Earphone test method, electronic device, and computer-readable storage medium

Abstract

This application discloses a headphone testing method, electronic device, and computer-readable storage medium, applicable to the field of headphone testing technology. The headphone testing method includes: fixing the headphone under test within a fixing device, wherein the touch area of ​​the headphone under test is exposed within the fixing device; driving an object simulation device close to the touch area and acquiring first test information of the touch area through a data acquisition device; acquiring second test information of the touch area, wherein the second test information is test information when the object simulation device is moved away from the touch area; and generating a test result for the headphone under test based on the first and second test information. This application solves the technical problem in the prior art where simply testing the function of the touch sensor itself can easily lead to missed detection of the headphone's touch area.

Description

Technical Field

[0001] This application relates to the field of headphone testing technology, and in particular to a headphone testing method, electronic device, and computer-readable storage medium. Background Technology

[0002] With the advancement of technology and the widespread use of electronic products, TWS (True Wireless Stereo) earphones have gained increasing popularity among consumers due to their portability and superior sound quality.

[0003] TWS earbuds typically have touch sensors on their bodies to collect user touch input. However, because current TWS earbuds usually use capacitive touch sensors, the capacitance between the two plates is very small due to limitations such as electrode geometry, generally only tens of μμF, and sometimes even just a few μμF. Therefore, when other objects (such as fingers) approach the TWS earbuds, it may cause changes in the earbuds' magnetic field, affecting the touch sensor's output.

[0004] While existing TWS earbuds undergo touch sensor testing before leaving the factory, this typically only tests the sensor's functionality. Without considering the impact of external environments on the touch sensor, it's easy to miss detections of the touch areas on the TWS earbuds. Summary of the Invention

[0005] The main purpose of this application is to provide a headphone testing method, electronic device, and computer-readable storage medium, which aims to solve the technical problem that the touch area of ​​the headphone is easily missed when simply testing the function of the touch sensor itself in the prior art.

[0006] To achieve the above objectives, this application provides a headphone testing method applied to a headphone testing fixture, the headphone testing fixture comprising: a fixing device, an object simulation device, and a data acquisition device;

[0007] The headphone testing method includes:

[0008] The earphone under test is fixed inside the fixing device, wherein the touch area of ​​the earphone under test is exposed outside the fixing device;

[0009] The object simulation device is driven close to the touch area, and the first test information of the touch area is collected by the data acquisition device.

[0010] Acquire second test information of the touch area, wherein the second test information is test information when the object simulation device is away from the touch area;

[0011] Based on the first test information and the second test information, the test results of the earphone under test are generated.

[0012] Optionally, the fixing device includes a fixing base and an upper pressure cover, wherein when the fixing base and the upper pressure cover are pressed together, an exposed hole is left between the fixing base and the upper pressure cover;

[0013] The step of fixing the earphone under test within the fixing device, wherein the touch area of ​​the earphone under test is exposed outside the fixing device, includes:

[0014] The earphone to be tested is placed on the mounting base, wherein the touch area of ​​the earphone to be tested is exposed in the exposed hole;

[0015] The earphone under test is fixed by pressing the fixing seat against the upper cover.

[0016] Optionally, the object simulation device includes a first arc-shaped component and a second arc-shaped component respectively disposed on both sides of the fixing device;

[0017] The step of driving the object simulation device closer to the touch area includes:

[0018] Based on a preset first limiting point and a preset second limiting point, the first arc-shaped component and the second arc-shaped component are driven to move to a preset proximity gap range of the touch area, wherein the first limiting point and the second limiting point are used for positioning the first arc-shaped component and the second arc-shaped component within the preset proximity range.

[0019] Optionally, the first arc-shaped component and the second arc-shaped component are grounded metal components.

[0020] Optionally, the headphone testing fixture further includes a monitoring device, which includes a camera and a display.

[0021] The step of driving the object simulation device closer to the touch area further includes:

[0022] The camera captures an image of the area where the object simulation device and the earphone under test are located, obtains a corresponding gap image, and outputs the gap image to the display.

[0023] Based on the gap image, it is determined whether the object simulation device is in contact with the earphone under test;

[0024] If the object simulation device comes into contact with the earphone under test, a preset prompt message will be output.

