Method for testing sleep current of electronic control unit and related device

Abstract

The present disclosure relates to a method for testing sleep current of an electronic control unit and related apparatus. The method comprises: comparing a measured value of a first current of the electronic control unit with a theoretical value when a micro control unit of the electronic control unit is in a non-working period of a first intermittent working mode; if the measured value of the first current is not greater than the theoretical value, comparing a measured value of a second current of the micro control unit with the theoretical value when the micro control unit is in a working period of the first intermittent working mode; if the measured value of the second current is not greater than the theoretical value, comparing a measured value of a third current of the electronic control unit with the theoretical value when the micro control unit is in the first intermittent working mode; if the measured value of the third current is not greater than the theoretical value, comparing a measured value of a fourth current of a peripheral wake-up circuit of the electronic control unit with the theoretical value when the electronic control unit is in a second intermittent working mode; and if the measured value of the fourth current is not greater than the theoretical value, determining that the sleep current of the electronic control unit is acceptable.

Description

Technical Field

[0001] This disclosure relates to the field of vehicle electronics technology, and more specifically, to a method, apparatus, computing device, and non-transient storage medium for testing the sleep current of an electronic control unit. Background Technology

[0002] In recent years, Electronic Control Units (ECUs) have been increasingly integrated, leading to greater complexity in both hardware and software design. Consequently, testing the sleep current of ECUs has become increasingly difficult. Furthermore, with advancements in vehicle electronics technology and the continuous electrification and intelligentization of vehicle components, the number of ECUs installed in vehicles is growing. Failure to control the sleep current of each ECU within standard requirements can result in high power consumption, causing vehicle battery drain or even malfunctions, leading to a poor user experience. Summary of the Invention

[0003] A brief overview of this disclosure is given below to provide a basic understanding of some aspects of it. However, it should be understood that this overview is not an exhaustive summary of this disclosure. It is not intended to identify key or essential parts of this disclosure, nor is it intended to limit the scope of this disclosure. Its purpose is merely to present certain concepts of this disclosure in a simplified form as a prelude to the more detailed description that follows.

[0004] According to a first aspect of this disclosure, a method for testing the sleep current of an electronic control unit is provided. The electronic control unit includes a microcontroller and a peripheral wake-up circuit. The microcontroller has a first intermittent operating mode, comprising alternating non-operating periods and operating periods. The electronic control unit has a second intermittent operating mode, comprising the alternating non-operating periods and operating periods, and further comprising a query period during the operating periods for determining whether to wake the electronic control unit via the microcontroller and the peripheral wake-up circuit. The method includes comparing a measured value of a first current of the electronic control unit during a non-operating period of the first intermittent operating mode with a theoretical value. The method further includes comparing a measured value of a second current of the microcontroller during an operating period of the first intermittent operating mode with a theoretical value in response to the measured value of the first current being substantially no greater than the theoretical value. The method further includes comparing a measured value of a third current of the electronic control unit during the first intermittent operating mode with a theoretical value in response to the measured value of the second current being substantially no greater than the theoretical value. The method further includes comparing a measured value of a fourth current in the peripheral wake-up circuit with a theoretical value when the electronic control unit is in the second intermittent operating mode, in response to the measured value of the third current being substantially no greater than the theoretical value. The method also includes determining that the sleep current of the electronic control unit is acceptable in response to the measured value of the fourth current being substantially no greater than the theoretical value.

[0005] According to a second aspect of this disclosure, an apparatus for testing the sleep current of an electronic control unit is provided. The electronic control unit includes a microcontroller and a peripheral wake-up circuit. The microcontroller has a first intermittent operating mode, which includes alternating non-operating periods and operating periods. The electronic control unit has a second intermittent operating mode, which includes the alternating non-operating periods and operating periods, and further includes a query period during the operating periods for determining whether to wake the electronic control unit via the microcontroller and the peripheral wake-up circuit. The apparatus includes a first test unit, a second test unit, a third test unit, and a fourth test unit. The first test unit is configured to compare a measured value of a first current of the electronic control unit with a theoretical value during a non-operating period of the first intermittent operating mode. The second test unit is configured to compare a measured value of a second current of the microcontroller with a theoretical value during an operating period of the first intermittent operating mode, in response to the measured value of the first current being substantially no greater than the theoretical value. The third test unit is configured to compare a measured value of a third current of the electronic control unit with a theoretical value during a operating period of the first intermittent operating mode, in response to the measured value of the second current being substantially no greater than the theoretical value. The fourth test unit is configured to compare the measured value of the fourth current of the peripheral wake-up circuit with the theoretical value when the electronic control unit is in the second intermittent operating mode, and to determine that the sleep current of the electronic control unit is acceptable in response to the measured value of the fourth current being substantially no greater than the theoretical value.

[0006] According to a third aspect of this disclosure, a computing device is provided for testing the sleep current of an electronic control unit. The computing device includes one or more processors and a memory storing computer-executable instructions. When executed by the one or more processors, the computer-executable instructions cause the one or more processors to perform the method for testing the sleep current of an electronic control unit according to a first aspect of this disclosure.

[0007] According to a fourth aspect of this disclosure, a non-transient storage medium having computer-executable instructions stored thereon is provided. When executed by a computer, the computer-executable instructions cause the computer to perform the method for testing the sleep current of an electronic control unit according to a first aspect of this disclosure. Attached Figure Description

[0008] The foregoing and other features and advantages of this disclosure will become clear from the following description of embodiments illustrated in conjunction with the accompanying drawings. The drawings, incorporated herein and forming a part of the specification, are further used to explain the principles of this disclosure and to enable those skilled in the art to make and use it. Wherein:

[0009] Figure 1 A flowchart is shown of a method for testing the sleep current of an electronic control unit according to some embodiments of the present disclosure;

[0010] Figure 2 A non-limiting example circuit diagram is shown of a switch control circuit and a switch input circuit included in the peripheral wake-up circuit of an electronic control unit according to some embodiments of the present disclosure;

[0011] Figure 3 A flowchart illustrating a non-limiting example process of a method for testing the sleep current of an electronic control unit according to some embodiments of the present disclosure is shown;

[0012] Figure 4 A schematic block diagram of an apparatus for testing the sleep current of an electronic control unit according to some embodiments of the present disclosure is shown;

[0013] Figure 5 A schematic block diagram of a computing device for testing the sleep current of an electronic control unit is shown according to some embodiments of the present disclosure;

[0014] Figure 6 A schematic block diagram of a computer system on which embodiments of the present disclosure may be implemented is shown;

[0015] Figure 7 An illustrative diagram showing the first intermittent operating mode of the microcontroller of the electronic control unit and the second intermittent operating mode of the electronic control unit is provided.

[0016] Note that in the embodiments described below, the same reference numerals are sometimes used across different figures to denote the same parts or parts with the same function, and repeated descriptions are omitted. In some cases, similar reference numerals and letters are used to denote similar items, so once an item is defined in one figure, it does not need to be discussed further in subsequent figures.

[0017] For ease of understanding, the positions, dimensions, and extents of the structures shown in the accompanying drawings and other materials may not represent actual positions, dimensions, and extents. Therefore, this disclosure is not limited to the positions, dimensions, and extents disclosed in the accompanying drawings and other materials. Detailed Implementation

[0018] Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that, unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the present disclosure.

[0019] The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the scope of this disclosure or its application or use. That is, the structures and methods herein are shown in an exemplary manner to illustrate different embodiments of the structures and methods in this disclosure. However, those skilled in the art will understand that they merely illustrate exemplary ways that can be used to implement this disclosure, and not exhaustive ways. Furthermore, the drawings are not necessarily drawn to scale, and some features may be enlarged to show details of specific components.

[0020] In addition, techniques, methods and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods and equipment should be considered part of the specification.

[0021] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.

[0022] An ECU may include a microcontroller unit (MCU) and peripheral wake-up circuitry. The MCU may have a first intermittent operating mode, which includes alternating non-operating and operating periods. The ECU may have a second intermittent operating mode. The second intermittent operating mode of the ECU may be based on the first intermittent operating mode of the MCU. Specifically, the second intermittent operating mode includes the alternating non-operating and operating periods of the first intermittent operating mode, and within the operating periods, there is also a query period where the MCU and peripheral wake-up circuitry determine whether to wake up the ECU. It is understood that in some cases, the ECU may also have a first intermittent operating mode, which is equivalent to the MCU being in the first intermittent operating mode combined with the peripheral wake-up circuitry being in sleep mode.

