A crystal resonator production quality evaluation system

Abstract

The application discloses a crystal resonator production quality evaluation system and relates to the technical field of crystal resonator production; the crystal resonator production quality evaluation system comprises a resonator image acquisition module, a resonator apparent quality analysis module, a resonator testing module, a resonator testing information acquisition module, a resonator performance analysis module, a resonator quality analysis module and a warning terminal; the apparent quality of each to-be-detected crystal resonator in a current production batch of a designated resonator manufacturing enterprise is analyzed, and then the sensitivity and stability of each target crystal resonator are analyzed through random sampling, so that the defects existing in the prior art are solved, the accurate analysis of the quality of the crystal resonator is realized, the quality of the to-be-detected crystal resonator in the current production batch is ensured, and then the experience of subsequent users in the use process is improved, and the reputation and sales volume of the crystal resonator enterprise are also improved.

Description

Technical Field

[0001] This invention relates to the field of crystal resonator manufacturing technology, specifically to a crystal resonator manufacturing quality evaluation system. Background Technology

[0002] As a high-precision oscillator with strong anti-interference capabilities, crystal resonators are widely used in various electronic products such as computers. To ensure the stability of electronic products during use, it is necessary to ensure the quality of crystal resonators. Therefore, it is necessary to monitor the production quality of crystal resonators after production.

[0003] Currently, the production quality inspection of crystal resonators mainly focuses on inspecting their appearance and resonant frequency. Clearly, this inspection method has at least the following problems: 1. The stability of crystal resonators affects the performance of subsequent electronic products. Current technology does not analyze the stability of crystal resonators in production batches, thus failing to effectively guarantee the quality of crystal resonators and affecting their service life. On the other hand, the lack of analysis on the sensitivity of crystal resonators hinders the improvement of the user experience during use, and also reduces the effectiveness of cooperation between partner companies and crystal resonator manufacturers, thereby lowering the reputation and sales volume of crystal resonator manufacturers.

[0004] 2. Ambient temperature affects the performance of crystal resonators. Current technology does not analyze the stability of crystal resonators in production batches under different ambient temperatures, thus failing to guarantee the performance of crystal resonators in various temperature environments. This also limits the applicable scenarios for crystal resonators, making it impossible to meet customer needs in different environments and impacting the sales of crystal resonator companies. Summary of the Invention

[0005] To address the aforementioned problems, the present invention aims to provide a crystal resonator production quality evaluation system.

[0006] To solve the above-mentioned technical problems, the present invention adopts the following technical solution: a crystal resonator production quality evaluation system, including a resonator image acquisition module, used to acquire images of each crystal resonator to be tested in the current production batch in a specified resonator manufacturing enterprise; The resonator apparent quality analysis module is used to analyze the apparent quality compliance coefficient of each crystal resonator under test based on the image corresponding to each crystal resonator under test, and then screen out each crystal resonator under test with qualified apparent quality, and record them as each target crystal resonator. The resonator test module is used to extract each test crystal resonator from each target crystal resonator, and then set up a benchmark test group and a temperature test group, and perform tests on the benchmark test group and the temperature test group. The resonator test information acquisition module is used to acquire the benchmark test information corresponding to the benchmark test group and the temperature test information corresponding to the temperature test group when the benchmark test group and the temperature test group are being tested. The resonator performance analysis module is used to analyze the performance evaluation coefficients of each test crystal resonator based on the benchmark test information corresponding to the benchmark test group and the temperature test information corresponding to the temperature test group. The resonator quality analysis module is used to analyze the production quality pass rate of the target crystal resonator in the current production batch of a specified resonator manufacturer, and then determine the production quality pass rate of the target crystal resonator in the current production batch of the specified resonator manufacturer. The early warning terminal is used to issue early warnings when the production quality pass rate of the target crystal resonator in the current production batch of a designated resonator manufacturer fails to meet the standards.

[0007] Preferably, the analysis of the apparent quality conformity coefficients corresponding to each crystal resonator under test is carried out in the following specific analysis process: The base size, base thickness, position of each lead, and length of each lead are obtained from the images corresponding to each crystal resonator under test, and the total weight of each crystal under test is collected. By analyzing the base dimensions, base thickness, and total weight of each crystal resonator under test, the first apparent quality compliance coefficient for each crystal resonator under test is obtained, denoted as [missing information]. , where i represents the number corresponding to each crystal resonator to be tested. ; Based on the position and length of each lead of each crystal resonator under test, the second apparent quality coincidence coefficient for each crystal resonator under test is obtained, denoted as . ; Through calculation formula The apparent quality conformity coefficients of each crystal resonator under test are obtained. ,in , These are the weighting factors corresponding to the set first and second apparent quality compliance coefficients, respectively.

