S-parameter measurement method for suppressing ripple, electronic device, and storage medium

Abstract

The present application provides a kind of S parameter measurement method for inhibiting ripple, electronic equipment and storage medium, comprising: selecting the maximum length of the measured piece from the multiple different lengths of multiple measured pieces as the first measured piece, and based on the preset scanning power and the preset scanning point number, control the vector network analyzer to carry out calibration and frequency sweep test to the first measured piece in the target test frequency range, determine the S parameter of the first measured piece;In the case where it is determined that the S parameter exists ripple, by removing the maximum length of the measured piece from multiple measured pieces, determine new multiple measured pieces, repeat the above steps;Until it is determined that there is no ripple S parameter for the first measured piece after inhibiting ripple Target S parameter. The present application inhibits the ripple of S parameter caused by the length of the measured piece being fixed by continuously reducing the length of the measured piece, without changing the test frequency range, greatly improving the accuracy and stability of the parameter curve measurement of S parameter in the field of electromagnetic measurement.

Description

Technical Field

[0001] This invention relates to the field of electromagnetic measurement technology, and in particular to a method for measuring S-parameters with ripple suppression, an electronic device, and a storage medium. Background Technology

[0002] Electromagnetic measurement is a crucial method for determining the electromagnetic properties of materials. With the advancement of science and technology, various fields, including radar navigation, aerospace, missile guidance, electronics, and new materials, are placing increasingly higher demands on the accuracy and stability of electromagnetic measurements. During electromagnetic measurements, S-parameters, as critical parameters, frequently exhibit ripple phenomena—that is, resonance, fluctuations, and abrupt changes in the S-parameter curve—which reduce the accuracy and stability of the measurement results. Therefore, suppressing S-parameter ripple during electromagnetic measurements to ensure the accuracy and stability of the results is of paramount importance. Summary of the Invention

[0003] This invention provides a method, electronic device, and storage medium for S-parameter measurement with ripple suppression, which addresses the shortcomings of existing electromagnetic measurement processes where S-parameter ripple occurs. By continuously reducing the length of the measured object, the ripple caused by the fixed length of the measured object is suppressed. Throughout the calibration and testing process, there is no need to change the test frequency range, scanning power, or number of scanning points. Thus, without increasing measurement costs and testing complexity, the accuracy and stability of S-parameter curve measurement in the field of electromagnetic measurement are effectively improved.

[0004] This invention provides a method for S-parameter measurement to suppress ripple, applied to a parameter measurement system. The parameter measurement system includes a vector network analyzer, a coaxial cable, and a device under test (DUT). The two ends of the coaxial cable are respectively connected to the vector network analyzer and a first DUT. The method includes:

[0005] The longest test piece among multiple test pieces of different lengths is selected as the first test piece. Based on the preset scanning power and preset number of scanning points, the vector network analyzer is controlled to perform calibration and frequency sweep testing on the first test piece within the target test frequency range to determine the S-parameters of the first test piece.

[0006] If it is determined that there is ripple in the S-parameter, the test piece with the longest length is removed from the plurality of test pieces to obtain an updated test piece;

[0007] The updated test device is identified as the new plurality of test devices, and the above steps are repeated until the S-parameter without ripple is determined as the target S-parameter of the first test device after ripple suppression.

[0008] According to the S-parameter measurement method for suppressing ripple provided by the present invention, the process of determining the target test frequency range includes:

[0009] A target test piece of a preset length is determined from multiple different lengths of the plurality of test pieces;

[0010] The highest test frequency and the lowest test frequency are determined with the preset length being greater than the first preset working wavelength of the target device under test at the highest test frequency and the preset length being greater than the second preset working wavelength of the target device under test at the lowest test frequency as targets;

[0011] The target test frequency range is determined based on the highest test frequency and the lowest test frequency.

[0012] According to the S-parameter measurement method for suppressing ripple provided by the present invention, the process of determining multiple different lengths of the multiple test pieces includes:

[0013] The plurality of different lengths are predetermined from a preset length range, and the preparation of the plurality of test pieces of the plurality of different lengths is indicated; the spacing between each pair of adjacent test pieces is equal.

[0014] According to the S-parameter measurement method for suppressing ripple provided by the present invention, the process of determining the preset length range includes:

[0015] The preset length is set as the maximum length;

[0016] The minimum length is determined by the working wavelength corresponding to the lowest test frequency within the target test frequency range.

[0017] The preset length range is determined based on the maximum length and the minimum length.

[0018] According to the present invention, a method for measuring S-parameters to suppress ripple is provided, the method further comprising:

[0019] If the parameter curve of the S-parameter is compared and analyzed with the preset ripple-free parameter curve, and it is determined that the parameter curve of the S-parameter does not match the preset ripple-free parameter curve, then the S-parameter is determined to have ripple.

[0020] According to the present invention, a method for measuring S-parameters to suppress ripple is provided, the method further comprising:

[0021] When an incident wave perpendicularly incident into the first test piece undergoes multiple reflections and multiple transmissions through the first test piece, a first ratio of the power of all reflected waves in the first test piece to the power of the incident wave, and a second ratio of the power of all transmitted waves in the first test piece to the power of the incident wave are determined.

[0022] The presence of ripple in the S-parameter is determined when the difference between the amplitude of the first ratio and 0 is minimized, and / or the difference between the amplitude of the second ratio and 1 is minimized.

[0023] According to the S-parameter measurement method for suppressing ripple provided by the present invention, the process of determining the first ratio and the second ratio includes:

[0024] The first ratio and the second ratio are determined based on the reflection coefficient of the first device under test, the length of the first device under test, the effective dielectric constant of the first device under test, the effective magnetic permeability of the first device under test, and the propagation constant of the incident wave in the first device under test.

[0025] Wherein, the effective dielectric constant and the effective permeability are both dielectric constants and permeabilities of media with the same electromagnetic properties as the first test piece filled with a single medium or at least two media.

[0026] According to the present invention, a method for measuring S-parameters to suppress ripple is provided, the method further comprising:

[0027] If, among the plurality of test devices, there is at least one target length smaller than the length of the first test device corresponding to the target S-parameter, the vector network analyzer is controlled to perform calibration and frequency sweep tests on the first test devices corresponding to each of the at least one target length within the target test frequency range based on the preset scan power and the preset number of scan points, so as to determine the target S-parameter of each of the plurality of test devices after ripple suppression.

[0028] The present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the S-parameter measurement method for suppressing ripple as described above.

[0029] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the S-parameter measurement method for suppressing ripple as described above.

