Debugging device and method for pA class current amplification module

Abstract

The application discloses a debugging device and method for a pA-grade current amplification module, which comprises a debugging cabinet connected with the current amplification module to be debugged, a resistor box, and a processor. The debugging cabinet is used for collecting the output voltage of the current amplification module to be debugged in real time and sending the output voltage to the processor. Meanwhile, the debugging cabinet automatically sets the range of the current amplification module to be debugged in combination with the range information of the processor. The debugging cabinet receives the control command from the processor to test the self-checking and / or insulation detection function of the current amplification module to be debugged. The resistor box is used for outputting two micro-current signals to the current amplification module to be debugged according to the control command of the processor. The processor is used for analyzing whether the self-checking and / or insulation detection function of the current amplification module to be debugged is normal according to the collected output voltage, performing fault diagnosis on the current amplification module to be debugged, and positioning the damaged device. The application can realize rapid and automatic debugging of the current amplification module accurately.

Description

Technical Field

[0001] This invention relates to the field of neutron signal measurement in nuclear reactors, and more specifically to a debugging device and method for a pA-level current amplification module. Background Technology

[0002] The pA-level current amplification module is used in the reactor core neutron flux measurement system. It can acquire micro-current signals from a self-powered neutron detector installed inside the pressure vessel, amplify, filter, and delay-eliminate the acquired current values, and then convert them into voltage outputs. It can also perform self-tests and insulation tests. The acquired micro-current signals are used for online, continuous calculation of the three-dimensional power distribution of the reactor core, monitoring of fuel assembly line power density and deviation from the nucleus-boiling ratio, and providing calibration coefficients for the power range of the external nuclear instrumentation system.

[0003] The self-powered neutron detector outputs a current signal in the pA range. The current amplification module's transmitter and compensation terminals can acquire current within the range of 1E-11A to 1E-3A. The current amplification module is divided into 10... -6 10 -7 10 -8 10 -9 The device has four speed settings, controlled by eight digital switches, and includes self-testing and insulation testing functions. The current testing method involves manually wiring and setting up the test environment before each test, manually selecting the operating mode and range using DIP switches, and then sequentially adjusting the current amplification module's functionality. This method is inefficient, prone to noise, and affects the testing results. Summary of the Invention

[0004] The technical problem this invention aims to solve is that most existing methods for debugging pA-level current amplification modules are manual, failing to achieve rapid and automated debugging, and exhibiting low efficiency and accuracy. This invention provides a debugging device and method for pA-level current amplification modules, capable of providing the module with operating power and high-precision input current, acquiring the module's output signal, performing self-test and / or insulation detection function debugging, displaying the results on a processor, and performing fault diagnosis. This invention enables rapid, automated, and accurate debugging of current amplification modules, while improving reliability and debugging efficiency.

[0005] This invention is achieved through the following technical solution:

[0006] In a first aspect, the present invention provides a debugging device for a pA-level current amplification module, the device comprising a debugging chassis, a resistor box and a processor, wherein the debugging chassis is connected to the processor, the processor is connected to the resistor box, and the resistor box is connected to the debugging chassis.

[0007] The debugging chassis is connected to the current amplification module to be debugged. The debugging chassis is used to acquire the output voltage of the current amplification module to be debugged in real time, and send the output voltage to the processor for analysis, processing and display via isolated serial communication. At the same time, the debugging chassis automatically sets the range of the current amplification module to be debugged based on the range information of the processor; and receives control commands from the processor to test the self-test and / or insulation test functions of the current amplification module to be debugged.

[0008] The resistor box is used to output two micro-current signals to the debugging chassis according to the control commands of the processor, so as to provide input current to the current amplification module to be debugged;

[0009] The processor is used to analyze the linearity of each stage of the current amplification module based on the acquired output voltage of the current amplification module under test, determine the size of the debugging resistor in the resistor box and the leakage current of each range; and control the checking of whether the self-test function and / or insulation detection function of the current amplification module under test are normal, and obtain the debugging results; based on the debugging results, perform fault diagnosis on the current amplification module under test and locate the fault of the damaged device.