[0008] Preferably, the specific testing process in the resonator testing module is as follows: A1. Randomly sample from each target crystal resonator to obtain each test crystal resonator, and then divide them into each reference test crystal resonator and each temperature test crystal resonator in an equal manner. The reference test crystal resonators are taken as the reference test group, and the temperature test crystal resonators are taken as the temperature test group. A2. Connect each benchmark crystal resonator in the benchmark test group to each external test circuit at a specified temperature, and then perform the benchmark test group test. A3. Connect each temperature test crystal resonator in the temperature test group to the target circuit at each temperature, and then perform the temperature test group test.

[0009] Preferably, the benchmark information corresponding to the benchmark test group includes the response time of each benchmark crystal resonator, the frequency at each acquisition time point, and the voltage at each acquisition time point; The temperature test information corresponding to the temperature test group includes the response time of each temperature test crystal resonator, the frequency at each monitoring time point, and the temperature at each monitoring time point.

[0010] Preferably, the analysis of the performance evaluation coefficients corresponding to each test crystal resonator is carried out in the following specific analysis process: Substitute the response times of each benchmark crystal resonator in the benchmark test group into the calculation formula. In this process, the sensitivity coincidence coefficients corresponding to each benchmark crystal resonator in the benchmark test group are obtained. , This represents the response time of the j-th benchmark crystal resonator in the benchmark test set. The set reference response time for the crystal resonator. The set permissible response time difference for the crystal resonator. The correction factor is set to correspond to the sensitivity coincidence coefficient, where j represents the number of each reference crystal resonator. ; According to the calculation formula The performance compliance coefficients of each benchmark crystal resonator in the benchmark test group were obtained. , , Let represent the frequency and voltage of the j-th benchmark crystal resonator in the benchmark test group at the t-th acquisition time point, respectively. , These represent the standard frequency and standard voltage corresponding to the set crystal resonator. , These are the weighting factors corresponding to the set crystal resonator frequency and voltage compatibility, respectively. The correction factor is set to correspond to the performance compliance coefficient, where t represents the number corresponding to each data acquisition time point. ; Through calculation formula The performance stability coefficients of each benchmark crystal resonator in the benchmark test group were obtained. , , Let represent the frequency and voltage of the j-th benchmark crystal resonator in the benchmark test group at the (t-1)-th acquisition time point, respectively. , These are the set permissible frequency difference and permissible voltage difference for the crystal resonator. , These are the weighting factors corresponding to the set frequency stability and voltage stability, respectively. The correction factor corresponding to the set performance temperature coefficient; Through calculation formula The performance evaluation coefficients corresponding to each benchmark crystal resonator in the benchmark test group were obtained. , , , These are the weighting factors corresponding to the set sensitivity compliance coefficient, performance compliance coefficient, and performance stability coefficient, respectively. Based on the temperature test information corresponding to the temperature test group, the performance evaluation coefficients corresponding to each temperature test crystal resonator in the temperature test group are analyzed and obtained.

[0011] Preferably, the performance evaluation coefficients corresponding to each temperature-tested crystal resonator in the temperature test group are obtained through analysis. The specific analysis process is as follows: The response time of each temperature test crystal resonator in the temperature test group is analyzed according to the sensitivity coincidence coefficient analysis process of each benchmark test crystal resonator in the benchmark test group. The sensitivity coincidence coefficient of each temperature test crystal resonator in the temperature test group is then obtained and denoted as [missing information]. , This indicates the number corresponding to each temperature-testing crystal resonator. ; According to the calculation formula The performance compliance and stability coefficients of each temperature-tested crystal resonator in the temperature test group were obtained. , , These represent the first and second temperatures in the temperature test group, respectively. The temperature-tested crystal resonator is in the first... The frequency and temperature corresponding to each monitoring time point , These represent the first and second temperatures in the temperature test group, respectively. The temperature-tested crystal resonator is in the first... The frequency and temperature corresponding to each monitoring time point , These are the weighting factors corresponding to the set temperature test crystal resonator performance compliance and stability. , The weighting factors corresponding to the frequency stability and temperature stability of the crystal resonator are set for the temperature test. This indicates the number corresponding to each monitoring time point. ; Through calculation formula The performance evaluation coefficients corresponding to each temperature-tested crystal resonator in the temperature test group were obtained. , , These are the weighting factors corresponding to the set sensitivity compliance coefficient, performance compliance coefficient, and stability coefficient, respectively, where e represents the natural constant.

