Test apparatus, device, system and test method

Abstract

This application provides a testing apparatus, device, system, and testing method. The testing apparatus includes two connecting components and a test piece. The connecting components include a guide shaft, an adjusting bracket, an adjusting shaft, and an elastic element. The guide shaft includes a fixed section and a guide section fixedly connected. The adjusting shaft includes a first fixed section and a second fixed section fixedly connected. The adjusting bracket is detachably connected to the fixed section, and the test piece is slidably connected to the guide section. The elastic element is sleeved on the guide section and located between the adjusting bracket and the test piece. The adjusting bracket has multiple first adjusting parts, and the first fixed section is detachably connected to any one of the first adjusting parts. The second fixed section is detachably connected to the testing equipment. This allows for fine adjustment of the test piece in the length and / or width directions. When testing two closely spaced RF interfaces on a circuit board, the adjusting shaft can be removed, and after determining the position of the testing apparatus, the adjusting bracket and the testing equipment can be reconnected, improving testing efficiency.

Description

Technical Field

[0001] This application relates to the field of communication device testing, and more particularly to a testing device, equipment, system, and testing method. Background Technology

[0002] In the telecommunications industry, circuit boards typically integrate radio frequency (RF) functionality for use by electronic devices. Because the quality of the RF function directly impacts the overall quality of the electronic device, current circuit boards require RF testing after manufacturing to rigorously control quality and improve product yield. However, current testing equipment has relatively low efficiency. Summary of the Invention

[0003] This application provides testing apparatus, equipment, systems, and testing methods that can improve testing efficiency.

[0004] This application provides a testing apparatus mounted on a testing device for testing circuit boards. The apparatus includes two connecting components and a test piece. The two connecting components are slidably connected to the test piece and are located on opposite sides of the test piece. Each connecting component includes a guide shaft, an adjusting bracket, an adjusting shaft, and an elastic element. The guide shaft includes a fixed section and a guide section fixedly connected. The adjusting shaft includes a first fixed section and a second fixed section fixedly connected. One side of the adjusting bracket is detachably connected to the fixed section. The test piece is slidably connected to the guide section and can slide along the axial direction of the guide shaft. The elastic element is sleeved on the guide section and located between the adjusting bracket and the test piece. When the test piece slides along the guide shaft towards the adjusting bracket, the elastic element is compressed. When the test piece slides along the guide shaft away from the adjusting bracket, the elastic element can reset. The other side of the adjusting bracket has multiple first adjusting portions. A first fixed section is detachably connected to any one of the first adjusting portions, and a second fixed section is detachably connected to the testing device.

[0005] The testing apparatus provided in this embodiment has a first fixed section of the adjusting shaft detachably connected to the adjusting bracket, and a second fixed section of the adjusting shaft detachably connected to the testing equipment, allowing for fine-tuning of the test piece's position in the length and / or width directions. Therefore, when testing two RF interfaces on a circuit board that are close together, it is only necessary to disassemble the adjusting shaft, separating the adjusting bracket from the testing equipment. After determining the position of the testing apparatus, the adjusting shaft can be reconnected to the adjusting bracket and the testing equipment, simplifying operation, increasing convenience, and improving testing efficiency.

[0006] In some embodiments, the test piece includes a test rod, a guide block, and a probe; the test rod is fixedly connected to the guide block and passes through the guide block along the thickness direction of the test piece; the guide block has a guide hole, a guide section is slidably connected in the guide hole, and an elastic element connects the guide block and the adjustment bracket; the test piece can slide along the axial direction of the guide shaft and compress the elastic element; the probe is fixedly connected to one end of the test rod, and the probe and the guide section are located on opposite sides of the guide block.

[0007] The guide slider drives the test rod and probe to slide along the guide shaft, allowing the probe to move toward or away from the circuit board to be tested, so that the probe can be inserted into the RF interface on the circuit board for testing.

[0008] In some embodiments, the guide shaft further includes a limiting section, which is fixedly connected to the end of the guide section away from the fixed section. A limiting ring protrudes radially outward from the peripheral wall of the limiting section, and the end of the limiting ring connected to the guide section forms a limiting wall surface. When the test piece slides along the guide shaft away from the adjusting bracket, the surface of the guide block away from the test bracket can abut against the limiting wall surface. Thus, the limiting wall surface abuts against the second guide surface of the guide block to prevent the test piece from falling off the guide shaft, increasing the structural stability of the testing device.

[0009] In some embodiments, the guide block is symmetrical about the axis of the test rod, and the guide block has two guide holes symmetrical about the axis of the test rod. The guide section of the guide shaft of one connecting component is slidably connected to one of the guide holes, and the guide section of the guide shaft of the other connecting component is slidably connected to the other guide hole.

[0010] The guide shafts of the two connecting components are slidably connected to two symmetrical guide holes, which can increase the stability of the test device sliding up and down, thereby increasing the accuracy of the alignment between the probe of the test device and the RF interface on the circuit board, and increasing the test accuracy.

[0011] In some embodiments, the test rod is a hollow rod-shaped member, with at least a portion of the probe located within the hollow portion of the test rod. The hollow portion of the test rod is used for cable passage, and the portion of the probe extending into the hollow portion of the test rod can connect with the cable, thereby concealing the cable within the test rod and making the test device more compact.

[0012] In some embodiments, each connection component includes two adjustment shafts, each with a first fixed section capable of being detachably connected to any two of a plurality of first adjustment parts. When testing a large number of circuit boards over extended periods, or when the number of circuit boards to be tested is small but the individual RF interface on the board requires testing for a relatively long time, each adjustment bracket is configured with two adjustment shafts, resulting in a total of four adjustment shafts across the two brackets. This increases the stability of the test device connection, reduces the risk of loosening during prolonged use, and thus increases testing efficiency and accuracy.

[0013] In some embodiments, the adjustment bracket includes a main body section and an extension section, which are fixedly connected at an angle. Multiple first adjustment parts are disposed on the main body section, and the extension section is detachably connected to the guide shaft. In other words, the adjustment bracket is essentially L-shaped. Thus, the main body section connects to the testing equipment, and the extension section connects to the test piece, preventing interference between the testing equipment and the test piece. This also makes the testing device more compact, lighter, and smaller in size.

[0014] In some embodiments, the first adjusting part is a first connecting hole provided on the main body section; the first fixing section is located inside the first connecting hole and is detachably connected to the hole wall of the first connecting hole. Setting the first adjusting part as the first connecting hole makes the structure of the first adjusting part simpler, easier to process, and easier to connect with the adjusting shaft, increasing the convenience of assembly and disassembly.

[0015] In some embodiments, the first fixing section and the first connecting hole are detachably connected by threads; the wall of the first connecting hole is provided with internal threads, and the outer wall of the first fixing section is provided with external threads; the first fixing section is located inside the first connecting hole, and the internal thread of the first connecting hole is screwed into the external thread of the adjusting shaft. This threaded connection method offers strong connection stability and is relatively simple to operate.

[0016] In some embodiments, the wall of the first connecting hole is provided with a slot, and the outer wall of the first fixing section is provided with an elastic buckle; the first fixing section is located inside the first connecting hole, and the elastic buckle is engaged in the slot; or, the wall of the first connecting hole is provided with an elastic buckle, the outer wall of the first fixing section is provided with a slot, the first fixing section is located inside the first connecting hole, and the elastic buckle is engaged in the slot. This buckle-slot connection method results in shorter assembly and disassembly times, increasing the speed of adjusting the position of the test piece, thereby saving testing time and increasing testing efficiency.

