Method, system and controller for testing solid state drives

Abstract

The application provides a testing method, system and controller of a solid state disk. The testing method is applied to a testing system of a solid state disk, the system comprising a testing controller, a testing mainboard and a high-low temperature test box, the testing mainboard being electrically connected with a tested solid state disk, the testing mainboard being connected with the testing controller, and the tested solid state disk being placed in the high-low temperature test box; the testing method comprising: the testing controller sending a control temperature control command to the high-low temperature test box according to a current testing task corresponding to the tested solid state disk in a preset testing task list, so as to control the environmental temperature in the high-low temperature test box to keep at a testing temperature required by the current testing task; and the testing mainboard executing the current testing task in the testing task list pre-received from the testing controller on the connected solid state disk; and the testing controller generating a testing record and a testing report according to the obtained data by using a testing program corresponding to the current testing task. The scheme improves the testing efficiency.

Description

TECHNICAL FIELD

[0001] The present application relates to a hard disk testing technology, in particular to a testing method, a testing system and a testing controller of a solid state disk. BACKGROUND

[0002] A solid state disk needs to undergo high and low temperature test before leaving the factory. The purpose of the high and low temperature test is to test whether the stability of the solid state disk (including high temperature resistance, low temperature resistance, and humidity resistance) is affected in a high or low temperature environment. The high and low temperature test is divided into two tests of temperature cycling and temperature shock. The temperature cycling test refers to setting the temperature to a low temperature (for example, -50℃) for a period of time (for example, 4 hours), then increasing the temperature to a high temperature (for example, 90℃), and then maintaining the high temperature for a period of time (for example, 4 hours), and then decreasing the temperature to the low temperature, and then repeating the above steps for multiple cycles. The temperature shock test refers to a rapid conversion from a low temperature to a high temperature for only a few minutes (or a custom time) and a rapid conversion from a high temperature to a low temperature. During the temperature conversion process, an aging test program can be run all the time to observe whether there is a data comparison error during the rapid temperature switching.

[0003] In many cases, a total of many test programs need to be tested and run in the high and low temperature test scheme, and the operation steps of each test program are different, the test time is long or short, and it is possible that several test programs need to be started at the same time for testing. Therefore, if a test program ends, a person needs to frequently operate, and the test personnel also need to frequently check the running of each test program to prevent the test from being abnormal and interrupted.

[0004] In addition, because there are many types of test programs, each software test solid state disk step is complicated, so that the test result needs to be manually saved and obtained.

[0005] Therefore, the existing high and low temperature test scheme of the solid state disk has complicated steps, and manual intervention is needed to collect the test results, which not only affects the test efficiency, but also affects the test steps of the solid state disk. SUMMARY

[0006] The present application provides a testing method, a testing system and a testing controller of a solid state disk, which can simplify the steps of the high and low temperature test scheme of the solid state disk, and automatically collect the test data, thereby improving the test efficiency.

[0007] In order to achieve the above object, the application provides a testing method of a solid state disk, which is applied to a testing system of the solid state disk, the testing system comprising a testing controller, a testing mainboard and a high-low temperature test box for providing a specified environment temperature, wherein the testing mainboard is electrically connected with a tested solid state disk, the testing mainboard is connected with the testing controller, and the tested solid state disk is placed in the high-low temperature test box; the testing method comprises the following steps:

[0008] The testing controller sends a control temperature control command to the high-low temperature test box according to a current testing task corresponding to the tested solid state disk in a preset testing task list, so as to control the environment temperature in the high-low temperature test box to keep at a testing temperature required by the current testing task; wherein the testing task list comprises a timing testing task and the current testing task; and the testing mainboard executes the current testing task on the solid state disk connected with the testing mainboard according to the current testing task in the testing task list received from the testing controller in advance;

[0009] The testing controller generates a testing record and a testing report according to obtained data by using a testing program corresponding to the current testing task in the testing controller; wherein the obtained data comprises temperature information in the high-low temperature test box fed back from the high-low temperature test box and testing data of the solid state disk measured by the testing mainboard when the testing task is executed on the solid state disk.

