A chip parameter adjustment method, device, equipment and storage medium

Abstract

The application discloses a chip parameter adjustment method, device and equipment and a storage medium. The method comprises the following steps: sequentially performing a target operation according to a test picture list according to a set timing, wherein the target operation comprises the following steps: controlling a display screen to display a test picture by a chip to be adjusted, acquiring the test picture by a target device, if the test picture is abnormal, matching a preset parameter of the chip to be adjusted according to an abnormal type of the test picture and a model of the chip to be adjusted, and adjusting the parameter to make the test picture normal; and when the last test picture in the test picture list is a normal picture, determining a current parameter of the chip to be adjusted as a target chip parameter of the chip to be adjusted. According to the technical scheme, the parameter of the chip to be adjusted can be automatically selected according to the test picture list, the parameter of the chip is adjusted, and the display effect is optimized.

Description

Technical Field

[0001] The present invention relates to the field of computer technology, and in particular to a chip parameter adjustment method, apparatus, device and storage medium. Background Technology

[0002] Due to variations in the structure and production batches of LED display panels, after the control system intelligently sets the screen, it is generally necessary to adjust the relevant parameters of the chips (e.g., column driver chips and row driver chips) to optimize the display effect.

[0003] In the existing technology, users can only adjust the relevant parameters of the chip by studying the relevant functions in the integrated chip manual, so as to optimize the display effect.

[0004] The drawbacks of the existing solution are:

[0005] 1. Integrated chip datasheets provide a large number of parameters with professional naming, which increases the learning cost for users;

[0006] 2. Some abnormal situations that occur in LED displays are generally difficult for users to correlate with chip parameters. Therefore, even after adjusting the relevant chip parameters, display abnormalities may still occur, and the goal of optimizing the display effect cannot be achieved. Summary of the Invention

[0007] This invention provides a chip parameter adjustment method, apparatus, device, and storage medium, which solves the problem that users cannot optimize display effects by adjusting chip parameters when it is difficult to associate chip parameters with display screen effects. It can automatically match the parameters that need to be adjusted of the chip based on the anomaly type of the test image and the model of the chip to be adjusted, and automatically adjust the chip parameters to achieve the purpose of optimizing display effects.

[0008] According to one aspect of the present invention, a chip parameter adjustment method is provided, comprising:

[0009] The target operations are executed sequentially according to the set timing based on the test image list. The target operations include: displaying test images on a screen controlled by the chip to be adjusted; acquiring test images through a target device; if the test images are abnormal, matching the abnormality type of the test images with the model of the chip to be adjusted using preset parameters of the chip to be adjusted, and adjusting the parameters to make the test images normal; the test image list includes at least one of the following: at least one grid-type test image of at least one color, at least one grayscale-type test image of at least one color, at least one color bar-type test image, and at least one checkerboard-type test image of at least one color.

[0010] When the last test image in the test image list is a normal image, the current parameters of the chip to be adjusted are determined as the target chip parameters.

[0011] According to another aspect of the present invention, a chip parameter adjustment device is provided, the chip parameter adjustment device comprising:

[0012] The execution module is used to perform target operations sequentially according to a set timing sequence based on a list of test images. The target operations include: displaying test images on a screen controlled by the chip to be adjusted; acquiring test images through a target device; if the test images are abnormal, matching preset parameters of the chip to be adjusted based on the type of abnormality and the model of the chip to be adjusted, and adjusting the parameters to make the test images normal. The list of test images includes at least one of the following: a grid-type test image of at least one color, a grayscale-type test image of at least one color, a color bar-type test image of at least one color, and a checkerboard-type test image of at least one color.

[0013] The parameter determination module is used to determine the current parameters of the chip to be adjusted as the target chip parameters when the last test image in the test image list is a normal image.

[0014] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0015] At least one processor; and

[0016] A memory communicatively connected to the at least one processor; wherein,

[0017] The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform the chip parameter adjustment method according to any embodiment of the present invention.

[0018] According to another aspect of the present invention, a computer-readable storage medium is provided, the computer-readable storage medium storing computer instructions for causing a processor to execute and implement the chip parameter adjustment method according to any embodiment of the present invention.

[0019] This invention, through its embodiments, executes target operations sequentially according to a set time sequence based on a list of test images. These target operations include: controlling a display screen to show test images via a chip to be adjusted; acquiring test images via a target device; if an anomaly is found in the test image, matching the anomaly type of the test image with the model of the chip to be adjusted to preset parameters of the chip, and adjusting these parameters to make the test image a normal image; when the last test image in the list is a normal image, determining the current parameters of the chip to be adjusted as the target chip parameters. This solves the problem that users cannot optimize display effects by adjusting chip parameters when it is difficult to correlate chip parameters with the display screen's display effect. It automatically matches the parameters that need adjustment based on the anomaly type of the test image and the model of the chip to be adjusted, automatically adjusting the chip parameters to achieve the goal of optimizing the display effect.

[0020] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0021] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 This is a flowchart of a chip parameter adjustment method according to an embodiment of the present invention;

[0023] Figure 2 This is a schematic diagram of an abnormal image in an embodiment of the present invention;

[0024] Figure 3 This is a schematic diagram of the upper ghosting adjustment control in an embodiment of the present invention;

[0025] Figure 4 This is a schematic diagram of the lower ghosting adjustment control in an embodiment of the present invention;

[0026] Figure 5 This is a schematic diagram of the first row of dimming compensation controls in an embodiment of the present invention;

[0027] Figure 6 This is a schematic diagram of the gray-out adjustment control in an embodiment of the present invention;

[0028] Figure 7 This is a schematic diagram of the low grayscale color cast adjustment control in an embodiment of the present invention;

[0029] Figure 8 This is a schematic diagram of the coupling adjustment control in an embodiment of the present invention;

[0030] Figure 9 This is a schematic diagram of the structure of a chip parameter adjustment system according to an embodiment of the present invention;

[0031] Figure 10 This is a flowchart of another chip parameter adjustment method in an embodiment of the present invention;

[0032] Figure 11 This is a schematic diagram of the structure of a chip parameter adjustment device according to an embodiment of the present invention;

[0033] Figure 12 This is a schematic diagram of the structure of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0034] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0035] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0036] It is understood that before using the technical solutions disclosed in the various embodiments of this disclosure, users should be informed of the types, scope of use, and usage scenarios of the personal information involved in this disclosure in an appropriate manner in accordance with relevant laws and regulations, and user authorization should be obtained.

