Contact force detection method and device, computer-readable storage medium, and terminal device

Abstract

A contact force detection method and apparatus, a computer-readable storage medium, and a terminal device are disclosed. The contact force detection method includes: obtaining signal changes from N sensors, symmetrically arranged on opposite sides of a strain gauge, wherein the strain gauge is strained by the contact force between the pantograph and the catenary, where N is an even number greater than or equal to 2; and calculating the contact force using at least the difference in signal changes from the N sensors. The technical solution of the present invention can accurately detect the contact force between the pantograph and the catenary.

Description

Technical Field

[0001] The present invention relates to the field of measurement technology, and in particular to a contact force detection method and device, a computer-readable storage medium, and a terminal device. Background Art

[0002] Subways are becoming a primary and efficient means of transportation in cities. Pantographs are installed in subways, which draw power from the catenary network through their coordination with the pantograph. Stable dynamic contact force between the pantograph and the catenary network is key to ensuring a good current collection relationship and maintaining continuous power. Therefore, the operational safety of urban subways, especially the proper working condition of the pantograph and the catenary network, is crucial to their normal operation.

[0003] In reality, when a subway train is in operation, the contact force between the pantograph and the catenary wire varies randomly due to the vibration of the catenary, resulting in an unstable contact force. Excessive contact force between the catenary and the pantograph can cause the pantograph to break the catenary or the catenary to strike the pantograph. However, insufficient contact force can lead to poor current collection by the pantograph and arcing between the pantograph and the catenary. Therefore, a reasonable contact force must exist between the pantograph and the catenary during train operation to ensure that the pantograph can safely transfer current from the catenary to the traction converter system within the train body, thereby providing continuous and effective power to the train. Furthermore, this can facilitate the production, installation, and maintenance of rail transit operations.

[0004] Currently, the main technologies for monitoring the pantograph-catenary relationship include visual imaging and electronic sensing. Visual imaging is a non-contact measurement method, and therefore cannot effectively detect and provide feedback on the dynamic characteristics of the pantograph-catenary relationship, such as hard points and pantograph-catenary contact force. For most pantograph-catenary operating parameters, it only serves as a post-event video review and accident tracing tool. Although electronic sensing technology is a contact measurement method, with a pantograph-catenary contact force sensor and an acceleration sensor installed on the pantograph head, the signals collected through active detection are severely subject to electromagnetic interference, making accurate subsequent data analysis difficult.

[0005] Currently, there is an urgent need for an effective detection method to accurately detect the contact force between the pantograph and the catenary. Summary of the Invention

[0006] One of the objectives of the embodiments solved by the present invention is to provide a contact force detection method and device for accurately detecting the contact force between the pantograph and the contact network.

[0007] To solve the above technical problems, an embodiment of the present invention provides a contact force detection method, which includes: obtaining signal changes of N sensors, where the N sensors are symmetrically arranged on both sides of a strain portion, and the strain portion is strained under the action of the contact force between the pantograph and the contact network, where N is an even number greater than or equal to 2; and calculating the contact force using at least the difference in the signal changes of the N sensors.

[0008] Optionally, the signal change includes a change component caused by a change in bending moment, a change component caused by a change in stress, and a change component caused by a change in temperature when the sensor is subjected to force, and the difference includes a difference in the change components caused by the change in bending moment.

[0009] Optionally, the sensor is an optical sensor, and the signal change is a wavelength change.

[0010] Optionally, calculating the contact force using at least a difference in signal changes of the N sensors includes:

[0011] Calculate a first difference between each first sensor and a symmetrically arranged second sensor, where the first sensor is located on a first side of the strain portion and the second sensor is located on a second side of the strain portion; calculate a sum of N / 2 first differences, and use the sum to calculate an average value to serve as a second difference, and at least use the second difference to calculate the contact force.

[0012] Optionally, the calculation of the contact force using at least the difference in signal change amounts of the N sensors includes: determining the bending moment mechanical coefficient of the sensor or the mechanical coefficient of the strain part, the bending moment mechanical coefficient or the mechanical coefficient being determined when the N sensors are calibrated; calculating the product of the difference and the bending moment mechanical coefficient, or the product of the difference and the mechanical coefficient, to obtain the contact force.

