A method and apparatus for optimizing an optical module

Abstract

The application relates to the technical field of communication, and provides a method and device for optimizing an optical module. The method comprises the following steps: in an initial state, adjusting a bias current until actual optical power meets a first preset requirement, adjusting a TEC voltage until actual wavelength meets a second preset requirement, and taking the adjusted TEC voltage as a first TEC voltage; taking the state after the last round of adjustment as the initial state of the next round of iteration; establishing a first relationship between the bias current and temperature after final adjustment and a second relationship between the TEC voltage and temperature after final adjustment; and adjusting according to the first relationship and the second relationship. When the adjustment of the bias current and the adjustment of the TEC voltage both affect the optical power and the wavelength, the first relationship between the bias current and the temperature and the second relationship between the TEC voltage and the wavelength are accurately quantified, so that the optical module can still ensure that the optical power and the wavelength are qualified under high and low temperature conditions.

Description

Technical Field

[0001] This invention relates to the field of communication technology, and in particular to a method and apparatus for optimizing optical modules. Background Technology

[0002] Dense wavelength division multiplexing (DWDM) is a core technology in optical communication. Different wavelengths of optical signals can be multiplexed and transmitted on the same optical fiber, significantly improving communication bandwidth and capacity while also saving costs. One current 5G technology approach is to use DWDM modules on existing links to achieve the required speeds. However, this requires higher specifications for parameters such as optical power and sensitivity compared to conventional optical modules. Furthermore, because the wavelength spacing between different channels in DWDM is only 0.8 nm, crosstalk can easily occur when the channel wavelength shifts or the spectral width broadens. Therefore, it places high demands on the wavelength stability and spectral width of the signal source. Typically, the wavelength tolerance of DWDM optical modules across the entire temperature range is only ±0.04 nm.

[0003] However, in practical applications, although the temperature of the TOSA (Transmitter Optical Subassembly) die in an optical module can be kept constant due to manufacturing processes, the die temperature controlled by the TEC (Thermoelectric Cooler) is not strictly constant with respect to the external temperature. Combined with the stress caused by temperature, this results in deviations in the optical power, sensitivity, and wavelength of the emitted optical signal under high and low temperature conditions. This is especially true for TOSAs using TO packages, which have a three-section structure with numerous laser-welded sections. Under industrial operating conditions, their optical power and sensitivity are prone to variation, and wavelength deviations can easily exceed the tolerance value of ±0.04nm.

[0004] Therefore, overcoming the shortcomings of the existing technology is an urgent problem to be solved in this technical field. Summary of the Invention

[0005] The technical problem that this invention aims to solve is that the optical power and wavelength of the optical signal emitted by the optical module will deviate under high and low temperature conditions, causing them to exceed the tolerance value and fail to meet the requirements of the optical module.

[0006] The present invention adopts the following technical solution:

[0007] In a first aspect, the present invention provides a method for optimizing an optical module, which involves performing multiple rounds of single-iteration under corresponding high-temperature or low-temperature conditions. In each round of single-iteration, the method includes:

[0008] In the first initial state, the bias current is adjusted until the actual optical power meets the first preset requirement, and the adjusted bias current is used as the first bias current. The TEC voltage is adjusted until the actual wavelength meets the second preset requirement, and the adjusted TEC voltage is used as the first TEC voltage.

[0009] The state after the previous round of adjustment is used as the first initial state for the next round. The next round is iterated once until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement.

[0010] The first bias current obtained after final adjustment is used as the target bias current, and a first relationship between the target bias current and temperature is established. The first TEC voltage obtained after final adjustment is used as the target TEC voltage, and a second relationship between the target TEC voltage and temperature is established. This is so that the bias current can be adjusted according to the first relationship and the TEC voltage can be adjusted according to the second relationship.

[0011] Preferably, the first preset requirement for the next iteration is determined based on the number of iterations already performed, specifically including:

[0012] When the number of iterations is no greater than the first preset number of iterations, the first preset requirement is that the difference between the actual optical power and the preset optical power is less than the first preset difference.

[0013] When the number of iterations is greater than the first preset number but not greater than the second preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is less than the second preset difference.

[0014] When the number of iterations is greater than the second preset number, the second preset number is when the difference between the actual optical power and the preset optical power is less than the third preset difference.

[0015] Preferably, the second preset requirement is that the deviation between the actual wavelength and the preset wavelength is within ±0.04nm.

[0016] Preferably, the high temperature condition is within the range of greater than 25°C and less than or equal to 85°C, and the low temperature condition is within the range of less than 25°C and greater than or equal to -40°C.

[0017] Secondly, the present invention also provides a method for optimizing an optical module, which involves performing multiple rounds of secondary iterations under corresponding high-temperature or low-temperature conditions. In each round of secondary iterations, the method includes:

[0018] In the second initial state, the voff voltage is adjusted until the actual sensitivity meets the third preset requirement. The adjusted voff voltage is used as the first voff voltage. Under the first voff voltage condition, the multi-round one-time iteration is performed.

[0019] If the number of iterations is greater than the first preset number of iterations, then the state after the previous round of two iterations is used as the second initial state for the next round, and the next round of two iterations is carried out until the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement, and the actual wavelength meets the second preset requirement.

[0020] Using the first bias current obtained through final adjustment as the target bias current, a first relationship between the target bias current and temperature is established. Using the first TEC voltage obtained through final adjustment as the target TEC voltage, a second relationship between the target TEC voltage and temperature is established. Using the first voff voltage obtained through final adjustment as the target voff voltage, a third relationship between the target voff voltage and temperature is established. This facilitates the adjustment of the bias current based on the first relationship, the adjustment of the TEC voltage based on the second relationship, and the adjustment of the voff voltage based on the third relationship.