[0010] Compared with the related art, the application comprises that the testing controller sends a control temperature control command to the high-low temperature test box according to a current testing task corresponding to the tested solid state disk in a preset testing task list, and the testing mainboard executes the current testing task on the solid state disk connected with the testing mainboard according to the current testing task in the testing task list received from the testing controller in advance, so that the steps of the high-low temperature testing scheme of the solid state disk can be simplified; in addition, the testing controller generates a testing record and a testing report according to obtained data by using a testing program corresponding to the current testing task in the testing controller, so that the testing efficiency is improved.

[0011] In an exemplary embodiment, the testing method further comprises the following steps:

[0012] The testing mainboard monitors the testing data of the connected solid state disk when the current testing task is executed;

[0013] If the testing data is abnormal, the testing mainboard captures log information of the solid state disk; wherein the log information of the solid state disk comprises at least one of the following: a drive log, a SMART log and a system log of the solid state disk;

[0014] The testing mainboard transmits the log information of the solid state disk to the testing controller;

[0015] The test controller generates an error log according to the log information of the solid state disk using a test program corresponding to the current test task in the test controller.

[0016] In an exemplary embodiment, after the step of generating a test record and a test report using a test program corresponding to the obtained data in the test controller, the test method further comprises:

[0017] The test controller uploads the test record and the test report to the log server.

[0018] In an exemplary embodiment, the step of the test mainboard capturing the log information of the solid state disk comprises:

[0019] The test mainboard captures the log information of the solid state disk through the Nvme-MI protocol.

[0020] In an exemplary embodiment, after the step of the test controller generating an error log according to the log information of the solid state disk using a test program corresponding to the current test task in the test controller, the method further comprises:

[0021] The test controller uploads the error log to the log server.

[0022] In an exemplary embodiment, the method further comprises:

[0023] The test mainboard monitors the in-place state of the solid state disk according to the electrical signal connected to the tray port of the solid state disk;

[0024] If it is monitored that the solid state disk is not in place with the test mainboard, the test controller feeds back that the solid state disk is not in place to the test controller;

[0025] The test controller reports an error through an output device and / or records that the solid state disk is not in place according to the information that the solid state disk is not in place.

[0026] In an exemplary embodiment, before the step of the test controller sending a control temperature control command to the high-low temperature test chamber according to the current test task in the test task list, the test method further comprises:

[0027] The test controller generates a test task according to the execution sequence of the received test program, the operation sequence of each test program, and the duration of each operation of each test program, and the operations performed by one or more test programs and one or more properties of the solid state disk tested by the operations at each time.

[0028] The test controller arranges the test tasks at each time in sequence to form a test task list.

[0029] In an exemplary embodiment, the test system includes a plurality of test mainboards, each of which is electrically connected to a corresponding solid state disk; the test controller sends a current test task in a corresponding test task list to the test mainboard to control the test mainboard to run the corresponding current test task.

[0030] The test controller sends a current test task in a corresponding test task list to the test mainboard to control the test mainboard to run the corresponding current test task.

[0031] To achieve the above purpose, the present application provides a test system for a solid state disk, comprising a test controller, a test mainboard, and a high-low temperature test box for providing a specified environment temperature; wherein,

[0032] The test controller sends a control temperature control command to the high-low temperature test box according to a current test task corresponding to the solid state disk to be tested in a preset test task list, so as to control the environment temperature in the high-low temperature test box to be maintained at a test temperature required by the current test task; wherein, the test task list comprises a timing test task and the current test task;

[0033] The high-low temperature test box controls the environment temperature in the high-low temperature test box to be maintained at the test temperature required by the current test task according to the temperature control command, and feeds back temperature information in the high-low temperature test box to the test controller;

[0034] The test mainboard executes the current test task on the electrically connected solid state disk according to the current test task in the test task list pre-received from the test controller;

[0035] The test controller generates a test record and a test report according to the obtained data using a test program corresponding to the current test task in the test controller; wherein, the obtained data comprises the temperature information in the high-low temperature test box fed back from the high-low temperature test box and test data of the solid state disk measured by the test mainboard when executing the test task on the solid state disk.

