Method and device for determining the ablation level of a high-voltage cable buffer layer and electronic device

Abstract

The application provides a method and device for determining the ablation level of a high-voltage cable buffer layer and an electronic device. The method comprises: drying a buffer layer sample; continuously applying a preset voltage and a preset current to the buffer layer sample in a sealed electrode cavity; collecting gas in the sealed electrode cavity at different ablation times using a gas sampling needle to obtain a plurality of gas samples; analyzing the concentration of the gas in each gas sample using a gas chromatograph to determine a characteristic gas concentration set; performing negative exponential function fitting analysis on the characteristic gas concentration and the ablation time to determine an ablation time constant corresponding to each ablation time; calculating the ratio of the ablation time to the ablation time constant to determine a buffer layer ablation severity conversion value, and determining the target ablation level of the buffer layer sample according to the buffer layer ablation severity conversion value. The method can effectively classify the severity of the ablation defects of the high-voltage cable buffer layer corresponding to different characteristic gas concentrations, thereby improving the operation reliability of the high-voltage cable line.

Description

Technical Field

[0001] This application relates to the field of determining the ablation level of a high-voltage cable buffer layer, and more specifically, to a method for determining the ablation level of a high-voltage cable buffer layer, an apparatus for determining the ablation level of a high-voltage cable buffer layer, a computer-readable storage medium, and an electronic device. Background Technology

[0002] The buffer layer is a key structure in high-voltage cables, serving functions such as longitudinal water blocking, buffering internal mechanical stress, and providing a conductive path between the insulation shield and the aluminum sheath. Therefore, the buffer layer is crucial for the safe and stable operation of high-voltage cables. However, in some cases, buffer layer erosion can lead to cable breakdown.

[0003] High-voltage cable buffer layer ablation faults exhibit a significant latent characteristic. Before a significant ablation fault occurs, conventional detection methods such as broadband impedance spectroscopy, X-ray detection, and partial discharge analysis are often insufficient to effectively detect the internal buffer layer ablation fault. In other words, there is currently a lack of methods to classify the severity of buffer layer ablation, making it impossible to accurately determine the extent of buffer layer ablation in actual high-voltage cable lines, thus severely increasing the latent risk of high-voltage cable buffer layer ablation. Summary of the Invention

[0004] The main objective of this application is to provide a method, apparatus, computer-readable storage medium, and electronic device for determining the ablation level of a high-voltage cable buffer layer, so as to at least solve the problem that the prior art cannot accurately determine the severity of ablation of the high-voltage cable buffer layer.

[0005] To achieve the above objectives, according to one aspect of this application, a method for determining the ablation level of a high-voltage cable buffer layer is provided, comprising: obtaining a buffer layer sample and drying the buffer layer sample; placing the buffer layer sample in a sealed electrode cavity and continuously applying a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample, while simultaneously collecting gas in the sealed electrode cavity at different ablation times using a gas sampling needle to obtain multiple gas samples, each gas sample including at least one characteristic gas; analyzing the gas concentration in each gas sample using a gas chromatograph to determine a characteristic gas concentration set corresponding to each gas sample, each characteristic gas concentration set including at least one characteristic gas concentration; performing a negative exponential function fitting analysis on the characteristic gas concentration and ablation time in each characteristic gas concentration set to determine the ablation time constant corresponding to each ablation time; calculating the ratio of the ablation time to the ablation time constant to determine a converted value of the buffer layer ablation severity, and determining the target ablation level of the buffer layer sample based on the converted value of the buffer layer ablation severity.

[0006] Optionally, a negative exponential function fitting analysis is performed on the characteristic gas concentration and ablation time of each of the characteristic gas concentration sets to determine the ablation time constant corresponding to each ablation time. This includes: performing a negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the characteristic gas concentration sets to determine the negative exponential function expression C = Aexp(-t / τ) + C0, where C is the characteristic gas concentration, τ is the ablation time constant, A is a first constant, C0 is a second constant, and t is the ablation time corresponding to the characteristic gas concentration; and determining the ablation time constant based on the negative exponential function expression.

[0007] Optionally, determining the target ablation level of the buffer layer sample based on the calculated ablation severity value includes: determining the target ablation level of the buffer layer sample as a mild ablation level when the calculated ablation severity value is less than a first threshold; determining the target ablation level of the buffer layer sample as a moderate ablation level when the calculated ablation severity value is greater than or equal to the first threshold and less than a second threshold, wherein the second threshold is greater than the first threshold; and determining the target ablation level of the buffer layer sample as a severe ablation level when the calculated ablation severity value is greater than the second threshold.

[0008] Optionally, a gas sample includes multiple characteristic gases, and a set of characteristic gas concentrations includes multiple corresponding characteristic gas concentrations, with each characteristic gas and its concentration corresponding to a specific gas. After analyzing the gas concentrations in each gas sample using a gas chromatograph to determine the set of characteristic gas concentrations corresponding to each gas sample, the method further includes: performing a negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each set of characteristic gas concentrations to obtain a preparatory time constant corresponding to each characteristic gas; calculating the ratio of each ablation time to the preparatory time constant to determine multiple preparatory conversion values; determining the preparatory ablation level of multiple buffer layer samples based on each preparatory conversion value, and determining the highest preparatory ablation level as the target ablation level of the buffer layer sample.

[0009] Optionally, after performing negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each characteristic gas concentration set to obtain the preparation time constant corresponding to each characteristic gas, the method further includes: determining a weight value of the preparation time constant corresponding to each characteristic gas based on the concentration of each characteristic gas in the characteristic gas concentration set, wherein the weight value is proportional to the concentration of each characteristic gas in the characteristic gas concentration set; and determining the ablation time constant based on the weight value of the preparation time constant corresponding to each characteristic gas and the preparation time constant.

[0010] Optionally, before drying the buffer layer sample, the method further includes: setting drying conditions for the buffer layer sample, wherein the drying conditions for the buffer layer sample include at least a drying temperature range and a drying time range; collecting gas in the sealed electrode cavity at different ablation times using a gas sampling needle to obtain multiple gas samples, including: collecting gas in the sealed electrode cavity once every preset time period using the gas sampling needle until the buffer layer sample decomposes and burns through under the action of current thermal effect, thereby obtaining the gas samples corresponding to different ablation times.

[0011] Optionally, the two sides of the buffer layer sample are in contact with the aluminum electrode of the high-voltage cable and the insulation shielding layer of the cable, respectively. The volume of each gas sample is within a preset volume range. The preset voltage is an AC voltage and the preset current is an AC current. Before placing the buffer layer sample in the sealed electrode cavity, the method further includes: fully ventilating the sealed electrode cavity.