[0013] Optionally, the sensor is an optical strain gauge, a resistance strain gauge or a fiber grating.

[0014] Optionally, each sensor includes a pair of optical strain gauges and a temperature compensation plate, or a pair of resistance strain gauges and a temperature compensation plate, or a pair of fiber gratings and a temperature compensation plate.

[0015] In order to solve the above technical problems, an embodiment of the present invention further discloses a contact force detection device, which includes: an acquisition module for acquiring signal changes of N sensors, where the N sensors are symmetrically arranged on both sides of the strain part, and the strain part is strained under the action of the contact force between the pantograph and the contact network, where N is an even number greater than or equal to 2; and a calculation module for calculating the contact force using at least the difference in the signal changes of the N sensors.

[0016] An embodiment of the present invention further discloses a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the contact force detection method are executed.

[0017] An embodiment of the present invention further discloses a terminal device, comprising a memory and a processor, wherein the memory stores a computer program that can be run on the processor, and the processor executes the steps of the contact force detection method when running the computer program.

[0018] Compared with the prior art, the technical solution of the embodiment of the present invention has the following beneficial effects:

[0019] In the technical solution of the present invention, the contact force can be calculated by the difference in the signal changes of N sensors. Because the N sensors are symmetrically arranged on both sides of the strain gauge, and the strain gauge is strained by the contact force between the pantograph and the catenary, the difference in the signal changes of the N sensors can reflect the change in the bending moment under the action of the contact force. The contact force can then be calculated based on this change in bending moment, achieving accurate detection of the contact force between the pantograph and the catenary. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a flow chart of a contact force detection method according to an embodiment of the present invention;

[0021] Figure 2 and Figure 3 is a schematic structural diagram of hardware for detecting contact force in an embodiment of the present invention;

[0022] Figure 4 2 is a schematic structural diagram of a contact force detection device in an embodiment of the present invention. DETAILED DESCRIPTION

[0023] As described in the background art, there is an urgent need for an effective detection method to accurately detect the contact force between the pantograph and the catenary.

[0024] In the technical solution of the present invention, the contact force can be calculated by the difference in the signal changes of N sensors. Because the N sensors are symmetrically arranged on both sides of the strain gauge, and the strain gauge is strained by the contact force between the pantograph and the catenary, the signal changes of the N sensors can reflect the change in the bending moment under the action of the contact force. The contact force can then be calculated from this change in bending moment, achieving accurate detection of the contact force between the pantograph and the catenary.

[0025] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0026] Figure 1This is a flow chart of a contact force detection method according to an embodiment of the present invention.

[0027] The contact force detection method of the embodiment of the present invention can be used on a terminal device, that is, the terminal device can perform the various steps of the contact force detection method. The terminal device can be a device with computing capabilities, such as a processor, a mobile phone, a computer, etc.

[0028] Specifically, the contact force detection method may include the following steps:

[0029] Step 101: Acquire signal changes of N sensors, where the N sensors are symmetrically arranged on two sides of a strain portion, and the strain portion is strained under the action of a contact force between the pantograph and the catenary, where N is an even number greater than or equal to 2.

[0030] Step 102: Calculate the contact force using at least the difference in signal changes of the N sensors.

[0031] It should be noted that the serial numbers of the steps in this embodiment do not limit the execution order of the steps.

[0032] It is understandable that, in a specific implementation, the contact force detection method can be implemented in the form of a software program, and the software program runs in a processor integrated inside a chip or a chip module.

[0033] In this embodiment of the present invention, when the strain gauge is strained by the contact force between the pantograph and the catenary, N sensors located on both sides of the strain gauge can measure signal changes. This signal change can reflect changes in the strain gauge caused by changes in bending moment, stress, and temperature due to the contact force.

[0034] In a specific implementation, when the strain gauge is in contact with the pantograph and the catenary, one side of the strain gauge is subjected to compression, while the other side is subjected to tension. Consequently, the bending moments detected by the sensors on either side of the strain gauge are equal in magnitude but opposite in direction. Furthermore, the changes in temperature and stress detected by the sensors on either side of the strain gauge are consistent.