[0036] To achieve the above purpose, the present application provides a test controller for a solid state disk, wherein,

[0037] The test controller sends a control temperature control command to the high-low temperature test box according to a current test task corresponding to the solid state disk to be tested in a preset test task list, so as to control the environment temperature in the high-low temperature test box to be maintained at a test temperature required by the current test task; wherein, the test task list comprises a timing test task and the current test task; and

[0038] The test controller generates a test record and a test report according to the obtained data using a test program corresponding to the current test task in the test controller; wherein the obtained data comprises temperature information in the high-low temperature test box fed back from the high-low temperature test box and test data of the solid state disk measured by the test mainboard when the solid state disk is executing the current test task in the test task list received in advance.

[0039] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent to those skilled in the art upon examination of the following or can be learned by practice of the application. Other advantages of the application can be realized and attained by means of the instrumentalities and combinations particularly described herein. BRIEF DESCRIPTION OF DRAWINGS

[0040] The accompanying drawings are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the principles of the application. The drawings are intended for illustrative purposes and should not be considered to limit or otherwise restrict the scope of the application.

[0041] Figure 1 A flow chart of the test method for the solid state disk in the embodiments of the present application;

[0042] Figure 2 A block diagram of the test system for the solid state disk in the embodiments of the present application. DETAILED DESCRIPTION

[0043] The present application describes a plurality of embodiments, but the description is exemplary rather than limiting, and it is obvious to those skilled in the art that there can be more embodiments and implementation schemes within the scope of the embodiments described in the present application. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are possible. Unless specifically limited, any feature or element of any embodiment can be utilized with any other feature or element of any other embodiment, or can replace any other feature or element in any other embodiment.

[0044] This application includes and contemplates combinations of features and elements known to those of ordinary skill in the art. The embodiments, features, and elements disclosed herein can also be combined with any conventional feature or element to form a unique application that is defined by the claims. Any feature or element of any embodiment can also be combined with features or elements from other application to form another unique application that is defined by the claims. Therefore, it should be understood that any feature shown and / or discussed in this application can be implemented alone or in any appropriate combination. Embodiments are therefore not to be limited to the other limitations as set forth in the claims and their equivalents. Moreover, various modifications and changes can be made within the scope of the claims that follow.

[0045] Furthermore, in describing representative embodiments, the specification can have presented the method and / or process as a particular sequence of steps. However, to the extent that the method or process depends on more than one step, the method or process should not be limited to those steps executed in the particular order shown. Other steps that are performed before, after, between, or parallel to the described steps could be provided in alternate embodiments consistent with the application. Therefore, the particular order in which the steps are presented is not limiting of the claims. Further, the claims should not be limited to the order in which the steps are written.

[0046] To achieve the purposes of the present application, the embodiments of the present application provide a testing method of a solid state disk, applied to Figure 2 The testing system of the solid state disk is shown in the figure, and the testing system 100 includes a testing controller 110, a testing mainboard 120, and a high-low temperature test box 130 for providing a specified environment temperature. The solid state disk 300 electrically connected to the testing mainboard 120 is in the high-low temperature test box 130, and the high-low temperature test box 130 is used to provide the specified environment temperature for the solid state disk 300 in it. As shown in the figure, Figure 1 and Figure 2 The testing method includes steps S101-S105.

[0047] Step S101, the testing controller according to the current testing task corresponding to the solid state disk to be tested in the preset testing task list.

[0048] The testing program of the solid state disk is installed in the testing controller. According to the application scene, the testing program of the solid state disk can be up to dozens of kinds, and the multiple testing programs can be executed at the same time or the time partially overlaps. Generally, the testing personnel needs to frequently operate the testing program and maintain the normal operation of the testing program to prevent the testing process from being abnormal and interrupted.

[0049] In order to organize the operation of the solid state disk in the high-low temperature test chamber when the test program of the solid state disk is executed, so as to improve the test efficiency of the solid state disk, in the embodiment of the application, the test controller and the test mainboard use a test task list to execute the test task according to the order of the test task in the test task list. The test task list includes a timing test task and a current test task. The current test task refers to the test task executed at the current time. The timing test task refers to the test task which is not executed at present according to the arrangement in the test task list, but is executed when a certain time or the previous task in the test list reaches a certain progress.

