Test method, electronic device and energy storage device

Abstract

The application provides a test method, an electronic device and an energy storage system. The test method is used for power stability test of a device under test. The method comprises: when it is detected that the device under test enters a start test state, acquiring a first power sample value of the device under test every first preset time interval within a preset time period; acquiring a power reference reference value corresponding to each first power sample value; comparing each first power sample value with the power reference reference value corresponding thereto to determine the state of the device under test; when it is determined that the device under test is in a stable state, acquiring a target power reference reference value of the device under test in the stable state; and performing power verification on the device under test based on the target power reference reference value and outputting a verification result. The above method can realize automation of the test process, improve test efficiency and test accuracy, and does not need manual test when the power stability of the device under test is tested.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a testing method, an electronic device and an energy storage device. BACKGROUND

[0002] In the prior art, the power (charging power or discharging power) stability test of a device is performed manually, and the test process is relatively complicated, which not only reduces the test efficiency, but also reduces the test accuracy.

[0003] Therefore, the prior art has defects and needs to be improved and developed. SUMMARY

[0004] In view of this, the present application provides a testing method, an electronic device and an energy storage device, which can solve the technical problems of low test efficiency and poor test accuracy caused by manual power stability test of a device under test.

[0005] The first aspect of the present application provides a testing method, which comprises:

[0006] When it is detected that the device under test enters a start test state, a first power sample value of the device under test is obtained every first preset time interval within a preset time period;

[0007] A power reference value corresponding to each first power sample value is obtained;

[0008] Each first power sample value is compared with the power reference value corresponding thereto to determine the state of the device under test;

[0009] When it is determined that the device under test is in a stable state, a target power reference value of the device under test in the stable state is obtained;

[0010] The device under test is subjected to power verification based on the target power reference value, and a verification result is output.

[0011] The second aspect of the present application provides an electronic device, which comprises a processor and a memory, and the memory stores a computer program, and the processor is configured to execute the foregoing testing method by calling the computer program stored in the memory.

[0012] The third aspect of the present application provides an energy storage device, which comprises a battery module and a processor, and the processor is configured to execute the foregoing testing method to test the power stability of the battery module.

[0013] The application provides a test method, an electronic device and an energy storage device. The test method comprises: when it is detected that a device under test enters a start test state, acquiring a first power sample value of the device under test every first preset time length within a preset time period; acquiring a power reference reference value corresponding to each first power sample value; comparing each first power sample value with the power reference reference value corresponding thereto to determine a state of the device under test; when it is determined that the device under test is in a stable state, acquiring a target power reference reference value of the device under test in the stable state; performing power verification on the device under test based on the target power reference reference value and outputting a verification result.

[0014] The embodiment of the application determines the state of the device under test by comparing each first power sample value of the device under test with the power reference reference value corresponding thereto, and performs power verification on the device under test based on the target power reference reference value when the device under test is in the stable state and outputs a verification result, so that the device under test does not need to be tested manually when the power stability of the device under test is tested, the whole test process is automated, and the test efficiency is improved. Furthermore, the state of the device under test is determined, and the device under test is further verified when the device under test is in the stable state, so that the test accuracy is improved. BRIEF DESCRIPTION OF DRAWINGS

[0015] In order to more clearly illustrate the technical solutions of the embodiments of the application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative effort.

[0016] Figure 1 A flowchart of a test method provided by the embodiment of the application is shown in the figure.

[0017] Figure 2 A flowchart of another test method provided by the embodiment of the application is shown in the figure.

[0018] Figure 3 A flowchart of another test method provided by the embodiment of the application is shown in the figure.

[0019] Figure 4 A structural schematic block diagram of an electronic device provided by the embodiment of the application is shown in the figure.

[0020] Figure 5 A structural schematic block diagram of an energy storage device provided by the embodiment of the application is shown in the figure. DETAILED DESCRIPTION

[0021] With reference to the drawings, the technical solutions in the embodiments of the present application will be clearly and completely described below. Obviously, the described embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts are within the scope of the present application.

[0022] The flowcharts shown in the drawings are only illustrative, and do not necessarily include all the contents and operations / steps, nor are they necessarily executed in the order described. For example, some operations / steps can be further decomposed, combined or partially merged, so the actual execution order can be changed according to the actual situation.

[0023] It should be noted that the terms "first", "second" in the specification and claims of the present application and the drawings are used to distinguish similar objects, and are not used to describe a specific order or sequence.

[0024] It should be understood that the terms used in the specification of the present application are only for the purpose of describing specific embodiments and are not intended to limit the present application. As used in the specification and the appended claims of the present application, the singular forms "a", "an" and "the" are intended to include the plural forms unless the context clearly indicates otherwise.

[0025] Some embodiments will be described below with reference to the accompanying drawings. The following embodiments and features in the embodiments can be combined with each other without conflict.

[0026] The embodiments of the present application provide a test method, an electronic device and an energy storage device.

[0027] For example, the test method can be applied to an electronic device. The electronic device has, for example, a charging function and a discharging function. In order to ensure normal use of the electronic device, the power stability of the electronic device needs to be tested. When the electronic device needs to be tested for power stability, the electronic device can be tested according to the test method provided by the embodiments of the present application.

[0028] Alternatively, the test method can be applied to an energy storage device. The energy storage device includes a battery module and a processor. The battery module has, for example, a charging function and a discharging function, and therefore the power stability of the battery module in the energy storage device needs to be tested. When the battery module in the energy storage device needs to be tested for power stability, the battery module in the energy storage device can be tested according to the test method provided by the embodiments of the present application.

