Clamp, testing device and method for panel cell segment crimping unit conduction test

Abstract

The application discloses a clamp, a testing device and a method for on-off test of a panel cell section crimping unit, comprising a testing unit, a first switching on-off unit and a second switching on-off unit; one end of the first switching on-off unit is electrically connected with the testing unit, and the other end of the first switching on-off unit is provided with a clamp for electrically connecting a gold finger of a signal input connector of the panel cell section crimping unit; the second switching on-off unit comprises a first interface for electrically connecting all probes of a pressure head assembly of the panel cell section crimping unit and a second interface for electrically connecting the testing unit; and the second interface is electrically connected with the testing unit. The application can perform on-off test on the panel cell section crimping unit before delivery, so as to guarantee the quality of the panel cell section crimping unit.

Description

Technical Field

[0001] This invention belongs to the field of display device testing technology, and specifically discloses an automatic continuity test device for panel cell segment crimping units and a display panel testing device and method. Background Technology

[0002] With the development of domestic technology, various panel testing equipment and fixtures are gradually being localized. For example, the panel cell segment crimping unit (probe unit technology) used in cell segment products was previously monopolized by South Korea, but now several domestic companies have the capability to design and manufacture panel cell segment crimping units. Figure 1 , 2 As shown, the panel cell segment crimping unit consists of N identical crimping head assemblies 7. Each crimping head assembly 7 is equipped with a probe 8, and each crimping head assembly 7 can crimp one display panel 9, allowing N display panels 9 to be crimped simultaneously. When the panel cell segment crimping unit is installed on the equipment, the N signal input connectors 4 interface with the equipment. The input connectors 4 transmit data through the PCBA 5 to the FPC 6 on the N crimping head assemblies, then to the probes 8, and finally to the product, enabling the product to light up before relevant tests are performed. However, since there is no corresponding equipment and product for the panel cell segment crimping unit to perform lighting tests before shipment, other methods must be used to test the continuity of the crimping head assembly 7. Typically, the panel cell segment crimping unit needs to undergo continuity testing after manufacturing. The existing testing method for the panel cell segment crimping unit is as follows: a multimeter is used during testing. To test continuity, one end of the test probe is connected to the contact point on the signal input port of the cell segment crimping unit on the panel, and the other end is connected to the probe tip of the cell segment crimping unit. Each probe is tested according to the correspondence of the signal diagram. The drawback of this testing method is that it is extremely labor-intensive and difficult to operate. In particular, when the spacing between the PAD points of the product is less than 0.16mm, the current PCBA process cannot produce a PCBA that meets the accuracy requirements, and thus it is impossible to achieve continuity testing of such cell segment crimping units. Therefore, it is urgent to develop a continuity testing device for cell segment crimping units to solve the above technical problems. Summary of the Invention

[0003] To address the technical problems existing in the prior art, the present invention provides an automatic continuity testing device for panel cell segment crimping units, which can perform continuity testing on panel cell segment crimping units before shipment, thereby ensuring the quality of panel cell segment crimping units.

[0004] This invention discloses a fixture for conducting continuity testing of cell segment crimping units in a panel, comprising two interconnected clamping continuity components with adjustable spacing. Each clamping continuity component includes a base, on which a PCB board is disposed. The PCB board is provided with a probe assembly for connecting to the signal input connector and an adapter interface for connecting to the adapter assembly.

[0005] In a preferred embodiment of the present invention, a spring and a threaded locking assembly are provided between two bases, the threaded locking assembly including a screw provided on one base and a threaded hole provided on the other base.

[0006] In a preferred embodiment of the present invention, a guide assembly is provided between two bases, the guide assembly including a positioning pin disposed on one base and a positioning hole disposed on the other base.

[0007] This invention also discloses an automatic continuity testing device for panel cell segment crimping units, comprising a testing unit, a first transition continuity unit, and a second transition continuity unit; one end of the first transition continuity unit is electrically connected to the testing unit, and the other end of the first transition continuity unit is provided with a clamp for electrically connecting the gold fingers of the signal input connector of the panel cell segment crimping unit; the second transition continuity unit includes a first interface for electrically connecting all probes of the crimping head assembly of the panel cell segment crimping unit and a second interface for electrically connecting the testing unit; the second interface is electrically connected to the testing unit.