[0025] Optionally, a touch sensor is provided in the touch area, a spring pin is provided on the data acquisition device, and a communication contact is provided on the earphone under test, with the communication contact exposed on the fixing device;

[0026] The step of acquiring the first test information of the touch area through the data acquisition device includes:

[0027] The spring pin is driven to contact the communication contact of the earphone under test to establish a communication connection channel between the data acquisition device and the earphone under test.

[0028] Based on the communication connection channel, the first test value of the touch sensor is collected within a preset first test duration, and the first test value is used as the first test information.

[0029] Optionally, the step of obtaining the second test information of the touch area includes, before:

[0030] Drive the object simulation device to move away from the touch area to a preset starting position;

[0031] Based on the communication connection channel between the data acquisition device and the earphone under test, the second test value of the touch sensor is acquired within a preset second test duration, and the second test value is used as the second test information.

[0032] Optionally, the step of generating the test result of the earphone under test based on the first test information and the second test information includes:

[0033] Obtain the test difference between the first test value in the first test information and the second test value in the second test information;

[0034] If the test difference is greater than a preset tolerance threshold, the test result is determined to be that the touch area is affected by external field interference.

[0035] This application also provides an electronic device, which includes: a memory, a processor, and a program for a headphone testing method stored in the memory and executable on the processor. When the program for the headphone testing method is executed by the processor, it can implement the steps of the headphone testing method as described above.

[0036] This application also provides a computer-readable storage medium storing a program implementing a headphone testing method, which, when executed by a processor, implements the steps of the headphone testing method as described above.

[0037] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the headphone testing method described above.

[0038] This application provides a headphone testing method, electronic device, and computer-readable storage medium applied to a headphone testing fixture. The headphone testing fixture includes a fixing device, an object simulation device, and a data acquisition device. The headphone under test is fixed within the fixing device, with the touch area of ​​the headphone exposed. The object simulation device is then driven close to the touch area to simulate a scenario where an external object approaches the headphone under test, and the data acquisition device acquires first test information of the touch area. Then, second test information of the touch area is acquired when the object simulation device moves away from the touch area. The difference between the first and second test information allows determination of whether an external field affects the normal response of the touch sensor within the headphone under test. This overcomes the technical problem in existing technologies where the influence of external fields on the touch sensor is not considered, and the testing only focuses on the touch sensor's functionality, leading to missed detections of the headphone's touch area. Attached Figure Description

[0039] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0040] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 This is a schematic diagram of the headphone testing fixture involved in the headphone testing method of this application;

[0042] Figure 2 This is a flowchart illustrating the first embodiment of the headphone testing method of this application;

[0043] Figure 3 This is a schematic diagram of a scenario for the headphone testing method of this application;

[0044] Figure 4 This is another schematic diagram of the headphone testing method of this application;

[0045] Figure 5 This is a schematic diagram of the device structure of the hardware operating environment involved in the headphone testing method in this application embodiment.

[0046] The purpose, features, and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0047] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are merely some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0048] To better illustrate the headphone testing method of this application, the headphone testing fixtures involved in the headphone testing method are described below:

[0049] Reference Figure 1 , Figure 1 This is a schematic diagram of the headphone testing fixture involved in the headphone testing method of this application. The headphone testing fixture shown in the figure consists of a fixing device 10, an object simulation device 20, and a data acquisition device 30. The fixing device 10 is used to fix the headphone under test, and the object simulation device 20 is used to simulate an external object. By driving the object simulation device close to the headphone under test, a scenario is simulated where an external object (such as a finger) approaches the headphone under test. The data acquisition device 30 is used to collect test information of the touch sensor inside the headphone under test by communicating with the headphone under test, as the object simulation device 20 approaches and moves away from the touch area.

[0050] Example 1

[0051] This application provides a headphone testing method. In the first embodiment of the headphone testing method of this application, refer to... Figure 2 The headphone testing method is applied to a headphone testing fixture, which includes: a fixing device, an object simulation device, and a data acquisition device.

[0052] The headphone testing method includes:

[0053] Step S10: Fix the earphone to be tested inside the fixing device, wherein the touch area of ​​the earphone to be tested is exposed outside the fixing device;

[0054] Step S20: Drive the object simulation device close to the touch area and collect the first test information of the touch area through the data acquisition device;

[0055] Step S30: Obtain second test information of the touch area, wherein the second test information is test information when the object simulation device is away from the touch area;

[0056] Step S40: Generate the test results of the earphone under test based on the first test information and the second test information.