[0029] It should be noted that the test method can also be applied to other devices other than electronic devices and energy storage devices, and the present application does not limit the same. In the following, the device that needs to be tested for power stability is referred to as the measured device, and the device that applies the test method is referred to as the test device.

[0030] The test method provided by the embodiment of the present application comprises: when it is detected that the measured device enters a start test state, obtaining a first power sample value of the measured device every first preset time interval within a preset time period; obtaining a power reference reference value corresponding to each first power sample value; comparing each first power sample value with the power reference reference value corresponding thereto to determine the state of the measured device; when it is determined that the measured device is in a stable state, obtaining a target power reference reference value of the measured device in the stable state; performing power verification on the measured device based on the target power reference reference value and outputting a verification result.

[0031] The embodiment of the present application determines the state of the measured device by comparing each first power sample value of the measured device with the power reference reference value corresponding thereto, and performs power verification on the measured device based on the target power reference reference value when the measured device is in a stable state and outputs a verification result, so that the power stability test of the measured device does not need to rely on manual testing, the entire test process is automated, and the test efficiency is improved. And by determining the state of the measured device and further performing power verification on the measured device when the measured device is in a stable state, the test accuracy is improved.

[0032] Some embodiments of the present application will be described in detail below with reference to the accompanying drawings. In the case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

[0033] Please refer to Figure 1 , Figure 1 A flowchart of a test method provided by the embodiment of the present application is shown. The test method is used for testing the power stability of the measured device. The measured device includes a battery cell, a battery pack, an energy storage device, and other devices with charging and discharging functions, which are not limited herein.

[0034] As Figure 1 shown, the test method comprises S101 to S105.

[0035] S101, when it is detected that the measured device enters a start test state, obtaining a first power sample value of the measured device every first preset time interval within a preset time period.

[0036] For example, when the test device detects that the device under test enters the start test state, the test device needs to obtain a first power sample value of the device under test to determine the power fluctuation of the device under test, so as to determine whether the state of the device under test is a stable state. In some embodiments, when the test device detects that the device under test enters the start test state, for example, when the device under test just starts charging or just starts discharging, the first power sample value of the device under test obtained by the test device generally jumps from 0 and fluctuates greatly. It takes a certain time for the device under test to enter a stable state. Therefore, if the test device determines whether the state of the device under test is a stable state or an abnormal state only according to the first power sample value of the device under test at a certain time point, the state of the device under test is likely to be misjudged as a stable state or an abnormal state. Therefore, when the test device detects that the device under test enters the start test state, the test device can obtain the first power sample value of the device under test every first preset time period within a preset time period, so as to determine the state of the device under test according to multiple first power sample values of the device under test subsequently, which is beneficial to improving the accuracy of determining the state of the device under test subsequently.

[0037] In some embodiments, the first preset time period includes, for example, 1 second, 2 seconds, 3 seconds, and the like, and is of course not limited thereto. The first preset time period can be determined based on how to improve the accuracy of determining the state of the device under test subsequently, for example, the shorter the first preset time period, the shorter the sampling time interval between multiple first power sample values, and the higher the accuracy of determining the state of the device under test by the test device according to multiple first power sample values. The first preset time period can also be determined based on the data interaction time required for sampling the power of the device under test, for example, since the first preset time period is less than the data interaction time required for sampling the power of the device under test, it is easy to lose the current first power sample value in the case that the test device has not obtained the current first power sample value and has to perform the next sampling, and therefore it is necessary to reasonably set the first preset time period, which is not limited herein. Through the setting of the first preset time period, the stability of the test device in obtaining the first power sample value of the device under test is improved.

[0038] S102, obtaining a power reference reference value corresponding to each first power sample value.

[0039] For example, the test device can determine the power fluctuation of the device under test according to each first power sample value and the power reference reference value corresponding to each first power sample value, so as to determine whether the state of the device under test is a stable state subsequently.

[0040] In some embodiments, in the case that the first power sample values at different sampling times fluctuate to different degrees, the power reference reference values corresponding to the first power sample values at different sampling times also change accordingly.

[0041] For example, the first power sampling value P1 is 100 watts, the second power sampling value P2 is 104 watts, the third power sampling value P3 is 109 watts, the fourth power sampling value P4 is 107 watts, the first power reference value W1 corresponding to the first power sampling value is 100 watts, and the first preset power deviation range is [-6 watts, 6 watts]. The first preset power deviation range is, for example, a condition required to be met between the first power sampling value of the measured device and the power reference value corresponding to the first power sampling value in a stable state. If the first power reference value W1 corresponding to the first power sampling value is used as the power reference value corresponding to the first power sampling value P1 to the fourth power sampling value P4, the test device can determine that the first power deviation value is 0 watts, the second power deviation value is 4 watts, the third power deviation value is 9 watts, and the fourth power deviation value is 7 watts. Among them, the third power deviation value and the fourth power deviation value are both not within [-6 watts, 6 watts], that is, the test device can determine that the third power sampling value P3 and the fourth power sampling value P4 have large fluctuations. However, in fact, the power deviation value between the fourth power sampling value P4 and the third power sampling value P3 is -2 watts, that is, in fact, the fourth power fluctuation value is within [-6 watts, 6 watts], and the fourth power sampling value has small fluctuations. If the test device does not obtain the power reference value corresponding to each first power sampling value, it is easy to misjudge the power fluctuation of the measured device when determining the power fluctuation of the measured device and determining whether the state of the measured device is a stable state, thereby causing the test device to misjudge the state of the measured device. Therefore, it is necessary to obtain the power reference value corresponding to each first power sampling value. Of course, it is not limited to this, and is not limited herein.