[0035] In other words, by taking the difference of the signal changes from N sensors, the effects of stress and temperature on the sensor signals are offset, while the bending moment detected by the sensors is amplified by a factor of 2. The contact force between the pantograph and the catenary can be calculated from the bending moment.

[0036] In a non-limiting embodiment, the sensor may be an optical strain gauge, a resistance strain gauge, or a fiber Bragg grating (FBG). The optical strain gauge may also be referred to as an optical strain sensitive gauge.

[0037] Specifically, the above-mentioned sensor can be a micro-electromechanical system (MEMS) fiber optic sensor, a MEMS fiber optic sensor, a micro-opto-electro-mechanical system (MOEMS) fiber optic sensor, a micro-opto-mechanical system (MOMS) fiber optic sensor, etc.

[0038] Take MEMS fiber optic sensors, for example. MEMS fiber optic sensing technology is a cutting-edge 21st-century advancement based on micron / nanomechanics and optics. This technology integrates a mass, elastic support, optical reflective micromirrors, and light input and output waveguide systems directly on a tiny chip, enabling all-optical detection and transmission of signals such as vibration, pressure, current, and temperature. The resulting MEMS sensors offer advantages such as small size, light weight, easy installation, high sensitivity, dynamic response, passive measurement, and immunity to electromagnetic interference.

[0039] The silicon-based sensitive structure of a MEMS chip is manufactured using micro-electromechanical (MEMS) technology, and signals are detected and read using fiber optic detection technology. This combines the advantages of both MEMS and fiber optic sensing technologies. MEMS fiber optic sensing technology overcomes the constraints of existing sensing technologies, which often require wide bandwidth and high precision. It is passive, has a wide operating temperature range, is miniaturized, resists electromagnetic interference, is lightweight, easily networked, and requires no maintenance. This allows for long-term, accurate measurement, reducing the complexity and cost of smart operations and maintenance systems. Therefore, MEMS fiber optic sensing technology is ideally suited for real-time monitoring of vehicle pantographs, contact lines, and their relationships.

[0040] It should be noted that the MOEMS optical fiber sensor and the MOMS optical fiber sensor in the embodiments of the present invention can have the advantages of the above-mentioned MEMS optical fiber sensor.

[0041] It should be noted that the sensor may also be any other feasible sensor that can convert strain into an optical signal or an electrical signal, and the embodiment of the present invention does not impose any limitation on this.

[0042] In a non-limiting embodiment, the number of sensors may be 2, 4, 6 or an even number thereof, which is not limited in the embodiment of the present invention.

[0043] In a specific embodiment of the present invention, please refer to Figure 2 and Figure 3 , Figure 2 4 is a schematic diagram of hardware for detecting contact force in an embodiment of the present invention. Figure 3 yes Figure 2 Exploded diagram.

[0044] The hardware 100 for detecting contact force includes a force-bearing portion 10, a strain portion 20, a sensor 30, and a bow head support 40. The force-bearing portion 10 is connected to one end of the slide to transmit the contact force between the slide and the contact network. The strain portion 20 includes a first end 21 and a second end 22. The first end 21 of the strain portion 20 is connected to the force-bearing portion 10 and is suspended in the air to facilitate strain under the action of contact force. The bow head support 40 is connected to the second end 22 of the strain portion 20 and the bow head support.

[0045] In a specific embodiment, the force-bearing portion 10 may include a force-bearing platform 11 and a force-bearing column 12. The force-bearing platform 11 is connected to one end of the slide. The force-bearing column 12 is connected to the first end 21 of the strain portion 20 and the force-bearing platform 11. The force-bearing platform 11 is connected to one end of the slide, allowing the contact force between the slide and the contact network to be transmitted to the strain portion 20 via the force-bearing column 12.

[0046] In a specific implementation, the strain unit 20 may include an intermediate strain beam 23. The intermediate strain beam 23 is connected to the force-bearing unit 10. The intermediate strain beam 23 can be strained under the action of the contact force. A sensor 30 is provided on the intermediate strain beam 23 to detect the strain of the intermediate strain beam 23. The strain of the intermediate strain beam 23 detected by the sensor 30 can be used to estimate the contact force between the pantograph and the contact network.