[0057] In this embodiment, it should be noted that the headphone testing method is applied to a headphone testing fixture, which includes a fixing device, an object simulation device, and a data acquisition device. The fixing device is used to fix the headphone under test, and the object simulation device is used to simulate an external object (such as a finger). The data acquisition device is used to collect test information (such as capacitance value) of the touch sensor inside the headphone under test when the object simulation device approaches and moves away from the touch area.

[0058] In addition, it should be noted that the object simulation device is only close to the touch area of ​​the earphone under test, but does not make contact with the surface of the earphone under test.

[0059] Furthermore, it is understood that, in order to avoid affecting the test results, the object simulation device undergoes a charge removal process to remove the charge from the surface of the object simulation device.

[0060] For example, steps S10 to S40 include: fixing the earphone under test within the fixing device, wherein the touch area of ​​the earphone under test is exposed outside the fixing device; driving the object simulation device closer to the touch area via a first driving device, and establishing a communication connection channel with the earphone under test via the data acquisition device, and then acquiring first test information of the touch area. The data acquisition device can establish a communication connection channel with the earphone under test via a wireless connection (such as WIFI, Bluetooth, etc.) or by contacting the communication contacts of the earphone under test. Then, acquiring second test information of the touch area, wherein the second test information is the test information when the object simulation device is away from the touch area. The first and second driving devices can be mechanisms such as cylinders or guide rails. Based on the first and second test information, generating test results for the earphone under test.

[0061] It is understood that the steps shown or described may be performed in a different order than those described above. In another possible implementation, steps S10 to S40 include: fixing the earphone under test within the fixing device, wherein the touch area of ​​the earphone under test is exposed outside the fixing device; establishing a communication connection channel between the data acquisition device and the earphone under test; then, when the object simulation device is in a preset initial position, acquiring second test information of the touch area through the data acquisition device. The preset initial position is a position where the object simulation device is away from the touch area. Then, driving the object simulation device closer to the touch area via a first driving device, and acquiring first test information of the touch area again through the data acquisition device. Based on the first test information and the second test information, generating a test result for the earphone under test.

[0062] In another possible implementation, steps S10 to S40 include: fixing the earphone under test within the fixing device, wherein the touch area of ​​the earphone under test is exposed outside the fixing device; establishing a communication connection between the data acquisition device and the earphone under test; then driving the object simulation device closer to the touch area via a first driving device and acquiring first test information of the touch area; then maintaining the communication connection between the data acquisition device and the earphone under test, and driving the object simulation device away from the touch area via the first driving device, acquiring second test information of the touch area; and generating a test result for the earphone under test based on the first test information and the second test information.

[0063] The first test information is the test information when the object simulation device is close to the touch area (i.e., there is an external object near the touch sensor of the earphone under test), and the second test information is the test information when the object simulation device is far away from the touch area (i.e., there is no external object near the touch sensor of the earphone under test). Therefore, by comparing the first test information and the second test information, it can be determined whether the touch sensor of the earphone under test is affected by the external field, and the test result of the earphone under test can be generated.

[0064] The fixing device includes a fixing base and an upper pressure cover. When the fixing base and the upper pressure cover are pressed together, an exposed hole is left between the fixing base and the upper pressure cover. In step S10, the earphone to be tested is fixed in the fixing device, wherein the touch area of ​​the earphone to be tested is exposed in the fixing device.

[0065] Step S11: Place the earphone to be tested on the fixed base, wherein the touch area of ​​the earphone to be tested is exposed in the exposed hole;

[0066] Step S12: The earphone to be tested is fixed by pressing the fixing seat against the upper cover.

[0067] In this embodiment, it should be noted that the front of the earphone under test generally houses structures such as speakers and dustproof mesh, while the back has communication contacts and a touch area with a touch sensor. The touch area is used to recognize the user's touch operation, and the communication contacts are metal contacts (solid pins) used for exchanging current and electrical signals with external devices.

[0068] Reference Figure 3 , Figure 3This is a schematic diagram of a scenario for the headphone testing method of this application. The fixing device includes a fixing base 11 and an upper pressure cover 12. When the upper pressure cover 12 is placed on the fixing base 11, an exposed hole 13 is left between the fixing base 11 and the upper pressure cover 12. Thus, when the headphone under test is fixed in the fixing device, the headphone under test can expose its communication contacts and the touch area equipped with a touch sensor outside the fixing device through the exposed hole.

