Digital high and low temperature test chamber

Abstract

This application discloses a digital high and low temperature test chamber, which includes: a chamber body, a heating system, a refrigeration system, a humidification system, a control system, a host computer remote operating system, and a wireless communication module. The chamber body includes multiple basic components. The control system is used to control the digital high and low temperature test chamber by completing multiple preset programs to conduct various types of high and low temperature environment tests. The host computer remote operating system is used to acquire test information from the digital high and low temperature test chamber via wireless transmission, record, summarize, and store the test information, and remotely control the digital high and low temperature test chamber. The remote operations performed by the host computer remote operating system include, but are not limited to, modifying test conditions and adjusting for abnormal states. This test chamber can reduce the workload of staff and improve testing efficiency.

Description

Technical Field

[0001] This application relates to the field of equipment testing technology, and in particular to a digital high and low temperature test chamber. Background Technology

[0002] Currently, high and low temperature environmental testing is a crucial part of the inspection of explosion-proof equipment. The requirements for this testing are also gradually increasing. In related technologies, samples such as electrical equipment to be tested are typically placed in a high and low temperature test chamber to conduct heat and cold resistance tests.

[0003] However, due to design flaws and other reasons, prolonged operation of high and low temperature test chambers in related technologies can lead to instability in the control system. This necessitates inspectors regularly visiting a designated testing area to check the chamber's operational status. Furthermore, operating the high and low temperature test chamber requires on-site operation by inspectors. This operational method increases the workload of inspectors, reduces the efficiency of high and low temperature testing, and easily leads to sample stacking and queuing. Summary of the Invention

[0004] The purpose of this application is to at least partially solve one of the aforementioned technical problems.

[0005] Therefore, the purpose of this application is to propose a digital high and low temperature test chamber. This high and low temperature test chamber can support remote control and remote acquisition of test data, thereby reducing the workload of operators, improving test efficiency, and solving the problem of how to reduce the workload of operators in high and low temperature tests and improve test efficiency.

[0006] To achieve the above objectives, this application proposes a digital high and low temperature test chamber, which includes: a chamber body, a heating system, a refrigeration system, a humidification system, a control system, a host computer remote operating system, and a wireless communication module, wherein...

[0007] The enclosure includes multiple basic components;

[0008] The heating system, the cooling system, the humidification system, the control system, and the wireless communication module are installed inside the cabinet. The control system communicates remotely with the host computer remote operating system through the wireless communication module.

[0009] The heating system, the cooling system, and the humidification system are used to provide the required operating temperature range and operating humidity range for the digital high and low temperature test chamber.

[0010] The control system is used to control the digital high and low temperature test chamber by completing multiple preset programs in order to conduct various types of high and low temperature environment tests.

[0011] The host computer remote operating system is used to acquire test information of the digital high and low temperature test chamber through wireless transmission, record, summarize and store the test information, and remotely control the digital high and low temperature test chamber. The remote operations performed by the host computer remote operating system include, but are not limited to: modifying test conditions and adjusting for abnormal states.

[0012] In addition, the digital high and low temperature test chamber of this application embodiment also has the following additional technical features:

[0013] Optionally, in some embodiments, the host computer remote operating system includes a touch screen, specifically used to display real-time measurement data curves, alarm status information, historical data curves, and factory parameter information through a human-machine interface on the touch screen.

[0014] Optionally, in some embodiments, the host computer remote operating system is specifically used to: create a new high and low temperature environment test according to the control instructions sent by the operator, and modify the control parameters of the high and low temperature environment test.

[0015] Optionally, in some embodiments, the alarm status information includes: real-time alarm information and historical alarm records. The control system is specifically used to: generate the real-time alarm information based on real-time monitoring data when an abnormality occurs in the digital high and low temperature test chamber, and send the real-time alarm information to the host computer remote operating system; the host computer remote operating system is specifically used to: display an alarm status icon on the human-machine interface and highlight the alarm items corresponding to the real-time alarm information; after the abnormality is eliminated, clear the alarm status and turn off the alarm bell.

