An automatic test system, method, apparatus and medium for a network-on-chip
By automatically generating verification environments and test cases through an automated testing system, the problems of long verification time and poor reusability in SoC design of NOC are solved, and efficient performance analysis and bottleneck location are achieved, thereby improving verification efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
- Filing Date
- 2023-03-17
- Publication Date
- 2026-07-21
AI Technical Summary
In SoC design, NOC verification suffers from diverse module types and configurations, resulting in long testing times, poor test case reusability, low performance analysis efficiency, and difficulty in quickly locating transmission bottlenecks.
An automated testing system for on-chip networks is proposed, comprising a basic verification environment module, a signal connection module, a standard test case module, a data reading module, a performance analysis module, and a performance evaluation module. The system automatically generates the verification environment and test cases through configuration files, thereby achieving automated testing.
It improves the efficiency and reusability of NOC verification, reduces the time spent repeatedly setting up the environment, quickly locates performance bottlenecks, and improves the work efficiency of verification personnel.
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