[0017] In some embodiments, the main body segment includes a first main body surface and a second main body surface, which are disposed opposite to each other; the second main body surface faces the test piece; the first connecting hole is a through hole penetrating through the first and second main body surfaces, or the first connecting hole is a blind hole penetrating through the first main body surface. Both through holes and blind holes are easy to process and have low cost.

[0018] In some embodiments, the thickness of the extension section is less than the thickness of the main body section to form a guide space between the main body section and the extension section; when the test piece slides along the guide axis toward the adjusting bracket, at least a portion of the test piece can be located within the guide space. The guide space is used for the test piece to slide along the guide axis. The guide space not only enables the testing device to perform tests normally, but also increases the structural compactness of the testing device, reduces the volume of the testing device, and reduces the weight of the testing device.

[0019] In some embodiments, a clearance space is provided on the side of the extension segment away from the main body segment, and the clearance space is connected to the guide sliding space; at least a portion of the elastic element and at least a portion of the guide segment are located within the clearance space. The clearance space is used to avoid the guide shaft and the elastic element. The clearance space not only enables the testing device to perform tests normally, but also increases the structural compactness of the testing device, reduces the volume of the testing device, and reduces the weight of the testing device.

[0020] In some embodiments, the extension section is provided with a fixing hole, which is a through hole extending through the extension section along the thickness direction of the adjusting bracket, or a blind hole extending through the surface of the extension section facing the test piece; the first fixing section is located inside the fixing hole and is detachably connected to the hole wall of the fixing hole. The guide shaft is fixed inside the fixing hole, which has a relatively simple structure, is easy to process, and reduces costs.

[0021] A second aspect of this application provides a testing device, comprising: a support frame, a first driving member, a mounting member, a loading member, a second driving member, an image acquisition device, and a testing device, wherein the testing device is any of the testing devices in the first aspect of this application. The first driving member, mounting member, loading member, second driving member, and image acquisition device are all mounted on the support frame; the mounting member is connected to the first driving member, and the first driving member can drive the mounting member to move along the thickness direction of the testing device; the loading member is connected to the second driving member, and the second driving member can drive the loading member to move along the length direction of the testing device, and the loading member is used to load a circuit board to be tested; the image acquisition device is used to acquire an image of the loading member carrying the circuit board to be tested. The testing device is connected to the mounting member, wherein the second fixed section of the adjusting shaft of the testing device is detachably connected to the mounting member, and the side of the loading member carrying the circuit board to be tested faces each other; the mounting member, driven by the first driving member, can drive the testing member to move toward or away from the circuit board to be tested.

[0022] When testing the RF interface of a circuit board, under the drive of the first and second driving components, the probes of the testing device can be accurately inserted into the RF interface of the circuit board, thereby completing the test of the RF interface of the circuit board. Furthermore, in this embodiment, in the testing device of the testing equipment, the first fixed section of the adjusting shaft of the testing device is detachably connected to the adjusting bracket, and the second fixed section of the adjusting shaft is detachably connected to the testing equipment, allowing for fine-tuning of the position of the test piece in the length and / or width directions. Therefore, when it is necessary to test two RF interfaces on a circuit board, and the two RF interfaces are close to each other, it is only necessary to disassemble the adjusting shaft, separating the adjusting bracket from the testing equipment. After determining the position of the testing device, the adjusting shaft can be reconnected to the adjusting bracket and the testing equipment, simplifying the operation, increasing convenience, and improving testing efficiency.

[0023] In some embodiments, the mounting component includes a mounting plate and a first slide bar, the mounting plate being connected to a first drive component, and the first slide bar being detachably connected to the mounting plate; the first slide bar is provided with a plurality of second adjustment portions; the testing device can be detachably connected to any of the second adjustment portions, wherein the second fixed section of the guide shaft can be detachably connected to any of the second adjustment portions.

[0024] In some embodiments, the mounting component further includes a second slide rod and a third slide rod, both of which are fixedly connected to the mounting plate. The second slide rod and the third slide rod are provided with a plurality of third adjustment parts. The first slide rod can be detachably connected to any of the third adjustment parts.

[0025] A third aspect of this application provides a testing system comprising: two testing devices, both of which are testing devices according to any one of the second aspects of this application; the second driving component of both testing devices is a conveyor belt, and the conveyor belts of the two testing devices are integrally formed; the conveyor belts are capable of simultaneously conveying the loading components of the two testing devices.

[0026] It is understandable that multiple testing devices are each equipped with multiple loading units, and a conveyor belt transports these units to their corresponding locations, allowing multiple testing devices to simultaneously test the circuit boards on multiple loading units, thus increasing testing efficiency. It is also understandable that a single loading unit can hold multiple circuit boards to further enhance testing efficiency.

[0027] This application provides a fourth aspect of a testing method, implemented using the testing equipment of any of the second aspects of this application, or the testing system of the third aspect of this application. The testing method includes: controlling an image acquisition device to capture an image of a loading component, the loading component carrying a circuit board to be tested. After acquiring the image, the method identifies the position coordinates of the circuit board in the image and compares these coordinates with pre-stored coordinates. If there is an error between the position coordinates and the pre-stored coordinates, the method controls a second driving component to move the loading component, causing the loading component to move the circuit board to the position corresponding to the pre-stored coordinates. After the loading component moves to the position corresponding to the pre-stored coordinates, the method controls a first driving component to move a mounting component, causing the mounting component to move the testing device until the probes of the testing device are inserted into the RF interface of the circuit board.

[0028] The testing method provided in the fourth aspect of this application automatically captures images using an image acquisition device, automatically moves the mounting component using a first driving component, and automatically moves the loading component using a second driving component. The entire process is automated, improving both testing accuracy and efficiency compared to manual operation. Furthermore, during testing, the elastic component in the testing device buffers the instantaneous force of the probe inserting into the RF interface, thereby reducing the damage rate of the RF interface and increasing the yield. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the embodiments of this application or the background art, the accompanying drawings used in the embodiments of this application or the background art will be described below.

[0030] Figure 1 This is a schematic diagram of the circuit board to be tested.

[0031] Figure 2 This is a schematic diagram of the structure of the test equipment provided in the embodiments of this application.

[0032] Figure 3 yes Figure 2 The diagram shows the structure of the mounting component.

[0033] Figure 4 yes Figure 2 The diagram shows the structure of the carrier module.

[0034] Figure 5 yes Figure 2 The diagram shows the structure of the loading component.

[0035] Figure 6 yes Figure 2 The diagram shows the test device in its first state.

[0036] Figure 7 yes Figure 6 The diagram shows the structure of the guide shaft.

[0037] Figure 8 yes Figure 6 The diagram shows the structure of the adjustment bracket.

[0038] Figure 9 yes Figure 6 The diagram shows the structure of the test piece.

[0039] Figure 10 yes Figure 2 The diagram shows the test device in its second state.

[0040] Figure 11 This is a schematic diagram of the structure of the test system provided in the embodiments of this application. Detailed Implementation

[0041] The embodiments of this application are described below with reference to the accompanying drawings.

[0042] Please see Figure 1 and Figure 2 , Figure 1 This is a schematic diagram of the circuit board to be tested. Figure 2 This is a schematic diagram of the structure of the test equipment provided in the embodiments of this application.