[0016] Optionally, in some embodiments, the control parameters include: operation control parameters, management control parameters, PID parameters, and correction parameters for measurement points. The host computer remote operating system is specifically used to modify the corresponding control parameters based on the current test measurement requirements and alarm status information.

[0017] Optionally, in some embodiments, the plurality of basic components include, but are not limited to: an operation panel, a door, a temperature and humidity detection sensor, an observation window, a tri-color light, a test lead hole, a blower motor, an over-temperature setting component, an emergency stop button, a water shortage indicator light, an overflow water pipe interface, a humidification water inlet pipe interface, and a main power switch.

[0018] Optionally, in some embodiments, the test chamber further includes: an over-temperature protection device, wherein the insulation material of the over-temperature protection device, the sealing characteristics of the chamber door, the position of the test lead hole, and the material of the test lead hole are set based on the operating temperature range and the operating humidity range of the digital high and low temperature test chamber.

[0019] Optionally, in some embodiments, the test chamber further includes a test hole plug and a test hole cover. When the digital high and low temperature test chamber is conducting sample testing, the test hole plug is used to seal the test lead hole. When the digital high and low temperature test chamber is not conducting sample testing, the test hole cover and the test hole plug are combined to seal the test lead hole.

[0020] Optionally, in some embodiments, the humidification system includes a humidifier, a water tank, an inlet pipe, and a junction box. When conducting a high humidity test using the humidification system, the control system is further configured to: determine the current dew point temperature inside the digital high and low temperature test chamber based on the temperature and relative humidity of the flowing air inside the chamber; and raise the temperature of the sample to be tested to a level greater than the dew point temperature using a heating device.

[0021] Optionally, in some embodiments, the operation panel is connected to the control system, the host computer remote operating system is compatible with the control system, and the host computer remote operating system remotely controls the digital high and low temperature test chamber by sending control commands to the control system.

[0022] The technical solutions provided by the embodiments of this application bring at least the following beneficial effects:

[0023] This application enables remote control of the high and low temperature test chamber's operating status, remote modification of test conditions, and remote recording, observation, and storage of the chamber's operational status. It allows staff to monitor the chamber's operation in real-time from other remote work locations via a customized software system. In case of abnormalities, staff can promptly receive notification and adjust the chamber accordingly. This avoids frequent on-site visits, reducing staff workload. Furthermore, remote control improves testing efficiency and alleviates the pressure of testing tasks. By enriching the functions of the high and low temperature test chamber, its level of intelligence is enhanced.

[0024] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0025] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein:

[0026] Figure 1 This is a schematic diagram of the structure of a digital high and low temperature test chamber proposed in an embodiment of this application;

[0027] Figure 2 This is a schematic diagram of a specific digital high and low temperature test chamber proposed in an embodiment of this application;

[0028] Figure 3 This is a front view of a specific digital high and low temperature test chamber proposed in an embodiment of this application. Detailed Implementation

[0029] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.

[0030] The digital high and low temperature test chamber of this application is described below with reference to the accompanying drawings.

[0031] Figure 1 This is a schematic diagram of the structure of a digital high and low temperature test chamber proposed in an embodiment of this application, as shown below. Figure 1 As shown, the high and low temperature test chamber includes: chamber body 10, heating system 20, refrigeration system 30, humidification system 40, control system 50, host computer remote operating system 60, and wireless communication module 70.

[0032] The housing 10 includes several basic components.

[0033] The heating system 20, cooling system 30, humidification system 40, control system 50 and wireless communication module 70 are set inside the cabinet 10. The control system 50 communicates remotely with the host computer remote operating system 60 through the wireless communication module 70.

[0034] Heating system 20, cooling system 30, and humidification system 40 are used to provide the required operating temperature and humidity ranges for the digital high and low temperature test chamber.

[0035] The control system 50 is used to control the digital high and low temperature test chamber by completing multiple setting programs in order to conduct various types of high and low temperature environment tests.