[0012] Preferably, the production quality pass rate of the target crystal resonator in the current production batch of the specified resonator manufacturer is analyzed. The specific analysis process is as follows: The performance evaluation coefficients of each benchmark crystal resonator in the benchmark test group are compared with the set performance evaluation coefficient thresholds for the benchmark crystal resonators. If the performance evaluation coefficient of a benchmark crystal resonator in the benchmark test group is greater than or equal to the performance evaluation coefficient threshold, then the performance of that benchmark crystal resonator in the benchmark test group is deemed qualified. The number of qualified benchmark crystal resonators in the benchmark test group is then counted and denoted as Q. Similarly, the number of qualified temperature crystal resonators in the temperature test group is obtained and denoted as... ; According to the calculation formula This yields the production quality pass rate of the target crystal resonator in the current production batch from a specified resonator manufacturer, where m represents the number of benchmark crystal resonators in the benchmark test group. This indicates the number of temperature testing crystal resonators in the temperature testing group.

[0013] Preferably, the production quality of the target crystal resonator in the current production batch of the designated resonator manufacturer is determined. The specific determination process is as follows: The production quality pass rate of the target crystal resonator in the current production batch of the designated resonator manufacturer is compared with the set standard production quality pass rate. If the production quality pass rate of the target crystal resonator in the current production batch is greater than or equal to the standard production quality pass rate, the production quality pass rate of the target crystal resonator in the current production batch is determined to meet the standard; otherwise, the production quality pass rate of the target crystal resonator in the current production batch is determined to fail to meet the standard.

[0014] Compared with the prior art, the beneficial effects of the present invention are as follows: 1. The present invention provides a crystal resonator production quality evaluation system. By analyzing the apparent quality of each crystal resonator to be tested in the current production batch of a designated resonator manufacturer, and then analyzing the sensitivity and stability of each target crystal resonator through random sampling, it solves the shortcomings of the current technology, realizes accurate analysis of crystal resonator quality, greatly ensures the quality of the crystal resonators to be tested in the current production batch, improves the service life of crystal resonators, and enhances the user experience during subsequent use. At the same time, it effectively ensures the cooperation effect between the cooperating enterprise and the crystal resonator enterprise, and protects the reputation and sales volume of the crystal resonator enterprise.

[0015] 2. In the resonator appearance quality analysis module, this invention analyzes the appearance quality of the crystal resonator, effectively ensuring the appearance quality of the crystal resonator and providing assurance for subsequent sampling inspection of the crystal resonator.

[0016] 3. In the resonator performance analysis module, this invention analyzes the sensitivity and stability of each benchmark crystal resonator in the benchmark test group and each temperature test crystal resonator in the temperature test group. This effectively ensures the performance of the crystal resonator and its effectiveness in various temperature environments. It also enriches the applicable scenarios of the crystal resonator, meets the needs of customers in different environments, and improves the sales of crystal resonator companies. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the system module structure connection of the present invention. Detailed Implementation

[0019] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0020] Please see Figure 1As shown, a crystal resonator production quality evaluation system includes a resonator image acquisition module, a resonator appearance quality analysis module, a resonator testing module, a resonator test information acquisition module, a resonator performance analysis module, a resonator quality analysis module, and an early warning terminal.

[0021] The resonator apparent quality analysis module is connected to the resonator image acquisition module and the resonator test module, respectively. The resonator test information acquisition module is connected to the resonator test module and the resonator performance analysis module, respectively. The resonator quality analysis module is connected to the resonator performance analysis module and the early warning terminal, respectively.

[0022] The resonator image acquisition module is used to acquire images of each crystal resonator to be tested in the current production batch of a specified resonator manufacturer. In the above, images of each crystal resonator to be tested in the current production batch of a designated resonator manufacturer are captured by a camera.

