Method for measuring error of low frequency voltage transformer under high voltage by using standard capacitor

Abstract

The application discloses a method for measuring error of low-frequency voltage transformer under high voltage by using standard capacitor, which comprises the following steps: connecting the measured low-frequency voltage transformer and low-frequency standard voltage transformer into a difference loop under preset low voltage to measure low-voltage ratio error and low-voltage phase error; introducing high-voltage standard capacitor and low-voltage standard capacitor under preset high voltage to connect with the measured low-frequency voltage transformer into an equal power loop to measure first capacitor ratio and first dielectric loss and second capacitor ratio and second dielectric loss; measuring high-voltage capacitor voltage coefficient, high-voltage dielectric loss voltage coefficient, low-voltage capacitor voltage coefficient and low-voltage dielectric loss voltage coefficient by using comparison method; measuring low-voltage capacitor ratio measurement error, low-voltage dielectric loss measurement error, high-voltage capacitor ratio measurement error and high-voltage dielectric loss measurement error by using capacitor rotation method; and calculating high-voltage ratio error and high-voltage phase error of the measured low-frequency voltage transformer under preset high voltage according to the above parameters.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of high-voltage electrical equipment, and more particularly, to a method for measuring error of a low-frequency voltage transformer under high voltage by using a standard capacitor. BACKGROUND

[0002] Flexible low-frequency power transmission is a new type of efficient AC power transmission technology that flexibly selects a suitable frequency of 0-50 Hz by means of power electronic technology to improve power grid transmission capacity and flexible regulation capability. It has a relatively significant economic advantage for offshore wind power transmission, new energy power generation collection and transmission, etc. In the early 20th century, Germany built a 16.7 Hz single-phase AC railway traction power supply system in order to reduce the brush spark of series excited motor, which has been used until now. In 1994, Academician Wang Xifan proposed a 50 / 3 Hz frequency division power transmission technology, which realizes grid connection with power frequency grid through frequency multiplication transformer in order to solve the problem of outputting high power and long distance transmission of low-speed hydroelectric generators. In recent years, with the development of offshore wind power technology in China, the transmission of active power is limited due to the large ground capacitance of the submarine cable, and it is necessary to carry out low-frequency power transmission research suitable for long-distance large-capacity power transmission.

[0003] As an important device for low-frequency power transmission voltage and current measurement and power grid protection, the key performance of the low-frequency transformer needs to be verified. The key performance test of the low-frequency transformer includes two categories of insulation test and accuracy test. The insulation test is a general test of low-frequency high-voltage electrical equipment, which only needs to solve the low-frequency power supply, while the accuracy test is an important test unique to the low-frequency transformer and must be carried out.

[0004] The standard voltage transformer is a key device for accuracy test of the transformer. Since the standard voltage transformer needs to be traced to the national benchmark, and the existing national benchmark in China is established at power frequency, it cannot be directly used for low frequency. SUMMARY

[0005] In view of the deficiencies of the prior art, the present application provides a method for measuring error of a low-frequency voltage transformer under high voltage by using a standard capacitor.

[0006] According to one aspect of the present application, there is provided a method for measuring error of a low-frequency voltage transformer under high voltage by using a standard capacitor, comprising:

[0007] connecting the measured low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference loop at a preset low voltage, measuring the low-voltage ratio error and low-voltage phase error of the measured low-frequency voltage transformer under low voltage, and the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

[0008] The high-voltage standard capacitor and the low-voltage standard capacitor are connected into an equal-power loop with the measured low-frequency voltage transformer under preset high voltage, and the first capacitance ratio and the first dielectric loss and the second capacitance ratio and the second dielectric loss of the measured low-frequency voltage transformer under preset low voltage are measured by the high-voltage capacitance bridge;

[0009] The high-voltage capacitance voltage coefficient and the high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and the low-voltage capacitance voltage coefficient and the low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor are measured by the comparison method;

[0010] The low-voltage capacitance ratio measurement error and the low-voltage dielectric loss measurement error of the high-voltage capacitance bridge under preset low voltage and the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error under preset high voltage are measured by the capacitance rotation method;

[0011] According to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error, and the high-voltage capacitance ratio measurement error, the high-voltage ratio error of the measured low-frequency voltage transformer under preset high voltage is calculated;

[0012] According to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error, and the high-voltage dielectric loss measurement error, the high-voltage phase error of the measured low-frequency voltage transformer under preset high voltage is calculated.

[0013] Optionally, the measured low-frequency voltage transformer is connected into a difference value loop with the low-frequency standard voltage transformer, and the low-voltage ratio error and the low-voltage phase error of the measured low-frequency voltage transformer under low voltage are measured, comprising:

[0014] After the 380V AC power supply is connected into a frequency conversion source and connected in parallel with the voltage regulating transformer and the step-up transformer, a frequency-adjustable high voltage can be generated, the high-voltage terminal of the primary winding of the measured low-frequency voltage transformer and the low-frequency standard voltage transformer is connected into the high voltage, and the low-voltage terminal is short-circuited to the ground, wherein the rated primary voltage of the low-frequency standard voltage transformer is U N1 , the rated secondary voltage Ua is 57.7V, the transformation ratio is N1, the rated voltage of the measured low-frequency voltage transformer is U N2 , the rated secondary voltage U b is also 57.7V, the transformation ratio is N2, and U N1 <U N2 ;

[0015] When the low-frequency standard voltage transformer is applied with the same primary voltage as the primary terminal of the measured low-frequency voltage transformer, a multi-disc induction voltage divider is connected in parallel to the secondary winding of the low-frequency standard voltage transformer, and the proportional winding of the multi-disc induction voltage divider is adjusted so that its output voltage is equal to the rated secondary voltage of the measured low-frequency voltage transformer;

[0016] The output winding of the multi-disc induction voltage divider is connected as the U terminal of the parameter voltage input transformer calibrator, the high-voltage terminal of the output winding of the multi-disc induction voltage divider is connected with the high-voltage terminal of the secondary winding of the measured low-frequency voltage transformer, and the low-voltage terminal of the output winding of the multi-disc induction voltage divider is connected with the low-voltage terminal of the secondary winding of the measured low-frequency voltage transformer and is connected to the terminals △U of the transformer calibrator for measuring the difference;

[0017] The low-voltage ratio error and the low-voltage phase error at the preset low voltage are measured by the transformer calibrator.

