TOSA device testing device, system and method

Abstract

The present invention discloses a TOSA device testing device, system and method. The device comprises a test board and a soft belt for connecting the TOSA device. The test board is provided with a power supply circuit, a main control circuit and an interface for connecting the soft belt. The power supply circuit is used to supply power to the test board. The main control circuit has an I 2 C pin and the interface I 2 The main control circuit is connected to the C pin, the main control circuit is used to receive the mode switching signal and perform power-on mode switching. The main control circuit has at least one IDAC output terminal. The main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and to control its I 2 C pin outputs the control signal to the interface’s I 2 C pin, the control signal is configured to control the internal Driver of the TOSA device to be tested to output the corresponding driving current. The present invention can complete PIV testing and optical port coupling, lens coupling power-up, and MPD responsivity testing of various BOX-type TOSAs.

Description

Technical Field

[0001] The present invention belongs to the technical field of optical communication, and in particular relates to a TOSA device testing device, system and method. Background Art

[0002] During the manufacturing process of high-speed optical devices (TOSA device optical transmitter components), the BOX device series needs to undergo multiple production processes, such as PIV testing, MPD responsivity testing, lens coupling, optical port coupling, etc. In all these production processes, the TOSA device needs to be powered on through the TOSA device power-on board to complete the corresponding production process. During the PIV test, it is necessary to adjust the current driving the laser in steps, and a set of optical power values ​​will be obtained synchronously to form a PIV curve. By analyzing the PIV curve, the laser threshold current and KINK point can be calculated, and the fixed current optical power point (benchmarked with the module optical power) can be determined to determine whether the TOSA device is qualified. The existing PIV test software is provided by the manufacturer and needs to be used with the manufacturer's equipment. It is costly and inconvenient for secondary development. Both the equipment and the software are highly encapsulated, and it is difficult to analyze when problems occur. When there is an error, it is impossible to analyze whether it is a manufacturer's equipment problem or a software problem.

[0003] At present, conventional PIV testing requires special testing instruments, and each testing instrument is equipped with a testing software, which is not conducive to software compatibility. In addition, the interface content is solidified, which is not conducive to adapting to changes. When the PIV demand changes, it is necessary to purchase a new model of PIV testing instrument, and the old PIV instrument will be idle, which is not conducive to the expansion of equipment.

[0004] In addition, when coupling lenses and optical ports, the TOSA device also needs to be temperature controlled and powered on with a constant current. The coupling machine equipment manufacturer provides the host computer software. In addition to controlling the dimming coupling operation of the coupling machine, it is also necessary to control the power-on board to control the TOSA device. The company currently has a variety of TOSA devices, such as 100G LR4Driver in solution, 100G LR4 Driver out solution, 100G ER / ZR EML solution, 200G / 400G series, 10G / 25G series, etc., all of which require a power-on board. The current situation is that one series of products uses one or two power-on boards, resulting in a variety of power-on boards on the production line, which consumes a lot of manpower for maintenance. In addition, when the coupling machine switches products, it needs to switch the power-on board, which often causes abnormal stations and affects production efficiency.

[0005] When testing the MPD responsivity, it is necessary to add current to the TOSA device to fix its optical power at a certain point. By sampling the MPD response current and calculating the responsivity, it is possible to determine whether the MPD is qualified. The existing MPD responsivity test requires a separate customized test board, which requires a lot of manpower to maintain. Summary of the invention

[0006] The object of the present invention is to overcome at least one defect in the prior art and provide a TOSA device testing device, system and method.

[0007] The technical solution of the present invention is implemented as follows: The present invention discloses a TOSA device test device, comprising a test board and a soft belt for connecting the TOSA device, wherein the test board is provided with a power supply circuit, a main control circuit and an interface for connecting the soft belt, wherein the power supply circuit is used to supply power to the test board, and the I 2 C pin interfaces with the I 2 The main control circuit is connected to the C pin, the main control circuit is used to receive the mode switching signal and perform power-on mode switching, the main control circuit has at least one IDAC output terminal, and the main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and to control its I 2 C pin outputs control signals to the interface’s I 2 C pin, the control signal is configured to control the corresponding drive current of the Driver output inside the TOSA device.

[0008] Furthermore, the soft tape used to connect the TOSA device includes at least a plurality of soft tape combinations respectively used to connect with different types of TOSA devices, the TOP surface of the test board is provided with a first interface for connecting the soft tape, the BOT surface of the test board is provided with a second interface for connecting the soft tape, each soft tape combination includes two soft tapes, and the two soft tapes are respectively connected to the first interface and the second interface;

[0009] The flexible tape for connecting the TOSA device also includes a single flexible tape for connecting with the Driver in TOSA device, and the single flexible tape is connected with the first interface or the second interface.

[0010] Furthermore, a mode switching circuit is provided on the test board, and the mode switching circuit is connected to the main control circuit. The mode switching circuit is used to output a mode switching signal to the main control circuit according to a user instruction.

[0011] Furthermore, the mode switching circuit includes a switching switch, one end of the switching switch is grounded, and the other end of the switching switch is respectively connected to the first input end and the second voltage connection of the main control circuit.

[0012] Furthermore, the other end of the switch is connected to the second voltage (eg, 3.3V) via the resistor R56.

[0013] Furthermore, the switching switch is a dip switch.

[0014] Furthermore, the main control circuit has at least one first ADC pin for sampling and monitoring the laser drive current, and the test board is also provided with a laser drive current monitoring circuit, which is used to monitor the drive current output by the IDAC output terminal of the main control circuit and transmit the monitored information to the first ADC pin of the main control circuit;

[0015] or / and,

[0016] The main control circuit has at least one VDAC output terminal, and the test board is also provided with an EA drive circuit, the input terminal of the EA drive circuit is connected to the VDAC output terminal of the main control circuit, and the output terminal of the EA drive circuit is connected to the EA pin of the interface;

[0017] or / and,

[0018] The main control circuit has at least one second ADC pin for sampling the optical power monitoring chip MPD inside the TOSA device, each second ADC pin of the main control circuit is respectively connected to the MPD pin corresponding to the interface and one end of the second sampling resistor, and the other end of the second sampling resistor is grounded;

[0019] or / and,

[0020] The test board is also provided with a TEC control circuit for driving the TEC inside the TOSA device to work, and the TEC control circuit is respectively connected to the main control circuit and some pins of the interface;

[0021] or / and,

[0022] The test board is also provided with a communication interface for connecting to a host computer.