[0023] For example, such as Figure 7As shown, the first intermittent operating mode 700A includes alternating operating periods (Ton) and non-operating periods (Toff). The MCU typically enters sleep mode during the non-operating period (Toff) and enters operating mode during the operating period (Ton). During the operating period (Ton) of the MCU's first intermittent operating mode 700A, the clock frequency of the clock source used by the MCU can be configured to be the same as the clock frequency used by the MCU in its normal operating mode (continuously operating), or, to reduce the MCU's power consumption during the operating period (Ton), it can be configured to be lower than, or even significantly lower than, the clock frequency used by the MCU in its normal operating mode. For example, a low-power timer can be enabled as a wake-up source during the non-operating period (Toff) of the MCU's first intermittent operating mode 700A so that the MCU can be periodically woken up to enter the operating period (Ton). For example, the period of the low-power timer can be set to 50 milliseconds, in which case the sum of the Ton duration and the Toff duration is 50 milliseconds. To reduce power consumption, during the off-peak period (Toff), only the clock source of the low-power timer (typically at a frequency of tens of kilohertz) can be kept active, while other clock sources such as external crystal oscillators and internal (slow and / or fast) crystal oscillators are turned off. Additionally, during the on-peak period (Ton), if the clock frequency required by the MCU is significantly lower than that required in normal operating mode, enabling the internal crystal oscillator is generally sufficient, and enabling the external crystal oscillator is unnecessary. This is because the startup time of an external crystal oscillator (typically in the millisecond range) is much longer than that of an internal crystal oscillator (typically in the tens of microseconds range). This increases the duration of the on-peak period (Ton), thereby increasing the average current of the MCU in the first intermittent operating mode, undesirably increasing the ECU's sleep current and thus increasing power consumption. If MCU peripherals (or more fully, peripheral devices) are required during the working period (Ton), only the necessary peripherals (such as analog-to-digital converters (ADCs), serial peripheral interfaces (SPI), general-purpose input / output (GPIO), etc.) and their associated clock sources can be enabled, while unnecessary peripherals and their associated clock sources are disabled. This reduces the MCU's power consumption during the working period (Ton). It is understood that the clock configurations given here regarding the working period (Ton) and non-working period (Toff) are merely exemplary and not restrictive. Those skilled in the art will appreciate that appropriate clock configurations can be selected based on actual needs.

[0024] Continue to refer to Figure 7The second intermittent operating mode 700B also includes alternating working periods Ton and non-working periods Toff. However, in addition, the second intermittent operating mode 700B has a query period Tc1 within each working period Ton, which determines whether to wake up the ECU via the MCU and external wake-up circuitry. In a sense, the MCU's first intermittent operating mode 700A is configured to implement the ECU's second intermittent operating mode 700B. It is understandable that each query period Tc1 can be configured to be within any time range of the corresponding working period Ton, as needed. In this paper, as... Figure 7 As shown, the time period between adjacent query periods Tc1 can be referred to as the non-query period Tc2. Therefore, the second intermittent operating mode 700B can also be considered as including alternating query periods Tc1 and non-query periods Tc2. In this paper, the sleep current of the ECU can refer to the average current of the ECU in the second intermittent operating mode, and can also be called hibernation current, quiescent current, or low-power current, etc.

[0025] To test the ECU's sleep current, the ECU can be set to a second intermittent operating mode. During this mode, the following tests should be conducted to ensure the ECU's wake-up functions are functioning correctly. After confirming the wake-up functions are working properly, the average current of the ECU in the second intermittent operating mode should be measured. If the measured average current exceeds the standard requirement for the ECU's sleep current, it indicates that the ECU's sleep current is unacceptable. Excessive sleep current may be caused by leakage current within the ECU or unnecessary excessive current consumption. In such cases, it is necessary to analyze the various causes and resolve the issues to reduce the ECU's sleep current until it meets the standard requirements.

[0026] However, the above testing methods may be inefficient. The ECU's sleep current has many components, including the current consumed by the MCU during the off-peak period (Toff), the current consumed by the MCU during the operating period (Ton), and the current consumed by the external wake-up circuit during the query period (Tc1). Leakage current or excessive current consumption (unnecessary current) may occur during one or more periods of the ECU's second intermittent operating mode (e.g., off-peak period (Toff), operating period (Ton), query period (Tc1), etc.) and / or be caused by one or more components of the ECU (e.g., MCU, external wake-up circuit, etc.). Therefore, directly measuring the average current of the ECU in the second intermittent operating mode makes it difficult to pinpoint the specific period or component causing the leakage current or excessive current consumption. This makes it difficult to comprehensively, accurately, and quickly analyze the cause and resolve the problem to bring the ECU's sleep current to an acceptable range.

[0027] To further address the aforementioned issues, this disclosure provides a method for testing the sleep current of an electronic control unit (ECU). The method involves phased testing in the following order: a non-working period where the ECU's MCU remains in a first intermittent operating mode; a working period where the ECU's MCU remains in the first intermittent operating mode; a period where the ECU's MCU is in the first intermittent operating mode (the MCU alternately experiences non-working and working periods); and a period where the ECU is in a second intermittent operating mode (the MCU alternately experiences non-working and working periods, and the peripheral wake-up circuit alternately experiences query and non-query periods). This phased testing clarifies which stage the leakage current or excessive current consumption occurs in and which component is causing it. Based on the characteristics of that stage and / or component, targeted troubleshooting of the ECU's hardware and software is conducted. This effectively reduces the difficulty of analysis, decreases the workload, and improves the coverage, accuracy, and efficiency of the troubleshooting, thereby further reducing the ECU's sleep current. The sleep current of the ECU not only meets standard requirements but can be kept as low as possible to achieve low power consumption.

[0028] The following will combine Figure 1 A method 100 for testing the sleep current of an electronic control unit (ECU) according to various embodiments of the present disclosure is described in detail. It will be understood that actual methods for testing the sleep current of an ECU may include other steps, but these are not discussed herein to avoid obscuring the essential points of the disclosure, and these other steps are not shown in the accompanying drawings. Furthermore, terms such as “first,” “second,” “third,” “fourth,” etc., may be used herein for reference only and are not intended to be limiting. For example, unless the context clearly indicates otherwise, the terms “first,” “second,” “third,” “fourth,” and other such numerical terms relating to structures or elements do not imply any order or sequence.

[0029] like Figure 1 As shown, method 100 includes steps S102 to S110.

[0030] At step S102, the measured value of the first current of the electronic control unit (ECU) during the non-working period Toff when the microcontroller unit (MCU) is in the first intermittent working mode is compared with the theoretical value.

[0031] For example, in some embodiments, the measured value of the first current is determined by measuring the current of the ECU with all chips of the ECU except the MCU in a preset mode and during a non-operating period Toff with the MCU in a first intermittent operating mode, and the theoretical value of the first current is determined based on the rated current of all the other chips of the ECU in the preset mode and the rated current of the MCU in sleep mode. Specifically, the measured value of the first current can be considered as the sum of the measured currents of all the other chips of the ECU except the MCU in the preset mode and the measured currents of the MCU during the non-operating period of the first intermittent operating mode, while the theoretical value of the first current can be considered as the sum of the rated currents of all the other chips of the ECU in the preset mode and the rated currents of the MCU in sleep mode. Note that, in this document, the preset mode of each of the other chips of the ECU can be sleep mode, but it can also be other modes (e.g., intermittent operating mode, normal operating mode, etc.), as long as these chips maintain the same mode assumed during measurement as those assumed during theoretical calculation. In some cases, setting the preset mode to sleep mode may be advantageous because it is closer to the actual ECU operating state corresponding to the ECU sleep current. In this case, the measured value of the first current can be determined by measuring the current of the ECU during the non-working period Toff when all chips of the ECU except the MCU are in sleep mode and the MCU is in the first intermittent working mode. Accordingly, the theoretical value of the first current can be determined based on the rated current of all chips of the ECU (including the MCU and all other chips) in sleep mode.

[0032] For non-limiting illustrative purposes, the measured and theoretical values ​​of the first current can be determined through the following process. After power-on, the MCU can operate in normal mode for a period of time to enter the non-working period Toff of the first intermittent operating mode after the sleep requirements are met. Before the MCU enters the non-working period Toff, all chips in the ECU except the MCU are put into sleep mode, external watchdog timers (if any) located outside the MCU in the ECU are turned off, and the previously mentioned low-power timers used for periodically waking up the MCU are disabled so that the MCU remains in the non-working period Toff. While the MCU is in the non-working period Toff, the current of the ECU is measured as the measured value of the first current. Those skilled in the art will understand various suitable means for measuring the current of the ECU, such as, but not limited to, directly connecting an ammeter in series on one of the ECU's power lines and reading the ammeter's reading under the aforementioned conditions (before the actual reading, the ammeter's current reading can be cleared, allowing the ammeter to re-acquire current, and then reading its average current value) as the measured value of the first current. Accordingly, you can consult the datasheet or reference manual for each chip in the ECU to find the rated current of each chip in sleep mode (or low-power mode). You can also focus on the methods for putting the chip into sleep mode for measurement purposes. If a typical current value exists for a certain mode, the rated current for that mode can be taken as that typical value. If no typical current value exists for a certain mode, the rated current for that mode can be taken as the maximum or minimum value. Specifically, if the manual only lists the maximum current of a chip in sleep mode, and this maximum current does not exceed the microamp level (e.g., only a few microamps), it is recommended to ignore the rated current of that chip in sleep mode when calculating the theoretical value of the first current. This is because the maximum current is often for extreme operating conditions, such as the current under high temperature and high pressure, while the current of the chip at normal temperature and pressure will be very small and negligible. Finally, the sum of the rated currents of each chip in sleep mode (or low-power mode) on the ECU can be used as the theoretical value of the first current.