[0018] Optionally, at the preset high voltage, a high-voltage standard capacitor and a low-voltage standard capacitor are introduced to form an equal-power circuit with the measured low-frequency voltage transformer, and the first capacitance ratio and the first dielectric loss of the measured low-frequency voltage transformer at the preset low voltage and the second capacitance ratio and the second dielectric loss at the preset high voltage are measured by the high-voltage capacitance bridge, comprising:

[0019] The high-voltage terminal of the primary winding of the measured low-frequency voltage transformer is connected with the high-voltage terminal of the high-voltage standard capacitor, and the high-voltage terminal of the secondary winding of the measured low-frequency voltage transformer is connected with the high-voltage terminal of the low-voltage standard capacitor;

[0020] The primary winding of the measured low-frequency voltage transformer is connected with the preset high voltage, the low-voltage terminal of the high-voltage standard capacitor is connected to the measured terminal of the high-voltage capacitance bridge, the low-voltage terminal of the low-voltage standard capacitor is connected to the reference terminal of the high-voltage capacitance bridge, and the low-voltage terminals of the primary and secondary windings of the measured low-frequency voltage transformer and the ground terminal of the high-voltage capacitance bridge are grounded;

[0021] The primary voltage is adjusted to the preset low voltage, and the first capacitance ratio and the first dielectric loss measured by the high-voltage capacitance bridge at this time are recorded;

[0022] The primary voltage is adjusted to the preset high voltage to be measured, and the second capacitance ratio and the second dielectric loss measured by the high-voltage capacitance bridge at this time are recorded.

[0023] Optionally, the high-voltage capacitance voltage coefficient and the high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and the low-voltage capacitance voltage coefficient and the low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor are measured by comparison method, comprising:

[0024] The high voltage electrode of the low voltage standard capacitor or the high voltage standard capacitor and the reference standard capacitor is connected to the high voltage output terminal of the high voltage power supply, and the low voltage measuring terminal is connected to the high voltage capacitor bridge by a shielded cable;

[0025] 10%U N , 20%U N , 30%U N , 40%U N , 50%U N , 60%U N , 70%U N , 80%U N , 90%U N , 100%U N The capacitance ratio and loss factor are measured at the test voltage, wherein U N is the rated voltage of the low voltage standard capacitor or the high voltage standard capacitor;

[0026] At each specified test voltage, the bridge balance is adjusted, the capacitance and dielectric loss are read respectively, and the capacitance voltage coefficient and dielectric loss voltage coefficient at each specified test voltage are calculated;

[0027] The maximum absolute value of the test voltage measurement point is selected as the low voltage capacitance voltage coefficient and low voltage dielectric loss voltage coefficient or high voltage capacitance voltage coefficient and high voltage dielectric loss voltage coefficient.

[0028] Optionally, the low voltage capacitance ratio measurement error and low voltage dielectric loss measurement error of the high voltage capacitor bridge at a preset low voltage, and the high voltage capacitance ratio measurement error and high voltage dielectric loss measurement error at a preset high voltage are measured by using the capacitance rotation method, comprising:

[0029] The high voltage electrodes of two test low voltage standard capacitors with the same capacitance are connected to the high voltage output terminal of the high voltage power supply, and the low voltage measuring terminals are connected to the reference terminal and the measured terminal of the high voltage capacitor bridge by shielded cables respectively;

[0030] At a preset low voltage, one of the test low voltage standard capacitors is used as a reference standard, and the other test low voltage standard capacitor is used as a measured capacitor, and the low voltage capacitance proportional value and low voltage dielectric loss under two circuits are measured;

[0031] According to the low voltage capacitance proportional value and low voltage dielectric loss of the two test low voltage standard capacitors, the low voltage capacitance ratio measurement error and low voltage dielectric loss measurement error of the high voltage capacitor bridge at the preset low voltage are calculated;

[0032] The high-voltage electrodes of two test high-voltage standard capacitors with the same capacitance are respectively connected to the high-voltage output terminals of a high-voltage power supply, and the low-voltage measuring terminals are respectively connected to the reference terminal and the measured terminal of a high-voltage capacitance bridge by shielded cables;

[0033] At a preset high voltage, one of the two test high-voltage standard capacitors is used as a reference standard, and the other is used as a measured capacitor, and the high-voltage capacitance proportional indication and the high-voltage dielectric loss under the two circuits are measured;

[0034] According to the high-voltage capacitance proportional indication and the high-voltage dielectric loss of the two test high-voltage standard capacitors, the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error of the high-voltage capacitance bridge at a preset low voltage are calculated.

[0035] According to another aspect of the present application, a device for measuring the error of a low-frequency voltage transformer at a high voltage by using a standard capacitor is provided, comprising:

[0036] A first measurement module is configured to connect a measured low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference circuit at a preset low voltage, and measure the low-voltage ratio error and the low-voltage phase error of the measured low-frequency voltage transformer at the low voltage, wherein the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

[0037] A second measurement module is configured to introduce a high-voltage standard capacitor and a low-voltage standard capacitor into an equal-power circuit with the measured low-frequency voltage transformer at a preset high voltage, and measure the first capacitance ratio and the first dielectric loss of the measured low-frequency voltage transformer at the preset low voltage and the second capacitance ratio and the second dielectric loss of the measured low-frequency voltage transformer at the preset high voltage by a high-voltage capacitance bridge;

[0038] A third measurement module is configured to measure the high-voltage capacitance voltage coefficient and the high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, and the low-voltage capacitance voltage coefficient and the low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by a comparison method;

[0039] A fourth measurement module is configured to measure the low-voltage capacitance ratio measurement error and the low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset low voltage, and the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset high voltage by a capacitance rotation method;

[0040] A first calculation module is configured to calculate the high-voltage ratio error of the measured low-frequency voltage transformer at the preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error, and the high-voltage capacitance ratio measurement error.