[0042] S103, compare each first power sampling value with the power reference value corresponding thereto to determine the state of the measured device.

[0043] For example, the test device needs to determine whether the state of the measured device is a stable state. For example, the test device compares each first power sampling value with the power reference value corresponding thereto, which includes obtaining the power deviation value between each first power sampling value and the power reference value corresponding thereto. For example, the test device can determine whether the state of the measured device is a stable state by judging whether the plurality of power deviation values fall within the first preset power deviation range.

[0044] For example, the first power sampling value P1 is 100 watts, the second power sampling value P2 is 104 watts, and the third power sampling value P3 is 109 watts, the power reference reference value W1 corresponding to the first power sampling value P1 is 100 watts, the power reference reference value W2 corresponding to the second power sampling value P2 is 100 watts, and the power reference reference value W3 corresponding to the third power sampling value P3 is 100 watts, and the preset power deviation range is [-6 watts, 6 watts]. The test device can determine that the first power deviation value is 0 watts, the second power deviation value is 4 watts, and the third power deviation value is 9 watts, wherein the third power deviation value is not within [-6 watts, 6 watts]. If the test device only compares the single first power sampling value with the corresponding power reference reference value to determine the state of the device under test, the state of the device under test determined according to the first power deviation value or the second power deviation value is different from the state of the device under test determined according to the third power deviation value, which is easy to cause misjudgment of the state of the device under test.

[0045] Therefore, the test device can compare each first power sampling value with the corresponding power reference reference value to determine the state of the device under test. For example, whether the plurality of power deviation values fall within the preset power deviation range is determined to determine whether the state of the device under test is a stable state, which is beneficial to improve the accuracy of determining the state of the device under test.

[0046] S104, when it is determined that the device under test is in a stable state, obtaining a target power reference reference value of the device under test in the stable state.

[0047] In some embodiments, the power fluctuation of the device under test in the stable state within the second preset power deviation range is allowed, but the power fluctuation outside the second preset power deviation range is not allowed and is abnormal. Therefore, in order to determine whether the power fluctuation of the device under test in the stable state is abnormal, the test device needs to continuously perform power verification on the device under test in the stable state. For example, the test device needs to obtain the target power reference reference value of the device under test in the stable state, so as to subsequently judge whether the power fluctuation of the device under test in the stable state falls within the second preset power deviation range based on the target power reference reference value, so as to perform power verification on the device under test. The verification time of the test device performing power verification on the device under test in the stable state, for example, includes 24 hours, 48 hours, etc., and can be pre-set or set by the user, which is not limited herein.

[0048] For example, the test device can determine the target power reference value of the DUT in the stable state according to the power reference value corresponding to the first power sample value of the DUT in the stable state; the test device can also determine the target power reference value of the DUT in the stable state according to the second power sample value of the DUT in the stable state; of course, the present application is not limited thereto, and the present application is not limited thereto.

[0049] By obtaining the target power reference value of the DUT in the stable state, the DUT in the stable state can be subsequently power checked based on the target power reference value, which is beneficial to improve the continuity of testing the DUT.

[0050] S105, power checking the DUT based on the target power reference value and outputting the checking result.

[0051] In some embodiments, the test device can sample the power of the DUT in the stable state, for example, obtain the second power sample value of the DUT. The second power sample value of the DUT and the target power reference value are compared to determine the power fluctuation, such as the power deviation value, of the DUT in the stable state, and to determine whether the power deviation value of the DUT in the stable state is within the second preset power deviation range, so as to power check the DUT based on the target power reference value and output the checking result.

[0052] For example, when the test device power checks the DUT based on the target power reference value, it can obtain multiple second power sample values of the DUT in the stable state, and then can sequentially perform multiple power checks on the multiple second power sample values based on the target power reference value. Therefore, during the power checking of the DUT, the output checking result can include at least one of the following: checking start time, checking end time, total checking times, target power reference value, second power sample value, whether the power deviation value between the second power sample value and the target power reference value is within the second preset power deviation range, etc.; of course, the present application is not limited thereto, and the present application is not limited thereto.

[0053] By power checking the DUT based on the target power reference value and outputting the checking result, after the testing of the DUT is completed, the user can view the checking result, and can make corresponding settings to the DUT according to the checking result, which is beneficial to save the process of manual power checking by the user, improve the automation degree of testing the DUT, improve the testing efficiency, and improve the testing accuracy.

[0054] For example, the test device compares each first power sample value with the corresponding power reference value to determine the state of the device under test, including: obtaining a first absolute value difference between each first power sample value and the corresponding power reference value; comparing each first absolute value difference with a first preset power deviation value; if there are a first preset number of consecutive first absolute value differences that are less than or equal to the first preset power deviation value, it is determined that the device under test enters a stable state; if there are no first preset number of consecutive first absolute value differences that are less than or equal to the first preset power deviation value, it is determined that the device under test does not enter a stable state.

[0055] In some embodiments, the test device can obtain a first absolute value difference between each first power sample value and the corresponding power reference value by subtracting the corresponding power reference value from each first power sample value and taking the absolute value.

[0056] For example, the first first power sample value P1 is 100 watts, and the corresponding power reference value W1 is 100 watts. The test device can determine that the first absolute value difference |P1-W1| between the first first power sample value P1 and the power reference value W1 is 0 watts. The second first power sample value P2 is 104 watts, and the corresponding power reference value W2 is 100 watts. The test device can determine that the first absolute value difference |P2-W2| between the second first power sample value P2 and the power reference value W2 is 4 watts. The third first power sample value P3 is 107 watts, and the corresponding power reference value W3 is 100 watts. The test device can determine that the first absolute value difference |P3-W3| between the third first power sample value P3 and the power reference value W3 is 7 watts. And so on. By obtaining the first absolute value difference between each first power sample value and the corresponding power reference value for subsequent determination of the power fluctuation corresponding to each first power sample value, the accuracy of determining the state of the device under test is improved, thereby improving the test accuracy of the device under test.