[0033] After obtaining the measured value and the theoretical value of the first current, the two are compared. In some embodiments, in response to the measured value of the first current being substantially greater than the theoretical value, it is determined that the ECU generates leakage current and / or consumes unnecessary current during the non-operating period Toff when the MCU is in the first intermittent operating mode. Therefore, abnormal states that the ECU may exhibit during the non-operating period Toff when the MCU is in the first intermittent operating mode can be further investigated until the measured value of the first current is substantially no greater than the theoretical value. It should be understood that investigation involves analyzing causes and resolving problems, therefore, the first current needs to be remeasured and the current measured value compared with the theoretical value after each time one or more problems are resolved or after all problems are resolved. For example, investigation can be combined with the ECU's hardware and software design. In some embodiments, troubleshooting possible abnormal states of the ECU during the non-operating period Toff of the first intermittent operating mode includes at least one of the following: confirming whether each chip of the ECU other than the MCU is in the operating state it should be in (e.g., when a chip is required to be in sleep mode, confirm whether the chip is actually in sleep mode; if it is found that the chip is not actually in sleep mode (causing unnecessary current consumption), then an attempt should be made to put it into sleep mode (e.g., refer to the method for putting the chip into sleep mode indicated in the manual); if the chip cannot enter sleep mode, it indicates that the chip is faulty, and it can be repaired or replaced); or confirming whether each pin of the MCU is in the level state it should be in during the non-operating period Toff of the first intermittent operating mode (e.g., a pin should be in a low level state but is incorrectly in a high level state, resulting in leakage current).

[0034] In some examples, the phrase "the measured value of the first current is substantially greater than the theoretical value" may include requiring the measured value of the first current to be twice or more than the theoretical value of the first current. By reasonably setting the degree to which the measured value of the first current, which requires further investigation, is greater than the theoretical value, the benefits of investigation can be maximized to outweigh the costs, thereby improving testing efficiency. In some embodiments, when the measured value of the first current is greater than the theoretical value by a factor of milliamperes or more (e.g., several milliamperes), it can be confirmed whether each chip of the ECU, excluding the MCU, is in the operating state it should be in. Then, after the state of each chip has been correctly adjusted (no longer consuming unnecessary current), the first current can be remeasured and the measured value compared with the current value. In some embodiments, when the measured value of the first current is greater than the theoretical value by a factor of hundreds of microamperes or less (e.g., several hundred microamperes), it can be confirmed whether each pin of the MCU is in the level state it should be in during the non-operating period Toff of the first intermittent operating mode. The level state that the pin should be in can be determined by the pin's input / output configuration and pull-up / pull-down resistor configuration, etc. For example, during the non-operating period Toff of the MCU in the first intermittent operating mode, if a pin is configured as an input and has a pull-up resistor, the pin's voltage level should be high. If the pin's voltage level is confirmed to be low, it indicates that leakage current may have occurred at the pin. In this case, the cause of the pin's voltage level error should be analyzed, and the pin should be restored to the correct voltage level to suppress the leakage current. Those skilled in the art will understand that various suitable means are available for measuring the voltage level of a pin, including but not limited to measurement with an oscilloscope.

[0035] By analyzing the measured and theoretical values ​​of the first current, the potential range for leakage current and / or unnecessary current consumption on the ECU can be pinpointed to the MCU, and the time range can be further narrowed to the non-working period Toff of the MCU's first intermittent operating mode. This helps clarify whether there is leakage current within this range that causes increased ECU sleep current, and also helps clarify whether chips other than the MCU are consuming unnecessary current. When the measured value of the first current is no longer greater than the theoretical value, or the degree to which the measured value of the first current exceeds the theoretical value is not significant, it can be determined that there is no leakage current / unnecessary current within this range, or that the leakage current / unnecessary current within this range is not the main cause of the large ECU sleep current.

[0036] Continue to refer to Figure 1At step S104, in response to the measured value of the first current being substantially no greater than the theoretical value (e.g., the measured value is less than or equal to the theoretical value, or the measured value is greater than the theoretical value but does not reach the level that requires further investigation), the measured value of the second current of the microcontroller unit (MCU) during the working period Ton in the first intermittent working mode is compared with the theoretical value.

[0037] For example, in some embodiments, the theoretical value of the second current is determined based on the rated current of the MCU during the operating period Ton of the first intermittent operating mode, and the measured value of the second current is determined under the condition specified by the rated current by measuring the current of the ECU during the operating period Ton of the first intermittent operating mode and the current of the ECU during the non-operating period Toff of the first intermittent operating mode, respectively, with all other chips of the ECU except the MCU in a preset mode (similar to the previously discussed, which could be a sleep mode). Specifically, the measured value of the second current can be considered as equal to the difference between the current of the ECU measured during the operating period Ton of the first intermittent operating mode and the current of the ECU measured during the non-operating period Toff of the first intermittent operating mode. Note that in this embodiment, the measured value of the ECU current during the non-operating period Toff of the first intermittent operating mode is not necessarily equal to the initial measured value of the first current in step S102. This is because when the measured value of the first current in step S102 is greater than the theoretical value of the first current, possible abnormal states of the ECU can be investigated until the measured value of the first current is no greater than the theoretical value before proceeding to step S104. At this time, the measured value of the ECU current in step S104 when the MCU is in the non-working period Toff of the first intermittent working mode is obviously different from the initial measured value of the first current in step S102 (similar situations exist in subsequent steps, which will not be elaborated on at that time). In some embodiments, the rated current of the MCU in the working period Ton of the first intermittent working mode and the required conditions (e.g., the start / stop status of the various peripheral resources of the MCU, the MCU core clock frequency, etc.) can be obtained by consulting the corresponding datasheet of the MCU. Then, the rated current is used as the theoretical value of the second current, and the difference between the current of the ECU in the working period Ton and the non-working period Toff, measured under the conditions required by the rated current, is used as the measured value of the second current.

[0038] For non-limiting illustrative purposes, the measured and theoretical values ​​of the second current can be determined through the following process: All chips in the ECU except the MCU are put into sleep mode. Then, after the MCU enters the first intermittent operating mode (Ton), the duration of the Toon period can be intentionally extended temporarily via software delay (e.g., by setting a loop) to stabilize the measurement of the second current. Generally, a Toon period of 10 milliseconds or more is sufficient for stable measurement. Furthermore, the measurement conditions for the second current are set to the conditions required for calculating the theoretical value of the second current using the MCU's rated current (e.g., the start / stop status of various peripheral resources of the MCU, the MCU core clock frequency, etc.). Using the aforementioned ammeter measurement method as an example, the method for measuring the ECU current during the non-operating period (Toff) of the first intermittent operating mode is as described above. The method for measuring the ECU current during the Toon period of the first intermittent operating mode can include clearing the ammeter's currently displayed reading before formally taking the reading, allowing the ammeter to re-acquire the current, and then reading the maximum current value displayed as the measured value of the second current. The maximum current value was chosen here because even after the software delay, the duration of the operating period Ton is only 10 milliseconds, which causes the current during the operating period Ton to appear as a spike on the ammeter waveform. Understandably, if the operating period Ton is extended long enough, the average reading of the ammeter within a subset of the operating period Ton can still be read as the measurement value of the second current.

[0039] After obtaining the measured value and theoretical value of the second current, they are compared. In some embodiments, in response to the measured value of the second current being substantially greater than the theoretical value, it is determined that the MCU generates leakage current and / or consumes unnecessary current during the operating period Ton of the first intermittent operating mode. Therefore, abnormal states that may occur in the MCU during the operating period Ton of the first intermittent operating mode can be further investigated until the measured value of the second current is substantially no greater than the theoretical value. It should be understood that investigation involves analyzing causes and resolving problems, therefore, the second current needs to be remeasured and compared with the theoretical value after each time one or more problems are resolved or after all problems are resolved. For example, investigation can be performed in conjunction with the MCU's hardware and software configuration. In some embodiments, abnormal states of the MCU can be investigated by confirming whether each pin of the MCU is at the level it should be at during the first intermittent operating mode's operating period Ton (e.g., a pin that should be low is incorrectly high, causing leakage current) and / or by confirming whether each peripheral resource of the MCU is in the on / off state it should be in during the first intermittent operating mode's operating period Ton (e.g., a peripheral that should be disabled is incorrectly enabled, causing unnecessary current consumption). For example, suppose that when the MCU is in the first intermittent operating mode's operating period Ton, all peripheral resources of the MCU should be disabled, but when reviewing the software code, it is found that some peripheral resources of the MCU are enabled. In this case, the unintended enabled peripheral resources consume more current, causing the measured value of the second current to be greater than the theoretical value. Testing and / or investigation can be performed again after disabling these peripheral resources until the measured value of the second current is substantially no greater than the theoretical value. Alternatively, testing efficiency can be improved by reasonably setting the degree to which the measured value of the second current exceeds the theoretical value, requiring further investigation.

[0040] By analyzing the measured and theoretical values ​​of the second current, the potential range of leakage current and / or unnecessary current consumption on the ECU can be located within the MCU, and the time range can be further located within the operating period (Ton) of the MCU's first intermittent operating mode. This helps to clarify whether there is leakage current and / or unnecessary current consumption within this range that would cause an increase in the ECU's sleep current. When the measured value of the second current is no longer greater than the theoretical value, or the degree to which the measured value of the second current exceeds the theoretical value is not significant, it can be determined that there is no leakage current / unnecessary current within this range, or that the leakage current / unnecessary current within this range is not the main cause of the large ECU sleep current.