[0010] Furthermore, the test chassis includes a base plate, a test bench, and a built-in power supply;

[0011] The base plate is used to select the appropriate amplification level based on the two micro-current signals provided by the resistor box, and transmit the two micro-current signals to the current amplification module to be debugged for amplification and processing. It also collects the output voltage after amplification and processing by the current amplification module to be debugged, and outputs the collected output voltage to the processor through the serial port.

[0012] The test bench is used to house the built-in power supply, base plate, and current amplification module to be debugged. During debugging, the current amplification module to be debugged is placed on the test pins inside the shielded box, and the shielded box cover is pressed down to perform closed debugging work, which reduces noise interference and makes debugging work more convenient and efficient.

[0013] Built-in power supply for powering the current amplification module to be debugged.

[0014] Furthermore, the baseboard includes test pins connected to the current amplification module to be debugged, two analog input modules, one analog output module, one serial port, and a processing module.

[0015] Furthermore, the self-test and / or insulation test functions of the current amplification module to be debugged are tested, including:

[0016] When self-test is required, the processor sets the working mode of the current amplification module to be tested, controls the baseboard to output 1V voltage to the self-test port of the current amplification module to be tested, collects the output voltage value of the current amplification module to be tested, and transmits the output voltage value to the processor for judgment and display.

[0017] When insulation testing is required, the working mode of the current amplification module under test is controlled by the base plate. The current amplification module under test collects the analog signal output by the base plate, and the base plate collects the output voltage value of the current amplification module under test and transmits the output voltage value to the processor for calculation and display.

[0018] Furthermore, the resistor box includes a power supply unit and a current signal board;

[0019] The power supply unit is used to convert the 220V input voltage into a 5VDC digital power signal and send the digital power signal to the current signal board.

[0020] The current signal board is used to convert digital power signals into analog signals through processor control and output current signal values ​​to the debugging chassis.

[0021] Furthermore, the current amplification module to be debugged includes a transmitting port, a compensation port, and a self-test port;

[0022] The transmitting port and the compensation port are used to receive two micro-current signals provided by the resistor box.

[0023] The self-test port is used to control the current amplification module under test to perform self-testing through the processor.

[0024] Furthermore, the current amplification module under test uses 8-channel isolation switches to control the switching of ranges and whether to enter the insulation detection mode.

[0025] Furthermore, the processor is also used to record and save debugging information in the form of files, and to display, save and print debugging results in the form of reports or curves.

[0026] Secondly, the present invention provides a debugging method for a pA-level current amplification module, which is applied to the aforementioned debugging device for a pA-level current amplification module; the method includes:

[0027] S1: Connect the debugging device to the current amplification module to be debugged;

[0028] S2: The processor controls the input of the resistor box to 10. -9 A current is supplied to the current amplification module connected to the debugging chassis, which is used for the first-stage amplifier circuit 10. -9Gear adjustment; if the adjustment is successful, proceed to step S3; if the adjustment fails, analyze the collected voltage value through the processor to locate the fault; replace the faulty component according to the located faulty component.

[0029] S3: Follow step S2 to sequentially process the first-stage amplifier circuit 10 -8 Gear, 10 -7 gear and 10 -6 Adjust the gear position;

[0030] S4: -1V Circuit Debugging: Set the working mode of the current amplification module to be debugged to normal operation through the processor, and debug the -1V voltage value of the current amplification module. If the error is ≤1%, the requirement is met.

[0031] S5: Insulation detection function debugging: Set the working mode of the current amplification module to be debugged to normal operation through the processor, input a second current (e.g., 1000nA) into the transmitting port of the current amplification module to be debugged, and collect data from the current amplification module to be debugged; set the working mode of the current amplification module to insulation detection, and collect data again; based on the two collected data, the processor automatically calculates the insulation detection ratio, displays it, and determines whether the requirements are met.

[0032] S6: Self-test function debugging: The working mode of the current amplification module to be debugged is controlled to self-test mode by the base plate of the debugging chassis. The current amplification module to be debugged collects the analog signal output by the base plate. The base plate collects the output voltage value of the current amplification module to be debugged, and the processor reads the collected voltage value for display and determines whether it meets the requirements.

[0033] S7: Joint testing and debugging: The debugging device is used to test the overall function of the current amplification module to be debugged.