[0021] Preferably, based on the number of rounds that have undergone two iterations, the third preset requirement for the next round of two iterations is determined, specifically including:

[0022] When the number of iterations does not exceed the third preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than the fourth preset difference.

[0023] When the number of iterations exceeds the third preset number but does not exceed the fourth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than the fifth preset difference.

[0024] When the number of iterations exceeds the fourth preset number but does not exceed the fifth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than the sixth preset difference.

[0025] Preferably, the number of iterations is recounted each time a second iteration is performed.

[0026] Preferably, before performing multiple rounds of secondary iterations, the method further includes:

[0027] Under normal temperature conditions, find the initial bias current, initial TEC voltage, and initial voff voltage corresponding to the actual optical power meeting the first preset requirement, the actual wavelength meeting the second preset requirement, and the actual sensitivity meeting the third preset requirement;

[0028] Adjust the voff voltage to the initial voff voltage, adjust the bias current to the initial bias current, and adjust the TEC voltage to the initial TEC voltage to obtain the second initial state of the first round, so as to perform the second iteration of the first round.

[0029] Preferably, when the number of iterations exceeds the second preset number of iterations, the establishment of the first, second, and third relationships fails, and the optical module test is unqualified.

[0030] Thirdly, the present invention also provides a method and apparatus for optimizing an optical module, for implementing the method for optimizing an optical module as described in the first aspect, the apparatus comprising:

[0031] At least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the method for optimizing the optical module as described in the first aspect.

[0032] Fourthly, the present invention also provides a non-volatile computer storage medium storing computer-executable instructions that are executed by one or more processors to perform the method for optimizing the optical module described in the first aspect.

[0033] This invention, through multiple iterative adjustments, enables the accurate quantification of the first relationship between bias current and temperature, and the second relationship between TEC voltage and wavelength, even when both the adjustment of bias current and TEC voltage affect optical power and wavelength. This provides a basis for compensating bias current and TEC voltage under high and low temperature conditions, ensuring that the optical module can still achieve qualified optical power and wavelength under these conditions. Attached Figure Description

[0034] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments of the present invention will be briefly described below. Obviously, the drawings described below are merely some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without any creative effort.

[0035] Figure 1 This is a flowchart illustrating a method for optimizing an optical module according to an embodiment of the present invention;

[0036] Figure 2 This is a flowchart illustrating another method for optimizing an optical module provided in an embodiment of the present invention;

[0037] Figure 3 This is a flowchart illustrating another method for optimizing an optical module provided in an embodiment of the present invention;

[0038] Figure 4 This is a schematic diagram of a third relationship formed by a method for optimizing an optical module according to an embodiment of the present invention;

[0039] Figure 5 This is a schematic diagram of the first relationship formed by a method for optimizing an optical module according to an embodiment of the present invention;

[0040] Figure 6 This is a schematic diagram of the second relationship formed by a method for optimizing an optical module according to an embodiment of the present invention;

[0041] Figure 7 This is a flowchart illustrating a method for optimizing an optical module according to an embodiment of the present invention;

[0042] Figure 8 This is a flowchart illustrating a method for optimizing an optical module according to an embodiment of the present invention;

[0043] Figure 9 This is a schematic diagram of the architecture of an optimized optical module provided in an embodiment of the present invention. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0045] Furthermore, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0046] Example 1:

[0047] In existing technologies, the optical power and wavelength of the optical signal emitted by optical modules deviate under high and low temperature conditions, exceeding tolerance limits and failing to meet the requirements of the optical module. To address this issue, Embodiment 1 of this invention provides a method for optimizing optical modules. The method includes: performing multiple iterations under corresponding high-temperature or low-temperature conditions. The high-temperature and low-temperature conditions refer to ambient temperatures, and are relative to normal temperatures. In practical application scenarios, normal temperature can be 25°C, high-temperature conditions are within the range of greater than 25°C and less than or equal to 85°C, and low-temperature conditions are within the range of less than 25°C and greater than or equal to -40°C. For example, high-temperature conditions can be 85°C, and low-temperature conditions can be -40°C. In each iteration, such as... Figure 1 As shown, the method includes:

[0048] In step 201, in the first initial state, the bias current is adjusted until the actual optical power meets the first preset requirement, and the adjusted bias current is used as the first bias current. The TEC voltage is adjusted until the actual wavelength meets the second preset requirement, and the adjusted TEC voltage is used as the first TEC voltage.

[0049] The first and second preset requirements are derived by those skilled in the art based on the needs of the optical module. In practical use, adjusting the bias current primarily affects optical power and has some influence on wavelength, while adjusting the TEC voltage primarily affects wavelength and has some influence on optical power. Therefore, during the adjustment of the bias current, the wavelength also changes, potentially causing the actual wavelength to fail to meet the second preset requirement. Thus, after adjusting the bias current until the actual optical power meets the first preset requirement, the TEC voltage is adjusted. However, during the adjustment of the TEC voltage, the optical power may change again, causing the actual optical power to fail to meet the first preset requirement after adjusting the TEC voltage to the first TEC voltage. Therefore, step 202 is entered for feedback adjustment. Adjusting the bias current until the actual optical power meets the first preset requirement and adjusting the TEC voltage until the actual wavelength meets the second preset requirement both involve adjusting the bias current to the minimum extent possible when the corresponding requirement is not met, so that the adjusted actual optical power just meets the first preset requirement, and then no further adjustment is made.

[0050] In step 202, the state after the previous round of adjustment is used as the first initial state for the next round, and one iteration is performed in the next round until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, ending the multi-round one-time iteration. During the first round of one-time iteration, the first initial state can be set by those skilled in the art based on the characteristics of the optical module. This initial state satisfies the requirement that, under normal temperature conditions, the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. Using the state after the previous round of adjustment as the first initial state for the next round means using the first bias current of the previous round as the bias current before the next round of adjustment, and using the first TEC voltage of the previous round as the TEC voltage before the next round of adjustment.