[0012] According to another aspect of this application, a device for determining the ablation level of a high-voltage cable buffer layer is provided, comprising: an acquisition unit for acquiring a buffer layer sample and drying the buffer layer sample; a processing unit for placing the buffer layer sample in a sealed electrode cavity and continuously applying a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample, while simultaneously collecting gas in the sealed electrode cavity at different ablation times using a gas sampling needle to obtain multiple gas samples, each gas sample including at least one characteristic gas; and a first determination unit for analyzing the gas using a gas chromatograph. The gas concentration in each gas sample is determined to establish a characteristic gas concentration set corresponding to each gas sample, wherein each characteristic gas concentration set includes at least one characteristic gas concentration; a second determining unit is used to perform a negative exponential function fitting analysis on the characteristic gas concentration and ablation time in each characteristic gas concentration set to determine the ablation time constant corresponding to each ablation time; a third determining unit is used to calculate the ratio of the ablation time to the ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0013] According to another aspect of this application, a computer-readable storage medium is provided, the computer-readable storage medium including a stored program, wherein, when the program is executed, it controls the device where the computer-readable storage medium is located to perform any of the methods for determining the ablation level of the high-voltage cable buffer layer.

[0014] According to another aspect of this application, an electronic device is provided, comprising: one or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, the one or more programs including a method for performing any of the methods described above for determining the ablation level of a high-voltage cable buffer layer.

[0015] Applying the technical solution of this application, the method for determining the ablation level of the high-voltage cable buffer layer first obtains a buffer layer sample and dries it; then, the buffer layer sample is placed in a sealed electrode cavity, and a preset voltage and current are continuously applied to the buffer layer sample to ablate it. Simultaneously, a gas sampling needle is used to collect gas in the sealed electrode cavity at different ablation times, obtaining multiple gas samples, each including at least one characteristic gas; secondly, a gas chromatograph is used to analyze the gas concentration in each gas sample to determine the characteristic gas concentration set corresponding to each gas sample, where each characteristic gas concentration set includes at least one characteristic gas concentration; thirdly, a negative exponential function fitting analysis is performed on the characteristic gas concentration and ablation time in each characteristic gas concentration set to determine the ablation time constant corresponding to each ablation time; finally, the ratio of the ablation time to the ablation time constant is calculated to determine the converted value of the buffer layer ablation severity, and the target ablation level of the buffer layer sample is determined based on the converted value of the buffer layer ablation severity. This method can effectively classify the severity of ablation defects in the buffer layer of high-voltage cables under different characteristic gas concentrations, solving the problem that existing technologies cannot accurately determine the severity of ablation in the buffer layer of high-voltage cables. It has the advantages of fast analysis speed, simplicity and ease of implementation, and high applicability, thereby improving the operational reliability of high-voltage cable lines. Attached Figure Description

[0016] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0017] Figure 1 A flowchart illustrating a method for determining the ablation level of a high-voltage cable buffer layer according to an embodiment of this application is shown.

[0018] Figure 2 A schematic diagram of gas chromatographic absorption peaks of gaseous products during the ablation process of a buffer layer provided according to an embodiment of this application is shown.

[0019] Figure 3 A schematic diagram illustrating the relationship between characteristic gas concentration and ablation time according to an embodiment of this application is shown.

[0020] Figure 4A schematic diagram showing the relationship between a buffer layer ablation severity conversion value, characteristic gas concentration, and ablation level according to an embodiment of this application is provided.

[0021] Figure 5 A structural block diagram of a device for determining the ablation level of a high-voltage cable buffer layer according to an embodiment of this application is shown. Detailed Implementation

[0022] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0023] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this application described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0025] As described in the background section, existing technologies lack methods for classifying the severity of buffer layer erosion, making it impossible to accurately determine the severity of buffer layer erosion in actual high-voltage cable lines, thus significantly increasing the latent risk of high-voltage cable buffer layer erosion. To address the problem that existing technologies cannot accurately determine the severity of high-voltage cable buffer layer erosion, embodiments of this application provide a method for determining the erosion level of a high-voltage cable buffer layer, a device for determining the erosion level of a high-voltage cable buffer layer, a computer-readable storage medium, and an electronic device.

[0026] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

[0027] This embodiment provides a method for determining the ablation level of a high-voltage cable buffer layer running on a mobile terminal, computer terminal, or similar computing device. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0028] Figure 1 This is a flowchart illustrating a method for determining the ablation level of a high-voltage cable buffer layer according to an embodiment of this application. Figure 1 As shown, the method includes the following steps:

[0029] Step S201: Obtain a buffer layer sample and dry the buffer layer sample.

[0030] Specifically, thoroughly drying the high-voltage cable buffer layer in an oven can remove residual moisture.

[0031] Before drying the buffer layer sample, the method further includes setting drying conditions for the buffer layer sample, wherein the drying conditions for the buffer layer sample include at least a drying temperature range and a drying time range.

[0032] Specifically, the drying conditions for the buffer layer can be a drying temperature range of 60℃ to 90℃ and a drying time range of 12h to 24h. Excessive drying temperature can lead to buffer layer decomposition, while excessive drying time can cause thermal aging, both of which will result in inaccurate results. Therefore, maintaining the drying conditions of the buffer layer sample within the specified temperature and time ranges can ensure the accuracy of the results.

[0033] In this method, the two sides of the buffer layer sample are in contact with the aluminum electrode of the high-voltage cable and the insulation shielding layer of the cable, respectively. The volume of each gas sample is within a preset volume range. The preset voltage is an AC voltage and the preset current is an AC current. Before placing the buffer layer sample in the sealed electrode cavity, the method further includes: fully ventilating the sealed electrode cavity.

[0034] Specifically, the two sides of the aforementioned buffer layer sample are in contact with the aluminum electrode of the high-voltage cable and the insulation shielding layer of the cable, respectively. This allows for the replication of the structural distribution of the buffer layer within the actual high-voltage cable, making the calculation results more practical. Furthermore, thoroughly ventilating the sealed electrode cavity before the test eliminates interference from impurities and gases, ensuring the accuracy of the results.

[0035] Step S202: Place the buffer layer sample in the sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, use a gas sampling needle to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas.

[0036] Specifically, the buffer layer generates characteristic gases when ablation defects occur. Therefore, the concentration of these characteristic gases is used as an important parameter for diagnosing the severity of ablation defects in the buffer layer. The preset voltage range is 10V to 100V, and the preset current range is 10mA to 100mA. If the preset voltage and current are too high, the buffer layer may be directly destroyed, making subsequent steps impossible. Furthermore, setting the preset voltage and current values ​​to be almost identical to the voltage and current values ​​of the buffer layer in actual applications better simulates its state in real-world applications, ensuring the accuracy and practicality of the determination method. Additionally, the voltage and current need to be applied continuously for a period of time to reproduce ablation defects of different severity levels in the buffer layer; generally, this is done for 3 minutes.

