKGROUND

[0002] Currently, a bus protocol (Advanced eXtensible Interface, AXI) of master / slave device interconnection can work at a high clock frequency and meet the interconnection needs of a large number of devices without complex bridging. AXI adopts separate read and write channels, separate address / control and data channels, supports non-aligned transmission and burst transmission, supports outstanding and out-of-order mechanisms, and is widely used in system on chip (SoC) system architecture with high performance, high bandwidth and low latency interconnection needs. With the increase of the design size of SoC system, the AXI master device needs to handle more complex responses of slave devices through interconnection and arbitration. However, there is no AXI master interface-oriented stress testing method at present, so it is impossible to realize the coverage verification of the AXI master device. SUMMARY

[0003] The present disclosure provides an AXI master interface-oriented stress testing device, method and system.

[0004] According to a first aspect of the present disclosure, an AXI master interface-oriented stress testing device is provided. The device comprises:

[0005] A handshake module is configured to complete handshake transmission with the AXI master device at a preset random transformed reverse pressure ratio within a first preset time corresponding to a target channel, and test the irregular response time and response intensity of the AXI master device. The random transformed reverse pressure ratio is a reverse pressure ratio under coverage pressure and boundary testing conditions, and the target channel includes a write address channel, a write data channel and a write response channel.

[0006] According to any possible implementation of the above-mentioned aspect, further provided is an implementation, wherein the target channel further includes a read address channel and a read data channel.

[0007] According to any possible implementation of the above-mentioned aspect, further provided is an implementation, wherein the AXI master device includes a plurality of

[0008] The handshake module is further configured to complete transmission handshake with each AXI master device according to a preset random transformation of a reverse pressure ratio within a first preset time corresponding to a target channel of each AXI master device, and perform competitive pressure testing of the AXI master device interface.

[0009] According to the aspect and any possible implementation manner described above, an implementation manner is further provided, and the handshake module comprises a plurality of;

[0010] Each handshake module is configured to complete transmission handshake according to a preset random transformation of a reverse pressure ratio within a first preset time corresponding to a target channel of an AXI master device in a test environment in which a test case of the AXI master device is run, so as to perform response delay pressure testing of the AXI master device interface in the presence of a plurality of AXI slave devices.

[0011] According to the aspect and any possible implementation manner described above, an implementation manner is further provided, and the device further comprises:

[0012] The cache module is configured to cache transmission information of the write address channel, the write data channel and the read address channel, and match the IDs of the addresses and the data in the transmission information;

[0013] The storage module is configured to simulate a memory model of an AXI slave device, and store the matched addresses and data in the transmission in the cache module;

[0014] The disorder module is configured to generate a disorder mode according to a return delay and a return order of a response and data returned to an AXI master device according to a second preset time, according to the addresses and the data in the transmission in the cache module and the matched transmission in the storage module;

[0015] The handshake module is further configured to complete transmission handshake of the write response channel or the read data channel according to the disorder mode, so as to test response disorder of the AXI master device interface.

[0016] According to the aspect and any possible implementation manner described above, an implementation manner is further provided, and the cache module is specifically configured to cache transmission of the write address channel, the write data channel and the read address channel in a queue caching mode.

[0017] According to a second aspect of the present disclosure, an AXI master device interface-oriented pressure testing method is provided. The method comprises:

[0018] The handshake with the AXI master device is completed at a preset random transformed back pressure ratio in a first preset time corresponding to the target channel, and the response time irregularity and response density of the AXI master device are tested; wherein the random transformed back pressure ratio is a back pressure ratio in a pressure and boundary test case, and the target channel includes a write address channel, a write data channel and a write response channel.

[0019] According to a third aspect of the present disclosure, a pressure test system for an AXI master device interface is provided. The system includes an AXI master device and a pressure test device for the AXI master device interface;

[0020] The AXI master device and the pressure test device for the AXI master device interface are connected through a target channel, and the handshake with the AXI master device is completed at a preset random transformed back pressure ratio in a first preset time corresponding to the target channel, and the response time irregularity and response density of the AXI master device are tested; wherein the random transformed back pressure ratio is a back pressure ratio in a pressure and boundary test case, and the target channel includes a write address channel, a write data channel and a write response channel.

[0021] According to a fourth aspect of the present disclosure, an electronic device is provided. The electronic device includes a memory and a processor, the memory has a computer program stored thereon, and the processor implements the method as described above when executing the program.

[0022] According to a fifth aspect of the present disclosure, a computer readable storage medium is provided, which has a computer program stored thereon, and the program is executed by a processor to implement the method as described above.