[0047] Furthermore, in some non-limiting embodiments, the strain portion 20 may further include an upper strain beam 24 located above the intermediate strain beam 23 , and / or the strain portion 20 may further include a lower strain beam 25 located below the intermediate strain beam 23 .

[0048] When the strain portion 20 includes the upper strain beam 24 , a cavity 26 is defined between the upper strain beam 24 and the intermediate strain beam 23 .

[0049] When the strain portion 20 includes the lower strain beam 25 , a cavity 26 is defined between the lower strain beam 25 and the middle strain beam 23 .

[0050] The following description will be made by taking the case where the sensor is an optical strain gauge and the number of sensors is 2 as an example.

[0051] Continue to refer to Figure 2 The sensor 30 includes two optical strain gauges, namely an optical strain gauge A and an optical strain gauge B. The two optical strain gauges are symmetrically arranged on two sides of the intermediate strain beam 23, and the optical strain gauges are used to detect the strain of the intermediate strain beam 23.

[0052] When the intermediate strain beam 23 is subjected to a contact force, one side of the intermediate strain beam 23 is compressed, while the other side is tensile. One of the two optical strain gauges detects compressive strain, while the other detects tensile strain. Both optical strain gauges simultaneously measure the strain on both sides of the intermediate strain beam 23. The bending moments detected by the two optical strain gauges are equal in absolute value but opposite in direction, providing temperature compensation. By combining the signals detected by the two optical strain gauges, the effects of stress and temperature are offset, while the bending moment is amplified by a factor of two, helping to improve the accuracy of contact force detection.

[0053] Furthermore, the two optical strain gauges are arranged at positions of the intermediate strain beam 23 close to the force-bearing portion 10. For example, the two optical strain gauges are arranged in an area where the distance from the force-bearing portion 10 meets a set threshold.

[0054] In a specific implementation, the two optical strain gauges can be bonded to the intermediate strain beam 23 by gluing, or can be connected to the intermediate strain beam 23 by screw fastening, embedding, welding, implanting, or with the help of an auxiliary fixing structure, etc., and examples are not given here one by one.

[0055] In some non-limiting embodiments, the contact force between the pantograph and the catenary is calculated as follows:

[0056] P cp =△λ A,M K A,M -△λ B,M K B,M (1)

[0057] Among them, P cp represents the contact force, △λ A,M K represents the wavelength change component caused by the bending moment change when the optical strain gauge A is subjected to force. A,M represents the mechanical coefficient of the optical strain gauge A related to the bending moment (also called the bending moment mechanical coefficient), △λ B,M K represents the wavelength change component caused by the bending moment change when the optical strain gauge B is subjected to force. B,M It represents the mechanical coefficient of the optical strain gauge B related to the bending moment.

[0058] In the specific implementation, K A,M and K B,M It is calculated during sensor calibration. A,M , K B,M Mechanical coefficient K of the strain part cp The calibration is performed on the upper and lower surfaces of the same rigid body (i.e., the strain part), so the following formula (2) can be obtained.

[0059] K cp =K A,M =KB,M (2)

[0060] Substituting formula (2) into formula (1), we can obtain formula (3).

[0061] P cp =△λ A,M K cp -△λ B,M K cp =K cp ×(△λ A,M -△λ B,M ) (3)

[0062] In a specific implementation, the wavelength variation of the optical strain gauge includes a wavelength variation component caused by a bending moment variation, a wavelength variation component caused by a stress variation, and a wavelength variation component caused by a temperature variation. For details, please refer to formulas (4) and (5).

