Signal processing method, system, device, computer equipment and storage medium

Abstract

The present application relates to a signal processing method, system, device, computer equipment, storage medium and computer program product. The method includes: sending a first test pattern to a host to be tested and instructing an oscilloscope to process the first test pattern to obtain a first initial eye diagram; obtaining a first emphasis parameter according to an eye diagram evaluation model and the first initial eye diagram, and instructing the oscilloscope to process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram; in the case where the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter to a second emphasis parameter according to an adaptive control algorithm; using the second emphasis parameter and the first emphasis parameter as new first emphasis parameters, instructing the oscilloscope to process the new first emphasis parameter and the first test pattern to obtain a second initial eye diagram, and determining the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter. The use of this method improves the efficiency of consistency testing.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to a signal processing method, apparatus, system, computer equipment, storage medium and computer program product. Background Art

[0002] With the development of SATA (Serial ATA) interface devices, SATA interface devices (such as motherboards and large storage devices) need to be tested for consistency before leaving the factory. Before performing consistency tests on SATA interface devices, the test system needs to verify the test patterns used for consistency testing to ensure the accuracy of the test patterns.

[0003] In traditional technology, the tester determines whether the current test code pattern needs to be adjusted based on the eye diagram output by the oscilloscope in the test system. If the current test code pattern needs to be adjusted, the tester adjusts the current test code pattern based on experience, and completes the adjustment of the test code pattern by continuously adjusting the emphasis parameters until the eye diagram corresponding to the test code pattern with the added emphasis parameters meets the requirements of the preset eye diagram. The current emphasis parameters are then determined to be the target emphasis parameters, and the consistency test of the SATA interface device can be performed based on the target test code pattern corresponding to the target emphasis parameters.

[0004] However, currently, based on the fact that testers adjust the emphasis parameters based on experience and obtain the target emphasis parameters, the debugging efficiency of the test pattern is low, which in turn leads to low efficiency in the consistency test of the SATA interface device. Summary of the invention

[0005] Based on this, it is necessary to provide a signal processing method, system, apparatus, computer device, computer-readable storage medium and computer program product to address the above technical problems.

[0006] In a first aspect, the present application provides a signal processing method. The method comprises:

[0007] Sending a first test pattern to the host to be tested, and instructing an oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0008] Performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0009] When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter;

[0010] The second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope is executed, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter.

[0011] In the above signal processing method, the initial eye diagram is evaluated according to the eye diagram evaluation model to obtain the first emphasis parameter, the oscilloscope is instructed to analyze and process the first emphasis parameter and the first test code type to obtain the second initial eye diagram fed back by the oscilloscope, and the first emphasis parameter is adjusted according to the preset adaptive control algorithm to obtain the second emphasis parameter, the second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter, which can avoid the low efficiency of manual debugging of emphasis parameters and reduce misjudgments and missed detections caused by human errors, thereby improving the test efficiency of consistency testing of the host to be tested.

[0012] In one embodiment, sending a first test pattern to the host to be tested includes:

[0013] Reading test data from the target address of the host to be tested, and obtaining a match between the test data and the default data;

[0014] When the matching condition is that the test data matches the default data, sending a first test pattern to the host to be tested;

[0015] When the matching condition is that the test data does not match the default data, an alarm device chip selection signal is sent to issue an alarm.

[0016] In this embodiment, the connection status of the test fixture and the host to be tested can be determined based on the matching of the test data with the default data. If the test data does not match the default data, the test fixture can issue an alarm to prompt the tester to check the connection status of the test fixture and the host to be tested to prevent excessive error in the signal received by the test fixture due to the connection status, thereby improving the accuracy of the test fixture in the SATA interface consistency test.

[0017] In one embodiment, the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope includes:

[0018] Obtaining a second test pattern according to the first emphasis parameter and the first test pattern;

[0019] The second test code pattern is sent to the host to be tested, and the oscilloscope is instructed to analyze and process the second test code pattern to obtain a second initial eye diagram fed back by the oscilloscope.

[0020] In this embodiment, by instructing the oscilloscope to analyze and process the second test pattern, the validity of the second test pattern for the SATA interface consistency test can be determined, that is, whether the first emphasis parameter is valid can be determined.

[0021] In one of the embodiments, after determining the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter, the method further includes:

[0022] A target test pattern is obtained according to the target emphasis parameter and the first test pattern, a signal test result corresponding to the target test pattern is determined, and the signal test result and the second initial eye diagram that meets the preset eye diagram condition are sent to a working machine.

[0023] In this embodiment, a target test code pattern that can effectively test the SATA interface can be obtained through the target emphasis parameter and the first test code pattern, and the signal test result of the SATA interface in the host to be tested can be obtained according to the target test code pattern, and the signal test result and the second initial eye diagram that meets the preset eye diagram conditions are sent to the working machine. This can avoid the tester manually copying the signal test result in the test fixture and the second initial eye diagram that meets the preset eye diagram conditions in the oscilloscope to the working machine, thereby realizing the efficiency of the SATA interface consistency test in the host to be tested.

[0024] In one embodiment, the test fixture is connected to a plurality of hosts to be tested, and before sending the first test pattern to the hosts to be tested, the method further includes:

[0025] Based on the preset test duration and test interval of each host to be tested, the interface corresponding to each host to be tested is preprocessed.

[0026] In the embodiment of the present application, by preprocessing the interface corresponding to the host to be tested, it is possible to avoid signal interference and misjudgment caused by overlapping of signals of multiple SATA interfaces in time phase, thereby improving the accuracy of SATA interface consistency testing.

[0027] In one embodiment, the test fixture is connected to a plurality of hosts to be tested, and before sending the first test pattern to the hosts to be tested, the method further includes:

[0028] Set the handshake signal parameters for the interface corresponding to each host to be tested;

[0029] Preprocessing interfaces corresponding to different test channels of the test fixture according to the handshake signal parameters;

[0030] The interfaces corresponding to the different test channels after preprocessing send handshake signals to the hosts under test, and instruct the hosts under test to feed back handshake responses to the interfaces of the test channels corresponding to the test fixture in response to the handshake signals.

[0031] In this embodiment, by setting response signal parameters for interfaces corresponding to different test channels, it is possible to avoid signal interference and misjudgment caused by overlap of signals of multiple SATA interfaces in time phase, thereby improving the accuracy of SATA interface consistency testing.