[0008] In a preferred embodiment of the present invention, the area of ​​the first interface is larger than the area of ​​all probes of the pressure head assembly.

[0009] In a preferred embodiment of the present invention, the conductive connector and the test unit are connected by an adapter assembly, the adapter assembly including an adapter, a wire and a horn-shaped connector, one end of the wire being connected to the adapter and the other end of the wire being connected to the horn-shaped connector, the horn-shaped connector being provided with a plurality of connection terminals, the connection terminals corresponding one-to-one with the PIN pins on the gold fingers of the signal input connector.

[0010] In a preferred embodiment of the present invention, the conductive connector and the test unit are connected by multiple signal lines, which are electrically connected to the input terminal of the test unit through an interface component, and each of the multiple signal lines corresponds to a signal terminal of the input terminal of the test unit.

[0011] In a preferred embodiment of the present invention, a spring and a threaded locking assembly are provided between two bases, the threaded locking assembly including a screw provided on one base and a threaded hole provided on the other base.

[0012] In a preferred embodiment of the present invention, a guide assembly is provided between two bases, the guide assembly including a positioning pin disposed on one base and a positioning hole disposed on the other base.

[0013] In a preferred embodiment of the present invention, the adapter assembly includes multiple wires, each of which corresponds one-to-one with a PIN pin on the gold finger of the signal input connector.

[0014] In a preferred embodiment of the present invention, the second transfer and conduction unit is a PCBA, and the first interface and the second interface are provided on one side surface of the PCBA, and the first interface and the second interface are electrically connected.

[0015] In a preferred embodiment of the present invention, the testing unit includes a PLC, a microcontroller, or a computer.

[0016] This invention also discloses a manual continuity test method for a cell segment crimping unit. An automatic continuity test device for a panel cell segment crimping unit is used to connect the cell segment crimping unit to be tested. Before testing, the fixture is connected to a signal input connector of the cell segment crimping unit, and the crimping head assembly of the cell segment crimping unit is connected to the first interface. During testing, a detection signal is sent based on the test unit. The detection signal is returned to the test unit sequentially through the second and first transition continuity units, thereby obtaining the continuity information of each probe on the crimping head assembly of the cell segment crimping unit.

[0017] The beneficial effects of the present invention are as follows: The present invention designs a clamp for quick connection of the gold fingers of the signal input connector of the panel cell segment crimping unit, which includes two interconnected clamping and conductive components with adjustable spacing. Each clamping and conductive component includes a base, on which a PCB board is provided. The PCB board is provided with a probe assembly for connecting the signal input connector and an adapter for connecting the adapter assembly. The clamp has the advantages of simple structure, easy replacement and good compatibility.

[0018] Furthermore, a spring and a threaded locking assembly are provided between the two bases of the present invention. The threaded locking assembly includes a screw provided on one base and a threaded hole provided on the other base. This structural design facilitates the connection between the panel cell segment pressing unit and the clamp.

[0019] Furthermore, a guide assembly is provided between the two bases of the present invention. The guide assembly includes a positioning pin provided on one base and a positioning hole provided on the other base. This structural design facilitates the sliding guidance between the panel cell segment pressing unit and the clamp.

[0020] Furthermore, this invention also discloses an automatic continuity testing device for panel cell segment crimping units, which has the advantages of simple structure, high detection efficiency, and good stability. This invention realizes the connection of panel cell segment crimping units by introducing a first and a second transition continuity unit. The connection is realized by introducing a second transition continuity unit with two interfaces, thereby enabling indirect continuity measurement of the crimping head assembly of the panel cell segment crimping unit. This technical solution greatly improves the convenience of panel cell segment crimping unit detection operation and enhances the detection efficiency of panel cell segment crimping units.

[0021] Furthermore, the area of ​​the first interface of the present invention is larger than the area of ​​all probes of the indenter assembly, thereby facilitating the crimping and connection between the indenter assembly and the first transition and conduction unit. Compared with the "point-to-point" conduction method in the prior art, the "point-to-multipoint" conduction method of the present invention can not only connect all probes on all indenter assemblies at one time, but also does not require precise alignment between the two, thus improving the detection efficiency of the present invention.