[0043] This application provides a testing device 1000 for testing a circuit board 10 to be tested. The circuit board 10 to be tested has multiple radio frequency interfaces 11, each corresponding to a different frequency band. Commonly used frequency bands generally include B1, B3, B5, B8, B38, B39, B40, B41, n1, n8, n28, n41, n78, n79, etc. In this embodiment, there are eight radio frequency interfaces 11, and the frequency bands corresponding to the eight radio frequency interfaces 11 are any eight of the aforementioned commonly used frequency bands. The testing device 1000 specifically tests one or more of the multiple radio frequency interfaces 11 to determine whether the radio frequency interface 11 is normal. Figure 1 In the diagram, the radio frequency interface 11 marked as 'a' is the radio frequency interface to be tested.

[0044] For ease of description, the length direction of the testing device 1000 is defined as the X-axis, the width direction as the Y-axis, and the thickness direction as the Z-axis. The X-axis, Y-axis, and Z-axis are mutually perpendicular. The testing device 1000 includes a support frame 200, a first drive component 300, a mounting component 400, an image acquisition device 500, a loading component 600, a second drive component (not shown), and a testing device 100. The first drive component 300, the loading component 600, and the image acquisition device 500 are all connected to the support frame 200. The mounting component 400 is connected to the drive end of the first drive component 300, and the testing device 100 is connected to the mounting component 400.

[0045] The support frame 200 supports the first drive component 300, the mounting component 400, the image acquisition device 500, the loading component 600, the second drive component (not shown), and the testing device 100. The first drive component 300 drives the mounting component 400 to move, the mounting component 400 is used to mount the testing device 100, and to move the testing device 100 away from or towards the loading component 600; the image acquisition device 500 acquires the position coordinates of the circuit board 10 to be tested on the loading component 600, the testing device 100 detects whether the frequency band of the circuit board 10 to be tested is normal, and the loading component 600 carries the circuit board 10 to be tested.

[0046] The support frame 200 includes a base plate 210, a support plate 220 and a connecting plate 230. The base plate 210, the support plate 220 and the connecting plate 230 are all rectangular plates. One end of the support plate 220 is connected to one surface of the base plate 210, and one end of the connecting plate 230 is connected to the side of the support plate 220 away from the base plate 210.

[0047] Specifically, the base plate 210 includes a bottom surface 211, a first bottom end surface 212, and a second bottom end surface 213. The first bottom end surface 212 and the second bottom end surface 213 are arranged opposite to each other and both extend parallel to the width direction of the testing equipment 1000. The bottom surface 211 connects the first bottom end surface 212 and the second bottom end surface 213 and is perpendicular to the first bottom end surface 212 and the second bottom end surface 213. The bottom surface 211 is provided with two first guide grooves 214, and the extension direction of the two first guide grooves 214 is parallel to the length direction of the testing equipment 1000. The bottom surface 211 is used to install the support plate 220 and support the loading component 600, and the first guide grooves 214 are used to provide guidance for the movement of the loading component 600.

[0048] The support plate 220 includes a perpendicular support surface 221 and a support end face 222 connected to the support surface 221. The support surface 221 is used to connect and support the connecting plate 230, and the support end face 222 is used to connect the base plate 210. The support surface 221 is provided with two parallel second guide grooves 223 that extend along the height direction of the support plate 220. The second guide grooves 223 are used to provide guidance for the movement of the mounting component 400.

[0049] The connecting plate 230 includes a connecting end face 231, a first connecting surface 232, and a second connecting surface 233, wherein the first connecting surface 232 and the second connecting surface 233 are arranged opposite to each other, and the connecting end face 231 is connected between the first connecting surface 232 and the second connecting surface 233. The connecting plate 230 is provided with a first through hole (not shown) and a second through hole (not shown), both of which penetrate the first connecting surface 232 and the second connecting surface 233. The connecting end face 231 is used to connect the support plate 220, and the first connecting surface 232 is used to connect the first driving member 300 and the image acquisition device 500. The first through hole is used for the driving end of the first driving member 300 to pass through, and the second through hole is used to expose the lens of the image acquisition device 500.

[0050] A support plate 220 is mounted on a base plate 210. The support end face 222 of the support plate 220 is fixedly connected to the bottom surface 211 of the base plate 210, and the base plate 210 is located on one side of the bottom surface 211. The length extension direction of the second guide groove 223 of the support plate 220 is the same as the length extension direction of the first guide groove 214. The connecting end face 231 of the connecting plate 230 is fixedly connected to the side of the support surface 221 of the support plate 220 away from the base plate 210. The second connecting surface 233 of the connecting plate 230 is opposite to the bottom surface 211 of the base plate 210. A portion of the support surface 221 of the support plate 220 is located between the second connecting surface 233 and the bottom surface 211, with a certain distance between them. The second guide groove 223 is located between the support plate 220 and the base plate 210.

[0051] The first driving component 300 is a stepper motor, which includes a first body 310 and a first drive shaft 320 connected to the first body 310. The first body 310 is fixed to the first connecting surface 232 of the connecting plate 230, and the first drive shaft 320 is located on the second connecting surface 233. The first drive shaft 320 is used to connect the mounting component 400. In other embodiments, the first driving component 300 is a cylinder, which includes a cylinder body and a connecting rod. The cylinder body is fixed to the first connecting surface 232 of the support plate 220, and the connecting rod extends through a first through hole between the support plate and the base plate.

[0052] See Figure 2The image acquisition device 500 is a charge-coupled device (CCD) type camera or a complementary metal-oxide-semiconductor (CMOS) camera. The image acquisition device 500 is connected to the first connection surface 232 of the connection plate 230, and the lens of the image acquisition device 500 faces the second via, so that the lens of the image acquisition device 500 is exposed relative to the second via, which facilitates the image acquisition device 500 to acquire the image of the circuit board 10 to be tested.

[0053] See also Figure 2 and Figure 3 , Figure 3 yes Figure 2 The diagram shows the structure of the mounting component.

[0054] Mounting component 400 includes mounting plate 410, first guide rods 420 connected to mounting plate 410, and a support module 430 connected to mounting plate 410. Mounting plate 410 is a cuboid plate, including a first mounting surface 411, a second mounting surface 412, and a guide end face 413. The first mounting surface 411 and the second mounting surface 412 are arranged opposite to each other, and the guide end face 413 connects between the first mounting surface 411 and the second mounting surface 412. Mounting plate 410 has a through hole (not shown) that passes through the first mounting surface 411 and the second mounting surface 412. The second mounting surface 412 is used to connect the testing device 100, and the through hole is used for the cables of the testing device 100 to pass through. The guide end face 413 faces the support surface 221 of the support plate 220. There are two first guide rods 420, which are fixedly connected to the guide end face 413 and protrude away from the guide end face 413.

[0055] Mounting component 400 is located between connecting plate 230 and base plate 210. The first mounting surface 411 of mounting plate 410 is fixedly connected to the end of the first drive shaft 320 of stepper motor away from the first body 310. The first mounting surface 411 of mounting plate 410 faces the second connecting surface 233 of connecting plate 230. Specifically, the first mounting surface 411 of mounting plate 410 is fixedly connected to the end of the first drive shaft 320 of stepper motor away from the first body 310. The second mounting surface 412 faces the bottom surface 211 of base plate 210. The other ends of the two first guide rods 420 are respectively connected to the two first guide grooves 214 and can slide within the two first guide grooves 214, that is, slide between base plate 210 and connecting plate 230.

[0056] See Figure 4 , Figure 4 yes Figure 2 The diagram shows the structure of the carrier module.