[0051] In step 203, the first bias current obtained after final adjustment is used as the target bias current, and a first relationship between the target bias current and temperature is established. Similarly, the first TEC voltage obtained after final adjustment is used as the target TEC voltage, and a second relationship between the target TEC voltage and temperature is established. This facilitates the adjustment of the bias current based on the first relationship and the adjustment of the TEC voltage based on the second relationship. Step 203 is not included in the multi-round single iteration; it is executed after the multi-round single iteration is completed.

[0052] In practical applications, the first relationship can be a compensation curve for the target bias current as a function of temperature; the second relationship can be a compensation curve for the TEC voltage as a function of temperature. Alternatively, for high-temperature and low-temperature conditions, corresponding compensation curves for the target bias current as a function of temperature can be found separately, and the two compensation curves under high-temperature and low-temperature conditions can be used together as the first relationship; similarly, for high-temperature and low-temperature conditions, corresponding compensation curves for the TEC voltage as a function of temperature can be found separately, and the two compensation curves under high-temperature and low-temperature conditions can be used together as the second relationship.

[0053] It should be noted that the "previous round" and "next round" mentioned in this embodiment refer to two adjacent iterations. For example, if three iterations have been performed up to a certain time, for ease of description, these three iterations are referred to in chronological order as: the first iteration, the second iteration, and the third iteration. The first iteration is the "previous iteration" of the second iteration, the second iteration is the "next iteration" of the first iteration, the second iteration is the "previous iteration" of the third iteration, and the third iteration is the "next iteration" of the second iteration.

[0054] The first bias current obtained by the final adjustment is the first bias current obtained in the last iteration after multiple rounds of one-time iterations until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. If a total of five rounds of one-time iterations were performed before the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, then the first bias current of the fifth round of one-time iteration is used as the target bias current, and the first TEC voltage of the fifth round of one-time iteration is used as the target TEC voltage.

[0055] In practical use, steps 201 and 202 also have a specific implementation method, such as... Figure 2 As shown, it includes:

[0056] In step 301, in the first initial state, it is determined whether the actual optical power meets the first preset requirement and whether the actual wavelength meets the second preset requirement.

[0057] In step 302, if the actual optical power does not meet the first preset requirement, the bias current is adjusted until the actual optical power meets the first preset requirement. It is then determined whether the actual wavelength meets the second preset requirement after adjustment. If the actual wavelength does not meet the second preset requirement, the adjusted bias current is used as the first bias current, and the TEC voltage is adjusted until the actual wavelength meets the second preset requirement. The adjusted TEC voltage is used as the first TEC voltage. The adjusted state is used as the first initial state, and the process returns to step 301.

[0058] In step 303, if the actual optical power meets the first preset requirement, but the actual wavelength does not meet the second preset requirement, the TEC voltage is adjusted until the actual wavelength meets the second preset requirement. The adjusted TEC voltage is used as the first TEC voltage, and the bias current corresponding to the first initial state is used as the first bias current. The adjusted state is used as the first initial state, and the process returns to step 301.

[0059] In step 304, if it is determined that the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, then one iteration is considered to be over. The bias current corresponding to the first initial state is taken as the first bias current, and the TEC voltage corresponding to the first initial state is taken as the first TEC voltage.

[0060] This embodiment, through multiple iterative adjustments, ensures that even when adjusting the bias current and TEC voltage both affect optical power and wavelength, it can still accurately quantify the first relationship between bias current and temperature, and the second relationship between TEC voltage and wavelength. This provides a basis for compensating bias current and TEC voltage under high and low temperature conditions, ensuring that the optical module can still guarantee qualified optical power and wavelength under high and low temperature conditions.

[0061] In practical application scenarios, the first preset requirement may be that the difference between the actual optical power and the preset optical power is less than the corresponding preset difference or within the corresponding allowable range. The second preset requirement may be that the difference between the actual wavelength and the preset wavelength is less than the corresponding preset difference or within the corresponding allowable range. For example, the second preset requirement is that the deviation between the actual wavelength and the preset wavelength is within ±0.04nm.

[0062] To further optimize the optical power of the optical module and make the actual optical power obtained after adjustment closer to the preset optical power, this embodiment also provides the following preferred implementation method: based on the number of iterations already performed, a first preset requirement is determined for the next iteration. Specifically, this includes: when the number of iterations is not greater than a first preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is less than a first preset difference; when the number of iterations is greater than a first preset number but not greater than a second preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is less than a second preset difference; when the number of iterations is greater than a second preset number, the second preset number is that the difference between the actual optical power and the preset optical power is less than a third preset difference.

[0063] The first and second preset counts are obtained by those skilled in the art based on experience. The preset optical power, first preset difference, second preset difference, and third preset difference are obtained by those skilled in the art based on the requirements of the optical module. The first preset difference is less than the second preset difference, the second preset difference is less than the third preset difference, and all are within the acceptable range of optical power. In actual use, the first preset count can be 2, and the second preset count can be 4.

[0064] This embodiment categorizes the first preset requirements. The fewer the number of iterations, the stricter the constraint on the actual optical power, so that the optical power is as close as possible to the preset optical power. The more the number of iterations, the looser the constraint on the actual optical power, so that the optical power and wavelength are within the corresponding qualified range as much as possible.