[0041] Note that the analysis of the second current must occur after the first current meets the standard (e.g., its measured value is basically no greater than the theoretical value). Otherwise, the analysis of the second current will be unreliable or its specificity will decrease. This is because the measured value of the first current will affect the measured value of the second current. If the reasons for the first current not meeting the standard are not investigated first, they will be mixed into the reasons for the second current not meeting the standard, making it difficult to decouple the complex causes.

[0042] Continue to refer to Figure 1 At step S106, in response to the fact that the measured value of the second current is substantially not greater than the theoretical value (e.g., the measured value is less than or equal to the theoretical value, or the measured value is greater than the theoretical value but does not reach the level that requires further investigation), the measured value of the third current of the ECU is compared with the theoretical value when the microcontroller unit (MCU) is in the first intermittent operating mode.

[0043] For example, in some embodiments, the measured value of the third current is determined by measuring the current of the ECU with all chips of the ECU except the MCU in a preset mode (similar to the previously discussed sleep mode) and the MCU in a first intermittent operating mode. The theoretical value of the third current is determined by measuring the current Ion of the ECU electronic control unit during the operating period Ton of the first intermittent operating mode and the current Ioff of the ECU during the non-operating period Toff of the first intermittent operating mode, with all chips of the ECU except the MCU in the preset mode (similar to the previously discussed sleep mode), and measuring the duration of the operating period Ton and the non-operating period Toff of the first intermittent operating mode (represented by Ton and Toff, respectively). Specifically, the theoretical value of the third current can be calculated as follows:

[0044] For illustrative purposes only, the measured and theoretical values ​​of the third current can be determined through the following process: All chips in the ECU except the MCU are put into sleep mode, and the previously mentioned low-power timer for periodically waking the MCU is enabled, thus putting the MCU in a first intermittent operating mode to alternate between operating periods (Ton) and non-operating periods (Toff). Using the aforementioned ammeter method as an example, before the actual reading, the ammeter reading can be cleared, allowing the ammeter to re-acquire current for a period (at least covering several cycles of the low-power timer), and then the average current value displayed is read as the measured value of the third current. The measurement methods for Ion and Ioff are similar to those discussed above regarding steps S102 and S104, and will not be repeated here. Specifically, Ton and Toff can be measured, for example, by setting the output of an idle I / O pin of the MCU to a high level at the software entry address of the operating period in the first intermittent operating mode, setting the pin output to a low level at the end of the operating period in the first intermittent operating mode and before entering the non-operating period, and then using an oscilloscope to observe the waveform of the pin's level state changing over time to determine the duration of Ton and Toff. Ultimately, The theoretical value of the third current is calculated. It's important to note that since determining the theoretical value relies on the measurements of Ton and Toff, inaccurate measurements of Ton and Toff may lead to an incorrectly calculated theoretical value of the third current, resulting in subsequent incorrect judgments about the relationship between the measured and theoretical values ​​of the third current. Therefore, it's necessary to check whether the MCU is running code during periods other than the high-level output of the aforementioned pins. If so, Ton may need to be corrected to include the other periods of code execution in addition to the high-level output of the aforementioned pins, and the theoretical value of the third current should be calculated based on the corrected Ton. Similarly, it's necessary to check whether the MCU is running code during periods of low-level output of the aforementioned pins. If so, Toff may need to be corrected to subtract the periods of code execution from the low-level output of the aforementioned pins, and the theoretical value of the third current should be calculated based on the corrected Toff. Otherwise, under otherwise unchanged conditions, deviations in the measured values ​​of Ton and / or Toff will lead to deviations in the calculated theoretical value of the third current, thus affecting subsequent analysis of the third current.

[0045] After obtaining the measured value and theoretical value of the third current, the two are compared. In some embodiments, in response to the measured value of the third current being substantially greater than the theoretical value, it is determined that the MCU consumes unnecessary current when the MCU is in the first intermittent operating mode. Therefore, possible abnormal states of the MCU when the MCU is in the first intermittent operating mode can be further investigated until the measured value of the third current is substantially no greater than the theoretical value. It should be understood that investigation includes analyzing causes and resolving problems, so the third current needs to be remeasured and the current measured value compared with the theoretical value after each time one or more problems are resolved or after all problems are resolved. For example, in some embodiments, the duration of the operating period Ton can be shortened while keeping the core clock frequency of the MCU fixed until the measured value of the third current is substantially no greater than the theoretical value. Since the analysis of the first and second currents has substantially eliminated possible leakage current and / or unnecessary current during each of the operating and non-operating periods in the first intermittent operating mode, if the measured value of the third current is still greater than the theoretical value at this time, it should not be due to the operating and non-operating periods being independent of each other, but rather their interrelationship leading to the consumption of unnecessary current. For example, with the period of a low-power timer remaining constant, a shorter non-working period can lead to a longer working period, resulting in unnecessary current consumption. Therefore, while keeping the MCU's core clock frequency constant (i.e., without affecting the MCU's operating speed), the duration of the working period Ton can be shortened to reduce the current drawn by the ECU when the MCU is in the first intermittent working mode, until the measured value of the third current is substantially no greater than the theoretical value. In some embodiments, the shortened duration of the working period Ton can be achieved by increasing the MCU's compiler optimization level, improving the MCU's code efficiency, and reducing the code redundancy during the MCU's operation in the working period Ton. It is understood that this is merely exemplary and not limiting, and those skilled in the art can adopt any other suitable methods to shorten the duration of the working period Ton in the first intermittent working mode. After analyzing and troubleshooting the first and second currents, if the measured value of the third current exceeds the theoretical value, it is possible to quickly determine that the cause is likely due to the working period of the first intermittent working mode being set too long, rather than an abnormal state of the ECU or MCU. This allows for effective and appropriate countermeasures, avoiding unnecessary work. Alternatively, testing efficiency can be improved by appropriately setting the degree to which the third current measurement value, which requires further investigation, exceeds the theoretical value.

[0046] By analyzing the measured and theoretical values ​​of the third current, the range of potentially unnecessary current consumption on the ECU can be pinpointed to the duration configuration of the operating and non-operating periods in the MCU's first intermittent operating mode. This helps clarify whether the duration of the operating period is unnecessarily long, causing excessive unnecessary current consumption that leads to increased ECU sleep current. When the measured value of the third current is no longer greater than the theoretical value, or the degree to which the measured value of the third current exceeds the theoretical value is not significant, it can be determined that the duration of the operating period is appropriate and not the main cause of the large ECU sleep current.

[0047] Note that the analysis of the third current must occur after the first and second currents have met the standards (e.g., their measured values ​​are generally no greater than the theoretical values). Otherwise, the analysis of the third current will be unreliable or less specific. This is because the measured values ​​of each of the first and second currents will affect the measured value of the third current and the calculation of its theoretical value. If the reasons for the first and second currents not meeting the standards are not investigated first, they will be mixed into the reasons for the third current not meeting the standards, making it difficult to decouple the complex causes.

[0048] Continue to refer to Figure 1 At step S108, in response to the fact that the measured value of the third current is substantially not greater than the theoretical value (e.g., the measured value is less than or equal to the theoretical value, or the measured value is greater than the theoretical value but does not reach the level that requires further investigation), the measured value of the fourth current of the peripheral wake-up circuit when the electronic control unit (ECU) is in the second intermittent operating mode is compared with the theoretical value.

[0049] For example, in some embodiments, the measurement of the fourth current is determined by measuring the ECU current Iecu1 with all chips of the ECU except the MCU and the peripheral wake-up circuit in a preset mode (similar to the previously discussed sleep mode) and the ECU in a second intermittent operating mode, and by measuring the ECU current Iecu2 with all chips of the ECU except the MCU and the peripheral wake-up circuit in the preset mode (similar to the previously discussed sleep mode), the peripheral wake-up circuit in sleep mode, and the MCU in a first intermittent operating mode. As mentioned earlier, since the difference between the second intermittent operating mode and the first intermittent operating mode is that the peripheral wake-up circuit is additionally activated during the query period Tc1 in the operating period Ton of the second intermittent operating mode, the measurement of the fourth current can be considered equal to (Iecu1 - Iecu2). Furthermore, the theoretical value of the fourth current can be determined by calculating the current Ic1 consumed by the peripheral wake-up circuit during the query period Tc1 and the current Ic2 consumed during the non-query period Tc2, and by measuring the durations of the query period Tc1 and the non-query period Tc2 (represented by Tc1 and Tc2, respectively). The non-query period Tc2 is located between two adjacent query periods Tc1, spanning from the end of the previous query period Tc1 to the beginning of the next query period Tc1. The duration of the non-query period Tc2 can be considered equal to the sum of the duration of the remaining part of the working period Ton excluding the query period Tc1 and the duration of the non-working period Toff, i.e., Tc2 = Ton - Tc1 + Toff. Specifically, the theoretical value of the fourth current can be calculated as follows: In addition, to simplify the measurement and calculation of the fourth current, the measured value of the fourth current can be determined with the capacitor element of the external wake-up circuit removed, and the theoretical value of the fourth current can be calculated without considering the capacitor element of the external wake-up circuit.