[0030] This invention provides a method, electronic device, and storage medium for ripple suppression S-parameter measurement. The method involves using an electronic device to control a vector network analyzer to calibrate and perform frequency sweep tests on a first device under test (DUT) within a target test frequency range. When ripple is detected in the S-parameters, the device removes the longest DUT with ripple from different DUTs of varying lengths and re-determines the longest DUT as the first DUT. Based on this re-determined first DUT, calibration and frequency sweep tests are repeated until the target S-parameters after ripple suppression are determined. This method suppresses ripple caused by the fixed length of the DUT by continuously reducing its length. Throughout the calibration and testing process, the test frequency range, sweep power, and number of sweep points do not need to be changed. Therefore, without increasing measurement costs or complexity, the accuracy and stability of S-parameter curve measurements in the electromagnetic measurement field are effectively improved. Attached Figure Description

[0031] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0032] Figure 1 This is a flowchart illustrating the S-parameter measurement method for suppressing ripple provided by the present invention.

[0033] Figure 2 This is a schematic diagram of the S-parameter measurement system provided by the present invention;

[0034] Figure 3A This is a cross-sectional schematic diagram of the coaxial line provided by the present invention;

[0035] Figure 3B This is a three-dimensional schematic diagram of the coaxial cable provided by the present invention;

[0036] Figure 4A This is a schematic cross-sectional view of the microstrip line provided by the present invention;

[0037] Figure 4B This is a three-dimensional schematic diagram of the microstrip line provided by the present invention;

[0038] Figure 5 This is a schematic diagram of the transmission process of the first test device under test for incident electromagnetic waves provided by the present invention.

[0039] Figure 6 This is a schematic diagram of the first reflection and transmission response of the first test piece to the incident electromagnetic wave provided by the present invention;

[0040] Figure 7 This is a schematic diagram of the transmission of electromagnetic waves through a three-layer structured medium provided by the present invention;

[0041] Figure 8 This is one of the schematic diagrams of the amplitude curve of the S-parameter of the coaxial line as the first test piece provided by the present invention;

[0042] Figure 9 This is the second schematic diagram of the amplitude curve of the S-parameter of the coaxial line as the first test piece provided by the present invention;

[0043] Figure 10 This is one of the schematic diagrams of the amplitude curve of the S-parameter of a microstrip line as the first device under test provided by the present invention;

[0044] Figure 11 This is the second schematic diagram of the amplitude curve of the S-parameter of the microstrip line as the first device under test provided by the present invention;

[0045] Figure 12 This is a schematic diagram of the structure of the S-parameter measurement device for suppressing ripple provided by the present invention;

[0046] Figure 13 This is a schematic diagram of the structure of the electronic device provided by the present invention. Detailed Implementation

[0047] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0048] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0049] The following is combined Figures 1-13This invention describes a ripple-suppressing S-parameter measurement method, electronic device, and storage medium. The ripple-suppressing S-parameter measurement method is applied to a parameter measurement system, which includes a vector network analyzer, a coaxial cable, and a device under test (DUT). The two ends of the coaxial cable are connected to the vector network analyzer and the DUT, respectively. Furthermore, the execution entity of the ripple-suppressing S-parameter measurement method is an electronic device connected to the vector network analyzer in the parameter measurement system. This electronic device possesses at least frequency range determination, length range determination, and calibration test control functions. The electronic device can be a personal computer (PC), laptop computer, tablet computer, or other devices. Further, the ripple-suppressing S-parameter measurement method can also be applied to a ripple-suppressing S-parameter measurement device installed in the electronic device. This ripple-suppressing S-parameter measurement device can be implemented through software, hardware, or a combination of both. The following description uses an example where the execution entity of the ripple-suppressing S-parameter measurement method is a controller built into the electronic device.

[0050] To facilitate understanding of the S-parameter measurement method for ripple suppression provided in the embodiments of the present invention, the following will describe in detail the S-parameter measurement method for ripple suppression provided by the present invention through several exemplary embodiments. It is understood that the following exemplary embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments.

[0051] Reference Figure 1 The above is a schematic flowchart of the S-parameter measurement method for suppressing ripple provided by the present invention, as shown below. Figure 1 As shown, the S-parameter measurement method for suppressing ripple includes the following steps 110 to 130.

[0052] Step 110: Select the test piece with the longest length from multiple test pieces of different lengths as the first test piece, and control the vector network analyzer to perform calibration and frequency sweep test on the first test piece within the target test frequency range based on the preset scan power and preset scan points, and determine the S-parameters of the first test piece.

[0053] In this system, multiple test pieces (DPTs) vary in length but are made of the same material, such as coaxial cables or microstrip lines of different lengths. Each DPT can be represented as a symmetrical two-port network, and the longest DPT among the multiple DPTs can also be represented as a symmetrical two-port network. For example, refer to... Figure 2 The schematic diagram of the parameter measurement system shown illustrates how two different ports of the vector network analyzer can be connected to one end of two coaxial cables, as follows: Figure 2As shown, the other ends of the two coaxial cables are connected to the two ports of the first device under test (DUT) to simplify the analysis of the electromagnetic response of a homogeneous DUT. Furthermore, the S-parameters (i.e., scattering parameters) can be used to evaluate the performance of the reflected and transmitted signals of the DUT.

[0054] Specifically, in step 110, for multiple test pieces of different lengths prepared in advance, the test piece with the longest length can be selected as the first test piece. The electronic device can pre-store the mapping relationship between the medium filler and the length range. This mapping relationship can be determined based on human experience and / or other methods such as combining relevant records in cloud big data. The reason for determining this mapping relationship is to limit the maximum and minimum lengths of test pieces prepared with different medium fillers, and to ensure that among the multiple test pieces of different lengths prepared between the maximum and minimum lengths, there must be a length with test piece S-parameter ripple and a length of test piece that suppresses S-parameter ripple. For example, the maximum length must have ripple, and the minimum length must not have ripple.

[0055] Based on this, when multiple test pieces of different lengths are prepared based on this mapping relationship, the different lengths of the multiple test pieces can be input into the electronic device. The input methods include, but are not limited to, input via terminal device applications, voice input, and image input. For example, the lengths can be obtained by the user manually inputting the different lengths of the multiple test pieces into an application on another electronic device connected to the electronic device; they can also be obtained by the user or other electronic devices outputting the different lengths of the multiple test pieces via voice; or they can be obtained by uploading an image containing multiple test pieces of different lengths to the electronic device for image recognition. No specific limitations are set here.

[0056] At this point, when the electronic device selects the device with the longest length from multiple different lengths of the devices under test as the first device under test, it can control the vector network analyzer to start calibration and frequency sweep testing of the first device under test within the target test frequency range based on a preset scan power (e.g., 1W) and a preset number of scan points (e.g., 201). In other words, it can send a control command to the vector network analyzer to instruct the vector network analyzer to start calibration and frequency sweep testing, thereby obtaining the S-parameters of the first device under test.