[0022] Furthermore, the clamp of the present invention includes two interconnected clamping and conducting assemblies with adjustable spacing. Each clamping and conducting assembly includes a base, on which a PCB board is disposed. The PCB board is provided with a probe assembly for connecting the signal input connector and an adapter for connecting the adapter assembly. This structural design can adapt to the connection and conduction of various types of panel cell segment crimping units.

[0023] Furthermore, the adapter assembly of the present invention includes an adapter, a wire, and a horn-shaped base. One end of the wire is connected to the adapter, and the other end of the wire is connected to the horn-shaped base. The horn-shaped base is provided with the connection terminal. This structure has the advantages of simple structure and easy debugging and assembly.

[0024] Furthermore, the present invention also discloses a manual continuity test method for a panel cell segment crimping unit, the specific steps of which include: S1, aligning and crimping the probe of a crimping head assembly with the first interface of a second adapter continuity unit, wherein the first adapter continuity unit is connected to the gold finger of the signal input connector corresponding to the crimping head assembly; S2, the test unit sends a test signal and obtains the test result; based on the test method of the present invention, the position of the crimping head assembly after the test is completed is also precisely adjusted, so no secondary adjustment is required at the customer's site after leaving the factory. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the panel cell segment crimping unit;

[0026] Figure 2This is a schematic diagram showing the display panel being connected via the cell segment crimping unit.

[0027] Figure 3 This is a schematic diagram of a fixture for conducting continuity testing of panel cell segment crimping units according to the present invention;

[0028] Figure 4 This is a schematic diagram of the left half of the clamp holding the continuity component of a fixture for conducting continuity testing of panel cell segment crimping units according to the present invention.

[0029] Figure 5 This is a schematic diagram of the right half of the clamping conductive component of a fixture for conducting continuity testing of panel cell segment crimping units according to the present invention.

[0030] Figure 6 This is a schematic diagram of the loosened state of a clamp for conducting continuity testing of a panel cell segment crimping unit according to the present invention.

[0031] Figure 7 This is a schematic diagram of the clamping state of a fixture for conducting continuity testing of panel cell segment crimping units according to the present invention.

[0032] Figure 8 This is a schematic diagram of an automatic continuity test device for panel cell segment crimping unit according to the present invention;

[0033] Figure 9 This is a schematic diagram of the adapter component of an automatic continuity test device for panel cell segment crimping unit according to the present invention;

[0034] In the diagram: 1-Test unit, 2-First adapter conduction unit, 3-Second adapter conduction unit, 4-Signal input connector, 5-PCBA, 6-FPC, 7-Pressure head assembly, 8-Probe, 9-Display panel, 21-Clamp, 22-Adapter assembly, 31-First interface, 32-Second interface, 211-Base, 212-PCB board, 213-Probe assembly, 214-Adapter, 215-Spring, 216-Threaded locking assembly, 217-Guide assembly, 221-Adapter, 222-Wire, 223-Horn base. Detailed Implementation

[0035] Those skilled in the art will readily understand that the above are merely preferred embodiments of the present invention and are not intended to limit the invention. Any modifications, combinations, substitutions, or improvements made within the spirit and principles of the present invention are included within the scope of protection of the present invention. The technical solutions (including preferred technical solutions) of the present invention will be further described in detail below with reference to the accompanying drawings and by listing some optional embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0036] Preferably, such as Figures 3-7 As shown, the present invention discloses a fixture for conducting continuity tests on cell segment crimping units of a panel. The fixture 21 includes two interconnected clamping continuity components with adjustable spacing. Each clamping continuity component includes a base 211, on which a PCB board 212 is disposed. The PCB board 212 is provided with a probe 8 component 213 for connecting to a signal input connector 4 and an adapter 214 for connecting to an adapter component 22. The adapter 214 can be a MIPI interface.

[0037] Preferably, a spring 215 and a threaded locking assembly 216 are provided between the two bases 211. The threaded locking assembly 216 includes a screw on one base 211 and a threaded hole on the other base 211. The locking and unlocking of the threaded locking assembly 216 can adjust the distance between the two bases 211, thereby enabling the crimping and conduction of the gold fingers of the signal input connector 4 of the panel cell segment crimping unit on the PCB board 212 with the probe 8.