[0050] The ECU's second intermittent operating mode can be used to intermittently query whether there are changes in switching signals from vehicle components, such as whether a door handle switch has been pressed, while the ECU is in sleep mode. Once a change in the switching signal occurs, it may be necessary to wake the ECU. In the ECU system, there are many similar switching signal inputs, but these inputs cannot be configured as interruptible inputs; therefore, after the ECU is in sleep mode, the status of the corresponding switches needs to be intermittently queried. In some embodiments, the peripheral wake-up circuitry includes switch control circuitry and switching signal input circuitry. Figure 2 Non-limiting example circuit diagrams of a peripheral wake-up circuit 200, including a switch control circuit 200A and a switch input circuit 200B, are shown according to some embodiments of the present disclosure, wherein R1 to R7 are resistive elements, C1 is a capacitive element, and Qx and Qy are transistor elements. Figure 2As shown, the switch control circuit 200A is configured to generate a power signal VCC_PU1 for the digital input circuit 200B in response to the enable signal EN from the MCU and the external power supply signal VCC. When the enable signal EN is active, the power signal VCC_PU1 becomes the same as the external power supply signal VCC, thereby powering the digital input circuit 200B. The digital input circuit 200B is configured to provide the received switch signal Switch1 to the MCU (connected to the MCU's I / O pin via Switch1_MCU) in response to the power signal VCC_PU1 from the switch control circuit 200A. For example, assuming the external power supply signal VCC is 12V, the power signal VCC_PU1 is also 12V when the enable signal EN is active high; the switch signal Switch1 is a low-level active digital input, normally high when the switch is inactive, and low when the switch is pressed (e.g., grounded), and Switch1_MCU is also low. The MCU is configured to determine whether to wake up the ECU based on the switch signal Switch1 from the digital input circuit 200B. If the switch signal Switch1 is valid, the ECU is woken up and put into normal operation mode. If the switch signal Switch1 is invalid, the ECU goes to sleep. For example, the switch signal Switch1 is the signal of the vehicle door handle switch. When the vehicle door handle switch is pressed, it indicates that the user wants to open the door to access the vehicle interior. At this time, the switch signal Switch1 is valid, and the ECU is woken up to handle the user's subsequent operations. In this embodiment, the query period Tc1 is the period when the enable signal EN is valid, and the non-query period Tc2 is the period when the enable signal EN is invalid. Therefore, calculating the current Ic1 consumed by the peripheral wake-up circuit 200 during the query period Tc1 can include determining the current consumed by the switch control circuit 200A and the digital input circuit 200B respectively when the enable signal EN is valid. Specifically, Ic1 can be regarded as equal to the sum of the current consumed by the switch control circuit 200A and the digital input circuit 200B respectively. Furthermore, since the enable signal EN is invalid during the non-query period Tc2, the switch control unit 200A and the digital input circuit 200B do not generate current. Therefore, the current Ic2 consumed by the external wake-up circuit 200 during the non-query period Tc2 can be calculated to be zero. In addition, the measurement durations of both the query period Tc1 and the non-query period Tc2 include the duration of the period when the enable signal EN is valid (query period) and the duration of the period when the enable signal EN is invalid (non-query period). This is understandable. Figure 2The switch control circuit 200A and the digital input circuit 200B shown are merely exemplary and not limiting. In practice, the switch control circuit and digital input circuit of the peripheral wake-up circuit can be any other suitable circuit arrangement. Additionally, an ECU may have multiple digital input circuits; only one is shown here for illustrative purposes.

[0051] For non-restrictive illustrative purposes, see reference. Figure 2 The peripheral wake-up circuit shown can determine the measured and theoretical values ​​of the fourth current through the following process. Before measuring the fourth current, remove the capacitor components of the peripheral wake-up circuit, for example... Figure 2 The capacitor C1 shown causes all chips in the ECU except the MCU and the external wake-up circuit to enter sleep mode. It also enables the previously mentioned low-power timer for periodically waking up the MCU, thus putting the MCU in a first intermittent operating mode, alternating between the working period (Ton) and the non-working period (Toff). Furthermore, the MCU intermittently outputs a valid enable signal EN to the external wake-up circuit during the query period (Tc1), thereby achieving the ECU's second intermittent operating mode. Using the aforementioned ammeter method as an example, before the actual reading, the ammeter's current reading can be cleared, allowing the ammeter to re-collect the current for a period (at least covering several cycles of the low-power timer) before reading the average current value as the measurement value of Iecu1. Additionally, it puts all chips in the ECU except the MCU into sleep mode and enables the previously mentioned low-power timer for periodically waking up the MCU, thus putting the MCU in a first intermittent operating mode, alternating between the working period (Ton) and the non-working period (Toff). Taking the aforementioned ammeter method as an example, before the actual reading, the ammeter's current reading can be cleared, allowing the ammeter to re-collect the current for a period of time (at least covering several cycles of the low-power timer). The average current value displayed is then read as the measured value of Iecu2. Then, the measured value of the fourth current is determined as Iecu1 minus Iecu2. On the other hand, when calculating the theoretical value of the fourth current, assuming VCC = 12V, R1 = 4.7kΩ, R2 = R3 = R4 = 10kΩ, R5 = 2.2kΩ, R6 = R7 = 33kΩ, and disregarding the capacitor C1 = 22nF, the current consumed by the switch control circuit 200A during the query period Tc1 is the sum of the base current and collector current of Qx, which can be calculated as follows: The current consumed by the digital input circuit 200B during the query period Tc1 can be calculated as follows: (If there are multiple switch input circuits, they are usually connected in parallel, so their currents can be accumulated.) Therefore, the current Ic1 consumed by the external wake-up circuit 200 during the query period Tc1 can be calculated as (3.05mA + 0.175mA) = 3.225mA. The current Ic2 consumed by the external wake-up circuit 200 during the non-query period Tc2 can be considered as 0. Then, the duration of Tc1 and Tc2 is determined by observing the waveform of the enable signal EN's level change over time using an oscilloscope. Finally, the theoretical value of the fourth current is calculated as follows:

[0052] After obtaining the measured value and theoretical value of the fourth current, the two are compared. In some embodiments, in response to the measured value of the fourth current being substantially greater than the theoretical value, it is determined that the peripheral wake-up circuit generates leakage current and / or consumes unnecessary current when the ECU is in the second intermittent operating mode. Therefore, further investigation can be conducted to identify any abnormal states that may occur in the peripheral wake-up circuit when the ECU is in the second intermittent operating mode until the measured value of the fourth current is substantially no greater than the theoretical value. It should be understood that investigation includes analyzing causes and resolving problems, so the fourth current needs to be remeasured and compared with the theoretical value after each time one or more problems are resolved or after all problems are resolved. For example, investigation can be performed in conjunction with the hardware and software configuration of the peripheral wake-up circuit and the MCU. In some embodiments, any abnormal states that may occur in the peripheral wake-up circuit can be investigated by confirming whether the pin of the peripheral wake-up circuit used to receive the enable signal EN controls only the peripheral wake-up circuit. For example, when the pin of the peripheral wake-up circuit used to receive the enable signal EN incorrectly controls other pins, circuits, or chips of the ECU, these pins, circuits, or chips will unintentionally consume more current, ultimately causing a large sleep current of the ECU. Additionally or alternatively, the external wake-up circuit's potential abnormal state (e.g., a pin that should be low but is incorrectly high, causing leakage current) can be investigated by verifying whether the MCU's pin for receiving the switch signal Switch1 is at the level it should be at in the second intermittent operating mode. Furthermore, testing efficiency can be improved by appropriately setting the degree to which the fourth current measurement value, requiring further investigation, exceeds the theoretical value. This degree could be, for example, but not limited to, the fourth current measurement value exceeding 120% of the theoretical value.

[0053] Additionally, return to reference Figure 2As can be seen, the digital input circuit 200B includes capacitor C1. Assuming VCC_PU1 = 12V, R5 = 2.2kΩ, R6 = R7 = 33kΩ, and C1 = 22nF, when the digital input circuit 200B receives the power signal VCC_PU1, C1 begins to charge, causing the voltage at Switch1 to gradually increase during the charging process. Its charging time constant t is related to R5 and is t = R5 × C1 = 2.2kΩ × 22nF = 48.4μs. Theoretically, it would take an infinite amount of time to fully charge C1. Charging C1 to 99% would require approximately five times t. Even assuming charging is complete when it reaches between 86% and 95%, it would still require approximately two to three times t. Since the capacitance value of capacitor C1 affects the charging process duration, which in turn affects the query period Tc1 duration, and the query period Tc1 duration directly affects the ECU current in the second intermittent operating mode (especially the query period Tc1), it can be assumed that the capacitance value of capacitor C1 affects the ECU current in the second intermittent operating mode (especially the query period Tc1). In some embodiments, the current consumed by the peripheral wake-up circuit during the query period Tc1 can also be reduced by decreasing the capacitance of the capacitor element (e.g., C1) in the peripheral wake-up circuit.