[0057] It should be noted that, in order to facilitate the design of the characteristic impedance of the first device under test, this invention uses the effective permittivity and effective permeability to represent the electromagnetic properties exhibited by the first device under test in the test environment. When the coaxial line is used as the first device under test, it is filled with a homogeneous medium, and its cross-sectional view is shown in the figure. Figure 3AAs shown, the coaxial cable includes an inner conductor 301, a dielectric layer 302, an outer conductor 303, and a shielding layer 304. The dielectric constant and permeability of this dielectric are the effective dielectric constant and effective permeability of the coaxial cable. A three-dimensional schematic diagram of the coaxial cable is shown below. Figure 3B As shown, it includes an outer conductor, a shielding layer, an inner conductor, and a dielectric layer, as follows: Figure 3B As shown, both the inner and outer conductors are made of copper, and the intermediate dielectric material is polytetrafluoroethylene (PTFE). The effective permittivity and effective permeability of the coaxial cable are 2.1ε₀ and μ₀, respectively. The outer diameter of the coaxial cable is 7 mm, the inner diameter is 3 mm, and the length is 15 mm. Represents the dielectric constant in a vacuum. It represents the magnetic permeability in a vacuum.

[0058] When a microstrip line is used as the first device under test, it is filled with two or more dielectrics, and its cross-section is as follows: Figure 4A As shown, it includes a conductor strip 401, a ground plane 402, and a dielectric layer 403; a three-dimensional schematic diagram of the microstrip line is shown below. Figure 4B As shown, it includes a conductor strip, a dielectric layer, and a ground plane; in Figure 4B In this model, the conductor strip and the ground plane are both made of copper, the dielectric substrate is made of Rogers 5880, the effective permittivity and effective permeability of the microstrip line are 1.8ε0 and μ0, respectively, the thickness of the conductor strip is 35 μm, the width of the conductor strip is 0.6 mm, the thickness of the dielectric substrate is 0.508 mm, the thickness of the ground plane is 35 μm, the width of the microstrip line is 20 mm, and the length of the microstrip line is 50 mm. At this time, the effective permittivity and effective permeability of the microstrip line can be obtained by using the conformal mapping method. The solution process is shown in equations (1) and (2).

[0059] (1)

[0060] (2)

[0061] In equations (1) and (2), Indicates the effective dielectric constant. Indicates the effective permeability. Represents the dielectric constant in a vacuum. Represents the magnetic permeability in a vacuum. Indicates the fill factor of the air layer; (i=1,2,…,n+m) represents the i-th i The fill factor of the layer medium satisfies: , (i=1,2,…,n+m) represents the i-th i The relative permittivity of the layer dielectric, (i=1,2,…,n+m) represents the i-th iThe relative permeability of the dielectric layers, where n represents the number of dielectric layers below the conductor strip in the microstrip line, i.e., dielectric layers 1, 2, ..., n are below the conductor strip in the microstrip line, and m represents the number of dielectric layers above the conductor strip in the microstrip line, i.e., n+1, n+2, ..., n+m are above the conductor strip in the microstrip line.

[0062] Based on this, the parameter measurement system provided in this invention is specifically a non-matching test system, where the characteristic impedance of the first device under test (DUT) is mismatched with the characteristic impedance of the signal source, aiming to increase the reflection and transmission response of the first DUT to electromagnetic waves. Furthermore, compared to a matched impedance, the mismatch between the characteristic impedance of the first DUT and the characteristic impedance of the signal source increases both the reflection and transmission characteristics of the electromagnetic waves output by the vector network analyzer, and the amplitude fluctuation of the measured S-parameter curve also increases accordingly. In addition, the degree of mismatch between the characteristic impedance of the first DUT and the characteristic impedance of the signal source is determined by the reflection coefficients at both ends of the first DUT. R Decide; R =0 indicates that the characteristic impedance of the first device under test matches the characteristic impedance of the signal source. R The greater the difference between the absolute value of R and 0, the greater the mismatch between the characteristic impedance of the first device under test and the characteristic impedance of the signal source. If the absolute value of R is too large, the transmission characteristics of the first device under test for incident electromagnetic waves will be extremely small; if the absolute value of R is too small, the reflection characteristics of the first device under test for incident electromagnetic waves will be extremely small. Based on this, the present invention pre-sets... R The value should be neither too large nor too small, and generally falls within the range of | R |=0.1-0.8; The characteristic impedance of the signal source is known. R The characteristic impedance of the signal source and the value are used to determine the characteristic impedance of the first device under test, which can be calculated by equation (3).

[0063] (3)

[0064] In equation (3), R This represents the reflection coefficient at both ends of the first tested component. This represents the characteristic impedance of the first device under test. This represents the characteristic impedance of the signal source.

[0065] Subsequently, based on the characteristic impedance of the first device under test, the effective dielectric constant and effective permeability of the first device under test, and the characteristic impedance design formula of the first device under test shown in equations (4) to (7), the cross-sectional dimensions of the first device under test can be further obtained, thereby realizing the design of the cross-sectional dimensions of the unmatched device under test.

[0066] When the coaxial cable is used as the first part to be measured, its cross-sectional dimensions (the inner diameter of the coaxial cable) are... and outer diameter ) can be determined by equation (4).

[0067] (4)

[0068] In equation (4), The characteristic impedance of the coaxial line is represented. This represents the effective dielectric constant of the coaxial line. Indicates the effective permeability of the coaxial line. Indicates the outer diameter of the coaxial line. This indicates the inner diameter of the coaxial line.

[0069] When a microstrip line is used as the first device under test, its cross-sectional dimensions (dielectric substrate thickness) and the width of the conductor strip ) can be determined by equations (5) to (7).

[0070] (5)

[0071] (6)

[0072] (7)

[0073] In equations (5) to (7), This represents the characteristic impedance of the microstrip line. This represents the effective dielectric constant of the microstrip line. This represents the effective permeability of the microstrip line. This indicates the thickness of the dielectric substrate for the microstrip line. This indicates the thickness of the conductor strip in the microstrip line.

[0074] Step 120: If it is determined that there is ripple in the S-parameters, remove the test piece with the longest length from multiple test pieces to obtain the updated test piece.

[0075] Step 130: Determine the updated test device as a new set of test devices, and repeat steps 110 and 120 until the S-parameter without ripple is determined as the target S-parameter, and the first test device corresponding to the target S-parameter is determined as the second test device that can suppress S-parameter ripple.

[0076] Specifically, for the first test device selected as the first test device from the different lengths of multiple test devices, that is, the S-parameter determined for the first time by the control vector network analyzer, it can be regarded as the first S-parameter, and it is determined that the first S-parameter must have ripple; when the electronic device obtains the first S-parameter by the control vector network analyzer, it can move the maximum length from the multiple different lengths, and reselect the test device with the maximum length from the different lengths of the remaining multiple test devices as the new first test device, and return to execute steps 110 and 120.

[0077] Conversely, for S-parameters not initially determined by the control vector network analyzer, these can be considered the second S-parameters. In this case, the parameter curve of the second S-parameter can be analyzed to determine if it exhibits at least one of the following: resonance, fluctuation, or abrupt change. If the parameter curve of the second S-parameter does not exhibit resonance, fluctuation, or abrupt change, it can be determined that it is ripple-free, and the second S-parameter without ripple is determined as the target S-parameter after ripple suppression for the first device under test. Conversely, if the parameter curve of the second S-parameter exhibits at least one of the following: resonance, fluctuation, or abrupt change, it can be determined that the second S-parameter has ripple.

