A cross-scale industrial surface defect detection method and system
By combining Blob analysis and Homography estimation neural networks, a cross-scale industrial surface defect detection method has been developed, which solves the problems of high computational cost and weak robustness in existing technologies and achieves efficient identification and detection of small-scale defects.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GUANGDONG POLYTECHNIC NORMAL UNIV
- Filing Date
- 2023-04-03
- Publication Date
- 2026-06-19
AI Technical Summary
Existing industrial surface defect detection methods are computationally intensive, have weak robustness, and low detection efficiency, especially in effectively identifying small-sized defects among multi-scale defects.
By employing the Blob analysis algorithm combined with the Homography estimation neural network for image feature extraction and alignment calibration, and combining it with a sliding window for noise filtering, cross-scale industrial surface defect detection is achieved.
It improves the ability to identify small-scale defects, enhances the robustness and generalization ability of the method, and improves detection efficiency.
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Figure CN116563325B_ABST