[0023] Further, the laser drive current monitoring circuit includes an amplifier circuit and a first sampling resistor connected in series between the IDAC output terminal of the main control circuit and the LD power-on pin of the interface, the amplifier circuit is used to amplify the voltage difference between the two ends of the first sampling resistor, and the output end of the amplifier circuit is connected to the first ADC pin of the main control circuit;

[0024] or / and,

[0025] The EA driving circuit includes an operational amplifier, wherein the in-phase input terminal of the operational amplifier is grounded via a resistor R36, the inverting input terminal of the operational amplifier is connected to the VDAC output terminal of the main control circuit via a resistor R32, the inverting input terminal of the operational amplifier is connected to the output terminal of the operational amplifier via a resistor R30 and a capacitor C50, the resistor R30 and the capacitor C50 are connected in parallel, the V+ pin of the operational amplifier is connected to a positive voltage, and the V- pin of the operational amplifier is connected to a negative voltage VSS;

[0026] or / and,

[0027] The first input end of the TEC control circuit is connected to the output pin TECON of the main control circuit, and the switch of the TEC control circuit is controlled by the TECON pin of the main control circuit. The TEC control output ends TEC+ and TEC- of the TEC control circuit are connected to the corresponding pins of the interface, and are connected to the TOSA device via a soft tape connected to the interface, so as to provide current to the TEC inside the TOSA device and drive the TEC to work. The second input end of the TEC control circuit is connected to the RTH pin of the interface, so as to receive the temperature sampled by the thermistor inside the TOSA device, and convert it into a voltage and output it to the third ADC pin of the main control circuit.

[0028] Further, the power supply circuit includes a first DC-DC circuit for outputting a first voltage to power a Driver inside the TOSA device, the output end of the first DC-DC circuit is connected to the Driver power supply pin of the interface, and the enable end of the first DC-DC circuit is connected to the first output end of the main control circuit; when in the first power-on mode, the main control circuit is used to control the first DC-DC circuit to output the first voltage to the Driver power supply pin of the interface;

[0029] or / and,

[0030] The power supply circuit includes a second DC-DC circuit, the output end of the second DC-DC circuit is connected to the main control circuit, and is used to output a reference voltage to the main control circuit, so that each IDAC output end of the main control circuit outputs a current, and the enable end of the second DC-DC circuit is connected to the second output end of the main control circuit;

[0031] or / and,

[0032] The power supply circuit includes a third DC-DC circuit, the output end of the third DC-DC circuit is connected to the EA driving circuit, and is used to output a negative voltage VSS to power the EA driving circuit. The enable end of the third DC-DC circuit is connected to the third output end of the main control circuit.

[0033] Furthermore, the power supply circuit includes a slow-start circuit, the input end of the slow-start circuit is connected to the input voltage, and the output end of the slow-start circuit outputs a second voltage. The input ends of the first DC-DC circuit, the second DC-DC circuit, and the third DC-DC circuit are connected to the second voltage.

[0034] Furthermore, the power supply circuit includes a power supply input interface, and the power supply input interface is connected to an input voltage.

[0035] Furthermore, a circuit for filtering power ripple is provided between the power input interface and the input voltage.

[0036] Furthermore, a capacitor and a magnetic bead L1 are provided between the power input interface and the input voltage terminal, one end of the magnetic bead L1 is respectively connected to one end of the capacitor C4 and the positive electrode of the power input interface, the other end of the capacitor C4 is grounded, the other end of the magnetic bead L1 is respectively connected to one end of the capacitor C1 and the input voltage terminal, and the other end of the capacitor C1 is grounded.

[0037] Furthermore, the power circuit includes an indicator light D1, the positive pole of the indicator light D1 is connected to the positive pole of the power input interface, and the negative pole of the indicator light D1 is grounded directly or via a resistor.

[0038] The present invention also discloses a TOSA device testing system, comprising a power supply, a host computer, a power meter and the TOSA device testing device as described above, wherein the host computer is connected and communicated with a test board, the power supply is connected with the test board to supply power to the test board, the interface of the test board is connected to the TOSA device to be tested through a soft tape, and the optical port of the TOSA device to be tested is connected to the optical power meter through an optical fiber.

[0039] The present invention also discloses a TOSA device testing method, including a PIV testing step of a TOSA device, specifically including:

[0040] Power the test board, and control the driver inside the TOSA device under test to output currents with different steps to power the laser through the test board, or control the test board to output currents with different steps to power the laser inside the TOSA device under test, so that the TOSA device under test emits light with different powers, and collects the corresponding optical power values;

[0041] Record the currents and corresponding optical power values ​​of different steps, record the currents and corresponding optical power values ​​of different steps, and calculate the threshold value, kink.

[0042] Furthermore, the currents and corresponding optical power values ​​of different steps are recorded, and the threshold value, kink, is calculated, including:

[0043] Get current and power data;

[0044] Preprocessing of current and power data;

[0045] Derivative the power data to obtain the threshold value;

[0046] Fit the derivative result with the current data to obtain kink;

[0047] The power data is derived to obtain a threshold value, specifically including: taking the first-order and second-order derivatives of the power, where the value of the current point corresponding to the maximum value of the second-order derivative is the threshold value ith;

[0048] The derivative result and the current data are fitted to obtain kink, specifically including: fitting the data of the first-order derivative of power and the current data to obtain a linear fitting value, and using the formula kink=Max(abs((the calculated value of the first-order derivative of power-the value after linear fitting) / the value after linear fitting))*100% to obtain the kink value.

[0049] Furthermore, the TOSA device testing method of the present invention further includes an MPD responsivity testing step, specifically including:

[0050] By setting the fixed-point optical power, the PD will generate a corresponding current, sample the optical power monitoring chip MPD inside the TOSA device, and calculate the MPD responsivity.

[0051] Furthermore, the TOSA device testing method of the present invention further includes an optical port coupling step, specifically including: supplying power to the test board, controlling the driver inside the TOSA device to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device, and collecting the corresponding optical power value;

[0052] The optical port position is adjusted until the optical power value reaches the target value, and then laser welding is performed to weld the optical port and the TOSA device shell together to complete the optical port coupling operation.

[0053] Furthermore, the TOSA device testing method of the present invention further includes a lens coupling step, specifically including: supplying power to the test board, controlling the driver inside the TOSA device to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device, and collecting the corresponding optical power value;

[0054] Adjust the lens position until the optical power reaches the target value, then stop and glue the lens to complete the lens coupling operation.

[0055] The present invention has at least the following beneficial effects: the present invention integrates the power-on temperature control of various device solutions of the company on a test board through hardware circuit design, and then connects it to the test board through a customized soft tape. The customized soft tape of the present invention is connected to the interface of the test board at one end and to the TOSA device at the other end, which can complete the power-on temperature control and MPD responsiveness test of various different devices. When switching TOSA devices, you only need to select the mode and replace the corresponding soft tape, which is convenient and simple to operate.