[0078] The electronic device can sort multiple test devices (DDTs) of different lengths from largest to smallest, and select the DDT with the largest length as the first DDT for calibration and scanning test based on the sorting result. Then, it determines whether the first S-parameter obtained from the test has ripple, that is, selects the DDT with the second largest length as the new first DDT for calibration and scanning test, and determines whether the second S-parameter obtained again has ripple. Steps 110 and 120 are executed in this way repeatedly until the second S-parameter without ripple is determined as the target S-parameter of the first DDT after ripple suppression.

[0079] It should be noted that, due to the mismatch between the characteristic impedance of the device under test (DUT) and the characteristic impedance of the signal source, this mismatch can be utilized to amplify the presentation and suppression of ripple without changing its presence. Furthermore, by measuring multiple DUTs of different pre-designed and fabricated lengths, a method for suppressing S-parameter ripple can be obtained. Specifically, within the target test frequency range, the ratio of the length of the first DUT to its operating wavelength must be less than or equal to... A ;in A It is the maximum value of the ratio of the length of the first test piece to the operating wavelength of the first test piece.

[0080] For example, electronic devices can determine the presence of ripple in the second S-parameter by analyzing the amplitude curve changes of the S-parameter. When at least one of the following conditions—resonance, fluctuation, or abrupt change—is observed in the second S-parameter, the ripple must occur within the target test frequency range when the length of the device under test is close to half the operating wavelength or an integer multiple thereof. A When the value approaches 0.5, the first test device can be re-determined from multiple test devices of different lengths, and steps 110 and 120 are repeated to obtain the second S-parameter to replace the previously obtained second S-parameter; this continues until the target S-parameter of the first test device after ripple suppression is obtained. If it is determined that no ripple appears in the second S-parameter, then the second S-parameter without ripple is the target S-parameter of the first test device after ripple suppression, while keeping the target test frequency range unchanged and measuring the selected first test device from multiple pre-designed and prepared test devices of different lengths.

[0081] The S-parameter measurement method for suppressing ripple provided in this invention involves an electronic device calibrating and performing frequency sweep tests on a first device under test (DUT) within a target test frequency range using a control vector network analyzer. When ripple is detected in the S-parameters, the method removes the longest DUT with ripple from different DUTs of varying lengths and re-determines the longest DUT as the first DUT. Based on this re-determined first DUT, calibration and frequency sweep tests are repeated until the target S-parameters after ripple suppression are determined. This method suppresses ripple caused by the fixed length of the DUT by continuously reducing its length. Throughout the calibration and testing process, the test frequency range, sweep power, and number of sweep points do not need to be changed. Therefore, without increasing measurement costs or complexity, the accuracy and stability of S-parameter curve measurements in the electromagnetic measurement field are effectively improved.

[0082] Based on the above Figure 1 The S-parameter measurement method for suppressing ripple, as shown in one example embodiment, can determine the target test frequency range required throughout the entire scanning test process based on the relationship between the operating wavelength of the longest test piece among a plurality of pre-prepared test pieces at different test frequencies and that maximum length. Therefore, the process for determining the target test frequency range specifically may include:

[0083] First, a target test piece of a preset length is determined from multiple test pieces of different lengths. Then, with the preset length being greater than the first preset operating wavelength of the target test piece at the highest test frequency and the preset length being greater than the second preset operating wavelength of the target test piece at the lowest test frequency, the highest test frequency and the lowest test frequency are determined. Finally, based on the highest test frequency and the lowest test frequency, the target test frequency range is determined.

[0084] Specifically, the electronic device can select the longest test device from multiple different lengths of test devices as the target test device of a preset length. It can also determine the highest test frequency by setting the target test frequency as the target test frequency at which half of the operating wavelength of the target test device at the highest test frequency in the target test frequency range is less than the preset length of the target test device. Furthermore, it can determine the lowest test frequency by setting the target test frequency at which one two-hundredth of the operating wavelength of the target test device at the lowest test frequency in the target test frequency range is less than the preset length of the target test device. The test frequency range containing the lowest test frequency and the highest test frequency obtained in this way is the target test frequency range.

[0085] It should be noted that the reason for setting the target test frequency range in this way is to obtain the S-parameters with ripple (such as the first S-parameters obtained in the first test), so that the target S-parameters without ripple can be quickly and accurately determined by the subsequent calibration and frequency sweep test within the target test frequency range by continuously reducing the length of the test device.

[0086] Based on the above Figure 1 In one example embodiment of the S-parameter measurement method for suppressing ripple, to ensure that among the multiple test pieces of different lengths prepared in advance, there are test pieces containing S-parameter ripple and test pieces suppressing S-parameter ripple, multiple test pieces of equally spaced lengths can be prepared within a preset length range. Based on this, the specific process for determining the multiple different lengths of the multiple test pieces may include:

[0087] Multiple different lengths are predetermined from a preset length range, and multiple test pieces of different lengths are prepared; the spacing between each pair of adjacent test pieces is equal.

[0088] The preset length range can be a length range containing a maximum length and a minimum length, wherein the S-parameter of the test piece with the maximum length has ripple, and the S-parameter of the test piece with the minimum length does not have ripple; in addition, the preset length range can be determined based on the length of the target test piece of the preset length among multiple test pieces of different lengths.

[0089] Specifically, the electronic device can be determined from a preset length range. p The lengths of the equidistant lengths, and p Each has a different length and indicates the preparation p a length p The test piece was prepared. p All tested components are filled with the same type of medium, such as coaxial lines filled with a single medium or microstrip lines filled with at least two types of medium. p The range of values ​​is p ≥ Lb / ( B · λ ), L b =| L max - L min |, L max This indicates the maximum length within the preset length range. L min This indicates the minimum length within the preset length range. λ Indicates the operating wavelength of the target device under test; B It is a preset constant and B The value of is determined by the standard that the suppression of ripples in adjacent test pieces with equal spacing is clearly observable, and its value range can be set to . B ≥0.005. This allows for the pre-design and fabrication of multiple test pieces of different lengths within a preset length range.

[0090] For example, based on the above Figure 1 The S-parameter measurement method for suppressing ripple, as shown in the example embodiment, includes the following steps in determining the preset length range:

[0091] The maximum length is determined from the preset lengths of multiple test pieces of different lengths, and the minimum length is further determined from the working wavelength corresponding to the lowest test frequency in the target test frequency range; then, the preset length range is determined based on the maximum length and the minimum length.

[0092] Specifically, the electronic device can determine a preset length among multiple different lengths of a device under test (DUT) as the maximum length; and determine the operating wavelength corresponding to the lowest test frequency within the target test frequency range as the minimum length of the DUT, such that this minimum length is equal to one two-hundredth of the operating wavelength of the DUT at the lowest test frequency. For example, when the maximum length within the preset length range is... L max Minimum length is L min At that time, the length of each of the multiple test pieces of different lengths pre-designed and prepared is... L The range of values ​​is L max > L ≥ L min .