[0037] Step S203: Analyze the gas concentration in each of the above gas samples using a gas chromatograph to determine the characteristic gas concentration set corresponding to each of the above gas samples. Each of the above characteristic gas concentration sets includes at least one characteristic gas concentration.

[0038] Specifically, the gas collection volume for each sample is 1 to 2 μL. If too little gas is collected, the results will be inaccurate. If too much gas is collected, it will affect the gas concentration in the sealed electrode cavity, which will lead to inaccurate gas concentration in subsequent samples, and thus inaccurate final results.

[0039] The process involves collecting gas from the sealed electrode cavity at different ablation times using a gas sampling needle to obtain multiple gas samples. This includes collecting gas from the sealed electrode cavity once every preset time interval using the gas sampling needle until the buffer layer sample decomposes and burns through under the action of electric current thermal effect, thus obtaining the gas samples corresponding to different ablation times.

[0040] Specifically, the preset time period can be set to 30 seconds. If the preset time period is set too short, it will result in too many sampling times, which will affect the gas concentration in the sealed electrode cavity and cause the gas concentration collected later to be inaccurate, thus leading to inaccurate final results. If the preset time period is set too long, it will also lead to inaccurate final results.

[0041] Step S204: Perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above-mentioned characteristic gas concentration sets to determine the ablation time constant corresponding to each of the above-mentioned ablation times.

[0042] Specifically, by performing a negative exponential function fitting analysis on the evolution of gas product concentration with ablation time during the ablation process of the buffer layer, the time constant of the characteristic gas of the buffer layer ablation can be obtained, thereby determining the target ablation level of the buffer layer sample.

[0043] The process of performing negative exponential function fitting analysis on the characteristic gas concentrations and ablation times of the aforementioned characteristic gas concentration sets to determine the ablation time constants corresponding to each of the aforementioned ablation times includes the following steps:

[0044] Step S2041: Perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above characteristic gas concentration sets to determine the negative exponential function expression C=Aexp(-t / τ)+C0, where C is the above characteristic gas concentration, τ is the above ablation time constant, A is the first constant, C0 is the second constant, and t is the ablation time corresponding to the above characteristic gas concentration.

[0045] Step S2042: Determine the ablation time constant based on the above negative exponential function expression.

[0046] Specifically, the high-voltage cable buffer layer ablation severity classification method based on the characteristic gas time constant scientifically considers the evolution law of characteristic gas concentration generated in the buffer layer during the ablation process, and extracts the time constant of the key characteristic parameter reflecting the evolution law of ablation characteristic gas concentration, effectively classifying the ablation severity of the buffer layer.

[0047] Step S205: Calculate the ratio of the above ablation time to the above ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the above buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0048] Specifically, the high-voltage cable buffer layer ablation severity classification method based on characteristic gas time constant scientifically considers the evolution law of characteristic gas concentration generated in the buffer layer during the ablation process, and extracts the time constant of the key characteristic parameter reflecting the evolution law of ablation characteristic gas concentration. It effectively classifies the ablation severity of the buffer layer, provides characteristic gas concentration ranges corresponding to different ablation severity of the buffer layer, provides a basis for the graded diagnosis of the severity of ablation defects in the high-voltage cable buffer layer, and effectively solves the technical problem of the long-standing lack of a basis for graded diagnosis of ablation of the high-voltage cable buffer layer.

[0049] Determining the target ablation level of the buffer layer sample based on the calculated ablation severity value includes the following steps:

[0050] Step S2051: If the calculated value of the severity of ablation of the buffer layer is less than the first threshold, the target ablation level of the buffer layer sample is determined to be a mild ablation level.

[0051] Step S2052: If the calculated value of the severity of ablation of the buffer layer is greater than or equal to the first threshold and less than the second threshold, the target ablation level of the buffer layer sample is determined to be a moderate ablation level, and the second threshold is greater than the first threshold.

[0052] Step S2053: If the calculated value of the severity of ablation of the buffer layer is greater than the second threshold, the target ablation level of the buffer layer sample is determined to be a severe ablation level.

[0053] Specifically, this allows us to obtain the concentration range of characteristic gases under different degrees of buffer layer ablation severity, thus providing a basis for the characteristic gas diagnosis of the severity of buffer layer ablation defects.

[0054] The first threshold is a number less than 1, and the second threshold is a number greater than 1. That is, when the converted value of the severity of the buffer layer ablation is much less than 1, the buffer layer is in a state of mild ablation; when the converted value of the severity of the buffer layer ablation is close to 1, the buffer layer is in a state of moderate ablation; and when the converted value of the severity of the buffer layer ablation is much greater than 1, the buffer layer is in a state of severe ablation.

[0055] Wherein, a gas sample includes multiple characteristic gases, a concentration set of characteristic gases includes multiple corresponding concentrations of characteristic gases, and there is a one-to-one correspondence between the characteristic gases and the characteristic gas concentrations. After analyzing the gas concentrations in each gas sample using a gas chromatograph to determine the characteristic gas concentration set corresponding to each gas sample, the method further includes the following steps:

[0056] Step S301: Perform negative exponential function fitting analysis on the concentration and ablation time of each of the above-mentioned characteristic gas concentration sets to obtain the preparation time constant corresponding to each of the above-mentioned characteristic gases.

[0057] Step S302: Calculate the ratio of each of the above ablation times to the above preparation time constant, and determine multiple preparation conversion values;

[0058] Step S303: Based on each of the above-mentioned preliminary conversion values, determine the preliminary ablation level of the multiple buffer layer samples, and determine the highest of the above-mentioned preliminary ablation levels as the target ablation level of the buffer layer sample.

[0059] Specifically, this allows for the consideration of ablation levels calculated based on different characteristic gas concentrations, thus improving the accuracy of the determination method.

[0060] The method further includes the following steps after performing negative exponential function fitting analysis on the concentration and ablation time of each of the aforementioned characteristic gas concentration sets to obtain the preparatory time constant for each of the aforementioned characteristic gases:

[0061] Step S401: Based on the concentration of each of the aforementioned characteristic gases in the aforementioned characteristic gas concentration set, determine the weight value of the preparation time constant corresponding to each of the aforementioned characteristic gases, wherein the weight value is proportional to the concentration of each of the aforementioned characteristic gases in the aforementioned characteristic gas concentration set.

[0062] Step S402: Determine the ablation time constant based on the weight value of the preparation time constant corresponding to each of the above-mentioned characteristic gases and each of the above-mentioned preparation time constants.

[0063] Specifically, generally speaking, the higher the concentration of the characteristic gas, the greater its impact on the ablation degree of the buffer layer. Therefore, by determining different weight values ​​for the time constant based on the concentration of each characteristic gas, the accuracy of the determination method can be further improved.

