Millimeter wave channel characteristic extraction method, device and storage medium containing small aperture

By combining full-wave simulation and ray tracing methods, the directivity pattern and transmission coefficient of small apertures are obtained, which solves the problem of inaccurate channel characteristic extraction by ray tracing in small aperture scenarios and achieves a more accurate description of channel characteristics.

CN116137550BActive Publication Date: 2025-10-03JIMEI UNIV
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Patent Information

Application Number
CN202310240653.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-03-14
Publication Date
2025-10-03
Estimated Expiration
2043-03-14

AI Technical Summary

Technical Problem

Existing ray tracing methods cannot accurately obtain channel characteristics when dealing with small aperture scenes, resulting in inaccurate channel extraction results.

Method used

The full-wave simulation method is used to obtain the directivity pattern and transmission coefficient of the tiny aperture, combined with the ray tracing method to generate the power delay distribution, and the convolution operation is used to optimize the channel characteristic extraction, including obtaining the channel characteristics of the simulated transmitter and receiver in adjacent metal cavities.

Benefits of technology

The accuracy of channel feature extraction in small aperture scenarios is improved, and the description of the time domain diffusion degree of multipath propagation is enhanced.

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Abstract

The present application is applicable to the field of electromagnetic wave and microwave technology, and provides a method, device and readable storage medium for extracting characteristics of millimeter wave channels containing a small aperture. The method includes acquiring scene data, acquiring a directional pattern of the small aperture according to a full-wave simulation method, generating a first power delay distribution from a first simulated transmitting end to a first simulated receiving end according to a ray tracing method and the directional pattern of the small aperture, generating a second power delay distribution from a second simulated transmitting end to a second simulated receiving end according to the ray tracing method and the directional pattern of the small aperture, and generating a third power delay distribution from the first simulated transmitting end to the second simulated receiving end by combining the first power delay distribution and the second power delay distribution. The channel characteristics in the first metal cavity and the second metal cavity are obtained by the ray tracing method, and the directional pattern and transmission coefficient at the small aperture are obtained by the full-wave simulation method. Combining the ray tracing method and the full-wave simulation method can optimize the accuracy of the channel extraction results.
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Description

Technical Field

[0001] The present application belongs to the field of electromagnetic wave and microwave technology, and in particular relates to a method, device and storage medium for extracting characteristics of a millimeter wave channel containing a tiny aperture. Background Art

[0002] A channel is a metaphor for the path between the transmitter and receiver in wireless communications. Channel characteristics primarily include delay, power, and field strength distribution. Currently, the most commonly used channel characteristic extraction and modeling methods for delay and power are primarily ray tracing. Ray tracing predicts ray propagation for a given scenario model and extracts the field strength at the predicted point to obtain channel characteristics. However, ray tracing is only applicable to indoor or outdoor scenarios, where field strength and power values ​​are calculated through the interaction of rays with geometric surfaces (reflection, diffraction, and scattering, etc.). However, for certain scenarios, such as tiny apertures (electrically small dimensions), ray tracing cannot accurately obtain channel information because electromagnetic waves can diffract at these tiny apertures, leading to inaccurate channel extraction results. Summary of the Invention

[0003] The embodiments of the present application provide a method, device, and storage medium for extracting characteristics of a millimeter-wave channel containing a tiny aperture, which can solve the technical problem of inaccurate channel extraction results.

[0004] In a first aspect, an embodiment of the present application provides a method for extracting characteristics of a millimeter-wave channel with a small aperture, comprising:

[0005] Acquiring scene data, the scene data including at least a first metal cavity and a second metal cavity disposed adjacent to each other, the first metal cavity and the second metal cavity being connected via a micro-aperture, a first simulated transmitting end and a first simulated receiving end being located within the first metal cavity, a second simulated transmitting end and a second simulated receiving end being located within the second metal cavity, the first simulated receiving end and the second simulated transmitting end being disposed proximate to the micro-aperture, and the first simulated receiving end and the second simulated transmitting end being disposed at opposite ends of the micro-aperture, respectively;

[0006] Obtaining the directivity pattern of the micro-aperture according to a full-wave simulation method;

[0007] generating a first power delay distribution from the first simulated transmitting end to the first simulated receiving end according to a ray tracing method and a directivity pattern of the micro-aperture;

[0008] generating a second power delay distribution from the second simulated transmitting end to the second simulated receiving end according to a ray tracing method and a directivity pattern of the micro-aperture;

[0009] A third power delay distribution from the first analog transmitting end to the second analog receiving end is generated according to the first power delay distribution and the second power delay distribution.