[0069] Steps S11 and S12 include: placing the earphone under test on the fixing base, wherein the touch area of ​​the earphone under test is exposed in the exposed hole. This avoids the fixing device being too close to the touch area and affecting the test results. Furthermore, the communication contacts of the earphone under test can also be exposed outside the fixing device through the exposed hole, facilitating the data acquisition device to collect test information through the communication contacts. The earphone under test is fixed by pressing the fixing base against the upper pressure cover. This prevents the earphone under test from falling off the fixing base or coming into contact with the object simulation device due to vibration or other reasons during the test.

[0070] The object simulation device includes a first arc-shaped component and a second arc-shaped component respectively disposed on both sides of the fixing device; in step S20, the step of driving the object simulation device closer to the touch area includes:

[0071] Step S21: Based on the preset first limiting point and the preset second limiting point, drive the first arc-shaped component and the second arc-shaped component to move to a preset proximity gap range of the touch area, wherein the first limiting point and the second limiting point are used for positioning the first arc-shaped component and the second arc-shaped component within the preset proximity range.

[0072] For example, it should be noted that the first arc-shaped component and the second arc-shaped component are grounded metal components. The grounded metal component can be a workpiece made of conductive metal such as iron, steel, or copper that is grounded. By grounding, the charge on the surface of the first arc-shaped component and the second arc-shaped component can be conducted to the ground in real time, ensuring that the first arc-shaped component and the second arc-shaped component always remain in a state without charge, and avoiding the influence of the charge on the surface of the first arc-shaped component and the second arc-shaped component on the test results.

[0073] Similarly, refer to Figure 3The object simulation device includes a first arc-shaped component 21 and a second arc-shaped component 22 respectively disposed on both sides of the fixed device. Driven by a cylinder, guide rail, or other driving device, the first arc-shaped component 21 and the second arc-shaped component 22 move to preset first limit point P1 and preset second limit point P2 to approach the touch area. It is understood that the first limit point P1 and the second limit point P2 can be actual limit points (i.e., obstacles are set at the position of the limit point) or virtual limit points (i.e., the position coordinates corresponding to the limit point). The preset first limit point P1 and preset second limit point P2 are used to position the first arc-shaped component 21 and the second arc-shaped component 22 close to the touch area. Thus, when the first arc-shaped component 21 and the second arc-shaped component 22 approach the touch area, the first gap between the first arc-shaped component and the touch area, and the second gap between the second arc-shaped component and the touch area, are both maintained within the preset approach gap range. Furthermore, it also prevents the first arc-shaped component 21 and the second arc-shaped component 22 from contacting the earphone under test. The preset proximity gap range can be 0.2mm ± 0.05mm.

[0074] The headphone testing fixture further includes a monitoring device, which includes a camera and a display; in step S20, the step of driving the object simulation device close to the touch terminal further includes:

[0075] Step S22: Use the camera to capture the area where the object simulation device and the earphone under test are located, obtain the corresponding gap image, and output the gap image to the display.

[0076] Step S23: Based on the gap image, detect whether the object simulation device is in contact with the earphone under test;

[0077] Step S24: If the object simulation device comes into contact with the earphone under test, a preset prompt message is output.

[0078] In this embodiment, it should be noted that the preset prompt information can be one or more of the following: images, text, and voice information used to prompt that the object simulation device has made contact with the earphone under test.

[0079] See Figure 4 , Figure 4 This is another schematic diagram of the headphone testing method of this application. In the diagram, camera 50 is pointed at the headphone under test. When the object simulation device approaches the headphone under test, camera 50 captures an image of the area where the object simulation device and the headphone under test are located, obtaining a gap image, and outputs the gap image to display 60.

[0080] For example, steps S22 to S24 include: capturing an image of the area where the object simulation device and the earphone under test are located using the camera, obtaining a corresponding gap image, and outputting the gap image to the display. The tester can visually inspect the gap image to determine whether the object simulation device and the earphone under test are in contact. Alternatively, the closest distance between the outlines of the object simulation device and the earphone under test can be determined by identifying the gap image, thus determining whether the object simulation device and the earphone under test are in contact. If the object simulation device is in contact with the earphone under test, it indicates that the test results may have been affected, requiring adjustment of the earphone testing fixture and retesting. In this case, a preset prompt message can be output to prompt the tester to retest.