[0065] Example 2:

[0066] In practical applications, high and low temperature conditions not only affect optical power and wavelength but also the sensitivity of the optical module, causing the sensitivity to fail to meet the requirements of the optical module. To solve this problem, this embodiment, based on Embodiment 1, provides a method for optimizing the optical module. The method includes: performing multiple rounds of secondary iterations under corresponding high or low temperature conditions, wherein, in each round of secondary iterations, as follows... Figure 3 As shown, the method includes:

[0067] In step 401, in the second initial state, the voff voltage (reverse bias voltage) is adjusted until the actual sensitivity meets the third preset requirement. The adjusted voff voltage is used as the first voff voltage. Under the first voff voltage condition, the multi-round single iteration described in Example 1 is executed. Here, the multi-round single iteration refers to the process described in steps 201-202 of Example 1 (step 203 in Example 1 is not included). Its specific implementation has been described in detail in Example 1 and will not be repeated here. Adjusting the voff voltage until the actual sensitivity meets the third preset requirement means adjusting the voff voltage so that the actual sensitivity exactly meets the third preset requirement.

[0068] Voff voltage is a key parameter affecting laser chirp and dispersion. Voff voltage directly affects laser output power, chirp, extinction ratio (ER), dispersion (DP), output eye diagram margin (MM), and bias current. Extinction ratio, dispersion, output eye diagram margin, and bias current are necessary indicators for evaluating EML lasers and optical modules. Therefore, whether the Voff voltage is reasonable directly affects the quality of the optical module.

[0069] The third preset requirement is derived by those skilled in the art based on the needs of the optical module. In practical use, adjusting the Voff voltage affects sensitivity and optical power, but not wavelength; adjusting the bias current primarily affects optical power and has some influence on wavelength, but no effect on sensitivity; while adjusting the TEC voltage primarily affects wavelength, has some influence on optical power, but no effect on sensitivity. Therefore, adjusting the Voff voltage may cause changes in optical power, making it unable to meet the second preset requirement. Adjusting the bias current to adjust optical power will also affect wavelength. Therefore, after adjusting the Voff voltage until the actual sensitivity meets the third preset requirement, multiple iterations are performed to adjust both optical power and wavelength. If, after multiple iterations (i.e., the number of iterations in step 402 below is greater than the first preset number of iterations), it is still impossible to adjust until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, then step 402 is entered for the next iteration to adjust the Voff voltage, thereby affecting the optical power.

[0070] The first voff voltage condition refers to the fact that in multiple iterations, the corresponding voff voltage is always the first voff voltage. The bias current and TEC voltage before adjustment change according to the number of iterations. The specific method of change has been described in Example 1 and will not be repeated here.

[0071] In step 402, if the number of iterations is greater than the first preset number of iterations, the state after the previous round of two iterations is used as the second initial state for the next round, and the next round of two iterations is carried out until the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement, and the actual wavelength meets the second preset requirement, and the multi-round two iterations end.

[0072] In this process, the number of iterations is recounted for each second iteration. The first preset number of iterations is obtained by those skilled in the art based on experience, and it is usually greater than the second preset number. During the first round of second iterations, the second initial state can be set by those skilled in the art based on the characteristics of the optical module. This initial state satisfies the following conditions under normal temperature: the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement, and the actual wavelength meets the second preset requirement. The state after the previous round of second iterations is used as the second initial state for the next round, specifically including: the first bias current obtained by the final adjustment in the previous round is used as the bias current before the adjustment in the next round; the first TEC voltage obtained by the final adjustment in the previous round is used as the TEC voltage before the adjustment in the next round; and the voff voltage of the previous round is used as the voff voltage after the adjustment in the next round. Here, "previous round" and "next round" refer to the second iteration. When understood in the context of the first iteration, the first TEC voltage obtained by the final adjustment in the previous round is the first TEC voltage of the last first iteration in the previous round of second iterations, and the first bias current obtained by the final adjustment in the previous round is the first bias current of the last first iteration in the previous round of second iterations.

[0073] In step 403, a first bias current obtained through final adjustment is used as the target bias current to establish a first relationship between the target bias current and temperature. A second relationship between the target TEC voltage and temperature is established using the first TEC voltage obtained through final adjustment as the target TEC voltage. A third relationship between the target Voff voltage and temperature is established using the first Voff voltage obtained through final adjustment as the target Voff voltage. This facilitates adjustment of the bias current based on the first relationship, the TEC voltage based on the second relationship, and the Voff voltage based on the third relationship. Step 403 is not included in the multiple rounds of secondary iterations; it is executed after the multiple rounds of secondary iterations have concluded.

[0074] In practical applications, the third relationship can be a compensation curve for the change of Voff voltage with temperature. Alternatively, for high-temperature and low-temperature conditions, corresponding compensation curves for the change of Voff voltage with temperature can be found separately, and the two compensation curves under high-temperature and low-temperature conditions can be used together as the third relationship.

[0075] Extensive experimental testing by those skilled in the art has shown that the changes in sensitivity, optical power, and wavelength with temperature are unidirectional and linear. For example, when the module temperature is above room temperature (e.g., 25°C), the optical power gradually increases with rising temperature, and when it is below room temperature, the optical power gradually decreases with decreasing temperature. That is, the sensitivity, optical power, and wavelength of the optical module all exhibit a univariate functional relationship with changes in external temperature. The adjustable parameters of these three indicators (i.e., the slope of the univariate functional relationship) are normally fixed values. To ensure greater stability of the optical module's sensitivity, optical power, and wavelength, the Voff voltage, bias current, and TEC voltage settings are divided into two segments based on room temperature. Under room temperature conditions, the Voff voltage is as follows: Figure 4 The AF segment in the diagram represents a fixed value, and the bias current is as follows: Figure 5 The IM segment in the figure shows a fixed value, and the TEC voltage is as follows: Figure 6 The PT segment in the figure represents a fixed value. Then, using the method described in this embodiment, compensation curves for voff voltage versus ambient temperature, bias current versus ambient temperature, and TEC voltage versus ambient temperature are obtained through fitting. All of these are fitted as linear curves. Under different temperature conditions, the curves may differ as follows: Figure 4 , Figure 5 and Figure 6 As shown by the dashed line in the image.