[0010] In a possible implementation of the first aspect, generating a first power delay distribution from the first simulated transmitting end to the first simulated receiving end according to a ray tracing method and a directional pattern of the small aperture includes:

[0011] Generate a transition power delay distribution from the first simulated transmitting end to the first simulated receiving end according to a ray tracing method, and obtain the first power delay distribution according to the transition power delay distribution and the directivity pattern of the small aperture; or

[0012] Determine that the receiving pattern of the ray tracing method at the first simulated receiving end is the pattern of the small aperture, and generate a first power delay distribution after the first simulated transmitting end transmits to the first simulated receiving end according to the ray tracing method.

[0013] In a possible implementation of the first aspect, generating a second power delay distribution from the second simulated transmitting end to the second simulated receiving end according to a ray tracing method and a directivity pattern of the small aperture includes:

[0014] Determine that the transmission pattern at the second simulated receiving end by the ray tracing method is the pattern of the small aperture, and generate a second power delay distribution after the second simulated transmitting end transmits to the second simulated receiving end according to the ray tracing method.

[0015] In a possible implementation of the first aspect, generating a third power delay profile from the first analog transmitting end to the second analog receiving end based on the first power delay profile and the second power delay profile includes:

[0016] The number of paths from the first analog transmitting end to the first analog receiving end is M, and the number of paths from the second analog transmitting end to the second analog receiving end is N. A convolution operation is performed on the first power delay distribution and the second power delay distribution to generate the third power delay distribution from the first analog transmitting end to the second analog receiving end.

[0017] In a possible implementation of the first aspect, a convolution operation is performed on the power delay distribution of the first power delay distribution and the second power delay distribution, and the convolution result is:

[0018] Among them, δ is the sampling function, τ i is the delay of the i-th path at the first simulated receiving end, τ j is the delay of the jth path of the second simulated receiving end, ai is the power of the i-th path of the first simulated receiving end, b j is the power of the j-th path of the second simulated receiving end.

[0019] In a possible implementation of the first aspect, the power from the first analog transmitting end to the second analog receiving end is a i +b j , the time delay from the first analog transmitting end to the second analog receiving end is τ i +τ j .

[0020] In a possible implementation of the first aspect, the power from the first analog transmitting end to the second analog receiving end is a i +b j +c d , the time delay from the first analog transmitting end to the second analog receiving end is τ i +τ j +τ d , c d is the transmission coefficient of the signal propagating in the tiny aperture, τ d is the time delay of the signal propagating in the tiny aperture.

[0021] In a possible implementation of the first aspect, the number of first analog transmitting ends is P, the number of second analog receiving ends is Q, and P·Q third power delay profiles from the first analog transmitting end to the second analog receiving end are generated based on the P first power delay profiles and the Q second power delay profiles, where P and Q are both positive integers.

[0022] In a second aspect, an embodiment of the present application provides a device for extracting millimeter wave channel characteristics, including:

[0023] A scene acquisition unit, configured to acquire scene data including a micro-aperture;

[0024] A full-wave simulation unit, configured to perform full-wave simulation on the micro-aperture and obtain a directivity pattern of the micro-aperture;

[0025] The ray tracing unit is used to generate a first power delay distribution after the first simulated transmitting end transmits to the first simulated receiving end, and to generate a second power delay distribution after the second simulated transmitting end transmits to the second simulated receiving end.

[0026] A convolution unit is used to generate a third power delay distribution from the first analog transmitting end to the second analog receiving end.

[0027] In a third aspect, an embodiment of the present application provides a network device comprising: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor implements the steps of any of the above-mentioned method embodiments when executing the computer program.