[0064] In addition, the above embodiment first calculates the ablation degree of the buffer layer based on the concentration of the characteristic gas. Then, in subsequent applications, the concentration of the characteristic gas can be directly obtained, and the corresponding ablation degree can be directly matched based on the concentration of the characteristic gas to obtain the ablation degree of the buffer layer directly without further calculation.

[0065] Among them, such as Figure 2 As shown, the gas chromatographic absorption peaks of various gaseous products during the buffer layer ablation process can be observed. The concentration (ppm) of the characteristic gas C2H4 from the buffer layer ablation is obtained by calculating the peak area based on the Austerity coefficient. The results are as follows: Figure 3 As shown. In this embodiment, the characteristic gas is determined to be only C2H4. Based on the calculation steps in the above embodiment, the deterioration degree of the buffer layer is determined, resulting in the following: Figure 3 The schematic diagram shows that when the calculated degradation value of the buffer layer is less than 0.5, the buffer layer is determined to be slightly ablated; when the calculated degradation value is greater than or equal to 0.5 and less than or equal to 1.25, the buffer layer is determined to be moderately ablated; and when the calculated degradation value is greater than 1.25, the buffer layer is determined to be severely ablated. Furthermore, the relationship between the time constant of the ablation characteristic gas and the water content of the buffer layer is shown in Table 1.

[0066] Table 1. Relationship between the time constant of ablation characteristic gases and the water content of the buffer layer

[0067] Buffer layer moisture content / % <![CDATA[τ(C2H4)]]> 0 2.17 20 2.40 40 3.15 60 1.64

[0068] The method for determining the ablation level of the high-voltage cable buffer layer described in this application first obtains a buffer layer sample and dries it. Then, the buffer layer sample is placed in a sealed electrode cavity, and a preset voltage and current are continuously applied to ablate the sample. Simultaneously, a gas sampling needle is used to collect gas within the sealed electrode cavity at different ablation times, resulting in multiple gas samples, each containing at least one characteristic gas. Next, a gas chromatograph is used to analyze the gas concentration in each sample, determining the characteristic gas concentration set corresponding to each sample. Each characteristic gas concentration set includes at least one characteristic gas concentration. Then, a negative exponential function fitting analysis is performed on the characteristic gas concentrations and ablation times in each concentration set to determine the ablation time constant corresponding to each ablation time. Finally, the ratio of the ablation time to the ablation time constant is calculated to determine the converted value of the buffer layer ablation severity, and the target ablation level of the buffer layer sample is determined based on this converted value. This method can effectively classify the severity of ablation defects in the buffer layer of high-voltage cables under different characteristic gas concentrations, solving the problem that existing technologies cannot accurately determine the severity of ablation in the buffer layer of high-voltage cables. It has the advantages of fast analysis speed, simplicity and ease of implementation, and high applicability, thereby improving the operational reliability of high-voltage cable lines.

[0069] To enable those skilled in the art to better understand the technical solution of this application, the implementation process of the method for determining the ablation level of the high-voltage cable buffer layer of this application will be described in detail below with reference to specific embodiments.

[0070] This embodiment relates to a specific method for determining the ablation level of a high-voltage cable buffer layer, including the following steps:

[0071] 1) The buffer layer of the commercial 110kV cross-linked polyethylene high-voltage cable was thoroughly dried in an oven at 60℃ for 12 hours to remove residual moisture. The buffer layer sample size was 3cm×3cm and the thickness was 2mm.

[0072] 2) Place the dried buffer layer sample in the sealed electrode cavity. The buffer layer is in contact with the aluminum sheath sheet electrode of the high-voltage cable and the insulation shield sheet sample of the cable, respectively. The size of the aluminum sheath electrode and the insulation shield is the same as the size of the buffer layer sample.

[0073] 3) Apply a 30V AC voltage to the buffer layer and continue for 3 minutes until the buffer layer sample decomposes and burns through under the action of current thermal effect, so as to reproduce the ablation defects of different degrees of severity in the buffer layer.

[0074] 4) Gas was extracted from the sealed electrode cavity using a gas sampling needle, and collected every 30 seconds during the buffer layer ablation process, with a collection volume of 1 μL each time. The gas sample was then injected into the inlet channel of the gas chromatograph to obtain the gas chromatographic absorption peaks of the gaseous products during the buffer layer ablation process. The results are as follows: Figure 2 As shown. The concentration (ppm) of the characteristic gas C2H4 for buffer layer ablation was obtained by calculating the peak area based on the Auster coefficient. The results are as follows. Figure 3 As shown;

[0075] 5) The evolution of gas product concentration with ablation time during the ablation process of the buffer layer was analyzed by negative exponential function fitting, and the time constant of the characteristic gas of the buffer layer ablation was obtained. The fitting function expression is as follows: C=Aexp(-t / τ)+C0, where C is the concentration of the characteristic gas of ablation, τ is the time constant of the characteristic gas of the buffer layer ablation, and the relationship between the time constant of the characteristic gas of ablation and the water content of the buffer layer is shown in Table 1.

[0076] 6) Grading of Buffer Layer Ablation Severity: By calculating the ratio of ablation time to the characteristic gas time constant, the converted value of buffer layer ablation severity is obtained. Based on this, the buffer layer ablation level is classified, thereby determining the severity of the buffer layer ablation defect. The results are as follows: Figure 4 As shown. When the converted value of the buffer layer erosion severity is much less than 1, the buffer layer is at a slight erosion level; when the converted value of the buffer layer erosion severity is close to 1, the buffer layer is at a moderate erosion level, and the operating status of the high-voltage cable buffer layer needs to be monitored; when the converted value of the buffer layer erosion severity is much greater than 1, the buffer layer is at a severe erosion level, and the high-voltage cable line needs to be replaced in a timely manner. Figure 4 The obtained correlation between the converted value of ablation severity and the concentration of ablation characteristic gas can provide the concentration range of characteristic gas under different ablation severity levels, which can provide a reference for the graded diagnosis of ablation defects in the buffer layer of actual high-voltage cable lines.

[0077] It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases the steps shown or described may be executed in a different order than that shown here.

[0078] This application also provides a device for determining the ablation level of a high-voltage cable buffer layer. It should be noted that this device can be used to execute the method for determining the ablation level of a high-voltage cable buffer layer provided in this application. This device is used to implement the above embodiments and preferred embodiments; details already described will not be repeated. As used below, the term "module" can refer to a combination of software and / or hardware that performs a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0079] The following describes the apparatus for determining the ablation level of the high-voltage cable buffer layer provided in the embodiments of this application.