[0093] It should be noted that the reason for setting the target frequency test range in this way and designing and preparing multiple test pieces of different lengths is to avoid the length of the test piece being equal to or close to an integer multiple of half the wavelength within the target test frequency range, and to ensure that the length of the test piece that effectively suppresses S-parameter ripple is included within the range of values ​​of the pre-designed and prepared test piece length, that is, within the preset length range. If the length of the test piece is equal to or close to an integer multiple of half the working wavelength at a certain frequency within the target test frequency range, the S-parameter parameter curve will exhibit phenomena such as resonance, fluctuation, and abrupt changes, that is, the S-parameter parameter curve will show ripple. The reason for this phenomenon is also the reason for setting the lowest test frequency within the target test frequency range and for pre-designing and preparing multiple test pieces of different lengths. This reason can be analyzed from three aspects in turn: phase superposition and cancellation, multilayer media propagation, and transmission reflection theory.

[0094] For S-parameter phase superposition and cancellation, consider that the electromagnetic wave is incident perpendicularly on the first device under test, and that the electromagnetic wave undergoes multiple reflections and transmissions through the first device under test. The electromagnetic wave transmission process is as follows: Figure 5 As shown, with the increase of the number of transmissions, the phase of the electromagnetic wave gradually increases, but the intensity gradually decreases. Therefore, phase superposition and cancellation only determine the phase difference between the secondary reflected wave and the primary reflected wave, and the phase difference between the secondary transmitted wave and the primary transmitted wave, to obtain the superposition and cancellation of the amplitudes of the reflected wave and the transmitted wave. Figure 6 This is a schematic diagram of the first reflection and transmission response of the first device under test to the incident electromagnetic wave.

[0095] According to the principle and characteristics of electromagnetic wave transmission, the phase difference between multiple reflected waves and the first reflected wave, and the phase difference between multiple transmitted waves and the first transmitted wave can be expressed by equations (8) and (9).

[0096] (8)

[0097] (9)

[0098] In equations (8) and (9), Indicates the phase difference of the reflected wave. Indicates the phase difference of the transmitted wave. Represents angular frequency. This indicates the time it takes for the electromagnetic wave to travel through the first device under test. Indicates the length of the first measured piece. This indicates the operating wavelength of the first device under test.

[0099] Based on the phase difference between the secondary reflected wave and the primary reflected wave, and the phase difference between the secondary transmitted wave and the primary transmitted wave, it is found that when the length of the first measured object is half the wavelength or an integer multiple thereof, the reflected waves cancel each other out to the maximum extent and have the smallest amplitude, while the transmitted waves are superimposed in phase to the maximum extent and have the largest amplitude.

[0100] For propagation in multi-layered media, we consider electromagnetic waves incident perpendicularly on the first test object, and there is no limitation on the number of layers in the media structure. Here, we take a three-layered media structure as an example, and the conclusions can be applied to multi-layered media structures. The propagation process of electromagnetic waves in a three-layered media structure is as follows: Figure 7 As shown, from left to right, they are medium 1, medium 2 and medium 3. Medium 1 and medium 3 are semi-infinite media, which are close to the electromagnetic measurement conditions, and the electromagnetic waves are incident perpendicularly.

[0101] like Figure 7 As shown, the three-layer structure medium has two media interfaces, interface 1 and interface 2, which affect the transmission of electromagnetic waves. The reflection coefficient and transmission coefficient of each interface are shown in equations (10) to (14).

[0102] (10)

[0103] (11)

[0104] (12)

[0105] (13)

[0106] In equations (10) to (14), R 2 represents the reflection coefficient at interface 2. τ 2 represents the transmission coefficient at interface 2. R 1 represents the reflection coefficient at interface 1. τ 1 represents the transmission coefficient at interface 1. η 1 represents the wave impedance of medium 1. η 2 represents the wave impedance of medium 2. η 3 represents the wave impedance of medium 3. γ 2 represents the propagation constant of electromagnetic waves in medium 2. Indicates the length of medium 2; The equivalent wave impedance of media 2 and media 3 at interface 1 can be expressed as:

[0107] (14)

[0108] When the length of the middle medium in a three-layer medium structure is half the working wavelength or an integer multiple thereof, and the wave impedance of the other two media... η 1 and ηSimilar to step 3, it is found that electromagnetic waves can pass through the three-layer medium structure without loss. At this time, all incident electromagnetic waves pass through the first test object without reflection. Based on the electromagnetic wave transmission analysis of the three-layer medium structure, it can be extended to the electromagnetic wave transmission analysis of more than three-layer medium structures.

[0109] For the transmission reflection method, consider an electromagnetic wave incident perpendicularly on the first device under test (DUT). The response of the DUT to multiple reflections and transmissions of the incident electromagnetic wave is as follows: Figure 5 As shown, the ratio of all reflected wave power to incident wave power S 11 The ratio of all transmitted wave power to incident wave power S 21 It can be expressed as equations (15) to (17).

[0110] (15)

[0111] (16)

[0112] (17)

[0113] In equations (15) to (17), R This represents the reflection coefficient at both ends of the measured component. This represents the propagation constant of the incident wave in the measured object. Indicates the length of the measured part. Represents angular frequency. Indicates the effective permeability of the measured component. This represents the effective dielectric constant of the device under test.

[0114] According to the theory and formula of the transmission reflection method, if the length of the first measured object is half the working wavelength or an integer multiple thereof, the transmission coefficient amplitude is 1. S 11 The minimum amplitude is 0. S 21 The maximum amplitude is 1.

[0115] In the field of electromagnetic measurement, to better describe and calculate S-parameters, the unit for representing S-parameters is dB, where... S 11 When the amplitude is close to 0, if expressed in dB, S 11 The magnitude is close to negative infinity (-∞). S 21 When the amplitude is close to 1, if expressed in dB, S 21The amplitude is close to 0. Based on this, it can be concluded that when the length of the first tested component is equal to or close to half the working wavelength or an integer multiple thereof within the test frequency range, the amplitude of all reflected electromagnetic waves is minimal. S 11 Using dB representation, which is close to -∞, will cause the S-parameter curve to deviate from the normal value, such as resonance, fluctuation and abrupt change, that is, the S-parameter will exhibit ripple phenomenon.