[0038] Preferably, a guide component 217 is provided between the two bases 211. The guide component 217 includes a positioning pin provided on one base 211 and a positioning hole provided on the other base 211. This structural design can stably realize the crimping and conduction between the probe 8 on the PCB board 212 and the gold finger of the signal input connector 4 of the panel cell segment crimping unit, effectively reducing the risk of damage to the gold finger of the signal input connector 4 of the panel cell segment crimping unit during crimping.

[0039] like Figure 8As shown, this invention discloses an automatic continuity testing device for panel cell segment crimping units, including a testing unit 1, a first transition continuity unit 2, and a second transition continuity unit 3. One end of the first transition continuity unit 2 is electrically connected to the testing unit 1, and the other end of the first transition continuity unit 2 is provided with a clamp 21 for electrically connecting the gold fingers of the signal input connector 4 of the panel cell segment crimping unit. The second transition continuity unit 3 includes a first interface 31 for electrically connecting to the gold fingers of the crimping head assembly 7 of the panel cell segment crimping unit and a second interface 32 for connecting to the testing unit 1. The second interface 32 is electrically connected to the testing unit 1. It should be noted that the first interface 31 is a conductive surface. When the gold fingers of the crimping head assembly 7 of the panel cell segment crimping unit contact the conductive surface, all the pins on the gold fingers of the crimping head assembly 7 of the panel cell segment crimping unit are simultaneously connected. Since the testing unit 1 of this invention has a visualization function, it can display the continuity status of all pins, which is convenient for recording and archiving, and has the advantages of high reliability and high precision testing efficiency.

[0040] Preferably, the area of ​​the first interface 31 is larger than the area of ​​all probes of the pressure head assembly. Compared with the prior art's "point-to-point" connection between the panel cell segment crimping unit and the test unit 1, the present invention discloses a "point-to-multipoint" indirect connection scheme. That is, the pressure head assembly 7 of the panel cell segment crimping unit first achieves "point-to-multipoint" connection with the first interface 31, and the test unit 1 achieves "point-to-multipoint" connection with the second interface 32, thereby realizing the electrical connection between the test unit 1 and the pressure head assembly 7 of the panel cell segment crimping unit.

[0041] Preferably, the connection scheme between the fixture 21 and the test unit 1 can include the following two:

[0042] like Figure 9 As shown, preferably, the fixture 21 and the test unit 1 are connected via an adapter assembly 22. The adapter assembly 22 includes an adapter 221, a wire 222, and a horn-shaped connector 223. One end of the wire 222 is connected to the adapter 221, and the other end is connected to the horn-shaped connector 223. The horn-shaped connector 223 is provided with multiple connection terminals, each corresponding to a PIN pin on the gold finger of the signal input connector 4. The horn-shaped connector 223 can be plugged into the test unit 1. Alternatively, the fixture 21 and the test unit 1 are connected via multiple signal lines. These signal lines are electrically connected to the input terminal of the test unit via an interface assembly, and each signal line corresponds to a signal terminal on the input terminal of the test unit.

[0043] Preferably, the second transfer and conduction unit 3 is a PCBA, and a first interface 31 and a second interface 32 are provided on one side surface of the PCBA, and the first interface 31 and the second interface 32 are electrically connected.

[0044] Preferably, the test unit 1 includes a PLC, a microcontroller, or a computer.

[0045] This invention also discloses a manual continuity test method for cell segment crimping units. An automatic continuity test device for panel cell segment crimping units is used to connect the cell segment crimping unit under test. Before testing, the fixture 21 is connected to a signal input connector 4 of the cell segment crimping unit under test, and the crimping head assembly 7 of the cell segment crimping unit under test is connected to the first interface 31. During testing, a detection signal is sent by the test unit 1. The detection signal returns to the test unit 1 sequentially through the second transition continuity unit 3 and the first transition continuity unit 2, obtaining the continuity information of each probe on the crimping head assembly 7 of the cell segment crimping unit under test. The signal flow of this invention is as follows: the test unit 1 outputs a signal, which is received through the universal second transition continuity unit 3 - each probe 8 of the crimping head assembly 7 - FPC - PCBA 5 - first transition continuity unit 2 - test unit 1. This allows for program setup, clearly showing the continuity status of each path, and direct data reading on the touchscreen. After testing one pressure head assembly 7, simply unplug the clamp 21 of the first adapter connection unit 2 and insert it into the connector corresponding to another pressure head assembly 7 to be tested. Simultaneously, place the second adapter connection unit 3 below the probe of the pressure head assembly 7 under test. This invention allows for testing of one pressure head assembly 7 with only one wire insertion and removal. Utilizing a PLC to test multiple probes on the same pressure head assembly 7 simultaneously further improves efficiency. The test results are visualized, facilitating recording and archiving. The program-controlled testing of this invention results in higher reliability and eliminates misjudgments caused by human testing errors.