[0034] Furthermore, in step S2, the processor controls the input of the resistor box to 10. -9 A current is supplied to the current amplification module connected to the debugging chassis, which is used for the first-stage amplifier circuit 10. -9 Gear adjustment, including:

[0035] The processor sets the tap of the current amplifier module to be debugged to 10. -9 Set the range and working mode to normal operation, and set the output signal to the first current (e.g., 0.05nA). Control the micro current source of the resistor box to output the first current (e.g., 0.05nA) to the current amplification module to be debugged in the debugging chassis. The voltage value of the current amplification module to be debugged is collected through the debugging chassis, and the collected voltage value is transmitted to the processor for analysis and display.

[0036] Furthermore, "test passed" means that the collected voltage value meets the accuracy requirements, while "test failed" means that the collected voltage value does not meet the accuracy requirements.

[0037] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0038] This invention discloses a debugging device and method for pA-level current amplification modules. This invention enables rapid, accurate, and automated debugging of the current amplification modules, improving production efficiency, ensuring quality, and thus increasing production capacity. Furthermore, this invention has been applied in core measurement system supply projects for units 5 and 6 in Fuqing, Fujian; units K2 and K3 in Pakistan; and units 1 and 2 in Zhangzhou, Fujian. Attached Figure Description

[0039] The accompanying drawings, which are included to provide a further understanding of embodiments of the invention and form part of this application, do not constitute a limitation thereof. In the drawings:

[0040] Figure 1 This is a schematic diagram of a debugging device for a pA-level current amplification module according to the present invention.

[0041] Figure 2 This is a flowchart of a debugging method for a pA-level current amplification module according to the present invention.

[0042] Figure reference numerals and corresponding component names:

[0043] 100-Debugging chassis, 101-Baseboard, 102-Rack case, 103-Built-in power supply, 200-Resistor box, 201-Power supply unit, 202-Current signal board, 300-Processor. Detailed Implementation

[0044] In the following, the terms “comprising” or “may include” as used in various embodiments of the invention indicate the presence of an inventive function, operation, or element, and do not limit the addition of one or more functions, operations, or elements. Furthermore, as used in various embodiments of the invention, the terms “comprising,” “having,” and their cognates are intended only to indicate a specific feature, number, step, operation, element, component, or combination of the foregoing, and should not be construed as primarily excluding the presence of one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing, or adding one or more combinations of the foregoing.

[0045] In various embodiments of the invention, the expression "or" or "at least one of A and / or B" includes any combination or all combinations of the words listed simultaneously. For example, the expression "A or B" or "at least one of A and / or B" may include A, may include B, or may include both A and B.

[0046] The expressions used in the various embodiments of the present invention (such as "first," "second," etc.) may modify various constituent elements in the various embodiments, but do not limit the corresponding constituent elements. For example, the above expressions do not limit the order and / or importance of the elements. The above expressions are only used for the purpose of distinguishing one element from other elements. For example, a first user device and a second user device refer to different user devices, although both are user devices. For example, a first element may be referred to as a second element without departing from the scope of the various embodiments of the present invention, and similarly, a second element may also be referred to as a first element.

[0047] It should be noted that if a description is made of "connecting" one component to another, then the first component can be directly connected to the second component, and a third component can be "connected" between the first and second components. Conversely, when a component is "directly connected" to another component, it can be understood that there is no third component between the first and second components.

[0048] The terminology used in the various embodiments of the invention is for the purpose of describing particular embodiments only and is not intended to limit the various embodiments of the invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of the invention pertain. The terms (such as those defined in a generally used dictionary) are to be interpreted as having the same meaning as in the context of the relevant technical field and are not to be interpreted as having an idealized or overly formal meaning, unless clearly defined in the various embodiments of the invention.

[0049] To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments and accompanying drawings. The illustrative embodiments and descriptions of the present invention are only used to explain the present invention and are not intended to limit the present invention.

[0050] Based on the fact that the current signal output by the self-powered neutron detector is in the pA range, the current acquisition at the transmitter and compensation ends of the current amplification module can achieve a range of 1E-11A to 1E-3A. Meanwhile, the current amplification module is divided into 10... -6 10 -7 10-8 10 -9 The device has four speed settings, controlled by eight digital switches, and includes self-testing and insulation testing functions. The current testing method involves manually wiring and setting up the test environment before each test, manually selecting the operating mode and range using DIP switches, and sequentially adjusting the current amplification module's functionality. This manual method cannot achieve rapid, automated debugging, and its efficiency and accuracy are low, easily generating noise that affects the debugging results.

