Piezoelectric ceramic driving method, device, apparatus, and medium

Abstract

The present disclosure provides a piezoelectric ceramic driving method, device, equipment and medium, the method comprises: obtaining a target Gaussian waveform; according to the set sampling strategy, the target Gaussian waveform is sampled to obtain a target voltage waveform; wherein the set sampling strategy at least includes taking the peak value of the target Gaussian waveform as the sampling reference; driving the piezoelectric ceramic according to the target voltage waveform.

Description

Technical Field

[0001] This disclosure relates to the field of piezoelectric ceramic driving technology, and more specifically, to a piezoelectric ceramic driving method, a piezoelectric ceramic driving device, an electronic device, and a computer-readable storage medium. Background Technology

[0002] In related technologies, there is a mapping relationship between the vibration feedback of piezoelectric ceramics and the voltage waveform. Typically, a smooth voltage waveform provides piezoelectric ceramics with comfortable vibration feedback, and the voltage waveform needs to reach its maximum voltage quickly while remaining smooth in order to provide a greater vibrational sensation. However, existing voltage waveforms cannot simultaneously achieve both smoothness and a strong vibration, thus preventing piezoelectric ceramics from simultaneously providing both comfortable vibration feedback and a greater vibrational sensation. Summary of the Invention

[0003] One objective of this disclosure is to provide a new technical solution for piezoelectric ceramic drive.

[0004] According to a first aspect of the present disclosure, a piezoelectric ceramic driving method is provided, the method comprising:

[0005] Obtain the target Gaussian waveform;

[0006] According to a set sampling strategy, the target Gaussian waveform is sampled to obtain the target voltage waveform; wherein, the set sampling strategy includes at least using the peak value of the target Gaussian waveform as the sampling reference;

[0007] Drive the piezoelectric ceramic according to the target voltage waveform.

[0008] Optionally, the sampling strategy further includes sampling points located within the first confidence interval of the target Gaussian waveform.

[0009] Optionally, sampling the target Gaussian waveform to obtain the target voltage waveform includes:

[0010] Determine the number of sampling points and waveform parameters of the target Gaussian waveform;

[0011] The sampling parameters are determined based on the number of sampling points and the waveform parameters;

[0012] The target Gaussian waveform is sampled according to the sampling parameters and the waveform parameters to obtain the target voltage waveform.

[0013] Optionally, the waveform parameters include standard deviation and voltage amplitude;

[0014] The sampling parameters include eccentricity value, sampling start point, sampling end point, number of sampling points on the left side, number of sampling points on the right side, left sampling interval, and right sampling interval.

[0015] Optionally, determining the sampling parameters based on the number of sampling points and the waveform parameters includes:

[0016] The eccentricity value is determined based on the number of sampling points;

[0017] The sampling start point and the sampling end point are determined based on the eccentricity value and the standard deviation.

[0018] Based on the number of sampling points, determine the number of sampling points on the left and the number of sampling points on the right;

[0019] The left sampling interval is determined based on the number of sampling points on the left, the eccentricity value, and the sampling start point; and the right sampling interval is determined based on the number of sampling points on the right, the eccentricity value, and the sampling end point.

[0020] Optionally, sampling the target Gaussian waveform based on the sampling parameters and the waveform parameters to obtain the target voltage waveform includes:

[0021] If the current sampling point i is less than the number of sampling points on the left, the corresponding first sampling voltage is obtained based on the voltage amplitude, the sampling start point, the left sampling interval, the eccentricity value, and the standard deviation; wherein i is greater than 0 and less than or equal to N;

[0022] If the current sampling point i is greater than or equal to the number of sampling points on the left, the corresponding second sampling voltage is obtained based on the voltage amplitude, the eccentricity value, the sampling interval on the right, and the standard deviation.

[0023] The target voltage waveform is obtained based on a plurality of first sampled voltages and a plurality of second sampled voltages.

[0024] According to a second aspect of the present disclosure, a piezoelectric ceramic driving device is provided, the device comprising:

[0025] The acquisition module is used to acquire the target Gaussian waveform;

[0026] A sampling module is used to sample the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein, the set sampling strategy includes at least using the peak value of the target Gaussian waveform as a sampling reference;

[0027] A driving module is used to drive the piezoelectric ceramic according to the target voltage waveform.

[0028] According to a third aspect of the present disclosure, an electronic device is provided, comprising: a memory for storing executable computer instructions; and a processor for executing the piezoelectric ceramic driving method according to the first aspect above, under the control of the executable computer instructions.

[0029] According to a fourth aspect of this disclosure, a computer-readable storage medium is provided having computer instructions stored thereon, which, when executed by a processor, perform the piezoelectric ceramic driving method described in the first aspect above.

[0030] One beneficial effect of this embodiment is that it acquires a target Gaussian waveform and samples it according to a set sampling strategy to obtain a target voltage waveform. This set sampling strategy includes at least using the peak value of the target Gaussian waveform as a sampling reference, and then driving the piezoelectric ceramic based on the target voltage waveform. Because the target Gaussian waveform has smooth characteristics, and sampling is performed at least based on the peak value of the target Gaussian waveform, the obtained target voltage waveform can balance smoothness and strong vibration, enabling the piezoelectric ceramic to simultaneously obtain comfortable vibration feedback and a stronger vibration sensation.

[0031] Other features and advantages of this specification will become clear from the following detailed description of exemplary embodiments with reference to the accompanying drawings. Attached Figure Description

[0032] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments of this specification and, together with their description, serve to explain the principles of this specification.