[0037] Example 1

[0038] Figure 1This is a flowchart illustrating a chip parameter adjustment method provided in an embodiment of the present invention. This embodiment is applicable to chip parameter adjustment situations. The method can be executed by the chip parameter adjustment device in this embodiment, which can be implemented in software and / or hardware, such as... Figure 1 As shown, the method specifically includes the following steps:

[0039] S110, according to the set timing sequence, the target operation is executed sequentially according to the test image list. The target operation includes: displaying test images on the display screen controlled by the chip to be adjusted, acquiring test images through the target device, and if the test images are abnormal, matching the preset parameters of the chip to be adjusted according to the abnormality type of the test images and the model of the chip to be adjusted, and adjusting the parameters to make the test images normal.

[0040] It should be noted that a typical list of test images includes four types: grid, color bar, grayscale, and checkerboard.

[0041] The test image list includes at least one of the following: a grid-type test image of at least one color, a grayscale-type test image of at least one color, a color bar-type test image of at least one color, and a checkerboard-type test image of at least one color.

[0042] The test images can include the following colors: red, green, blue, white, and black. Alternatively, the test images can contain only red, black, and white. It should be noted that the more colors in the test images, the better the display effect will be after adjusting the chip parameters. For example, the test image list could include: grid images with red grid lines, grid images with green grid lines, grid images with blue grid lines, and grid images with white grid lines, where the areas other than the grid lines are black.

[0043] The test images in the test image list can be arranged in a preset order. For example, the test image list from top to bottom could be: a grid image with red grid lines, a grid image with green grid lines, a grid image with blue grid lines, a grid image with white grid lines, a red grayscale image, a green grayscale image, a blue grayscale image, a white grayscale image, a color bar image with red color bars, a color bar image with green color bars, a color bar image with blue color bars, a color bar image with white color bars (where the areas other than the color bars are black), a red and black checkerboard image, a green and black checkerboard image, a blue and black checkerboard image, and a white and black checkerboard image. The test image list could include 16 test images. The order of the test images in the test image list can also be determined according to the anomaly type. For example, it could be: obtaining the test images corresponding to each anomaly type in the anomaly type list; and generating a test image list based on the test images corresponding to each anomaly type in the anomaly type list.

[0044] Specifically, the method of controlling the display screen to display test images through the chip to be adjusted can be as follows: the test images in the test image list are displayed sequentially according to their arrangement order. The first test image is displayed directly. If it is not the first test image, the current test image is displayed after the previously displayed test image is a normal image.

[0045] The target device can be a camera or other device capable of capturing content displayed on a screen; this embodiment of the invention does not impose any restrictions on this.

[0046] Specifically, if the test image has an anomaly, the method of matching the preset parameters of the chip to be adjusted based on the anomaly type of the test image and the model of the chip to be adjusted can be as follows: If the test image has an anomaly and the anomaly type is upper ghosting, then the preset blanking value and blanking level of the chip to be adjusted are matched based on the anomaly type of the test image and the model of the chip to be adjusted. If the test image has an anomaly and the anomaly type is lower ghosting, then the preset ghosting level and ghosting time of the chip to be adjusted are matched based on the anomaly type of the test image and the model of the chip to be adjusted. If the test image has an anomaly and the anomaly type is a dead pixel crosshair, then the preset parameters for removing dead pixels of the chip to be adjusted are matched based on the anomaly type of the test image and the model of the chip to be adjusted (for example, it can be 0 or 1, where 1 represents selecting to remove dead pixels). If the test image has an anomaly and the anomaly type is low gray horizontal stripes, then the preset parameters for eliminating low gray horizontal stripes of the chip to be adjusted are matched based on the anomaly type of the test image and the model of the chip to be adjusted (similar to removing dead pixels, and will not be elaborated here). If the test image has an anomaly, and the anomaly type is "first row too dark," then the preset first row darkening compensation and first row darkening compensation time of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted. If the test image has an anomaly, and the anomaly type is "color block," then the preset color block elimination parameters of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted (similar to bad pixel removal, not elaborated here). If the test image has an anomaly, and the anomaly type is "gray skipping," then the preset low gray uniformity of the chip to be adjusted is matched according to the anomaly type of the test image and the model of the chip to be adjusted. If the test image has an anomaly, and the anomaly type is "low gray color cast," then the preset low gray color cast compensation of the chip to be adjusted is matched according to the anomaly type of the test image and the model of the chip to be adjusted. If the test image has an anomaly, and the anomaly type is "coupling," then the preset coupling optimization parameters of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted.

[0047] In a specific example, the method of performing target operations sequentially according to the test image list in a set time sequence can be as follows: The chip to be adjusted controls the display screen to show test images; the target device acquires the test images; based on the test images and their corresponding target images, it is determined whether the test images are abnormal; if the test images are normal, the next test image is determined according to the test image list and displayed; if the test images are abnormal, the abnormality type of the test images is obtained; a parameter adjustment interface is generated based on the abnormality type of the test images and displayed, allowing the user to adjust the chip parameters. After the user adjusts the chip parameters, the display screen displays the image corresponding to the adjusted chip parameters. During the chip parameter adjustment process, after each adjustment, the image corresponding to the adjusted chip parameters displayed on the display screen needs to be acquired, and the image corresponding to the adjusted chip parameters displayed on the display screen needs to be determined whether the image corresponding to the adjusted chip parameters is abnormal, until the image corresponding to the adjusted chip parameters is a normal image, at which point the chip parameter adjustment operation ends.