[0057] In some embodiments, the test device can determine whether the first absolute value difference is less than or equal to the first preset power deviation value to compare each first absolute value difference with the first preset power deviation value.

[0058] For example, the first preset power deviation value Pi is 6W, which corresponds to a first preset power deviation range of [-6W, 6W]. Based on this, the test equipment can determine that the first absolute value difference |P1-W1| is less than Pi according to the first absolute value difference |P1-W1| being 0W, and that the first absolute value difference |P2-W2| is less than Pi according to the first absolute value difference |P2-W2| being 4W. The test equipment can determine that the first absolute value difference |P3-W3| is greater than Pi according to the first absolute value difference |P3-W3| being 7W. In this way, by comparing each first absolute value difference with the first preset power deviation value, the test equipment can determine the power fluctuation corresponding to each first power sampling value according to the comparison result, so as to determine the state of the device under test in the future, which is beneficial to improve the test accuracy of the device under test.

[0059] In some embodiments, if there are a continuous first preset number of first absolute value differences that are less than or equal to the first preset power deviation value, it is determined that the device under test enters a stable state.

[0060] For example, the first preset number includes 3, 4, 5, etc. The first preset number can be pre-set or set by the user, which is not limited here.

[0061] For example, the first preset number is 3, and the first preset power deviation value Pi is 6W. If the continuous three first absolute value differences are 0W, 4W, and 2W, respectively, which corresponds to the first power sampling values of the three first absolute value differences fluctuating around the respective power reference values with an amplitude less than or equal to the first preset power deviation value Pi, and the fluctuation amplitude is small, the test equipment can determine that the power of the device under test tends to be stable, and the device under test is in a stable state. By having a continuous first preset number of first absolute value differences less than or equal to the first preset power deviation value, it can be determined that the device under test enters a stable state, which is beneficial to reduce the risk of misjudging that the device under test enters a stable state due to random events such as first power sampling errors, and to improve the accuracy of determining the state of the device under test.

[0062] In some embodiments, if there are no continuous first preset number of first absolute value differences that are less than or equal to the first preset power deviation value, it is determined that the device under test does not enter a stable state.

[0063] For example, the first preset number is 3, the first preset power deviation value ΔPi is 6W, and the first absolute value difference values of the continuous 3 first absolute value difference values are 0W, 7W and 2W, which means that the first power sample values corresponding to the 3 first absolute value difference values do not completely fluctuate around the respective power reference reference value with an amplitude less than or equal to the first preset power deviation value ΔPi, and the fluctuation amplitude is large. Therefore, the test device can determine that the power of the device under test is not stable, and the device under test is not in a stable state. By determining that the device under test is not in a stable state only when the first absolute value difference values of the continuous first preset number are less than or equal to the first preset power deviation value, the test device can continuously determine the state of the device under test according to the first absolute value difference values within the preset time period, until the first absolute value difference values of the continuous first preset number are less than or equal to the first preset power deviation value when the preset time period is reached. This is beneficial to improve the accuracy of determining the state of the device under test.

[0064] In an exemplary embodiment, the number A of the first power sample values less than or equal to the first preset power deviation value can be counted.

[0065] As shown in FIG. 1, the test method involves the following steps: Figure 2

[0066] S201, the test device acquires the first power sample value of the device under test and the power reference reference value corresponding thereto;

[0067] S202, the first absolute value difference value is determined according to the first power sample value and the power reference reference value corresponding thereto;

[0068] S203, it is determined whether the first absolute value difference value is less than or equal to the first preset power deviation value. If yes, go to S204, and if no, go to S205;

[0069] S204, the number A of the first power sample values less than or equal to the first preset power deviation value is increased by 1;

[0070] S205, the number A of the first power sample values less than or equal to the first preset power deviation value is re-assigned to 0;

[0071] S206, it is determined whether the number A is greater than or equal to the first preset number. If no, go to S207, and if yes, go to S208;

[0072] S207, it is determined whether the test time is within the preset time period. If yes, go to S201, and if no, go to S208;

[0073] S208, the test of whether the device under test is in a stable state is exited. ​

[0074] For example, in a preset time period, the test device cyclically determines whether a first absolute value difference between the current first power sample value and the power reference reference value corresponding thereto is less than or equal to a first preset power deviation value, if yes, the number A is increased by 1; if no, the number A is revalued as 0. For example, when the number A is greater than or equal to the first preset number, it can be determined that the measured device enters a stable state, that is, the test of whether the measured device is in a stable state can be exited; when the number A is less than the first preset number, and the test time is in the preset time period, the measured device can be continuously tested; when the number A is less than the first preset number, and the test time is not in the preset time period, it can be determined that the measured device has not entered a stable state for a long time, that is, the test of whether the measured device is in a stable state can be exited.

[0075] In this way, the test device can automatically determine the state of the measured device, which is beneficial to improve the automation degree of testing the measured device and improve the test efficiency. Moreover, in the case that there are a continuous first preset number of first absolute value differences less than or equal to the first preset power deviation value, it can be determined that the state of the measured device is a stable state, which is beneficial to improve the test accuracy.