[0041] The second calculation module is configured to calculate a high-voltage phase error of the measured low-frequency voltage transformer under a preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, a high-voltage dielectric loss voltage coefficient, a low-voltage dielectric loss voltage coefficient, a low-voltage dielectric loss measurement error and a high-voltage dielectric loss measurement error.

[0042] According to yet another aspect of the present application, there is provided a computer readable storage medium storing a computer program for performing the method according to any one of the preceding aspects of the present application.

[0043] According to yet another aspect of the present application, there is provided an electronic device comprising a processor, a memory for storing instructions executable by the processor, and the processor configured to read the executable instructions from the memory and execute the instructions to implement the method according to any one of the preceding aspects of the present application.

[0044] Thus, the present application provides a method for measuring the error of a low-frequency voltage transformer under high voltage by using a standard capacitor, which solves the problem of lack of high-voltage level low-frequency standard voltage transformers and enables error measurement of higher level low-frequency voltage transformers. BRIEF DESCRIPTION OF DRAWINGS

[0045] The exemplary embodiments of the present application can be more fully understood with reference to the following drawings:

[0046] Figure 1 is a flowchart of the method for measuring the error of a low-frequency voltage transformer under high voltage by using a standard capacitor according to an exemplary embodiment of the present application;

[0047] Figure 2 is a schematic diagram of a measurement loop for measuring the error of a low-frequency voltage transformer under low voltage according to an exemplary embodiment of the present application;

[0048] Figure 3 is a schematic diagram of a measurement loop for measuring the error of a voltage transformer according to an exemplary embodiment of the present application;

[0049] Figure 4 is a circuit diagram for measuring the power frequency voltage linearity of a high-voltage standard capacitor according to an exemplary embodiment of the present application;

[0050] Figure 5 is a structural schematic diagram of a device for measuring the error of a low-frequency voltage transformer under high voltage by using a standard capacitor according to an exemplary embodiment of the present application;

[0051] Figure 6 is a structure of an electronic device according to an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0052] Hereinafter, example embodiments according to the present application will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, and thus are not to limit the whole embodiments of the present application, and it should be appreciated that the present application covers all the technical solutions which can be obtained by those of ordinary skill in the art based on the embodiments of the present application without making creative efforts.

[0053] It should be noted that the relative arrangement of the components and steps, numerical expressions, and numerical values set forth in the embodiments are not limitations on the scope of the present application unless otherwise specifically indicated.

[0054] Those skilled in the art can understand that the terms "first", "second" and the like in the embodiments of the present application are only used to distinguish different steps, devices or modules and the like, and do not represent any specific technical meaning, nor indicate their logical order.

[0055] It should also be understood that in the embodiments of the present application, "a plurality of" can mean two or more, and "at least one" can mean one, two or more.

[0056] It should also be understood that for any component, data or structure mentioned in the embodiments of the present application, unless specifically limited or given the opposite indication in the context, it can be understood as one or more in general.

[0057] In addition, the term "and / or" in the present application is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B can represent the existence of A alone, the existence of A and B at the same time, and the existence of B alone. In addition, the character " / " in the present application generally represents an "or" relationship between the front and rear associated objects.

[0058] It should also be understood that the description of the embodiments of the present application emphasizes the differences between the embodiments, and the same or similar parts can be referred to each other, and for the sake of brevity, will not be repeated.

[0059] At the same time, it should be understood that in order to facilitate the description, the size of each part shown in the drawings is not drawn according to the actual proportional relationship.

[0060] The following description of at least one example embodiment is merely illustrative in nature and is in no way limiting to the application or its use.

[0061] Techniques, methods, and devices known to those of ordinary skill in the relevant art can not be discussed in detail herein, but should be considered as part of the description of the present application.

[0062] It should be noted that similar reference numbers and letters represent similar items in the following drawings, and thus once an item is defined in one drawing, it need not be discussed further in subsequent drawings.

[0063] Embodiments of the present application can be applied to terminal devices, computer systems, servers, and the like electronic devices, which can operate with many other general-purpose or special-purpose computing system environments or configurations. Examples of well-known terminal devices, computing systems, environments, and / or configurations suitable for use with terminal devices, computer systems, servers, and the like electronic devices include, but are not limited to, personal computer systems, server computer systems, thin clients, thick clients, handheld or laptop devices, microprocessor-based systems, set-top boxes, programmable consumer electronics, network personal computers, minicomputer systems, mainframe computer systems, and distributed cloud computing technology environments that include any of the above systems, and the like.

[0064] Terminal devices, computer systems, servers, and the like electronic devices can be described in the general context of computer system-executable instructions, such as program modules, being executed by a computer system. Generally, program modules can include routines, programs, objects, components, logic, data structures, and the like, which perform particular tasks or implement particular abstract data types. Computer systems / servers can be implemented in a distributed cloud computing environment, where tasks are performed by remote processing devices that are linked through a communications network. In a distributed cloud computing environment, program modules can be located in local or remote computer system storage media including storage devices.

[0065] Exemplary method

[0066] Figure 1 is a flowchart of a method for measuring error of a low-frequency voltage transformer under high voltage using a standard capacitor provided by an exemplary embodiment of the present application. The present embodiment can be applied to electronic devices, such as Figure 1 As shown in FIG. 1, the method 100 for measuring error of a low-frequency voltage transformer under high voltage using a standard capacitor includes the following steps:

[0067] Step 101, at a preset low voltage, connect the measured low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference circuit to measure low-voltage ratio error and low-voltage phase error of the measured low-frequency voltage transformer under the low voltage, and the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer;

[0068] Step 102, at a preset high voltage, introduce a high-voltage standard capacitor and a low-voltage standard capacitor, and connect them with the measured low-frequency voltage transformer into an equal-power circuit, and measure the first capacitance ratio and the first dielectric loss of the measured low-frequency voltage transformer under the preset low voltage and the second capacitance ratio and the second dielectric loss under the preset high voltage through a high-voltage capacitor bridge;

[0069] Step 103, measuring the high-voltage capacitance voltage coefficient and the high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and the low-voltage capacitance voltage coefficient and the low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by using the comparison method;

[0070] Step 104, measuring the low-voltage capacitance ratio measurement error and the low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at a preset low voltage and the high-voltage capacitance ratio measurement error and the high-voltage dielectric loss measurement error at a preset high voltage by using the capacitance rotation method;

[0071] Step 105, calculating the high-voltage ratio error of the measured low-frequency voltage transformer at a preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error and the high-voltage capacitance ratio measurement error;

[0072] Step 106, calculating the high-voltage phase error of the measured low-frequency voltage transformer at a preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error and the high-voltage dielectric loss measurement error.