[0023] The resonator apparent quality analysis module is used to analyze the apparent quality compliance coefficient of each crystal resonator under test based on the image corresponding to each crystal resonator under test, and then screen out each crystal resonator under test with qualified apparent quality, and record them as each target crystal resonator. In a specific embodiment, the apparent quality coincidence coefficients corresponding to each crystal resonator under test are analyzed. The specific analysis process is as follows: The base size, base thickness, position of each lead, and length of each lead are obtained from the images corresponding to each crystal resonator under test, and the total weight of each crystal under test is collected. It should be noted that the total weight of each crystal resonator under test is collected by a weight sensor.

[0024] By analyzing the base dimensions, base thickness, and total weight of each crystal resonator under test, the first apparent quality compliance coefficient for each crystal resonator under test is obtained, denoted as [missing information]. , where i represents the number corresponding to each crystal resonator to be tested. ; In the above analysis, the first apparent quality compliance coefficient corresponding to each crystal resonator under test was obtained. The specific analysis process is as follows: Substitute the base size, base thickness, and total weight corresponding to each crystal resonator under test into the calculation formula. In this process, the first apparent quality coincidence coefficient corresponding to each crystal resonator under test is obtained. C, H, and G represent the standard base dimensions, base thickness, and total weight of the crystal resonator, respectively. , , These represent the base dimensions, base thickness, and total weight corresponding to the i-th crystal resonator under test, respectively. , , These are the weighting factors corresponding to the set base size, base thickness, and total weight, respectively.

[0025] It should be noted that the standard base dimensions, base thickness, and total weight of the crystal resonator were obtained from the production management center.

[0026] Based on the position and length of each lead of each crystal resonator under test, the second apparent quality coincidence coefficient for each crystal resonator under test is obtained, denoted as . ; In the above analysis, the second apparent quality conformity coefficient corresponding to each crystal resonator under test is obtained. The specific analysis process is as follows: The standard position and standard length of each lead in the crystal resonator are obtained from the production management center. Then, the position of each lead corresponding to each crystal resonator under test is compared with its corresponding standard position. If the position of a lead corresponding to a certain crystal resonator under test is different from its corresponding standard position, the conformity coefficient of the lead position of that crystal resonator under test is recorded as... If the positions of all leads of a crystal resonator under test are identical to their corresponding standard positions, then the conformity coefficient of the lead positions of the crystal resonator under test is denoted as... Thus, the lead position coincidence coefficients corresponding to each crystal resonator under test are obtained. ,in Values or ,and < , and All are natural numbers; Through calculation formula The second apparent quality coincidence coefficients corresponding to each crystal resonator under test are obtained. , Let L represent the length of the u-th lead corresponding to the i-th crystal resonator under test, and L represent the standard lead length of the crystal resonator. , These are the set lead position compliance coefficient and the weighting factor corresponding to the lead length, respectively, where u represents the number corresponding to each lead. .

[0027] Through calculation formula The apparent quality conformity coefficients of each crystal resonator under test are obtained. ,in , These are the weighting factors corresponding to the set first and second apparent quality compliance coefficients, respectively.

[0028] In the above process, the apparent quality of each crystal resonator to be tested is selected. The specific selection process is as follows: The apparent quality compliance coefficient of each crystal resonator to be tested is compared with the standard apparent quality compliance coefficient of the crystal resonator. If the apparent quality compliance coefficient of a certain crystal resonator to be tested is greater than or equal to the standard apparent quality compliance coefficient of the crystal resonator, then the apparent quality of the crystal resonator to be tested is determined to be qualified. In this way, each crystal resonator to be tested that has qualified apparent quality is obtained.

[0029] This invention analyzes the apparent quality of crystal resonators in the resonator appearance quality analysis module, effectively ensuring the appearance quality of crystal resonators and providing assurance for subsequent sampling inspection of crystal resonators.

[0030] The resonator test module is used to extract each test crystal resonator from each target crystal resonator, and then set up a benchmark test group and a temperature test group, and perform tests on the benchmark test group and the temperature test group. In a specific embodiment, the specific testing process in the resonator testing module is as follows: A1. Randomly sample from each target crystal resonator to obtain each test crystal resonator, and then divide them into each reference test crystal resonator and each temperature test crystal resonator in an equal manner. The reference test crystal resonators are taken as the reference test group, and the temperature test crystal resonators are taken as the temperature test group. A2. Connect each benchmark crystal resonator in the benchmark test group to each external test circuit at a specified temperature, and then perform the benchmark test group test. It should be noted that the power-on voltage of each external test circuit is different.