[0056] The test board of the present invention can support simultaneous power-on of multiple channels, and includes EA control function, real-time monitoring function of power-on current, and TEC control function. Therefore, the power-on board has a wide range of uses and powerful functions. It can be used for PIV testing of 10G, 25G, 100G, 200G, and 400G series BOX devices and lens coupling and optical port coupling power-on, and MPD responsivity testing.

[0057] The present invention is aimed at 100G LR4 Driver in scheme TOSA. This type of TOSA is completely different from other types of TOSA (without internal Driver) in terms of power-on mode. This type of TOSA has an internal integrated Driver, and needs to power the laser by controlling the Driver inside the TOSA, and needs to provide a corresponding voltage to the Driver inside the TOSA for power supply. The multifunctional TOSA power-on test board has been compatible with this type of TOSA and can support the power-on temperature control test of this type of TOSA.

[0058] The present invention is aimed at Driver out DML type and EML type TOSA. The power-on method of this TOSA is basically the same, and the laser can be driven to work by the Driver output current on the test board. EML type devices usually need to add EA on the device end for optical port coupling to ensure that the optical power calibration can be consistent with the module end. The multifunctional TOSA power-on test board also includes this function.

[0059] The present invention is aimed at the two major power-on modes of Driver in and Driver out / EML TOSA. The test board has a switch switching function and a status indication function, and can switch between the two power-on modes at any time. At the same time, it can ensure that when one mode is used for power-on, the power-on of the other mode will be turned off. In the case of a mode switching error or a soft tape use error, the TOSA device cannot be powered on. At the same time, after each power-on test is completed, the upper computer software will turn off the current output of the power-on board to prevent a short circuit caused by replacing the TOSA device with power on. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0061] Figure 1 A principle block diagram of a test board provided by an embodiment of the present invention;

[0062] Figure 2A functional block diagram of a TOSA device testing system provided by an embodiment of the present invention;

[0063] Figure 3 A circuit diagram of a power supply circuit provided by an embodiment of the present invention;

[0064] Figure 4 A circuit diagram of a mode switching circuit provided by an embodiment of the present invention;

[0065] Figure 5 A circuit diagram of a communication interface provided by an embodiment of the present invention;

[0066] Figure 6 A circuit diagram of a test pin provided by an embodiment of the present invention;

[0067] Figure 7 A circuit diagram of an interface provided by an embodiment of the present invention;

[0068] Figure 8 A schematic diagram of a main control circuit provided by an embodiment of the present invention;

[0069] Fig. 9 A schematic diagram of an EA driving circuit provided by an embodiment of the present invention;

[0070] Fig.10 A schematic diagram of a laser drive current monitoring circuit provided by an embodiment of the present invention;

[0071] Fig.11 A schematic diagram of a TEC control circuit provided by an embodiment of the present invention;

[0072] Fig.12 A flow chart of PIV parameter calculation provided by an embodiment of the present invention;

[0073] Fig.13 A schematic diagram of device end pins of a first flexible tape provided in an embodiment of the present invention;

[0074] Fig.14 A schematic diagram of the pins at the test board end of the first flexible tape provided in an embodiment of the present invention;

[0075] Fig.15 A schematic diagram of device end pins of a second flexible tape provided in an embodiment of the present invention;

[0076] Fig.16 A schematic diagram of the pins at the test board end of the second flexible tape provided by an embodiment of the present invention;

[0077] Fig.17 A schematic diagram of device end pins of a third flexible tape provided in an embodiment of the present invention;

[0078] Fig.18A schematic diagram of the test board pins of the third flexible tape provided in an embodiment of the present invention;

[0079] Fig.19 A schematic diagram of device end pins of a fourth flexible strip provided in an embodiment of the present invention;

[0080] Fig. 20 A schematic diagram of the test board end pins of the fourth flexible tape provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0081] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0082] In the description of the present invention, it should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0083] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features; in the description of the present invention, unless otherwise specified, "multiple" and "several" mean two or more.

[0084] Embodiment 1

[0085] See also Figures 1 to 11 The embodiment of the present invention provides a TOSA device testing device, including a test board. The test board is compatible with all 10G, 25G, 100G, 200G, and 400G series BOX devices. There are two power-on modes with significant differences, namely Driver in mode and Driver out & EML mode. The Driver in mode is only for the Driver in device. As the name implies, the Driver of the TOSA device is integrated inside the TOSA. Therefore, when powering on such a device, it is not necessary to use an external Driver output current to drive the laser. It is only necessary to supply the voltage required by the TOSA internal Driver and pass it through the I 2The C pin is connected to it, and the current output size is controlled by the MCU. Driver out & EML mode is the most common mode currently used, mainly used to power up TOSA devices without built-in Driver.

[0086] The test board is provided with a power supply circuit, a main control circuit and an interface for connecting a flexible belt, the power supply circuit is used to supply power to the test board, the power supply circuit includes a first DC-DC circuit for outputting a first voltage to supply power to a driver inside the TOSA device to be tested, the output end of the first DC-DC circuit is connected to the driver power supply pin of the interface, the enable end of the first DC-DC circuit is connected to the first output end of the main control circuit, and the I 2 C pin interfaces with the I 2 The main control circuit is connected to the C pin, the main control circuit is used to receive the mode switching signal and perform power-on mode switching, the main control circuit has at least one IDAC output terminal, and the main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and to control the first DC-DC circuit to output a first voltage to the Driver power supply pin of the interface when in the first power-on mode, and to control its I 2 C pin outputs control signals to the interface’s I 2 C pin, the control signal is configured to control the internal Driver of the TOSA device to be tested to output the corresponding drive current; when any kind of soft tape is connected to the interface, one end of the soft tape is connected to some pins of the interface, and the other end is used to connect to the corresponding TOSA device. The first power-on mode is the Driver in power-on mode. The second power-on mode is the Driver out power-on mode.

[0087] The soft tape used to connect the TOSA device includes at least a plurality of soft tape combinations respectively used to connect with different types of Driver out TOSA devices. The TOP surface of the test board is provided with a first interface for connecting the soft tape, and the BOT surface of the test board is provided with a second interface for connecting the soft tape. Each soft tape combination includes two soft tapes, and the two soft tapes are respectively connected to the first interface and the second interface.

[0088] The flexible tape for connecting the TOSA device also includes a single flexible tape for connecting with the Driver in TOSA device, and the single flexible tape is connected with the first interface or the second interface.

[0089] When any one of the flexible strips is connected to the first interface or the second interface, one end of the flexible strip is connected to at least part of the pins of the first interface or the second interface, and the other end is used to connect to the corresponding TOSA device.