[0028] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it can implement the steps in the above-mentioned method embodiments.

[0029] In a fifth aspect, an embodiment of the present application provides a computer program product. When the computer program product is run on a terminal device, the terminal device executes the method for extracting millimeter-wave channel characteristics containing a small aperture as described in any one of the above-mentioned first aspects.

[0030] It can be understood that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here.

[0031] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the present application is applied to the extraction of millimeter wave channel characteristics in a scene containing a tiny aperture, and the scene data includes at least a first metal cavity and a second metal cavity arranged adjacent to each other, the first metal cavity having a first simulated transmitting end, the second metal cavity having a second simulated receiving end, and the two ends of the tiny aperture connecting the first metal cavity and the second metal cavity are the first simulated receiving end and the second simulated transmitting end, respectively. The first simulated transmitting end has a signal source, and the signal source is transmitted to the first simulated receiving end, the second simulated transmitting end, and the second simulated receiving end in sequence. The channel characteristics in the first metal cavity and the second metal cavity are obtained by ray tracing, and the directional pattern and transmission coefficient at the tiny aperture are obtained by full-wave simulation. Combining the ray tracing method and the full-wave simulation method can optimize the accuracy of the channel extraction results. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0033] Figure 1 is a schematic diagram of a channel extraction scenario provided by an embodiment of the present application;

[0034] Figure 2 This is a flow chart of a method for extracting characteristics of a millimeter-wave channel with a small aperture provided in one embodiment of the present application;

[0035] Figure 3 This is a power delay distribution convolution result diagram provided by an embodiment of the present application;

[0036] Figure 4 1 is a schematic structural diagram of a device for extracting millimeter wave channel characteristics provided in one embodiment of the present application;

[0037] Figure 5 It is a structural diagram of a network device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0038] In the following description, specific details such as specific system structures and techniques are provided for purposes of illustration rather than limitation to facilitate a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid obscuring the description of the present application with unnecessary detail.

[0039] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or collections thereof.

[0040] It will also be understood that the term "and / or" used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0041] As used in this specification and the appended claims, the term "if" can be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.

[0042] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0043] References to "one embodiment" or "some embodiments" in this specification mean that a particular feature, structure, or characteristic described in conjunction with that embodiment is included in one or more embodiments of the present application. Thus, phrases such as "in one embodiment," "in some embodiments," "in other embodiments," and "in other embodiments" appearing in various places in this specification do not necessarily refer to the same embodiment, but rather mean "one or more but not all embodiments," unless otherwise specifically emphasized. The terms "including," "comprising," "having," and variations thereof all mean "including but not limited to," unless otherwise specifically emphasized.

[0044] Channel is a figurative metaphor for the path between the sender and receiver in wireless communications. For radio waves, there is no tangible connection between the sender and the receiver, and there may be more than one propagation path. In order to vividly describe the work between the sender and the receiver, we can imagine that there is an invisible road connecting the two, and this connecting path is called a channel.

[0045] Radio waves propagate through wireless channels not along a single path but rather as a composite of numerous reflected waves transmitted along multiple paths. Because electromagnetic waves travel different distances along each path, the reflected waves from each path arrive at different times, resulting in different signal delays. When the transmitter sends a very narrow pulse signal, the signal received by the receiver is composed of many pulses with varying delays, a phenomenon known as delay spread.

[0046] Channel characteristics mainly include time delay, power and field strength distribution. Currently, the commonly used channel characteristic extraction and modeling method for time delay and power is mainly the ray tracing method.

[0047] The ray tracing method is an electromagnetic field prediction algorithm based on geometric optics and consistent diffraction theory. The ray tracing method simplifies the propagation path between the transmitter and the receiver into multiple paths that propagate along straight lines. The signals transmitted to the receiver through each path have different delays, powers, and field strengths. When the characteristic dimensions of the scene are all electrically large, the propagation path of the electromagnetic wave can be equivalent to straight-line propagation. When the characteristic dimensions of the scene are electrically small, the propagation path of the electromagnetic wave cannot be equivalent to straight-line propagation. It is necessary to take into account the wave characteristics of the electromagnetic wave and the diffraction phenomenon that occurs at electrically small dimensions. That is, after the electromagnetic wave passes through a small aperture (electrically small size), it will bypass the small aperture and continue to propagate forward. Therefore, it is necessary to propose a new channel extraction method.