[0032] In one embodiment, before performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain the first emphasis parameter, the method further includes:

[0033] Acquire a sample eye diagram and a label corresponding to the sample eye diagram; the label includes an emphasis parameter label;

[0034] Inputting the sample eye diagram and the label corresponding to the sample eye diagram into an eye diagram evaluation model, analyzing and processing the sample eye diagram according to the eye diagram evaluation model to obtain an emphasis parameter;

[0035] Based on the emphasis parameter and the emphasis parameter label, obtaining a loss value of the eye diagram evaluation model;

[0036] When the loss value satisfies a preset loss condition, the training of the eye diagram evaluation model is terminated and a trained eye diagram evaluation model is obtained.

[0037] In an embodiment of the present application, by training the eye diagram evaluation model, the accuracy of the emphasis parameters output by the eye diagram evaluation model can be improved. At the same time, by obtaining the emphasis parameters based on the eye diagram evaluation model, the efficiency of the accuracy of the SATA interface consistency test can be improved.

[0038] In a second aspect, the present application also provides a signal processing system. The system comprises:

[0039] A test fixture, used for sending a first test pattern to a host to be tested, and instructing an oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope; performing data processing on the first initial eye pattern according to an eye pattern evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye pattern fed back by the oscilloscope; in the case where the second initial eye pattern does not meet a preset eye pattern condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter; constructing the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, executing the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain the second initial eye pattern fed back by the oscilloscope, and determining the first emphasis parameter corresponding to the second initial eye pattern that meets the preset eye pattern condition as a target emphasis parameter;

[0040] The oscilloscope is used to obtain an initial eye diagram according to the first test pattern and send the initial eye diagram to the test fixture;

[0041] A working machine is used to receive a signal test result and the second initial eye diagram that meets the preset eye diagram condition.

[0042] In an embodiment of the present application, an initial eye diagram is evaluated according to an eye diagram evaluation model to obtain a first emphasis parameter, an oscilloscope is instructed to analyze and process the first emphasis parameter and a first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope, and the first emphasis parameter is adjusted according to a preset adaptive control algorithm to obtain a second emphasis parameter, the second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter, which can avoid the low efficiency of manual debugging of emphasis parameters and reduce misjudgments and missed detections caused by human errors, thereby improving the test efficiency of consistency testing of the host to be tested.

[0043] In one of the embodiments, the oscilloscope is specifically used to perform error compensation on the first test code pattern according to the cable power loss to obtain the compensated first test code pattern, and obtain an initial eye diagram corresponding to the compensated first test code pattern according to the afterglow effect.

[0044] In this embodiment, by using the power loss in the cable as the error compensation value and de-embedding the original test pattern in the oscilloscope, the error of the initial eye diagram caused by the signal distortion and attenuation caused by the cable itself can be reduced, thereby improving the accuracy of the SATA interface signal consistency test.

[0045] In a third aspect, the present application further provides a signal processing device. The device comprises:

[0046] A sending module, used for sending a first test pattern to the host to be tested, and instructing the oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0047] A data processing module, configured to perform data processing on the first initial eye diagram according to an eye diagram evaluation model to obtain a first emphasis parameter, and instruct the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0048] An adjustment module, configured to adjust the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter when the second initial eye diagram does not meet a preset eye diagram condition;

[0049] A first determination module is used to construct the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, execute the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code type to obtain a second initial eye diagram fed back by the oscilloscope, and determine the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter.

[0050] In the above-mentioned signal processing device, the initial eye diagram is evaluated according to the eye diagram evaluation model to obtain the first emphasis parameter, the oscilloscope is instructed to analyze and process the first emphasis parameter and the first test code type to obtain the second initial eye diagram fed back by the oscilloscope, and the first emphasis parameter is adjusted according to the preset adaptive control algorithm to obtain the second emphasis parameter, the second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter, which can avoid the low efficiency of manual debugging of emphasis parameters and reduce misjudgments and missed detections caused by human errors, thereby improving the test efficiency of the consistency test of the host to be tested.

[0051] In one embodiment, the sending module is specifically used for:

[0052] Reading test data from the target address of the host to be tested, and obtaining a match between the test data and the default data;

[0053] When the matching condition is that the test data matches the default data, sending a first test pattern to the host to be tested;

[0054] When the matching condition is that the test data does not match the default data, an alarm device chip selection signal is sent to issue an alarm.

[0055] In this embodiment, the connection status of the test fixture and the host to be tested can be determined based on the matching of the test data with the default data. If the test data does not match the default data, the test fixture can issue an alarm to prompt the tester to check the connection status of the test fixture and the host to be tested to prevent excessive error in the signal received by the test fixture due to the connection status, thereby improving the accuracy of the test fixture in the SATA interface consistency test.

[0056] In one embodiment, the data processing module is specifically used for:

[0057] Obtaining a second test pattern according to the first emphasis parameter and the first test pattern;

[0058] The second test code pattern is sent to the host to be tested, and the oscilloscope is instructed to analyze and process the second test code pattern to obtain a second initial eye diagram fed back by the oscilloscope.

[0059] In this embodiment, by instructing the oscilloscope to analyze and process the second test pattern, the validity of the second test pattern for the SATA interface consistency test can be determined, that is, whether the first emphasis parameter is valid can be determined.

[0060] In one embodiment, the device further comprises:

[0061] The second determination module is used to obtain a target test code pattern according to the target emphasis parameter and the first test code pattern, determine a signal test result corresponding to the target test code pattern, and send the signal test result and the second initial eye diagram that meets the preset eye diagram condition to the working machine.

[0062] In this embodiment, a target test code pattern that can effectively test the SATA interface can be obtained through the target emphasis parameter and the first test code pattern, and the signal test result of the SATA interface in the host to be tested can be obtained according to the target test code pattern, and the signal test result and the second initial eye diagram that meets the preset eye diagram conditions are sent to the working machine. This can avoid the tester manually copying the signal test result in the test fixture and the second initial eye diagram that meets the preset eye diagram conditions in the oscilloscope to the working machine, thereby realizing the efficiency of the SATA interface consistency test in the host to be tested.

[0063] The first preprocessing module is used to preprocess the interface corresponding to each host to be tested based on the preset test duration and test interval of each host to be tested.

[0064] In the embodiment of the present application, by preprocessing the interface corresponding to the host to be tested, it is possible to avoid signal interference and misjudgment caused by overlapping of signals of multiple SATA interfaces in time phase, thereby improving the accuracy of SATA interface consistency testing.

[0065] The second preprocessing module is used to set handshake signal parameters for the interface corresponding to each host to be tested;

[0066] Preprocessing interfaces corresponding to different test channels of the test fixture according to the handshake signal parameters;

[0067] The interfaces corresponding to the different test channels after preprocessing send handshake signals to the hosts under test, and instruct the hosts under test to feed back handshake responses to the interfaces of the test channels corresponding to the test fixture in response to the handshake signals.