[0048] It should be noted that if, after iterating through the adjustment parameters, the test image cannot be adjusted to a normal image, then the target image parameters of the test image are obtained. These target image parameters include at least one of the following: grid line type, line width, spacing, and grayscale value. The test image is then updated based on these target image parameters, and the updated test image is adjusted to a normal image by adjusting these parameters. If, after iterating through the adjustment parameters, the test image still cannot be adjusted to a normal image, it indicates that the anomaly of the test image is not obvious. Therefore, the parameters of the test image are updated to make the anomaly more obvious, making it easier to adjust the updated test image to a normal image by adjusting the parameters.

[0049] In addition, the target operation may also include: displaying a test image on a display screen controlled by the chip to be adjusted; acquiring the test image through a target device; if the test image is abnormal and the similarity between the test image and the target image corresponding to the test image is greater than a target similarity threshold, then acquiring the target image parameters of the test image; updating the test image based on the target image parameters; matching the preset parameters of the chip to be adjusted according to the abnormality type of the test image and the model of the chip to be adjusted; and adjusting the parameters to make the updated test image a normal image.

[0050] S120, when the last test image in the test image list is a normal image, the current parameters of the chip to be adjusted are determined as the target chip parameters.

[0051] Specifically, when the last test image in the test image list is a normal image, the method for determining the current parameters of the chip to be adjusted as the target chip parameters can be as follows: After obtaining the last test image in the test image list through the target device, if the test image is determined to be a normal image based on the last test image in the test image list and the corresponding target image, then the current parameters of the chip to be adjusted are determined as the target chip parameters. Alternatively, when the last test image in the test image list is a normal image, the method for determining the current parameters of the chip to be adjusted as the target chip parameters can also be as follows: After obtaining the last test image in the test image list through the target device, if the last test image is determined to be abnormal based on the last test image in the test image list and the corresponding target image, then the preset parameters of the chip to be adjusted are matched according to the abnormality type of the last test image and the model of the chip to be adjusted, and the parameters are adjusted to make the last test image a normal image, thus obtaining the current parameters of the chip to be adjusted, and determining the current parameters of the chip to be adjusted as the target chip parameters.

[0052] It should be noted that for the target chip parameters, each test image may contain at least one type of anomaly. Therefore, it is necessary to adjust the chip parameters, analyze the anomalies one by one, and process the existing anomalies until a normal image is obtained.

[0053] In another specific example, a list of test images is generated based on the test images corresponding to each exception type in the exception type list. The test images are then displayed sequentially according to the order of the exception types in the list. Each test image is checked for an exception. If the test image is normal, the current parameters of the chip to be adjusted are saved. If the chip is abnormal, the parameters of the chip to be adjusted are adjusted until the last test image in the test image list is a normal image. At this point, the current parameters of the chip to be adjusted are determined as the target chip parameters. In other words, the current parameters of the chip to be adjusted are determined as the target chip parameters only when the last test image corresponding to the last exception type is a normal image.

[0054] Optionally, the target operation is executed sequentially according to the set time sequence based on the test image list, including:

[0055] After adjusting the previous test image to a normal image, perform the target operation on the current test image;

[0056] or;

[0057] After determining that the previous test image is a normal image based on the previous test image and its corresponding target image, the target operation is performed on the current test image.

[0058] It should be noted that if the current test image is the first test image in the test image list, the target operation is performed directly on the first test image. If the current test image is not the first test image in the test image list, the target operation is performed on the current test image after the previous test image has been adjusted to a normal image; or, the target operation is performed on the current test image after determining that the previous test image is a normal image based on the previous test image and its corresponding target image.

[0059] Optionally, before performing the target operation according to the set timing sequence based on the test image list, the following may also be included:

[0060] Retrieve the test image corresponding to each exception type in the exception type list;

[0061] Generate a list of test images based on the test images corresponding to each exception type in the exception type list.

[0062] The list of anomaly types includes at least one of the following: upper ghosting, lower ghosting, bad pixel crosshairs, dark first row, low gray horizontal stripes, color blocks, low gray color cast, gray skipping, and coupling. For example... Figure 2 The images shown are respectively those with upper ghosting, lower ghosting, bad pixel crosshairs, dark first row, low gray horizontal stripes, color blocks, low gray color cast, gray jumps, and coupling.

[0063] Specifically, the way to obtain the test image corresponding to each exception type in the exception type list is to query the correspondence table between test images and exception types to obtain the test image corresponding to each exception type.

[0064] Specifically, the method for generating a test image list based on the test images corresponding to each exception type in the exception type list can be as follows: generate a test image list based on the order of the exception types in the exception type list and the test images corresponding to each exception type.

[0065] It should be noted that there is a correspondence between the test images and the anomaly types. For example, the anomaly types corresponding to grid images include: upper ghosting, lower ghosting, and bad pixel crosshairs; the anomaly types corresponding to grayscale images include: dark first row, color blocks, and low gray horizontal stripes; the anomaly types corresponding to color bar images include: gray skipping and low gray color cast; and the anomaly type corresponding to chessboard images includes: coupling.

[0066] Optionally, before matching the preset parameters of the chip to be adjusted based on the anomaly type of the test image and the model of the chip to be adjusted, the method further includes:

[0067] If the test image is abnormal, and the similarity between the test image and the target image corresponding to the test image is greater than the target similarity threshold, then the target image parameters of the test image are obtained, wherein the target image parameters include at least one of the following: grid line type, line width, spacing and grayscale value;

[0068] The test image is updated based on the target image parameters. These target image parameters may further include: grid line color, the color corresponding to the grayscale image, color bar color, and grid color.