[0063] △λ A =△λ A,M +△λ A,F +△λ A,T (4)

[0064] △λ B =△λ B,M +△λ B,F +△λ B,T (5)

[0065] Among them, △λ A Indicates the wavelength change of optical strain gauge A when it is subjected to force, △λ A,M It represents the wavelength change component caused by the bending moment change when the optical strain gauge A is subjected to force, △λ A,F It represents the wavelength change component caused by stress change when optical strain gauge A is subjected to force, △λ A,T It represents the wavelength change component of the optical strain gauge A caused by temperature change when it is subjected to force; △λ B Indicates the wavelength change of optical strain gauge B when it is subjected to force, △λ B,M It represents the wavelength change component caused by the bending moment change when the optical strain gauge B is subjected to force, △λ B,F It represents the wavelength change component caused by stress change when optical strain gauge B is subjected to force, △λ B,T Indicates the wavelength change component of optical strain gauge B caused by temperature change when it is subjected to force

[0066] As mentioned above, the wavelength change component caused by stress change when optical strain gauge A is subjected to force is equal to the wavelength change component caused by stress change when optical strain gauge B is subjected to force. The wavelength change component caused by temperature change when optical strain gauge A is subjected to force is equal to the wavelength change component caused by temperature change when optical strain gauge B is subjected to force. For details, please refer to formulas (6) and (7).

[0067] △λ A,F =△λ B,F (6)

[0068] △λ A,T =△λ B,T (7)

[0069] Formula (8) can be obtained from formulas (4), (5), (6) and (7).

[0070] △λ A -△λ B =△λ A,M -△λ B,M (8)

[0071] Substituting formula (8) into formula (3), we can obtain formula (9).

[0072] P cp =K cp ×(△λ A -△λ B ) (9)

[0073] Among them, the mechanical coefficient K cp It represents the mechanical sensitivity coefficient of the intermediate strain beam 23 when subjected to stress.

[0074] So far, the formula for calculating contact force is obtained, which is formula (9). In this formula, △λ A Represents the wavelength component measured by the optical sensitive film A, △λ B Represents the wavelength component measured by the optical sensitive film B. Both can be obtained through measurement. Mechanical coefficient K cp can be obtained by calibration. That is, by executing Figure 1 Step 101 of the method shown in FIG. 1 is to obtain Δλ A and △λ B , and then use formula (9) to perform step 2 to calculate the contact force.

[0075] The embodiment of the present invention reflects the change in bending moment through the change in wavelength, and then uses the transformation of the bending moment to calculate the actual change in contact force, and finally establishes the relationship between the change in wavelength and the change in contact force, thereby achieving convenience and accuracy in contact force calculation.

[0076] In a specific application scenario, when the intermediate strain beam 23 is subjected to force, the change in the signal of a single sensor due to bending moment is 1 nanometer (nm), the change due to stretching is 0.1nm, and the change due to temperature is 0.02nm. The wavelength change Δλ of the optical sensitive sheet A is A =1+0.1+0.02=1.12nm, the wavelength change of optical sensitive film B △λ B =-1+0.1+0.02=-0.88nm. Mechanical coefficient K cp is 15N / nm. When applied, the contact force is: P cp =1.12nm×15N / nm-(-0.88nm×15N / nm)=30N.

[0077] In one variation, the number N of sensors may be 4, 6, or more. In this case, the contact force may be calculated in the following manner: a first sum of signal changes of N / 2 first sensors and a second sum of signal changes of N / 2 second sensors are calculated, wherein the N / 2 first sensors are located on the first side of the strain portion, and the N / 2 second sensors are located on the second side of the strain portion; a difference between the first sum and the second sum is calculated as the difference value; and the contact force is calculated using at least the difference value.

[0078] Accordingly, the calculation formula of the contact force can be transformed from Formula 9 to Formula (10).

[0079] P cp =(K cp1 ×(△λ A，1 -△λ B，1 )+K cp2 ×(△λ A，2 -△λ B，2 )+...+K cpN / 2 ×(△λ A，N / 2 -△λ B，N / 2 )) / (N / 2) (10)

[0080] Among them, △λ A，1 , △λ A，2 , ..., △λ A，N / 2 They represent N / 2 first sensors located on the first side of the middle strain beam 23, Δλ B，1 , △λ B，2 , ..., △λ B，N / 2 They represent N / 2 second sensors located on the second side of the middle strain beam 23, K cp1 Indicates that the middle strain beam 23 is at the sensor △λ A，1 and △λ B，1 Mechanical sensitivity coefficient when the position is subjected to force, Kcp2 Indicates that the middle strain beam 23 is at the sensor △λ A,2 and △λ B,2 Mechanical sensitivity coefficient when the position is subjected to force, K cpN / 2 Indicates that the middle strain beam 23 is at the sensor △λ A,N / 2 and △λ B,N / 2 The mechanical sensitivity coefficient when the position is subjected to force.