[0068] In this embodiment, by setting response signal parameters for interfaces corresponding to different test channels, it is possible to avoid signal interference and misjudgment caused by overlap of signals of multiple SATA interfaces in time phase, thereby improving the accuracy of SATA interface consistency testing.

[0069] A training module, used to obtain a sample eye diagram and a label corresponding to the sample eye diagram; the label includes an emphasis parameter label;

[0070] Inputting the sample eye diagram and the label corresponding to the sample eye diagram into an eye diagram evaluation model, analyzing and processing the sample eye diagram according to the eye diagram evaluation model to obtain an emphasis parameter;

[0071] Based on the emphasis parameter and the emphasis parameter label, obtaining a loss value of the eye diagram evaluation model;

[0072] When the loss value satisfies a preset loss condition, the training of the eye diagram evaluation model is terminated and a trained eye diagram evaluation model is obtained.

[0073] In an embodiment of the present application, by training the eye diagram evaluation model, the accuracy of the emphasis parameters output by the eye diagram evaluation model can be improved. At the same time, by obtaining the emphasis parameters based on the eye diagram evaluation model, the efficiency of the accuracy of the SATA interface consistency test can be improved.

[0074] In a fourth aspect, the present application further provides a computer device. The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0075] Sending a first test code pattern to the host to be tested, and instructing an oscilloscope to analyze and process the first test code pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0076] Performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0077] When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter;

[0078] The second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope is executed, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter.

[0079] In a fifth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0080] Sending a first test pattern to the host to be tested, and instructing an oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0081] Performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0082] When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter;

[0083] The second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope is executed, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter.

[0084] In a sixth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0085] Sending a first test pattern to the host to be tested, and instructing an oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0086] Performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0087] When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter;

[0088] The second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope is executed, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter.

[0089] The above-mentioned signal processing method, system, device, computer equipment, storage medium and computer program product evaluate the initial eye diagram according to the eye diagram evaluation model to obtain the first emphasis parameter, instruct the oscilloscope to analyze and process the first emphasis parameter and the first test code type to obtain the second initial eye diagram fed back by the oscilloscope, and adjust the first emphasis parameter according to the preset adaptive control algorithm to obtain the second emphasis parameter, construct the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, and determine the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter, which can avoid the low efficiency of manual debugging of emphasis parameters and reduce misjudgment and missed detection caused by human errors, thereby improving the test efficiency of consistency testing of the host to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0090] Figure 1 is an application environment diagram of a signal processing method in an embodiment;

[0091] Figure 2 is a flow chart of a signal processing method in one embodiment;

[0092] Figure 3 A schematic diagram of a flow chart of a method for testing the connection between a host to be tested and a test fixture in one embodiment;

[0093] Figure 4 is a circuit diagram of a test fixture in one embodiment;

[0094] Figure 5 A schematic diagram of a flow chart of a method for obtaining a second initial eye diagram in one embodiment;

[0095] Figure 6 A schematic flow chart of a method for preprocessing a test fixture interface by setting handshake parameters in one embodiment;

[0096] Figure 7 A schematic diagram of a flow chart of an eye diagram evaluation model training method in one embodiment;

[0097] Figure 8 A flowchart of an example of a signal processing method in an embodiment;

[0098] Fig. 9 is a structural block diagram of a signal processing device in one embodiment;

[0099] Fig.10 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0100] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0101] The signal processing method provided in the embodiment of the present application is applied to a test fixture, which belongs to Figure 1 In the signal processing system 100 shown, the signal processing system includes a test fixture 101, an oscilloscope 102, a working machine 103 and a host to be tested 104.

[0102] In one embodiment, Figure 2 As shown, a signal processing method is provided, which is applied to Figure 1 The test fixture in the example is used to illustrate the following steps:

[0103] Step 202: Send a first test pattern to the host to be tested, and instruct the oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope.

[0104] In one embodiment, a first test pattern may be pre-stored in the memory of the test fixture, and the first test pattern is used to perform consistency testing on the SATA interface in the host to be tested. The first test pattern may be a SATA signal pattern encoded by HFTP, MFTP, LFTP or LBP. The test fixture sends the pre-stored first test pattern to the host to be tested, and then the test fixture instructs the oscilloscope to analyze and process the first test pattern. The oscilloscope obtains a first initial eye diagram based on the first test pattern sent by the test fixture, and feeds it back to the test fixture. The test fixture receives and obtains the first initial eye diagram fed back by the oscilloscope.

[0105] Step 204 , performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope.

[0106] The emphasis parameters include pre-emphasis (Pre-Emphasis) parameters and de-emphasis (De-Emphasis) parameters.

[0107] In one embodiment, after the test fixture obtains the first initial eye diagram, the first initial eye diagram is input into the eye diagram evaluation model integrated in the FPGA (Field Programmable Gate Array) of the test fixture, and the first initial eye diagram is processed according to the eye diagram evaluation model to obtain the first emphasis parameter, which is used to adjust the first test pattern. After the eye diagram evaluation model outputs the first emphasis parameter, the test fixture instructs the oscilloscope to analyze and process the first emphasis parameter and the first test pattern, and the oscilloscope obtains the second initial eye diagram according to the first emphasis parameter and the first test pattern sent by the test fixture, and feeds it back to the test fixture. The test fixture receives and obtains the second initial eye diagram fed back by the oscilloscope.

[0108] In an optional embodiment, the eye diagram evaluation model can be deployed in the cloud or server, and the cloud or server communicates with the FPGA of the test fixture through the network. After the test fixture obtains the first initial eye diagram, the test fixture uploads the first initial eye diagram to the cloud or server, and performs data processing on the first initial eye diagram according to the eye diagram evaluation model in the cloud or server to obtain the first emphasis parameter. Then, the cloud or server sends the first emphasis parameter to the test fixture. When the test fixture obtains the first emphasis parameter, the test fixture instructs the oscilloscope to analyze and process the first emphasis parameter and the first test pattern. The oscilloscope obtains the second initial eye diagram based on the first emphasis parameter and the first test pattern sent by the test fixture, and feeds it back to the test fixture. The test fixture receives and obtains the second initial eye diagram fed back by the oscilloscope.

[0109] Step 206, when the second initial eye diagram does not meet the preset eye diagram condition, the first emphasis parameter is adjusted according to a preset adaptive control algorithm to obtain a second emphasis parameter.