[0080] Figure 5 This is a schematic diagram of a device for determining the ablation level of a high-voltage cable buffer layer according to an embodiment of this application. Figure 5 As shown, the device includes an acquisition unit 10, a processing unit 20, a first determination unit 30, a second determination unit 40, and a third determination unit 50. The acquisition unit 10 is used to acquire a buffer layer sample and dry the buffer layer sample. The processing unit 20 is used to place the buffer layer sample in a sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate it. Simultaneously, a gas sampling needle is used to collect gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas. The first determination unit 30 is used to use... A gas chromatograph analyzes the concentration of gases in each of the aforementioned gas samples to determine a set of characteristic gas concentrations corresponding to each of the aforementioned gas samples. Each set of characteristic gas concentrations includes at least one characteristic gas concentration. A second determining unit 40 performs a negative exponential function fitting analysis on the characteristic gas concentrations and ablation times in each of the aforementioned characteristic gas concentration sets to determine the ablation time constant corresponding to each of the aforementioned ablation times. A third determining unit 50 calculates the ratio of the aforementioned ablation time to the aforementioned ablation time constant to determine the converted value of the ablation severity of the buffer layer, and determines the target ablation level of the aforementioned buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0081] The apparatus for determining the ablation level of the high-voltage cable buffer layer of this application includes an acquisition unit, a processing unit, a first determination unit, a second determination unit, and a third determination unit. The acquisition unit is used to acquire a buffer layer sample and dry it. The processing unit is used to place the buffer layer sample in a sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate it. At the same time, a gas sampling needle is used to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each gas sample including at least one characteristic gas. The first determination unit is used to analyze the gas concentration in each gas sample using a gas chromatograph to determine the characteristic gas concentration set corresponding to each gas sample. Each characteristic gas concentration set includes at least one characteristic gas concentration. The second determination unit is used to perform a negative exponential function fitting analysis on the characteristic gas concentration and ablation time in each characteristic gas concentration set to determine the ablation time constant corresponding to each ablation time. The third determination unit is used to calculate the ratio of ablation time to ablation time constant, determine the converted value of buffer layer ablation severity, and determine the target ablation level of the buffer layer sample based on the converted value of buffer layer ablation severity. This method can effectively classify the severity of ablation defects in the buffer layer of high-voltage cables under different characteristic gas concentrations, solving the problem that existing technologies cannot accurately determine the severity of ablation in the buffer layer of high-voltage cables. It has the advantages of fast analysis speed, simplicity and ease of implementation, and high applicability, thereby improving the operational reliability of high-voltage cable lines.

[0082] In some optional examples, the second determining unit includes a first determining module and a second determining module. The first determining module is used to perform a negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above-mentioned characteristic gas concentration sets, and determine the negative exponential function expression C = Aexp(-t / τ) + C0, where C is the above-mentioned characteristic gas concentration, τ is the above-mentioned ablation time constant, A is a first constant, C0 is a second constant, and t is the ablation time corresponding to the above-mentioned characteristic gas concentration. The second determining module is used to determine the ablation time constant according to the above-mentioned negative exponential function expression. This can scientifically consider the evolution law of the characteristic gas concentration generated by the buffer layer during the ablation process, and extract the time constant of the key characteristic parameter reflecting the evolution law of the ablation characteristic gas concentration, effectively classifying the severity of buffer layer ablation.

[0083] In some optional examples, the third determining unit includes a third determining module, a fourth determining module, and a fifth determining module. The third determining module is used to determine the target ablation level of the buffer layer sample as a mild ablation level when the calculated value of the buffer layer ablation severity is less than a first threshold. The fourth determining module is used to determine the target ablation level of the buffer layer sample as a moderate ablation level when the calculated value of the buffer layer ablation severity is greater than or equal to the first threshold and less than a second threshold, where the second threshold is greater than the first threshold. The fifth determining module is used to determine the target ablation level of the buffer layer sample as a severe ablation level when the calculated value of the buffer layer ablation severity is greater than the second threshold. This allows for the determination of the concentration range of characteristic gases under different buffer layer ablation severity levels, thereby providing a basis for characteristic gas diagnosis of the severity of buffer layer ablation defects.

[0084] In this embodiment, a gas sample includes multiple characteristic gases, and a set of characteristic gas concentrations includes multiple corresponding characteristic gas concentrations. Each characteristic gas and its concentration corresponds one-to-one. The device further includes a first processing module, a sixth determining module, and a seventh determining module. The first processing module, after analyzing the gas concentrations in each gas sample using a gas chromatograph to determine the set of characteristic gas concentrations corresponding to each gas sample, performs a negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each set of characteristic gas concentrations to obtain a preliminary time constant corresponding to each characteristic gas. The sixth determining module calculates the ratio of each ablation time to the preliminary time constant to determine multiple preliminary conversion values. The seventh determining module determines the preliminary ablation level of multiple buffer layer samples based on the preliminary conversion values ​​and determines the highest preliminary ablation level as the target ablation level of the buffer layer sample. This approach considers ablation levels calculated based on different characteristic gas concentrations, improving the accuracy of the determination method.

[0085] In an optional embodiment, the above-described apparatus further includes an eighth determining module and a ninth determining module. The eighth determining module is used to perform negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each of the aforementioned characteristic gas concentration sets to obtain the preparatory time constant corresponding to each of the aforementioned characteristic gases. The weight value is proportional to the concentration of each of the aforementioned characteristic gases in the aforementioned characteristic gas concentration sets. The ninth determining module is used to determine the ablation time constant based on the weight value of the preparatory time constant corresponding to each of the aforementioned characteristic gases and the aforementioned preparatory time constant. This can further improve the accuracy of the determining method.

[0086] In an optional embodiment, the apparatus further includes a setting module for setting drying conditions for the buffer layer sample before drying. These drying conditions include at least a drying temperature range and a drying time range. The first determining unit includes a collection module for collecting gas from the sealed electrode cavity using the gas sampling needle at preset time intervals until the buffer layer sample decomposes and burns through under the thermal effect of the current, obtaining gas samples corresponding to different ablation times. This improves the accuracy of the determining method.

[0087] As an optional approach, the buffer layer sample is in contact with the aluminum electrode of the high-voltage cable and the insulation shielding layer of the cable on both sides, respectively. The volume of each gas sample is within a preset volume range. The preset voltage is an AC voltage, and the preset current is an AC current. The device also includes a second processing module, which is used to fully ventilate the sealed electrode cavity before placing the buffer layer sample in it. This allows for the reproduction of the structural distribution of the buffer layer within the actual high-voltage cable, making the calculation results more practical. Furthermore, fully ventilating the sealed electrode cavity before the test eliminates interference from impurity gases inside, ensuring the accuracy of the results.

[0088] The aforementioned device for determining the ablation level of the high-voltage cable buffer layer includes a processor and a memory. The aforementioned acquisition units are all stored as program units in the memory, and the processor executes these program units to achieve the corresponding functions. All of the aforementioned modules are located in the same processor; alternatively, the modules may be located in different processors in any combination.