[0076] It should be noted that, unless otherwise specified, the terms "previous round" and "next round" in this embodiment refer to two adjacent quadratic iteration processes. For example, if three quadratic iterations have been performed up to a certain time, for ease of description, these three quadratic iterations are referred to in chronological order as: the first quadratic iteration, the second quadratic iteration, and the third quadratic iteration. The first quadratic iteration is the "previous quadratic iteration" of the second quadratic iteration, the second quadratic iteration is the "next quadratic iteration" of the first quadratic iteration, the second quadratic iteration is the "previous quadratic iteration" of the third quadratic iteration, and the third quadratic iteration is the "next quadratic iteration" of the second quadratic iteration.

[0077] The final adjusted first voff voltage is the first voff voltage obtained in the last round of secondary iterations after multiple rounds of secondary iterations, until the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement, and the actual wavelength meets the second preset requirement. If a total of five rounds of secondary iterations were performed before achieving the first preset requirement for actual optical power and the second preset requirement for actual wavelength, then the first bias current of the fifth secondary iteration is used as the target bias current, the first TEC voltage of the fifth secondary iteration is used as the target TEC voltage, and the first voff voltage of the fifth secondary iteration is used as the target voff voltage.

[0078] The target bias current in Example 1 is the final bias current obtained after multiple iterations until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. It needs to be distinguished from the target bias current in this example. Similarly, the target TEC voltage in Example 1 is the final TEC voltage obtained after multiple iterations until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. It needs to be distinguished from the target TEC voltage in this example.

[0079] The terms "first iteration" and "second iteration" are merely used to refer to different iterative processes. The terms "first" and "second" have no special limiting meaning and should not be interpreted as having a special limiting meaning in terms of order or other aspects.

[0080] In practical use, steps 401 and 402 also have a specific implementation method, such as... Figure 7 As shown, it includes:

[0081] In step 501, in the second initial state, it is determined whether the actual sensitivity meets the third preset requirement, whether the actual optical power meets the first preset requirement, and whether the actual wavelength meets the second preset requirement.

[0082] In step 502, if the actual sensitivity does not meet the third preset requirement, the voff voltage is adjusted until the actual sensitivity meets the third preset requirement, and then the process proceeds to step 503; otherwise, the process proceeds directly to step 503.

[0083] In step 503, multiple rounds of one-time iteration are performed until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement, and the second iteration ends; or until the number of one-time iteration rounds is greater than the first preset number of iterations, the state after the last adjustment is used as the second initial state, and the process returns to step 501.

[0084] This embodiment, through multiple iterative adjustments, ensures that even when the adjustment of Voff voltage, bias current, and TEC voltage has a cross-effect on sensitivity, optical power, and wavelength, it can still accurately quantify the first relationship between bias current and temperature, the second relationship between TEC voltage and wavelength, and the third relationship between Voff voltage and temperature. This provides a basis for compensating Voff voltage, bias current, and TEC voltage under high and low temperature conditions, ensuring that the optical module can still meet the requirements for sensitivity, optical power, and wavelength under high and low temperature conditions.

[0085] To further optimize the sensitivity of the optical module and make the actual sensitivity obtained after adjustment closer to the preset sensitivity, this embodiment also provides the following preferred implementation method: based on the number of iterations already performed, a third preset requirement is determined for the next iteration. Specifically, this includes: when the number of iterations does not exceed the third preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than a fourth preset difference; when the number of iterations exceeds the third preset number but does not exceed the fourth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than a fifth preset difference; when the number of iterations exceeds the fourth preset number but does not exceed the fifth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than a sixth preset difference.

[0086] When the number of iterations in the second iteration exceeds the number of iterations in the third iteration, the second iteration ends, and the establishment of the first, second, and third relationships is considered to have failed, resulting in the optical module being deemed unqualified. In practical use, the third preset number of iterations can be 0, the fourth preset number of iterations can be 1, and the fifth preset number of iterations can be 2. The second iteration number is obtained by those skilled in the art based on experience, and it is usually greater than or equal to the fifth preset number of iterations.

[0087] The third, fourth, and fifth preset counts are all obtained by those skilled in the art based on experience. The preset sensitivity, fourth preset difference, fifth preset difference, and sixth preset difference are obtained by those skilled in the art based on the requirements of the optical module. The fourth preset difference is less than the fifth preset difference, the fifth preset difference is less than the sixth preset difference, and all are within the acceptable sensitivity range.

[0088] This embodiment categorizes the third preset requirement. The fewer the number of iterations, the stricter the constraint on the actual sensitivity, so that the sensitivity is as close as possible to the preset sensitivity. The more iterations, the looser the constraint on the actual sensitivity, so that the sensitivity, optical power, and wavelength are all within the corresponding qualified range.

[0089] In practical applications, before performing a second iteration, a second initial state can be obtained based on experiments. That is, before performing multiple rounds of second iterations, the method further includes: under normal temperature conditions, finding the initial bias current, initial TEC voltage, and initial voff voltage corresponding to when the actual optical power meets the first preset requirement, the actual wavelength meets the second preset requirement, and the actual sensitivity meets the third preset requirement; adjusting the voff voltage to the initial voff voltage, adjusting the bias current to the initial bias current, and adjusting the TEC voltage to the initial TEC voltage to obtain the second initial state of the first round for performing the first round of second iterations.

[0090] Example 3:

[0091] This invention is based on the method described in Embodiment 1, and combines it with specific application scenarios, using technical descriptions within those scenarios to illustrate the implementation process of the invention's features. Taking the optimization process of the sensitivity, optical power, and wavelength of the corresponding optical module as an example, it specifically includes:

[0092] First, those skilled in the art analyzed the requirements for the optical module, dividing both sensitivity and optical power specifications into three tiers. The first tier had the highest requirements, while the third tier had the lowest, yet still met the module's specifications. In order of priority, the actual specifications of the optical module might be as follows:

[0093] 1. Sensitivity meets the first-tier requirements, optical power meets the first-tier requirements, and wavelength is qualified.