[0069] Specifically, if the test image is abnormal and the similarity between the test image and the target image corresponding to the test image is greater than the target similarity threshold, the target image parameters of the test image can be obtained as follows: if the test image is abnormal and the similarity between the test image and the target image corresponding to the test image is greater than the target similarity threshold, a parameter adjustment interface is displayed so that the user can adjust the target image parameters of the test image based on the parameter adjustment interface.

[0070] The parameter adjustment interface includes: an image parameter adjustment area and a chip parameter adjustment area.

[0071] It should be noted that when there are anomalies in the test image, adjusting the parameters of the target image is to highlight the anomalies. Users can then adjust the chip parameters based on the adjusted test image to achieve better display results.

[0072] Optionally, if the test image is abnormal, the target image parameters of the test image are obtained, including:

[0073] If the test image is abnormal, then the image type of the test image is obtained;

[0074] The target image parameters corresponding to the test image are determined based on the image type of the test image.

[0075] Specifically, the method for determining the target image parameters corresponding to the test image based on the image type of the test image can be as follows: if the image type of the test image is a grid type, then the target image parameters corresponding to the test image can be the grid line type and grid spacing; if the image type of the test image is a grayscale image, then the target image parameters corresponding to the test image can be the grayscale value.

[0076] Optionally, if the test image is abnormal, then according to the abnormality type of the test image and the model of the chip to be adjusted, the preset parameters of the chip to be adjusted are matched, including:

[0077] Obtain a list of exception types, wherein the list of exception types includes at least one exception type;

[0078] Based on the list of abnormality types, determine whether the test image contains any of the abnormality types listed;

[0079] If the test image contains an anomaly from the anomaly type list, then the preset parameters of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted.

[0080] The anomaly types in the anomaly type list, from top to bottom, can be: upper ghosting, lower ghosting, bad pixel crosshair, first row darkening, low gray horizontal stripes, color blocks, low gray color cast, gray jumps, and coupling.

[0081] It should be noted that, according to the order of the anomaly types in the anomaly type list, the test images are analyzed one by one to see if the above-mentioned anomalies exist. If they do, the anomalies in the test images are resolved by adjusting the parameters of the chip to be adjusted, until the test images displayed by the adjusted parameters of the chip to be adjusted are normal images.

[0082] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0083] If the anomaly type of the test image is upper ghosting, then the adjustment range of the blanking value corresponding to upper ghosting and the adjustment range of the blanking level corresponding to upper ghosting are determined according to the identification information of the chip to be adjusted.

[0084] Receive the blanking value selected by the user within the adjustment range of the blanking value corresponding to the upper ghost and the blanking level selected within the adjustment range of the blanking level corresponding to the upper ghost;

[0085] The parameters of the chip to be adjusted are adjusted according to the blanking value and the blanking level.

[0086] The identification information of the chip to be adjusted can be the model of the chip to be adjusted, or other identification information used to characterize the chip to be adjusted.

[0087] It should be noted that the method for receiving the hidden value selected by the user within the adjustment range of the hidden value corresponding to the upper ghost and the hidden level selected within the adjustment range of the hidden level corresponding to the upper ghost can be as follows: an upper ghost adjustment control is generated based on the adjustment range of the hidden value corresponding to the upper ghost and the adjustment range of the hidden level corresponding to the upper ghost. The upper ghost adjustment control includes a hidden value adjustment control and a hidden level adjustment control. The user adjusts the hidden value through the hidden value adjustment control to obtain the hidden value selected by the user within the adjustment range of the hidden value corresponding to the upper ghost. The user adjusts the hidden level through the hidden level adjustment control to obtain the hidden level selected by the user within the adjustment range of the hidden level corresponding to the upper ghost.

[0088] In a specific example, such as Figure 3 As shown, the blanking phase is controlled by the receiver card, ranging from [0 to 1000] * 8ns, applicable to all chips; the parameters of the decoding chip are normalized, with an adjustment range of [0 to 100%]. Taking the ICND2013 decoding chip as an example, the chip manual specifies the blanking level as bit [3:0], with an actual range of 0 to 15, calculated using normalization:

[0089] gain = (bit[3:0]) / 15*100%; step size is 6.7%.

[0090] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0091] If the anomaly type of the test image is lower ghosting, then the adjustment range of the ghosting elimination level and the adjustment range of the ghosting elimination time corresponding to the lower ghosting are determined according to the identification information of the chip to be adjusted.

[0092] Receive the ghosting level selected by the user within the adjustment range of the ghosting level corresponding to the lower ghost and the ghosting time selected within the adjustment range of the ghosting time corresponding to the lower ghost;

[0093] The parameters of the chip to be adjusted are adjusted according to the annulment level and the annulment time.

[0094] The adjustment range for the ghosting level corresponding to the lower ghosting includes at least one of the following: the adjustment range for the red ghosting level, the adjustment range for the green ghosting level, and the adjustment range for the blue ghosting level. The adjustment range for the ghosting time corresponding to the lower ghosting includes at least one of the following: the adjustment range for the red ghosting time, the adjustment range for the green ghosting time, and the adjustment range for the blue ghosting time.

[0095] The second ablation level includes at least one of a red second ablation level, a green second ablation level, and a blue second ablation level, and the ablation time includes at least one of a red ablation time, a green ablation time, and a blue ablation time.

[0096] Specifically, receiving the second disappearance level selected by the user within the adjustment range of the disappearance level corresponding to the lower ghost and the disappearance time selected within the adjustment range of the disappearance time corresponding to the lower ghost includes: receiving the second disappearance level selected by the user within at least one of the adjustment ranges of the red disappearance level, the green disappearance level, and the blue disappearance level corresponding to the lower ghost, and the disappearance time selected by the user within at least one of the adjustment ranges of the red disappearance time, the green disappearance time, and the blue disappearance time corresponding to the lower ghost.