[0089] The processor contains a kernel, which retrieves the corresponding program units from memory. One or more kernels can be configured, and adjusting kernel parameters can address the problem of existing technologies being unable to accurately determine the severity of high-voltage cable buffer layer ablation.

[0090] The memory may include non-permanent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory includes at least one memory chip.

[0091] This invention provides a computer-readable storage medium including a stored program, wherein, when the program is executed, it controls the device containing the computer-readable storage medium to perform the method for determining the ablation level of the high-voltage cable buffer layer.

[0092] Specifically, the methods for determining the ablation level of the buffer layer in high-voltage cables include:

[0093] Step S201: Obtain a buffer layer sample and dry the buffer layer sample.

[0094] Specifically, thoroughly drying the high-voltage cable buffer layer in an oven can remove residual moisture.

[0095] Step S202: Place the buffer layer sample in the sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, use a gas sampling needle to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas.

[0096] Specifically, the buffer layer generates characteristic gases when ablation defects occur. Therefore, the concentration of these characteristic gases is used as an important parameter for diagnosing the severity of ablation defects in the buffer layer. The preset voltage range is 10V to 100V, and the preset current range is 10mA to 100mA. If the preset voltage and current are too high, the buffer layer may be directly destroyed, making subsequent steps impossible. Furthermore, setting the preset voltage and current values ​​to be almost identical to the voltage and current values ​​of the buffer layer in actual applications better simulates its state in real-world applications, ensuring the accuracy and practicality of the determination method. Additionally, the voltage and current need to be applied continuously for a period of time to reproduce ablation defects of different severity levels in the buffer layer; generally, this is done for 3 minutes.

[0097] Step S203: Analyze the gas concentration in each of the above gas samples using a gas chromatograph to determine the characteristic gas concentration set corresponding to each of the above gas samples. Each of the above characteristic gas concentration sets includes at least one characteristic gas concentration.

[0098] Specifically, the gas collection volume for each sample is 1 to 2 μL. If too little gas is collected, the results will be inaccurate. If too much gas is collected, it will affect the gas concentration in the sealed electrode cavity, which will lead to inaccurate gas concentration in subsequent samples, and thus inaccurate final results.

[0099] Step S204: Perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above-mentioned characteristic gas concentration sets to determine the ablation time constant corresponding to each of the above-mentioned ablation times.

[0100] Specifically, by performing a negative exponential function fitting analysis on the evolution of gas product concentration with ablation time during the ablation process of the buffer layer, the time constant of the characteristic gas of the buffer layer ablation can be obtained, thereby determining the target ablation level of the buffer layer sample.

[0101] Step S205: Calculate the ratio of the above ablation time to the above ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the above buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0102] Specifically, the high-voltage cable buffer layer ablation severity classification method based on characteristic gas time constant scientifically considers the evolution law of characteristic gas concentration generated in the buffer layer during the ablation process, and extracts the time constant of the key characteristic parameter reflecting the evolution law of ablation characteristic gas concentration. It effectively classifies the ablation severity of the buffer layer, provides characteristic gas concentration ranges corresponding to different ablation severity of the buffer layer, provides a basis for the graded diagnosis of the severity of ablation defects in the high-voltage cable buffer layer, and effectively solves the technical problem of the long-standing lack of a basis for graded diagnosis of ablation of the high-voltage cable buffer layer.

[0103] This invention provides a processor for running a program, wherein the program executes the method for determining the ablation level of the high-voltage cable buffer layer.

[0104] Specifically, the methods for determining the ablation level of the buffer layer in high-voltage cables include:

[0105] Step S201: Obtain a buffer layer sample and dry the buffer layer sample.

[0106] Specifically, thoroughly drying the high-voltage cable buffer layer in an oven can remove residual moisture.

[0107] Step S202: Place the buffer layer sample in the sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, use a gas sampling needle to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas.

[0108] Specifically, the buffer layer generates characteristic gases when ablation defects occur. Therefore, the concentration of these characteristic gases is used as an important parameter for diagnosing the severity of ablation defects in the buffer layer. The preset voltage range is 10V to 100V, and the preset current range is 10mA to 100mA. If the preset voltage and current are too high, the buffer layer may be directly destroyed, making subsequent steps impossible. Furthermore, setting the preset voltage and current values ​​to be almost identical to the voltage and current values ​​of the buffer layer in actual applications better simulates its state in real-world applications, ensuring the accuracy and practicality of the determination method. Additionally, the voltage and current need to be applied continuously for a period of time to reproduce ablation defects of different severity levels in the buffer layer; generally, this is done for 3 minutes.

[0109] Step S203: Analyze the gas concentration in each of the above gas samples using a gas chromatograph to determine the characteristic gas concentration set corresponding to each of the above gas samples. Each of the above characteristic gas concentration sets includes at least one characteristic gas concentration.

[0110] Specifically, the gas collection volume for each sample is 1 to 2 μL. If too little gas is collected, the results will be inaccurate. If too much gas is collected, it will affect the gas concentration in the sealed electrode cavity, which will lead to inaccurate gas concentration in subsequent samples, and thus inaccurate final results.

[0111] Step S204: Perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above-mentioned characteristic gas concentration sets to determine the ablation time constant corresponding to each of the above-mentioned ablation times.

[0112] Specifically, by performing a negative exponential function fitting analysis on the evolution of gas product concentration with ablation time during the ablation process of the buffer layer, the time constant of the characteristic gas of the buffer layer ablation can be obtained, thereby determining the target ablation level of the buffer layer sample.

[0113] Step S205: Calculate the ratio of the above ablation time to the above ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the above buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0114] Specifically, the high-voltage cable buffer layer ablation severity classification method based on characteristic gas time constant scientifically considers the evolution law of characteristic gas concentration generated in the buffer layer during the ablation process, and extracts the time constant of the key characteristic parameter reflecting the evolution law of ablation characteristic gas concentration. It effectively classifies the ablation severity of the buffer layer, provides characteristic gas concentration ranges corresponding to different ablation severity of the buffer layer, provides a basis for the graded diagnosis of the severity of ablation defects in the high-voltage cable buffer layer, and effectively solves the technical problem of the long-standing lack of a basis for graded diagnosis of ablation of the high-voltage cable buffer layer.

[0115] This invention provides a device including a processor, a memory, and a program stored in the memory and executable on the processor. When the processor executes the program, it performs at least the following steps:

[0116] Step S201: Obtain a buffer layer sample and dry the buffer layer sample.

[0117] Step S202: Place the buffer layer sample in the sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, use a gas sampling needle to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas.

[0118] Step S203: Analyze the gas concentration in each of the above gas samples using a gas chromatograph to determine the characteristic gas concentration set corresponding to each of the above gas samples. Each of the above characteristic gas concentration sets includes at least one characteristic gas concentration.

[0119] Step S204: Perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above-mentioned characteristic gas concentration sets to determine the ablation time constant corresponding to each of the above-mentioned ablation times.