[0110] In one embodiment, the oscilloscope carries a preset eye diagram, and the preset eye diagram condition is that the error between the second initial eye diagram and the preset eye diagram is within a preset range. The oscilloscope compares and analyzes the second initial eye diagram with the preset eye diagram. If the error between the second initial eye diagram and the preset eye diagram exceeds the preset range, it is determined that the second initial eye diagram does not meet the preset eye diagram condition, and the oscilloscope returns a failure signal (FAIL) to the test fixture. Then, the test fixture receives the failure signal, indicating that the second initial eye diagram does not meet the preset eye diagram condition, and the test fixture adjusts the first emphasis parameter according to the preset adaptive algorithm to obtain the second emphasis parameter. Among them, the preset adaptive algorithm calculates and obtains the step value and iteration number for the first emphasis parameter through BER (Bit Error Ratio bit error probability) and BER change, as well as the evaluation index of the eye diagram (such as noise ratio, jitter, etc.), and adjusts the first emphasis parameter based on the step value and the iteration number to obtain the adjusted second emphasis parameter.

[0111] When the second initial eye diagram meets the preset eye diagram condition, the oscilloscope returns a success signal (SUCCEED), indicating that the SATA interface of the host to be tested can be effectively tested for consistency based on the test pattern corresponding to the current second initial eye diagram.

[0112] Step 208, constructing the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, executing the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope, and determining the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter.

[0113] In one embodiment, the test fixture constructs the first emphasis parameter and the second emphasis parameter into a new first emphasis parameter, so that the second test pattern can be obtained according to the first emphasis parameter and the first test pattern, and the second test pattern is obtained by adjusting the first test pattern by the first emphasis parameter and the second emphasis parameter. The oscilloscope analyzes and processes the adjusted second test pattern to obtain an updated second initial eye diagram. If the updated second initial eye diagram still does not meet the preset eye diagram condition, a new second emphasis parameter is obtained according to the preset adaptive control algorithm, and the current first emphasis parameter and the new second emphasis parameter are reconstructed into a new first emphasis parameter, and the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain the second initial eye diagram fed back by the oscilloscope is executed, until the current second initial eye diagram meets the preset eye diagram condition, and the current first emphasis parameter is determined as the target emphasis parameter.

[0114] Optionally, the emphasis parameter may include but is not limited to a first emphasis parameter. Based on different adaptive times, the emphasis parameter is continuously iteratively updated. The processing process of the oscilloscope for each emphasis parameter in the embodiment of the present application is similar and will not be repeated here.

[0115] Optionally, each time the test fixture determines the first emphasis parameter, it may be displayed on a display screen of the oscilloscope, and the tester may adjust the test fixture according to the current first emphasis parameter.

[0116] In the above signal processing method, the initial eye diagram is evaluated according to the eye diagram evaluation model to obtain the first emphasis parameter, the oscilloscope is instructed to analyze and process the first emphasis parameter and the first test code type to obtain the second initial eye diagram fed back by the oscilloscope, and the first emphasis parameter is adjusted according to the preset adaptive control algorithm to obtain the second emphasis parameter, the second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter, which can avoid the low efficiency of manual debugging of emphasis parameters and reduce misjudgments and missed detections caused by human errors, thereby improving the test efficiency of consistency testing of the host to be tested.

[0117] In one embodiment, before sending the first test pattern to the host to be tested, the connection status between the test fixture and the host to be tested can be determined based on the matching status between the test data and the default data, such as Figure 3 As shown, step 202 sends a first test pattern to the host to be tested, including:

[0118] Step 302, reading test data from the target address of the host to be tested, and obtaining a match between the test data and the default data.

[0119] In one embodiment, the target address of the memory in the host to be tested is pre-stored with default data. After the test fixture is connected to the host to be tested, the test fixture reads the test data from the target address of the host to be tested, obtains the test data read by the test fixture, and compares the test data with the default data to obtain the matching of the test data and the default data. The matching is used to characterize the connection between the host to be tested and the test fixture.

[0120] Specifically, Figure 4 As shown, Figure 4To test the circuit connection of the test fixture, the test fixture includes an MCU (Microcontroller Unit) and an MC34904C5EK (an integrated circuit). After the host to be tested is connected to the test fixture, the MC34904C5EK of the test fixture is used to compare signals. When the pin of the MC34904C5EK receives an electrical signal, it compares the test data with the default data, obtains a matching result, and sends the matching situation to the MCU.

[0121] Step 304: When the matching condition is that the test data matches the default data, a first test pattern is sent to the host to be tested.

[0122] In one embodiment, when the matching condition is that the test data matches the default data, it indicates that the connection between the host to be tested and the test fixture is normal, and there is no error in the signal transmission between the host to be tested and the test fixture, then the test fixture sends a first test code type to the host to be tested.

[0123] Step 306, when the matching situation is that the test data does not match the default data, an alarm device chip select signal is sent to issue an alarm.

[0124] In one embodiment, when the matching situation is that the test data does not match the default data, it means that the connection between the host to be tested and the test fixture is abnormal, and the signal transmission between the host to be tested and the test fixture has a large error, then the test fixture sends an alarm device chip select signal to alarm.

[0125] In this embodiment, the connection status of the test fixture and the host to be tested can be determined based on the matching of the test data with the default data. If the test data does not match the default data, the test fixture can issue an alarm to prompt the tester to check the connection status of the test fixture and the host to be tested to prevent excessive error in the signal received by the test fixture due to the connection status, thereby improving the accuracy of the test fixture in the SATA interface consistency test.

[0126] In one embodiment, if Figure 5 As shown, step 204 or step 208 instructs the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope, including:

[0127] Step 502: Obtain a second test pattern according to the first emphasis parameter and the first test pattern.

[0128] In one embodiment, the test fixture adds the first emphasis parameter output by the eye diagram evaluation model to the first test pattern to obtain a second test pattern. The second test pattern is used to generate a second initial eye diagram.

[0129] In an optional embodiment, the test fixture receives a first emphasis parameter sent by the cloud or the server, and adds the first emphasis parameter to the first test pattern to obtain a second test pattern.

[0130] Step 504 , sending a second test code pattern to the host to be tested, instructing the oscilloscope to analyze and process the second test code pattern, and obtaining a second initial eye diagram fed back by the oscilloscope.

[0131] In one embodiment, the test fixture sends the second test pattern to the host to be tested, and instructs the oscilloscope to analyze and process the second test pattern. The oscilloscope obtains a second initial eye diagram corresponding to the second test pattern according to the second test pattern, and feeds the second initial eye diagram back to the test fixture. The test fixture receives and obtains the second initial eye diagram fed back by the oscilloscope.

[0132] In this embodiment, by instructing the oscilloscope to analyze and process the second test pattern, the validity of the second test pattern for the SATA interface consistency test can be determined, that is, whether the first emphasis parameter is valid can be determined.