[0036] The host computer remote operating system 60 is used to acquire test information of the digital high and low temperature test chamber through wireless transmission, record, summarize and store the test information, and remotely control the digital high and low temperature test chamber. The remote operations that the host computer remote operating system 60 can perform include, but are not limited to, modifying test conditions and adjusting for abnormal states.

[0037] Specifically, multiple basic components are installed on or inside the chamber 10 at corresponding locations. These basic components are essential for the digital high and low temperature test chamber to maintain normal operation and perform high and low temperature environment tests. Examples include the power supply for the high and low temperature test chamber and the water inlet pipe for supplying water to the chamber. The number of basic components, the type of each component, and the arrangement of the components are determined according to the actual testing requirements and can be referenced from the test chamber setup methods in relevant technologies.

[0038] The heating system 20, cooling system 30, and humidification system 40 built into the chamber 10 are used to ensure that the high and low temperature test chamber can reach the operating range of the required temperature and humidity for the test. These systems can be constructed based on the principles of different heating, humidification, and cooling methods. For example, the refrigeration unit in the cooling system 30 can be water-cooled or air-cooled depending on the current test environment conditions and test requirements.

[0039] This application, by completing the overall structural design of the high and low temperature test chamber and the coordinated design of the built-in heating, humidification and cooling systems, ensures that the dimensional parameters, test performance parameters and various components of the high and low temperature test chamber meet the test requirements and the requirements of basic standards in this field.

[0040] For example, the dimensions of the high and low temperature test chamber of this application can be 1 cubic meter, that is, the depth, width and height of the test chamber are all 1000 mm; the working temperature range is -70℃ to +150℃; the humidity range is 20% RH to 98% RH; the temperature deviation is ≤±2℃; the humidity deviation is +2.0 / -5.0%RH (humidity >75%RH), ±5%RH (humidity ≤75%RH); the temperature uniformity is 1 to 2℃; the temperature fluctuation is 0.3 to 1℃.

[0041] The control system 50 is a dedicated digital control system for the high and low temperature test chamber of this application, and the control system can complete multiple program settings. For example... Figure 1 As shown, the control system 50 can be connected to the systems (such as the heating system 20, the cooling system 30, and the humidification system 40) and components in the high and low temperature test chamber that perform various test functions. After running the set program, the control system 50 sends control commands to the relevant systems or components to control the corresponding systems or components to perform relevant operations to complete the test.

[0042] For example, the control system 50 can be a programmable logic controller (PLC) built into the test chamber. The control system 50 executes multiple set programs, including continuously decreasing the temperature inside the test chamber or increasing the humidity inside the test chamber at certain intervals. The digital high and low temperature test chamber of this application can perform various types of tests, including constant temperature tests, high and low temperature alternating tests, constant humidity and heat tests, and high and low temperature alternating humidity and heat tests.

[0043] The host computer remote operating system 60 includes hardware devices and control software capable of remotely operating the high and low temperature test chamber. The host computer remote operating system 60 can be located far from the high and low temperature test chamber, such as in the operator's office, to enable remote control of the test chamber and remote acquisition of test data.

[0044] Specifically, based on the dedicated control system for the digital high and low temperature test chamber constructed according to the testing requirements, this application also develops a host computer operating system. The host computer remote operating system 60 can realize remote operation of the digital high and low temperature test chamber through wireless transmission, including modification of test conditions, recording, observation and storage of test conditions.

[0045] In one embodiment of this application, the host computer remote operating system 60 is compatible with the control system 50, meaning the host computer's operating system is compatible with the test chamber's local operating system. The test chamber is equipped with a computer communication interface. The host computer remote operating system 70 wirelessly connects to the control system 50 through the wireless communication module 70 and communication interface within the test chamber, thereby sending control commands to the control system 50. The control system 50 then forwards the received control commands to the relevant systems or devices for execution, thus enabling remote control of the digital high and low temperature test chamber.