[0116] Since ripples appear in the S-parameter curve when the length of the first measured component is equal to or close to an integer multiple of half the operating wavelength, the maximum value of the ratio of the length of the first measured component to its operating wavelength is... A The value should be A A value <0.5 cannot effectively suppress the ripple present in the S-parameter. Based on this, and according to extensive simulations and actual tests, it was determined that when... A When the value is ≤0.45, the ripple of the S-parameter can be effectively suppressed. When the length of the first test piece is equal to or close to 0 times the working wavelength, that is, when the lowest test frequency in the target test frequency range is very small, the S-parameter will exhibit ripple. Based on a large number of simulations and actual tests, if the target test frequency range remains unchanged, then the lengths of the multiple test pieces designed and prepared in advance should be at least one two-hundredth of the working wavelength of the test piece at the lowest test frequency. This is also the basis for setting the lowest test frequency in the target test frequency range, so as to avoid the presence of ripple in the S-parameter of different test pieces of different lengths near the lowest test frequency due to the low lowest test frequency in the target test frequency range, thereby better highlighting the accuracy and reliability of the method for suppressing S-parameter ripple.

[0117] Based on this, multiple test pieces of different lengths are pre-designed and prepared, and the test piece with the longest length is selected as the target test piece. The minimum preset length of the target test piece is determined based on the standard that the ratio of the preset length of the target test piece to the working wavelength of the target test piece is equal to 0.005. Within the preset length range, the minimum value is determined in advance. p The lengths of the equidistant lengths, and p Each has a different length and indicates the preparation p a length p One tested component; p The range of values ​​is p ≥ L b / ( B · λ ), L b =| L max - L min|, L max This indicates the maximum length within the preset length range. L min This indicates the minimum length within the preset length range. λ Indicates the operating wavelength of the target device under test; B It is a preset constant and B The value of is determined by the standard that the suppression of ripples in adjacent test pieces with equal spacing is clearly observable, and its value range can be set to . B ≥0.005. This allows for the pre-design and fabrication of multiple test pieces of different lengths within a preset length range.

[0118] Based on the above Figure 1 The S-parameter measurement method for suppressing ripple, as shown in one example embodiment, determines whether ripple exists in the S-parameter by matching the parameter curve of the currently determined S-parameter with the parameter curve of the ripple-free standard parameter when the electronic device has a pre-stored parameter curve of the S-parameter. Based on this, the S-parameter measurement method for suppressing ripple provided by the present invention may further include:

[0119] If the parameter curve of the S-parameter is matched with the preset ripple-free parameter curve, and it is determined that the parameter curve of the S-parameter does not match the preset ripple-free parameter curve, then the S-parameter is determined to have ripple.

[0120] Specifically, the preset ripple-free parameter curve can be a standard parameter curve in which the S-parameters do not exhibit resonance, fluctuation, or abrupt changes.

[0121] Specifically, in order to improve the efficiency of determining whether there is ripple in the S-curve, a preset ripple-free parameter curve representing the absence of ripple in the S-parameters can be pre-set and stored, and matched with the S-parameters obtained in the current test. If the parameter curve of the S-parameters obtained in the current test does not match the preset ripple-free parameter curve, then it is determined that there is ripple in the S-parameters obtained in the current test.

[0122] It should be noted that if the S-parameters obtained from the current test are matched with the preset ripple-free parameter curve, then the S-parameters obtained from the current test are the target S-parameters after the first test piece has suppressed ripple.

[0123] For example, will Figure 3B The coaxial cable shown is the test piece, meaning both the inner and outer conductors are made of copper, and the intermediate dielectric material is polytetrafluoroethylene (PTFE). The effective permittivity and effective permeability of the coaxial cable are 2.1. ε 0 and μ0. The outer diameter of the coaxial cable is 7mm, the inner diameter is 3mm, and the length is 10mm. At this point, with a target test frequency range of 600MHz–40GHz, a preset scan power of 1W, and a preset scan point count of 201, the following results can be obtained: Figure 8 The diagram shown is a schematic of the amplitude curve of the S-parameter of the coaxial line as the first test piece, in dB.

[0124] Maintaining the target test frequency range of 600MHz–40GHz, measuring a pre-designed and prepared coaxial cable with a length of 2mm, setting the preset scan power to 1W and the preset scan point count to 201, the following results can be obtained: Figure 9 The diagram shown is a schematic of the amplitude curve of the S-parameter of the coaxial line as the first test piece, in dB.

[0125] Will Figure 4B The microstrip line shown is used as the device under test, such as Figure 4B As shown, the microstrip line is filled with two dielectric materials: copper for both the conductor strip and the ground plane, meaning the substrate material is Rogers 5880. The effective dielectric constant and effective permeability of the microstrip line are 1.8 and 1.8, respectively. ε 0 and μ 0. The conductor strip thickness is 35μm, the conductor strip width is 0.6mm, the dielectric substrate thickness is 0.508mm, the ground plane thickness is 35μm, the microstrip line width is 20mm, and the microstrip line length is 40mm. At this point, with a target test frequency range of 150MHz–10GHz, a preset scan power of 1W, and a preset scan point count of 201, the following results can be obtained: Figure 10 The diagram shown is a schematic of the amplitude curve of the S-parameters of the microstrip line as the first device under test, with units in dB.

[0126] Maintaining the target test frequency range of 150MHz–10GHz, measuring a pre-designed and prepared coaxial cable with a length of 10mm, setting the preset scan power to 1W and the preset scan point count to 201, the following results can be obtained: Figure 11 The diagram shown is a schematic of the amplitude curve of the S-parameters of the microstrip line as the first device under test, with units in dB.

[0127] Based on the above Figure 1 The S-parameter measurement method for suppressing ripple, as shown in one example embodiment, involves an electromagnetic wave perpendicularly incident on a first test object, which is transmitted multiple times within the test object via multiple reflections and transmissions. The presence of ripple in the S-parameters obtained from this test can be determined based on the relationship between the reflected wave, the transmitted wave, and the incident wave. Therefore, the S-parameter measurement method for suppressing ripple provided in this embodiment of the invention may further include:

[0128] First, under the condition that the incident wave perpendicularly incident into the first test piece undergoes multiple reflections and multiple transmissions through the first test piece, a first ratio of the power of all reflected waves in the first test piece to the power of the incident wave, and a second ratio of the power of all transmitted waves in the first test piece to the power of the incident wave are determined; then, when the difference between the amplitude of the first ratio and 0 is minimized, and / or the difference between the amplitude of the second ratio and 1 is minimized, it is determined that the S-parameters of the first test piece have ripple.

[0129] Specifically, the difference between the amplitude of the first ratio and 0 is minimized; specifically, the first ratio is close to 0. In dB terms, this means the amplitude of the first ratio is close to negative infinity (-∞). Similarly, the difference between the amplitude of the second ratio and 1 is minimized; specifically, the second ratio is close to 1. In dB terms, this means the amplitude of the second ratio is close to 0. At least one of these two scenarios will cause the S-parameter curve to deviate from its normal value, exhibiting resonance, fluctuations, or abrupt changes—that is, ripple in the S-parameters. Therefore, when an incident wave perpendicularly incident into the first device under test undergoes multiple reflections and transmissions, the presence of ripple in the S-parameters of the first device under test can be determined by minimizing the difference between the amplitude of the first ratio of the power of all reflected waves in the first device under test to the power of the incident wave and 0, and / or minimizing the difference between the amplitude of the second ratio of the power of all transmitted waves in the first device under test to the power of the incident wave and 1. This improves the flexibility and accuracy of determining whether ripple exists in the S-parameters.