[0031] A3. Connect each temperature test crystal resonator in the temperature test group to the target circuit at each temperature, and then perform the temperature test group test.

[0032] It should be noted that the voltage applied to the target circuit is the same at all temperatures.

[0033] The resonator test information acquisition module is used to acquire the benchmark test information corresponding to the benchmark test group and the temperature test information corresponding to the temperature test group when the benchmark test group and the temperature test group are being tested. In one specific embodiment, the benchmark information corresponding to the benchmark test group includes the response time of each benchmark crystal resonator, the frequency at each acquisition time point, and the voltage at each acquisition time point; In the above, the benchmark test information corresponding to the benchmark test group is collected. The specific collection process is as follows: the time taken for each benchmark crystal resonator in the benchmark test group to reach the set standard frequency of the crystal resonator is collected by a timer and used as the response time of each benchmark crystal resonator. Each benchmark crystal resonator in the benchmark test group is connected to a spectrum analyzer, and the time taken for each benchmark crystal resonator to reach the set standard frequency is collected and used as the response time of each benchmark crystal resonator. The time when each reference crystal resonator reaches the set standard frequency corresponding to the crystal resonator is taken as the start time point of each reference crystal resonator. Then, each acquisition time point is set from the start time point of each reference crystal resonator according to the preset time interval, and then the frequency of each reference crystal resonator at each acquisition time point is extracted from the spectrum analyzer. The voltage of each reference crystal resonator was collected at each acquisition time point using a voltmeter.

[0034] The temperature test information corresponding to the temperature test group includes the response time of each temperature test crystal resonator, the frequency at each monitoring time point, and the temperature at each monitoring time point.

[0035] In the above, the temperature test information corresponding to the temperature test group is collected. The specific collection process is as follows: according to the collection process of the response time of each benchmark crystal resonator in the benchmark test group and the voltage at each collection time point, the response time of each temperature test crystal resonator in the temperature test group and the frequency at each monitoring time point are collected. Temperature sensors are used to collect the temperature of each temperature test crystal resonator in the temperature test group at each monitoring time point.

[0036] The resonator performance analysis module is used to analyze the performance evaluation coefficients of each test crystal resonator based on the benchmark test information corresponding to the benchmark test group and the temperature test information corresponding to the temperature test group. In a specific embodiment, the performance evaluation coefficients corresponding to each test crystal resonator are analyzed. The specific analysis process is as follows: Substitute the response times of each benchmark crystal resonator in the benchmark test group into the calculation formula. In this process, the sensitivity coincidence coefficients corresponding to each benchmark crystal resonator in the benchmark test group are obtained. , This represents the response time of the j-th benchmark crystal resonator in the benchmark test set. The set reference response time for the crystal resonator. The set permissible response time difference for the crystal resonator. The correction factor is set to correspond to the sensitivity coincidence coefficient, where j represents the number of each reference crystal resonator. ; According to the calculation formula The performance compliance coefficients of each benchmark crystal resonator in the benchmark test group were obtained. , , Let represent the frequency and voltage of the j-th benchmark crystal resonator in the benchmark test group at the t-th acquisition time point, respectively. , These represent the standard frequency and standard voltage corresponding to the set crystal resonator. , These are the weighting factors corresponding to the set crystal resonator frequency and voltage compatibility, respectively. The correction factor is set to correspond to the performance compliance coefficient, where t represents the number corresponding to each data acquisition time point. ; Through calculation formula The performance stability coefficients of each benchmark crystal resonator in the benchmark test group were obtained. , , Let represent the frequency and voltage of the j-th benchmark crystal resonator in the benchmark test group at the (t-1)-th acquisition time point, respectively. , These are the set permissible frequency difference and permissible voltage difference for the crystal resonator. , These are the weighting factors corresponding to the set frequency stability and voltage stability, respectively. The correction factor corresponding to the set performance temperature coefficient; Through calculation formula The performance evaluation coefficients corresponding to each benchmark crystal resonator in the benchmark test group were obtained. , , , These are the weighting factors corresponding to the set sensitivity compliance coefficient, performance compliance coefficient, and performance stability coefficient, respectively. Based on the temperature test information corresponding to the temperature test group, the performance evaluation coefficients corresponding to each temperature test crystal resonator in the temperature test group are analyzed and obtained.