[0081] In some non-limiting embodiments, the N / 2 first sensors located on the first side of the strain beam and the N / 2 second sensors located on the second side of the strain beam can be of the same type. For example, N / 2 optical strain gauges can be provided on the first side of the intermediate strain beam 23, and N / 2 optical strain gauges can be provided on the second side of the intermediate strain beam 23; or, N / 2 electrical resistance strain gauges can be provided on the first side of the intermediate strain beam 23, and N / 2 electrical resistance strain gauges can be provided on the second side of the intermediate strain beam 23; or, N / 2 fiber Bragg gratings can be provided on the first side of the intermediate strain beam 23, and N / 2 fiber Bragg gratings can be provided on the second side of the intermediate strain beam 23.

[0082] In other non-limiting embodiments, each sensor includes a pair of optical strain gauges and a temperature compensation plate, or a pair of resistance strain gauges and a temperature compensation plate, or a pair of fiber Bragg gratings and a temperature compensation plate.

[0083] In the embodiment of the present invention, the temperature compensation sheet can be used to detect the temperature-induced strain of the intermediate strain beam 23. By providing the temperature compensation sheet, the signal of the optical strain gauge, resistance strain gauge, or fiber Bragg grating can be temperature compensated, further improving the accuracy of the contact force calculation.

[0084] In a specific implementation, taking the sensors as an optical strain gauge and a temperature compensation gauge as an example, the wavelength change obtained by measuring the optical strain gauge can be subtracted from the wavelength change obtained by measuring the temperature compensation gauge, and then the wavelength change of the optical strain gauge can be substituted into the above formula for calculating the contact force.

[0085] That is to say, Figure 1 Step 102 may include the following steps: calculating the difference between each pair of optical strain gauges and temperature compensation gauges as the signal variation of the sensor; and calculating the contact force using the difference between the signal variations of N sensors.

[0086] In a specific embodiment, taking the example of setting an optical strain gauge and a temperature compensation gauge on the first side of the intermediate strain beam 23 and setting an optical strain gauge and a temperature compensation gauge on the second side, the calculation formula of the contact force is shown in formula (11).

[0087] P cp =K cp ×((△λA -△λ A，T )-(△λ B -△λ B，T )) (11)

[0088] Among them, △λ A represents the wavelength change of the optical sensitive sheet located on the first side, △λ A，T represents the wavelength change of the temperature compensation plate located on the first side, △λ B The wavelength change of the optical sensitive sheet on the second side is represented by Δλ B，T Indicates the wavelength change of the temperature compensation plate located on the second side.

[0089] It should be noted that the locations of the optical strain gauge and the temperature compensation gauge on the intermediate strain beam 23 can be configured according to requirements and are not limited here.

[0090] Please refer to Figure 4 The embodiment of the present invention further discloses a contact force detection device 40. The contact force detection device 40 may include:

[0091] an acquisition module 401 for acquiring signal changes from N sensors, wherein the N sensors are symmetrically arranged on two sides of a strain portion, wherein the strain portion is strained under the action of a contact force between the pantograph and the catenary, and N is an even number greater than or equal to 2;

[0092] The calculation module 402 is configured to calculate the contact force using at least the difference in signal changes of the N sensors.

[0093] In a specific implementation, the above-mentioned contact force detection device can correspond to a chip with a contact force detection function in a network device, such as a SOC (System-On-a-Chip), a baseband chip, etc.; or correspond to a chip module with a contact force detection function in a terminal device; or correspond to a chip module with a data processing function chip, or correspond to a terminal device.

[0094] For more information about the working principle and working mode of the contact force detection device 40, please refer to Figures 1 to 3 The relevant description in will not be repeated here.

