A method and processing device for counting events

By dividing the effective time window and target time period in the substation relay protection device, the problem of fault analysis accuracy caused by improper time window setting is solved, the statistics of family defect-related events are improved, and the accuracy of fault analysis is enhanced.

CN116186485BActive Publication Date: 2026-05-26CYG SUNRI CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CYG SUNRI CO LTD
Filing Date
2022-12-23
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

In existing technologies, the accuracy of fault analysis results of substation relay protection devices is low, mainly due to improper time window settings, which leads to the neglect of family-related defect events or the inclusion of interfering events.

Method used

By determining the number of events for the target model device within the effective time window, and dividing the target time period according to the relationship between the start and end times of the effective time window, the event statistics time period is reasonably divided, irrelevant events are reduced, and the statistics of events related to family defects are increased.

Benefits of technology

It improves the accuracy of fault analysis results, reduces the impact of irrelevant events, increases the statistics of events related to family defects, and enhances the precision of equipment fault analysis.

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Abstract

This application provides a method and processing apparatus for statistical analysis of events. The method includes: determining the number of events occurring on a target device within a first time period and a time window of the same rank, where the start time of the rank is the occurrence time of the rank, i = 1, 2, ..., R, R ≥ 2, and R is an integer; determining whether the rank is a valid time window, where the number of events occurring on the target device within the valid time window is greater than or equal to a preset threshold; and determining the j-th target time period based on the valid time window, where the start time of the j-th target time period is the start time of the M-th target time period. j The start time of each effective time window, and the end time of the j-th target time period is the N-th window. j The method provided in this application determines the end time of each effective time window and counts the events generated by the target model equipment within the j-th target time period. This method allows for a more reasonable division of the time period for event statistics, improving the accuracy of fault analysis results.
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