[0037] In another specific embodiment, the performance evaluation coefficients corresponding to each temperature-tested crystal resonator in the temperature test group are analyzed and obtained. The specific analysis process is as follows: The response time of each temperature test crystal resonator in the temperature test group is analyzed according to the sensitivity coincidence coefficient analysis process of each benchmark test crystal resonator in the benchmark test group. The sensitivity coincidence coefficient of each temperature test crystal resonator in the temperature test group is then obtained and denoted as [missing information]. , This indicates the number corresponding to each temperature-testing crystal resonator. ; According to the calculation formula The performance compliance and stability coefficients of each temperature-tested crystal resonator in the temperature test group were obtained. , , These represent the first and second temperatures in the temperature test group, respectively. The temperature-tested crystal resonator is in the first... Frequency and temperature corresponding to each monitoring time point , These represent the first and second temperatures in the temperature test group, respectively. The temperature-tested crystal resonator is in the first... Frequency and temperature corresponding to each monitoring time point , These are the weighting factors corresponding to the set temperature test crystal resonator performance compliance and stability. , The weighting factors corresponding to the frequency stability and temperature stability of the crystal resonator are set for the temperature test. This indicates the number corresponding to each monitoring time point. ; Through calculation formula The performance evaluation coefficients corresponding to each temperature-tested crystal resonator in the temperature test group were obtained. , , These are the weighting factors corresponding to the set sensitivity compliance coefficient, performance compliance coefficient, and stability coefficient, respectively, where e represents the natural constant.

[0038] This invention analyzes the sensitivity and stability of each benchmark crystal resonator in the benchmark test group and each temperature test crystal resonator in the temperature test group within the resonator performance analysis module. This effectively ensures the performance of the crystal resonator and its effectiveness in various temperature environments. It also enriches the applicable scenarios of the crystal resonator, meets the needs of customers in different environments, and improves the sales of crystal resonator companies.

[0039] The resonator quality analysis module is used to analyze the production quality pass rate of the target crystal resonator in the current production batch of a specified resonator manufacturer, and then determine the production quality pass rate of the target crystal resonator in the current production batch of the specified resonator manufacturer. In a specific embodiment, the production quality pass rate of the target crystal resonator corresponding to the current production batch in a designated resonator manufacturer is analyzed. The specific analysis process is as follows: The performance evaluation coefficients of each benchmark crystal resonator in the benchmark test group are compared with the set performance evaluation coefficient thresholds for the benchmark crystal resonators. If the performance evaluation coefficient of a benchmark crystal resonator in the benchmark test group is greater than or equal to the performance evaluation coefficient threshold, then the performance of that benchmark crystal resonator in the benchmark test group is deemed qualified. The number of qualified benchmark crystal resonators in the benchmark test group is then counted and denoted as Q. Similarly, the number of qualified temperature crystal resonators in the temperature test group is obtained and denoted as... ; According to the calculation formula This yields the production quality pass rate of the target crystal resonator in the current production batch from a specified resonator manufacturer, where m represents the number of benchmark crystal resonators in the benchmark test group. This indicates the number of temperature testing crystal resonators in the temperature testing group.

[0040] In yet another specific embodiment, the production quality of the target crystal resonator corresponding to the current production batch in a designated resonator manufacturer is determined. The specific determination process is as follows: The production quality pass rate of the target crystal resonator in the current production batch of the designated resonator manufacturer is compared with the set standard production quality pass rate. If the production quality pass rate of the target crystal resonator in the current production batch is greater than or equal to the standard production quality pass rate, the production quality pass rate of the target crystal resonator in the current production batch is determined to meet the standard; otherwise, the production quality pass rate of the target crystal resonator in the current production batch is determined to fail to meet the standard.

[0041] This invention analyzes the apparent quality of each crystal resonator to be tested in the current production batch of a designated resonator manufacturer, and then analyzes the sensitivity and stability of each target crystal resonator through random sampling. This solves the shortcomings of current technology, achieves accurate analysis of crystal resonator quality, greatly ensures the quality of the crystal resonators to be tested in the current production batch, increases the service life of crystal resonators, and improves the user experience. It also effectively protects the cooperation between partner companies and crystal resonator manufacturers, ensuring the reputation and sales volume of crystal resonator manufacturers.