[0073] Specifically, the standard capacitor is a kind of gas insulated plate capacitor, which has the characteristics of excellent frequency characteristics, and researches have shown that the amount of influence of its capacitance and dielectric loss voltage coefficient by frequency is in the order of 10-6. Under the premise of the existing low-voltage level low-frequency voltage ratio standard, the application proposes a method for measuring the error of high-voltage level low-frequency voltage transformer by using the standard capacitor, which can measure the error of low-frequency voltage transformer in the absence of high-voltage level standard voltage transformer. The specific steps are as follows:

[0074] First step: at a low voltage level, connect the measured low-frequency voltage transformer and the low-frequency standard voltage transformer into a difference circuit to measure the ratio error f0 and the phase error δ0 of the measured low-frequency voltage transformer at a low voltage, as shown in the following formula: Figure 2

[0075] Figure 2 In the middle, connect the 380V AC power supply into a frequency source in parallel with the voltage regulating transformer and the step-up transformer to generate a frequency-adjustable high voltage. Connect the measured PT and the standard PT N primary winding high voltage terminals to the high voltage, and short the low voltage terminals to the ground. The PT N has a rated primary voltage of U N1 , a rated secondary voltage of Ua of 57.7V, a transformation ratio of N1, a PT rated voltage of U N2 , and a rated secondary voltage of U b of 57.7V, a transformation ratio of N2, and U N1 <U​N2 Since PT N and PT have the same secondary voltage, N1 N When the primary terminal of PT is added with the same primary voltage, Ua = U N1 / N1, Ub = U N2 / N2, then U a > U b Therefore, it is necessary to connect a multi-disc induction voltage divider on the secondary winding of PT N and adjust the proportional winding of the multi-disc induction voltage divider so that its output voltage is equal to U b .

[0076] The output winding of the multi-disc induction voltage divider is connected to the U terminal of the transformer calibrator, the high voltage terminal of the output winding of the multi-disc induction voltage divider is connected to the high voltage terminal of the secondary winding of PT, and the low voltage terminal of the output winding of the multi-disc induction voltage divider is connected to the terminals △U of the transformer calibrator.

[0077] At this time, the transformer calibrator will measure the ratio error f0 and phase error δ0 at low voltage U1.

[0078] Second step: at high voltage, introduce high and low voltage standard capacitors, and connect them with the measured voltage transformer to form an equal power circuit, and measure the error of the measured voltage transformer at high voltage through the high voltage capacitor bridge. As shown in Figure 3 .

[0079] Figure 3 In the formula, C1 is a high voltage standard capacitor, C2 is a low voltage standard capacitor, the high voltage terminal of the primary winding of PT is connected to the high voltage terminal of C1, and the high voltage terminal of the secondary winding of PT is connected to the high voltage terminal of C2. Connect the primary winding of PT to low frequency high voltage U, connect the low voltage terminal of C1 to the measured terminal C X of the high voltage capacitor bridge, connect the low voltage terminal of C2 to the reference terminal C N of the high voltage capacitor bridge, and ground the low voltage terminal and the high voltage capacitor bridge ground terminal of the primary and secondary windings of PT. The capacitance of the high voltage capacitor C1, the capacitance of the low voltage capacitor C2, and the transformation ratio N of PT need to meet the following formula:

[0080]

[0081] Adjust the voltage regulator, adjust the primary voltage to the rated primary voltage U1 of PT N , record the capacitance ratio N0 and dielectric loss D0 measured by the high voltage capacitor bridge at this time, then adjust the primary voltage to the high voltage U to be measured, and record the capacitance ratio N and dielectric loss D measured by the high voltage capacitor bridge at this time.

[0082] The error of PT at U is:

[0083]

[0084] δ≈δ0+(D-D0)-ΔD1+ΔD2-(β-β0)

[0085] wherein: is the capacitance voltage coefficient of the high-voltage standard capacitor, is the capacitance voltage coefficient of the low-voltage standard capacitor, ΔD1 is the dielectric loss voltage coefficient of the high-voltage standard capacitor, ΔD2 is the dielectric loss voltage coefficient of the low-voltage standard capacitor, and α and β are the capacitance ratio measurement error and dielectric loss measurement error of the high-voltage capacitance bridge at voltage U, respectively, and α0 and β0 are the capacitance ratio measurement error and dielectric loss measurement error of the high-voltage capacitance bridge at voltage U1, respectively.

[0086] Step 3: Measure the voltage coefficient of the standard capacitor by comparison method, as shown in Figure 4 Cx is the high / low-voltage standard capacitor to be measured.

[0087] The measurement steps are as follows:

[0088] ① Connect the high-voltage electrodes of C x and C N to the high-voltage output terminals of the high-voltage power supply, and connect the low-voltage measurement terminals to the high-voltage capacitance bridge with shielded cables. Assume that the rated voltage of the standard capacitor is U0, and measure the capacitance ratio and loss factor at 10% U N , 20% U N , 30% U N , 40% U N , 50% U N , 60% U N , 70% U N , 80% U N , 90% U N , and 100% U N .

[0089] ② Adjust the bridge balance at each specified test voltage, read the capacitance C and dielectric loss D, respectively, and then calculate the voltage coefficient of the capacitance by formula (1) and the voltage coefficient of the dielectric loss by formula (2).

[0090] For the high-voltage standard capacitor:

[0091]

[0092] ΔD1=D 1x -D 10 (2)

[0093] For the low-voltage standard capacitor:

[0094]

[0095] ΔD2=D 2x -D 20 (4)

[0096] wherein: C 1x , C 2x are the capacitances of the high-voltage standard capacitor and the low-voltage standard capacitor respectively; D 1x and D 2x are the dielectric loss values of the high-voltage standard capacitor and the low-voltage standard capacitor respectively at high voltage; C 10 , C 20 are the capacitances of the low-voltage standard capacitor and the low-voltage standard capacitor respectively; D 10 , D 20 are the dielectric loss values of the high-voltage standard capacitor and the low-voltage standard capacitor respectively at low voltage.