[0097] It should be noted that the method for receiving the second ghosting level selected by the user within the adjustment range of the ghosting level corresponding to the lower ghosting and the ghosting time selected within the adjustment range of the ghosting time corresponding to the lower ghosting can be as follows: a lower ghosting adjustment control is generated based on the adjustment range of the ghosting level and the adjustment range of the ghosting time corresponding to the lower ghosting. The lower ghosting adjustment control includes a ghosting time adjustment control and a ghosting level adjustment control. The user adjusts the ghosting time using the ghosting time adjustment control to obtain the ghosting time selected by the user within the adjustment range of the ghosting time corresponding to the lower ghosting. The user adjusts the ghosting level using the ghosting level adjustment control to obtain the second ghosting level selected by the user within the adjustment range of the ghosting level corresponding to the lower ghosting.

[0098] In a specific example, such as Figure 4 As shown, this embodiment of the invention supports adjusting the erasure time and erasure level. Both parameters are controlled by the driver chip, and the interface performs normalization processing. The adjustment range is [0~100%]. Taking ICN2055 as an example, the erasure level corresponds to parameter Reg0x1E[4:0], and the erasure time corresponds to parameter Reg0x0D[4:0]. Normalization calculation:

[0099] Gain1 = (0x1E[4:0]) / 31*100%, with a step size of 3.2%;

[0100] Gain2 = (0x0D[4:0]) / 31*100%, with a step size of 3.2%.

[0101] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0102] If the anomaly type of the test image is a bad pixel crosshair, then a bad pixel removal control is generated;

[0103] The system receives the user's selection of the dead pixel removal control and calls the dead pixel removal interface to adjust the parameters of the chip to be adjusted.

[0104] In a specific example, if the anomaly type of the test image is a dead pixel crosshair, a dead pixel removal control is displayed. If the user selects the dead pixel removal control, the dead pixel removal interface is called to adjust the parameters of the chip to be adjusted.

[0105] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0106] If the anomaly type of the test image is low gray horizontal stripes, then a low gray horizontal stripe removal control is generated.

[0107] The system receives the user's selection of the low-gray horizontal stripe elimination control and calls the low-gray horizontal stripe elimination interface to adjust the parameters of the chip to be adjusted.

[0108] The low-gray horizontal stripe removal control may include: a red low-gray horizontal stripe removal control, a green low-gray horizontal stripe removal control, and a blue low-gray horizontal stripe removal control.

[0109] Specifically, the method of receiving a user's selection operation for the low gray horizontal stripe elimination control and calling the low gray horizontal stripe elimination interface to adjust the parameters of the chip to be adjusted can be as follows: receiving a user's selection operation for any one of the red, green, and blue low gray horizontal stripe elimination controls, and calling the low gray horizontal stripe elimination interface corresponding to the selected control to adjust the parameters of the chip to be adjusted.

[0110] In a specific example, if the anomaly type of the test image is low gray horizontal stripes, then a red low gray horizontal stripe removal control, a green low gray horizontal stripe removal control, and a blue low gray horizontal stripe removal control are generated. If the test image is red, the user's selection operation for the red low gray horizontal stripe removal control is received, and the red low gray horizontal stripe removal interface is called to adjust the parameters of the chip to be adjusted.

[0111] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0112] If the anomaly type of the test image is darker in the first row, then the adjustment range of the first row darkening compensation and the adjustment range of the first row darkening compensation time corresponding to the first row darkening are determined according to the identification information of the chip to be adjusted.

[0113] Receive the first line dark compensation selected by the user in the adjustment range of the first line dark compensation corresponding to the first line darkness, and the first line dark compensation time selected in the adjustment range of the first line dark compensation time corresponding to the first line darkness.

[0114] The parameters of the chip to be adjusted are adjusted based on the first row of darkening compensation and the first row of darkening compensation time.

[0115] The adjustment range of the first row darkening compensation corresponding to the first row being darker includes at least one of the following: the adjustment range of the red first row darkening compensation corresponding to the first row being darker, the adjustment range of the green first row darkening compensation corresponding to the first row being darker, and the adjustment range of the blue first row darkening compensation corresponding to the first row being darker.

[0116] The adjustment range of the first row darkening compensation time corresponding to the first row being darker includes at least one of the following: the adjustment range of the red first row darkening compensation time corresponding to the first row being darker, the adjustment range of the green first row darkening compensation time corresponding to the first row being darker, and the adjustment range of the blue first row darkening compensation time corresponding to the first row being darker.

[0117] The first row darkening compensation includes at least one of the following: red first row darkening compensation, green first row darkening compensation, and blue first row darkening compensation. The first row darkening compensation time includes at least one of the following: red first row darkening compensation time, green first row darkening compensation time, and blue first row darkening compensation time.

[0118] Specifically, the method for receiving the first-line dark compensation selected by the user in the adjustment range of the first-line dark compensation corresponding to the first-line darkness and the first-line dark compensation time selected in the adjustment range of the first-line darkness compensation time corresponding to the first-line darkness can be as follows: receiving the first-line dark compensation selected by the user in at least one of the adjustment ranges of red, green, and blue first-line dark compensation corresponding to the first-line darkness, and the first-line darkness compensation time corresponding to the first-line darkness, and the first-line darkness compensation time corresponding to the first-line darkness, and receiving the first-line dark compensation time selected by the user in at least one of the adjustment ranges of red, green, and blue first-line dark compensation time corresponding to the first-line darkness.

[0119] In a specific example, such as Figure 5 As shown, this embodiment of the invention supports adjusting the first row darkening compensation and the first row darkening compensation time. The two parameters are controlled by the driver chip, and the interface is normalized. The adjustment range is [0~100%].