[0120] Step S205: Calculate the ratio of the above ablation time to the above ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the above buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0121] The devices mentioned in this article can be servers, PCs, tablets, mobile phones, etc.

[0122] This application also provides a computer program product, which, when executed on a data processing device, is suitable for executing an initialization program having at least the following method steps:

[0123] Step S201: Obtain a buffer layer sample and dry the buffer layer sample.

[0124] Step S202: Place the buffer layer sample in the sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, use a gas sampling needle to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas.

[0125] Step S203: Analyze the gas concentration in each of the above gas samples using a gas chromatograph to determine the characteristic gas concentration set corresponding to each of the above gas samples. Each of the above characteristic gas concentration sets includes at least one characteristic gas concentration.

[0126] Step S204: Perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the above-mentioned characteristic gas concentration sets to determine the ablation time constant corresponding to each of the above-mentioned ablation times.

[0127] Step S205: Calculate the ratio of the above ablation time to the above ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the above buffer layer sample based on the converted value of the ablation severity of the buffer layer.

[0128] It is obvious to those skilled in the art that the modules or steps of the present invention described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those described herein, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, the present invention is not limited to any particular combination of hardware and software.

[0129] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0130] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0131] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0132] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0133] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0134] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0135] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0136] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0137] As can be seen from the above description, the embodiments of this application achieve the following technical effects:

[0138] 1) The method for determining the ablation level of the high-voltage cable buffer layer described in this application firstly obtains a buffer layer sample and dries it; then, the buffer layer sample is placed in a sealed electrode cavity, and a preset voltage and preset current are continuously applied to the buffer layer sample to ablate it. Simultaneously, a gas sampling needle is used to collect the gas in the sealed electrode cavity at different ablation times, resulting in multiple gas samples, each of which includes at least one characteristic gas; secondly, a gas chromatograph is used to analyze the gas concentration in each gas sample to determine the characteristic gas concentration set corresponding to each gas sample, where each characteristic gas concentration set includes at least one characteristic gas concentration; thirdly, a negative exponential function fitting analysis is performed on the characteristic gas concentration and ablation time in each characteristic gas concentration set to determine the ablation time constant corresponding to each ablation time; finally, the ratio of the ablation time to the ablation time constant is calculated to determine the converted value of the buffer layer ablation severity, and the target ablation level of the buffer layer sample is determined based on the converted value of the buffer layer ablation severity. This method can effectively classify the severity of ablation defects in the buffer layer of high-voltage cables under different characteristic gas concentrations, solving the problem that existing technologies cannot accurately determine the severity of ablation in the buffer layer of high-voltage cables. It has the advantages of fast analysis speed, simplicity and ease of implementation, and high applicability, thereby improving the operational reliability of high-voltage cable lines.

[0139] 2) The device for determining the ablation level of the high-voltage cable buffer layer according to the present application includes an acquisition unit, a processing unit, a first determination unit, a second determination unit, and a third determination unit. The acquisition unit is used to acquire a buffer layer sample and dry the buffer layer sample. The processing unit is used to place the buffer layer sample in a sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, a gas sampling needle is used to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each gas sample including at least one characteristic gas. The first determination unit is used to analyze the gas concentration in each gas sample using a gas chromatograph to determine the characteristic gas concentration set corresponding to each gas sample. A characteristic gas concentration set includes at least one characteristic gas concentration. The second determination unit is used to perform a negative exponential function fitting analysis on the characteristic gas concentration and ablation time in each characteristic gas concentration set to determine the ablation time constant corresponding to each ablation time. The third determination unit is used to calculate the ratio of ablation time to ablation time constant to determine the converted value of buffer layer ablation severity and determine the target ablation level of the buffer layer sample based on the converted value of buffer layer ablation severity. This method can effectively classify the severity of ablation defects in the buffer layer of high-voltage cables under different characteristic gas concentrations, solving the problem that existing technologies cannot accurately determine the severity of ablation in the buffer layer of high-voltage cables. It has the advantages of fast analysis speed, simplicity and ease of implementation, and high applicability, thereby improving the operational reliability of high-voltage cable lines.

[0140] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for determining the ablation level of a high-voltage cable buffer layer, characterized in that, include: Obtain a buffer layer sample and dry the buffer layer sample; The buffer layer sample is placed in a sealed electrode cavity, and a preset voltage and preset current are continuously applied to the buffer layer sample to ablate the buffer layer sample. At the same time, a gas sampling needle is used to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas. The concentration of gas in each gas sample is analyzed by gas chromatography to determine a set of characteristic gas concentrations corresponding to each gas sample, wherein a set of characteristic gas concentrations includes at least one characteristic gas concentration. A negative exponential function fitting analysis was performed on the characteristic gas concentration and ablation time of each of the characteristic gas concentration sets to determine the ablation time constant corresponding to each ablation time. Calculate the ratio of the ablation time to the ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the buffer layer sample based on the converted value of the ablation severity of the buffer layer.

2. The determination method according to claim 1, characterized in that, A negative exponential function fitting analysis was performed on the characteristic gas concentrations and ablation times of each of the aforementioned characteristic gas concentration sets to determine the ablation time constants corresponding to each ablation time, including: A negative exponential function fitting analysis was performed on the characteristic gas concentration and ablation time of each characteristic gas concentration set to determine the expression of the negative exponential function C=A exp(-t / τ)+C0, where C is the characteristic gas concentration, τ is the ablation time constant, A is the first constant, C0 is the second constant, and t is the ablation time corresponding to the characteristic gas concentration. The ablation time constant is determined based on the negative exponential function expression.

3. The determination method according to claim 1, characterized in that, The target ablation level of the buffer layer sample is determined based on the calculated ablation severity value of the buffer layer, including: If the calculated severity of the ablation of the buffer layer is less than the first threshold, the target ablation level of the buffer layer sample is determined to be a mild ablation level. If the calculated severity of the buffer layer ablation is greater than or equal to the first threshold and less than the second threshold, the target ablation level of the buffer layer sample is determined to be a moderate ablation level, where the second threshold is greater than the first threshold. If the calculated severity of the ablation of the buffer layer is greater than the second threshold, the target ablation level of the buffer layer sample is determined to be a severe ablation level.

4. The determination method according to claim 1, characterized in that, A gas sample includes multiple characteristic gases, and a set of characteristic gas concentrations includes multiple corresponding characteristic gas concentrations, wherein each characteristic gas corresponds one-to-one with its concentration. After analyzing the gas concentrations in each gas sample using a gas chromatograph to determine the set of characteristic gas concentrations corresponding to each gas sample, the method further includes: A negative exponential function fitting analysis was performed on each characteristic gas concentration and ablation time in each of the characteristic gas concentration sets to obtain the preparation time constant corresponding to each characteristic gas. Calculate the ratio of each ablation time to the preparation time constant to determine multiple preparation conversion values; Based on the aforementioned preliminary conversion values, the preliminary ablation levels of multiple buffer layer samples are determined, and the highest preliminary ablation level is determined as the target ablation level of the buffer layer sample.