[0097] ③The measurement should be carried out at least 3 times when the voltage rises and falls, and the middle value of the 6 or more measured data selected at each voltage percentage point is taken as the test result, and the maximum absolute value of each measurement point is taken as the voltage coefficient value.

[0098] Fourth step: measure the error of the high-voltage capacitor bridge at each voltage point by using the capacitor rotation method. As shown in Figure 4 , take two low-voltage standard capacitors C A and C B with the same capacitance, and connect them according to the comparison method. At the measured voltage point, take C A and C B as the standard capacitors, measure the capacitance of the other standard capacitor (in which the current flowing through the high-voltage capacitor bridge covers the current range of the high-voltage capacitor bridge in the aforementioned equal-power circuit), and the measured proportional indication values are X A and X B , and the dielectric loss values are D A and D B , then the capacitance ratio measurement error and the dielectric loss measurement error at the voltage point are respectively:

[0099]

[0100]

[0101] When measuring at low voltage by using the capacitor rotation method, the capacitance ratio measurement error and the dielectric loss measurement error of the high-voltage capacitor bridge are α0 and β0 respectively, and when measuring at high voltage by using the capacitor rotation method, the capacitance ratio measurement error and the dielectric loss measurement error of the high-voltage capacitor bridge are α and β respectively.

[0102] Therefore, the application provides a method for measuring the error of a low-frequency voltage transformer under high voltage by using a standard capacitor, which solves the problem of lacking a low-frequency standard voltage transformer of a high voltage level and can realize error measurement of a higher level low-frequency voltage transformer.

[0103] Exemplary apparatus

[0104] Figure 5 Fig. 1 is a structural schematic diagram of a device for measuring the error of a low-frequency voltage transformer under high voltage by using a standard capacitor according to an exemplary embodiment of the application. As shown in Fig. 1, the device 500 comprises: Figure 5

[0105] A first measurement module 510 is configured to connect a measured low-frequency voltage transformer and a low-frequency standard voltage transformer into a difference circuit under a preset low voltage, measure the low-voltage ratio error and low-voltage phase error of the measured low-frequency voltage transformer under the low voltage, and the preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer.

[0106] A second measurement module 520 is configured to introduce a high-voltage standard capacitor and a low-voltage standard capacitor, connect them with the measured low-frequency voltage transformer into an equal-power circuit under a preset high voltage, and measure the first capacitance ratio and first dielectric loss of the measured low-frequency voltage transformer under the preset low voltage and the second capacitance ratio and second dielectric loss under the preset high voltage by a high-voltage capacitor bridge.

[0107] A third measurement module 530 is configured to measure the high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor and the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor by using a comparison method.

[0108] A fourth measurement module 540 is configured to measure the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitor bridge under the preset low voltage and the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error under the preset high voltage by using a capacitance rotation method.

[0109] A first calculation module 550 is configured to calculate the high-voltage ratio error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high-voltage capacitance voltage coefficient, the low-voltage capacitance voltage coefficient, the low-voltage capacitance ratio measurement error, and the high-voltage capacitance ratio measurement error.

[0110] A second calculation module 560 is configured to calculate the high-voltage phase error of the measured low-frequency voltage transformer under the preset high voltage according to the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error, and the high-voltage dielectric loss measurement error.​

[0111] Optionally, the first measuring module 510 comprises:

[0112] The first connecting submodule is configured to connect the 380V alternating current power source to the frequency conversion source, and then connect the voltage regulating transformer and the voltage boosting transformer in parallel, so as to generate a high voltage with adjustable frequency, and then connect the high voltage terminal of the primary winding of the measured low-frequency voltage transformer and the low-frequency standard voltage transformer to the high voltage, and short-circuit the low voltage terminal to the ground, wherein the rated primary voltage of the low-frequency standard voltage transformer is U N1 , the rated secondary voltage Ua is 57.7V, and the transformation ratio is N1, the rated voltage of the measured low-frequency voltage transformer is U N2 , the rated secondary voltage U b is also 57.7V, the transformation ratio is N2, and U N1 <U N2 ;

[0113] The first adjusting submodule is configured to connect the multi-disc induction voltage divider to the secondary winding of the low-frequency standard voltage transformer when the same primary voltage is applied to the primary terminals of the low-frequency standard voltage transformer and the measured low-frequency voltage transformer, and adjust the proportional winding of the multi-disc induction voltage divider, so that the output voltage of the multi-disc induction voltage divider is equal to the rated secondary voltage of the measured low-frequency voltage transformer.

[0114] The output submodule is configured to input the output winding of the multi-disc induction voltage divider as the U terminal of the transformer calibrator, connect the high voltage terminal of the output winding of the multi-disc induction voltage divider to the high voltage terminal of the secondary winding of the measured low-frequency voltage transformer, and connect the low voltage terminal of the output winding of the multi-disc induction voltage divider to the low voltage terminal of the secondary winding of the measured low-frequency voltage transformer to form a difference terminal △U of the transformer calibrator.

[0115] The first measuring submodule is configured to measure the low-voltage ratio error and the low-voltage phase error at the preset low voltage by the transformer calibrator.

[0116] Optionally, the second measuring module 520 comprises:

[0117] The second connecting submodule is configured to connect the high voltage terminal of the primary winding of the measured low-frequency voltage transformer to the high voltage terminal of the high voltage standard capacitor, and connect the high voltage terminal of the secondary winding of the measured low-frequency voltage transformer to the high voltage terminal of the low voltage standard capacitor.

[0118] The third connecting submodule is configured to connect the primary winding of the measured low-frequency voltage transformer to the preset high voltage, connect the low voltage terminal of the high voltage standard capacitor to the measured terminal of the high voltage capacitor bridge, connect the low voltage terminal of the low voltage standard capacitor to the reference terminal of the high voltage capacitor bridge, and ground the low voltage terminals of the primary winding and the secondary winding of the measured low-frequency voltage transformer and the ground terminal of the high voltage capacitor bridge.