[0076] For example, obtaining the power reference reference value corresponding to each first power sample value includes: taking the first first power sample value as the power reference reference value corresponding to the first first power sample value; obtaining a second absolute value difference between the current first power sample value and the power reference reference value corresponding to the previous first power sample value, wherein the first first power sample value is not the current first power sample value; determining the power reference reference value corresponding to the current first power sample value based on the second absolute value difference until the power reference reference value corresponding to all first power sample values is determined.

[0077] In some embodiments, the first first power sample value is taken as the power reference reference value corresponding to the first first power sample value.

[0078] For example, when the measured device is just tested, the power of the measured device may, for example, jump and fluctuate from 0, which is a normal phenomenon. Moreover, based on the first first power sample value P1 of the measured device, there is no previous first power sample value to be used as a power reference reference value, the test device can default that the power reference reference value W1 corresponding to the first first power sample value P1 is the first first power sample value P1, and when subsequently obtaining the power reference reference value corresponding to the first power sample value, the test device can determine it according to the power reference reference value W1 for subsequent determination of the state of the measured device.

[0079] In some embodiments, the test device subtracts the power reference reference value corresponding to the previous first power sample value from the current first power sample value and takes the absolute value to obtain a second absolute value difference between the current first power sample value and the power reference reference value corresponding to the previous first power sample value, wherein the first first power sample value is not the current first power sample value.

[0080] For example, taking the second first power sample value P2 as 104 watts and the power reference reference value W1 as 100 watts, the test device can determine that the second absolute value difference |P2-W1| between the second first power sample value P2 and the power reference reference value W1 is 4 watts; and so on. The test device obtains the second absolute value difference for subsequent determination of the power reference reference value corresponding to the first power sample value.

[0081] In some embodiments, the power reference reference value corresponding to the current first power sample value is determined based on the second absolute value difference until the power reference reference value corresponding to all first power sample values is determined.

[0082] For example, the test device can determine the power reference reference value corresponding to the current first power sample value according to whether the second absolute value difference is within the second preset power deviation range. For example, if the second absolute value difference is within the second preset power deviation range, the test device can determine that the power reference reference value corresponding to the current first power sample value does not need to be adjusted, and the power reference reference value corresponding to the current first power sample value is maintained as the power reference reference value corresponding to the previous first power sample value; if the second absolute value difference is not within the second preset power deviation range, the test device can determine that the power reference reference value corresponding to the next first power sample value needs to be adjusted. Moreover, in the case that the second absolute value difference is not within the second preset power deviation range, since the second absolute value difference corresponding to the current first power sample value is large, the test device can determine that the difference between the current first power sample value and the previous power sample value is also large, i.e., the power fluctuation of the device under test is large, and the test device can maintain the power reference reference value corresponding to the current first power sample value as the power reference reference value corresponding to the previous first power sample value to reassign the number A of first power sample values with the first absolute value difference less than or equal to the first preset power deviation value to 0. Of course, it is not limited thereto, for example, the test device can also determine the power reference reference value corresponding to the current first power sample value as a no-power reference reference value, so as to subsequently determine the state of the device under test according to the no-power reference reference value corresponding to the current first power sample value, reassign the number A of first power sample values with the first absolute value difference less than or equal to the first preset power deviation value to 0, and thus determine the state of the device under test; which is not limited herein.

[0083] In this way, the power reference reference value corresponding to each first power sample value can be automatically obtained for subsequent determination of the state of the device under test, thereby facilitating improvement of the automation degree of testing of the device under test and improvement of the testing efficiency.

[0084] For example, the power reference reference value corresponding to the current first power sample value is determined based on the second absolute value difference, including: comparing the second absolute value difference with a second preset power deviation value; if the second absolute value difference is less than or equal to the second preset power deviation value, the power reference reference value corresponding to the previous first power sample value is taken as the power reference reference value corresponding to the current first power sample value; if the second absolute value difference is greater than the second preset power deviation value, the current first power sample value is taken as the power reference reference value corresponding to the first power sample value obtained by the next sampling.

[0085] In some embodiments, the test device compares the second absolute value difference with the second preset power deviation value by judging whether the second absolute value difference is less than or equal to the second preset power deviation value.

[0086] For example, taking the second preset power deviation value ΔPj as 6 watts, the second preset power deviation range corresponding to the second preset power deviation value ΔPj is [-6 watts, 6 watts]. Based on this, if the second absolute value difference |P2-W1| is 4 watts, the test device can determine that the second absolute value |P2-W1| is less than ΔPj; if the second absolute value difference |P2-W1| is 6 watts, the test device can determine that the second absolute value |P2-W1| is equal to ΔPj; if the second absolute value difference |P2-W1| is 8 watts, the test device can determine that the second absolute value |P2-W1| is greater than ΔPj; and so on. By comparing the second absolute value difference with the second preset power deviation value, the test device can determine whether the power reference reference value corresponding to the first power sample value needs to be adjusted according to the comparison result, thereby facilitating improvement of the accuracy of determination of the power reference reference value corresponding to the first power sample value.

[0087] In some embodiments, if the second absolute value difference is less than or equal to the second preset power deviation value, the power reference reference value corresponding to the previous first power sample value is taken as the power reference reference value corresponding to the current first power sample value.

[0088] For example, taking the second preset power deviation value ΔPj as 6 watts and the second absolute value difference |P2-W1| as 4 watts, it can be determined that the second absolute value difference |P2-W1| is less than or equal to the second preset power deviation value ΔPj, and the test device can take the power reference reference value W1 corresponding to the previous first power sample value as the power reference reference value corresponding to the current first power sample value, which is equivalent to determining the power reference reference value W2 corresponding to the second first power sample value P2, and at this time, W2=W1; and so on.