[0133] In one embodiment, after step 208 determines the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter, the method further includes:

[0134] A target test pattern is obtained according to the target emphasis parameter and the first test pattern, a signal test result corresponding to the target test pattern is determined, and the signal test result and a second initial eye diagram that meets a preset eye diagram condition are sent to a working machine.

[0135] The working machine and the test fixture are connected to the same local area network.

[0136] In one embodiment, the test fixture adds the target emphasis parameter to the first test pattern to obtain the target test pattern, and sends the target test pattern to the host to be tested, instructing the oscilloscope to perform data processing on the target test pattern to obtain signal test results, such as signal test result information such as eye width, eye height, and jitter. The test fixture sends the signal test results and the obtained second initial eye diagram that meets the preset eye diagram conditions to the working machine.

[0137] In this embodiment, a target test code pattern that can effectively test the SATA interface can be obtained through the target emphasis parameter and the first test code pattern, and the signal test result of the SATA interface in the host to be tested can be obtained according to the target test code pattern, and the signal test result and the second initial eye diagram that meets the preset eye diagram conditions are sent to the working machine. This can avoid the tester manually copying the signal test result in the test fixture and the second initial eye diagram that meets the preset eye diagram conditions in the oscilloscope to the working machine, thereby realizing the efficiency of the SATA interface consistency test in the host to be tested.

[0138] In one embodiment, the test fixture is connected to a plurality of hosts to be tested, and before step 202 sends the first test pattern to the hosts to be tested, the method further includes:

[0139] Based on the preset test duration and test interval of each host to be tested, the interface corresponding to each host to be tested is preprocessed.

[0140] In one embodiment, the ROM (Read-Only Memory) of the test fixture can pre-store the allocation strategy of the test duration and test interval corresponding to multiple interfaces of the test fixture. The test fixture sets the preset test duration and interval for each host to be tested, and according to the pre-stored allocation strategy, sets the preset test duration and interval for the interface corresponding to each host to be tested, thereby completing the preprocessing of the interface corresponding to each host to be tested.

[0141] In the embodiment of the present application, by preprocessing the interface corresponding to the host to be tested, it is possible to avoid signal interference and misjudgment caused by overlapping of signals of multiple SATA interfaces in time phase, thereby improving the accuracy of SATA interface consistency testing.

[0142] In one embodiment, if Figure 6 As shown, the test fixture is connected to multiple hosts to be tested. Before step 202 sends the first test pattern to the host to be tested, the method further includes:

[0143] Step 602: Set handshake signal parameters for the interface corresponding to each host to be tested.

[0144] The handshake signal parameters include the request signal period, the request signal polarity, the response signal delay time, and the timeout time.

[0145] In one embodiment, the test fixture calculates corresponding parameters for the request signal period, request signal polarity, response signal delay time, and timeout time according to the allocation strategy of the test duration and interval corresponding to the multiple interfaces in the memory.

[0146] Specifically, the test fixture calculates the request signal period according to the cache size, signal transmission rate and response characteristics of the host under test, calculates the request signal polarity according to the signal characteristics and interface type (for example, SATA Gen3) of the host under test, calculates the response signal delay time according to the time delay from the host under test device receiving the request signal to sending the response signal, and calculates the timeout time according to the response characteristics, signal transmission rate and cache size of the host under test and the response delay.

[0147] Step 604 , pre-processing the interfaces corresponding to different test channels of the test fixture according to the handshake signal parameters.

[0148] In one embodiment, the test fixture sets interfaces corresponding to different test channels of the test fixture according to the calculated handshake signal parameters, thereby completing preprocessing of interfaces corresponding to different test channels of the test fixture.

[0149] Step 606 , sending a handshake signal to each host under test through the interface corresponding to the pre-processed test channel, instructing each host under test to feed back a handshake response to the interface of the test channel corresponding to the test fixture in response to the handshake signal.

[0150] In one embodiment, the test fixture sends request signals to the host to be tested in turn according to the set handshake signal parameters, instructing each host to be tested to complete the handshake response for the handshake signal and the interface of the test channel corresponding to the test fixture. Specifically, the test fixture sends the corresponding handshake signal to the interface corresponding to the first set test channel, instructing the host to be tested corresponding to the current interface to return a response signal, and when the response signal is received, a handshake signal is sent to the interface corresponding to the next test channel; when the time to receive the response signal exceeds the timeout time and the response signal is still not received, it is considered that the interface has an abnormality and the test fails.

[0151] In this embodiment, by setting response signal parameters for interfaces corresponding to different test channels, it is possible to avoid signal interference and misjudgment caused by overlap of signals of multiple SATA interfaces in time phase, thereby improving the accuracy of SATA interface consistency testing.

[0152] In one embodiment, if Figure 7 As shown, before step 204 performs data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain the first emphasis parameter, the method further includes:

[0153] Step 702: Obtain a sample eye diagram and a label corresponding to the sample eye diagram.

[0154] The label includes an emphasis parameter label.

[0155] In the embodiment of the present application, the test fixture obtains the sample eye diagram and the label corresponding to the sample eye diagram.

[0156] In an optional embodiment, the eye diagram evaluation model can be trained in a terminal, a cloud or a server, and the model parameters of the trained eye diagram evaluation model can be set in a test fixture.

[0157] Step 704: input the sample eye diagram and the label corresponding to the sample eye diagram into the eye diagram evaluation model, analyze and process the sample eye diagram according to the eye diagram evaluation model, and obtain the emphasis parameter.

[0158] In an embodiment of the present application, the test fixture inputs the sample eye diagram and the label corresponding to the sample eye diagram into the eye diagram evaluation model, analyzes and processes the sample eye diagram according to the eye diagram evaluation model, and obtains the emphasis parameter.

[0159] Step 706: Obtain the loss value of the eye diagram evaluation model based on the emphasis parameter and the emphasis parameter label.

[0160] In an embodiment of the present application, the test fixture obtains the loss value of the current eye diagram evaluation model according to the emphasis parameters and emphasis parameter labels output by the eye diagram evaluation model.

[0161] Step 708: When the loss value satisfies the preset loss condition, the training of the eye diagram evaluation model is terminated and the trained eye diagram evaluation model is obtained.

[0162] In an embodiment of the present application, the test fixture adjusts the parameters in the eye diagram evaluation model according to the current loss value through an optimization algorithm (such as gradient descent). When the loss value meets the preset loss condition, the training of the eye diagram evaluation model is terminated and the trained eye diagram evaluation model is obtained.

[0163] In an embodiment of the present application, by training the eye diagram evaluation model, the accuracy of the emphasis parameters output by the eye diagram evaluation model can be improved. At the same time, by obtaining the emphasis parameters based on the eye diagram evaluation model, the efficiency of the accuracy of the SATA interface consistency test can be improved.