[0048] The electrically large size may be a size larger than 0.5λ, and the electrically small size may be a size much smaller than the operating wavelength, such as a size smaller than 0.05λ, where λ is the operating wavelength.

[0049] Figure 2 The following is a flow chart of a method for extracting millimeter-wave channel characteristics with a small aperture, provided by this application. This method can be applied to scenarios with a small aperture, as an example and not a limitation. The small aperture is a size comparable to the operating wavelength, and the size of the small aperture is smaller than λ.

[0050] The method for extracting characteristics of a millimeter wave channel with a small aperture provided in this application includes the following steps:

[0051] S101: Get scene data. Figure 1 , the scene data at least includes a first metal cavity and a second metal cavity arranged adjacent to each other, and the first metal cavity and the second metal cavity are connected by a tiny aperture. The first metal cavity has a first analog transmitting end (TX1) and a first analog receiving end (RX1), and the second metal cavity has a second analog transmitting end (TX2) and a second analog receiving end (RX2), and the signal source can be located at the first analog transmitting end. The first analog receiving end and the second analog transmitting end are both arranged close to the tiny aperture, and the first analog receiving end and the second analog transmitting end are respectively arranged at opposite ends of the tiny aperture. It can also be understood that the signal source is emitted from the first analog transmitting end and transmitted to the first analog receiving end, the second analog transmitting end and the second analog receiving end in sequence.

[0052] The dimensions of the first metal cavity and the second metal cavity are all greater than λ, such as the length, width, depth, etc. of the first metal cavity and the second metal cavity are all greater than λ, and the size of the micro-aperture is smaller than λ.

[0053] In a possible implementation, the scene data includes a first metal cavity and a second metal cavity. A metal wall is provided between the first metal cavity and the second metal cavity, and a tiny aperture is provided on the metal wall.

[0054] In one possible implementation, the scene data includes a first metal cavity, a second metal cavity, and a third metal cavity. A metal wall is located between the first and second metal cavities, and a metal wall is located between the second and third metal cavities. Each metal wall has a micro-aperture. In other implementations, the scene data may further include a fourth metal cavity, a fifth metal cavity, and so on, which are not specifically limited here.

[0055] S102: Obtain the directivity pattern and transmission coefficient of the small aperture according to the full-wave simulation method.

[0056] The tiny aperture is located on a metal wall with a certain thickness. This allows the tiny aperture to be treated as a waveguide for full-wave simulation. If the tiny aperture has a circular cross-section, it can be treated as a circular waveguide for full-wave simulation; if the tiny aperture has a square cross-section, it can be treated as a square waveguide for full-wave simulation.

[0057] Full-wave simulation methods use numerical algorithms developed based on Maxwell's equations, such as FDTD, MLFMA, FIT, and MOM. These algorithms are all based on Maxwell's equations. Full-wave simulation methods offer accurate results and can be used to determine the directivity pattern and transmission coefficient for small apertures.

[0058] It should be noted that due to the small size of the micro-aperture, the micro-aperture can be regarded as a symmetrical structure, the end of the micro-aperture close to the first metal cavity is the first end, and the end of the micro-aperture close to the second metal cavity is the second end, and the direction diagrams of the micro-aperture at the first end and the second end are the same.

[0059] S103: Generate a first power delay distribution from the first simulated transmitting end to the first simulated receiving end according to a ray tracing method and a directivity pattern of a small aperture.

[0060] The first simulated transmitting end is assumed to have a unit transmitting source (the directional pattern is omnidirectional, and the energy in each direction is the same). The ray tracing method simulates M straight-line propagation paths from the first simulated transmitting end to the first simulated receiving end. When the signal passes through each straight-line propagation path to reach the first simulated receiving end, a time delay will be generated relative to the transmission time, and a power change will also occur. When the electromagnetic wave passes through each straight-line propagation path to reach the second simulated receiving end, it has a corresponding time delay and power change value, which is referred to as the power delay distribution. The power delay distribution from the first simulated transmitting end to the first simulated receiving end is the first power delay distribution.