[0057] The support module 430 includes a support plate 431, a first slide rod 434, a second slide rod 432, and a third slide rod 433. The support plate 431 is a cuboid plate with a first support surface (not shown) and a second support surface 435 arranged opposite to each other. The first support surface of the support plate 431 is used to connect with the second mounting surface 412 of the mounting plate 410, and the second support surface 435 is used to support the second slide rod 432, the third slide rod 433, the first slide rod 434, and the testing device 100. The second slide rod 432 and the third slide rod 433 are both fixedly connected to the second support surface 435 of the support plate 431. The second slide rod 432 and the third slide rod 433 are both arranged parallel to the width direction of the testing device 1000 and are located on the edges of the second support surface 435 respectively. The first slide rod 434 is arranged parallel to the length direction of the testing equipment 1000, that is, the first slide rod 434 is perpendicular to the second slide rod 432 and the third slide rod 433, and both ends of the first slide rod 434 are detachably connected to the second slide rod 432 and the third slide rod 433, respectively. Specifically, both ends of the first slide rod 434 are connected to the second slide rod 432 and the third slide rod 433 by threaded connection. The second slide rod 432 has a plurality of first fixing holes 436 spaced apart along its length direction, the third slide rod 433 has a plurality of second fixing holes 437 spaced apart along its length direction, and each end of the first slide rod 434 has a third fixing hole (not shown in the figure). The first fixing holes 436 and the third fixing holes are the third adjustment part.

[0058] In other embodiments, the second slide rod 432 and the third slide rod 433 are not provided, and the first slide rod 434 is directly and detachably connected to the second bearing surface 435 of the mounting plate 410. In other embodiments, the first slide rod 434 is detachably connected to the second slide rod 432 and the third slide rod 433 respectively through elastic buckles and slots; specifically, elastic buckles are provided at both ends of the first slide rod 434, the second slide rod 432 is provided with a plurality of first slots at intervals along its length, and the third slide rod 433 is provided with a plurality of second slots at intervals along its length. The elastic buckle at one end of the first slide rod 434 can be engaged in any of the first slots, and the elastic buckle at the other end of the first slide rod 434 can be engaged in any of the second slots. In other embodiments, the first slide bar 434 is inclined relative to the length direction of the testing device 1000, that is, the first slide bar 434 is inclined to the second slide bar 432 and the third slide bar 433. In this case, the adjustable position of the first slide bar 434 increases, thereby improving the applicability of the entire testing device 1000.

[0059] See also Figure 2 , Figure 3 and Figure 4The support module 430 is connected to the mounting plate 410. Specifically, the support plate 431 faces the second mounting surface 412 of the mounting plate 410, and the first support surface of the support plate 431 is connected to the second mounting surface 412 of the mounting plate 410. The second support surface 435 of the support plate 431 faces the bottom surface 211 of the base plate 210. The first slide rod 434, the second slide rod 432, and the third slide rod 433 are connected to the second support surface 435, and all three slide rods are opposite to the bottom surface 211 of the base plate 210.

[0060] See Figure 3 The number of carrier modules 430 is multiple, and the multiple carrier modules 430 are evenly arranged on the second mounting surface 412 of the mounting plate 410. In this embodiment, there are eight carrier modules 430, which are arranged in two rows and four columns on the second mounting surface 412 of the mounting plate 410. The carrier modules 430 are used to carry the test devices 100, and each carrier module 430 carries one test device 100. One test device 100 can test one circuit board 10 to be tested. By setting multiple carrier modules 430 to carry multiple test devices 100, multiple circuit boards 10 to be tested can be tested at the same time, which improves the testing efficiency.

[0061] Figure 5 yes Figure 2 The diagram shows the structure of the loading component.

[0062] The loading component 600 is a frame-shaped structure with an opening on one side. It has a receiving chamber communicating with the opening, the bottom wall of which faces the opening. The receiving chamber is used to accommodate the circuit board 10 to be tested. Two second guide rods (not shown) are provided on the bottom of the loading component 600 away from its opening. See also... Figure 2 The loading component 600 is placed on the bottom surface 211 of the base plate 210. Two second guide rods are respectively located within two second guide grooves 223, and the two second guide rods can slide within the two second guide grooves 223. In other embodiments, the loading component 600 is a plate, with one surface of the plate used to support the circuit board 10 to be tested. Multiple circuit boards 10 to be tested can be mounted on the loading component 600. In this embodiment, the loading component 600 mounts eight circuit boards 10 to be tested. Each of the eight circuit boards 10 corresponds one-to-one with one of the eight support modules 430. The testing device 100 on each support module 430 detects one circuit board 10 to be tested, thereby improving testing efficiency.

[0063] See Figure 2The second driving component is a stepper motor, which includes a second body and a second drive shaft connected to the body. The second body is fixed to the first bottom end face 212 or the second bottom end face 213 of the base plate 210, and the second drive shaft is connected to the loading component 600. In other embodiments, the second driving component is a cylinder, which includes a cylinder body and a connecting rod. The cylinder body is fixed to the first bottom end face 212 or the second bottom end face 213 of the base plate 210, and the connecting rod is connected to the loading component 600. The second driving component can drive the loading component 600 to move, so that the loading component 600 is located below the image acquisition device 500 and the mounting component 400, so as to facilitate the detection of the circuit board 10 housed in the loading component 600. During the movement of the loading component 600, the second guide rod slides along the second guide groove 223, which can increase the ease of movement of the loading component 600.

[0064] See Figure 6 , Figure 6 yes Figure 2 The diagram shows the test device in its first state.

[0065] The testing device 100 includes two connecting assemblies and a test piece 140. The two connecting assemblies are slidably connected to the test piece 140 and are located on opposite sides of the test piece 140. Each connecting assembly includes a guide shaft 110, an adjusting bracket 120, an adjusting shaft 130, and an elastic element 150. The adjusting bracket 120 is fixedly connected to the guide shaft 110. The test piece 140 is slidably connected to the guide shaft 110 and is movable along the axial direction of the guide shaft 110. The elastic element 150 is sleeved on the guide shaft 110, and its two ends abut against the adjusting bracket 120 and the test piece 140, respectively. When the test piece 140 slides along the guide shaft 110 toward the adjusting bracket 120, the elastic element 150 is compressed; when the test piece 140 slides along the guide shaft 110 away from the adjusting bracket 120, the elastic element 150 gradually returns to its original position. (See also...) Figure 4 The testing device 100 is connected to the first slide bar 434 via the adjusting shaft 130 and is detachably connected to the first slide bar 434 so that the position of the testing device 100 on the first slide bar 434 can be adjusted.

[0066] Figure 7 yes Figure 6 The diagram shows the structure of the guide shaft. In this embodiment, the guide shaft 110 is cylindrical and includes a fastening section 111, a guiding section 112, and a limiting section 113. The fastening section 111, the guiding section 112, and the limiting section 113 are connected sequentially along the axial direction of the cylinder. A limiting ring 114 protrudes radially outward from the peripheral wall of the limiting section 113. One end of the limiting ring 114, which connects to the guiding section 112, forms a limiting wall surface 115. The limiting wall surface 115 is used to limit the movement limit position of the test piece 140. See also... Figure 6The fastening section 111 is connected to the adjusting bracket 120, the guide section 112 is connected to the test piece 140, and the elastic element 150. In other embodiments, the guide shaft 110 is a square prism, an elliptical prism, or a triangular prism, etc.