[0089] In some embodiments, if the second absolute value difference is greater than the second preset power deviation value, the current first power sample value is taken as the power reference value corresponding to the first power sample value obtained by the next sampling.

[0090] For example, taking the second preset power deviation value ΔPj as 6 watts and the second absolute value difference |P2-W1| as 8 watts, it can be determined that the second absolute value difference |P2-W1| is greater than the second preset power deviation value ΔPj, and the test equipment can take the current first power sample value, i.e., the second first power sample value P2, as the power reference value corresponding to the first power sample value obtained by the next sampling, which is equivalent to determining the power reference value W3 corresponding to the third first power sample value P3. At this time, W3=P2; and the same applies to the subsequent steps.

[0091] In this way, the power reference value W2 corresponding to the second first power sample value P2 can still be maintained as the power reference value W1, so that the test equipment can reassign the number A of first power sample values whose first absolute value difference is less than or equal to the first preset power deviation value to 0 according to the first absolute value difference |P2-W2| between the second first power sample value P2 and the power reference value W2. Alternatively, the power reference value W2 corresponding to the second first power sample value P2 can be determined as unobtainable, so that the test equipment can reassign the number A of first power sample values whose first preset power deviation value to 0 according to the first absolute value difference |P2-W2| between the second first power sample value P2 and the power reference value W2.

[0092] In this way, the power reference value corresponding to each first power sample value can be determined in a timely manner, or the power reference value corresponding to the first power sample value obtained by the next sampling can be adjusted in a timely manner, so as to improve the accuracy of determining the power reference value and thus improve the accuracy of determining the state of the device under test.

[0093] For example, the target power reference value of the device under test in the stable state is obtained by taking the power reference value corresponding to the first power sample value of the device under test in the stable state as the target power reference value of the device under test in the stable state.

[0094] For example, in the initial stage of determining that the state of the device under test is the stable state, since there is no last target power reference value of the device under test in the stable state as the target power reference value, the test device can default the power reference value corresponding to the first power sampling value of the device under test in the stable state as the target power reference value of the device under test in the stable state. For example, before the test device determines that the state of the device under test is the stable state, the power reference value corresponding to the last first power sampling value Pn is 200 watts Wn, and then the test device can determine that the target power reference value D of the device under test in the stable state is 200 watts according to the power reference value Wn of 200 watts. In this way, the test device can obtain the corresponding target power reference value to perform power verification on the device under test in the initial stage of performing power verification on the device under test, which is beneficial to maintain the normal operation of the power verification on the device under test.

[0095] For example, the power verification on the device under test based on the target power reference value and the output of the verification result includes: obtaining the second power sampling value of the device under test every second preset time interval until the second preset number of target second power sampling values are obtained, wherein the third absolute value difference between each target second power sampling value and the target power reference value is less than or equal to the third preset power deviation value; obtaining the average power value of all target second power sampling values, and updating the target power reference value to the average power value; continuing to perform power verification on the device under test until the verification time ends; obtaining the verification start time, the verification end time, the verification total number, and each second power sampling value and the sampling time corresponding to each second power sampling value in the verification process to output the verification result.

[0096] In some embodiments, the second preset time interval is 5 seconds, for example, and the test device obtains the second power sampling value of the device under test every 5 seconds. Moreover, the test device can compare the current second power sampling value with the target power reference value after obtaining each second power sampling value, for example, subtract the target power reference value from the second power sampling value to determine the difference between the second power sampling value and the target power reference value, and compare the difference between the second power sampling value and the target power reference value with the third preset power deviation value.

[0097] For example, the target power reference reference value D is 200 W, the first second power sample value Q1 is 201 W, the second second power sample value Q2 is 203 W, the third second power sample value Q3 is 206 W, the fourth second power sample value Q4 is 204 W, the third preset power deviation value ΔPk is 5 W, and the third preset power deviation range corresponding to the third preset power deviation value ΔPk is [-5 W, 5 W]. Based on this, the difference Q1-D is 1 W, the difference Q2-D is 3 W, the difference Q3-D is 6 W, and the difference Q4-D is 4 W. It can be determined that the difference Q1-D, the difference Q2-D, and the difference Q4-D are third absolute value differences, so that the first second power sample value Q1, the second second power sample value Q2, and the fourth second power sample value Q4 are target second power sample values. If the second preset number is 3, the test equipment can obtain the average power value of the first second power sample value Q1, the second second power sample value Q2, and the fourth second power sample value Q4, and update the target power reference reference value D to the average power value, that is, D=(201+203+204)÷3=202.7 W.

[0098] In this way, during the power verification of the test equipment on the device under test until the end of the verification time, the test equipment can update the target power reference reference value in a timely manner according to the fluctuation of the second power sample value, so as to more accurately obtain the power fluctuation of the device under test in a stable state according to the third absolute value difference between the second power sample value and the target reference reference value, and improve the accuracy of testing the device under test.

[0099] In some embodiments, the test equipment can output a verification result of the verification start time, the verification end time, the total number of verifications, and each second power sample value and the sampling time corresponding to each second power sample value in the verification process. The user can determine whether the device under test needs maintenance and the like through the corresponding verification result of the device under test. Through the output of the verification result, it is beneficial to reduce the test process of the user on the device under test, and improve the test efficiency of the device under test.

[0100] For example, the test method further comprises: calculating the difference between the second power sample value and the target power reference reference value; when it is determined that the absolute value of the difference is greater than the third preset power deviation value, marking the second power sample value as an abnormal power sample value, and updating the abnormal number.