[0023] The pressure test device, method and system for the AXI master device interface provided by the embodiments of the present application can complete the handshake with the AXI master device through the handshake module of the pressure test device for the AXI master device interface at a preset random transformed back pressure ratio in a first preset time corresponding to the target channel, and test the response time irregularity and response density of the AXI master device; wherein the random transformed back pressure ratio is a back pressure ratio in a pressure and boundary test case, and the target channel includes a write address channel, a write data channel and a write response channel; therefore, the random transformed back pressure ratio in the pressure and boundary test case is used to complete the test of the response time irregularity and response density of the AXI master device, a pressure test method for the AXI master device interface is provided, and the coverage verification of the AXI master device is realized.

[0024] It is to be understood that the description in the summary is not intended to identify key or essential features of embodiments of the disclosure, nor is it intended to limit the scope of the disclosure. Other features of the disclosure will be apparent from review of the description below and the associated drawings. BRIEF DESCRIPTION OF DRAWINGS

[0025] The above and other features, advantages and aspects of embodiments of the present disclosure will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings in which:

[0026] Figure 1 A schematic diagram of a stress test system facing an AXI master interface according to an embodiment of the present disclosure is shown;

[0027] Figure 2 A schematic diagram of a stress test device facing an AXI master interface according to an embodiment of the present disclosure is shown; Figure 1 A schematic diagram of a stress test device facing an AXI master interface according to an embodiment of the present disclosure is shown;

[0028] Figure 3 A schematic diagram of a stress test method facing an AXI master interface between an AXI master and a stress test device facing an AXI master interface according to an embodiment of the present disclosure is shown; Figure 1 A schematic diagram of a stress test method facing an AXI master interface between an AXI master and a stress test device facing an AXI master interface according to an embodiment of the present disclosure is shown;

[0029] Figure 4 A block diagram of an exemplary electronic device capable of implementing embodiments of the present disclosure is shown. DETAILED DESCRIPTION

[0030] In order to make the objects, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions in the embodiments of the present disclosure will be described clearly and completely below with reference to the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are some but not all of the embodiments of the present disclosure. Based on the embodiments in the present disclosure, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of the present disclosure.

[0031] In addition, the term "and / or" herein is merely a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B can represent the three cases of A alone, A and B together, and B alone. In addition, the character " / " herein generally represents an "or" relationship between the front and rear associated objects.

[0032] In this disclosure, a backpressure ratio with random variations under coverage stress and boundary test conditions is used to complete the test of irregular response time and dense response of AXI master device. This provides a stress test method for AXI master device interface, thereby realizing the coverage verification of AXI master device.

[0033] Figure 1 A schematic diagram of a stress testing system 100 for an AXI master device interface according to an embodiment of the present disclosure is shown. The system 100 includes an AXI master device 110 and a stress testing apparatus 120 for an AXI master device interface.

[0034] like Figure 1 As shown, the AXI master device 110 and the stress testing device 120 facing the AXI master device interface are connected through five independent channels, namely the write address channel, write data channel, read address channel, write response channel and read data channel.

[0035] In some embodiments, the reverse voltage ratio of the five independent channels can be configured independently. For example, the reverse voltage ratio of the write address channel can be adjusted by the AWREADY signal; the reverse voltage ratio of the write data channel can be adjusted by the WREADY signal; the reverse voltage ratio of the read address channel can be adjusted by the ARREADY signal; the reverse voltage ratio of the write address channel can be adjusted by the BVALID signal; and the reverse voltage ratio of the read data channel can be adjusted by the RVALID signal.

[0036] In some embodiments, the AXI master device 110 and the stress testing device 120 facing the AXI master device interface are connected through a target channel. The stress testing device 120 facing the AXI master device interface completes a transmission handshake with the AXI master device 110 under a preset randomly changing back pressure ratio within a first preset time corresponding to the target channel, testing the irregularity of the response time and the density of the response of the AXI master device 110. The randomly changing back pressure ratio is the back pressure ratio under coverage pressure and boundary test conditions, and the target channel includes a write address channel, a write data channel, and a write response channel.

[0037] In some embodiments, the target channel further includes a read address channel and a read data channel. The AXI master device 110 and the stress testing device 120 facing the AXI master device interface are connected through the target channel. The stress testing device 120 facing the AXI master device interface completes the transmission handshake with the AXI master device 110 in an out-of-order manner, which is determined by randomly shuffling the response and data return delay and return order of the AXI master device 110 within a second preset time, and tests the out-of-order response of the AXI master device 110.