5. The determination method according to claim 4, characterized in that, After performing negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each of the characteristic gas concentration sets to obtain the preparatory time constant corresponding to each characteristic gas, the method further includes: Based on the concentration of each characteristic gas in the concentration set, a weight value for the preparation time constant corresponding to each characteristic gas is determined, and the weight value is proportional to the concentration of each characteristic gas in the concentration set. The ablation time constant is determined based on the weight value of the preparation time constant corresponding to each of the characteristic gases and each of the preparation time constants.

6. The determination method according to claim 1, characterized in that, Before drying the buffer layer sample, the method further includes setting drying conditions for the buffer layer sample, wherein the drying conditions for the buffer layer sample include at least a drying temperature range and a drying time range. Gas samples were collected from the sealed electrode cavity at different ablation times using a gas sampling needle. The process included collecting gas from the sealed electrode cavity once every preset time interval until the buffer layer sample decomposed and burned through under the thermal effect of electric current, thus obtaining the gas samples corresponding to different ablation times.

7. The determination method according to claim 1, characterized in that, The buffer layer sample is in contact with the aluminum electrode of the high-voltage cable and the insulation shielding layer of the cable on both sides, respectively. The volume of each gas sample is within a preset volume range. The preset voltage is an AC voltage and the preset current is an AC current. Before placing the buffer layer sample in the sealed electrode cavity, the method further includes: fully ventilating the sealed electrode cavity.

8. A device for determining the ablation level of a high-voltage cable buffer layer, characterized in that, include: An acquisition unit is used to acquire a buffer layer sample and dry the buffer layer sample. The processing unit is used to place the buffer layer sample in a sealed electrode cavity and continuously apply a preset voltage and a preset current to the buffer layer sample to ablate the buffer layer sample. At the same time, a gas sampling needle is used to collect the gas in the sealed electrode cavity at different ablation times to obtain multiple gas samples, each of which includes at least one characteristic gas. The first determining unit is used to analyze the concentration of gas in each gas sample using a gas chromatograph to determine a set of characteristic gas concentrations corresponding to each gas sample, wherein a set of characteristic gas concentrations includes at least one characteristic gas concentration. The second determining unit is used to perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each of the characteristic gas concentration clusters to determine the ablation time constant corresponding to each ablation time. The third determining unit is used to calculate the ratio of the ablation time to the ablation time constant, determine the converted value of the ablation severity of the buffer layer, and determine the target ablation level of the buffer layer sample based on the converted value of the ablation severity of the buffer layer.

9. The determining device according to claim 8, characterized in that, The second determining unit includes a first determining module and a second determining module. The first determining unit is used to perform negative exponential function fitting analysis on the characteristic gas concentration and ablation time of each characteristic gas concentration set, and determine the negative exponential function expression C=A exp(-t / τ)+C0, where C is the characteristic gas concentration, τ is the ablation time constant, A is the first constant, C0 is the second constant, and t is the ablation time corresponding to the characteristic gas concentration; The second determining module is used to determine the ablation time constant based on the negative exponential function expression.

10. The determining device according to claim 8, characterized in that, The third determining unit includes a third determining module, a fourth determining module, and a fifth determining module. The third determining module is used to determine the target ablation level of the buffer layer sample as a mild ablation level when the calculated value of the ablation severity of the buffer layer is less than the first threshold. The fourth determining module is used to determine the target ablation level of the buffer layer sample as a moderate ablation level when the calculated value of the ablation severity of the buffer layer is greater than or equal to the first threshold and less than the second threshold, wherein the second threshold is greater than the first threshold. The fifth determining module is used to determine the target ablation level of the buffer layer sample as a severe ablation level when the calculated value of the ablation severity of the buffer layer is greater than the second threshold.

11. The determining device according to claim 8, characterized in that, A gas sample includes multiple characteristic gases, and a concentration set of characteristic gases includes multiple corresponding concentrations of characteristic gases. The characteristic gases and their concentrations correspond one-to-one. The device further includes a first processing module, a sixth determining module, and a seventh determining module. The first processing module is used to analyze the gas concentration in each gas sample using a gas chromatograph, determine the characteristic gas concentration set corresponding to each gas sample, and then perform negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each characteristic gas concentration set to obtain the preparation time constant corresponding to each characteristic gas. The sixth determining module is used to calculate the ratio of each ablation time to the preparation time constant, and determine multiple preparation conversion values; The seventh determining module is used to determine the preparatory ablation level of multiple buffer layer samples based on each of the preparatory conversion values, and to determine the highest preparatory ablation level as the target ablation level of the buffer layer sample.

12. The determining device according to claim 11, characterized in that, The device further includes an eighth determining module and a ninth determining module. The eighth determining module is used to perform negative exponential function fitting analysis on each characteristic gas concentration and ablation time in each characteristic gas concentration set to obtain the preparation time constant corresponding to each characteristic gas. Then, based on the characteristic gas concentration in each characteristic gas concentration set, it determines the weight value of the preparation time constant corresponding to each characteristic gas. The weight value is proportional to the characteristic gas concentration in each characteristic gas concentration set. The ninth determining module is used to determine the ablation time constant based on the weight value of the preparation time constant corresponding to each of the characteristic gases and each of the preparation time constants.

13. The determining device according to claim 8, characterized in that, The device further includes a setting module, which is used to set the drying conditions of the buffer layer sample before drying the buffer layer sample. The drying conditions of the buffer layer sample include at least a drying temperature range and a drying time range. The first determining unit includes a collection module, which is used to collect the gas in the sealed electrode cavity once every preset time period using the gas sampling needle until the buffer layer sample decomposes and burns through under the action of electric current thermal effect, thereby obtaining the gas sample corresponding to different ablation times.

14. The determining device according to claim 8, characterized in that, The buffer layer sample is in contact with the aluminum electrode of the high-voltage cable and the insulation shielding layer of the cable on both sides, respectively. The volume of each gas sample is within a preset volume range. The preset voltage is an AC voltage, and the preset current is an AC current. The device also includes a second processing module. The second processing module is used to fully ventilate the sealed electrode cavity before placing the buffer layer sample into the sealed electrode cavity.

15. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored program, wherein, when the program is executed, it controls the device containing the computer-readable storage medium to perform the method for determining the ablation level of the high-voltage cable buffer layer as described in any one of claims 1 to 7.

16. An electronic device, characterized in that, include: One or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, the one or more programs including a method for performing a method for determining the ablation level of a high-voltage cable buffer layer as described in any one of claims 1 to 7.

Images