[0119] The second adjusting sub-module is used for adjusting the voltage regulator to adjust the primary voltage to a preset low voltage, and recording a first capacitance ratio and a first dielectric loss measured by the high-voltage capacitance bridge at this time;

[0120] The recording sub-module is used for adjusting the primary voltage to a preset high voltage required to be measured, and recording a second capacitance ratio and a second dielectric loss measured by the high-voltage capacitance bridge at this time.

[0121] Optionally, the third measuring module 530 comprises:

[0122] The fourth connecting sub-module is used for connecting the high-voltage electrodes of the low-voltage standard capacitor or the high-voltage standard capacitor and the reference standard capacitor to the high-voltage output terminal of the high-voltage power supply respectively, and connecting the low-voltage measuring terminal to the high-voltage capacitance bridge by the shielded cable respectively;

[0123] The second measuring sub-module is used for measuring the capacitance ratio and the dielectric loss at 10% U N , 20% U N , 30% U N , 40% U N , 50% U N , 60% U N , 70% U N , 80% U N , 90% U N , and 100% U N of the rated voltage of the low-voltage standard capacitor or the high-voltage standard capacitor respectively. N

[0124] The first calculating sub-module is used for adjusting the bridge balance at each specified test voltage, reading the capacitance and the dielectric loss respectively, and calculating the capacitance-voltage coefficient and the dielectric loss-voltage coefficient at each specified test voltage.

[0125] The selecting sub-module is used for selecting the maximum absolute value of the test voltage measurement point as the low-voltage capacitance-voltage coefficient and the low-voltage dielectric loss-voltage coefficient or the high-voltage capacitance-voltage coefficient and the high-voltage dielectric loss-voltage coefficient.

[0126] Optionally, the fourth measuring module 540 comprises:

[0127] The fifth connecting sub-module is used for connecting the high-voltage electrodes of the two test low-voltage standard capacitors with the same capacitance to the high-voltage output terminal of the high-voltage power supply respectively, and connecting the low-voltage measuring terminal to the reference terminal and the measured terminal of the high-voltage capacitance bridge by the shielded cable respectively;

[0128] ​The third measurement sub-module is used for measuring the low-voltage capacitance proportional indication and low-voltage dielectric loss under two circuits at a preset low voltage, with one of the test low-voltage standard capacitors as a reference standard and the other as a measured capacitor.

[0129] The second calculation sub-module is used for calculating the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset low voltage according to the low-voltage capacitance proportional indication and low-voltage dielectric loss of the two test low-voltage standard capacitors.

[0130] The sixth connection sub-module is used for connecting the high-voltage electrodes of the two test high-voltage standard capacitors with the same capacitance to the high-voltage output terminals of the high-voltage power supply respectively, and connecting the low-voltage measurement terminals to the reference terminal and the measured terminal of the high-voltage capacitance bridge respectively by shielded cables.

[0131] The fourth measurement sub-module is used for measuring the high-voltage capacitance proportional indication and high-voltage dielectric loss under two circuits at a preset high voltage, with one of the test high-voltage standard capacitors as a reference standard and the other as a measured capacitor.

[0132] The third calculation sub-module is used for calculating the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error of the high-voltage capacitance bridge at the preset low voltage according to the high-voltage capacitance proportional indication and high-voltage dielectric loss of the two test high-voltage standard capacitors.

[0133] Exemplary electronic device

[0134] Figure 6 The electronic device 60 includes one or more processors 61 and memory 62. Figure 6 The processor 61 can be a central processing unit (CPU) or other form of processing unit that has data processing capability and / or instruction execution capability, and can control other components in the electronic device to perform desired functions.

[0135] The processor 61 can be a central processing unit (CPU) or other form of processing unit that has data processing capability and / or instruction execution capability, and can control other components in the electronic device to perform desired functions.

[0136] The memory 62 can include one or more computer program products that can include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory, for example, can include random access memory (RAM), cache memory, and / or the like. The non-volatile memory, for example, can include read only memory (ROM), hard disk, flash memory, and / or the like. One or more computer program instructions can be stored on the computer-readable storage media, and the processor 61 can run the program instructions to implement the methods of the software programs of the various embodiments of the present application described above and / or other desired functions. In one example, the electronic device can further include an input device 63 and an output device 64, which are interconnected through a bus system and / or other forms of connection mechanisms (not shown).

[0137] In addition, the input device 63 can include, for example, a keyboard, a mouse, and / or the like.

[0138] The output device 64 can output various information to the outside. The output device 64 can include, for example, a display, a speaker, a printer, a communication network and a remote output device connected thereto, and / or the like.

[0139] Of course, in order to simplify, Figure 6 Only some of the components of the electronic device related to the present application are shown in FIG. 6, and components such as a bus, an input / output interface, and the like are omitted. In addition, the electronic device can further include any other appropriate components according to a specific application.

[0140] Exemplary computer program product and computer readable storage medium

[0141] In addition to the methods and devices described above, embodiments of the present application can also be a computer program product including computer program instructions that, when executed by a processor, cause the processor to perform steps of the methods according to various embodiments of the present application described in the above "Exemplary Methods" section of the specification.

[0142] The computer program product can be written in any combination of one or more programming languages, including an object-oriented programming language such as Java, C++, and / or the like, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code can execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device or entirely on the remote cloud device or server.

[0143] In addition, an embodiment of the present application can also be a computer readable storage medium, having stored thereon computer program instructions which, when executed by a processor, cause the processor to carry out the steps described in the above "Exemplary Method" section of this specification of the methods according to various embodiments of the present application.

[0144] The computer readable storage medium can be any combination of one or more computer readable medium(s). The computer readable medium can be a computer readable signal medium or a computer readable storage medium. A computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, or apparatus or device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium include an electrical connection having one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0145] The above describes the basic principles of the present application in conjunction with specific embodiments, but it should be noted that the advantages, benefits, effects and the like mentioned in the present application are only examples and are not limiting, and these advantages, benefits, effects and the like cannot be considered as necessary for each embodiment of the present application. In addition, the above specific details are only for the purpose of example and for the purpose of understanding, and are not limiting, and the above details do not limit the present application to the above specific details.