[0054] By analyzing the measured and theoretical values ​​of the fourth current, the potential range for leakage current and / or unnecessary current consumption on the ECU can be located within the external wake-up circuit. Furthermore, the time range can be narrowed down to the ECU's second intermittent operating mode (especially the query period Tc1). This helps clarify whether there is leakage current and / or unnecessary current consumption within this range that could cause increased ECU sleep current. When the measured value of the fourth current is no longer greater than the theoretical value, or the degree to which the measured value exceeds the theoretical value is not significant, it can be determined that there is no leakage current / unnecessary current within this range, or that the leakage current / unnecessary current within this range is not the primary cause of the large ECU sleep current.

[0055] Note that the analysis of the fourth current must occur after the third current meets the standard (e.g., its measured value is basically no greater than the theoretical value). Otherwise, the analysis of the fourth current will be unreliable or its specificity will decrease. This is because the measured value of the third current will affect the measured value of the fourth current. If the reasons for the third current not meeting the standard are not investigated first, they will be mixed into the reasons for the fourth current not meeting the standard, making it difficult to decouple the complex causes.

[0056] Continue to refer to Figure 1At step S110, in response to the measured value of the fourth current being substantially no greater than the theoretical value (e.g., the measured value is less than or equal to the theoretical value, or the measured value is greater than the theoretical value but does not reach the level requiring further investigation), it is determined that the sleep current of the electronic control unit (ECU) is acceptable. Thus, through sequential phased testing and / or investigation of the non-working period of the first intermittent operating mode, the working period of the first intermittent operating mode, the first intermittent operating mode, and the second intermittent operating mode, it can be confirmed that the sleep current of the ECU conforms to the standard and is acceptable.

[0057] It should be noted that in the above method, the condition for advancing from each stage to the next is that the measured values ​​of the corresponding currents from the first to the fourth current are substantially no greater than the theoretical values ​​(e.g., the measured values ​​are less than or equal to the theoretical values, or even if the measured values ​​are greater than the theoretical values, the amount by which the measured values ​​exceed the theoretical values ​​is not enough to trigger a troubleshooting action). This balances short test process time with acceptable test results, which is beneficial for accelerating test efficiency. However, it is also possible to use troubleshooting actions in each stage to ensure that the measured values ​​of the corresponding currents from the first to the fourth current are not limited to being substantially no greater than the theoretical values, but are made as small as possible, thereby ultimately minimizing the ECU's sleep current and significantly reducing ECU power consumption.

[0058] It should also be noted that the situation described herein as "the measured value is substantially no greater than the theoretical value" can include situations where the measured value is less than or equal to the theoretical value, and can also include situations where the measured value is greater than the theoretical value but the amount exceeding it does not exceed a preset threshold. This preset threshold can be set based on the degree to which the measured value exceeds the theoretical value, requiring further investigation, and / or, for example, but not limited to, the amount by which the measured value exceeds the theoretical value not exceeding 20%, 15%, 10%, or 5% of the theoretical value. Accordingly, the situation described herein as "the measured value is substantially greater than the theoretical value" can include situations where the measured value is greater than the theoretical value, or can further include situations where the measured value is greater than the theoretical value and the amount exceeding it exceeds the aforementioned preset threshold.

[0059] For ease of understanding of the method 100 of this disclosure, Figure 3 A non-limiting example process 300 is shown. (e.g.) Figure 3As shown, firstly, the theoretical value I1' of the first current is determined (S302). Then, the measured value I1 of the first current is determined (S304). Next, it is determined whether I1 is not greater than I1' (S306). If it is determined that I1 is greater than I1' (S306 "No"), then it is determined that the ECU generates leakage current and / or consumes unnecessary current during the non-working period Toff of the first intermittent working mode (S308), and after checking for possible abnormal states of the ECU (S310), the measured value I1 of the first current is re-determined (S304). If it is determined that I1 is not greater than I1' (S306 "Yes"), then the theoretical value I2' of the second current is determined (S312) and the measured value I2 of the second current is determined (S314). Next, it is determined whether I2 is not greater than I2' (S316). If I2 is determined to be greater than I2' (S316 "No"), then it is determined that the MCU generates leakage current and / or consumes unnecessary current during the first intermittent operating mode's operating period Ton (S318), and after checking for possible abnormal states of the MCU (S320), the measured value of the second current I2 is re-determined (S314). If I2 is determined not to be greater than I2' (S316 "Yes"), then the theoretical value of the third current I3' (S322) and the measured value of the third current I3 are determined (S324). Next, it is determined whether I3 is not greater than I3' (S326). If I3 is determined to be greater than I3' (S326 "No"), then it is determined that the MCU consumes unnecessary current in the first intermittent operating mode (S328), and after shortening the duration of the first intermittent operating mode's operating period Ton while keeping the MCU's core clock frequency fixed (S330), the measured value of the third current I3 is re-determined (S324). If I3 is determined to be no greater than I3' (S326 "Yes"), then the theoretical value of the fourth current I4' (S332) and the measured value of the fourth current I4 are determined (S334). Next, it is determined whether I4 is no greater than I4' (S336). If I4 is determined to be greater than I4' (S336 "No"), then it is determined that the peripheral wake-up circuit generates leakage current and / or consumes unnecessary current in the second intermittent operating mode (S338), and after investigating possible abnormal states of the peripheral wake-up circuit (S340), the measurement value of the fourth current I4 is re-determined (S334). If I4 is determined to be no greater than I4' (S336 "Yes"), then the sleep current of the ECU is determined to be acceptable (S342).

[0060] Therefore, the method for testing the sleep current of an ECU provided in this disclosure, by sequentially testing the above four stages (the non-working period when the MCU is in the first intermittent working mode, the working period when the MCU is in the first intermittent working mode, the MCU in the first intermittent working mode, and the ECU in the second intermittent working mode), can accurately analyze the causes of leakage current and / or unnecessary current consumption in each stage and provide targeted troubleshooting methods, thereby improving the testing efficiency of the ECU's sleep current and effectively reducing the ECU's sleep current.

[0061] This disclosure also provides, in another aspect, an apparatus for testing the sleep current of an electronic control unit. (Reference) Figure 4 This illustrates a schematic block diagram of an apparatus 400 for testing the sleep current of an ECU according to some embodiments of the present disclosure. Figure 4 As shown, the device 400 includes a first test unit 402, a second test unit 404, a third test unit 406, and a fourth test unit 408.

[0062] The first test unit 402 can be configured to compare a measured value of the first current of the ECU with a theoretical value during a non-operating period when the MCU is in a first intermittent operating mode. The second test unit 404 can be configured to compare a measured value of the second current of the MCU with a theoretical value during an operating period when the MCU is in the first intermittent operating mode, in response to the measured value of the first current being substantially no greater than the theoretical value. The third test unit 406 can be configured to compare a measured value of the third current of the ECU with a theoretical value when the measured value of the second current is substantially no greater than the theoretical value. The fourth test unit is configured to compare a measured value of the fourth current of the peripheral wake-up circuit with a theoretical value when the ECU is in a second intermittent operating mode, and to determine that the sleep current of the ECU is acceptable, in response to the measured value of the fourth current being substantially no greater than the theoretical value.

[0063] Various embodiments of the apparatus 400 for testing the sleep current of an ECU are similar to the various embodiments of the method 100 for testing the sleep current of an ECU described above. Therefore, reference can be made to the foregoing description of the various embodiments of the method 100 for testing the sleep current of an ECU, which will not be repeated here.

[0064] This disclosure also provides a computing device for testing the sleep current of an electronic control unit, which may include one or more processors and a memory storing computer-executable instructions, which, when executed by the one or more processors, cause the one or more processors to perform a method for testing the sleep current of an electronic control unit according to any of the foregoing embodiments of this disclosure. Figure 5 As shown, computing device 500 includes one or more processors 502 and a memory 504 storing computer-executable instructions that, when executed by the one or more processors 502, cause the one or more processors 502 to perform a method 100 for testing the sleep current of an electronic control unit according to any of the foregoing embodiments of this disclosure. The one or more processors 502 may be, for example, a central processing unit (CPU) of computing device 500. The one or more processors 502 may be any type of general-purpose processor, or may be a processor specifically designed for testing the sleep current of an electronic control unit, such as an application-specific integrated circuit (“ASIC”). Memory 504 may include various computer-readable media accessible by the one or more processors 502. In various embodiments, memory 504 described herein may include volatile and non-volatile media, removable and non-removable media. For example, memory 504 may include any combination of random access memory (“RAM”), dynamic RAM (“DRAM”), static RAM (“SRAM”), read-only memory (“ROM”), flash memory, cache memory, and / or any other type of non-transient computer-readable media. The memory 504 may store instructions that, when executed by the processor 502, cause the processor 502 to execute the method 100 for testing the sleep current of an electronic control unit according to any of the foregoing embodiments of the present disclosure.

[0065] This disclosure also provides a non-transient storage medium having computer-executable instructions stored thereon, which, when executed by a computer, cause the computer to perform a method 100 for testing the sleep current of an electronic control unit according to any of the foregoing embodiments of this disclosure.