[0095] Regarding the various modules / units contained in the various devices and products described in the above embodiments, they can be software modules / units, hardware modules / units, or partly software modules / units and partly hardware modules / units. For example, for various devices and products applied to or integrated in a chip, the various modules / units contained therein can all be implemented in the form of hardware such as circuits, or at least some of the modules / units can be implemented in the form of software programs, which run on the processor integrated inside the chip, and the remaining (if any) modules / units can be implemented in the form of hardware such as circuits; for various devices and products applied to or integrated in a chip module, the various modules / units contained therein can all be implemented in the form of hardware such as circuits, and different modules / units can be located in the same component of the chip module (such as a chip, circuit module, etc.) or in different components, or at least some of the modules / units can be implemented in the form of hardware such as circuits. The element can be implemented in the form of a software program, which runs on the processor integrated inside the chip module, and the remaining (if any) modules / units can be implemented in the form of hardware such as circuits; for various devices and products applied to or integrated in the terminal, the various modules / units contained therein can be implemented in the form of hardware such as circuits, and different modules / units can be located in the same component (for example, chip, circuit module, etc.) or different components in the terminal, or, at least some modules / units can be implemented in the form of a software program, which runs on the processor integrated inside the terminal, and the remaining (if any) modules / units can be implemented in the form of hardware such as circuits.

[0096] The embodiment of the present invention further discloses a storage medium, which is a computer-readable storage medium having a computer program stored thereon. When the computer program is run, the computer program can execute Figure 1 The steps of the contact force detection method are shown in .

[0097] The embodiment of the present invention further discloses a terminal device, which may include a memory and a processor, wherein the memory stores a computer program that can be run on the processor. When the processor runs the computer program, it can execute Figure 1 The steps of the contact force detection method shown in . The user equipment includes but is not limited to mobile phones, computers, tablet computers and other terminal devices.

[0098] It should be understood that the term "and / or" in this document simply describes a relationship between related objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A exists alone, A and B exist simultaneously, or B exists alone. Furthermore, the character " / " in this document indicates that the related objects are in an "or" relationship.

[0099] The term "plurality" used in the embodiments of the present application refers to two or more.

[0100] The first, second, etc. descriptions appearing in the embodiments of this application are only for illustration and distinction of the description objects. There is no order, nor does it indicate any special limitation on the number of devices in the embodiments of this application, and cannot constitute any limitation on the embodiments of this application.

[0101] The "connection" appearing in the embodiments of the present application refers to various connection methods such as direct connection or indirect connection to achieve communication between devices, and the embodiments of the present application do not impose any limitations on this.

[0102] It should be understood that in the embodiments of the present application, the processor may be a central processing unit (CPU), or may be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0103] It should also be understood that the memory in the embodiments of the present application may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of random access memory (RAM) are available, such as static RAM (SRAM), dynamic random access memory (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), and direct rambus RAM (DR RAM).

[0104] The above embodiments can be implemented in whole or in part by software, hardware, firmware or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer program are loaded or executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from one website, computer, server or data center to another website, computer, server or data center via wired or wireless means. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server or data center that contains one or more available media sets. The available medium can be a magnetic medium (for example, a floppy disk, a hard disk, a tape), an optical medium (for example, a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state drive.

[0105] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0106] In the several embodiments provided in this application, it should be understood that the disclosed methods, devices, and systems can be implemented in other ways. For example, the device embodiments described above are merely schematic; for example, the division of the units is merely a logical function division, and there may be other division methods in actual implementation; for example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, indirect coupling or communication connection of devices or units, which may be electrical, mechanical, or other forms.

[0107] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0108] In addition, the functional units in various embodiments of the present invention may be integrated into a single processing unit, each unit may be physically included separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or hardware plus software functional units.

[0109] The above-mentioned integrated unit implemented in the form of a software functional unit can be stored in a computer-readable storage medium. The above-mentioned software functional unit stored in a storage medium includes a number of instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to perform some steps of the method described in various embodiments of the present invention.

[0110] Although the present invention is disclosed as above, the present invention is not limited thereto. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be based on the scope defined by the claims.