[0120] Taking ICN2055 as an example, the parameters corresponding to the shadow compensation in the first row are Reg0x18[5:4] and Reg0x19[7:5], and the parameter corresponding to the shadow compensation time in the first row is Reg0x0E[4:0]. The normalized calculation is as follows:

[0121] Gain1 = (0x18[5:4] << 2 + 0x19[7:5]) / 31 * 100%, with a step size of 3.2%;

[0122] Gain2 = (0x0E[4:0]) / 31*100%, with a step size of 3.2%.

[0123] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0124] If the anomaly type of the test image is color block, then a color block removal control is generated;

[0125] The system receives the user's selection of the color block elimination control and calls the color block elimination interface to adjust the parameters of the chip to be adjusted.

[0126] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0127] If the anomaly type of the test image is gray jump, the adjustment range of the low gray uniformity corresponding to the gray jump is determined according to the identification information of the chip to be adjusted.

[0128] Receive the low gray uniformity selected by the user within the adjustment range corresponding to the low gray uniformity of the gray jump;

[0129] The parameters of the chip to be adjusted are adjusted based on the low gray uniformity.

[0130] The adjustment range of the low gray uniformity corresponding to the gray jump includes at least one of the following: the adjustment range of the red low gray uniformity corresponding to the gray jump, the adjustment range of the green low gray uniformity corresponding to the gray jump, and the adjustment range of the blue low gray uniformity corresponding to the gray jump.

[0131] Specifically, the method for receiving the low gray uniformity selected by the user within the adjustment range of low gray uniformity corresponding to the gray jump can be: receiving the low gray uniformity selected by the user within at least one of the adjustment ranges of red low gray uniformity, green low gray uniformity, and blue low gray uniformity corresponding to the gray jump.

[0132] The low gray uniformity includes at least one of red low gray uniformity, green low gray uniformity, and blue low gray uniformity.

[0133] In a specific example, such as Figure 6 As shown, this embodiment of the invention supports adjusting the uniformity of low gray levels. The parameters are controlled by the driver chip, and the interface is normalized. The adjustment range is [0~100%].

[0134] Taking ICN2055 as an example, the low gray uniformity corresponds to the parameter reg0x10[7:6], and the normalized calculation is as follows:

[0135] Gain = (0x10[7:6]) / 3*100%, with a step size of 33.3%.

[0136] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0137] If the anomaly type of the test image is low gray color cast, then the adjustment range of the low gray color cast compensation corresponding to the low gray color cast is determined according to the identification information of the chip to be adjusted.

[0138] Receive the low gray color cast compensation selected by the user within the adjustment range corresponding to low gray color cast compensation;

[0139] The parameters of the chip to be adjusted are adjusted according to the low gray color cast compensation.

[0140] The adjustment range of the low gray color cast compensation corresponding to the low gray color cast includes at least one of the following: the adjustment range of the red low gray color cast compensation corresponding to the low gray color cast, the adjustment range of the green low gray color cast compensation corresponding to the low gray color cast, and the adjustment range of the blue low gray color cast compensation corresponding to the low gray color cast.

[0141] The low gray color cast compensation includes at least one of the following: red low gray color cast compensation, green low gray color cast compensation, and blue low gray color cast compensation.

[0142] Specifically, the method of receiving the low gray color cast compensation selected by the user in the adjustment range of low gray color cast compensation corresponding to low gray color cast can be as follows: receiving the low gray color cast compensation selected by the user in at least one of the adjustment ranges of red low gray color cast compensation corresponding to low gray color cast, green low gray color cast compensation corresponding to low gray color cast, and blue low gray color cast compensation corresponding to low gray color cast.

[0143] In a specific example, such as Figure 7 As shown, this embodiment of the invention supports adjustment of low grayscale color cast compensation. The parameters are controlled by the driver chip, and the interface is normalized. The adjustment range is [0~100%].

[0144] Taking ICN2055 as an example, the low grayscale color cast compensation corresponds to the parameter reg0x11[13:11], and the normalized calculation is as follows:

[0145] Gain = (0x11[13:11]) / 7*100%, with a step size of 14.3%.

[0146] Optionally, the parameters of the chip to be adjusted are adjusted according to the anomaly type of the test image, including:

[0147] If the anomaly type of the test image is coupling, then the adjustment range of the coupling optimization parameter corresponding to the coupling is determined according to the identification information of the chip to be adjusted;

[0148] Receive the coupling optimization parameters selected by the user within the adjustment range of the corresponding coupling optimization parameters;

[0149] The parameters of the chip to be adjusted are adjusted according to the coupling optimization parameters.

[0150] The coupling optimization parameters may include at least two types, such as Reg0x0C[7:0] and Reg0x20[4:0].

[0151] In a specific example, such as Figure 8 As shown, this embodiment of the invention supports adjusting the parameters of coupling optimization 1 and coupling optimization 2. The two parameters are controlled by the driver chip, and the interface is normalized. The adjustment range is [0~100%].

[0152] Taking ICN2055 as an example, the parameters corresponding to Coupling Optimization 1 are Reg0x0C[7:0], and the parameters corresponding to Coupling Optimization 2 are Reg0x20[4:0]. The normalized calculation is as follows:

[0153] Gain1 = (0x0C[7:0]) / 255*100%, with a step size of 0.4%;

[0154] Gain2 = (0x20[4:0]) / 31*100%, with a step size of 3.2%.

[0155] Optionally, if the test image is abnormal, then according to the abnormality type of the test image and the model of the chip to be adjusted, the preset parameters of the chip to be adjusted are matched, including:

[0156] Obtain the target image corresponding to the test image;

[0157] If an anomaly is determined in the test image based on the test image and the corresponding target image, then the preset parameters of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted.