[0081] A touch sensor is provided in the touch area, a spring pin is provided on the data acquisition device, and a communication contact is provided on the earphone under test, the communication contact being exposed on the fixing device; in step S20, the step of acquiring the first test information of the touch area through the data acquisition device includes:

[0082] Step S25: Drive the spring pin to contact the communication contact of the earphone under test to establish a communication connection channel between the data acquisition device and the earphone under test.

[0083] Step S26: Based on the communication connection channel, collect the first test value of the touch sensor within a preset first test duration, and use the first test value as the first test information.

[0084] In this embodiment, it is understood that a touch sensor is provided in the touch area, a spring pin is provided on the data acquisition device, and a communication contact is provided on the earphone under test. The communication contact is exposed on the fixing device to facilitate contact between the spring pin and the communication contact to establish a communication connection channel. The data acquisition device is provided with spring pins (pogo pins), and the number and position of the spring pins match the communication contact of the earphone under test. By driving the spring pin to contact the communication contact of the earphone under test, a communication connection channel is established between the data acquisition device and the earphone under test. The communication connection channel includes the earphone under test, the communication contact, the spring pin, and the data acquisition device. For the acquisition of test information, exemplarily, the earphone under test transmits the test information of the touch sensor to the spring pin through the communication contact, and then from the spring pin to the data acquisition device. Then, based on the communication connection channel, the first test value of the touch sensor within a preset first test duration (such as 12s, 15s, 18s, etc.) is acquired, and the first test value is used as the first test information. The first test value can be the capacitance value of the touch sensor. In this embodiment, communication is achieved by using a spring pin to contact the communication contact point of the earphone under test, which improves the convenience of earphone testing and is easier to implement than using a wireless connection.

[0085] Specifically, in step S30, before the step of obtaining the second test information of the touch area, the following steps are included:

[0086] Step S31: Drive the object simulation device to move away from the touch area to a preset starting position;

[0087] Step S32: Based on the communication connection channel between the data acquisition device and the earphone under test, the second test value of the touch sensor within a preset second test duration is acquired, and the second test value is used as the second test information.

[0088] In this embodiment, it should be noted that the preset starting position is the position where the object simulation device is far away from the touch area. The object simulation device is driven to move away from the touch area to the preset starting position. At this time, the object simulation device will not affect the touch sensor in the earphone under test. Therefore, the communication connection channel between the data acquisition device and the earphone under test acquires the second test value of the touch sensor within a preset second test duration (e.g., 8s, 10s, 12s, etc.), and uses the second test value as the second test information. The second test value can also be the capacitance value of the touch sensor.

[0089] In step S40, the step of generating the test result of the earphone under test based on the first test information and the second test information includes:

[0090] Step S41: Obtain the test difference between the first test value in the first test information and the second test value in the second test information;

[0091] Step S42: If the test difference is greater than the preset tolerance threshold, the test result is determined to be that the touch area is affected by external field interference.

[0092] For example, after obtaining the first test information and the second test information, the test difference between the first test value in the first test information and the second test value in the second test information can be obtained. Then, by determining whether the test difference is greater than a preset tolerance threshold (such as 2μμF, 3μμF, 5μμF, etc.), it can be determined whether the touch sensor has been affected by an external field. If the test difference is greater than the preset tolerance threshold, it indicates that the capacitance value output by the touch sensor changes significantly when the object simulation device is near, and the test result is determined to be that the touch area is affected by external field interference. If the test difference is not greater than the preset tolerance threshold, it indicates that the capacitance value output by the touch sensor does not change significantly when the object simulation device is near compared to when the object simulation device is not near, and the test result is determined to be that the touch area is not affected by external field interference.

[0093] This application provides a headphone testing method applied to a headphone testing fixture, which includes a fixing device, an object simulation device, and a data acquisition device. The headphone under test is fixed within the fixing device, with the touch area of ​​the headphone exposed. The object simulation device is then driven close to the touch area to simulate a scenario where an external object approaches the headphone, and the data acquisition device collects first test information about the touch area. Then, second test information about the touch area is acquired when the object simulation device moves away from the touch area. The difference between the first and second test information allows determination of whether an external field affects the normal response of the touch sensor within the headphone. This overcomes the technical problem in existing technologies where the touch sensor's influence from external fields is not considered, and only the touch sensor's functionality is tested, leading to missed detections of the headphone's touch area.