[0090] The pins of the interface are designed to be compatible with a variety of TOSA devices.

[0091] See also Figures 13 to 20 The multiple soft tape combinations used to connect with different types of TOSA devices respectively include at least a first soft tape combination used to match (connect) with a Driver out DMLTOSA device and a second soft tape combination used to match (connect) with a Driver out EMLTOSA device.

[0092] When the TOSA device to be tested is a Driver-in TOSA device, the test board is connected to the Driver-in TOSA device through a single soft tape, namely, the first soft tape. The test board end pin of the first soft tape is used to connect to the first interface on the TOP surface of the test board, and the device end pin of the first soft tape is used to connect to the Driver-in TOSA device;

[0093] When the TOSA device to be tested is a Driver out DMLTOSA device, the test board is connected to the Driver out DMLTOSA device through a first soft tape combination. The first soft tape combination includes a second soft tape and a third soft tape, the test board end pin of the second soft tape is used to connect to the first interface on the TOP surface of the test board, and the device end pin of the second soft tape is used to connect to the Driver out DMLTOSA device; the test board end pin of the third soft tape is used to connect to the second interface on the BOT surface of the test board, and the device end pin of the second soft tape is used to connect to the Driver out DMLTOSA device.

[0094] When the TOSA device to be tested is a Driver out EMLTOSA device, the test board is connected to the Driver out EMLTOSA device through a second soft tape combination. The second soft tape combination includes a third soft tape and a fourth soft tape, the test board end pin of the fourth soft tape is used to connect to the first interface on the TOP surface of the test board, and the device end pin of the fourth soft tape is used to connect to the Driver out EMLTOSA device; the test board end pin of the third soft tape is used to connect to the second interface on the BOT surface of the test board, and the device end pin of the second soft tape is used to connect to the Driver out EMLTOSA device.

[0095] Driver inTOSA devices only need to be connected to one soft tape, because the pins used in this solution are all on one side of the test board. Driver out and EMLTOSA devices need to be connected to two soft tapes, because the pins used are distributed on the upper and lower sides of the test board.

[0096] When the first soft belt assembly is connected to the interface (including the first interface and the second interface), the first soft belt assembly is at least connected to the driver power supply pin, I2 When the second soft belt assembly and the third soft belt assembly are connected to the interface (including the first interface and the second interface), the second soft belt assembly and the third soft belt assembly are at least connected to the LD power-on pin of the interface.

[0097] In some embodiments, the main control circuit uses an MCU. The test board uses an MCU as the main control part. The MCU part of the circuit uses a chip model ADUCM320I. In addition to completing the main control function part of the entire power-on test board, the MCU also has four IDAC output currents by connecting the VCC_252.5V voltage as a reference voltage, which is used to drive the TOSA device in the Driver out & EML mode. Multiple ADC pins of the single-chip microcomputer are connected to the TOSA device, such as the MPD1, MPD2, MPD3, and MPD4 pins, which can be used to sample the optical power monitoring chip MPD inside the TOSA. By setting the fixed-point optical power, the PD will generate a corresponding current, and the sampling resistors R25, R26, R27, and R28 will convert it into sampling voltages MPD0, MPD1, MPD2, and MPD3. The MCU reports it to the host computer, and the MPD responsivity can be converted by formula calculation. By measuring the responsivity, it can be tested whether the MPD inside the TOSA device is qualified.

[0098] In some embodiments, the present invention uses an MCU of model ADUCM320I with 4 IDAC pins. It only needs to provide 2.5V voltage as a reference voltage to complete 4-way constant current source output for driving the laser. The EML type needs to add an additional EA control function in the Driver out mode. Through the EA driving circuit, the EA modulator inside the TOSA is controlled to complete the power-on test at a fixed EA voltage. The main reason is to test whether the EA function is normal. At the same time, using the conventional EA value of the module end for fixed-point coupling can also ensure that the optical power of the device end and the module end are accurately aligned, and there will be no large or small light at the module end.

[0099] In some embodiments, two 24-pin pins are reserved on the TOP surface and the BOT surface of the test board, and two 24-pin card sockets are welded to serve as the interface.

[0100] In some embodiments, a mode switching circuit is provided on the test board, and the mode switching circuit is connected to the main control circuit. The mode switching circuit is used to output a mode switching signal to the main control circuit according to a user instruction.

[0101] In some embodiments, the mode switching circuit includes a switch, one end of the switch is grounded, and the other end of the switch is connected to the first input terminal and the second voltage connection of the main control circuit respectively. The present invention controls the switching between the Driver in power-on mode and the Driver out power-on mode, i.e., the switching between the two modes, through the switch. In the Driver in power-on mode or the Driver out power-on mode, other circuits, such as the EA drive circuit, are controlled through software settings.

[0102] In some embodiments, the other end of the switch is connected to a second voltage (eg, 3.3V) via a resistor R56.

[0103] In some embodiments, the switching switch is a dip switch.

[0104] See also Figure 4 , U17 is the switching pin for the two power-on modes, Driver in and Driver out & EML. The pin is reserved on the test board and connected to an external dip switch through a wire. In actual use, the two power-on modes can be switched through this dip switch. D2 is the status indicator light for the two power-on modes, which is brought out through a wire. When the dip switch is closed, the Mode_SW pin level is pulled low, and this pin is connected to the MCU IO port P0.0. When P0.0 is at a low level, the power-on test board will enable the Driver in power-on mode, and the indicator D2 will be short-circuited, and the indicator light will go out. When the dip switch is disconnected, the Mode_SW pin level is at a high level, and P0.0 is at a high level at this time, and the test board will enable the Driver out & EML power-on mode.

[0105] In some embodiments, see Figure 6 In order to facilitate firmware debugging after the first version of the circuit is completed, multiple test pins are reserved on the test board. 2 C pin, four-way MCU output BIAS, and BIAS output by the sampling chip.

[0106] In some embodiments, the main control circuit has at least one first ADC pin for sampling and monitoring the laser drive current, and a laser drive current monitoring circuit is also provided on the test board. The laser drive current monitoring circuit is used to monitor the drive current output by the IDAC output end of the main control circuit and transmit the monitored information to the first ADC pin of the main control circuit.

[0107] The laser driving current monitoring circuit is used for real-time monitoring of the current on the powered laser. Through monitoring, it can be ensured that the current is accurately added to the laser.

[0108] The laser drive current monitoring circuit includes an amplifier circuit and a first sampling resistor connected in series between the IDAC output end of the main control circuit and the LD power-on pin of the interface. The amplifier circuit is used to amplify the voltage difference across the first sampling resistor. The output end of the amplifier circuit is connected to the first ADC pin of the main control circuit to output voltages TXBIAS1, TXBIAS2, TXBIAS3, and TXBIAS4 to the ADC pins AIN3, AIN4, AIN5, and AIN6 of the main control circuit, thereby completing real-time sampling and monitoring of the laser drive current.