[0046] In this embodiment, the design, programming, and debugging of the host computer remote operating system 60, as well as the design, selection, and debugging of the wireless communication module 70, are carried out first. Then, when configuring the digital high and low temperature test chamber, the prototype is assembled, debugged, and accepted based on the debugging results of the previous step. The type of wireless communication module 70 can be selected based on multiple factors such as the distance between the location of the high and low temperature test chamber and the location of the operator for remote operation, the amount of test data to be transmitted, and the data transmission rate. For example, a LoRa module can be selected as the wireless communication module 70.

[0047] The following section will provide a detailed description of the overall structural design of the digital high and low temperature test chamber and the coordinated setup of the built-in heating, humidification, cooling, and air conditioning systems of this application.

[0048] In an embodiment of the present application, a plurality of basic components provided at relevant positions on the box body or in relevant areas inside the box body include, but are not limited to: an operation panel, a box door, a temperature and humidity detection sensor, an observation window, a three-color light, a test lead hole, a blower motor, an over-temperature setting component, an emergency stop button, a water shortage indicator light, an overflow water pipe interface, a humidification water inlet interface, and a main power switch.

[0049] In this embodiment, the digital high and low temperature test chamber, as Figure 2 shown, can be provided with the above-mentioned various basic components at the top, each side, and corresponding positions inside the test chamber box body. For example, as Figure 3 shown, on the front of the digital high and low temperature test chamber, an operation panel 1, a box door 2, an observation window 3, a three-color light 4, and a motor housing 5 are provided. The other components can be provided at positions such as the back and left side of the test chamber, which will not be elaborated here one by one.

[0050] Several of the main components are described below. Among them, the operation panel 1 is the main operation platform of the digital high and low temperature test chamber and can be regarded as the local operating system of the test chamber. The operation panel 1 is connected to the control system 50, that is, an operator can input control instructions to the control system 50 through the buttons or interactive interface on the operation panel to conduct relevant tests. In the embodiment of the present application, an operating system supporting the operation panel 1 is installed in the control system 50, and the panel operating system of this test chamber is compatible with the above-mentioned host computer operating system.

[0051] Blower motor: The motor constitutes the air circulation system inside the test chamber.

[0052] Box door 2: The large door of the test chamber for placing the test samples to be measured. The box door 2 can be sealed with the test chamber through the handle device.

[0053] Temperature and humidity detection sensor: It is located at the upper right corner of the inner tank of the box body 10 and is mainly used for detecting the temperature and humidity inside the box body.

[0054] Lighting lamp: It is located on both sides of the top of the box body and is used for illuminating the inside of the box.

[0055] Observation window 3: It is located on the box door 2 of the test chamber, which is convenient for users to observe the test samples during the test.

[0056] Test lead hole: A test hole is installed on the side of the test chamber, and users can lead the test cable out of the test chamber through the test hole.

[0057] Emergency stop button: Press it to stop the machine in case of emergency.

[0058] Over-temperature setting component: Double monitoring and alarm processing are performed on the over-temperature of the working chamber temperature. The independent over-temperature alarm is generally set to be 5°C higher than the test temperature.

[0059] Three-color light: Indicates the operating status of the test chamber and emits an alarm sound when the test chamber alarms. The three-color light is installed directly above the chamber door 2.

[0060] Main power switch: The air switch for the overall power supply of the control box is located on the front of the control cabinet. When the main power supply is OFF, the test chamber will be powered off.

[0061] Refrigeration unit: It performs dehumidification and cooling functions for the test chamber, and is generally divided into water-cooled unit and air-cooled unit.

[0062] Overflow pipe: Wastewater discharge interface during the test chamber, located at the lower back of the chamber. One end of the overflow pipe is connected to the overflow pipe interface, and the other end of the overflow pipe is connected to the drainage ditch or water inlet pipe.

[0063] Cooling water inlet (water cooling): Located at the rear of the enclosure, it is used for the condensate inlet of the water-cooled unit.

[0064] In one embodiment of this application, the digital high and low temperature test chamber further includes: an over-temperature protection device for operating temperature. The insulation material of the over-temperature protection device, the sealing characteristics of the chamber door, the position of the test lead hole, and the material of the test lead hole can all be set based on the above-mentioned operating temperature range and operating humidity range of the digital high and low temperature test chamber.