[0061] In one possible implementation, the first power delay distribution is generated by the following method: generating a transition power delay distribution from the first simulated transmitting end to the first simulated receiving end using a ray tracing method, and obtaining the first power delay distribution based on the transition power delay distribution and a directivity pattern of a small aperture.

[0062] When there is no micro-aperture at the first simulated receiving end and there is no structure at the first simulated receiving end that affects the electromagnetic wave receiving capability, the power delay distribution from the first simulated transmitting end to the first simulated receiving end is generated according to the ray tracing method. In this case, there is no influence of the micro-aperture, and the power delay distribution obtained is relatively accurate. When a micro-aperture is provided at the first simulated receiving end, due to the limitation of the micro-aperture, the first simulated receiving end has different receiving capabilities for electromagnetic waves from different incoming wave directions. Therefore, the filtered power delay distribution at the first simulated receiving end generated solely according to the ray tracing method is not accurate (the power component will be affected by the incoming wave direction, and the delay remains unchanged). It is necessary to combine the transition power delay distribution with the directional pattern of the first end of the micro-aperture to obtain a more accurate power delay distribution.

[0063] Optionally, the filtered power delay distribution has power components, each corresponding to a delay, and the power components are scalars. However, each power component corresponds to a propagation path, which carries angle information when propagating to the first simulated receiving end. Thus, each power component with angle information is equivalent to a power vector. Combining the power attenuation ratio of the directional pattern of the first end of the micro-aperture in each direction, a corrected power vector can be generated. The first power delay distribution can be derived from the corrected power vector and the corresponding delay.

[0064] In one possible implementation, the first power delay distribution is generated by determining that a receiving pattern at the first simulated receiving end using a ray tracing method is a pattern of a small aperture, and generating a first power delay distribution after the first simulated transmitting end transmits to the first simulated receiving end using the ray tracing method.

[0065] When generating the first power delay distribution using the ray tracing method, it is necessary to first determine the transmission pattern of the first simulated transmitter and the reception pattern of the first simulated receiver. The transmission pattern of the first simulated transmitter is the pattern of a unit signal source, and the reception pattern of the first simulated receiver is set to the pattern of a small aperture. In other words, when generating the first power delay distribution using the ray tracing method, the power variation caused by different incoming wave directions is taken into account in advance, and then the first power delay distribution is generated using the ray tracing method.

[0066] S104: Generate a second power delay distribution from the second simulated transmitting end to the second simulated receiving end according to a ray tracing method and a directivity pattern of a small aperture.

[0067] The second simulated transmitter is assumed to have a transmission source whose radiation pattern during transmission is that of a small aperture. Ray tracing is used to simulate N straight-line propagation paths from the second simulated transmitter to the second simulated receiver (including refraction and reflection paths). As the signal travels along each straight-line propagation path to the first simulated receiver, it experiences a time delay relative to the transmission time and also experiences a power variation. Each straight-line propagation path has a corresponding time delay and power variation, collectively referred to as a power delay profile. The power delay profile from the second simulated transmitter to the second simulated receiver is referred to as the second power delay profile.

[0068] In one possible implementation, the second power delay distribution is generated by the following method. A transmission pattern at the second simulated receiving end, as determined by a ray tracing method, is determined to be a pattern of a small aperture. A second power delay distribution is generated after the second simulated transmitting end transmits to the second simulated receiving end, using the ray tracing method. The receiving pattern at the second simulated receiving end is an omnidirectional pattern (the energy is the same in each direction).

[0069] The power delay distribution from the first simulated transmitting end to the first simulated receiving end is generated using ray tracing without the influence of the small aperture at the second simulated transmitting end. The resulting power delay distribution is more accurate. However, since the second simulated transmitting end has a small aperture, the emission source of the second simulated transmitting end is derived from electromagnetic waves transmitted from the first simulated receiving end through the small aperture. Therefore, the directional pattern at the second simulated transmitting end must be set to the directional pattern of the small aperture to obtain a more accurate second power delay distribution.

