A deep trench capacitor structure and method of manufacturing the same
CN117637716BActive Publication Date: 2026-08-28NAT CENT FOR ADVANCED PACKAGING CO LTD
Patent Information
- Application Number
- CN202311757803.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-19
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2043-12-19
AI Technical Summary
Technical Problem
[0003]深沟槽电容器的电容密度越大对电源完整性的改善效果越好,而在半导体器件中形成深沟槽电容器时可能出现一些工艺问题,比如侧壁粗糙度大会导致薄膜均匀性较差,比如DTC与TSV在同一硅片上制作时容易产生的Cu凸起等问题
Benefits of technology
[0034]1.本发明提供的深沟槽电容器制作工艺简单、成本低、与现有工艺兼容度高。
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Abstract
The present application relates to a kind of deep trench capacitor structure and its manufacturing method.Deep trench capacitor structure includes silicon interposer, the silicon interposer is configured as internal arrangement multiple metal tracks;Deep trench capacitor, the deep trench capacitor is configured as attached to the first surface of the silicon interposer;The deep trench capacitor includes wafer, multiple contact vias arranged in the wafer, and first dielectric layer, upper electrode, lower electrode, second dielectric layer and plastic encapsulation layer arranged in the first surface of the wafer;The deep trench capacitor is electrically connected with the multiple metal tracks in the silicon interposer by the contact via.By depositing electrode and dielectric layer on the deep trench array etched, deep trench capacitor is made in the way of plastic encapsulation, integrated to silicon interposer, has better compatibility to through silicon via, and manufacturing process is simpler, and the compatibility of existing process is higher.
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Citation Information
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