[0050] In an exemplary embodiment, in order to organize the test task list, pywinauto+pyQt+Django web framework is used for software integrated development in the test controller or in other clients to automate the test work. Pywinauto is a set of python modules for automating Microsoft Windows GUI, which allows testers to operate through input devices (such as mouse and keyboard) to send commands to window dialog boxes and controls. PyQt is a toolkit for creating GUI applications, which is the result of the fusion of Python programming language and Qt library, and realizes a set of Python modules (including more than 300 classes, nearly 6000 functions and methods). It is a multi-platform toolkit that can run on all major operating systems (including UNIX, Windows and Mac). Django is an open source web application framework written in Python language. By using pywinauto+pyQt+Django web framework, the test controller can receive the selection of the test program, the selection of the options of the test program and the selection of the execution order of the test program by the tester, so as to form each test task in the preset test task list. When each test task is executed according to the test task list by using pywinauto+pyQt+Django web framework, the test program is called by pywinauto module and pyQt module according to the arrangement order of the test task in the test task list, so that the next test task can be automatically executed after the execution of a test task, thereby improving the test efficiency.

[0051] In step S101, the test controller sends a temperature control command to the high-low temperature test chamber through the serial port line (for example, through the I2C line) connected to the high-low temperature test chamber according to the current test task, so as to control the environmental temperature in the high-low temperature test chamber. The hardware facilities of the high-low temperature test chamber feed back the temperature information in the high-low temperature test chamber to the test controller through the serial port line.

[0052] In step S103, the test mainboard executes the current test task on the solid state disk connected to the test mainboard according to the current test task in the test task list previously received from the test controller.

[0053] In an exemplary embodiment, there can be multiple test mainboards 120 in the test system, each of which is connected to one or more solid state disks 300. After generating the test task list, the test controller 110 transmits the test task list to the test mainboard 120. The test mainboard 120 receives the test task list and executes the current test task in the test task list. At the same time, the test controller 110 controls the ambient temperature in the high-low temperature test chamber 130 according to the current test task to provide an appropriate ambient temperature for the solid state disk 300 to execute the current test task. In such an environment, the test mainboard 120 executes the current test task on the solid state disk 300 connected to the test mainboard 120 and obtains the test data of the solid state disk 300 from the solid state disk 300. The test mainboard 120 transmits the obtained test data of the solid state disk to the test controller 110.

[0054] In step S105, the test controller generates a test record and a test report according to the obtained data using the test program corresponding to the current test task in the test controller.

[0055] The obtained data includes the temperature information in the high-low temperature test chamber fed back from the high-low temperature test chamber and the test data of the solid state disk measured by the test mainboard when executing the test task on the solid state disk. The test report contains test conclusion, test background, test purpose, test scheme and test process. The test record contains test start time, test end time, test exception time, test data, test category and test item.

[0056] Compared with the related art, the embodiments of the present application include that the test controller sends a temperature control command to the high-low temperature test chamber according to the current test task of the solid state disk to be tested in the preset test task list, and the test mainboard executes the current test task on the solid state disk connected to the test mainboard according to the current test task in the test task list previously received from the test controller, so that the steps of the high-low temperature test scheme of the solid state disk can be simplified. In addition, the test controller generates a test record and a test report according to the obtained data using the test program corresponding to the current test task in the test controller, thereby improving the test efficiency.

[0057] In an exemplary embodiment, the test method further includes that the test controller uploads the test record and the test report to a log server.

[0058] The test records and test reports stored in the log server are also monitored. If abnormal test records and test reports are monitored, the abnormal test project is kicked out accordingly, and the abnormal test report is sent to the tester through the smptlib and email modules of the Python language.