[0158] Specifically, if an anomaly is determined in the test image based on the test image and its corresponding target image, the method for matching preset parameters of the chip to be adjusted based on the anomaly type of the test image and the model of the chip to be adjusted can be as follows: If the similarity between the test image and its corresponding target image is less than a first similarity threshold, the test image is determined to be abnormal, and preset parameters of the chip to be adjusted are matched based on the anomaly type of the test image and the model of the chip to be adjusted. If the similarity between the test image and its corresponding target image is greater than or equal to the first similarity threshold, the test image is determined to be a normal image.

[0159] In a specific example, the chip to be adjusted controls the display screen to sequentially display test images from the test image list. Since the first test image in the test image list is a grid image with red grid lines, the chip to be adjusted controls the display screen to display a grid image with red grid lines. A camera captures a grid image with red grid lines displayed on the screen. Based on the target image corresponding to the camera-captured image and the red grid image, it is determined whether the red grid image displayed on the screen is a normal image. If it is a normal image, the second test image is displayed. If it is an abnormal image, the abnormality type of the red grid image is determined. Based on the abnormality type of the test image and the model of the chip to be adjusted, the preset parameters of the chip to be adjusted are matched. A parameter adjustment interface is generated based on the preset parameters of the chip to be adjusted and displayed. Based on the adjusted chip parameters input by the user in the parameter adjustment interface, the display screen is controlled to display the adjusted grid image. The camera captures the adjusted grid image displayed on the screen, and the adjustment is performed accordingly. The adjusted grid image and the target image corresponding to the grid image with red grid lines determine whether the adjusted grid image displayed on the screen is a normal image. If it is a normal image, the second test image is displayed. If it is an abnormal image, the preset parameters of the chip to be adjusted are matched according to the abnormality type of the test image and the model of the chip to be adjusted, and the test image is adjusted to a normal image by adjusting the parameters. This process continues until the last test image in the test image list is displayed on the screen controlled by the chip to be adjusted. Since the last test image in the test image list is a black and white checkerboard image, the black and white checkerboard image is displayed on the screen controlled by the chip to be adjusted. The black and white checkerboard image displayed on the screen is captured by the camera. The black and white checkerboard image displayed on the screen is determined to be a normal image based on the target image corresponding to the checkerboard image captured by the camera. If it is a normal image, the current parameters of the chip to be adjusted are obtained and determined as the target chip parameters of the chip to be adjusted. If the image is abnormal, the preset parameters of the chip to be adjusted are matched according to the abnormality type of the test image and the model of the chip to be adjusted. A parameter adjustment interface is generated and displayed based on the preset parameters of the chip to be adjusted. The adjusted chip parameters are input by the user into the parameter adjustment interface, and the adjusted chessboard image is displayed on the screen. The adjusted chessboard image displayed on the screen is captured by the camera. The adjusted chessboard image is compared with the target image corresponding to the black and white chessboard image to determine whether the adjusted chessboard image displayed on the screen is a normal image. If it is a normal image, the current parameters of the chip to be adjusted are obtained and determined as the target chip parameters. If the image is abnormal, the chip parameters are adjusted until the chessboard image displayed on the screen is a normal image.

[0160] In another specific example, as Figure 9 shown, the chip parameter adjustment system provided by the embodiments of the present invention includes: a camera, a device on which the chip to be adjusted is installed, and an LED display screen. Among them, the camera is used to take pictures of the LED display screen, and by comparing the target picture corresponding to the test picture with the picture taken by the camera, it is determined whether there is an abnormality in the test picture. In the embodiments of the present invention, the test picture list includes four types: grid, color bar, grayscale, and chessboard. A wizard is set in the order of grid, grayscale, color bar, and chessboard (the grid can handle many imperceptible problems and is processed first, and the execution order is designed according to the above idea). Since the adjustment methods and parameters of different chips are different, this system needs to be compatible with different chips, and the parameters of the chip to be adjusted are adjusted according to the parameter adjustment strategies corresponding to different abnormal types, so as to achieve the purpose of optimizing the display effect.

[0161] The automatic debugging steps are as Figure 10 shown:

[0162] Step 1: Sort out common abnormal types as wizards (for example, it can include: upper ghosting, lower ghosting, bad point crosshair, first row being dim, low gray horizontal stripes, color block, low gray color deviation, gray jump, coupling, a total of 9 wizards);

[0163] Step 2: Control the display screen through the chip to be adjusted to display the test picture corresponding to wizard i, and take pictures of the LED display screen picture corresponding to wizard i through the camera;

[0164] Step 3: Compare the LED display screen picture (test picture) corresponding to wizard i with the standard test picture (the target picture corresponding to the test picture);

[0165] Step 4: If the test pictures corresponding to wizard i are all consistent with the target pictures corresponding to the test pictures, and i < n, obtain the current parameters of the chip to be adjusted, save the current parameters of the chip to be adjusted, i + 1, and return to execute Step 2;

[0166] Step 5: If the test pictures corresponding to wizard n are not all consistent with the target pictures corresponding to the test pictures, execute Step 6;

[0167] Step 6: Adjust the parameters corresponding to wizard i, and after adjusting the parameters corresponding to wizard i, return to execute Step 2.

[0168] It should be noted that the test pictures corresponding to wizard i may include: at least one test picture of the grid type test picture of at least one color, at least one test picture of the grayscale type test picture of at least one color, at least one test picture of the color bar type test picture of at least one color, and at least one test picture of the chessboard type of at least one color.

[0169] The chip parameter adjustment system provided in this embodiment of the invention guides users through the operation in a wizard-like manner, reducing the learning difficulty and enhancing the user experience.

[0170] The technical solution of this embodiment executes target operations sequentially according to a test image list in a set time sequence. The target operations include: displaying test images on a screen controlled by the chip to be adjusted; acquiring test images through a target device; if the test images are abnormal, matching the abnormality type of the test images with the model of the chip to be adjusted to preset parameters of the chip to be adjusted, and adjusting the parameters to make the test images normal; when the last test image in the test image list is a normal image, determining the current parameters of the chip to be adjusted as the target chip parameters, thus automatically selecting and adjusting the chip parameters according to the test image list to optimize the display effect.