[0164] In a specific embodiment, Figure 8 As shown, the embodiment of the present application also provides an example of a signal processing method, which specifically includes the following steps:

[0165] S801, connect the test fixture, the host to be tested, the oscilloscope and the working machine to the same local area network to complete the construction of the test environment.

[0166] S802, the test fixture pre-sets the storage depth, sampling rate, time base and math function (function in the oscilloscope) of the oscilloscope, so that the oscilloscope performs analysis and processing according to the pre-set parameters, and completes the connection initialization between the oscilloscope and the host to be tested.

[0167] S803, the test fixture reads the test data from the target address of the host to be tested, and obtains the test data read by the test fixture.

[0168] S804, the test fixture compares the read test data with the default data to obtain the matching situation between the test data and the default data, and determines whether the test fixture is correctly connected to the host to be tested based on the matching situation. If the matching situation is that the test data matches the default data, step S805 is executed; if the matching situation is that the test data does not match the default data, an alarm signal is sent to prompt the tester, and step S803 is executed.

[0169] S805, the test fixture sends a test pattern to the host to be tested.

[0170] S806, judging whether the eye diagram corresponding to the test pattern meets the preset eye diagram condition. If the eye diagram meets the preset eye diagram condition, executing step S808; if the eye diagram does not meet the preset eye diagram condition, executing step S807.

[0171] S807, tuning the test pattern according to the eye diagram evaluation model and the preset adaptive control algorithm, and outputting the current emphasis parameter.

[0172] S808, determining a signal test result according to the eye diagram that meets the eye diagram condition, outputting the eye diagram and the signal test result as a report, and sending it to the working machine.

[0173] In one embodiment, a signal processing system includes:

[0174] The test fixture 101 is used to send a first test pattern to a host to be tested, and instruct an oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope; perform data processing on the first initial eye diagram according to an eye diagram evaluation model to obtain a first emphasis parameter, and instruct the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope; when the second initial eye diagram does not meet a preset eye diagram condition, adjust the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter; construct the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, execute the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope, and determine the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as a target emphasis parameter;

[0175] An oscilloscope 102, used to obtain an initial eye diagram according to a first test pattern and send it to a test fixture;

[0176] The working machine 103 is used to receive the signal test result and the second initial eye diagram that meets the preset eye diagram condition.

[0177] In the embodiment of the present application, the test fixture 101, the oscilloscope 102 and the working machine 103 are arranged in the same local area network. The test fixture 101 is used to calculate and output the target weighting parameters. The calculation process is the same as the method of steps 202 to 204, which will not be repeated here.

[0178] The oscilloscope 102 is used to analyze and process the test pattern according to the afterglow effect to obtain an initial eye diagram. Figure 4As shown, the oscilloscope 102 can display the current initial eye diagram on an LCD (Liquid Crystal Display) display screen, and the tester can adjust the test fixture 101 according to the current initial eye diagram.

[0179] The working machine 103 is used to receive the signal test result and the second initial eye diagram that meets the preset eye diagram condition, and perform visualization processing on the test result and the second initial eye diagram that meets the preset eye diagram condition.

[0180] In an embodiment of the present application, an initial eye diagram is evaluated according to an eye diagram evaluation model to obtain a first emphasis parameter, an oscilloscope is instructed to analyze and process the first emphasis parameter and a first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope, and the first emphasis parameter is adjusted according to a preset adaptive control algorithm to obtain a second emphasis parameter, the second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter, which can avoid the low efficiency of manual debugging of emphasis parameters and reduce misjudgments and missed detections caused by human errors, thereby improving the test efficiency of consistency testing of the host to be tested.

[0181] In one embodiment, the oscilloscope 102 is specifically configured to perform error compensation on the first test pattern according to the cable power loss to obtain the compensated first test pattern, and obtain an initial eye diagram corresponding to the compensated first test pattern according to the afterglow effect.

[0182] In the embodiment of the present application, taking the oscilloscope generating the first initial eye diagram as an example, the oscilloscope 102 performs error calculation for the signal distortion and attenuation caused by the cable itself, obtains an error compensation value, obtains a compensated first test pattern according to the error compensation value, and obtains a first initial eye diagram corresponding to the compensated first test pattern according to the afterglow effect. The error calculation process of the oscilloscope 102 in the process of generating the initial eye diagram based on the test pattern is the same as the error calculation process in the process of generating the first initial eye diagram based on the first test pattern.

[0183] In view of the error calculation for the signal distortion and attenuation caused by the cable itself, the embodiments of the present application provide two methods for calculating the error compensation value.

[0184] Method 1: Use a network analysis device to measure the channel loss of the target transmission channel.

[0185] Method 2: Calculate the channel loss of the target transmission channel according to the loss formula.

[0186] The specific processing process includes the following steps:

[0187] Step 1: Calculate the cable error compensation value according to the cable insertion loss curve and the cable length.

[0188] When the cable lengths are the same, the insertion loss measured by the network division test can be used for de-embedding; when the cable lengths are different, the cable insertion loss can be calculated according to the following formula.

[0189] IL(dB / CM)=(IL(x)-IL(y)) / (yx)

[0190] Among them, IL (dB / CM) is the insertion loss of the cable per centimeter, IL (x) and IL (y) are the frequency point losses at the corresponding frequencies, and x and y are the lengths of the corresponding cables. For example, the test wire diameter is 30AWG, 60CM and 30CM, SATA cables, and the insertion loss curve of the 60CM cable and the insertion loss curve of the 30CM cable are obtained. The insertion loss curve of the 60CM cable at the 3GHZ frequency point is -0.2dB, and the insertion loss curve of the 30CM cable at the 6GHZ frequency point is -0.1dB. Using the above formula, the insertion loss per centimeter of cable = (-0.2 + 0.1) / 30cm = -0.0033dB.

[0191] Step 2: Calculate the line power loss based on the resistivity of the cable, the line length and the line cross-sectional area, and then obtain the line signal loss (also called line loss) based on the line power loss.

[0192] According to the cable voltage value U, the cable power loss P can be calculated L , and calculate the power loss of the cable based on the connector loss P. As shown in the following formula:

[0193] R=S / ρL

[0194] P L =U*U / R

[0195] Where R is the resistance value of the transmission channel, ρ is the resistivity, S is the cable cross-sectional area, L is the cable length, and U is the cable voltage value. 总 , then the signal loss is 10LogP 总 . Cable power loss P 总 The calculation process is shown in the following formula:

[0196] P 总 =P L +P

[0197] In this embodiment, by using the power loss in the cable as the error compensation value and de-embedding the original test pattern in the oscilloscope, the error of the initial eye diagram caused by the signal distortion and attenuation caused by the cable itself can be reduced, thereby improving the accuracy of the SATA interface signal consistency test.