[0146] Each embodiment in the specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between each embodiment can be understood by mutual reference. For system embodiments, since they basically correspond to method embodiments, the description is relatively simple, and the relevant parts can be understood by referring to the part of the method embodiment.

[0147] The block diagrams of the devices, systems, apparatuses, systems involved in the present application are only illustrative examples and are not intended to require or imply that the connections, arrangements, configurations must be as shown in the block diagrams. As those skilled in the art will recognize, these devices, systems, apparatuses, systems can be connected, arranged, configured in any manner. Words such as "include", "contain", "have" and the like are open-ended words, meaning "including but not limited to", and can be used interchangeably. The words "or" and "and" used herein mean the word "and / or", and can be used interchangeably unless the context clearly indicates otherwise. The word "such as" used herein means the phrase "such as but not limited to", and can be used interchangeably.

[0148] The methods and systems of the present application can be implemented in a number of ways. For example, the methods and systems of the present application can be implemented via software, hardware, firmware, or any combination of software, hardware, and firmware. The above described order of steps for the methods is merely illustrative, and the steps of the methods of the present application are not limited to the order specifically described above unless otherwise specifically stated. Furthermore, in some embodiments, the present application can also be implemented as a program recorded on a recording medium, which includes machine readable instructions for implementing the methods according to the present application. Thus, the present application also covers recording media storing programs for executing the methods according to the present application.

[0149] It is also to be noted that in the systems, apparatuses, and methods of the present application, various components or steps can be split and / or recombined. Such splitting and / or recombining is to be considered as an equivalent of the present application. The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present application. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein can be applied to other aspects without departing from the scope of the present application. Thus, the present application is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0150] The above description has been presented for the purposes of illustration and description. Furthermore, this description is not intended to limit the embodiments of the present application to the forms disclosed herein. Although several example aspects and embodiments have been discussed, those skilled in the art will recognize certain variations, modifications, changes, additions, and sub-combinations thereof.

Claims

1. A method for measuring the high-voltage error of a low-frequency voltage transformer using a standard capacitor, characterized in that, include: Under a preset low voltage, the low-frequency voltage transformer under test is connected to a low-frequency standard voltage transformer to form a differential circuit. The low-voltage ratio error and low-voltage phase error of the low-frequency voltage transformer under test are measured under low voltage. The preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer. Under a preset high voltage, a high voltage standard capacitor and a low voltage standard capacitor are introduced and connected to the low frequency voltage transformer under test to form an equal power circuit. The first capacitance ratio and the first dielectric loss of the low frequency voltage transformer under test under the preset low voltage, as well as the second capacitance ratio and the second dielectric loss under the preset high voltage, are measured by a high voltage capacitor bridge. The high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, as well as the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor, are measured using a comparison method. The low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitor bridge under the preset low voltage and the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error under the preset high voltage are measured using the capacitor rotation method. The high voltage ratio error of the tested low-frequency voltage transformer under the preset high voltage is calculated based on the low voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high voltage capacitor voltage coefficient, the low voltage capacitor voltage coefficient, the low voltage capacitor ratio measurement error, and the high voltage capacitor ratio measurement error. Based on the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error, and the high-voltage dielectric loss measurement error, the high-voltage phase error of the tested low-frequency voltage transformer under the preset high voltage is calculated.

2. The method according to claim 1, characterized in that, Connect the low-frequency voltage transformer under test to a low-frequency standard voltage transformer to form a differential circuit, and measure the low-voltage ratio error and low-voltage phase error of the low-frequency voltage transformer under test at low voltage, including: After connecting a 380V AC power supply to the frequency converter, and then connecting it in parallel with a voltage regulating transformer and a step-up transformer, a high voltage with adjustable frequency can be generated. The high-voltage terminals of the primary windings of the low-frequency voltage transformer under test and the low-frequency standard voltage transformer are connected to the high voltage, while the low-voltage terminals are short-circuited to ground. The rated primary voltage of the low-frequency standard voltage transformer is U. N1 The rated secondary voltage Ua is 57.7V, the transformation ratio is N1, and the rated voltage of the low-frequency voltage transformer under test is U. N2 Rated secondary voltage U b It is also 57.7V, with a turns ratio of N2, U N1 <U N2 ; When the same primary voltage is applied to the primary terminals of the low-frequency standard voltage transformer and the low-frequency voltage transformer under test, a multi-disc inductive voltage divider is connected in parallel to the secondary winding of the low-frequency standard voltage transformer. The proportional winding of the multi-disc inductive voltage divider is adjusted so that its output voltage is equal to the rated secondary voltage of the low-frequency voltage transformer under test. Use the output winding of the multi-disc inductive voltage divider as the U terminal of the parametric voltage input transformer calibrator. Connect the high voltage terminal of the output winding of the multi-disc inductive voltage divider to the high voltage terminal of the secondary winding of the low-frequency voltage transformer under test. Connect the low voltage terminal of the output winding of the multi-disc inductive voltage divider to the low voltage terminal of the secondary winding of the low-frequency voltage transformer under test to the two ends of the differential measurement terminal △U of the transformer calibrator. The transformer calibrator measures the low-voltage ratio error and low-voltage phase error under the preset low voltage.

3. The method according to claim 1, characterized in that, Under a preset high voltage, a high-voltage standard capacitor and a low-voltage standard capacitor are introduced and connected to the tested low-frequency voltage transformer to form an equal-power circuit. The first capacitance ratio and first dielectric loss of the tested low-frequency voltage transformer under the preset low voltage, and the second capacitance ratio and second dielectric loss under the preset high voltage are measured using a high-voltage capacitance bridge. Connect the high-voltage terminal of the primary winding of the low-frequency voltage transformer under test to the high-voltage terminal of the high-voltage standard capacitor, and connect the high-voltage terminal of the secondary winding of the low-frequency voltage transformer under test to the high-voltage terminal of the low-voltage standard capacitor. Connect the primary winding of the low-frequency voltage transformer under test to a low-frequency preset high voltage. Connect the low-voltage terminal of the high-voltage standard capacitor to the test terminal of the high-voltage capacitor bridge. Connect the low-voltage terminal of the low-voltage standard capacitor to the reference terminal of the high-voltage capacitor bridge. Connect the low-voltage terminals of the primary and secondary windings of the low-frequency voltage transformer under test and the grounding terminal of the high-voltage capacitor bridge to ground. Adjust the voltage regulator to adjust the primary voltage to the preset low voltage, and record the first capacitance ratio and the first dielectric loss measured by the high voltage capacitor bridge at this time; Adjust the voltage to the preset high voltage to be measured, and record the second capacitance ratio and the second dielectric loss measured by the high voltage capacitor bridge at this time.