[0051] Therefore, based on the above problems, this invention designs a debugging device and method for a pA-level current amplification module, which can provide the current amplification module with working power and high-precision input current, collect the output signal of the current amplification module, debug the self-test function and / or insulation detection function of the current amplification module to be debugged, display and diagnose faults on the processor, etc. This invention can realize rapid, automated and accurate debugging of the current amplification module, while improving reliability and debugging efficiency.

[0052] The design concept of this invention is as follows: Two micro-current signals are output to the transmitting and compensating ends of the current amplification module under test. The module's range is automatically set. The output voltage value of the current amplification module is then acquired, and the measurement results are sent to a processor for display and recording via isolated serial communication. The processor analyzes and calculates the measurement data to determine the resistance value of the amplification resistor to be replaced and the leakage current magnitude for each range. Simultaneously, it checks whether the self-test and insulation detection functions of the current amplification module are normal.

[0053] Example 1

[0054] like Figure 1 As shown, the present invention provides a debugging device for a pA-level current amplification module. The device includes a debugging chassis 100, a resistor box 200, and a processor 300. The debugging chassis 100 is connected to the processor 300, the processor 300 is connected to the resistor box 200, and the resistor box 200 is connected to the debugging chassis 100.

[0055] The debugging chassis 100 is connected to the current amplification module to be debugged. The debugging chassis 100 is used to acquire the output voltage of the current amplification module to be debugged in real time, and send the output voltage to the processor 300 for analysis, processing and display via isolated serial communication. At the same time, the debugging chassis 100 automatically sets the range of the current amplification module to be debugged based on the range information of the processor 300; and receives control commands from the processor 300 to test the self-test and / or insulation test functions of the current amplification module to be debugged.

[0056] Resistor box 200 is used to output 10 according to the control commands of processor 300. -11 A~10-3 Two micro-current signals from A are sent to the debugging chassis 100 to provide input current to the current amplification module to be debugged.

[0057] The processor 300 is used to analyze the linearity of each stage of the current amplification module under test based on the acquired output voltage of the current amplification module under test, determine the size of the debugging resistor in the resistor box 200 and the leakage current of each range; and control the checking of whether the self-test function and / or insulation detection function of the current amplification module under test are normal, and obtain the debugging results; and perform fault diagnosis on the current amplification module under test based on the debugging results, and locate the fault of the damaged device.

[0058] In this embodiment, the processor 300 controls the resistor box 200 to output two micro-current signals to the debugging chassis 100. The debugging chassis 100 selects the appropriate amplification level based on the current magnitude via the base plate 101, and then internally transmits the two current signals to the current amplification module under test. The current amplification module amplifies the current and sends it to the base plate 101 for signal acquisition. The base plate 101 then transmits the acquired data to the processor 300 via a serial port for processing and display.

[0059] When self-test is required, the processor 300 sets the working mode of the current amplification module to be tested, controls the baseboard 101 to output 1V voltage to the self-test port of the current amplification module to be tested, collects the output voltage value of the current amplification module to be tested, and transmits the output voltage value to the processor 300 for judgment and display.

[0060] When insulation testing is required, the working mode of the current amplification module to be tested is controlled by the base plate 101. The current amplification module to be tested collects the analog signal output by the base plate 101. The base plate 101 collects the output voltage value of the current amplification module to be tested and transmits the output voltage value to the processor 300 for calculation and display.

[0061] In this embodiment, the debugging chassis 100 includes a base plate 101, a test bench 102, and a built-in power supply 103;

[0062] The base plate 101 is used to select the appropriate amplification level based on the two micro-current signals provided by the resistor box 200, and transmit the two micro-current signals to the current amplification module under test for amplification and processing. At the same time, it controls the working mode and amplification range of the current amplification module under test through nine switch signals, and provides one analog signal for self-testing. It also collects the output voltage after amplification and processing by the current amplification module under test, and outputs the collected output voltage to the processor 300 through the serial port. Specifically, the base plate 101 includes test pins connected to the current amplification module under test, two analog input modules, one analog output module, one serial port, and a processing module.