[0065] Specifically, this application studies the influence of the test chamber's structural materials, insulation materials, door sealing characteristics, and the location of the test lead holes on the chamber's temperature and humidity. Based on actual needs, these parameters are rationally set to ensure the chamber structure design better meets the requirements of high and low temperature testing. For example, in related embodiments where the high and low temperature test chamber does not have a humidity system, stainless steel can be used for the test lead holes. However, because the high and low temperature test chamber of this application requires humidity testing, stainless steel is no longer used to avoid the possibility of stainless steel deteriorating in sealing, rusting, and leaking under long-term humidity conditions. This embodiment selects the material of the test lead holes according to the working humidity range of the high and low temperature test chamber, ensuring that the test lead holes remain in a normal state within the working humidity range.

[0066] In one embodiment of this application, since the test lead hole can be used to allow the test cable connected to the sample to be tested to pass through, the test chamber of this embodiment also includes a test hole plug and a test hole cover to improve the sealing performance of the test lead hole. Specifically, when the digital high and low temperature test chamber is conducting sample testing, the test lead hole is sealed by the test hole plug. When the digital high and low temperature test chamber is not conducting sample testing, the test hole cover and test hole plug are combined to seal the test lead hole; that is, the test hole cover is placed over the test hole plug and then inserted into the test lead hole. Therefore, this embodiment improves the sealing performance of the test chamber, avoiding the potential for excessive uniformity deviation inside the chamber due to poor sealing, increased humidification water consumption, failure to reach the maximum temperature during high-temperature testing, and excessive frost formation inside the chamber during low-temperature testing, which could lead to failure to cool down the evaporator.

[0067] In one embodiment of this application, the humidification system 40 of the high and low temperature test chamber includes: a humidifier, a water tank, an inlet pipe, and a junction box. When a high humidity test is conducted through the humidification system, the control system 50 is further configured to: determine the current dew point temperature inside the digital high and low temperature test chamber based on the temperature and relative humidity of the flowing air inside the digital high and low temperature test chamber; and raise the temperature of the sample to be tested to a level greater than the dew point temperature using a heating device.

[0068] Specifically, humidity tests for most electronic components require that condensation not occur on the components. However, condensation will occur on the sample when the sample temperature is lower than the dew point temperature of the air flowing inside the test chamber. Therefore, this embodiment also includes anti-condensation measures. For example, suppose the temperature of the air flowing inside the test chamber is detected as 60°C and the relative humidity as 90% RH by the aforementioned temperature and humidity sensor. By consulting the preset mapping table between dew point temperature and constant temperature, it can be found that the dew point temperature is 58°C. This means that if the sample temperature is lower than 58°C, condensation will occur on the sample surface. Therefore, to prevent condensation, this embodiment can raise the sample temperature to the temperature of the air inside the test chamber using the heating device in the heating system 20 before conducting the constant humidity test, thereby preventing condensation during the subsequent heating process.

[0069] Furthermore, the remote operations performed by the host computer remote operating system 60 in the digital high and low temperature test chamber of this application will be described in detail below.

[0070] In one embodiment of this application, the host computer remote operating system 70 includes a touch screen. The host computer remote operating system is specifically used to display real-time measurement data curves, alarm status information, historical data curves, and factory parameter information through the human-machine interface on the touch screen.

[0071] Specifically, after logging into the preset dedicated control software on the human-machine interface of the touch screen, this application can remotely control the PLC, send operation commands to the high and low temperature test chamber, and monitor the equipment status. In this embodiment, multiple pages can be displayed on the touch screen display area, including the homepage, running interface, real-time curves, alarm status, historical curves, process editing, input / output, control parameters, device lifespan, factory parameters, and help information. The following describes in detail the function of the host computer remote operating system to remotely acquire and display data based on an alarm example.