[0066] Figure 6A schematic block diagram of a computer system 600 on which embodiments of the present disclosure may be implemented is shown. The computer system 600 includes a bus 602 or other communication mechanism for transmitting information, and a processing means 604 coupled to the bus 602 for processing information. The computer system 600 also includes a memory 606 coupled to the bus 602 for storing instructions to be executed by the processing means 604; the memory 606 may be random access memory (RAM) or other dynamic storage device. The memory 606 may also be used to store temporary variables or other intermediate information during the execution of instructions to be executed by the processing means 604. The computer system 600 also includes a read-only memory (ROM) 608 or other static storage device coupled to the bus 602 for storing static information and instructions for the processing means 604. A storage device 610, such as a magnetic disk or optical disk, is provided and coupled to the bus 602 for storing information and instructions. Computer system 600 may be coupled via bus 602 to output device 612 for providing output to a user, such as, but not limited to, a display (such as a cathode ray tube (CRT) or liquid crystal display (LCD)), speakers, etc. Input device 614, such as a keyboard, mouse, microphone, etc., is coupled to bus 602 for transmitting information and command selections to processing device 604. Computer system 600 may perform embodiments of this disclosure. Consistent with certain implementations of this disclosure, results are provided by computer system 600 in response to processing device 604 executing one or more sequences of one or more instructions contained in memory 606. Such instructions may be read into memory 606 from another computer-readable medium, such as storage device 610. Execution of the sequence of instructions contained in memory 606 causes processing device 604 to perform the methods described herein. Alternatively, the teachings may be implemented using hard-wired circuitry instead of or in combination with software instructions. Therefore, implementations of this disclosure are not limited to any particular combination of hardware circuitry and software. In various embodiments, computer system 600 can be connected across a network to one or more other computer systems, such as computer system 600, to form a networked system via network interface 616. This network may include a private network or a public network such as the Internet. In a networked system, one or more computer systems can store data and supply data to other computer systems. As used herein, the term "computer-readable medium" refers to any medium that participates in providing instructions to processing device 604 for execution. Such media can take many forms, including but not limited to non-volatile media, volatile media, and transmission media. Non-volatile media include, for example, optical discs or magnetic disks such as storage device 610. Volatile media include dynamic memory such as memory 606. Transmission media include coaxial cables, copper wires, and optical fibers, including wiring that includes bus 602.Common forms of computer-readable media or computer program products include, for example, floppy disks, flexible disks, hard disks, magnetic tapes, or any other magnetic media, CD-ROMs, digital video discs (DVDs), Blu-ray discs, any other optical media, thumb drives, memory cards, RAM, PROMs and EPROMs, fast EPROMs, any other memory chips or cartridges, or any other tangible media from which a computer can read. Various forms of computer-readable media may be involved when carrying one or more sequences of one or more instructions to processing device 604 for execution. For example, instructions may initially be carried on a disk of a remote computer. The remote computer may load the instructions into its dynamic memory and transmit the instructions over a telephone line using a modem. A modem local to computer system 600 may receive data over a telephone line and convert the data into an infrared signal using an infrared transmitter. An infrared detector coupled to bus 602 may receive the data carried in the infrared signal and place the data on bus 602. Bus 602 carries the data to memory 606, from which processing device 604 retrieves and executes the instructions. Optionally, instructions received by memory 606 may be stored on storage device 610 before or after execution by processing device 604.

[0067] According to various embodiments, instructions configured to be executed by a processing device to perform a method are stored on a computer-readable medium. The computer-readable medium may be a device for storing digital information. For example, a computer-readable medium includes a compact disc read-only memory (CD-ROM) as known in the art for storing software. The computer-readable medium is accessed by a processor adapted to execute the instructions configured to be executed.

[0068] The foregoing has described one or more exemplary embodiments of this disclosure. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims may be performed in a different order than that shown in the embodiments and may still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require the specific or sequential order shown to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0069] The systems, devices, modules, or units described in the above embodiments can be implemented by computer chips or physical entities, or by products with certain functions. A typical implementation device is a server system. Of course, this disclosure does not exclude the possibility that, with the future development of computer technology, the computer implementing the functions of the above embodiments can be, for example, a personal computer, a laptop computer, an in-vehicle human-machine interaction device, a cellular phone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or any combination of these devices.

[0070] While one or more embodiments of this disclosure provide the method operation steps as described in the embodiments or flowcharts, more or fewer operation steps may be included based on conventional or non-inventive means. The order of steps listed in the embodiments is merely one possible execution order among many and does not represent the only execution order. In actual device or terminal product execution, the methods shown in the embodiments or drawings can be executed sequentially or in parallel (e.g., in a parallel processor or multi-threaded processing environment, or even a distributed data processing environment).

[0071] The terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, product, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, product, or apparatus. Without further limitation, the presence of other identical or equivalent elements in the process, method, product, or apparatus that includes said elements is not excluded. For example, the use of terms such as "first" or "second" to denote names does not indicate any particular order.

[0072] For ease of description, the above devices are described in terms of function, divided into various modules. Of course, when implementing one or more embodiments of this disclosure, the functions of each module can be implemented in one or more software and / or hardware, or a module that performs the same function can be implemented by a combination of multiple sub-modules or sub-units. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division; in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual couplings, direct couplings, or communication connections may be through some interfaces; indirect couplings or communication connections between devices or units may be electrical, mechanical, or other forms.

[0073] This disclosure is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this disclosure. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in one or more blocks of the flowchart illustrations and / or one or more blocks of the block diagrams.

[0074] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means that implement the functions specified in one or more flowcharts and / or one or more block diagrams. These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process, such that the instructions, which execute on the computer or other programmable apparatus, provide steps for implementing the functions specified in one or more flowcharts and / or one or more block diagrams.

[0075] Those skilled in the art will understand that one or more embodiments of this disclosure may take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, one or more embodiments of this disclosure may take the form of a computer program product implemented on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0076] One or more embodiments of this disclosure can be described in the general context of computer-executable instructions, such as program modules, that are executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc., that perform a particular task or implement a particular abstract data type. One or more embodiments of this disclosure can also be practiced in distributed computing environments where tasks are performed by remote processing devices connected via a communication network. In a distributed computing environment, program modules can reside in local and remote computer storage media, including storage devices.

[0077] The same or similar parts between the various embodiments of this disclosure can be referred to mutually, and each embodiment focuses on describing the differences from other embodiments. In particular, for the apparatus embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and relevant parts can be referred to the description of the method embodiments. In the description of this disclosure, the descriptions of terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., mean that the specific feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of this disclosure. In this disclosure, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples. Furthermore, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this disclosure and the features of the different embodiments or examples.

[0078] Additionally, when used in this disclosure, the terms “here,” “above,” “below,” “below,” “in the following,” “overall,” and similar terms should refer to the entirety of this disclosure and not any particular part thereof. Furthermore, unless expressly stated otherwise or otherwise understood in the context in which they are used, conditional language used herein, such as “may,” “possibly,” “for example,” “like,” etc., is generally intended to express that certain embodiments include, while other embodiments do not, certain features, elements, and / or states. Therefore, such conditional language is not generally intended to imply that one or more embodiments require features, elements, and / or states in any way, or whether such features, elements, and / or states are included or performed in any particular embodiment.

[0079] The above description is merely an embodiment of one or more embodiments of this disclosure and is not intended to limit the scope of the one or more embodiments of this disclosure. Various modifications and variations can be made to the one or more embodiments of this disclosure by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the scope of the claims.

Claims

1. A method for testing the sleep current of an electronic control unit, the electronic control unit including a microcontroller and a peripheral wake-up circuit, the microcontroller having a first intermittent operating mode, the first intermittent operating mode including alternating non-working periods and working periods, the electronic control unit having a second intermittent operating mode, the second intermittent operating mode including the alternating non-working periods and working periods, and further including a query period in the working periods for determining whether to wake up the electronic control unit via the microcontroller and the peripheral wake-up circuit, the method comprising: The measured value of the first current of the electronic control unit will be compared with the theoretical value during the non-operating period when the microcontroller is in the first intermittent operating mode; In response to the fact that the measured value of the first current is substantially no greater than the theoretical value, the measured value of the second current of the microcontroller will be compared with the theoretical value during the working period when the microcontroller is in the first intermittent working mode. In response to the fact that the measured value of the second current is substantially no greater than the theoretical value, the measured value of the third current of the electronic control unit will be compared with the theoretical value when the microcontroller is in the first intermittent operating mode; In response to the fact that the measured value of the third current is substantially no greater than the theoretical value, the measured value of the fourth current of the peripheral wake-up circuit will be compared with the theoretical value when the electronic control unit is in the second intermittent operating mode. as well as Since the measured value of the fourth current is substantially no greater than the theoretical value, it is determined that the sleep current of the electronic control unit is acceptable. Among them, "the measured value is basically not greater than the theoretical value" includes "the measured value is less than or equal to the theoretical value" and "the measured value is greater than the theoretical value but the amount of the difference does not exceed the preset threshold".

2. The method according to claim 1, wherein, The first current measurement value is determined by measuring the current of the electronic control unit while all chips of the electronic control unit except the microcontroller are in a preset mode and during a non-operating period when the microcontroller is in the first intermittent operating mode. as well as The theoretical value of the first current is determined based on the rated current of all the other chips of the electronic control unit in the preset mode and the rated current of the microcontroller in sleep mode.