[0130] Based on the above Figure 1 The S-parameter measurement method for suppressing ripple, as shown in one example embodiment, when the first device under test (DUT) is filled with a single dielectric (such as a coaxial line) or at least two dielectrics (such as a microstrip line), determines the effective dielectric constant and effective permeability of the corresponding first DUT by determining the dielectric constant and permeability of a dielectric with the same electromagnetic properties as the corresponding first DUT, and determines the first ratio and the second ratio accordingly. The specific determination process may include:

[0131] The first ratio and the second ratio are determined based on the reflection coefficient of the first device under test, the length of the first device under test, the effective dielectric constant and the effective magnetic permeability of the first device under test, and the propagation constant of the incident wave in the first device under test.

[0132] The effective dielectric constant and effective permeability are both the dielectric constant and permeability of a medium that has the same electromagnetic properties as the first test piece filled with a single medium or at least two media.

[0133] Specifically, this first ratio is the ratio of all reflected wave power to incident wave power. S 11 The second ratio is specifically the ratio of all transmitted wave power to incident wave power. S 21 In the case of [the aforementioned situation], the first ratio and the second ratio can be determined using equations (15) to (17) in the aforementioned embodiments. The specific determination process and related diagrams can be found in the aforementioned embodiments. They will not be repeated here.

[0134] Based on the above Figure 1 In one example embodiment of the S-parameter measurement method for ripple suppression shown, if the target S-parameter is determined before traversing multiple different lengths of multiple devices under test (DUTs), calibration and frequency sweep testing can be performed on the remaining DUTs that have not been traversed, so as to determine the target S-parameters of each first DUT after ripple suppression from multiple DUTs. Based on this, the S-parameter measurement method for ripple suppression provided by the present invention may further include:

[0135] When there is at least one target length among multiple test devices that is smaller than the length of the first test device corresponding to the target S-parameter, the vector network analyzer is controlled to perform calibration and frequency sweep tests on the first test devices corresponding to each of the at least one target length within the target test frequency range based on the preset scan power and preset scan points, so as to determine the target S-parameter of each of the first test devices after ripple suppression.

[0136] Specifically, for multiple test devices of different lengths that have been pre-designed and prepared, if the S-parameters of the first test device selected from these multiple test devices, obtained through calibration and frequency sweep testing, do not have ripple, then the S-parameters without ripple can be determined as the target S-parameters of the first test device after ripple suppression. At the same time, it can also be determined whether there is at least one target length among the multiple test devices of different lengths that is smaller than the length of the first test device corresponding to the target S-parameter. If so, the test devices corresponding to each of the at least one target length are all taken as the first test devices and calibrated and frequency swept tests are performed on each of them. This is to obtain the target S-parameters of each of the first test devices after ripple suppression.

[0137] It should be noted that if there is no target length smaller than the length of the first test piece corresponding to the target S-parameter among the multiple test pieces of different lengths, then it can be considered that only the test piece with the smallest length among the multiple test pieces can be used as the first test piece to obtain the target S-parameter of the first test piece after suppressing ripple.

[0138] The S-parameter measurement device for suppressing ripple provided by the present invention will be described below. The S-parameter measurement device for suppressing ripple described below can be referred to in correspondence with the S-parameter measurement method for suppressing ripple described above.

[0139] The S-parameter measurement device for suppressing ripple provided by the present invention is applied to a parameter measurement system, which includes a vector network analyzer, a coaxial cable and a first device under test, with the two ends of the coaxial cable connected to the vector network analyzer and the first device under test, respectively.

[0140] Reference Figure 12 The diagram below shows the structure of the S-parameter measurement device for suppressing ripple provided by the present invention. Figure 12 As shown, the S-parameter measurement device 1200 for suppressing ripple includes: a control test module 1210 and a test device update module 1220.

[0141] The control test module 1210 is used to select the test piece with the longest length from multiple test pieces of different lengths as the first test piece, and control the vector network analyzer to perform calibration and frequency sweep test on the first test piece within the target test frequency range based on the preset scan power and preset scan points, so as to determine the S-parameters of the first test piece.

[0142] The device under test (DUT) update module 1220 is used to remove the longest DUT from multiple DUTs when it is determined that there is ripple in the S-parameters, to obtain an updated DUT; to determine the updated DUT as a new set of multiple DUTs, and to repeatedly execute the steps of selecting the longest DUT from multiple different lengths of multiple DUTs as the first DUT, and controlling the vector network analyzer to perform calibration and frequency sweep testing on the first DUT within the target test frequency range based on a preset scan power and a preset number of scan points, to determine the S-parameters of the first DUT; until the S-parameters without ripple are determined as the target S-parameters of the first DUT after ripple suppression.

[0143] Optionally, the control test module 1210 is specifically used to determine a target test piece of a preset length from multiple different lengths of multiple test pieces; to determine the highest test frequency and the lowest test frequency with the preset length being greater than a first preset working wavelength of the target test piece at the highest test frequency and the preset length being greater than a second preset working wavelength of the target test piece at the lowest test frequency; and to determine the target test frequency range based on the highest test frequency and the lowest test frequency.

[0144] Optionally, the control test module 1210 is specifically used to predetermine multiple different lengths from a preset length range and instruct the preparation of multiple test pieces of multiple different lengths; the spacing between each pair of adjacent test pieces is equal.

[0145] Optionally, the control test module 1210 is specifically used to determine the preset length as the maximum length; determine the working wavelength corresponding to the lowest test frequency in the target test frequency range as the minimum length; and determine the preset length range based on the maximum length and the minimum length.

[0146] Optionally, the test device update module 1220 is specifically used to determine that there is ripple in the S-parameter when comparing and analyzing the parameter curve of the S-parameter with the preset ripple-free parameter curve and determining that the parameter curve of the S-parameter does not match the preset ripple-free parameter curve.

[0147] Optionally, the test device update module 1220 is specifically used to determine, when the incident wave perpendicularly incident into the first test device undergoes multiple reflections and multiple transmissions through the first test device, a first ratio of the power of all reflected waves in the first test device to the power of the incident wave, and a second ratio of the power of all transmitted waves in the first test device to the power of the incident wave; and to determine that ripple exists in the S-parameter when the difference between the amplitude of the first ratio and 0 is minimized, and / or the difference between the amplitude of the second ratio and 1 is minimized.

[0148] Optionally, the test device update module 1220 is specifically used to determine the first ratio and the second ratio based on the reflection coefficient of the first test device, the length of the first test device, the effective dielectric constant and the effective permeability of the first test device, and the propagation constant of the incident wave in the first test device; wherein the effective dielectric constant and the effective permeability are both dielectric constants and permeabilities of media with the same electromagnetic properties as the first test device filled with a single medium or at least two media.