[0171] Example 2

[0172] Figure 11 This is a schematic diagram of a chip parameter adjustment device provided in an embodiment of the present invention. This embodiment is applicable to chip parameter adjustment. The device can be implemented using software and / or hardware, and can be integrated into any device that provides chip parameter adjustment functionality, such as… Figure 11 As shown, the chip parameter adjustment device specifically includes an execution module 210 and a parameter determination module 220.

[0173] The execution module is used to perform target operations sequentially according to a set time sequence based on a list of test images. The target operations include: displaying test images on a screen controlled by the chip to be adjusted; acquiring test images through a target device; if the test images are abnormal, matching preset parameters of the chip to be adjusted based on the type of abnormality and the model of the chip to be adjusted, and adjusting the parameters to make the test images normal. The list of test images includes at least one of the following: a grid-type test image of at least one color, a grayscale-type test image of at least one color, a color bar-type test image of at least one color, and a checkerboard-type test image of at least one color.

[0174] The parameter determination module is used to determine the current parameters of the chip to be adjusted as the target chip parameters when the last test image in the test image list is a normal image.

[0175] The above-described products can perform the methods provided in any embodiment of the present invention, and have the corresponding functional modules and beneficial effects for performing the methods.

[0176] Example 3

[0177] Figure 12 A schematic diagram of an electronic device 10 that can be used to implement embodiments of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0178] like Figure 12 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 may also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0179] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0180] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as chip parameter tuning methods.

[0181] In some embodiments, the chip parameter adjustment method may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the chip parameter adjustment method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the chip parameter adjustment method by any other suitable means (e.g., by means of firmware).

[0182] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0183] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0184] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0185] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0186] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0187] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0188] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0189] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A method for adjusting chip parameters, characterized in that, include: The target operations are executed sequentially according to the set timing based on the test image list. The target operations include: displaying test images on a screen controlled by the chip to be adjusted; acquiring test images through a target device; if the test images are abnormal, matching the abnormality type of the test images with the model of the chip to be adjusted using preset parameters of the chip to be adjusted, and adjusting the parameters to make the test images normal; the test image list includes at least one of the following: at least one grid-type test image of at least one color, at least one grayscale-type test image of at least one color, at least one color bar-type test image, and at least one checkerboard-type test image of at least one color. When the last test image in the test image list is a normal image, the current parameters of the chip to be adjusted are determined as the target chip parameters. Before matching the preset parameters of the chip to be adjusted based on the anomaly type of the test image and the model of the chip to be adjusted, the process further includes: If the test image is abnormal, and the similarity between the test image and the target image corresponding to the test image is greater than the target similarity threshold, then the target image parameters of the test image are obtained, wherein the target image parameters include at least one of the following: grid line type, line width, spacing and grayscale value; The test image is updated based on the target image parameters.

2. The method according to claim 1, characterized in that, The target operations are executed sequentially according to the set time sequence based on the list of test images, including: After adjusting the previous test image to a normal image, perform the target operation on the current test image; or; After determining that the previous test image is a normal image based on the previous test image and its corresponding target image, the target operation is performed on the current test image.

3. The method according to claim 1, characterized in that, Before executing the target operation according to the set timing sequence based on the test image list, it also includes: Retrieve the test image corresponding to each exception type in the exception type list; Generate a list of test images based on the test images corresponding to each exception type in the exception type list.

4. The method according to claim 1, characterized in that, If the test image is abnormal, then the target image parameters of the test image are obtained, including: If the test image is abnormal, then the image type of the test image is obtained; The target image parameters corresponding to the test image are determined based on the image type of the test image.

5. The method according to claim 1, characterized in that, If the test image is abnormal, then the preset parameters of the chip to be adjusted are matched according to the type of abnormality in the test image and the model of the chip to be adjusted, including: Obtain a list of exception types, wherein the list of exception types includes at least one exception type; Based on the list of abnormality types, determine whether the test image contains any of the abnormality types listed; If the test image contains an anomaly from the anomaly type list, then the preset parameters of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted.

6. The method according to claim 1, characterized in that, If the test image is abnormal, then the preset parameters of the chip to be adjusted are matched according to the type of abnormality in the test image and the model of the chip to be adjusted, including: Obtain the target image corresponding to the test image; If an anomaly is determined in the test image based on the test image and the corresponding target image, then the preset parameters of the chip to be adjusted are matched according to the anomaly type of the test image and the model of the chip to be adjusted.

7. A chip parameter adjustment device, characterized in that, include: The execution module is used to perform target operations sequentially according to a set timing sequence based on a list of test images. The target operations include: displaying test images on a screen controlled by the chip to be adjusted; acquiring test images through a target device; if the test images are abnormal, matching preset parameters of the chip to be adjusted based on the type of abnormality and the model of the chip to be adjusted, and adjusting the parameters to make the test images normal. The list of test images includes at least one of the following: a grid-type test image of at least one color, a grayscale-type test image of at least one color, a color bar-type test image of at least one color, and a checkerboard-type test image of at least one color. The parameter determination module is used to determine the current parameters of the chip to be adjusted as the target chip parameters when the last test image in the test image list is a normal image. The execution module is further configured to: Before matching the preset parameters of the chip to be adjusted based on the anomaly type of the test image and the model of the chip to be adjusted, if the test image has an anomaly and the similarity between the test image and the target image corresponding to the test image is greater than the target similarity threshold, then the target image parameters of the test image are obtained, wherein the target image parameters include at least one of the following: grid line type, line width, spacing and grayscale value; The test image is updated based on the target image parameters.

8. An electronic device, characterized in that, The electronic device includes: At least one processor; and A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform the chip parameter adjustment method according to any one of claims 1-6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that cause a processor to execute the chip parameter adjustment method according to any one of claims 1-6.

Images