[0094] 2. Sensitivity meets the first-level requirements, optical power meets the second-level requirements, and wavelength is qualified.

[0095] 3. Sensitivity meets the first-level requirements, optical power meets the third-level requirements, and wavelength is qualified.

[0096] 4. Sensitivity meets the second-tier requirements, optical power meets the first-tier requirements, and wavelength is qualified.

[0097] 5. Sensitivity meets the second-tier requirements, optical power meets the second-tier requirements, and wavelength is qualified.

[0098] 6. Sensitivity meets the second-level requirements, optical power meets the third-level requirements, and wavelength is qualified.

[0099] 7. Sensitivity meets the third-level standard, optical power meets the first-level standard, and wavelength is qualified.

[0100] 8. Sensitivity meets the third-level standard, optical power meets the second-level standard, and wavelength is qualified.

[0101] 9. Sensitivity meets the third-level standard, optical power meets the third-level standard, and wavelength is qualified.

[0102] 10. Unable to be adjusted to pass the test, this optical module fails the test.

[0103] The first, second, and third sensitivity indicators can be understood as the third preset requirement in Embodiment 2. The first indicator is that the difference between the actual sensitivity and the preset sensitivity is less than the fourth preset difference; the second indicator is that the difference between the actual sensitivity and the preset sensitivity is less than the fifth preset difference; and the third indicator is that the difference between the actual sensitivity and the preset sensitivity is less than the sixth preset difference.

[0104] The first, second, and third levels of optical power can be understood as the first preset requirement in Embodiment 1. The first level requirement is that the difference between the actual optical power and the preset optical power is less than the first preset difference; the second level requirement is that the difference between the actual optical power and the preset optical power is less than the second preset difference; and the third level requirement is that the difference between the actual optical power and the preset optical power is less than the third preset difference.

[0105] Determine the relationship curves between the sensitivity, optical power, and wavelength of similar optical modules under normal temperature conditions and external temperature variations. The initial conditions are shown in the attached figure. Figure 4 AF segment, appendix Figure 5 IM segment, appendix Figure 6 The PT segment shown in the figure is a fixed value.

[0106] After setting the sensitivity and optical power levels, based on feedback, when the module's sensitivity, optical power, and wavelength deviation exceed the normal range at three temperature points (room temperature, high temperature, and low temperature), the microcontroller will correct the compensation curve according to the feedback results. The specific steps are as follows: When the optical module is at room temperature (usually 25℃), the sensitivity, optical power, and wavelength are considered acceptable by default. At this time, the Voff voltage, bias current, and TEC voltage are at their initial values. Figure 4 Point D in the middle Figure 5 K point in Figure 6 Point R in the equation corresponds to the second initial state during the first round of secondary iterations in Example 2.

[0107] At high temperatures, the high-temperature compensation curve is corrected. Specifically, the Voff voltage real-time adjustment module judges the sensitivity feedback results from the bit error rate tester. If the sensitivity is qualified, then... Figure 4 If the DF segment is not up to standard, the voff voltage is adjusted and compensated according to the sensitivity until the sensitivity meets the requirements, and the voff voltage curve after DE or DG segment compensation is fitted.

[0108] The real-time bias current adjustment module makes a judgment based on the optical power feedback result measured by the power meter. If the optical power is qualified, then... Figure 5 If the KM segment is not up to standard, the bias current is adjusted and compensated according to the optical power until the optical power meets the requirements, and the bias current curve after compensation for the KL or KN segment is fitted.

[0109] The TEC voltage real-time adjustment module makes a judgment based on the wavelength feedback result measured by the wavelength meter. If the wavelength is qualified, then it adopts... Figure 6If the RT segment is not up to standard, the impact of the modified TEC voltage on the optical power is considered simultaneously according to the wavelength, and the wavelength effect after the bias current adjustment is also included in the calculation. The TEC voltage is adjusted and compensated until the wavelength meets the requirements, and the TEC voltage curve after RS ​​or RU segment compensation is fitted.

[0110] After wavelength adjustment is completed, return to the real-time optical power adjustment module, correct the bias current compensation curve to KL1 or KN1, and then enter the real-time wavelength adjustment module to confirm whether the wavelength is qualified. If it is qualified, the adjustment ends; if it is not qualified, it will automatically enter the debugging stage.

[0111] At this point, the optical module has completed the redrawing of the temperature compensation curves for the three parameters in the high-temperature segment and stored them in the register.

[0112] At low temperatures, the low-temperature compensation curve is corrected. Specifically, at low temperatures, the Voff voltage real-time adjustment module judges based on the sensitivity feedback results from the bit error rate tester. If the sensitivity is qualified, then... Figure 4 If the DA segment is not up to standard, the voff voltage is adjusted and compensated according to the sensitivity until the sensitivity meets the requirements, and the voff voltage curve after DB segment or DC segment compensation is fitted.

[0113] The real-time bias current adjustment module makes a judgment based on the optical power feedback result measured by the power meter. If the optical power is qualified, then... Figure 5 If segment KI is not up to standard, the bias current is adjusted and compensated according to the optical power until the optical power meets the requirements, and the bias current curve after compensation for segment KH or KJ is fitted.