[0109] One end of the first sampling resistor is connected to the IDAC output end of the main control circuit, and the other end of the first sampling resistor is connected to the LD power-on pin corresponding to the interface.

[0110] In some embodiments, Fig.10 The laser drive current monitoring circuit is shown in the figure. The chip model is MAX9634. The sampling resistors R16, R52, R20, R53, R21, R54, R24, R55 are connected in series in the circuit. There are four groups in total, corresponding to 4 channel currents respectively. Four MX9634 chips are connected in parallel at both ends of the sampling resistors, which can amplify the voltage difference at both ends of the sampling resistors by 50 times. The output voltages TXBIAS1, TXBIAS2, TXBIAS3, and TXBIAS4 are connected to the MCU ADC pins AIN3, AIN4, AIN5, and AIN6, thereby completing the real-time sampling and monitoring of the laser drive current.

[0111] In some embodiments, the main control circuit has at least one VDAC output terminal, and an EA driving circuit is also provided on the test board. The input terminal of the EA driving circuit is connected to the VDAC output terminal of the main control circuit, and the output terminal of the EA driving circuit is connected to the EA pin of the interface.

[0112] The EA driving circuit includes an operational amplifier, the in-phase input terminal of the operational amplifier is grounded via a resistor R36, the inverting input terminal of the operational amplifier is connected to the VDAC output terminal of the main control circuit via a resistor R32, the inverting input terminal of the operational amplifier is connected to the output terminal of the operational amplifier via a resistor R30 and a capacitor C50, the resistor R30 and the capacitor C50 are connected in parallel, the V+ pin of the operational amplifier is connected to a positive voltage, and the V- pin of the operational amplifier is connected to a negative voltage VSS. The V+ pin of the operational amplifier is grounded via a capacitor C54, and the V- pin of the operational amplifier is grounded via a capacitor C57. The positive voltage is a reference voltage.

[0113] The main control circuit is used to control the VDAC output end to output the EA setting voltage to the corresponding EA driving circuit respectively. The EA driving circuit is used to receive the voltage output by the VDAC output end of the main control circuit, and output the corresponding EA voltage, which is used to power on the EA in the EML TOSA device, and can complete the EA function test and the EA optical power test in the EML TOSA device.

[0114] like Fig. 9 The figure shows a four-way EA drive circuit, which uses a chip model MAX4233. The four pins EASET1, EASET2, EASET3, and EASET4 are connected to the MCU DAC pins to set the EA voltage. The value of the output terminal EABIAS is equal to the -EASET value. By setting the EASET pin voltage, the EA voltage setting can be completed. The EA drive circuit is mainly used to power on the EA in the EML TOSA device, and can complete the device EA function test and EA optical power test.

[0115] The EML type needs to add an additional EA control function in the Driver out mode. Through the EA drive circuit, the EA modulator inside the TOSA is controlled to complete the power-on test at a fixed EA voltage. The main reason is to test whether the EA function is normal. At the same time, using the conventional EA value of the module end for fixed-point coupling can also ensure that the optical power of the device end and the module end are accurately aligned, and there will be no light high or low at the module end.

[0116] In some embodiments, the main control circuit has at least one second ADC pin for sampling the optical power monitoring chip MPD inside the TOSA device, and each second ADC pin of the main control circuit is respectively connected to the MPD pin corresponding to the interface and one end of the second sampling resistor, and the other end of the second sampling resistor is grounded. Capacitors are connected in parallel at both ends of the second sampling resistor.

[0117] Multiple ADC pins of the microcontroller are connected to the TOSA device, such as the MPD1, MPD2, MPD3, and MPD4 pins, which can be used to sample the optical power monitoring chip MPD inside the TOSA. By setting the fixed-point optical power, the PD will generate a corresponding current, and the sampling resistors R25, R26, R27, and R28 will convert it into sampling voltages MPD0, MPD1, MPD2, and MPD3. The MCU reports it to the host computer, and the MPD responsivity can be calculated through formula calculation. By measuring the responsivity, it can be tested whether the MPD inside the TOSA device is qualified.

[0118] In some embodiments, a TEC control circuit is also provided on the test board, so that the test board is compatible with power-on temperature control tests of various TOSA devices. The first input end of the TEC control circuit is connected to the output pin TECON of the main control circuit, and the switch of the TEC control circuit is controlled by the TECON pin of the main control circuit. The TEC control output ends TEC+ and TEC- of the TEC control circuit are connected to the corresponding pins of the interface, and are connected to the TOSA device through a soft tape connected to the interface, and are used to provide current to the TEC inside the TOSA device and drive the TEC to work. The second input end of the TEC control circuit is connected to the RTH pin of the interface, and is used to receive the temperature sampled by the internal thermistor of the TOSA device, and convert it into a voltage output to the third ADC pin of the main control circuit. The TEC drive circuit is mainly used to provide current to the TEC inside the TOSA, drive the TEC to work, and cooperate with the internal thermistor of the TOSA to perform temperature sampling. The temperature point can be set by the MCU, and the TEC temperature can be kept stable by the PID algorithm.

[0119] like Fig.11 The figure shows the TEC drive circuit, including the TEC controller. The TEC controller U14 uses the chip model ADN8834. The TEC controller U14 pin TECON is connected to the MCU, and the TEC can be turned on and off through this pin. ITEC and VTEC are connected to the MCU ADC pins to monitor the working current and voltage of TEC. RTH is connected to the power-on test board card holder and connected to the internal thermistor of TOSA through a customized soft tape. When the temperature changes, the resistance of the thermistor will change, and the LTEMP voltage will change. LTEMP is connected to the MCU ADC pin. By monitoring this voltage, the internal temperature of TOSA can be monitored in real time. The TEC_SET pin is connected to the MCU DAC pin to complete the setting of the TEC temperature control temperature. The MCU monitors the real-time temperature and continuously adjusts the set temperature through the PID algorithm to make the actual temperature close to the target temperature, thereby maintaining a constant temperature.

[0120] In some embodiments, see Figure 5 The test board is also provided with a communication interface U2 for connecting to the host computer. U2 is the I 2 C pin, through which an external USB communication box is connected to a computer, the host computer can control the test board. When performing PIV testing on TOSA devices, an external programmable power supply and an optical power meter are required, and connected to a computer. The test board is connected to the TOSA device through a custom soft tape, and the TOSA device optical port is connected to the optical power meter through an optical fiber.