[0198] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0199] Based on the same inventive concept, the embodiment of the present application also provides a signal processing device for implementing the signal processing method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in the one or more signal processing device embodiments provided below can refer to the limitations on the signal processing method above, and will not be repeated here.

[0200] In one embodiment, Fig. 9 As shown, a signal processing device 900 is provided, comprising: a sending module 901, a data processing module 902, an adjustment module 903 and a first determination module 904, wherein:

[0201] The sending module 901 is used to send a first test pattern to the host to be tested, and instruct the oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0202] The data processing module 902 is used to perform data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instruct the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0203] An adjustment module 903, configured to adjust the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter when the second initial eye diagram does not meet the preset eye diagram condition;

[0204] The first determination module 904 is used to construct the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, execute the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code type to obtain a second initial eye diagram fed back by the oscilloscope, and determine the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter.

[0205] In one embodiment, the sending module 901 is specifically used for:

[0206] Read the test data from the target address of the host to be tested, and obtain the matching status between the test data and the default data;

[0207] When the matching condition is that the test data matches the default data, sending a first test pattern to the host to be tested;

[0208] When the matching situation is that the test data does not match the default data, an alarm device chip select signal is sent to issue an alarm.

[0209] In one embodiment, the data processing module 902 is specifically used for:

[0210] Obtaining a second test pattern according to the first emphasis parameter and the first test pattern;

[0211] A second test code pattern is sent to the host to be tested, and the oscilloscope is instructed to analyze and process the second test code pattern to obtain a second initial eye diagram fed back by the oscilloscope.

[0212] In one embodiment, the device further comprises:

[0213] The second determination module is used to obtain a target test pattern according to the target emphasis parameter and the first test pattern, determine a signal test result corresponding to the target test pattern, and send the signal test result and a second initial eye diagram that meets a preset eye diagram condition to a working machine.

[0214] The first preprocessing module is used to preprocess the interface corresponding to each host to be tested based on the preset test duration and test interval of each host to be tested.

[0215] The second preprocessing module is used to set handshake signal parameters for the interface corresponding to each host to be tested;

[0216] Preprocess the interfaces corresponding to different test channels of the test fixture according to the handshake signal parameters;

[0217] The interfaces corresponding to different test channels after preprocessing send handshake signals to each host under test, instructing each host under test to feed back handshake responses to the interfaces of the test channels corresponding to the test fixture in response to the handshake signals.

[0218] A training module, used for obtaining a sample eye diagram and a label corresponding to the sample eye diagram; the label includes an emphasis parameter label;

[0219] Inputting the sample eye diagram and the label corresponding to the sample eye diagram into the eye diagram evaluation model, analyzing and processing the sample eye diagram according to the eye diagram evaluation model, and obtaining the emphasis parameter;

[0220] Based on the emphasis parameter and the emphasis parameter label, a loss value of the eye diagram evaluation model is obtained;

[0221] When the loss value meets the preset loss condition, the training of the eye diagram evaluation model is terminated and the trained eye diagram evaluation model is obtained.

[0222] Each module in the above signal processing device can be implemented in whole or in part by software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0223] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Fig.10 As shown. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a signal processing method is implemented. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covered on the display screen, or a key, trackball or touchpad set on the computer device housing, or an external keyboard, touchpad or mouse, etc.

[0224] Those skilled in the art will understand that Fig.10 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0225] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0226] Sending a first test pattern to the host to be tested, and instructing the oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope;

[0227] Processing the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope;

[0228] When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter;

[0229] The second emphasis parameter and the first emphasis parameter are constructed into a new first emphasis parameter, and the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test code pattern to obtain a second initial eye diagram fed back by the oscilloscope is performed, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as the target emphasis parameter.

[0230] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0231] Read the test data from the target address of the host to be tested, and obtain the matching status between the test data and the default data;

[0232] When the matching condition is that the test data matches the default data, sending a first test pattern to the host to be tested;

[0233] When the matching situation is that the test data does not match the default data, an alarm device chip select signal is sent to issue an alarm.

[0234] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0235] Obtaining a second test pattern according to the first emphasis parameter and the first test pattern;

[0236] A second test code pattern is sent to the host to be tested, and the oscilloscope is instructed to analyze and process the second test code pattern to obtain a second initial eye diagram fed back by the oscilloscope.

[0237] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0238] A target test pattern is obtained according to the target emphasis parameter and the first test pattern, a signal test result corresponding to the target test pattern is determined, and the signal test result and a second initial eye diagram that meets a preset eye diagram condition are sent to a working machine.

[0239] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0240] Based on the preset test duration and test interval of each host to be tested, the interface corresponding to each host to be tested is preprocessed.

[0241] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0242] Set the handshake signal parameters for the interface corresponding to each host to be tested;

[0243] Preprocess the interfaces corresponding to different test channels of the test fixture according to the handshake signal parameters;

[0244] The interfaces corresponding to different test channels after preprocessing send handshake signals to each host under test, instructing each host under test to feed back handshake responses to the interfaces of the test channels corresponding to the test fixture in response to the handshake signals.

[0245] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0246] Obtaining a sample eye diagram and a label corresponding to the sample eye diagram; the label includes an emphasis parameter label;

[0247] Inputting the sample eye diagram and the label corresponding to the sample eye diagram into the eye diagram evaluation model, analyzing and processing the sample eye diagram according to the eye diagram evaluation model, and obtaining the emphasis parameter;

[0248] Based on the emphasis parameter and the emphasis parameter label, a loss value of the eye diagram evaluation model is obtained;

[0249] When the loss value meets the preset loss condition, the training of the eye diagram evaluation model is terminated and the trained eye diagram evaluation model is obtained.

[0250] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0251] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0252] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties.

[0253] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0254] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0255] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A signal processing method, characterized in that: The method is applied to a test fixture, and the method comprises: Sending a first test code pattern to the host to be tested, and instructing an oscilloscope to analyze and process the first test code pattern to obtain a first initial eye diagram fed back by the oscilloscope; Performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope; When the second initial eye diagram does not meet the preset eye diagram condition, the first emphasis parameter is adjusted according to a preset adaptive control algorithm to obtain a second emphasis parameter; the first emphasis parameter includes a pre-emphasis parameter and a de-emphasis parameter; The second emphasis parameter and the first emphasis parameter are constructed as a new first emphasis parameter, the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope is performed, and the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition is determined as a target emphasis parameter; When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter includes: When the second initial eye diagram does not meet the preset eye diagram condition, adjusting the step value and the number of iterations of the first emphasis parameter according to the preset adaptive control algorithm for the bit error probability and the change of the bit error probability, and the noise ratio and jitter of the second initial eye diagram to obtain an adjusted second emphasis parameter; Before performing data processing on the first initial eye diagram according to the eye diagram evaluation model to obtain the first emphasis parameter, the method further includes: Acquire a sample eye diagram and a label corresponding to the sample eye diagram; the label includes an emphasis parameter label; Inputting the sample eye diagram and the label corresponding to the sample eye diagram into an eye diagram evaluation model, analyzing and processing the sample eye diagram according to the eye diagram evaluation model to obtain an emphasis parameter; Based on the emphasis parameter and the emphasis parameter label, obtaining a loss value of the eye diagram evaluation model; When the loss value satisfies a preset loss condition, the training of the eye diagram evaluation model is terminated and a trained eye diagram evaluation model is obtained.