[0114] The TEC voltage real-time adjustment module makes a judgment based on the wavelength feedback result measured by the wavelength meter. If the wavelength is qualified, then it adopts... Figure 6 If the RP segment is not up to standard, the impact of the modified TEC voltage on the optical power is considered simultaneously based on the wavelength, and the wavelength effect after the bias current adjustment is also taken into account. The TEC voltage is adjusted and compensated until the wavelength meets the requirements, and the TEC voltage curve after compensation for the RO or RQ segment is fitted. After the wavelength adjustment is completed, the system returns to the real-time optical power adjustment module to correct the bias current compensation curve to KH1 or KJ1, and then enters the real-time wavelength adjustment module again to confirm whether the wavelength is up to standard. If it is up to standard, the adjustment ends; if it is not up to standard, it automatically enters the debugging stage again. At this point, the optical module has completed the redrawing of the temperature compensation curves for the three parameters in the low-temperature segment and stored them in the register.

[0115] The optical module can obtain stable sensitivity, optical power, and wavelength by calling the compensation curve obtained by refitting under the corresponding temperature conditions through the microcontroller.

[0116] In the actual execution process, the execution flow for obtaining the corresponding fitted compensation curve is as follows: Figure 8 As shown, it specifically includes:

[0117] In step 601, it is determined whether the sensitivity meets the first-level index; if not, the Voff voltage is adjusted until the first-level index is met; the second debugging count (which can be understood as the number of secondary iterations in Example 2) is increased by 1, and the process proceeds to step 604.

[0118] In step 602, it is determined whether the sensitivity meets the second-level index; if not, the Voff voltage is adjusted until the second-level index is met; the second debugging count is increased by 1, and the process proceeds to step 604.

[0119] In step 603, it is determined whether the sensitivity meets the third-level index; if not, the Voff voltage is adjusted until the third-level index is met; the second debugging count is increased by 1, and the process proceeds to step 604.

[0120] In step 604, it is determined whether the optical power meets the first-level index; if not, the bias current is adjusted until the first-level index is met, the first debugging count (i.e., the number of iterations in Example 1) is increased by 1, and the process proceeds to step 607.

[0121] In step 605, it is determined whether the optical power meets the second-level specification; if not, the bias current is adjusted until the second-level specification is met, the first debugging count is increased by 1, and the process proceeds to step 607.

[0122] In step 606, it is determined whether the optical power meets the third-level specification; if not, the bias current is adjusted until the third-level specification is met, the first debugging count is increased by 1, and the process proceeds to step 607.

[0123] In step 607, it is determined whether the wavelength is qualified. If it is not qualified, the TEC voltage is adjusted until the wavelength is qualified; proceed to step 608; if it is qualified, the debugging ends. At this time, the corresponding TEC voltage is the target TEC voltage, the bias current is the target bias current, and the voff voltage is the target voff voltage; thus, the corresponding compensation curve is established.

[0124] In step 608, it is determined whether the first debugging count is greater than 6 times (i.e., the first preset iteration count). If it is greater than 6 times, the first debugging count is reset to zero and the count is restarted, and the process proceeds to step 610; otherwise, the process proceeds to step 609.

[0125] In step 609, it is determined whether the first number of debugging attempts is greater than 4 (i.e., the second preset number of attempts). If it is greater than 4, proceed to step 606; otherwise, it is determined whether the first number of debugging attempts is greater than 2 (i.e., the first preset number of attempts). If the first number of debugging attempts is not greater than 4 but greater than 2, proceed to step 605; otherwise, proceed to step 604.

[0126] In step 610, it is determined whether the second debugging count is greater than 1 (i.e., the fourth preset count). If the second debugging count is not greater than 1, proceed to step 602; otherwise, it is determined whether the second debugging count is greater than 2 (i.e., the fifth preset count). If the second debugging count is greater than 1 and not greater than 2, proceed to step 603; otherwise, if the second debugging count is greater than 2, the debugging ends, the corresponding compensation curve cannot be obtained, and the optical module test fails. The third preset count is 0. Whenever step 601, step 602, or step 603 is entered, the second debugging count is greater than 0, so no additional judgment is needed.

[0127] Example 4:

[0128] Following the methods for optimizing optical modules described in Embodiment 1 and Embodiment 2, this invention also provides an apparatus for optimizing optical modules, the apparatus comprising:

[0129] At least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the method described in Embodiment 1, Embodiment 2, or Embodiment 3.

[0130] In specific application scenarios, the device includes a temperature detection module, a sensitivity monitoring module, an optical power monitoring module, a wavelength monitoring module, a real-time Voff voltage adjustment module, a real-time bias current adjustment module, and a real-time TEC voltage adjustment module. The temperature detection module detects the external operating temperature of the optical module. The sensitivity monitoring module detects the sensitivity shift of the optical module under high and low temperature conditions and provides feedback to the Voff voltage adjustment module. The optical power monitoring module detects the optical power shift of the optical module under high and low temperature conditions and provides feedback to the bias current adjustment module. The wavelength monitoring module detects the wavelength shift of the optical module under high and low temperature conditions and provides feedback to the TEC voltage adjustment module. The Voff voltage adjustment module, bias current adjustment module, and TEC voltage adjustment module sample the current flowing through the thermistor to monitor the ambient temperature in real time and calculate the Voff voltage, bias current, and TEC voltage in real time based on the temperature compensation curve. Responding to feedback from the sensitivity, optical power, and wavelength monitoring modules at normal temperature, high temperature, and low temperature, the device adjusts the temperature compensation curve in real time and divides sensitivity and optical power into three performance levels, prioritizing the optimal performance level.

[0131] like Figure 9 The diagram shown is an architectural schematic of an optimized optical module device according to an embodiment of the present invention. The optimized optical module device of this embodiment includes one or more processors 21 and a memory 22. Figure 9 Take a processor 21 as an example.

[0132] Processor 21 and memory 22 can be connected via a bus or other means. Figure 9 Taking the example of a connection between China and Israel via a bus.