[0038] The handshake module 121 is configured to complete handshake with the AXI master 110 under a preset random change of a reverse pressure ratio in a first preset time corresponding to a target channel, and test response time irregularity and response intensity of the AXI master, so as to provide a pressure test method for the interface of the AXI master 110, and thus realize coverage verification of the AXI master 110.

[0039] The above is the introduction of the system embodiment, and the following further describes the scheme of the present disclosure through the device embodiment.

[0040] Figure 2 A schematic diagram of the pressure test device for the interface of the AXI master shown in FIG. 1 is shown. Figure 1 As shown in FIG. 2, the device 120 includes: Figure 2

[0041] The handshake module 121 is configured to complete handshake with the AXI master under a preset random change of a reverse pressure ratio in a first preset time corresponding to a target channel, and test response time irregularity and response intensity of the AXI master, wherein the random change of the reverse pressure ratio is a reverse pressure ratio in a coverage pressure and a boundary test case, and the target channel includes a write address channel, a write data channel, and a write response channel.

[0042] In some embodiments, the handshake can be an AXI protocol handshake with adjustable reverse pressure ratio. The reverse pressure ratio can be randomly changed under certain constraints, for example, the signal can be randomly set to 0 and 1 within 100 time periods. The first preset time can be set according to actual user requirements.

[0043] In some embodiments, before testing the response time irregularity and response intensity of the AXI master, a preset test case and a preset random test parameter need to be obtained, then a change function corresponding to the preset random test parameter is determined according to the preset random test parameter, and then a test environment is run according to the preset test case.

[0044] In some embodiments, under the running of the test environment, the handshake of the write address channel, the write data channel, and the write response channel is completed through the AWREADY signal, the WREADY signal, and the BVALID signal with adjustable reverse pressure ratio.

[0045] ​The preset test case can be a test case pre-written by a user according to actual requirements, different preset test cases can be set to test the response time and density of the AXI master under different functions. The preset random test parameter can be a random transformed back pressure ratio pre-configured by the user according to actual requirements; and the change function can be a change function of the back pressure ratio changing with time, such as randomly changing the back pressure ratio every 1 millisecond or every 10 milliseconds.

[0046] In some embodiments, the adjusted random transformed back pressure ratio covers pressure and boundary test cases. For example, taking the write channel as an example, when the back pressure ratio is set to 50% and the WREADY signal of the AXI master is 1, the WREADY signal has a 50% probability of being 1, and the back pressure ratio is randomly adjusted between 0 and 100%, and the adjustment signal is randomly set to 1 under any back pressure ratio.

[0047] In some embodiments, the handshake module 121 simulates the transmission handshake between the AXI slave and the AXI master, and adjusts the random transformed back pressure ratio under the condition of covering the pressure and boundary test to achieve the pressure test for the AXI master write, and the pressure test items are response density and response time irregularity.

[0048] According to the embodiments of the present disclosure, the following technical effects are achieved:

[0049] Under the preset random transformed back pressure ratio in the first preset time corresponding to the target channel, the handshake module of the pressure test device facing the AXI master interface completes the transmission handshake with the AXI master, and tests the response time irregularity and response density of the AXI master; wherein the random transformed back pressure ratio is the back pressure ratio under the condition of covering the pressure and boundary test, and the target channel includes the write address channel, the write data channel and the write response channel; based on this, the random transformed back pressure ratio under the condition of covering the pressure and boundary test is used to complete the test of the response time irregularity and the response density of the AXI master, which can provide a pressure test method facing the AXI master interface, thereby realizing the coverage verification of the AXI master.

[0050] In some embodiments, the above target channel further includes a read address channel and a read data channel.

[0051] In some embodiments, under the running test environment, the handshake module 121 completes the transmission handshake of the read address channel and the read data channel with the AXI master through the ARREADY signal and the RVALID signal with adjustable back pressure ratio.

[0052] Through the above device, the random transformed back pressure ratio is adjusted under the condition of covering the pressure and boundary test to achieve the pressure test for the AXI master write and read, and the pressure test items are response density and response time irregularity.

[0053] In some embodiments, the AXI master device comprises a plurality of AXI master devices.

[0054] The handshake module 121 is further configured to complete transmission handshake with each AXI master device according to the inverse pressure ratio of the preset random transformation within the first preset time corresponding to the target channel of each AXI master device, and perform competitive pressure testing on the AXI master device interfaces.