[0070] S105: Generate a third power delay distribution from the first simulated transmitting end to the second simulated receiving end according to the first power delay distribution and the second power delay distribution.

[0071] The first power delay profile is the power delay profile from the first simulated transmitter to the first simulated receiver, and the second power delay profile is the power delay profile from the second simulated transmitter to the second simulated receiver. In the power delay profile at a small aperture, the power attenuation and delay are very small. When generating the third power delay profile from the first simulated transmitter to the second simulated receiver, the power delay profile at a small aperture can be considered or ignored.

[0072] In one possible implementation, the number of paths from the first analog transmitter to the first analog receiver is M, and the number of paths from the second analog transmitter to the second analog receiver is N. That is, there are M·N paths between the first analog transmitter and the second analog receiver. For example, the number of paths from the first analog transmitter to the first analog receiver is 2, and the number of paths from the second analog transmitter to the second analog receiver is 2. That is, there are 4 paths between the first analog transmitter and the second analog receiver.

[0073] By performing a convolution operation on the first power delay distribution and the second power delay distribution, a third power delay distribution from the first simulated transmitting end to the second simulated receiving end can be generated.

[0074] Optionally, the convolution operation result is Among them, δ is the sampling function, τ i is the delay of the i-th path at the first simulated receiving end, τ j is the delay of the jth path at the second simulated receiving end, a i is the power of the i-th path at the first simulated receiving end, b j is the power of the j-th path at the second simulated receiving end.

[0075] For example, without considering the power delay distribution at the small aperture, the power from the first simulated transmitting end to the second simulated receiving end is a i +b j, the time delay from the first simulated transmitting end to the second simulated receiving end is τ i +τ j .

[0076] It should be noted that the first power delay distribution, the second power delay distribution and the third power delay distribution can be visualized graphs, with the horizontal axis representing time and the vertical axis representing power (in dBm).

[0077] In order to verify the feasibility of this application, transceiver antennas are set at the first simulated transmitting end and the second simulated receiving end. The configuration parameters of the transceiver antennas are: carrier frequency is 60GHz, effective bandwidth is 4GHz, antenna type is omnidirectional antenna, and initial power is 0dBm. After adopting the millimeter wave channel characteristic extraction method proposed in this application, the first power delay distribution diagram, the second power delay distribution diagram and the third power delay distribution diagram after convolution are obtained respectively. Figure 3 As shown in the figure, from top to bottom are the first power delay distribution diagram, the second power delay distribution diagram, and the convolved third power delay distribution diagram. The delay distribution from the first simulated transmitter to the first simulated receiver is concentrated in the range of 0.08ns-0.40ns, and the delay distribution from the second simulated transmitter to the second simulated receiver is concentrated in the range of 0.11ns-0.41ns. The convolution results show that the delay spread from the first simulated transmitter to the second simulated receiver increases and increases by nearly 100%, with a concentration of 0.20ns-0.81ns. This indicates that in scenarios with small apertures, the degree of multipath diffusion in the time domain increases.

[0078] For example, a i and b j When the unit of is dBm, and considering the power delay distribution at a small aperture, c d is the transmission coefficient of the signal propagating in the micro-aperture, and the transmission coefficient of the micro-aperture can be obtained by full-wave simulation method. d is the time delay of the signal propagating in the small aperture. The power from the first simulated transmitting end to the second simulated receiving end is a i +b j +c d , the time delay from the first simulated transmitting end to the second simulated receiving end is τ i +τ j +τ d Among them, the transmission coefficient from the first end to the second end of the small aperture can be obtained according to the full-wave simulation method. The power of the first simulated receiving end is known (which can be obtained according to the first power delay distribution). According to the transmission coefficient, the power c from the first end to the second end of the small aperture can be generated. dThe axial length L of the tiny aperture is known. The propagation speed of electromagnetic waves in air is close to the speed of light. Based on the propagation speed of electromagnetic waves in air, the time it takes for the electromagnetic wave to pass through the tiny aperture can be calculated, which is the time delay τ of the tiny aperture. d .