[0067] See Figure 8 , Figure 8 yes Figure 6 The diagram shows the structure of the adjustment bracket. The adjustment bracket 120 has multiple first adjustment parts; the adjustment shaft 130 can be detachably connected to any of the first adjustment parts. The adjustment bracket 120 includes a main body segment 121 and an extension segment 122 fixedly connected to the main body segment 121 at an angle (the adjustment bracket 120 is basically L-shaped). Specifically, the main body segment 121 is columnar, and its cross-section along the height direction perpendicular to the test piece 140 is oblong. The main body segment 121 includes a first main surface 123, a second main surface 124, and a main peripheral surface 125. The first main surface 123 and the second main surface 124 are arranged opposite to each other, and the main peripheral surface 125 connects between the first main surface 123 and the second main surface 124.

[0068] The main body segment 121 is provided with a plurality of first adjustment parts, which are distributed at intervals along the length direction of the main body segment 121, which is the direction of the major axis extension of the aforementioned oblong cross section. In this embodiment, the first adjustment part is a first connecting hole 129 provided on the main body segment 121, which penetrates the first main body surface 123 and the second main body surface 124.

[0069] The extension segment 122 is an L-shaped block that protrudes outward along the peripheral surface 125 of the main body segment 121. It includes a first extension surface 126, a second extension surface 127, and an extension peripheral surface 128. The first extension surface 126 and the second extension surface 127 are positioned opposite to each other, and the extension peripheral surface 128 connects the first extension surface 126 and the second extension surface 127. The second extension surface 127 is L-shaped.

[0070] The extension segment 122 includes a body 1221 and a sub-extension segment 1222. The body 1221 is connected to the peripheral surface 125 of the main body segment 121. The sub-extension segment 1222 is an L-shaped block, extending from one end of the body 1221 away from the body 1221. The first extension surface 126 is formed by the same faces of the body 1221 and the sub-extension segment 1222. The second extension surface 127 is formed by connecting the other face of the body, the side face 1270 (the side face 1270 connects the face of the body opposite to the first extension surface 126), and the other face of the sub-extension segment 1222, thus making the second extension surface 127 L-shaped. There is a clearance space 120a between the sub-extension segment 1222 and the side face 1270. A fixing hole 120b penetrates the surface of the sub-extension segment 1222 that forms the first extension surface 126 and the second extension surface 127, and the fixing hole 120b communicates with the clearance space 120a for engagement with the guide shaft 110.

[0071] See also Figure 6 When the extension 122 of the adjusting bracket 120 is connected to the guide shaft 110, the fixing hole 120b engages with the fastening section 111 of the guide shaft 110. Specifically, the fastening section 111 of the guide shaft 110 and the fixing hole 120b of the extension 122 are threaded together; wherein, the fastening section 111 of the guide shaft 110 has external threads, the hole wall of the fixing hole 120b has internal threads, the fastening section 111 of the guide shaft 110 is located inside the fixing hole 120b of the extension 122, and the internal threads are threaded together with the external threads. In other embodiments, the fastening section 111 of the guide shaft 110 and the hole wall of the fixing hole 120b of the extension 122 are interference-fitted. In other embodiments, the fixing hole 120b is a blind hole that only penetrates the surface of the sub-extension 1222 that forms the second extension surface 127; that is, the fixing hole 120b is recessed into the surface of the sub-extension 1222 that forms the second extension surface 127 and is recessed into the first extension surface 126; the connection between the hole wall of the blind hole and the fastening section 111 of the guide shaft 110 is a threaded connection or an interference fit, which will not be described in detail.

[0072] Continue reading Figure 8The thickness of the main body segment 121 is greater than the thickness of the extension segment 122. Specifically, the first main body surface 123 and the first extension surface 126 are flush and connected, and there is a height difference between the second main body surface 124 and the second extension surface 127. At this time, the thickness space corresponding to the portion of the main body segment 121 that is thicker than the extension segment 122 forms a guide sliding space 120c, and a portion of the main body peripheral surface 125 forms the peripheral wall surface of the guide sliding space 120c, while the second extension surface 127 forms the bottom wall surface of the guide sliding space 120c. The guide sliding space 120c is connected to and adjacent to the clearance space 120a. The guide sliding space 120c is used for the test piece 140 to slide along the guide shaft 110, and the clearance space 120a is used to avoid the guide shaft 110 and the elastic element. The design of the guide space 120c and the clearance space 120a ensures that the test piece 140 can move smoothly and be accurately inserted into the RF interface 11 of the circuit board 10, while also making the adjustment bracket 120 compact, lightweight, and small in size.

[0073] Continue reading Figure 6 The adjusting shaft 130 is cylindrical and includes a first fixed section 131 and a second fixed section 132 connected in sequence. The first fixed section 131 is detachably connected to the first adjusting part of the adjusting bracket 120, and the second fixed section 132 is detachably connected to the first sliding rod 434 to achieve a detachable connection between the testing device 100 and the first sliding rod 434. In other embodiments, the guide shaft 110 is a square prism, an elliptical prism, or a triangular prism, etc. The number of adjusting shafts 130 can be one or two. When the number of circuit boards to be tested is small and the testing can be completed in a short time, one adjusting shaft 130 can be fixed to one first adjusting part. When the number of circuit boards to be tested is large and the testing takes a long time, two adjusting shafts 130 are set to be fixed to two first adjusting parts respectively, thereby increasing the stability of the connection of the testing device 100.

[0074] The first fixed section 131 of the adjusting shaft 130 is threadedly connected to the first connecting hole 129 on the main body section 121. Specifically, the outer wall of the first fixed section 131 is provided with external threads, and the hole wall of the first connecting hole 129 is provided with internal threads. The adjusting shaft 130 and the main body section 121 are detachably connected through the screwing of the internal and external threads. In other embodiments, the first fixed section 131 and the hole wall of the first connecting hole 129 are connected by a snap-fit ​​and slot engagement. Specifically, the outer wall of the first fixed section 131 is provided with an elastic snap, and the hole wall of the first connecting hole 129 is provided with a slot. When the adjusting shaft 130 is inserted into the first connecting hole 129, it is located in the slot by the elastic snap and abuts against the slot wall, thereby achieving a detachable connection between the adjusting shaft 130 and the main body section 121.

[0075] In other embodiments, the first connecting hole 129 is a blind hole provided on the main body section 121, and the blind hole penetrates the first main body surface 123; the adjusting shaft 130 is connected to the wall of the blind hole by a threaded connection or a snap-fit ​​and slotted engagement method, which is the same as in the above embodiments and will not be described again. In other embodiments, the first adjusting part is a first column connected to the first main body surface 123 of the main body section 121, the first fixing section 131 of the adjusting shaft 130 is provided with an inner hole, the wall of the inner hole is provided with an internal thread, the outer wall of the first column is provided with an external thread, and the external thread of the first column and the internal thread of the inner hole are threaded together to realize the detachable connection between the adjusting shaft 130 and the main body section 121.