4. The method according to claim 1, characterized in that, The high-voltage capacitance voltage coefficient and high-voltage dielectric loss voltage coefficient of the high-voltage standard capacitor, and the low-voltage capacitance voltage coefficient and low-voltage dielectric loss voltage coefficient of the low-voltage standard capacitor are measured using a comparison method, including: The high-voltage electrodes of the low-voltage standard capacitor or the high-voltage standard capacitor and the reference standard capacitor are respectively connected to the high-voltage output terminal of the high-voltage power supply, and the low-voltage measurement terminals are respectively connected to the high-voltage capacitor bridge with shielded cables. At 10% U N 20% U N 30% U N 40% U N 50% U N 60% U N 70% U N 80% U N 90% U N 100% U N The capacitance ratio and loss factor were measured under the test voltage, where U N The rated voltage of the low-voltage standard capacitor or the high-voltage standard capacitor; Adjust the bridge balance under each specified test voltage, read the capacitance and dielectric loss respectively, and calculate the capacitance voltage coefficient and dielectric loss voltage coefficient under each specified test voltage. The maximum absolute value of a test voltage measurement point is selected as the low-voltage capacitor voltage coefficient and the low-voltage dielectric loss voltage coefficient, or the high-voltage capacitor voltage coefficient and the high-voltage dielectric loss voltage coefficient.

5. The method according to claim 1, characterized in that, The measurement of the low-voltage capacitance ratio and low-voltage dielectric loss of the high-voltage capacitor bridge under a preset low voltage, and the measurement of the high-voltage capacitance ratio and high-voltage dielectric loss under a preset high voltage, using the capacitance rotation method, includes: Connect the high-voltage electrodes of two test low-voltage standard capacitors with the same capacitance to the high-voltage output terminal of the high-voltage power supply, respectively. Connect the low-voltage measurement terminals to the reference terminal and the terminal under test of the high-voltage capacitor bridge with shielded cables. Under the preset low voltage, one of the low-voltage test standard capacitors is used as the reference standard and the other low-voltage test standard capacitor is used as the capacitor under test. The low-voltage capacitance ratio and low-voltage dielectric loss are measured under the two circuits. Based on the low-voltage capacitance ratio and low-voltage dielectric loss of two test low-voltage standard capacitors, calculate the measurement error of the low-voltage capacitance ratio and the measurement error of the low-voltage dielectric loss of the high-voltage capacitor bridge under the preset low voltage. Connect the high-voltage electrodes of two test high-voltage standard capacitors with the same capacitance to the high-voltage output terminal of the high-voltage power supply, and connect the low-voltage measurement terminals to the reference terminal and the terminal under test of the high-voltage capacitor bridge respectively using shielded cables. Under the preset high voltage, one of the high voltage test standard capacitors is used as the reference standard and the other high voltage test standard capacitor is used as the capacitor under test. The high voltage capacitance ratio and high voltage dielectric loss are measured under the two circuits. Based on the high-voltage capacitance ratio and high-voltage dielectric loss of the two high-voltage standard capacitors, the measurement error of the high-voltage capacitance ratio and the measurement error of the high-voltage dielectric loss of the high-voltage capacitor bridge under the preset low voltage are calculated.

6. A device for measuring the high-voltage error of a low-frequency voltage transformer using a standard capacitor, characterized in that, include: The first measurement module is used to connect the low-frequency voltage transformer under test and the low-frequency standard voltage transformer into a differential circuit under a preset low voltage, and measure the low-voltage ratio error and low-voltage phase error of the low-frequency voltage transformer under test under the low voltage. The preset low voltage is the rated primary voltage of the low-frequency standard voltage transformer. The second measurement module is used to introduce a high-voltage standard capacitor and a low-voltage standard capacitor under a preset high voltage, and connect them to the low-frequency voltage transformer under test to form an equal power circuit. The module measures the first capacitance ratio and the first dielectric loss of the low-frequency voltage transformer under test under the preset low voltage, as well as the second capacitance ratio and the second dielectric loss under the preset high voltage, through a high-voltage capacitor bridge. The third measurement module is used to measure the high voltage capacitance voltage coefficient and high voltage dielectric loss voltage coefficient of the high voltage standard capacitor, as well as the low voltage capacitance voltage coefficient and low voltage dielectric loss voltage coefficient of the low voltage standard capacitor using a comparison method. The fourth measurement module is used to measure the low-voltage capacitance ratio measurement error and low-voltage dielectric loss measurement error of the high-voltage capacitor bridge under the preset low voltage, as well as the high-voltage capacitance ratio measurement error and high-voltage dielectric loss measurement error under the preset high voltage, using the capacitor rotation method. The first calculation module is used to calculate the high voltage ratio error of the tested low-frequency voltage transformer under the preset high voltage based on the low voltage ratio error, the first capacitance ratio, the second capacitance ratio, the high voltage capacitor voltage coefficient, the low voltage capacitor voltage coefficient, the low voltage capacitor ratio measurement error, and the high voltage capacitor ratio measurement error. The second calculation module is used to calculate the high-voltage phase error of the tested low-frequency voltage transformer under the preset high voltage based on the low-voltage phase error, the first dielectric loss, the second dielectric loss, the high-voltage dielectric loss voltage coefficient, the low-voltage dielectric loss measurement error, and the high-voltage dielectric loss measurement error.

7. A computer-readable storage medium, characterized in that, The storage medium stores a computer program for performing the method described in any one of claims 1-5.

8. An electronic device, characterized in that, The electronic device includes: processor; Memory used to store the processor's executable instructions; The processor is configured to read the executable instructions from the memory and execute the instructions to implement the method described in any one of claims 1-5.

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