[0094] Example 2

[0095] This application provides an electronic device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, which are executed by the at least one processor to enable the at least one processor to perform the headphone testing method in the first embodiment described above.

[0096] The following is for reference. Figure 5 The diagram illustrates a structural schematic of an electronic device suitable for implementing embodiments of the present disclosure. The electronic devices in the embodiments of the present disclosure may include, but are not limited to, mobile terminals such as mobile phones, laptops, digital broadcast receivers, PDAs (personal digital assistants), PADs (tablet computers), PMPs (portable multimedia players), in-vehicle terminals (e.g., in-vehicle navigation terminals), and fixed terminals such as digital TVs and desktop computers. Figure 5 The electronic device shown is merely an example and should not be construed as limiting the functionality and scope of the embodiments disclosed herein.

[0097] like Figure 5 As shown, an electronic device may include a processing unit (such as a central processing unit, graphics processing unit, etc.) that can perform various appropriate actions and processes based on a program stored in read-only memory (ROM) or a program loaded from a storage device into random access memory (RAM). The RAM also stores various programs and data required for the operation of the electronic device. The processing unit, ROM, and RAM are interconnected via a bus. Input / output (I / O) interfaces are also connected to the bus.

[0098] Typically, the following systems can be connected to the I / O interface: input devices including, for example, touchscreens, touchpads, keyboards, mice, image sensors, microphones, accelerometers, gyroscopes, etc.; output devices including, for example, liquid crystal displays (LCDs), speakers, vibrators, etc.; storage devices including, for example, magnetic tapes, hard disks, etc.; and communication devices. Communication devices allow electronic devices to communicate wirelessly or wiredly with other devices to exchange data. Although electronic devices with various systems are shown in the figures, it should be understood that it is not required to implement or possess all the systems shown. More or fewer systems may be implemented alternatively.

[0099] In particular, according to embodiments of this disclosure, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of this disclosure include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via a communication device, or installed from a storage device, or installed from a ROM. When the computer program is executed by a processing device, it performs the functions defined above in the methods of embodiments of this disclosure.

[0100] The electronic device provided in this application, employing the headphone testing method described in Embodiment 1 or Embodiment 2 above, solves the technical problem of low sound quality caused by incorrect headphone wearing. Compared with the prior art, the beneficial effects of the electronic device provided in this application are the same as those of the headphone testing method provided in Embodiment 1 above, and other technical features of this electronic device are the same as those disclosed in the methods of the above embodiments, and will not be repeated here.

[0101] It should be understood that various parts of this disclosure can be implemented using hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments or examples.

[0102] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0103] Example 3

[0104] This embodiment provides a computer-readable storage medium having computer-readable program instructions stored thereon, which are used to perform the headphone testing method in the first embodiment described above.

[0105] The computer-readable storage medium provided in this application embodiment may be, for example, a USB flash drive, but is not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, system, or device. The program code contained on the computer-readable storage medium may be transmitted using any suitable medium, including but not limited to: wires, optical cables, RF (radio frequency), etc., or any suitable combination thereof.

[0106] The aforementioned computer-readable storage medium may be included in an electronic device or may exist independently without being assembled into an electronic device.

[0107] The aforementioned computer-readable storage medium carries one or more programs that, when executed by an electronic device, cause the electronic device to: fix the earphone under test within the fixing device, wherein the touch area of ​​the earphone under test is exposed outside the fixing device; drive the object simulation device closer to the touch area and acquire first test information of the touch area through the data acquisition device; acquire second test information of the touch area, wherein the second test information is test information when the object simulation device is away from the touch area; and generate a test result for the earphone under test based on the first test information and the second test information. Computer program code for performing the operations of this disclosure can be written in one or more programming languages ​​or combinations thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, and conventional procedural programming languages ​​such as C or similar programming languages. The program code can be executed entirely on a user's computer, partially on a user's computer, as a standalone software package, partially on a user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0108] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0109] The modules described in the embodiments of this disclosure can be implemented in software or hardware. The names of the modules do not necessarily limit the functionality of the unit itself.