[0076] See also Figure 4 and Figure 6 The second fixed section 132 of the adjusting shaft 130 is detachably connected to the first slide rod 434. The first slide rod 434 has a plurality of second adjusting portions spaced apart along its length. In this embodiment, the second adjusting portion is a second connecting hole 438 on the first slide rod 434, which radially penetrates the first slide rod 434. The second fixed section 132 of the adjusting shaft 130 is threadedly connected to the second connecting hole 438 on the first slide rod 434. Specifically, the outer wall of the second fixed section 132 has external threads, and the wall of the second connecting hole 438 has internal threads. The detachable connection between the adjusting shaft 130 and the first slide rod 434 is achieved through the screwing of the internal and external threads. In other embodiments, the second fixing section 132 is connected to the wall of the second connecting hole 438 by a snap-fit ​​and slot engagement. Specifically, the outer wall of the second fixing section 132 is provided with an elastic snap, and the wall of the second connecting hole 438 is provided with a slot. When the adjusting shaft 130 is inserted into the second connecting hole 438, it is located in the slot by the elastic snap and abuts against the slot wall, thereby realizing the detachable connection between the adjusting shaft 130 and the first slide rod 434.

[0077] In other embodiments, the second connecting hole 438 is a blind hole provided on the first slide rod 434, penetrating the side of the first slide rod 434 away from the second bearing surface 435; the adjusting shaft 130 is connected to the wall of the blind hole by a threaded connection or a snap-fit ​​and slotted engagement method, the threaded connection or snap-fit ​​and slotted engagement method is the same as in the above embodiments, and will not be described again. In other embodiments, the second adjusting part is a second column connected to the side of the first slide rod 434 away from the second bearing surface 435, the second fixed section 132 of the adjusting shaft 130 is provided with an inner hole, the wall of the inner hole is provided with an internal thread, the outer wall of the second column is provided with an external thread, and the external thread of the second column and the internal thread of the inner hole are threaded together to realize the detachable connection between the adjusting shaft 130 and the first slide rod 434.

[0078] See Figure 9 , Figure 9 yes Figure 6The diagram shows the structure of the test piece. The test piece 140 includes a test rod 141, a guide slider 142, and a probe 143. The test rod 141 is a hollow rod-shaped member, and the hollow portion of the test rod 141 forms a receiving chamber for accommodating cables. The guide slider 142 is fixedly connected to the test rod 141. Specifically, the guide slider 142 includes a first guide surface 144 and a second guide surface 145 arranged opposite to each other. The test rod 141 is mounted on the guide slider 142 and passes through the first guide surface 144 and the second guide surface 145. The guide slider 142 is provided with a guide hole 146, which passes through the first guide surface 144 and the second guide surface 145. In this embodiment, the guide slider 142 has a shape symmetrical with respect to the axis of the test rod 141, and the guide slider 142 is provided with two guide holes 146, which are symmetrical with respect to the axis of the test rod 141. The probe 143 is fixedly connected to one end of the test rod 141 and is at least partially located inside the receiving chamber so that the cable inside the receiving chamber can be connected to the probe 143. The other part of the probe 143 is located outside the receiving chamber for insertion onto the circuit board 10.

[0079] See also Figure 6 Correspondingly, each of the two connecting components corresponds to one of the two guide holes 146. Specifically, one guide hole 146 connects the guide shaft 110 of one connecting component to the adjusting bracket 120. The other guide hole 146 connects the guide shaft 110 of the other connecting component to the adjusting bracket 120. The two connecting components thus have a total of two guide shafts 110. These two guide shafts 110 restrict the axial rotation of the test piece 140 around the guide shaft 110, increasing the stability of the test piece 140's sliding and thereby increasing the accuracy of the test.

[0080] The elastic element 150 is a spring, which is sleeved on the guide section 112 and is at least partially located within the clearance space 120a. Its two ends abut against the side surface 1270 of the guide slider 142 and the sub-extension section 1222, respectively. In other embodiments, the elastic element 150 is an elastic rubber sleeve or the like.

[0081] In this embodiment, please continue to refer to Figure 6The adjusting bracket 120, the guide slider 142, and the probe 143 are sequentially distributed along the thickness direction of the testing device 100, and the adjusting bracket 120 and the guide slider 142 are connected by a guide shaft 110. The fastening section 111, the guiding section 112, and the limiting section 113 of the guide shaft 110 are sequentially distributed along the thickness direction of the testing device 100. The fastening section 111 is located in the fixing hole 120b of the extension section 122 of the adjusting bracket 120 and is fixedly connected to the hole wall of the fixing hole 120b. Part of the guiding section 112 is located between the side surface 1270 of the sub-extension section 1222 and the first guide surface 144 of the guide slider 142, and the other part is located in the guide hole 146 of the guide slider 142. The limiting section 113 is located outside the guide hole 146. The limiting section 113 and the probe 143 are located on the same side of the guide slider 142. That is, the adjusting bracket 120 is located on one side of the guide slider 142, and the limiting section 113 of the probe 143 and the guide shaft 110 is located on the other side of the guide slider 142.

[0082] When the test piece 140 is not in contact with the circuit board 10 to be tested, the test device 100 is in a state of... Figure 6 In the first state shown, there is a gap between the first guide surface 144 and the second extension surface 127 of the guide slider 142, the elastic member 150 is in the natural state, and the limiting wall 115 abuts against the second guide surface 145 of the guide slider 142 to prevent the test piece 140 from falling off the guide shaft 110.

[0083] When the test piece 140 contacts the circuit board 10 to be tested, refer to Figure 10 , Figure 10 yes Figure 2 The diagram shows the test apparatus in its second state. Test apparatus 100 is in... Figure 10 In the second state shown, the test piece 140 moves upward along the guide shaft 110, the elastic element 150 is compressed, and the second guide surface 145 of the guide slider 142 gradually moves away from the limiting wall 115. When the test piece 140 moves to the first guide surface 144 and the second extension surface 127 of the guide slider 142, the test piece 140 moves to the upper limit position, at which point the probe 143 is inserted into the RF interface 11 of the circuit board 10 to be tested. At the instant the probe 143 is inserted into the RF interface 11 of the circuit board 10 to be tested, the elastic element 150 can alleviate the force of the probe 143 on the RF interface 11 of the circuit board 10, thereby reducing or avoiding the risk of the probe 143 damaging the circuit board 10. In addition, the elastic element 150 can also correct the small displacement phenomenon of the probe 143 during the insertion process, and can adjust the position of the probe 143, reducing or avoiding the phenomenon that the probe 143 cannot be inserted into the RF interface 11 of the circuit board 10.

[0084] The specific process of testing circuit board 10 using the testing equipment 1000 provided in this embodiment is as follows:

[0085] Before starting the test equipment 1000, move the loading component 600 to a position below the image acquisition device 500 and the first driving component 300, and place the circuit board 10 to be tested on the loading component 600. Then, adjust the positions of the first slide bar 434, the test device 100, and the adjustment shaft 130. The positions of the first slide bar 434, the test device 100, and the adjustment shaft 130 are adjusted according to the position of the RF interface 11 on the circuit board 10.

[0086] See Figure 1 The circuit board 10 has eight RF interfaces 11. Taking RF interface 11(a) as an example, which needs to be tested, please refer to [reference needed]. Figure 4 The staff determines that the first sliding rod 434 is engaged with the first fixing hole 436 (M1) and the second fixing hole 437 (N1). If the first sliding rod 434 is already engaged with the first fixing hole 436 (M1) and the second fixing hole 437 (N1), no adjustment is needed. If not, the first sliding rod 434 is removed from other positions and then installed at the first fixing hole 436 (M1) and the second fixing hole 437 (N1). Specifically, the bolts fixing the first slide rod 434 and the second slide rod 432 are removed, and the bolts fixing the first slide rod 434 and the third slide rod 433 are also removed. Then, one end of the first slide rod 434 is aligned with the first fixing hole 436 (M1), and the other end of the first slide rod 434 is aligned with the second fixing hole 437 (N1). Then, the bolts are tightened into the first fixing hole 436 (M1) and the third fixing hole corresponding to the first fixing hole 436 (M1), and another bolt is tightened into the second fixing hole 437 (N1) and the third fixing hole corresponding to the second fixing hole 437 (N1).