[0072] As an example, the alarm status interface can display alarm status information including real-time alarm information and historical alarm records. The control system 50 is specifically used to: generate real-time alarm information based on real-time monitoring data when an anomaly occurs in the digital high and low temperature test chamber, and send the real-time alarm information to the host computer remote operating system 60. Furthermore, the host computer remote operating system 60 is specifically used to: display alarm status icons on the human-machine interface and highlight the alarm items corresponding to the real-time alarm information; after troubleshooting, clear the alarm status and turn off the alarm bell.

[0073] Specifically, in this example, alarm states include: real-time alarm, alarm log, clear alarm, and alarm bell off. When an alarm occurs, the program in the host computer's remote operating system will automatically redirect to the alarm status page, and the parameter icon for the current alarm will be highlighted. On the main interface, when an alarm is active, the page displays an alarm status icon; once the alarm is resolved, a normal icon is displayed. Highlightable alarms include: power failure, humidifier overcurrent, and blower thermal protection, etc., determined based on abnormal data detected by the control system. On the alarm log page, clicking the status filter dropdown button allows filtering by alarm status. Alarm statuses are categorized as resolved and unresolved.

[0074] In one embodiment of this application, the host computer remote operating system 60 is specifically used to: create a high and low temperature environment test according to the control instructions sent by the operator, and modify the control parameters of the high and low temperature environment test.

[0075] In this embodiment, the control parameters include: operation control parameters, management control parameters, PID parameters, and measurement point correction parameters. The host computer remote operating system 60 is specifically used to modify the corresponding control parameters based on the current test measurement requirements and alarm status information.

[0076] Specifically, operational control parameters include threshold parameters and equipment control parameters such as the upper and lower limits of temperature alarms, lighting control modes, and auxiliary master control; management control parameters include parameters that manage the test process, such as anti-condensation coefficient, anti-condensation delay, nonlinear coefficient, and temperature blower frequency; PID parameters include parameters that perform PID control on the equipment within the test chamber, such as proportional band, derivative time, and integral time. Correction parameters are used to correct for measurement points during the test, such as multiple humidity and temperature points.

[0077] In this implementation, based on the adjustment requirements of the above parameters at different test stages, and alarm information such as whether a certain parameter is abnormal or an abnormal state occurs in the test chamber, the operator can send parameter adjustment commands through the host computer remote operating system 70 to adjust the above operating parameters of the test chamber, thereby realizing remote modification of the test conditions of the digital high and low temperature test chamber.

[0078] For example, the host computer remote operating system 70 generates a real-time curve based on the acquired real-time measurement data. Based on the real-time curve, it can determine if there is an excessive temperature deviation. Alternatively, when the host computer remote operating system 70 displays alarm information such as water source blockage, the operator can be informed of the above abnormal situation immediately and adjust the control parameters related to the abnormal parameters through the parameter adjustment options in the control parameter interface to adjust the working status of the test chamber.

[0079] Therefore, in this embodiment, staff can use the remote control function of the host computer remote operating system 70 to promptly eliminate any abnormalities occurring in the high and low temperature test chamber, avoiding frequent on-site inspections of the digital high and low temperature test chamber, reducing the workload of staff, ensuring the normal operation of the high and low temperature test, and improving test efficiency.

[0080] In summary, the digital high and low temperature test chamber of this application supports remote control of its operating status, remote modification of test conditions, and remote recording, observation, and storage of its operating status. It allows staff to monitor the chamber's operation in real time from other remote work locations via a customized software system. In case of abnormalities, staff can promptly identify the anomaly and make adjustments to the chamber. This avoids frequent on-site visits and reduces staff workload. Furthermore, remote control of the testing process improves testing efficiency and alleviates the pressure of testing tasks. By enriching the functions of the high and low temperature test chamber, its level of intelligence is enhanced.

[0081] It should be noted that in the description of this application, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Furthermore, in the description of this application, unless otherwise stated, "a plurality of" means two or more.

[0082] Furthermore, in the description of this application, the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting the present invention.