[0079] In one possible implementation, there are P first simulated transmitters, Q second simulated receivers, and P·Q combinations of first simulated transmitters and second simulated receivers. Based on the above channel extraction method, a third power delay profile can be generated from each first simulated transmitter to each second simulated receiver. These P·Q combinations yield P·Q third power delay profiles. In this way, the power delay profiles for each location within the first and second metal cavities can be derived. P and Q are both positive integers.

[0080] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0081] The method for extracting millimeter-wave channel characteristics containing a tiny aperture provided in the present application is applied to the extraction of millimeter-wave channels in scenes containing tiny apertures. The scene data includes at least a first metal cavity and a second metal cavity arranged adjacent to each other. The first metal cavity has a first simulated transmitting end, the second metal cavity has a second simulated receiving end, and the two ends of the tiny aperture connecting the first metal cavity and the second metal cavity are the first simulated receiving end and the second simulated transmitting end, respectively. The first simulated transmitting end has a signal source, and the signal source is transmitted to the first simulated receiving end, the second simulated transmitting end, and the second simulated receiving end in sequence. The channel characteristics in the first metal cavity and the second metal cavity are obtained by ray tracing, and the directional pattern and transmission coefficient at the tiny aperture are obtained by full-wave simulation. Combining the ray tracing method and the full-wave simulation method can optimize the accuracy of the channel extraction results.

[0082] Corresponding to the method for extracting characteristics of millimeter wave channels with tiny apertures described in the above embodiment, Figure 4 A structural block diagram of an apparatus for extracting millimeter wave channel characteristics provided in an embodiment of the present application is shown. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0083] See also Figure 4 The device includes a scene acquisition unit, a full-wave simulation unit, a ray tracing unit and a convolution unit. The scene acquisition unit is used to acquire scene data containing a small aperture, such as Figure 1The scene data may include the structural dimensions of the first metal cavity, the second metal cavity, and the micro-aperture. The full-wave simulation unit is used to perform full-wave simulation on the micro-aperture to obtain the directivity pattern and transmission coefficient of the micro-aperture. The ray tracing unit uses a ray tracing method to generate a first power delay distribution after the first simulated transmitting end transmits to the first simulated receiving end, and a second power delay distribution after the second simulated transmitting end transmits to the second simulated receiving end. The convolution unit generates a third power delay distribution from the first simulated transmitting end to the second simulated receiving end based on the obtained first power delay distribution and second power delay distribution.

[0084] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiment of this application. Their specific functions and technical effects can be found in the method embodiment section and will not be repeated here.

[0085] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0086] An embodiment of the present application also provides a network device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor implements the steps of any of the above-mentioned method embodiments when executing the computer program.

[0087] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the above-mentioned various method embodiments can be implemented.

[0088] An embodiment of the present application provides a computer program product. When the computer program product is run on a mobile terminal, the mobile terminal can implement the steps in the above-mentioned various method embodiments when executing the computer program product.

[0089] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the process of the above-mentioned method embodiment by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, it can implement the steps of each of the above-mentioned method embodiments. The computer program includes computer program code, which can be in source code form, object code form, executable file, or some intermediate form. The computer-readable medium can at least include: any entity or device capable of carrying computer program code to the camera / terminal device, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal, and software distribution medium. For example, a USB flash drive, mobile hard drive, magnetic disk, or optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals or telecommunication signals.