[0059] In an exemplary embodiment, the test method further comprises:

[0060] The test mainboard monitors the test data of the connected solid state disk during the execution of the current test task;

[0061] If the test data is abnormal, the test mainboard captures the log information of the solid state disk; wherein the log information of the solid state disk includes at least one of the following: drive log, SMART log and system log of the solid state disk;

[0062] The test mainboard transmits the log information of the solid state disk to the test controller;

[0063] The test controller generates an error log according to the log information of the solid state disk using the test program corresponding to the current test task in the test controller.

[0064] The SMART (Self_Monitoring, Analysis and Reporting Technology) log is mainly used to exclude the predictable mechanical failure in the hard disk (unpredictable failure includes damage caused by hard disk circuit board quality problems, impact from external forces, etc.), and statistics show that such predictable failure accounts for more than 60% of the total number of hard disk failures, therefore, the SMART technology strives to provide a warning before such failure occurs, so as to protect the data content from loss.

[0065] For the stored data, the conventional test data mode is log storage, but once the abnormal data log occurs, the test site needs to be restored and reproduced, and the data collection and analysis of the abnormality are re-performed. This is because in the conventional non-automated test hard disk process, the drive log and SMART log of the solid state disk (including the self-owned log of the solid state disk) cannot be collected in time, resulting in the need to spend a lot of time to reproduce and analyze the problem site. The log of the fault point must have timeliness, and missing the fault point will lead to the need to reproduce the fault point and analyze it. In the embodiment of the application, the test mainboard is added to the monitoring process of the test data of the solid state disk. Not only will the test controller analyze the test data generated by the test task, but also the test mainboard will make a real-time judgment on whether there is an abnormality in the test process. If an abnormality occurs, the log information of the solid state disk is captured in real time, thereby avoiding the decline in test efficiency caused by reproducing the problem site for analysis of the fault.

[0066] In an exemplary embodiment, the step of the test mainboard capturing the log information of the solid state disk comprises:

[0067] The test controller captures the log information of the solid state disk through the Nvme-MI protocol.

[0068] Nvme-MI (Management Interface) defines a new complete NVMe SSD (Solid State Disk) management method, and supports OOB (Out-Of-Band) management method to perform some basic management on the NVMe device. Out-of-band management is a management that operates using hardware resources and components that are independent of the operating system control. The out-of-band communication path is from the management controller to the management terminal through MCTP on SMBus / I2C or MCTP on PCIe VDM. Unlike the NVMe protocol, the NVMe-MI protocol is transmitted through the MCTP (Management Component Transport Protocol) protocol, and the underlying physical layer supports PCIe or SMBus / I2C. We choose SMBUS / I2C for research, and the advantage is that it is separated from the NVMe protocol. Even if the solid state disk is faulty in the NVMe, there is still another path to view the status of the solid state disk. In the embodiment of the application, the log information of the solid state disk is collected according to the MI packet in the Nvme-MI protocol, which obviously avoids the interference of the log information collection process on the test speed of the solid state disk.

[0069] In an exemplary embodiment, after the step of generating the error log according to the log information of the solid state disk by the test controller using the test program corresponding to the current test task in the test controller, the method further comprises:

[0070] uploading the error log to the log server by the test controller.

[0071] In an exemplary embodiment, the test controller uploads the error log to the log server through a Socket socket.

[0072] The error log is different from the access log in both format and content. However, the error log also provides rich information like the access log, so that the running condition of the server and where the problem occurs can be analyzed using the information.

[0073] In an exemplary embodiment, the method further comprises:

[0074] monitoring the in-place state of the solid state disk according to the electrical signal of the tray port connected to the solid state disk by the test mainboard;

[0075] feeding back to the test controller that the solid state disk is not in place if it is monitored that the solid state disk is not in place with the test mainboard;

[0076] reporting an error and / or recording that the solid state disk is not in place by the test controller according to the information that the solid state disk is not in place.

[0077] In an exemplary embodiment, before step S101, the method further comprises:

[0078] generating the test task by the test controller according to the execution sequence of the received test program, the operation sequence of each test program, and the duration of each operation of each test program, summarizing the operation performed by one or more test programs executed at each time and one or more properties of the solid state disk tested by the operation.