[0046] In the description of this application, it should be noted that the terms "upper," "lower," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Unless otherwise expressly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two elements. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0047] It should be noted that in this application, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0048] The above description is merely a specific embodiment of this application, enabling those skilled in the art to understand or implement this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. An automatic continuity testing device for panel cell segment crimping units, characterized in that: The system includes a test unit, a first transition conduction unit, and a second transition conduction unit. One end of the first transition conduction unit is electrically connected to the input terminal of the test unit, and the other end of the first transition conduction unit is provided with a fixture for conducting continuity tests on the panel cell segment crimping unit. The fixture is connected to the gold fingers of the signal input connector of the panel cell segment crimping unit. The second transition conduction unit includes a first interface for electrically connecting to all probes of the crimping head assembly of the panel cell segment crimping unit and a second interface for electrically connecting to the output terminal of the test unit. The test unit is used to send test signals and provide feedback on test results. The first interface is a conductive surface, and the area of ​​the conductive surface is larger than the area of ​​all probes of the crimping head assembly. When all probes of the crimping head assembly contact the conductive surface, all probes of the crimping head assembly simultaneously conduct. The fixture for conducting continuity testing of panel cell segment crimping units includes two interconnected clamping continuity assemblies with adjustable spacing. Each clamping continuity assembly includes a base on which a PCB board is mounted. The PCB board has a probe assembly for connecting to the signal input connector and an adapter for connecting to the adapter assembly. A spring and threaded locking assembly are provided between the two bases. The threaded locking assembly includes a screw on one base and a threaded hole on the other base. A guide assembly is provided between the two bases. The guide assembly includes a locating pin on one base and a locating hole on the other base.

2. The automatic continuity test device for panel cell segment crimping unit according to claim 1, characterized in that: The fixture and the test unit are connected by an adapter assembly, which includes an adapter, a wire, and a horn-shaped connector. One end of the wire is connected to the adapter, and the other end of the wire is connected to the horn-shaped connector. The horn-shaped connector is provided with multiple connection terminals, and each connection terminal corresponds to a PIN pin on the gold finger of the signal input connector.

3. The automatic continuity test device for panel cell segment crimping unit according to claim 1, characterized in that: The fixture and the test unit are connected by multiple signal lines. These multiple signal lines are electrically connected to the input terminal of the test unit through an interface component, and each of the multiple signal lines corresponds to a signal terminal of the input terminal of the test unit.

4. The automatic continuity test device for panel cell segment crimping unit according to claim 1, characterized in that: The second adapter is a PCBA, and the first interface and the second interface are provided on one side surface of the PCBA. The first interface and the second interface are electrically connected.

5. The automatic continuity testing device for panel cell segment crimping unit according to claim 1, characterized in that: The testing unit includes a PLC, a microcontroller, or a computer.

6. An automatic continuity test method for panel cell segment crimping units, characterized in that: The automatic continuity test device for panel cell segment crimping units as described in any one of claims 1-5 is used to connect the panel cell segment crimping unit under test. Before testing, the fixture is connected to a signal input connector of the panel cell segment crimping unit under test, and the crimping head assembly of the panel cell segment crimping unit under test is connected to the first interface. During testing, a detection signal is sent based on the test unit. After the detection signal returns to the test unit through the second transition continuity unit and the first transition continuity unit in sequence, the continuity information of each probe on the crimping head assembly of the panel cell segment crimping unit under test is obtained.

7. The automatic continuity test method for panel cell segment crimping unit according to claim 6, characterized in that: The specific steps include, S1, align and press the probe of a pressure head assembly with the first interface of the second adapter and connection unit, and the first adapter and connection unit is connected to the gold finger of the signal input connector corresponding to the pressure head assembly; S2, the test unit sends a test signal and obtains the test result.

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