[0063] The test bench 102 is used to house the built-in power supply 103, the base plate 101, and the current amplification module to be debugged. During debugging, the current amplification module to be debugged is placed on the test pins inside the shielded box, and the shielded box cover is pressed down to perform closed debugging work, which reduces noise interference and makes debugging work more convenient and efficient.

[0064] Built-in power supply 103 is used to power the current amplification module to be debugged;

[0065] The built-in power supply 103 outputs ±15V to the base plate 101, which then passes through a three-terminal adjustable positive regulator and a three-terminal adjustable negative regulator to obtain a ±6V analog power supply. After passing through a π-type filter circuit, it supplies power to the current amplification module to be debugged, ensuring that the peak-to-peak value of the power supply ripple is less than 5mV and reducing the impact of the input voltage on the current amplification module to be debugged.

[0066] In the above technical solution, the present invention integrates the base plate 101 and the built-in power supply 103 in the test bench box 102. The current amplification module to be debugged is connected to the debugging device through the test pins on the base plate 101. The installation is simple and convenient, and it is placed in a shielded box to reduce external interference.

[0067] In this embodiment, the resistor box 200 includes a power supply unit 201 and a current signal board 202; the power supply unit 201 is used to convert the 220V input voltage into a 5VDC digital power signal and send the digital power signal to the current signal board 202; the current signal board 202 is used to convert the digital power signal into an analog signal under the control of the processor 300 and output the current signal value to the debugging chassis 100.

[0068] The current amplification module under test is controlled by 8-channel isolating switches to switch ranges and operate modes. The baseboard 101 controls the optocoupler via digital signals. When the input is 0, the optocoupler conducts and outputs -1V; when the input is 1, the optocoupler does not conduct and outputs 6V. After being filtered by a capacitor, the output controls the on / off state of 3DO6 to set the measurement range of the current amplification module or whether to enter the insulation detection mode.

[0069] In this embodiment, the current amplification module to be debugged includes a transmitting port, a compensation port, and a self-test port;

[0070] The transmitting port and the compensation port are used to receive two micro-current signals provided by the resistor box 200.

[0071] The self-test port is used to control the current amplification module to be debugged via processor 300 to perform self-test testing.

[0072] As a further implementation, the processor 300 is also used to record and save debugging information in the form of files, and to display, save and print debugging results in the form of reports or curves.

[0073] This invention: (1) The current amplification module to be debugged is placed on the test base plate of the debugging chassis and connected to the test probe to reduce the error that may be caused by manual wiring and improve reliability and debugging efficiency; (2) The debugging chassis acquires 8 channels of 16-bit analog signals with an accuracy of ≤ ±0.5%FS; (3) The processor can control the output current of the resistor box according to the set current value, and perform linear fitting based on the measured voltage to analyze the linearity of each range, determine the damage of components, and make fault judgment; (4) After the single power input, it obtains ±6V analog power through a three-terminal adjustable positive voltage regulator and a three-terminal adjustable negative voltage regulator, and then supplies power to the current amplification module after passing through a π-type filter circuit to ensure that the peak value of the power supply ripple is less than 5mV and reduce the influence of the input voltage on the current amplification module.

[0074] This invention enables rapid, accurate, and automated debugging of current amplification modules, improving production efficiency, ensuring quality, and thus increasing production capacity. Furthermore, this invention has been applied in core measurement system supply projects for units 5 and 6 in Fuqing, Fujian; units K2 and K3 in Pakistan; and units 1 and 2 in Zhangzhou, Fujian.

[0075] Example 2

[0076] like Figure 2 As shown, the difference between this embodiment and Embodiment 1 is that, based on the debugging device for a pA-level current amplification module in Embodiment 1, this embodiment also provides a debugging method for a pA-level current amplification module, the method comprising:

[0077] S1: Connect the debugging device to the current amplification module to be debugged;

[0078] S2: The processor 300 controls the resistor box 200 to input 10. -9 A current is supplied to the current amplification module connected to the debugging chassis 100, which is used to amplify the first-stage amplifier circuit 10. -9 Gear adjustment; if the adjustment is successful, proceed to step S3; if the adjustment fails, analyze the collected voltage value through processor 300 to locate the fault; replace the faulty component according to the located faulty component.