[0121] In some embodiments, the power supply circuit is mainly used to convert the external 3.3V voltage into 3.7V, 2.5V, and -3V. 3.7V is mainly used for the power supply of the Driver in the Driver in mode, 2.5V is mainly used for the MCU four-way current output reference voltage, and -3V is mainly used for the power supply of the chip MAX4233 in the EA driver circuit.

[0122] In some embodiments, the first DC-DC circuit uses a DC-DC chip U4. The model of the DC-DC chip U4 in this embodiment is a TPS6300 chip, which can boost the 3.3V voltage and output a 3.7V voltage for powering the TOSA internal driver in the driver in mode of the test board.

[0123] In some embodiments, the power supply circuit includes a second DC-DC circuit, the output end of the second DC-DC circuit is connected to the main control circuit, and is used to output a reference voltage to the main control circuit, so that each IDAC output end of the main control circuit outputs current, and the enable end of the second DC-DC circuit is connected to the second output end of the main control circuit. The second DC-DC circuit uses a DC-DC chip U5. The model of the DC-DC chip U5 in this embodiment is an MPM3810 chip, which is used to output a 2.5V voltage and is mainly used to supply the MCU four-way IDAC current reference voltage.

[0124] The power supply circuit includes a third DC-DC circuit, the output end of the third DC-DC circuit is connected to the EA driving circuit, and is used to output a negative voltage VSS to power the EA driving circuit. The enable end of the third DC-DC circuit is connected to the third output end of the main control circuit. The third DC-DC circuit uses a negative voltage chip U18. The negative voltage chip U18 is used to output a 3.3V voltage as a 3V negative voltage for use by the EA driving circuit chip.

[0125] The power supply circuit includes a slow-start circuit, the input end of the slow-start circuit is connected to the input voltage, and the output end of the slow-start circuit outputs a second voltage. The input ends of the first DC-DC circuit, the second DC-DC circuit, and the third DC-DC circuit are connected to the second voltage.

[0126] The slow-start circuit uses chip U3. This embodiment uses ADP196 chip from ADI. This circuit can protect and reduce Inrush and protect the subsequent circuits.

[0127] The power supply circuit includes a power input interface U1 , and the power input interface U1 is connected to an input voltage VCC.

[0128] Preferably, a circuit for filtering power ripple is provided between the power input interface U1 and the input voltage VCC.

[0129] A capacitor and a magnetic bead L1 are provided between the power input interface U1 and the input voltage terminal VCC. One end of the magnetic bead L1 is connected to one end of the capacitor C4 and the positive electrode of the power input interface respectively, and the other end of the capacitor C4 is grounded. The other end of the magnetic bead L1 is connected to one end of the capacitor C1 and the input voltage terminal respectively, and the other end of the capacitor C1 is grounded. The capacitor and the magnetic bead play a role in filtering the power ripple.

[0130] The power circuit comprises an indicator light D1 , the positive pole of the indicator light D1 is connected to the positive pole of the power input interface, and the negative pole of the indicator light D1 is directly or via a resistor connected to the ground.

[0131] The test board needs an external program-controlled power supply, which outputs 3.3V voltage to the power-on test board and is connected to the power-on test board through U1. D1 is the power-on indicator of the power-on test board.

[0132] The present invention integrates the power-on temperature control of the company's various device solutions on a test board through hardware circuit design, and then connects it to the test board through a customized soft tape. The customized soft tape of the present invention is connected to the interface of the test board at one end and to the TOSA device at the other end, which can complete the power-on temperature control and MPD responsiveness test of various different devices. When switching TOSA devices, you only need to select the mode and replace the corresponding soft tape, which is convenient and simple to operate.

[0133] The test board of the present invention can support simultaneous power-on of up to 4 channels, and includes EA control function, real-time monitoring function of power-on current, and TEC control function. Therefore, the power-on board has a wide range of uses and powerful functions. It can be used for PIV testing of 10G, 25G, 100G, 200G, and 400G series BOX devices, lens coupling and optical port coupling power-on, and MPD responsivity testing.

[0134] The present invention is aimed at 100G LR4 Driver in scheme TOSA. This type of TOSA is completely different from other types of TOSA (without internal Driver) in terms of power-on mode. This type of TOSA has an internal integrated Driver, and needs to power the laser by controlling the Driver inside the TOSA, and needs to provide a corresponding voltage to the Driver inside the TOSA for power supply. The test board has been compatible with this type of TOSA and can support the power-on temperature control test of this type of TOSA.

[0135] The present invention is aimed at Driver out DML type and EML type TOSA. The power-on method of this TOSA is basically the same. The laser can be driven to work by the Driver output current on the test board. EML type devices usually need to add EA at the device end for optical port coupling to ensure that the optical power calibration at the module end can be consistent. The test board also includes this function.

[0136] The present invention is aimed at the two major power-on modes of Driver in and Driver out / EML TOSA. The test board has a switch switching function and a status indication function, and can switch between the two power-on modes at any time. At the same time, it can ensure that when one mode is used for power-on, the power-on of the other mode will be turned off. In the case of a mode switching error or a soft tape use error, the TOSA device cannot be powered on. At the same time, after each power-on test is completed, the upper computer software will turn off the current output of the power-on board to prevent a short circuit caused by replacing the TOSA device with power on.

[0137] Embodiment 2

[0138] See also Figures 1 to 11 The embodiment of the present invention also discloses a TOSA device test system, including a power supply, a host computer, a power meter and the TOSA device test device as described in the first embodiment, wherein the host computer is connected and communicated with a test board, the power supply is connected with the test board to supply power to the test board, the interface of the test board is connected to the TOSA device to be tested through a soft tape, and the optical port of the TOSA device to be tested is connected to the optical power meter through an optical fiber.

[0139] When the TOSA device to be tested is a Driver in TOSA device, the test board is used to control the Driver inside the Driver in TOSA device to output currents with different steps to power the laser, so that the Driver in TOSA device emits light with different powers.

[0140] When the TOSA device to be tested is a Driver out DMLTOSA device or a Driver out EMLTOSA device, the test board is used to output currents with different steps to power the laser in the Driver out DMLTOSA device or the Driver out EMLTOSA device, so that the Driver out DMLTOSA device or the Driver out EMLTOSA device emits light with different powers;

[0141] The power meter is connected to the optical port of the Driver in TOSA device, the Driver out DMLTOSA device, or the Driver out EMLTOSA device through an optical fiber, and is used to detect the optical power value of the Driver in TOSA device, the Driver out DMLTOSA device, or the Driver out EMLTOSA device, and upload it to a host computer. The host computer is used to record the currents of different steps and the corresponding optical power values ​​to form a PIV curve.