3. The method according to claim 1, wherein, The theoretical value of the second current is determined based on the rated current of the microcontroller during the working period of the first intermittent working mode; The measured value of the second current is determined under the specified rated current by measuring the current of the electronic control unit during the working period when the microcontroller is in the first intermittent working mode and during the non-working period when the microcontroller is in the first intermittent working mode, with all chips of the electronic control unit except the microcontroller in a preset mode.

4. The method according to claim 1, wherein, The measured value of the third current is determined by measuring the current of the electronic control unit with all chips of the electronic control unit except the microcontroller in a preset mode and the microcontroller in the first intermittent operating mode. as well as The theoretical value of the third current is determined by measuring the current of the electronic control unit during the working period when the microcontroller is in the first intermittent working mode and during the non-working period when the microcontroller is in the first intermittent working mode, with all chips of the electronic control unit except the microcontroller in the preset mode, and measuring the duration of the working period and the non-working period of the first intermittent working mode.

5. The method according to claim 1, wherein, The fourth current is measured by measuring the current of the electronic control unit when all chips of the electronic control unit except the microcontroller and the peripheral wake-up circuit are in a preset mode and the electronic control unit is in the second intermittent operating mode, and when all chips of the electronic control unit except the microcontroller and the peripheral wake-up circuit are in the preset mode, the peripheral wake-up circuit is in sleep mode and the microcontroller is in the first intermittent operating mode; as well as The theoretical value of the fourth current is determined by calculating the current consumed by the peripheral wake-up circuit during the query period and the non-query period between adjacent query periods, and by measuring the duration of the query period and the non-query period.

6. The method according to claim 5, wherein, The measured value of the fourth current was determined after removing the capacitor element of the peripheral wake-up circuit; and The theoretical value of the fourth current is calculated without considering the capacitor elements of the peripheral wake-up circuit.

7. The method according to claim 5, wherein, The peripheral wake-up circuit includes a switch control circuit and a switch input circuit. The switch control circuit is configured to generate a power signal for the switch input circuit in response to an enable signal from the microcontroller and an external power supply signal. The switch input circuit is configured to provide a received switch signal to the microcontroller in response to the power signal from the switch control circuit. The microcontroller is configured to determine whether to wake up the electronic control unit based on the switch signal from the switch input circuit. The query period is the period when the enable signal is valid, and the non-query period is the period when the enable signal is invalid. The calculation of the current consumed by the peripheral wake-up circuit during the query period includes determining the current consumed by the switch input circuit and the switch control circuit respectively when the enable signal is valid. Specifically, the current consumed by the peripheral wake-up circuit during the non-query period is calculated to be zero. The measurement of the duration of the query period and the non-query period includes measuring the duration of the period when the enable signal is valid and the duration of the period when the enable signal is invalid.

8. The method according to any one of claims 2 to 7, wherein, The preset mode is sleep mode.

9. The method according to claim 1, further comprising: In response to the measured value of the first current being substantially greater than the theoretical value, it is determined that the electronic control unit generates leakage current and / or consumes unnecessary current during non-operating periods when the microcontroller is in the first intermittent operating mode. as well as Investigate any abnormal states that may occur in the electronic control unit when the microcontroller is in the non-operating period of the first intermittent operating mode, until the measured value of the first current is substantially no greater than the theoretical value. Among them, "the measured value is substantially greater than the theoretical value" includes "the measured value is greater than the theoretical value and the amount of the difference exceeds the preset threshold".

10. The method according to claim 9, wherein, The investigation should identify at least one of the following abnormal states that may occur in the electronic control unit during non-operating periods when the microcontroller is in the first intermittent operating mode: Confirm whether each chip in the electronic control unit, excluding the microcontroller, is in its proper operating state; or Confirm whether each pin of the microcontroller is at the level it should be in during the non-working period of the first intermittent working mode.

11. The method according to claim 1, further comprising: In response to the measured value of the second current being substantially greater than the theoretical value, it is determined that the microcontroller generates leakage current and / or consumes unnecessary current during the operating period when the microcontroller is in the first intermittent operating mode. as well as Investigate any abnormal states that may occur in the microcontroller when it is in the first intermittent operating mode, until the measured value of the second current is substantially no greater than the theoretical value. Among them, "the measured value is substantially greater than the theoretical value" includes "the measured value is greater than the theoretical value and the amount of the difference exceeds the preset threshold".

12. The method according to claim 11, wherein, The abnormal states that the microcontroller may experience during the working period when the microcontroller is in the first intermittent working mode include at least one of the following: Confirm whether each pin of the microcontroller is at the level it should be at during the working period of the first intermittent working mode; or Confirm whether each peripheral resource of the microcontroller is in the start / stop state that it should be in during the working period of the first intermittent working mode.

13. The method according to claim 1, further comprising: In response to the fact that the measured value of the third current is substantially greater than the theoretical value, it is determined that the microcontroller consumes unnecessary current when the microcontroller is in the first intermittent operating mode. as well as With the core clock frequency of the microcontroller fixed, the duration of the operating period is shortened until the measured value of the third current is substantially no greater than the theoretical value. Among them, "the measured value is substantially greater than the theoretical value" includes "the measured value is greater than the theoretical value and the amount of the difference exceeds the preset threshold".

14. The method according to claim 13, wherein, The duration of the work period is shortened by including at least one of the following operations: Increase the compiler optimization level of the microcontroller; or Improve the code efficiency of the microcontroller; or Reduce the code redundancy of the microcontroller during the operating period.

15. The method according to claim 1, further comprising: In response to the measured value of the fourth current being substantially greater than the theoretical value, it is determined that the peripheral wake-up circuit generates leakage current and / or consumes unnecessary current when the electronic control unit is in the second intermittent operating mode. as well as Investigate any abnormal states that may occur in the peripheral wake-up circuit when the electronic control unit is in the second intermittent operating mode, until the measured value of the fourth current is substantially no greater than the theoretical value. Among them, "the measured value is substantially greater than the theoretical value" includes "the measured value is greater than the theoretical value and the amount of the difference exceeds the preset threshold".

16. The method according to claim 15, wherein, The peripheral wake-up circuit includes a switch control circuit and a switch input circuit. The switch control circuit is configured to generate a power signal for the switch input circuit in response to an enable signal from the microcontroller and an external power supply signal. The switch input circuit is configured to provide a received switch signal to the microcontroller in response to the power signal from the switch control circuit. The microcontroller is configured to determine whether to wake up the electronic control unit based on the switch signal from the switch input circuit. Among them, investigating abnormal states that may occur in the peripheral wake-up circuit when the electronic control unit is in the second intermittent working mode includes at least one of the following: Confirm whether the pin of the peripheral wake-up circuit used to receive the enable signal only controls the peripheral wake-up circuit; Confirm whether the pin of the microcontroller unit used to receive the switch signal is at the level it should be in during the second intermittent operation mode.

17. The method of claim 15, further comprising: The current consumed by the peripheral wake-up circuit during the query period is reduced by decreasing the capacitance of the capacitor element of the peripheral wake-up circuit.

18. An apparatus for testing the sleep current of an electronic control unit, the electronic control unit including a microcontroller and a peripheral wake-up circuit, the microcontroller having a first intermittent operating mode, the first intermittent operating mode including alternating non-working periods and working periods, the electronic control unit having a second intermittent operating mode, the second intermittent operating mode including the alternating non-working periods and working periods, and further including a query period in the working periods for determining whether to wake up the electronic control unit via the microcontroller and the peripheral wake-up circuit, the apparatus comprising: The first test unit is configured to compare a measured value of the first current of the electronic control unit with a theoretical value during non-operating periods when the microcontroller is in the first intermittent operating mode. The second test unit is configured to compare the measured value of the second current of the microcontroller with the theoretical value during the working period when the microcontroller is in the first intermittent working mode, in response to the measured value of the first current being substantially no greater than the theoretical value. The third test unit, configured to compare the measured value of the third current of the electronic control unit with the theoretical value in response to the measured value of the second current being substantially no greater than the theoretical value, when the microcontroller is in the first intermittent operating mode. The fourth test unit is configured as follows: In response to the fact that the measured value of the third current is substantially no greater than the theoretical value, the measured value of the fourth current of the peripheral wake-up circuit will be compared with the theoretical value when the electronic control unit is in the second intermittent operating mode. as well as Since the measured value of the fourth current is substantially no greater than the theoretical value, it is determined that the sleep current of the electronic control unit is acceptable. Among them, "the measured value is basically not greater than the theoretical value" includes "the measured value is less than or equal to the theoretical value" and "the measured value is greater than the theoretical value but the amount of the difference does not exceed the preset threshold".

19. A computing device for testing the sleep current of an electronic control unit, comprising: One or more processors; as well as A memory storing computer-executable instructions, which, when executed by the one or more processors, cause the one or more processors to perform a method for testing the sleep current of an electronic control unit according to any one of claims 1 to 17.

20. A non-transient storage medium having stored thereon computer-executable instructions, which, when executed by a computer, cause the computer to perform a method for testing the sleep current of an electronic control unit according to any one of claims 1 to 17.

Images