[0079] Specifically, the processor 300 sets the tap of the current amplification module to be debugged to "10". -9The circuit is set to "normal working mode" and "0.05nA" output signal. The micro-current source of the control resistor box 200 outputs 0.05nA to the current amplification module under test in the debugging chassis 100. The debugging chassis 100 acquires the voltage value of the current amplification module under test and transmits the acquired voltage value to the processor for analysis and display. If the acquired voltage does not meet the accuracy requirements, the processor calculates based on the acquired voltage, identifies the damaged component, replaces the damaged component, and repeats the debugging step. If the acquired voltage accuracy meets the requirements, the accuracy of the current amplification module under test is adjusted for other input current values.

[0080] S3: Following step S2, sequentially adjust the first-stage amplifier circuit "10" -8 "gear", "10" -7 "gear" and "10" -6 Adjust the gear position;

[0081] S4: -1V Circuit Debugging: Set the operating mode of the current amplifier module to be debugged to normal operation via processor 300.

[0082] The -1V voltage value of the current amplification module is adjusted. If the error is ≤1%, the requirement is met.

[0083] S5: Insulation detection function debugging: Set the working mode of the current amplification module to be debugged to "normal operation" through the processor 300, input 1000nA current into the transmitting port of the current amplification module to be debugged, and collect data from the current amplification module to be debugged; set the working mode of the current amplification module to be debugged to "insulation detection", and collect data again; based on the two collected data, the processor automatically calculates the insulation detection ratio, displays it, and determines whether the requirements are met;

[0084] S6: Self-test function debugging: The working mode of the current amplification module to be debugged is controlled to "self-test mode" by the base plate 101 of the debugging chassis 100. The current amplification module to be debugged collects the analog signal output by the base plate 101. The base plate 101 collects the output voltage value of the current amplification module to be debugged, and the processor reads the collected voltage value for display and determines whether the requirements are met.

[0085] S7: Joint testing and debugging: The debugging device is used to test the overall function of the current amplification module to be debugged.

[0086] This invention uses a processor to automatically control the range switching of the current amplification module under test and the output value of the micro-current source of the resistance box. It collects the amplified output voltage value of the current amplification module and performs error calculation, linear fitting, and fault location. It also verifies the self-test and insulation detection functions of the current amplification module. This invention can individually debug the four ranges of the amplification and compensation ends of the current amplification module. The debugging device can calculate the amplification result of the current amplification module under test, determine whether the accuracy is within the required range, and if not, locate the fault through calculation.

[0087] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A debugging device for a pA-level current amplification module, characterized in that, The device includes: A test chassis (100) is connected to the current amplification module to be tested. The test chassis (100) is used to collect the output voltage of the current amplification module to be tested in real time and send the output voltage to the processor (300) through isolated serial communication. At the same time, the test chassis (100) automatically sets the range of the current amplification module to be tested in combination with the range information of the processor (300). It also receives control commands from the processor (300) to test the self-test and / or insulation test functions of the current amplification module to be tested. The resistor box (200) is used to output two micro-current signals to the debugging chassis (100) according to the control command of the processor (300) to provide input current to the current amplification module to be debugged; The processor (300) is used to analyze the linearity of each stage of the current amplification module under test based on the collected output voltage of the current amplification module under test, determine the size of the debugging resistor in the resistor box (200) and the leakage current of each range; and control the checking of whether the self-test function and / or insulation detection function of the current amplification module under test are normal, and obtain the debugging results; and perform fault diagnosis on the current amplification module under test based on the debugging results, and locate the fault of the damaged device. The current amplification module to be debugged includes a transmitting port, a compensation port, and a self-test port; The transmitting port and the compensation port are used to receive two micro-current signals provided by the resistor box (200); The self-test port is used to control the current amplification module to be debugged to perform self-test detection through the processor (300); The current amplification module to be debugged uses 8-channel isolation switches to control the switching of ranges and whether to enter the insulation detection mode.

2. The debugging device for a pA-level current amplification module according to claim 1, characterized in that, The debugging chassis (100) includes a base plate (101), a test bench (102), and a built-in power supply (103). The base plate (101) is used to select the corresponding amplification level according to the two micro-current signals provided by the resistor box (200), and transmit the two micro-current signals to the current amplification module to be debugged for amplification and processing, collect the output voltage after amplification and processing by the current amplification module to be debugged, and output the collected output voltage to the processor (300) through the serial port. The test bench (102) is used to house the built-in power supply (103), the base plate (101), and the current amplification module to be debugged; The built-in power supply (103) is used to supply power to the current amplification module to be debugged.