[0055] In some embodiments, the plurality of AXI master devices correspond to one AXI master device interface-oriented pressure testing device, and each AXI master device is connected to the handshake module in the AXI master device interface-oriented pressure testing device through a target channel.

[0056] Based on the pressure testing of the handshake module in the device, which is dense and irregular in response time, the competitive pressure testing on the AXI master device interfaces is performed by connecting the plurality of AXI master devices respectively.

[0057] In some embodiments, the handshake module comprises a plurality of handshake modules.

[0058] Each handshake module is configured to complete transmission handshake according to the inverse pressure ratio of the preset random transformation within the first preset time corresponding to the target channel of the AXI master device in a test environment in which a test case of the AXI master device is running, so as to perform response delay pressure testing on the AXI master device interface in the presence of a plurality of AXI slave devices.

[0059] In some embodiments, one AXI master device corresponds to a plurality of handshake modules in the AXI master device interface-oriented pressure testing device, and each handshake module in the AXI master device interface-oriented pressure testing device is connected to the AXI master device through a target channel.

[0060] By connecting the handshake modules in the plurality of devices to the AXI master device respectively, the response delay pressure testing on the AXI master device interface is performed, which is based on the pressure testing of the AXI master device, which is dense and irregular in response time.

[0061] In some embodiments, the device further comprises:

[0062] The cache module 122 is configured to cache transmission information of the write address channel, the write data channel and the read address channel, and match the IDs of the addresses and data in the transmission information.

[0063] The storage module 123 is configured to simulate a memory model of the AXI slave device, and store the matched address and data in the transmission in the cache module;

[0064] The disorder module 124 is configured to generate a disorder mode according to the return delay and the return order of the response and the data returned to the AXI master device according to the transmission in the cache module and the matched address and data in the transmission in the storage module.

[0065] The handshake module 121 is further configured to complete the transmission handshake of the write response channel or the read data channel according to the disorder mode, so as to test the response disorder of the AXI master device interface.

[0066] In some embodiments, the cache module 122 supports the outstanding mechanism of the AXI protocol. The cache module 122 matches the ID of the address and the data in the transmission information, so that the transmission packets in the write channel and the read channel are consistent, the number difference of the transmission packets between the channels is reduced, and the data loss and disorder are avoided, for example, the address is stored in the cache module 122 first, and then the data is matched.

[0067] In some embodiments, the cache module 122 sets a limit value of the maximum number difference of the transmission packets, so as to cover various transmission scenarios under the interleaving mechanism of the AXI protocol to the greatest extent. The various transmission scenarios can include intermittent or continuous write transmission and intermittent or continuous read transmission.

[0068] In some embodiments, the storage of the storage module 123 supports bit operation, and can support all configurable cases of the LEN signal or the SIZE signal in the AXI protocol. The storage module 123 simulates the memory model of the AXI slave device, so as to realize the read-write access function loop of the AXI master device, the memory data bit width is consistent with the AXI data bit width, the bit operation is supported, and transmission scenarios under all traversal configurations of the SIZE signal and the STRB signal of the AXI protocol are supported to the greatest extent.

[0069] In some embodiments, the disorder module 124 can perform transmission interaction of the write response channel and the read data channel, the transmission delay is random under certain constraints, the transmission order is disordered under certain constraints, and the out-of-order mechanism of the AXI protocol is supported.

[0070] In some embodiments, the second preset time can be set according to actual needs of a user, and the return delay and the return order can be set according to actual needs of the user.

[0071] In some embodiments, the disorder module 124 generates a disorder response signal, randomly delays the transmission of the write response channel and read data channel signals returned to the AXI master device, and when the queue transmission is greater than 1, randomly sends in sequence to maximize the coverage of various transmission scenarios under the AXI protocol out-of-order mechanism, such as intermittent or continuous write transmission and intermittent or continuous read transmission.

[0072] Through the above device, the response disorder test of the AXI master device is completed by using the disorder mode of randomly disordering the return delay and return order of the response and data returned to the AXI master device, which can further provide a stress test method for the AXI master device interface, thereby realizing the coverage verification of the AXI master device.

[0073] In some embodiments, the above cache module 122 is specifically used to cache the transmission of the write address channel, the write data channel and the read address channel in a queue.

[0074] In some embodiments, considering that the random back pressure of the handshake module 121 will cause a large difference in the number of transmission packets between channels, the cache module 122 can cache the transmission of the write address channel, the write data channel and the read address channel into a queue, so as to traverse the address and data and improve the read-write efficiency.