[0083] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0084] Any process or method description in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or more executable instructions for implementing a particular logical function or process, and the scope of the preferred embodiments of this application includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the function involved, as should be understood by those skilled in the art to which embodiments of this application pertain.

[0085] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0086] Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of this application.

Claims

1. A digital high and low temperature test chamber, characterized in that, include: The enclosure, heating system, cooling system, humidification system, control system, host computer remote operating system, and wireless communication module, among which, The enclosure includes multiple basic components; The heating system, the cooling system, the humidification system, the control system, and the wireless communication module are installed inside the cabinet. The control system communicates remotely with the host computer remote operating system through the wireless communication module. The heating system, the cooling system, and the humidification system are used to provide the required operating temperature range and operating humidity range for the digital high and low temperature test chamber. The control system is used to control the digital high and low temperature test chamber by completing multiple preset programs in order to conduct various types of high and low temperature environment tests. The host computer remote operating system is used to acquire test information of the digital high and low temperature test chamber through wireless transmission, record, summarize and store the test information, and remotely control the digital high and low temperature test chamber. The remote operations performed by the host computer remote operating system include: modifying test conditions and adjusting for abnormal states. The host computer remote operating system is specifically used to: create high and low temperature environment tests according to the control instructions sent by the operator, and modify the control parameters of the high and low temperature environment tests; The control parameters include: operation control parameters, management control parameters, PID parameters, and measurement point correction parameters. The host computer remote operating system is specifically used to modify the corresponding control parameters based on the current test measurement requirements and alarm status information. The humidification system includes a humidifier, a water tank, an inlet pipe, and a junction box. Before conducting a high humidity test using the humidification system, the control system is further configured to: determine the current dew point temperature inside the digital high and low temperature test chamber based on the temperature and relative humidity of the flowing air inside the chamber; raise the temperature of the sample to be tested to a level greater than the dew point temperature using a heating device; and ensure that the sample to be tested is an explosion-proof device.

2. The digital high and low temperature test chamber according to claim 1, characterized in that, The host computer remote operating system includes a touch screen, and the host computer remote operating system is specifically used for: The touchscreen displays real-time measurement data curves, alarm status information, historical data curves, and factory parameter information through a human-machine interface.

3. The digital high and low temperature test chamber according to claim 2, characterized in that, The alarm status information includes: real-time alarm information and historical alarm records. The control system is specifically used for: When an abnormality occurs in the digital high and low temperature test chamber, the real-time alarm information is generated based on real-time monitoring data and sent to the host computer remote operating system. The host computer remote operating system is specifically used for: The alarm status icon is displayed on the human-computer interaction interface, and the alarm items corresponding to the real-time alarm information are highlighted. After troubleshooting, clear the alarm status and turn off the alarm bell.

4. The digital high and low temperature test chamber according to claim 1, characterized in that, The various basic components include: an operation panel, a door, a temperature and humidity sensor, an observation window, a tri-color light, a test lead hole, a blower motor, an over-temperature setting component, an emergency stop button, a water shortage indicator light, an overflow water pipe interface, a humidifier water inlet pipe interface, and a main power switch.

5. The digital high and low temperature test chamber according to claim 4, characterized in that, Also includes: The working temperature over-temperature protection device, the insulation material of the working temperature over-temperature protection device, the sealing characteristics of the chamber door, the position of the test lead hole and the material of the test lead hole are set based on the working temperature range and the working humidity range of the digital high and low temperature test chamber.

6. The digital high and low temperature test chamber according to claim 4, characterized in that, Also includes: The test hole plug and test hole cover are used to seal the test lead hole when the sample is being tested in the digital high and low temperature test chamber. When the sample is not being tested in the digital high and low temperature test chamber, the test hole cover and the test hole plug are combined to seal the test lead hole.

7. The digital high and low temperature test chamber according to claim 4, characterized in that, The operation panel is connected to the control system, and the host computer remote operating system is compatible with the control system. The host computer remote operating system remotely controls the digital high and low temperature test chamber by sending control commands to the control system.

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