3. The debugging device for a pA-level current amplification module according to claim 2, characterized in that, The base plate (101) includes test pins connected to the current amplification module to be debugged, two analog input modules, one analog output module, one serial port, and a processing module.

4. The debugging device for a pA-level current amplification module according to claim 2, characterized in that, Test the self-test and / or insulation test functions of the current amplification module to be debugged, including: When performing a self-test, the processor (300) sets the working mode of the current amplification module to be tested, controls the base plate (101) to output 1V voltage to the self-test port of the current amplification module to be tested, collects the output voltage value of the current amplification module to be tested, and transmits the output voltage value to the processor (300) for judgment and display. When insulation testing is performed, the working mode of the current amplification module to be tested is controlled by the base plate (101). Two micro-current signals are output from the resistor box to the current amplification module to be tested. The base plate (101) collects the output voltage value of the current amplification module to be tested and transmits the output voltage value to the processor (300) for calculation and display.

5. The debugging device for a pA-level current amplification module according to claim 1, characterized in that, The resistor box (200) includes a power supply unit (201) and a current signal board (202). The power supply unit (201) is used to convert the 220V input voltage into a 5VDC digital power signal and send the digital power signal to the current signal board (202). The current signal board (202) is used to convert the digital power signal into an analog signal under the control of the processor (300) and output the current signal value to the debugging chassis (100).

6. The debugging device for a pA-level current amplification module according to claim 1, characterized in that, The processor (300) is also used to record and save debugging information in the form of a file, and to display, save and print debugging results in the form of a report or curve.

7. A debugging method for a pA-level current amplification module, characterized in that, This method is applied to a debugging device for a pA-level current amplification module as described in any one of claims 1 to 6; the method includes: S1: Connect the debugging device to the current amplification module to be debugged; S2: The input of the resistor box (200) is controlled by the processor (300). The current is supplied to the current amplification module to be debugged connected to the debugging chassis (100) to the first-stage amplification circuit. Gear adjustment; if the adjustment is successful, proceed to step S3; if the adjustment fails, analyze the collected voltage value through the processor (300) to locate the fault; replace the faulty component according to the located faulty component. S3: Follow step S2 to sequentially process the first-stage amplifier circuit. gear, gear and Adjust the gear position; S4: The processor (300) sets the operating mode of the current amplification module to be debugged to normal operation, and performs the following actions on the current amplification module: The voltage value is adjusted; if the error... If so, then the requirement is met; S5: The processor (300) sets the working mode of the current amplification module to be debugged to normal operation, inputs the second current into the transmitting port of the current amplification module to be debugged, and collects data from the current amplification module to be debugged; the working mode of the current amplification module to be debugged is set to insulation detection, and data is collected again; based on the two collected data, the processor automatically calculates the insulation detection ratio, displays it, and determines whether the requirements are met. S6: The working mode of the current amplification module to be debugged is controlled to self-test mode by the base plate (101) of the debugging chassis (100). The current amplification module to be debugged collects the analog signal output by the base plate (101). The base plate (101) collects the output voltage value of the current amplification module to be debugged, and the processor reads the collected voltage value for display and determines whether the requirements are met. S7: The debugging device is used to test the overall function of the current amplification module to be debugged.

8. A debugging method for a pA-level current amplification module according to claim 7, characterized in that, In step S2, the processor (300) controls the input of the resistor box (200). The current is supplied to the current amplification module to be debugged connected to the debugging chassis (100) to the first-stage amplification circuit. Gear adjustment, including: The processor (300) sets the tap of the current amplifier module to be debugged to... The range and working mode are set to normal operation, and the output signal is set to the first current. The control resistor box (200) outputs the first current to the current amplification module to be debugged in the debugging chassis (100). The voltage value of the current amplification module to be debugged is collected through the debugging chassis (100), and the collected voltage value is transmitted to the processor for analysis and display.

9. A debugging method for a pA-level current amplification module according to claim 7, characterized in that, "Testing passed" means that the collected voltage value meets the accuracy requirements, while "testing failed" means that the collected voltage value does not meet the accuracy requirements.

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