[0142] The software control process of the present invention mainly includes the following parts: interface part, execution part, data display, data upload, data storage, and sequence management. The interface part includes the device management interface, data calibration interface, and system parameter interface. The execution part adopts the inheritance polymorphism idea of ​​the class, designs different execution steps into the same input and output, and completes the serialized scripted execution through the plug-in mode and the method steps of using the name execution. The management of the execution steps is completed through the sequence management tool. Finally, the data execution results are displayed on the interface, uploaded to the MES, and stored on the server. When the hardware system is built and the software can execute the steps normally, the temperature control and PIV curve collection can be performed according to the characteristics of different devices. The collected curve needs to go through a series of filtering before it can continue to be used, and finally the threshold, kink and other parameters that reflect the performance of the device can be calculated.

[0143] During the PIV test, the host computer controls the programmable power supply to supply power to the power-on test board, and then controls the TEC driver. According to the TEC temperature value set by the host computer, the TEC temperature is first kept stable (for TOSA devices with TEC), and then the power-on test board is controlled to control the internal TOSA Driver output current (Driver in mode) or directly output current to drive TOSA (Driver out & EML mode). The host computer continuously adjusts the output current in a certain step, and at the same time collects the optical power value of the optical power meter, and collects and records the corresponding current I and optical power P to form a PIV curve.

[0144] When coupling the lens or optical port of a TOSA device, an external programmable power supply and the optical power meter of the coupling machine are also required. The connection method is the same as that of the PIV test. The programmable power supply and the power-on board need to be connected to the computer, and the coupling machine is connected to the computer. During the coupling test, the manufacturer's own host computer software will first be initialized (different test specification programs are set according to different products, mainly for the number of channels, TEC temperature, and current size), and then the TEC temperature will be controlled. After the temperature stabilizes, power will be turned on. The optical power meter detects the corresponding optical power value. When the lens is coupled, the mechanical arm clamps the lens and adjusts the lens position through its algorithm. The software stops after detecting that the optical power reaches the target value. Then the lens can be glued to complete the lens coupling operation. When the optical port is coupled, the mechanical arm clamps the optical port and adjusts the optical port position through its algorithm. When the software detects that the optical power reaches the target value, the coupling machine performs laser welding to weld the optical port and the BOX device shell together to complete the optical port coupling operation.

[0145] Therefore, the test system of the present invention can complete PIV tests and optical port coupling, lens coupling power-up, and MPD responsivity tests of various BOX-type TOSAs.

[0146] Embodiment 3

[0147] See also Figures 1 to 12 The present invention also discloses a TOSA device testing method, including a PIV testing step of a TOSA device, specifically including:

[0148] Power the test board, control the TEC drive circuit, set the TEC temperature value according to the host computer, and first keep the TEC temperature stable (for TOSA devices with TEC);

[0149] The host computer uses I 2 C controls the control board, through the test board, to control the Driver inside the TOSA device to be tested to output currents with different steps to power the laser, or controls the test board to output currents with different steps to power the laser inside the TOSA device to be tested, so that the TOSA device to be tested emits light with different powers, and collects corresponding optical power values;

[0150] The currents of different steps and the corresponding optical power values ​​are recorded to form a PIV curve. Through the software algorithm, the threshold current and KINK point of the TOSA laser can be calculated to determine whether the TOSA device to be tested is qualified.

[0151] Furthermore, the TOSA device testing method of the present invention further includes an MPD responsivity testing step, specifically including:

[0152] By setting the fixed-point optical power, the PD will generate a corresponding current, sample the optical power monitoring chip MPD inside the TOSA device, and calculate the MPD responsivity.

[0153] Furthermore, the TOSA device testing method of the present invention further includes an optical port coupling step, specifically including: supplying power to the test board, controlling the driver inside the TOSA device to be tested to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device to be tested, and collecting the corresponding optical power value;

[0154] The optical port position is adjusted until the optical power value reaches the target value, and then laser welding is performed to weld the optical port and the TOSA device shell together to complete the optical port coupling operation.

[0155] Furthermore, the TOSA device testing method of the present invention further includes a lens coupling step, specifically including: supplying power to the test board, controlling the driver inside the TOSA device to be tested to output a driving current to power the laser through the test board, or controlling the test board to output a driving current to power the laser inside the TOSA device to be tested, and collecting the corresponding optical power value;

[0156] Adjust the lens position until the optical power reaches the target value, then stop and glue the lens to complete the lens coupling operation.

[0157] Furthermore, the calculation steps of threshold and kink include:

[0158] Step 1: Get current and power values;

[0159] Step 2: pre-process the current and power data, specifically including: performing moving average processing of multiple points (such as 10 points) on the original power value to prevent data jitter.

[0160] Step 3: Perform the first-order derivative (first-order derivative) and second-order derivative (second-order derivative) of power to obtain the first-order derivative calculation value P1 and the second-order derivative calculation value respectively, where the value of the current point corresponding to the maximum value of the second-order derivative is the threshold ith. Step 3: Fit the data of the first-order derivative of power with the current data to obtain the linear fitting value P2.

[0161] The fourth step is to use the formula kink = Max (abs ((P1-P2) / P2) * 100%) to obtain the kink value, where P1 is the calculated value of the first-order derivative of power and P2 is the value after linear fitting of power.

[0162] The present invention provides a test method for PIV of an optical device based on LabVIEW, which changes the current by designing a hardware circuit board, reads the data on the power meter, and then obtains the corresponding PIV curve and the calculation points on the curve through a certain filtering and fitting algorithm, thereby completing the determination of the device performance. The composition of the entire system is divided into four parts: device system construction, hardware driving circuit, software system, and algorithm analysis. The purpose of the device system part is to complete the hardware preparation work of scanning the PIV curve by combining hardware devices. The driving circuit board mainly realizes the change of the driving current of the device so that the device outputs different powers. The software system mainly realizes the compatibility of different hardware devices and the compatibility of different functions. The algorithm part mainly realizes the calculation of the PIV curve. The present invention can realize the effect of changing the EA condition to affect the power, controlling the TEC to achieve temperature control, and achieving the effect of affecting the size of the power by setting the BIAS bias current of the MCU control device. Therefore, it is very necessary for the present invention to build a flexible hardware system and software system, and design a suitable calculation method.

[0163] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A TOSA device testing device, characterized in that: The invention comprises a test board and a soft belt for connecting a TOSA device, wherein the test board is provided with a power supply circuit, a main control circuit and an interface for connecting the soft belt, wherein the power supply circuit is used to supply power to the test board, and the I 2 C pin interfaces with the I 2 The main control circuit is connected to the C pin, the main control circuit is used to receive the mode switching signal and perform power-on mode switching, the main control circuit has at least one IDAC output terminal, and the main control circuit is configured to control each of its IDAC output terminals to output a driving current to each LD power-on pin of the interface when in the second power-on mode, and to control its I 2 C pin outputs control signals to the interface’s I 2 C pin, the control signal is configured to control the corresponding drive current of the Driver output inside the TOSA device.