[0042] The early warning terminal is used to issue early warnings when the production quality pass rate of the target crystal resonator in the current production batch of a designated resonator manufacturer fails to meet the standards.

[0043] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A crystal resonator manufacturing quality evaluation system, characterized in that, include: The resonator image acquisition module is used to acquire images of each crystal resonator to be tested in the current production batch of a specified resonator manufacturer. The resonator apparent quality analysis module is used to analyze the apparent quality compliance coefficient of each crystal resonator under test based on the image corresponding to each crystal resonator under test, and then screen out each crystal resonator under test with qualified apparent quality, and record them as each target crystal resonator. The resonator test module is used to extract each test crystal resonator from each target crystal resonator, and then set up a benchmark test group and a temperature test group, and perform tests on the benchmark test group and the temperature test group. The resonator test information acquisition module is used to acquire the benchmark test information corresponding to the benchmark test group and the temperature test information corresponding to the temperature test group when the benchmark test group and the temperature test group are being tested. The resonator performance analysis module is used to analyze the performance evaluation coefficients of each test crystal resonator based on the benchmark test information corresponding to the benchmark test group and the temperature test information corresponding to the temperature test group. The resonator quality analysis module is used to analyze the production quality pass rate of the target crystal resonator in the current production batch of a specified resonator manufacturer, and then determine the production quality pass rate of the target crystal resonator in the current production batch of the specified resonator manufacturer. The early warning terminal is used to issue early warnings when the production quality pass rate of the target crystal resonator in the current production batch of a designated resonator manufacturer fails to meet the standards. The analysis of the performance evaluation coefficients corresponding to each tested crystal resonator is as follows: Substitute the response times of each benchmark crystal resonator in the benchmark test group into the calculation formula. In this process, the sensitivity coincidence coefficients corresponding to each benchmark crystal resonator in the benchmark test group are obtained. , This represents the response time of the j-th benchmark crystal resonator in the benchmark test set. The set reference response time for the crystal resonator. The set permissible response time difference for the crystal resonator. The correction factor is set to correspond to the sensitivity coincidence coefficient, where j represents the number of each reference crystal resonator. ; According to the calculation formula The performance compliance coefficients of each benchmark crystal resonator in the benchmark test group were obtained. , , Let represent the frequency and voltage of the j-th benchmark crystal resonator in the benchmark test group at the t-th acquisition time point, respectively. , These represent the standard frequency and standard voltage corresponding to the set crystal resonator. , These are the weighting factors corresponding to the set crystal resonator frequency and voltage compatibility, respectively. The correction factor is set to correspond to the performance compliance coefficient, where t represents the number corresponding to each data acquisition time point. ; Through calculation formula The performance stability coefficients of each benchmark crystal resonator in the benchmark test group were obtained. , , Let represent the frequency and voltage of the j-th benchmark crystal resonator in the benchmark test group at the (t-1)-th acquisition time point, respectively. , These are the set permissible frequency difference and permissible voltage difference for the crystal resonator. , These are the weighting factors corresponding to the set frequency stability and voltage stability, respectively. The correction factor corresponding to the set performance temperature coefficient; Through calculation formula The performance evaluation coefficients corresponding to each benchmark crystal resonator in the benchmark test group were obtained. , , , These are the weighting factors corresponding to the set sensitivity compliance coefficient, performance compliance coefficient, and performance stability coefficient, respectively. Based on the temperature test information corresponding to the temperature test group, the performance evaluation coefficients corresponding to each temperature test crystal resonator in the temperature test group are analyzed and obtained.

2. The crystal resonator production quality evaluation system as described in claim 1, characterized in that, The analysis of the apparent quality coincidence coefficients for each crystal resonator under test is performed as follows: The base size, base thickness, position of each lead, and length of each lead are obtained from the images corresponding to each crystal resonator under test, and the total weight of each crystal under test is collected. By analyzing the base dimensions, base thickness, and total weight of each crystal resonator under test, the first apparent quality compliance coefficient for each crystal resonator under test is obtained, denoted as [missing information]. , where i represents the number corresponding to each crystal resonator to be tested. ; Based on the position and length of each lead of each crystal resonator under test, the second apparent quality coincidence coefficient for each crystal resonator under test is obtained, denoted as . ; Through calculation formula The apparent quality conformity coefficients of each crystal resonator under test are obtained. ,in , These are the weighting factors corresponding to the set first and second apparent quality compliance coefficients, respectively.