[0087] Because the first fixed section 131 of the adjusting shaft 130 is connected to the adjusting bracket 120, and the second fixed section 132 of the adjusting shaft 130 is connected to the first slide rod 434, the positions of the testing device 100 and the adjusting shaft 130 can be adjusted simultaneously. (See also...) Figure 4 The staff determined that the testing device 100 needed to be connected to the second connecting hole 438 (L1) of the first slide bar 434. (See reference...) Figure 6The adjusting shaft 130 needs to be connected to the first connecting hole 129 (P1). If the testing device 100 is already connected to the second connecting hole 438 (L1) and the adjusting shaft 130 is connected to the first connecting hole 129 (P1), no adjustment is needed; otherwise, the testing device 100 can be removed from the first slide rod 434 and reconnected. Specifically, the adjusting shaft 130 fixing the testing device 100 is removed from the adjusting bracket 120 and the first slide rod 434. Then, the first connecting hole 129 (P1) of the adjusting bracket 120 is aligned with the second connecting hole 438 (L1) of the first slide rod 434. Finally, the adjusting shaft 130 is tightened into the first connecting hole 129 (P1) and the second connecting hole 438 (L1).

[0088] When testing a large number of circuit boards over a long period of time, or when the number of circuit boards to be tested is small, but the loss time of a single RF interface on the circuit board to be tested is relatively long, each adjustment bracket 120 is equipped with two adjustment axes 130, that is, the two adjustment brackets 120 are equipped with a total of four adjustment axes 130, thereby increasing the stability of the connection of the test device 100. The adjustment method of each adjustment axis 130 is described above.

[0089] In this embodiment, the first fixed section 131 of the adjusting shaft 130 is detachably connected to the adjusting bracket 120, and the second fixed section 132 of the adjusting shaft 130 is detachably connected to the first slide bar 434, allowing the position of the test piece 140 in the length and / or width directions to be finely adjusted. Therefore, when testing two RF interfaces 11 on a circuit board 10, and the two RF interfaces 11 are close to each other, it is only necessary to disassemble the adjusting shaft 130, separating the adjusting bracket 120 from the first slide bar 434. After determining the position of the testing device 100, the adjusting shaft 130 can be used to reconnect the adjusting bracket 120 and the first slide bar 434, eliminating the need to adjust the position of the first slide bar 434. This simplifies operation, increases convenience, and improves testing efficiency.

[0090] When the two RF interfaces 11 to be tested are far apart, the positions of the adjustment shaft 130 and the first slider can be adjusted simultaneously to perform the test.

[0091] The testing equipment 1000 also includes a controller, which can be an electronic device such as a computer or mobile phone. The image acquisition device 500, the first driving component 300, and the testing device 100 are all communicatively connected to the electronic device. The cable of the testing device 100 is connected to the probe 143, and then passes sequentially through the receiving chamber of the test rod 141 of the test component 140 and the through hole of the mounting plate 410 of the mounting component 400 before connecting to the electronic device. The image acquisition device 500 and the first driving component 300 are communicatively connected to the electronic device via cables or wireless signals. The electronic device is equipped with testing software, which determines whether the testing equipment 1000 is operational.

[0092] After the circuit board 10 to be tested is placed and the test device 100 is positioned correctly, turn on the power of the test device 1000, and click the "Start Test" button on the test software. The test device 1000 will then begin testing. The specific test steps are as follows:

[0093] Step S10: Control the image acquisition device 500 to capture an image of the loading component 600 containing the circuit board 10.

[0094] Step S11: After acquiring the image captured by the image acquisition device 500, the position coordinates of the circuit board 10 in the image are identified, and the position coordinates are compared with the pre-stored coordinates. The pre-stored coordinates are pre-set in the test software and stored in the electronic device.

[0095] Step S12: If there is an error between the position coordinates and the pre-stored coordinates, control the second driving component to drive the loading component 600 to move, so that the loading component 600 drives the circuit board 10 to the position corresponding to the pre-stored coordinates.

[0096] Step S13: Control the first driving component 300 to drive the mounting component 400 to move, so that the mounting component 400 drives the test device 100 to move until the probe 143 of the test device 100 is inserted into the RF interface 11 of the circuit board 10. After the probe 143 is inserted into the RF interface 11, the test software will obtain various parameters of the RF interface 11 through the cable connected between the probe 143 and the electronic device, and then compare the various parameters with the pre-stored parameters to determine whether the RF interface 11 is normal.

[0097] The aforementioned testing method automatically captures images using the image acquisition device 500, automatically moves the mounting component 400 using the first driving component 300, and automatically moves the loading component 600 using the second driving component. The entire process is automated, improving both testing accuracy and efficiency compared to manual operation. Furthermore, during testing, the elastic component 150 in the testing device 100 buffers the instantaneous force of the probe 143 inserting into the RF interface 11, thereby reducing the damage rate of the RF interface 11 and increasing the yield rate.

[0098] See Figure 11 , Figure 11 This is a schematic diagram of the structure of the testing system provided in an embodiment of this application. This application also provides a testing system comprising multiple testing devices 1000, where "multiple" means two or more, arranged side-by-side. In this embodiment, the testing system includes two testing devices 1000, each of which includes a support frame 200, a first driving component 300, a mounting component 400, an image acquisition device 500, a loading component 600, a second driving component, and a testing device 100.

[0099] The support frame 200, first drive component 300, mounting component 400, image acquisition device 500, testing device 100, and loading component 600 are all the same as in the above embodiments and will not be described again. The difference between this embodiment and the above embodiments is that the second drive component is a transmission belt 700, the base plate 210 of the support frame 200 does not have a first guide groove 214, and the bottom of the loading component 600 does not have a second guide rod; specifically, the transmission belt 700 is disposed on the bottom surface 211 of the base plate 210. In this embodiment, the first bottom end surface 212 of the base plate 210 of one testing device 1000 is connected to the second bottom end surface 213 of the base plate 210 of another testing device 1000, which means that multiple base plates 210 are integrally formed; the transmission belts 700 of any adjacent testing devices 1000 are connected, which means that multiple transmission belts 700 are integrally formed. The loading component 600 is mounted on the conveyor belt 700, which transports the loading component 600 to the corresponding test device 1000. It can be understood that multiple test devices 1000 are each equipped with multiple loading components 600, and the conveyor belt transports these multiple loading components 600 to their corresponding locations, allowing multiple test devices 1000 to simultaneously test the circuit boards 10 on multiple loading components 600, thereby increasing testing efficiency.

[0100] The above are merely some embodiments and implementation methods of this application. The scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A test device mounted on a test apparatus for testing a circuit board, characterized by, The testing device includes: two connecting components and a test piece, wherein the two connecting components are slidably connected to the test piece, and the two connecting components are located on both sides of the test piece; The connecting assembly includes a guide shaft, an adjusting bracket, an adjusting shaft, and an elastic element; the guide shaft includes a fixed section and a guiding section that are fixedly connected; the adjusting shaft includes a first fixed section and a second fixed section that are fixedly connected. One side of the adjusting bracket is detachably connected to the fixed section, the test piece is slidably connected to the guide section, and the test piece can slide along the axial direction of the guide shaft; the elastic element is sleeved on the guide section and located between the adjusting bracket and the test piece; when the test piece slides along the guide shaft towards the adjusting bracket, the elastic element is compressed; when the test piece slides along the guide shaft away from the adjusting bracket, the elastic element can return to its original position. The other side of the adjustment bracket is provided with a plurality of first adjustment parts, the first fixing section can be detachably connected to any of the first adjustment parts, and the second fixing section is used to detachably connect to the test equipment.