2. The TOSA device testing device according to claim 1, wherein: The soft tape used to connect the TOSA device includes at least a plurality of soft tape combinations respectively used to connect with different types of TOSA devices. The TOP surface of the test board is provided with a first interface for connecting the soft tape, and the BOT surface of the test board is provided with a second interface for connecting the soft tape. Each soft tape combination includes two soft tapes, and the two soft tapes are respectively connected to the first interface and the second interface. The flexible tape for connecting the TOSA device also includes a single flexible tape for connecting with the Driver in TOSA device, and the single flexible tape is connected with the first interface or the second interface.

3. The TOSA device testing device according to claim 1, wherein: The test board is provided with a mode switching circuit, which is connected to the main control circuit. The mode switching circuit is used to output a mode switching signal to the main control circuit according to a user instruction.

4. The TOSA device testing device according to claim 3, wherein: The mode switching circuit includes a switching switch, one end of the switching switch is grounded, and the other end of the switching switch is respectively connected to the first input end and the second voltage connection of the main control circuit.

5. The TOSA device testing device according to claim 1, wherein: The main control circuit has at least one first ADC pin for sampling and monitoring the laser drive current. The test board is also provided with a laser drive current monitoring circuit, which is used to monitor the drive current output by the IDAC output terminal of the main control circuit and transmit the monitored information to the first ADC pin of the main control circuit; or / and, The main control circuit has at least one VDAC output terminal, and the test board is also provided with an EA drive circuit, the input terminal of the EA drive circuit is connected to the VDAC output terminal of the main control circuit, and the output terminal of the EA drive circuit is connected to the EA pin of the interface; or / and, The main control circuit has at least one second ADC pin for sampling the optical power monitoring chip MPD inside the TOSA device, each second ADC pin of the main control circuit is respectively connected to the MPD pin corresponding to the interface and one end of the second sampling resistor, and the other end of the second sampling resistor is grounded; or / and, The test board is also provided with a TEC control circuit for driving the TEC inside the TOSA device to work, and the TEC control circuit is respectively connected to the main control circuit and some pins of the interface; or / and, The test board is also provided with a communication interface for connecting to a host computer.

6. The TOSA device testing device according to claim 5, characterized in that: The laser driving current monitoring circuit comprises an amplifier circuit and a first sampling resistor connected in series between the IDAC output terminal of the main control circuit and the LD power-on pin of the interface, wherein the amplifier circuit is used to amplify the voltage difference between the two ends of the first sampling resistor, and the output terminal of the amplifier circuit is connected to the first ADC pin of the main control circuit; or / and, The EA driving circuit includes an operational amplifier, wherein the in-phase input terminal of the operational amplifier is grounded via a resistor R36, the inverting input terminal of the operational amplifier is connected to the VDAC output terminal of the main control circuit via a resistor R32, the inverting input terminal of the operational amplifier is connected to the output terminal of the operational amplifier via a resistor R30 and a capacitor C50, the resistor R30 and the capacitor C50 are connected in parallel, the V+ pin of the operational amplifier is connected to a positive voltage, and the V- pin of the operational amplifier is connected to a negative voltage VSS; or / and, The first input end of the TEC control circuit is connected to the output pin TECON of the main control circuit, and the switch of the TEC control circuit is controlled by the TECON pin of the main control circuit. The TEC control output ends TEC+ and TEC- of the TEC control circuit are connected to the corresponding pins of the interface, and are connected to the TOSA device via a soft tape connected to the interface, so as to provide current to the TEC inside the TOSA device and drive the TEC to work. The second input end of the TEC control circuit is connected to the RTH pin of the interface, so as to receive the temperature sampled by the thermistor inside the TOSA device, and convert it into a voltage and output it to the third ADC pin of the main control circuit.

7. The TOSA device testing device according to claim 1, wherein: The power supply circuit includes a first DC-DC circuit for outputting a first voltage to power a Driver inside the TOSA device, wherein an output end of the first DC-DC circuit is connected to a Driver power supply pin of the interface, and an enable end of the first DC-DC circuit is connected to a first output end of the main control circuit; when in a first power-on mode, the main control circuit is used to control the first DC-DC circuit to output a first voltage to the Driver power supply pin of the interface; or / and, The power supply circuit includes a second DC-DC circuit, the output end of the second DC-DC circuit is connected to the main control circuit, and is used to output a reference voltage to the main control circuit, so that each IDAC output end of the main control circuit outputs a current, and the enable end of the second DC-DC circuit is connected to the second output end of the main control circuit; or / and, The power supply circuit includes a third DC-DC circuit, the output end of the third DC-DC circuit is connected to the EA driving circuit, and is used to output a negative voltage VSS to power the EA driving circuit. The enable end of the third DC-DC circuit is connected to the third output end of the main control circuit.

8. A TOSA device testing system, characterized in that: The invention comprises a power supply, a host computer, a power meter and a TOSA device test device as described in any one of claims 1 to 7, wherein the host computer is connected and communicated with a test board, the power supply is connected with the test board to supply power to the test board, the interface of the test board is connected to the TOSA device to be tested through a soft tape, and the optical port of the TOSA device to be tested is connected to the optical power meter through an optical fiber.

9. A TOSA device testing method, characterized in that: Using the TOSA device testing system as claimed in claim 8; The PIV test steps for TOSA devices include: Power the test board, and control the driver inside the TOSA device under test to output currents with different steps to power the laser through the test board, or control the test board to output currents with different steps to power the laser inside the TOSA device under test, so that the TOSA device under test emits light with different powers, and collects the corresponding optical power values; Record the current and corresponding optical power values ​​of different steps and calculate the threshold value and kink.

10. The TOSA device testing method according to claim 9, wherein: Record the current and corresponding optical power values ​​of different steps, and calculate the threshold and kink, including: Get current and power data; Preprocessing of current and power data; Derivative the power data to obtain the threshold value; Fit the derivative result with the current data to obtain kink; The power data is derived to obtain a threshold value, specifically including: taking the first-order and second-order derivatives of the power, wherein the value of the current point corresponding to the maximum value of the second-order derivative is the threshold value ith; The derivative result and the current data are fitted to obtain kink, specifically including: fitting the data of the first-order derivative of power and the current data to obtain a linear fitting value, and using the formula kink=Max(abs((the calculated value of the first-order derivative of power-the value after linear fitting) / the value after linear fitting))*100% to obtain the kink value.

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