[0110] The computer-readable storage medium provided in this application stores computer-readable program instructions for executing the above-described headphone testing method, thus solving the technical problem of low sound quality caused by incorrect headphone wearing. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided in this application are the same as those of the headphone testing method provided in Embodiment 1 or Embodiment 2, and will not be repeated here.

[0111] Example 4

[0112] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the headphone testing method described above.

[0113] The computer program product provided in this application solves the technical problem of low sound quality caused by incorrect headphone wearing. Compared with the prior art, the beneficial effects of the computer program product provided in this application are the same as those of the headphone testing method provided in Embodiment 1 or Embodiment 2 above, and will not be repeated here.

[0114] The above are merely preferred embodiments of this application and do not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent scope of this application.

Claims

1. A method of testing earphones, the method comprising: The earphone test tool comprises a fixing device, an object simulation device and a data acquisition device. The earphone test method comprises: fixing the earphone to be tested in the fixing device, wherein a touch area of the earphone to be tested is exposed to the fixing device; driving the object simulation device to approach the touch area without contacting the surface of the earphone to be tested, and acquiring first test information of the touch area by the data acquisition device; acquiring second test information of the touch area, wherein the second test information is test information when the object simulation device is away from the touch area; generating a test result of the earphone to be tested according to the first test information and the second test information; the step of generating the test result of the earphone to be tested according to the first test information and the second test information comprises: acquiring a test difference value between a first test value in the first test information and a second test value in the second test information; if the test difference value is greater than a preset tolerance threshold, determining that the test result is that the touch area is interfered by an external field.

2. The earphone test method of claim 1, wherein, The fixing device comprises a fixing seat and an upper cover, and when the fixing seat and the upper cover are pressed together, an exposed hole is left between the fixing seat and the upper cover. The step of fixing the earphone to be tested in the fixing device, wherein a touch area of the earphone to be tested is exposed to the fixing device, comprises: placing the earphone to be tested on the fixing seat, wherein the touch area of the earphone to be tested is exposed in the exposed hole; fixing the earphone to be tested by pressing the fixing seat and the upper cover together.

3. The earphone testing method of claim 1, wherein, The object simulation device comprises a first arc-shaped member and a second arc-shaped member arranged on the two sides of the fixing device respectively. The step of driving the object simulation device to approach the touch area comprises: driving the first arc-shaped member and the second arc-shaped member to move to a preset approaching gap range of the touch area based on a preset first limiting point and a preset second limiting point, wherein the first limiting point and the second limiting point are used for positioning the first arc-shaped member and the second arc-shaped member in the preset approaching range.

4. The earphone testing method of claim 3, wherein, The first arc-shaped member and the second arc-shaped member are grounded metal members.

5. The earphone testing method of claim 1, wherein, The earphone test tool further comprises a monitoring device comprising a camera and a display. The step of driving the object simulation device to approach the touch area further comprises: capturing the area where the object simulation device and the earphone to be tested are located by the camera, obtaining a corresponding gap image, and outputting the gap image to the display; detecting whether the object simulation device and the earphone to be tested are in contact according to the gap image; if the object simulation device and the earphone to be tested are in contact, outputting preset prompt information.

6. The earphone testing method of claim 1, wherein, A touch sensor is arranged in the touch area, a spring needle is arranged on the data acquisition device, and a communication contact point is further arranged on the earphone to be tested, wherein the communication contact point is exposed to the fixing device. The step of acquiring the first test information of the touch area by the data acquisition device comprises: Drive the spring needle to contact the communication contact of the earphone to be tested, so as to establish a communication connection channel between the data acquisition device and the earphone to be tested; Based on the communication connection channel, collect the first test value of the touch sensor within a preset first test duration, and take the first test value as the first test information.

7. The earphone testing method of claim 1, wherein, The touch area is provided with a touch sensor, and the step of acquiring the second test information of the touch area comprises the following steps: Drive the object simulation device to move to a preset starting position away from the touch area; Based on the communication connection channel between the data acquisition device and the earphone to be tested, collect the second test value of the touch sensor within a preset second test duration, and take the second test value as the second test information.

8. An electronic device, comprising: The electronic device comprises: At least one processor; and The memory is in communication connection with the at least one processor; wherein The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute the steps of the earphone test method in any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a program for implementing an earphone test method, and the program for implementing an earphone test method is executed by a processor to implement the steps of the earphone test method in any one of claims 1 to 7.

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