[0075] In some embodiments, the write address channel, the write data channel and the read address channel cached into the queue also do not set a limit value for the maximum transmission packet number difference, so as to maximize the coverage of various transmission scenarios under the AXI protocol interleaving mechanism.

[0076] Through the above device, the transmission of the write address channel, the write data channel and the read address channel is stored into a queue, so as to traverse the address and data and improve the read-write efficiency, thereby further providing a stress test method for the AXI master device interface, thereby realizing the coverage verification of the AXI master device.

[0077] The above is the introduction of the device embodiment, and the following method embodiment further describes the scheme of the present disclosure.

[0078] Figure 3 A schematic diagram of a stress test method 300 for an AXI master device interface is shown between the AXI master device and the stress test device for the AXI master device interface shown in Figure 1

[0079] ​In block 310, a handshake with the AXI master is completed in a preset random change reverse pressure ratio of a first preset time corresponding to the target channel, and the response time and density of the AXI master are tested, wherein the random change reverse pressure ratio is a reverse pressure ratio in a coverage pressure and boundary test case, and the target channel includes a write address channel, a write data channel, and a write response channel.

[0080] In some embodiments, the target channel further includes a read address channel and a read data channel, and a handshake with the AXI master is completed in a random change return delay and return order of the response and data returned to the AXI master in a second preset time, and the response disorder of the AXI master is tested.

[0081] By using the random change reverse pressure ratio in the coverage pressure and boundary test case, the response time and density of the AXI master are tested, and a pressure test method for the AXI master interface is provided, so that the coverage verification of the AXI master is realized.

[0082] It should be noted that, for the foregoing method embodiments, in order to simply describe, they are all expressed as a series of action combinations, but those skilled in the art should know that the disclosure is not limited by the action order described, because according to the disclosure, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should know that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required by the disclosure.

[0083] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the described method can refer to the corresponding process in the foregoing pressure test device for the AXI master interface, which will not be repeated here.

[0084] In the technical solution of the disclosure, the acquisition, storage and application of user personal information comply with relevant laws and regulations and do not violate public order and good customs.

[0085] According to the embodiments of the disclosure, the disclosure further provides an electronic device, a readable storage medium and a computer program product.

[0086] Figure 4A schematic block diagram of an electronic device 400 that can be used to implement embodiments of the present disclosure is shown. The electronic device is intended to represent various forms of digital computers, such as laptops, desktops, tablets, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device can also represent various forms of mobile devices, such as personal digital assistants, cellular telephones, smartphones, wearable devices, and other similar computing devices. The components shown here, their connections and relationships, and their functions, are meant to be examples only, and are not intended to limit the implementations of the present disclosure described and / or claimed in this document.

[0087] The electronic device 400 includes a computing unit 401 that can perform various appropriate actions and processes in accordance with a computer program stored in a ROM 402 or a computer program loaded into a RAM 403 from a storage unit 408. In the RAM 403, various programs and data required for the operation of the electronic device 400 can also be stored. The computing unit 401, the ROM 402, and the RAM 403 are connected to each other through a bus 404. An I / O interface 405 is also connected to the bus 404.

[0088] Various components in the electronic device 400 are connected to the I / O interface 405, including an input unit 406, such as a keyboard, a mouse, and the like; an output unit 407, such as various types of displays, speakers, and the like; a storage unit 408, such as a magnetic disk, an optical disk, and the like; and a communication unit 409, such as a network card, a modem, a wireless communication transceiver, and the like. The communication unit 409 allows the electronic device 400 to exchange information / data with other devices through a computer network, such as the Internet, and / or various telecommunication networks.

[0089] The computing unit 401 can be various general and / or special purpose processing components with processing and computing capabilities. Some examples of the computing unit 401 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various specialized artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The computing unit 401 performs various methods and processes described above, such as the method 300. For example, in some embodiments, the method 300 can be implemented as a computer software program tangibly embodied in a machine-readable medium, such as the storage unit 408. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 400 via the ROM 402 and / or the communication unit 409. When the computer program is loaded onto the RAM 403 and executed by the computing unit 401, one or more steps of the method 300 described above can be performed. Alternatively, in other embodiments, the computing unit 401 can be configured to perform the method 300 by any other appropriate means, such as by means of firmware.

[0090] Various implementations of the systems and techniques described above can be realized in digital electronic circuitry, integrated circuitry, a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), a system on a chip (SOC), a programmable logic device (PLD), a computer hardware, firmware, software, and / or combinations thereof. These various implementations can include implementation in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device.