Claims

1. A contact force detection device, characterized in that: The strain portion includes a first end and a second end, wherein the first end of the strain portion is connected to the force-bearing portion, and the first end is suspended to facilitate strain under the action of the contact force; the strain portion is fixed to the support via the second end; and the strain portion includes a cavity located between the first end and the second end; It also includes upper strain beam, lower strain beam and middle strain beam, N sensors are arranged on two side surfaces of an intermediate strain beam of the strain portion, the intermediate strain beam having a mid-plane, such that the intermediate strain beam and the N sensors are symmetrically arranged about the mid-plane; the intermediate strain beam is connected to the force-bearing portion; The cavity is surrounded by an upper strain beam, a lower strain beam, a first end, and a second end; the upper strain beam and the lower strain beam are parallel to the median plane of the middle strain beam; An upper cavity is formed between the middle strain beam and the upper strain beam, and a lower cavity is formed between the middle strain beam and the lower strain beam; The force-bearing portion includes a force-bearing platform and a force-bearing column; the force-bearing platform is connected to one end of the pantograph slide, and the force-bearing column is connected to the first end of the strain portion and the force-bearing platform, and is used to transmit the contact force between the pantograph slide and the contact network to the strain portion through the force-bearing column; the intermediate strain beam is strained under the action of the contact force; the sensor is used to detect the strain of the intermediate strain beam and estimate the contact force between the pantograph and the contact network based on the strain of the intermediate strain beam; an acquisition module, configured to acquire signal changes of N sensors, wherein the strain portion is strained under the action of the contact force between the pantograph and the contact network, and N is an even number greater than or equal to 2; A calculation module is used to calculate the contact force using at least the difference in signal changes of the N sensors.

2. A contact force detection method based on the contact force detection device according to claim 1, characterized in that: include: Acquire signal changes of N sensors, where the N sensors are symmetrically arranged on two sides of the strain portion, the strain portion being strained under the action of the contact force between the pantograph and the catenary, and N is an even number greater than or equal to 2; The contact force is calculated using at least the difference in signal changes of the N sensors.

3. The contact force detection method according to claim 2, wherein: The signal variation includes a variation component caused by a bending moment change, a variation component caused by a stress change, and a variation component caused by a temperature change when the sensor is subjected to force, and the difference includes a difference in the variation components caused by the bending moment change.

4. The contact force detection method according to claim 2, wherein: The sensor is an optical sensor, and the signal change is a wavelength change.

5. The contact force detection method according to claim 2, wherein: Calculating the contact force by at least using the difference in signal changes of the N sensors includes: calculating a first difference between each first sensor and a symmetrically arranged second sensor, wherein the first sensor is located on a first side surface of the strain portion and the second sensor is located on a second side surface of the strain portion; Calculating a sum of N / 2 first difference values, and using the sum to calculate an average value to serve as a second difference value; The contact force is calculated using at least the second difference.

6. The contact force detection method according to claim 2, wherein: Calculating the contact force by at least using the difference in signal changes of the N sensors includes: Determining a bending moment mechanical coefficient of a sensor or a mechanical coefficient of the strain portion, wherein the bending moment mechanical coefficient or the mechanical coefficient is determined when calibrating the N sensors; The product of the difference and the bending moment mechanical coefficient, or the product of the difference and the mechanical coefficient, is calculated to obtain the contact force.

7. The contact force detection method according to any one of claims 2 to 6, characterized in that: The sensor is an optical strain gauge, a resistance strain gauge or a fiber grating.

8. The contact force detection method according to any one of claims 2 to 6, characterized in that: Each sensor includes a pair of optical strain gauges and temperature compensation sheets, or a pair of resistance strain gauges and temperature compensation sheets, or a pair of fiber Bragg gratings and temperature compensation sheets.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the contact force detection method according to any one of claims 2 to 8 are executed.

10. A terminal device comprising a memory and a processor, wherein the memory stores a computer program that can be run on the processor, characterized in that: When the processor runs the computer program, the processor performs the steps of the contact force detection method according to any one of claims 2 to 8.

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