[0133] The memory 22, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs and non-volatile computer-executable programs, such as the method for optimizing the optical module in Embodiment 1. The processor 21 executes the method for optimizing the optical module by running the non-volatile software program and instructions stored in the memory 22.

[0134] Memory 22 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 22 may optionally include memory remotely located relative to processor 21, which can be connected to processor 21 via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0135] The program instructions / modules are stored in the memory 22 and, when executed by one or more processors 21, perform the method for optimizing the optical module described in Embodiment 1.

[0136] It is worth noting that the information interaction and execution process between the modules and units in the above-mentioned device and system are based on the same concept as the processing method embodiment of the present invention. For details, please refer to the description in the method embodiment of the present invention, and will not be repeated here.

[0137] Those skilled in the art will understand that all or part of the steps in the various methods of the embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, which may include: read-only memory (ROM), random access memory (RAM), magnetic disk or optical disk, etc.

[0138] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for optimizing an optical module, characterized in that, Under corresponding high-temperature or low-temperature conditions, multiple rounds of single-iteration are performed. In each round of single-iteration, the method includes: In the first initial state, the bias current is adjusted until the actual optical power meets the first preset requirement, and the adjusted bias current is used as the first bias current. The TEC voltage is adjusted until the actual wavelength meets the second preset requirement, and the adjusted TEC voltage is used as the first TEC voltage. The state after the previous round of adjustment is used as the first initial state for the next round. The next round is iterated once until the actual optical power meets the first preset requirement and the actual wavelength meets the second preset requirement. The first bias current obtained after final adjustment is used as the target bias current, and a first relationship between the target bias current and temperature is established. The first TEC voltage obtained after final adjustment is used as the target TEC voltage, and a second relationship between the target TEC voltage and temperature is established. This is so that the bias current can be adjusted according to the first relationship and the TEC voltage can be adjusted according to the second relationship. The high temperature conditions are within the range of greater than 25°C and less than or equal to 85°C, and the low temperature conditions are within the range of less than 25°C and greater than or equal to -40°C.

2. The method for optimizing an optical module according to claim 1, characterized in that, Based on the number of iterations already performed, determine the first preset requirement for the next iteration, specifically including: When the number of iterations is no greater than the first preset number of iterations, the first preset requirement is that the difference between the actual optical power and the preset optical power is less than the first preset difference. When the number of iterations is greater than the first preset number but not greater than the second preset number, the first preset requirement is that the difference between the actual optical power and the preset optical power is less than the second preset difference. When the number of iterations is greater than the second preset number, the second preset number is when the difference between the actual optical power and the preset optical power is less than the third preset difference.

3. The method for optimizing an optical module according to claim 1 or 2, characterized in that, The second preset requirement is that the deviation between the actual wavelength and the preset wavelength is within ±0.04nm.

4. A method for optimizing an optical module, characterized in that, Under appropriate high or low temperature conditions, multiple rounds of secondary iterations are performed. In each round of secondary iterations, the method includes: In the second initial state, the voff voltage is adjusted until the actual sensitivity meets the third preset requirement. The adjusted voff voltage is used as the first voff voltage. Under the first voff voltage condition, the multi-round one-time iteration as described in any one of claims 1-3 is performed; wherein, the voff voltage is a reverse bias voltage. If the number of iterations is greater than the first preset number of iterations, then the state after the previous round of two iterations is used as the second initial state for the next round, and the next round of two iterations is carried out until the actual sensitivity meets the third preset requirement, the actual optical power meets the first preset requirement, and the actual wavelength meets the second preset requirement. Using the first bias current obtained through final adjustment as the target bias current, a first relationship between the target bias current and temperature is established. Using the first TEC voltage obtained through final adjustment as the target TEC voltage, a second relationship between the target TEC voltage and temperature is established. Using the first voff voltage obtained through final adjustment as the target voff voltage, a third relationship between the target voff voltage and temperature is established. This facilitates the adjustment of the bias current based on the first relationship, the adjustment of the TEC voltage based on the second relationship, and the adjustment of the voff voltage based on the third relationship. The high temperature conditions are within the range of greater than 25°C and less than or equal to 85°C, and the low temperature conditions are within the range of less than 25°C and greater than or equal to -40°C.

5. The method for optimizing an optical module according to claim 4, characterized in that, Based on the number of rounds of the second iteration already performed, determine the third pre-defined requirement for the next round of the second iteration, specifically including: When the number of iterations does not exceed the third preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than the fourth preset difference. When the number of iterations exceeds the third preset number but does not exceed the fourth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than the fifth preset difference. When the number of iterations exceeds the fourth preset number but does not exceed the fifth preset number, the third preset requirement is that the difference between the actual sensitivity and the preset sensitivity is less than the sixth preset difference.

6. The method for optimizing an optical module according to claim 4, characterized in that, Each time a second iteration is performed, the number of iterations in the first iteration is recounted.

7. The method for optimizing an optical module according to claim 4, characterized in that, Before performing multiple rounds of secondary iterations, the method further includes: Under normal temperature conditions, find the initial bias current, initial TEC voltage, and initial voff voltage corresponding to the actual optical power meeting the first preset requirement, the actual wavelength meeting the second preset requirement, and the actual sensitivity meeting the third preset requirement; Adjust the voff voltage to the initial voff voltage, adjust the bias current to the initial bias current, and adjust the TEC voltage to the initial TEC voltage to obtain the second initial state of the first round, so as to perform the second iteration of the first round.

8. The method for optimizing an optical module according to claim 4, characterized in that, When the number of iterations exceeds the second preset number of iterations, the establishment of the first, second, and third relationships fails, and the optical module test is unqualified.

9. An apparatus for optimizing an optical module, characterized in that, The device includes: At least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor for performing the method of optimizing an optical module according to any one of claims 1-3 or the method of optimizing an optical module according to any one of claims 4-8.

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