[0101] For example, the target power reference reference value D is 200 watts, the third second power sampling value Q3 is 206 watts, and the third preset power deviation value ΔPk is 5 watts. The difference between the third second power sampling value Q3 and the target power reference reference value D is 6 watts, which is greater than the third preset power deviation value ΔPk. Therefore, the test device marks the third second power sampling value Q3 as an abnormal power sampling value, and the number of abnormalities is increased by 1. By analogy. At the end of the verification time, the user can view the second power sampling value marked as an abnormal power sampling value, for example, to determine whether the third preset power deviation value ΔPk is reasonable. If not, the third preset power deviation value can be adjusted according to the second power sampling value marked as an abnormal power sampling value when testing the device under test in the future. Of course, it is not limited to this, and is not limited herein. In this way, it is beneficial to improve the convenience of the user to adjust the third preset power deviation value, thereby improving the user experience.

[0102] In an exemplary embodiment, the number B of target second power sampling values and the number C of abnormalities can be counted.

[0103] As shown in Figure 3 The test method involves the following steps:

[0104] S301, the test device takes the power reference reference value corresponding to the first power sampling value of the device under test in the stable state as the target power reference reference value of the device under test in the stable state;

[0105] S302, the second power sampling value of the device under test is obtained every second preset time length;

[0106] S303, the absolute value of the difference between the current second power sampling value and the target power reference reference value is calculated;

[0107] S304, determine whether the absolute value of the difference is less than or equal to the third preset power deviation value, if yes, jump to S305, if no, jump to S306;

[0108] S305, determine that the current second power sampling value is a target second power sampling value, the sum of the target second power sampling values is increased by the target second power sampling value, and the number B of target second power sampling values is increased by 1;

[0109] S306, mark the current second power sampling value as an abnormal power sampling value, and the number C of abnormalities is increased by 1;

[0110] S307, determine whether the number B is greater than or equal to the second preset number, if yes, jump to S308, if no, jump to S309;

[0111] S308, updating the target power reference reference value to an average power value corresponding to the sum of the target second power sample values, reassigning the sum of the target second power sample values to 0, and reassigning the number B to 0;

[0112] S309, determining whether the time is within the verification time, if yes, jumping to S302, if no, jumping to S310;

[0113] S310, ending the power verification.

[0114] For example, in the verification time, the second power sample value is cyclically obtained, and it is determined whether the obtained second power sample value is the target second power sample value according to the target power reference reference value and the third preset power deviation value, if yes, the sum of the target second power sample values is increased by the target second power sample value, and the number B of the target second power sample values is increased by 1; if no, the second power sample value is marked as an abnormal power sample value, and the number C of the abnormal times is increased by 1. For example, when the number B is greater than or equal to the second preset number, and the time is within the verification time, the average power value corresponding to the current target second power sample value can be obtained by dividing the sum of the current target second power sample values by the number B, so as to update the target power reference reference value, reassign the sum of the target second power sample values to 0, and reassign the number B to 0, so that the target power reference reference value is cyclically updated, and the second power sample value of the measured device is cyclically verified in the verification time; when the number B is less than the second preset number, and the time is within the verification time, the second power sample value of the measured device can be verified according to the target power reference reference value; when the time is not within the verification time, the power verification can be ended.

[0115] In this way, when the test device verifies the power of the measured device in the stable state, the target power reference reference value of the measured device can be automatically adjusted, which is beneficial to improve the test efficiency. At the same time, through the automatic adjustment of the target power reference reference value of the measured device, the abnormal value of the second power sample value of the measured device in the stable state can be more accurately obtained, which is beneficial to improve the test accuracy.

[0116] For example, in the process of sampling the power of the measured device, if the sampled power value is less than the abnormal power value and the continuous number exceeds the abnormal number, the test process is exited.

[0117] With the abnormal power value as 0W and the abnormal number of times as 3, for example, when it is detected that the device under test enters the start test state, the first power sample value of the device under test acquired every first preset time length within a preset time period includes 20W, 50W, 70W, 0W, 0W, 0W, 0W, 0W, the test device can determine that there are 5 continuous abnormal power values, and the continuous number of times exceeds the abnormal number of times, and the test device can exit the test process. Through identification of the abnormal power value and statistics of the abnormal number of times, it can be avoided that the state of the device under test is determined as the stable state according to the continuous first preset number of abnormal power values when the state of the device under test is determined. In this way, the test accuracy can be improved.

[0118] With the abnormal power value as 0W and the abnormal number of times as 3, for example, when it is detected that the device under test enters the start test state, the first power sample value of the device under test acquired every first preset time length within a preset time period includes 20W, 50W, 70W, 0W, 0W, 0W, 0W, 0W, the test device can determine that there are 5 continuous abnormal power values, and the continuous number of times exceeds the abnormal number of times, and the test device can exit the test process. Through identification of the abnormal power value and statistics of the abnormal number of times, it can be avoided that the state of the device under test is determined as the stable state according to the continuous first preset number of abnormal power values when the state of the device under test is determined. In this way, the test accuracy can be improved.

[0119] Of course, the abnormal power value and the abnormal number of times are not limited to this, and are not limited herein.

[0120] Please refer to the above embodiments Figure 4 , Figure 4 is a schematic block diagram of an electronic device 400 provided by an embodiment of the present application. The electronic device 400 can be used to perform power stability testing on a device under test. The electronic device 400 includes a processor 401 and a memory 402.

[0121] For example, the processor 401 and the memory 402 are connected by a system bus 403, such as an I 2 C (Inter-integrated Circuit) bus.

[0122] Specifically, the processor 401 can be a microcontroller unit (MCU), a central processing unit (CPU), or a digital signal processor (DSP), etc.