2. The testing apparatus according to claim 1, characterized in that, The test piece includes a test rod, a guide block, and a probe; the test rod is fixedly connected to the guide block and passes through the guide block along the thickness direction of the test piece; the guide block is provided with a guide hole, the guide section is slidably connected in the guide hole, and the elastic element connects the guide block and the adjustment bracket; the test piece can slide along the axial direction of the guide shaft and compress the elastic element; The probe is fixedly connected to one end of the test rod, and the probe and the guide section are located on opposite sides of the guide block.

3. The testing apparatus according to claim 2, characterized in that, The guide shaft further includes a limiting section, which is fixedly connected to the end of the guide section away from the fixed section; The peripheral wall of the limiting section has a limiting ring protruding radially outward, and the end of the limiting ring connected to the guide section forms a limiting wall surface; when the test piece slides away from the adjusting bracket along the guide axis, the surface of the guide block away from the test bracket can abut against the limiting wall surface.

4. The testing apparatus according to claim 2, characterized in that, The guide block has a shape symmetrical with respect to the axis of the test rod, and the guide block is provided with two guide holes, which are symmetrical with respect to the axis of the test rod. The guide segment of the guide shaft of one of the connecting components is slidably connected to one of the guide holes, and the guide segment of the guide shaft of the other connecting component is slidably connected to the other guide hole.

5. The testing apparatus according to claim 2, characterized in that, The test rod is a hollow rod-shaped component, and at least a portion of the probe is located within the hollow portion of the test rod.

6. The testing apparatus according to any one of claims 1 to 5, characterized in that, Each of the connecting components includes two of the adjusting shafts, and the first fixed section of each of the two adjusting shafts is detachably connected to any two of the plurality of first adjusting parts.

7. The testing apparatus according to any one of claims 1 to 5, characterized in that, The adjusting bracket includes a main body section and an extension section, the main body section and the extension section are fixedly connected at an angle; a plurality of first adjusting parts are disposed on the main body section, and the extension section is detachably connected to the guide shaft.

8. The testing apparatus according to claim 7, characterized in that, The first adjustment part is a first connecting hole provided on the main body section; the first fixing section is located inside the first connecting hole and is detachably connected to the hole wall of the first connecting hole.

9. The testing apparatus according to claim 8, characterized in that, The first fixing section is detachably connected to the first connecting hole by a thread; the wall of the first connecting hole is provided with an internal thread, and the outer wall of the first fixing section is provided with an external thread; the first fixing section is located inside the first connecting hole, and the internal thread of the first connecting hole is screwed into the external thread of the adjusting shaft.

10. The testing apparatus according to claim 8, characterized in that, The first connecting hole has a groove on its wall, and the outer wall of the first fixing section has an elastic buckle; the first fixing section is located inside the first connecting hole, and the elastic buckle is engaged in the groove; or, The first connecting hole has an elastic buckle on its wall, and the outer wall of the first fixing section has a groove. The first fixing section is located inside the first connecting hole, and the elastic buckle is engaged in the groove.

11. The testing apparatus according to claim 8, characterized in that, The main body segment includes a first main body surface and a second main body surface, the first main body surface and the second main body surface being disposed opposite to each other; the second main body surface is oriented toward the test piece. The first connecting hole is a through hole that penetrates the first body surface and the second body surface, or the first connecting hole is a blind hole that penetrates the first body surface.

12. The testing apparatus according to claim 7, characterized in that, The thickness of the extension segment is less than the thickness of the main body segment, so as to form a guide sliding space between the main body segment and the extension segment; When the test piece slides along the guide axis toward the adjusting bracket, at least a portion of the test piece can be located within the guide space.

13. The testing apparatus according to claim 12, characterized in that, The extension section has a clearance space on the side away from the main body section, and the clearance space is connected to the guide space; at least a portion of the elastic element and at least a portion of the guide section are located within the clearance space.

14. The testing apparatus according to claim 7, characterized in that, The extension section is provided with a fixing hole, which is a through hole that penetrates the extension section along the thickness direction of the adjusting bracket, or the fixing hole is a blind hole that penetrates the surface of the extension section facing the test piece; the first fixing section is located in the fixing hole and is detachably connected to the hole wall of the fixing hole.

15. A testing device, characterized in that, include: The device comprises a support frame, a first driving component, a mounting component, a loading component, a second driving component, an image acquisition device, and a testing device, wherein the testing device is the testing device according to any one of claims 1 to 14. The first driving component, the mounting component, the loading component, the second driving component, and the image acquisition device are all mounted on the support frame. The mounting component is connected to the first driving component, and the first driving component can drive the mounting component to move along the thickness direction of the testing equipment. The loading component is connected to the second driving component, and the second driving component can drive the loading component to move along the length direction of the testing equipment. The loading component is used to load the circuit board to be tested. The image acquisition device is used to acquire an image of the loading component carrying the circuit board to be tested. The testing device is connected to the mounting component, wherein the second fixed section of the adjusting shaft of the testing device is detachably connected to the mounting component, and the side of the test component and the loading component carrying the circuit board to be tested are opposite each other; the mounting component can drive the test component to move toward or away from the circuit board to be tested under the drive of the first driving component.

16. The testing equipment according to claim 15, characterized in that, The mounting component includes a mounting plate and a first slide rod. The mounting plate is connected to the first driving component, and the first slide rod is detachably connected to the mounting plate. The first slide rod is provided with a plurality of second adjustment parts. The testing device can be detachably connected to any of the second adjustment parts, wherein the second fixed section of the guide shaft can be detachably connected to any of the second adjustment parts.

17. The testing equipment according to claim 16, characterized in that, The mounting component further includes a second slide rod and a third slide rod, both of which are fixedly connected to the mounting plate. The second slide rod and the third slide rod are provided with multiple third adjustment parts. The first slide rod can be detachably connected to any of the third adjustment parts.

18. A testing system, characterized in that, include: Two testing devices, both of which are the testing devices according to any one of claims 15 to 17; the second drive component of both testing devices is a conveyor belt, and the conveyor belts of both testing devices are integrally formed; the conveyor belts are capable of simultaneously conveying the loading components of both testing devices.

19. A testing method, characterized in that, The testing method is implemented using the testing equipment described in any one of claims 15 to 17, or using the testing system described in claim 18, and the testing method includes: The image acquisition device is controlled to capture images of the loading component, which carries a circuit board to be tested. After acquiring the image captured by the image acquisition device, the position coordinates of the circuit board in the image are identified, and the position coordinates are compared with the pre-stored coordinates; If there is an error between the position coordinates and the pre-stored coordinates, the second driving component is controlled to drive the loading component to move, so that the loading component moves the circuit board to the position corresponding to the pre-stored coordinates; After the loading component moves to the position corresponding to the pre-stored coordinates, the first driving component is controlled to drive the mounting component to move, so that the mounting component drives the test device to move until the probe of the test device is inserted into the RF interface of the circuit board.

Images