3. The crystal resonator production quality evaluation system as described in claim 1, characterized in that, The specific testing process in the resonator testing module is as follows: A1. Randomly sample from each target crystal resonator to obtain each test crystal resonator, and then divide them into each reference test crystal resonator and each temperature test crystal resonator in an equal manner. The reference test crystal resonators are taken as the reference test group, and the temperature test crystal resonators are taken as the temperature test group. A2. Connect each benchmark crystal resonator in the benchmark test group to each external test circuit at a specified temperature, and then perform the benchmark test group test. A3. Connect each temperature test crystal resonator in the temperature test group to the target circuit at each temperature, and then perform the temperature test group test.

4. The crystal resonator production quality evaluation system as described in claim 3, characterized in that, The benchmark information corresponding to the benchmark test group includes the response time of each benchmark crystal resonator, the frequency at each acquisition time point, and the voltage at each acquisition time point; The temperature test information corresponding to the temperature test group includes the response time of each temperature test crystal resonator, the frequency at each monitoring time point, and the temperature at each monitoring time point.

5. The crystal resonator production quality evaluation system as described in claim 4, characterized in that, The analysis yielded performance evaluation coefficients for each temperature-tested crystal resonator in the temperature test group. The specific analysis process is as follows: The response time of each temperature test crystal resonator in the temperature test group is analyzed according to the sensitivity coincidence coefficient analysis process of each benchmark test crystal resonator in the benchmark test group. The sensitivity coincidence coefficient of each temperature test crystal resonator in the temperature test group is then obtained and denoted as [missing information]. , This indicates the number corresponding to each temperature-testing crystal resonator. ; According to the calculation formula The performance compliance and stability coefficients of each temperature-tested crystal resonator in the temperature test group were obtained. , , These represent the first and second temperatures in the temperature test group, respectively. The temperature-tested crystal resonator is in the first... Frequency and temperature corresponding to each monitoring time point , These represent the first and second temperatures in the temperature test group, respectively. The temperature-tested crystal resonator is in the first... Frequency and temperature corresponding to each monitoring time point , These are the weighting factors corresponding to the set temperature test crystal resonator performance compliance and stability. , The weighting factors corresponding to the frequency stability and temperature stability of the crystal resonator are set for the temperature test. This indicates the number corresponding to each monitoring time point. ; Through calculation formula The performance evaluation coefficients corresponding to each temperature-tested crystal resonator in the temperature test group were obtained. , , These are the weighting factors corresponding to the set sensitivity compliance coefficient, performance compliance coefficient, and stability coefficient, respectively, where e represents the natural constant.

6. The crystal resonator production quality evaluation system as described in claim 5, characterized in that, The analysis describes the production quality pass rate of the target crystal resonator in the current production batch of the specified resonator manufacturer. The specific analysis process is as follows: The performance evaluation coefficients of each benchmark crystal resonator in the benchmark test group are compared with the set performance evaluation coefficient thresholds for the benchmark crystal resonators. If the performance evaluation coefficient of a benchmark crystal resonator in the benchmark test group is greater than or equal to the performance evaluation coefficient threshold, then the performance of that benchmark crystal resonator in the benchmark test group is deemed qualified. The number of qualified benchmark crystal resonators in the benchmark test group is then counted and denoted as Q. Similarly, the number of qualified temperature crystal resonators in the temperature test group is obtained and denoted as... ; According to the calculation formula This yields the production quality pass rate of the target crystal resonator in the current production batch from a specified resonator manufacturer, where m represents the number of benchmark crystal resonators in the benchmark test group. This indicates the number of temperature testing crystal resonators in the temperature testing group.

7. The crystal resonator production quality evaluation system as described in claim 6, characterized in that, The specific process for determining the production quality qualification of the target crystal resonator in the current production batch from a designated resonator manufacturer is as follows: The production quality pass rate of the target crystal resonator in the current production batch of the designated resonator manufacturer is compared with the set standard production quality pass rate. If the production quality pass rate of the target crystal resonator in the current production batch is greater than or equal to the standard production quality pass rate, the production quality pass rate of the target crystal resonator in the current production batch is determined to meet the standard; otherwise, the production quality pass rate of the target crystal resonator in the current production batch is determined to fail to meet the standard.

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