[0123] Specifically, the memory 402 can be a Flash chip, a read-only memory (ROM) disk, an optical disk, a U disk, or a mobile hard disk, etc.

[0124] The processor 401 is configured to invoke the computer program stored in the memory 402 and execute the foregoing test method when invoking the computer program.

[0125] For example, the processor 401 is configured to invoke the computer program stored in the memory 402 and execute the following steps when invoking the computer program:

[0126] When it is detected that the device under test enters a start test state, a first power sample value of the device under test is obtained every first preset time interval within a preset time period.

[0127] A power reference reference value corresponding to each first power sample value is obtained.

[0128] Each first power sample value is compared with the power reference reference value corresponding thereto to determine the state of the device under test.

[0129] When it is determined that the device under test is in a stable state, a target power reference reference value of the device under test in the stable state is obtained.

[0130] The device under test is subjected to power verification based on the target power reference reference value, and a verification result is output.

[0131] The specific principles and implementation manners of the electronic device provided in the embodiments of the present application are similar to the test method of the foregoing embodiments, and will not be described herein.

[0132] Please refer to Figure 5 , Figure 5 is a schematic block diagram of the energy storage device 500 provided in the embodiments of the present application. The energy storage device 500 includes a battery module 501 and a processor 502. The processor 502 is configured to execute the foregoing test method to perform power stability test on the battery module 501.

[0133] For example, the processor 502 is configured to execute the following steps:

[0134] When it is detected that the device under test enters a start test state, a first power sample value of the device under test is obtained every first preset time interval within a preset time period.

[0135] A power reference reference value corresponding to each first power sample value is obtained.

[0136] Each first power sample value is compared with the power reference reference value corresponding thereto to determine the state of the device under test.

[0137] When it is determined that the device under test is in a stable state, a target power reference reference value of the device under test in the stable state is obtained.

[0138] The power of the measured device is checked based on the target power reference benchmark value, and a checking result is output.

[0139] The specific principle and implementation mode of the energy storage device 500 provided in the embodiments of the present application are similar to the test method of the foregoing embodiments, and will not be described here again.

[0140] It should also be understood that the term "and / or" used in the present application and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0141] The above is merely specific embodiments of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present application, and these modifications or replacements should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A test method for performing power stability testing on a device under test, characterized in that, The method comprises the following steps: when it is detected that the device under test enters a start test state, every first preset time interval, a first power sample value of the device under test is obtained within a preset time period; a power reference reference value corresponding to each first power sample value is obtained; each first power sample value is compared with the power reference reference value corresponding thereto to determine the state of the device under test; when it is determined that the device under test is in a stable state, a target power reference reference value of the device under test in the stable state is obtained; the device under test is subjected to power verification based on the target power reference reference value, and a verification result is outputted; the method comprises the following steps: the first first power sample value is taken as the power reference reference value corresponding to the first first power sample value; a second absolute value difference between the current first power sample value and the power reference reference value corresponding to the previous first power sample value is obtained, wherein the first first power sample value is not the current first power sample value; the power reference reference value corresponding to the current first power sample value is determined based on the second absolute value difference until the power reference reference values corresponding to all the first power sample values are determined; the method comprises the following steps: the second absolute value difference is compared with a second preset power deviation value; if the second absolute value difference is less than or equal to the second preset power deviation value, the power reference reference value corresponding to the previous first power sample value is taken as the power reference reference value corresponding to the current first power sample value; if the second absolute value difference is greater than the second preset power deviation value, the current first power sample value is taken as the power reference reference value corresponding to the first power sample value obtained by next sampling.

2. The test method of claim 1, wherein, the method comprises the following steps: a first absolute value difference between each first power sample value and the power reference reference value corresponding thereto is obtained; each first absolute value difference is compared with a first preset power deviation value; if there are continuous first preset number of first absolute value differences that are less than or equal to the first preset power deviation value, it is determined that the device under test enters a stable state; if there are no continuous first preset number of first absolute value differences that are less than or equal to the first preset power deviation value, it is determined that the device under test does not enter a stable state.

3. The test method of claim 1, wherein, the method comprises the following steps: the power reference reference value corresponding to the first power sample value of the device under test in the stable state is taken as the target power reference reference value of the device under test in the stable state.

4. The test method of claim 1, wherein, the method comprises the following steps: acquire a second power sample value of the device under test every second preset time interval until a second preset number of target second power sample values are acquired, wherein a third absolute value difference between each target second power sample value and the target power reference baseline value is less than or equal to a third preset power deviation value; acquire an average power value of all the target second power sample values, and update the target power reference baseline value to the average power value; continue to perform power calibration on the device under test until the calibration time ends; acquire a calibration start time, a calibration end time, a total number of calibrations, and each second power sample value and a sampling time corresponding to each second power sample value in the calibration process, and output the calibration result.

5. The test method of claim 4, wherein, The test method further comprises: calculating a difference value between the second power sample value and the target power reference baseline value; when it is determined that an absolute value of the difference value is greater than the third preset power deviation value, marking the second power sample value as an abnormal power sample value, and updating an abnormal number of times.

6. The test method of any one of claims 1 to 5, wherein, The test method further comprises: during the process of performing power sampling on the device under test, if a sampled power value is less than an abnormal power value and a continuous number of times exceeds a preset abnormal number of times, then the test flow is exited.

7. An electronic device, comprising: The electronic device comprises a processor and a memory, the memory stores a computer program, and the processor calls the computer program stored in the memory to execute the test method of any one of claims 1 to 6.

8. An energy storage device, characterized by, The energy storage device comprises a battery module and a processor, and the processor is used to execute the test method of any one of claims 1 to 6 to perform power stability testing on the battery module.

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