[0149] Optionally, the device under test (DUT) update module 1220 is specifically used to control the vector network analyzer to perform calibration and frequency sweep tests on the first DUT corresponding to each of the at least one target length that is smaller than the length of the first DUT corresponding to the target S-parameter, based on a preset scan power and a preset number of scan points, in the case where there is at least one target length among the multiple DUTs. This determines the target S-parameter of each of the first DUTs after ripple suppression.

[0150] The S-parameter measurement device 1200 for suppressing ripple provided in this embodiment of the invention can execute the technical solution in any embodiment of the above-described S-parameter measurement method for suppressing ripple. Its implementation principle and specific implementation process are similar to those of the S-parameter measurement method for suppressing ripple. Please refer to the implementation principle and specific implementation process of the S-parameter measurement method for suppressing ripple, which will not be repeated here.

[0151] Figure 13 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 13As shown, the electronic device may include: a processor 1310, a communication interface 1320, a memory 1330, and a communication bus 1340, wherein the processor 1310, the communication interface 1320, and the memory 1330 communicate with each other via the communication bus 1340. The processor 1310 can call logic instructions in the memory 1330 to execute an S-parameter measurement method for ripple suppression, the method including:

[0152] The first test device (DD) is selected as the longest DD from multiple DDs of different lengths. Based on a preset scan power and a preset number of scan points, a vector network analyzer is controlled to calibrate and perform frequency sweep tests on the first DD within the target test frequency range to determine the S-parameters of the first DD. If ripple is found in the S-parameters, the longest DD is removed from the multiple DDs to obtain an updated DD. The updated DD is then identified as a new set of multiple DDs, and the above steps are repeated until the S-parameters without ripple are determined as the target S-parameters of the first DD after ripple suppression.

[0153] Furthermore, the logical instructions in the aforementioned memory 1330 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0154] On the other hand, the present invention also provides a computer program product, the computer program product comprising a computer program that can be stored on a non-transitory computer-readable storage medium, wherein when the computer program is executed by a processor, the computer is capable of executing the S-parameter measurement method for suppressing ripple provided by the above methods, the method comprising:

[0155] The first test device (DD) is selected as the longest DD from multiple DDs of different lengths. Based on a preset scan power and a preset number of scan points, a vector network analyzer is controlled to calibrate and perform frequency sweep tests on the first DD within the target test frequency range to determine the S-parameters of the first DD. If ripple is found in the S-parameters, the longest DD is removed from the multiple DDs to obtain an updated DD. The updated DD is then identified as a new set of multiple DDs, and the above steps are repeated until the S-parameters without ripple are determined as the target S-parameters of the first DD after ripple suppression.

[0156] In another aspect, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the S-parameter measurement method for suppressing ripple provided by the methods described above, the method comprising:

[0157] The first test device (DD) is selected as the longest DD from multiple DDs of different lengths. Based on a preset scan power and a preset number of scan points, a vector network analyzer is controlled to calibrate and perform frequency sweep tests on the first DD within the target test frequency range to determine the S-parameters of the first DD. If ripple is found in the S-parameters, the longest DD is removed from the multiple DDs to obtain an updated DD. The updated DD is then identified as a new set of multiple DDs, and the above steps are repeated until the S-parameters without ripple are determined as the target S-parameters of the first DD after ripple suppression.

[0158] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0159] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0160] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for measuring S-parameters to suppress ripple, characterized in that, The method is applied to a parameter measurement system, which includes a vector network analyzer, a coaxial cable, and a device under test (DUT), wherein the two ends of the coaxial cable are respectively connected to the vector network analyzer and a first DUT; the method includes: The first test device (DD) is selected from multiple different lengths of multiple test devices (DDs). Based on a preset scan power and a preset number of scan points, the vector network analyzer is controlled to calibrate and perform frequency sweep tests on the first DD within a target test frequency range to determine the S-parameters of the first DD. The process of determining the multiple different lengths of the multiple DDs includes: pre-determining the multiple different lengths from a preset length range and instructing the preparation of multiple DDs of the multiple different lengths; the spacing between each pair of adjacent DDs is equal. The process of determining the preset length range includes: setting the preset length as the maximum length; setting the target test frequency... The minimum length is determined by the operating wavelength corresponding to the lowest test frequency within the frequency range; based on the maximum length and the minimum length, the preset length range is determined; the process of determining the target test frequency range includes: determining a target test device of a preset length from multiple different lengths of the plurality of test devices; determining the highest test frequency and the lowest test frequency with the preset length being greater than a first preset operating wavelength of the target test device at the highest test frequency and the preset length being greater than a second preset operating wavelength of the target test device at the lowest test frequency as targets; and determining the target test frequency range based on the highest test frequency and the lowest test frequency. If it is determined that there is ripple in the S-parameter, the test piece with the longest length is removed from the plurality of test pieces to obtain an updated test piece; The updated test device is identified as the new plurality of test devices, and the above steps are repeated until the S-parameter without ripple is determined as the target S-parameter of the first test device after ripple suppression.

2. The S-parameter measurement method for suppressing ripple according to claim 1, characterized in that, The method further includes: If the parameter curve of the S-parameter is compared and analyzed with the preset ripple-free parameter curve, and it is determined that the parameter curve of the S-parameter does not match the preset ripple-free parameter curve, then the S-parameter is determined to have ripple.

3. The S-parameter measurement method for suppressing ripple according to claim 1, characterized in that, The method further includes: When an incident wave perpendicularly incident into the first test piece undergoes multiple reflections and multiple transmissions through the first test piece, a first ratio of the power of all reflected waves in the first test piece to the power of the incident wave, and a second ratio of the power of all transmitted waves in the first test piece to the power of the incident wave are determined. The presence of ripple in the S-parameter is determined when the difference between the amplitude of the first ratio and 0 is minimized, and / or the difference between the amplitude of the second ratio and 1 is minimized.

4. The S-parameter measurement method for suppressing ripple according to claim 3, characterized in that, The process of determining the first ratio and the second ratio includes: The first ratio and the second ratio are determined based on the reflection coefficient of the first device under test, the length of the first device under test, the effective dielectric constant of the first device under test, the effective magnetic permeability of the first device under test, and the propagation constant of the incident wave in the first device under test. Wherein, the effective dielectric constant and the effective permeability are both dielectric constants and permeabilities of media with the same electromagnetic properties as the first test piece filled with a single medium or at least two media.

5. The S-parameter measurement method for suppressing ripple according to claim 1, characterized in that, The method further includes: If, among the plurality of test devices, there is at least one target length smaller than the length of the first test device corresponding to the target S-parameter, the vector network analyzer is controlled to perform calibration and frequency sweep tests on the first test devices corresponding to each of the at least one target length within the target test frequency range based on the preset scan power and the preset number of scan points, so as to determine the target S-parameter of each of the plurality of test devices after ripple suppression.

6. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the S-parameter measurement method for suppressing ripple as described in any one of claims 1 to 5.

7. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the S-parameter measurement method for suppressing ripple as described in any one of claims 1 to 5.

Images