[0090] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0091] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0092] In the embodiments provided in this application, it should be understood that the disclosed devices / network equipment and methods can be implemented in other ways. For example, the device / network equipment embodiments described above are merely illustrative. For example, the division of the modules or units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0093] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0094] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. A method for extracting characteristics of a millimeter-wave channel containing a small aperture, characterized in that: include: Acquiring scene data, the scene data including at least a first metal cavity and a second metal cavity disposed adjacent to each other, the first metal cavity and the second metal cavity being connected via a micro-aperture, a first simulated transmitting end and a first simulated receiving end being located within the first metal cavity, a second simulated transmitting end and a second simulated receiving end being located within the second metal cavity, the first simulated receiving end and the second simulated transmitting end being disposed proximate to the micro-aperture, and the first simulated receiving end and the second simulated transmitting end being disposed at opposite ends of the micro-aperture, respectively; Obtaining the directivity pattern of the micro-aperture according to a full-wave simulation method; generating a first power delay distribution from the first simulated transmitting end to the first simulated receiving end according to a ray tracing method and a directivity pattern of the micro-aperture; generating a second power delay distribution from the second simulated transmitting end to the second simulated receiving end according to a ray tracing method and a directivity pattern of the micro-aperture; Generating a third power delay profile from the first simulated transmitting end to the second simulated receiving end according to the first power delay profile and the second power delay profile includes: performing a convolution operation on the first power delay profile and the second power delay profile to generate the third power delay profile from the first simulated transmitting end to the second simulated receiving end, when the number of paths from the first simulated transmitting end to the first simulated receiving end is M and the number of paths from the second simulated transmitting end to the second simulated receiving end is N; and performing a convolution operation on the power delay profile of the first power delay profile and the second power delay profile, where the convolution result is: ,in, is the sampling function, The first analog receiving end The delay of the path, The second analog receiving end The delay of the path, The first analog receiving end The power of the strip diameter, The second analog receiving end The power of the strip diameter.

2. The method for extracting characteristics of a millimeter-wave channel with a small aperture according to claim 1, wherein: The generating of the first power delay distribution from the first simulated transmitting end to the first simulated receiving end according to the ray tracing method and the directivity pattern of the small aperture includes: Generate a transition power delay distribution from the first simulated transmitting end to the first simulated receiving end according to a ray tracing method, and obtain the first power delay distribution according to the transition power delay distribution and the directivity pattern of the small aperture; or Determine that the receiving pattern of the ray tracing method at the first simulated receiving end is the pattern of the small aperture, and generate a first power delay distribution after the first simulated transmitting end transmits to the first simulated receiving end according to the ray tracing method.

3. The method for extracting characteristics of a millimeter wave channel with a small aperture according to claim 1, wherein: Generating a second power delay distribution from the second simulated transmitting end to the second simulated receiving end according to the ray tracing method and the directivity pattern of the small aperture includes: Determine that the transmission pattern at the second simulated receiving end by the ray tracing method is the pattern of the small aperture, and generate a second power delay distribution after the second simulated transmitting end transmits to the second simulated receiving end according to the ray tracing method.

4. The method for extracting characteristics of a millimeter wave channel with a small aperture according to claim 1, wherein: The power from the first analog transmitting end to the second analog receiving end is , the delay from the first analog transmitting end to the second analog receiving end is .

5. The method for extracting characteristics of a millimeter wave channel with a small aperture according to claim 1, wherein: The power from the first analog transmitting end to the second analog receiving end is , the delay from the first analog transmitting end to the second analog receiving end is , is the transmission coefficient of the signal propagating in the tiny aperture, is the time delay of the signal propagating in the tiny aperture.

6. The method for extracting characteristics of a millimeter-wave channel with a small aperture according to any one of claims 1 to 5, wherein the number of the first simulated transmitting ends is P, the number of the second simulated receiving ends is Q, and P·Q third power delay profiles from the first simulated transmitting end to the second simulated receiving end are generated based on the P first power delay profiles and the Q second power delay profiles, wherein: P and Q are both positive integers.

7. A millimeter wave channel characteristic extraction device, characterized in that: The method for extracting characteristics of a millimeter wave channel containing a micro-aperture according to any one of claims 1 to 6 is used, and the millimeter wave channel characteristic extraction device comprises: A scene acquisition unit, configured to acquire scene data including a micro-aperture; A full-wave simulation unit, configured to perform full-wave simulation on the micro-aperture and obtain a directivity pattern of the micro-aperture; a ray tracing unit, configured to generate a first power delay distribution after the first simulated transmitting end transmits to the first simulated receiving end, and to generate a second power delay distribution after the second simulated transmitting end transmits to the second simulated receiving end; A convolution unit is used to generate a third power delay distribution from the first analog transmitting end to the second analog receiving end.

8. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 6 is implemented.

Citation Information

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