[0091] Program code for carrying out methods of the present disclosure can be written in any combination of one or more programming languages. The program code can be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the program code, when executed by the processor or controller, produces the functions / operations specified in the flowcharts and / or the block diagrams. The program code can be executed entirely on a machine, partially on a machine, partially on a machine as a stand-alone software package, partially on a machine and partially on a remote machine or entirely on a remote machine or server.

[0092] In the context of this disclosure, a machine-readable medium can be a tangible medium that contains or stores a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium can include but is not limited to an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of the machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0093] To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having a display device for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the computer. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0094] The systems and techniques described here can be implemented in a computing system that includes a back end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front end component (e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network (LAN), a wide area network (WAN), and the Internet.

[0095] The computer system can include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server can arise by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, a server of a distributed system, or a server combined with a blockchain.

[0096] It should be understood that the various forms of flow shown above can be used to reorder, add, or remove steps. For example, the steps recited in the present disclosure can be performed in parallel, in series, or in a different order, as long as the desired results of the technology disclosed in the present disclosure are achieved, which is not limited herein.

[0097] The specific implementation described above does not constitute a limitation on the protection scope of the present disclosure. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A stress testing device for an AXI master interface, characterized in that, Comprise: The handshake module is used for completing handshake with the AXI master device under the preset random transformed back pressure ratio in the first preset time corresponding to the target channel, testing the response time irregularity and response density of the AXI master device, wherein the random transformed back pressure ratio is the back pressure ratio under the coverage pressure and the boundary test condition, and the target channel comprises a write address channel, a write data channel and a write response channel.

2. The apparatus of claim 1, wherein, The target channel further comprises a read address channel and a read data channel.

3. The apparatus of claim 1, wherein, The AXI master device comprises a plurality of The handshake module is further used for respectively completing handshake with each AXI master device according to the preset random transformed back pressure ratio in the first preset time corresponding to the target channel of each AXI master device, and performing the competitive pressure test of the AXI master device interface.

4. The apparatus of claim 1, wherein, The handshake module comprises a plurality of Each handshake module is used for completing handshake according to the preset random transformed back pressure ratio in the first preset time corresponding to the target channel of the AXI master device in the test environment of the test case of the AXI master device, so as to perform the response delay pressure test of the AXI master device interface in the case that a plurality of AXI slave devices exist.

5. The apparatus of claim 2, wherein, The device further comprises: The cache module is used for caching the transmission information of the write address channel, the write data channel and the read address channel, and matching the ID of the address and the data in the transmission information; The storage module is used for simulating the memory model of the AXI slave device, and storing the matched address and data in the transmission in the cache module; The out-of-order module is used for generating an out-of-order mode according to the return delay and the return order of the response and the data returned to the AXI master device according to the random disturbance in the second preset time according to the address and the data in the transmission in the cache module and the matched transmission in the storage module; The handshake module is further used for completing the transmission handshake of the write response channel or the read data channel according to the out-of-order mode, so as to test the response out-of-order of the AXI master device interface.

6. The apparatus of claim 5, wherein, The cache module is specifically used for adopting the queue caching mode to cache the transmission of the write address channel, the write data channel and the read address channel.

7. A method of stress testing an AXI master interface, the method comprising: Comprise: The handshake module is used for completing handshake with the AXI master device under the preset random transformed back pressure ratio in the first preset time corresponding to the target channel, testing the response time irregularity and response density of the AXI master device, wherein the random transformed back pressure ratio is the back pressure ratio under the coverage pressure and the boundary test condition, and the target channel comprises a write address channel, a write data channel and a write response channel.

8. A stress test system for an AXI master interface, characterized in that, The device comprises an AXI master device and a pressure test device facing the AXI master device interface; The AXI master and the pressure testing device facing the AXI master interface are connected through a target channel, and the pressure testing device facing the AXI master interface completes handshake with the AXI master at a preset random reverse pressure ratio of the target channel in a first preset time, tests the response time irregularity and density of the AXI master, wherein the random reverse pressure ratio is a reverse pressure ratio under a coverage pressure and a boundary test condition, and the target channel includes a write address channel, a write data channel and a write response channel.

9. An electronic device, comprising: Comprise: at least one processor; and a memory connected in communication with the at least one processor; The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute the method of claim 7.

10. A non-transitory computer-readable storage medium having stored thereon computer instructions, wherein, The computer instructions are used to enable the computer to execute the method of claim 7.

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