2. The method according to claim 1, characterized in that The sending of the first test pattern to the host to be tested includes: Reading test data from the target address of the host to be tested, and obtaining a match between the test data and the default data; When the matching condition is that the test data matches the default data, sending a first test pattern to the host to be tested; the first test pattern is used to perform a consistency test on the SATA interface in the host to be tested; When the matching condition is that the test data does not match the default data, an alarm device chip selection signal is sent to issue an alarm.

3. The method according to claim 1, characterized in that The step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope includes: Obtaining a second test pattern according to the first emphasis parameter and the first test pattern; The second test code pattern is sent to the host to be tested, and the oscilloscope is instructed to analyze and process the second test code pattern to obtain a second initial eye diagram fed back by the oscilloscope.

4. The method according to claim 1, characterized in that: After determining the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as the target emphasis parameter, the method further includes: A target test pattern is obtained according to the target emphasis parameter and the first test pattern, a signal test result corresponding to the target test pattern is determined, and the signal test result and the second initial eye diagram that meets the preset eye diagram condition are sent to a working machine.

5. The method according to claim 1, characterized in that The test fixture is connected to a plurality of hosts to be tested, and before sending the first test pattern to the hosts to be tested, the method further includes: Based on the preset test duration and test interval of each host to be tested, the interface corresponding to each host to be tested is preprocessed.

6. The method according to claim 1, characterized in that The test fixture is connected to a plurality of hosts to be tested, and before sending the first test pattern to the hosts to be tested, the method further includes: Set the handshake signal parameters for the interface corresponding to each host to be tested; Preprocessing interfaces corresponding to different test channels of the test fixture according to the handshake signal parameters; The interfaces corresponding to the different test channels after preprocessing send handshake signals to the hosts under test, and instruct the hosts under test to feed back handshake responses to the interfaces of the test channels corresponding to the test fixture in response to the handshake signals.

7. A signal processing system, characterized in that: The signal processing system comprises: A test fixture, used for sending a first test pattern to a host to be tested, and instructing an oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope; performing data processing on the first initial eye pattern according to an eye pattern evaluation model to obtain a first emphasis parameter, and instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye pattern fed back by the oscilloscope; in the case where the second initial eye pattern does not meet a preset eye pattern condition, adjusting the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter; the first emphasis parameter includes a pre-emphasis parameter and a de-emphasis parameter; constructing the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, executing the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain the second initial eye pattern fed back by the oscilloscope, and determining the first emphasis parameter corresponding to the second initial eye pattern that meets the preset eye pattern condition as a target emphasis parameter; The test fixture is specifically used to adjust the step value and the number of iterations of the first emphasis parameter according to a preset adaptive control algorithm for the bit error probability and the change of the bit error probability, and the noise ratio and jitter of the second initial eye diagram when the second initial eye diagram does not meet the preset eye diagram condition, so as to obtain the adjusted second emphasis parameter; The oscilloscope is used to obtain an initial eye diagram according to the first test pattern and send the initial eye diagram to the test fixture; A working machine, used for receiving a signal test result and the second initial eye diagram satisfying the preset eye diagram condition; The test fixture is also used to obtain a sample eye diagram and a label corresponding to the sample eye diagram; the label includes an emphasis parameter label; Inputting the sample eye diagram and the label corresponding to the sample eye diagram into an eye diagram evaluation model, analyzing and processing the sample eye diagram according to the eye diagram evaluation model to obtain an emphasis parameter; Based on the emphasis parameter and the emphasis parameter label, obtaining a loss value of the eye diagram evaluation model; When the loss value satisfies a preset loss condition, the training of the eye diagram evaluation model is terminated and a trained eye diagram evaluation model is obtained.

8. The system according to claim 7, characterized in that The oscilloscope is specifically used to perform error compensation on the first test pattern according to the cable power loss to obtain the compensated first test pattern, and to obtain an initial eye diagram corresponding to the compensated first test pattern according to the afterglow effect.

9. A signal processing device, characterized in that: The device comprises: A sending module, used for sending a first test pattern to the host to be tested, and instructing the oscilloscope to analyze and process the first test pattern to obtain a first initial eye diagram fed back by the oscilloscope; A data processing module, configured to perform data processing on the first initial eye diagram according to an eye diagram evaluation model to obtain a first emphasis parameter, and instruct the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope; An adjustment module, configured to adjust the first emphasis parameter according to a preset adaptive control algorithm to obtain a second emphasis parameter when the second initial eye diagram does not meet a preset eye diagram condition; the first emphasis parameter includes a pre-emphasis parameter and a de-emphasis parameter; A first determination module is configured to construct the second emphasis parameter and the first emphasis parameter into a new first emphasis parameter, execute the step of instructing the oscilloscope to analyze and process the first emphasis parameter and the first test pattern to obtain a second initial eye diagram fed back by the oscilloscope, and determine the first emphasis parameter corresponding to the second initial eye diagram that meets the preset eye diagram condition as a target emphasis parameter; The adjustment module is specifically used to adjust the step value and the number of iterations of the first emphasis parameter according to the preset adaptive control algorithm on the bit error probability and the change of the bit error probability, and the noise ratio and jitter of the second initial eye diagram when the second initial eye diagram does not meet the preset eye diagram condition, so as to obtain the adjusted second emphasis parameter; A training module is used to obtain a sample eye diagram and a label corresponding to the sample eye diagram; the label includes a weighted parameter label; the sample eye diagram and the label corresponding to the sample eye diagram are input into an eye diagram evaluation model, and the sample eye diagram is analyzed and processed according to the eye diagram evaluation model to obtain a weighted parameter; based on the weighted parameter and the weighted parameter label, a loss value of the eye diagram evaluation model is obtained; when the loss value meets a preset loss condition, the training of the eye diagram evaluation model is terminated and the trained eye diagram evaluation model is obtained.

10. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

11. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

12. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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