[0079] sequentially arranging the test task at each time by the test controller to form a test task list.

[0080] To achieve the purpose of the present application, an embodiment of the present application provides a test system for a solid state disk, as shown in Figure 2 The test system 100 comprises a test controller 110, a test mainboard 120, and a high-low temperature test chamber 130 for providing a specified environment temperature; wherein,

[0081] The test controller 110 sends a temperature control command to the high-low temperature test chamber 130 according to a current test task corresponding to the solid state disk 300 to be tested in a preset test task list, so as to control the environmental temperature in the high-low temperature test chamber 130 to keep at a test temperature required by the current test task; wherein the test task list includes a timing test task and the current test task.

[0082] The high-low temperature test chamber 130 controls the environmental temperature in the high-low temperature test chamber 130 to keep at the test temperature required by the current test task according to the temperature control command, and feeds back temperature information in the high-low temperature test chamber to the test controller 110.

[0083] The test mainboard 120 executes the current test task on the electrically connected solid state disk 300 according to the current test task in the test task list received in advance from the test controller;

[0084] The test controller 110 generates a test report according to obtained data using a test program corresponding to the current test task in the test controller 110; wherein the obtained data includes the temperature information in the high-low temperature test chamber 130 fed back from the high-low temperature test chamber 130 and test data of the solid state disk 300 measured by the test mainboard 120 when the test task is executed on the solid state disk 300.

[0085] In order to achieve the purpose of the present application, the embodiment of the present application provides a test controller of a solid state disk, wherein,

[0086] The test controller sends a temperature control command to the high-low temperature test chamber according to a current test task corresponding to the solid state disk to be tested in a preset test task list, so as to control the environmental temperature in the high-low temperature test chamber to keep at a test temperature required by the current test task; wherein the test task list includes a timing test task and the current test task.

[0087] The test controller generates a test record and a test report according to obtained data using a test program corresponding to the current test task in the test controller; wherein the obtained data includes the temperature information in the high-low temperature test chamber fed back from the high-low temperature test chamber and test data of the solid state disk measured by the test mainboard when the current test task in the test task list received in advance is executed on the solid state disk.

[0088] Those of ordinary skill in the art will realize and understand that all or some of the steps in the methods disclosed above and the functional modules / units in the systems and devices can be implemented as software, firmware, hardware, and appropriate combinations thereof. In hardware implementation, the division between the functional modules / units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component can have multiple functions, or one function or step can be performed by several physical components in cooperation. Some or all of the components can be implemented as software executed by a processor, such as a digital signal processor or a microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on computer-readable media, which can include computer storage media (or non-transitory media) and communication media (or transitory media). As is well known to those of ordinary skill in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, it is common and well understood by those of ordinary skill in the art that communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and can include any information delivery media.

Claims

1. A method of testing a solid state drive, the method comprising: The application discloses a test system applied to a solid state disk, and a test method thereof. The test system comprises a test controller, a test mainboard and a high-low temperature test box for providing a specified environment temperature. The test mainboard is electrically connected with a solid state disk to be tested. The test mainboard is connected with the test controller. The solid state disk to be tested is arranged in the high-low temperature test box. The test method comprises the following steps: The test controller collects the operation executed by one or more test programs at each moment and one or more properties of the solid state disk tested by the operation according to the execution sequence of the test programs, the operation sequence of each test program and the duration of each operation of each test program, and generates a test task. The test controller arranges the test task at each moment in sequence to form a preset test task list. The test controller sends a control temperature control command to the high-low temperature test box according to a current test task corresponding to the solid state disk to be tested in the test task list, so as to control the environment temperature in the high-low temperature test box to be kept at a test temperature required by the current test task. The test task list comprises a timing test task and the current test task. The test mainboard executes the current test task on the solid state disk connected with the test mainboard according to the current test task in the test task list received from the test controller in advance. The test controller generates a test record and a test report according to the obtained data by using a test program corresponding to the current test task in the test controller. The obtained data comprises temperature information of the high-low temperature test box fed back from the high-low temperature test box and test data of the solid state disk measured by the test mainboard when the test task is executed on the solid state disk.

