A method and system for out-of-focus scanning stack diffraction imaging based on parallel iteration

Abstract

The application discloses a method and system for out-of-focus scanning stack diffraction imaging based on parallel iteration. The method for out-of-focus scanning stack diffraction imaging comprises the following steps: measuring a measured diffraction light field intensity generated by an actual illumination probe acting on a sample to be measured; obtaining initial probe, sample and guessed diffraction light field information; then performing weighted updating and evaluation on amplitude and phase information of the initial probe and the sample through a stack diffraction imaging algorithm until a mean square error (MSE) between the measured diffraction light field intensity and the guessed diffraction light field intensity is less than a threshold value. The iterative algorithm used in the method can process multiple groups of diffraction data in parallel, and the reconstructed probe and sample can be weighted and superimposed in the algorithm by using evaluation methods such as mean weight, image correlation and image sharpness, and the method has the advantages of fast iterative convergence speed and strong expansibility.

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