2. The test method of claim 1, wherein, The test method further comprises the following steps: The test mainboard monitors the test data of the connected solid state disk when the current test task is executed. If the test data is abnormal, the test mainboard captures log information of the solid state disk. The log information of the solid state disk comprises at least one of the following: a drive log, a SMART log and a system log of the solid state disk. The test mainboard transmits the log information of the solid state disk to the test controller. The test controller generates an error log according to the log information of the solid state disk by using a test program corresponding to the current test task in the test controller.

3. The test method of claim 1, wherein, After the step of generating a test record and a test report by using a test program corresponding to the obtained data in the test controller, the test method further comprises the following steps: The test controller uploads the test record and the test report to a log server.

4. The test method of claim 2, wherein, The step of capturing the log information of the solid state disk by the test mainboard comprises the following steps: The test mainboard captures the log information of the solid state disk by using an Nvme-MI protocol.

5. The test method of claim 2, wherein, After the step of generating an error log according to log information of the solid state disk by the test controller using a test program corresponding to the current test task in the test controller, the method further comprises: The test controller uploads the error log to a log server.

6. The test method of claim 1, wherein, The method further comprises: The test mainboard monitors the in-place state of the solid state disk according to electrical signals of a tray port connected to the solid state disk; If it is monitored that the solid state disk is not in place with the test mainboard, the test controller is fed back that the solid state disk is not in place; The test controller reports an error and / or records that the solid state disk is not in place through an output device according to the information that the solid state disk is not in place.

7. The test method of claim 1, wherein, The test system comprises a plurality of test mainboards, wherein each test mainboard is electrically connected to a corresponding solid state disk; The step of the test controller issuing the current test task to the test mainboard to control the test mainboard to run the current test task comprises: The test controller issues the current test task in the test task list to the test mainboard to control the test mainboard to run the corresponding current test task.

8. A test system of a solid state drive, characterized by, The test controller, the test mainboard, and a high-low temperature test box for providing a specified environment temperature; wherein, The test controller generates a test task according to the execution sequence of the received test programs, the operation sequence of each test program, and the duration of each operation of each test program, and the operations performed by one or more test programs at each time and one or more properties of the solid state disk tested by the operations; The test controller arranges the test tasks at each time in sequence to form a preset test task list; The test controller sends a temperature control command to the high-low temperature test box according to the current test task corresponding to the solid state disk to be tested in the test task list to control the environment temperature in the high-low temperature test box to remain at the test temperature required by the current test task; wherein, the test task list comprises a timing test task and the current test task; The high-low temperature test box controls the environment temperature in the high-low temperature test box to remain at the test temperature required by the current test task according to the temperature control command, and feeds back the temperature information in the high-low temperature test box to the test controller; The test mainboard executes the current test task on the electrically connected solid state disk according to the current test task in the test task list pre-received from the test controller; and The test controller generates a test record and a test report according to the obtained data using a test program corresponding to the current test task in the test controller; wherein, the obtained data comprises the temperature information in the high-low temperature test box fed back from the high-low temperature test box and the test data of the solid state disk measured by the test mainboard when executing the test task on the solid state disk.

9. A test controller of a solid state disk, characterized by, The test controller generates a test task according to the execution sequence of the received test programs, the operation sequence of each test program, and the duration of each operation of each test program, the operations performed by one or more test programs executed at each time, and one or more properties of the solid state disk tested by the operations; The test controller arranges the test tasks at each time in sequence to form a preset test task list; The test controller sends a control temperature control command to the high-low temperature test chamber according to the current test task corresponding to the solid state disk under test in the test task list to control the environmental temperature in the high-low temperature test chamber to remain at the test temperature required by the current test task; wherein the test task list includes a timing test task and the current test task; and The test controller generates a test record and a test report according to the obtained data using the test program corresponding to the current test task in the test controller; wherein the obtained data includes the temperature information of the high-low temperature test chamber fed back from the high-low temperature test chamber and the test data of the solid state disk measured by the test mainboard when the current test task in the test task list received in advance is performed on the solid state disk.

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