[0033] Figure 1 This is one of the hardware configuration diagrams of an electronic device according to an embodiment of the present disclosure;

[0034] Figure 2 This is a schematic flowchart of a piezoelectric ceramic driving method according to an embodiment of the present disclosure;

[0035] Figure 3 This is a schematic diagram of the target Gaussian waveform and the sampled voltage according to an embodiment of the present disclosure;

[0036] Figure 4 This is a schematic diagram of the piezoelectric ceramic driving device according to an embodiment of the present disclosure;

[0037] Figure 5 This is a second schematic diagram of the hardware configuration of an electronic device according to an embodiment of the present disclosure. Detailed Implementation

[0038] Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that, unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the embodiments of the present disclosure.

[0039] The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit this disclosure or its application or use.

[0040] Techniques, methods, and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and equipment should be considered part of the specification.

[0041] In all the examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.

[0042] It should be noted that similar labels and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be discussed further in subsequent figures.

[0043] <Hardware Configuration>

[0044] Figure 1 This is a block diagram of the hardware configuration of an electronic device 1000 according to an embodiment of the present disclosure.

[0045] In one embodiment, the electronic device 1000 may be a server or a terminal device. The server may be a monolithic server or a distributed server spanning multiple computers or a computer data center. The terminal device may be a portable computer, desktop computer, wearable device, or any other device having a processor or other computing device and a memory or other storage device; this embodiment does not limit the specific device.

[0046] like Figure 1 As shown, the electronic device 1000 may include a processor 1100, a memory 1200, an interface device 1300, a communication device 1400, a display device 1500, an input device 1600, a speaker 1700, a microphone 1800, etc.

[0047] Processor 1100 may be a mobile processor. Memory 1200 includes, for example, ROM (Read-Only Memory), RAM (Random Access Memory), and non-volatile memory such as a hard disk. Interface device 1300 includes, for example, a USB interface and a headphone jack. Communication device 1400 may be capable of wired or wireless communication. Communication device 1400 may include short-range communication devices, such as any device that performs short-range wireless communication based on short-range wireless communication protocols such as Hilink, WiFi (IEEE 802.11), Mesh, Bluetooth, ZigBee, Thread, Z-Wave, NFC, UWB, and LiFi. Communication device 1400 may also include long-range communication devices, such as any device that performs WLAN, GPRS, or 2G / 3G / 4G / 5G long-range communication. Display device 1500 is, for example, an LCD screen or a touch screen. Input device 1600 may include, for example, a touch screen or a keyboard. Electronic device 1000 can output audio information through a speaker 1700 and acquire audio information through a microphone 1800.

[0048] Despite Figure 1 The electronic device 1000 shows multiple devices, but this disclosure may only relate to some of them. For example, electronic device 1000 may only relate to memory 1200 and processor 1100.

[0049] In embodiments of this disclosure, the memory 1200 of the electronic device 1000 is used to store instructions for controlling the processor 1100 to execute the piezoelectric ceramic driving method provided in the embodiments of this disclosure.

[0050] In the above description, those skilled in the art can design instructions based on the scheme disclosed in this disclosure. How the instructions control the processor to operate is well known in the art, and therefore will not be described in detail here.

[0051] <Method Implementation>

[0052] Figure 2 An embodiment of the piezoelectric ceramic driving method of this disclosure is shown, which can be driven by... Figure 1 The electronic device implementation shown is as follows: Figure 2 As shown, the piezoelectric ceramic driving method of this embodiment may include the following steps S2100 to S2300.

[0053] like Figure 2 As shown, the piezoelectric ceramic driving method in this embodiment may include the following steps S2100 to S2300:

[0054] Step S2100: Obtain the target Gaussian waveform.

[0055] Typically, Gaussian functions It can be represented as:

[0056]

[0057] in, Let be the amplitude of the Gaussian function. Let be the mean of the Gaussian function. This represents the standard deviation of the Gaussian function, which typically has the advantages of smooth waveform and bell-shaped curve.

[0058] In this embodiment, the target Gaussian waveform can be obtained first based on the Gaussian function, and the target Gaussian waveform can be sampled to obtain the sampled voltage to output the target voltage waveform, and then the piezoelectric ceramic can be driven based on the target voltage waveform.

[0059] After obtaining the target Gaussian waveform by performing step S2100 above, proceed to:

[0060] Step S2200: According to the set sampling strategy, the target Gaussian waveform is sampled to obtain the target voltage waveform.

[0061] It should be noted that if sampling is based on a fixed interval, the difference between the first and last sampling points will usually be relatively large under different amplitudes, and it cannot be guaranteed that the peak value of the target Gaussian waveform can be sampled. Therefore, in this embodiment, the sampling strategy includes at least using the peak value of the target Gaussian waveform as the sampling benchmark. Preferably, the sampling points can be selected to be sampled at equal intervals on both sides symmetrical to the peak value of the target Gaussian waveform, thus ensuring that the peak value of the target Gaussian waveform is sampled as much as possible.

[0062] It should be noted that, referring to the application of the Gaussian function in statistics—the characteristics of the Gaussian distribution—a shift of 1.96 standard deviations can cover 95% of the distribution values, and a shift of 2.58 standard deviations can cover 99% of the distribution values. In simpler terms, when the confidence interval fluctuates around the mean by 1.96 standard deviations, it can cover 95% of the distribution values, meaning that the estimated parameter value based on the sampling has a 95% probability of falling within this interval. Based on this, in this embodiment, the sampling strategy can further include setting the sampling points to be within the first confidence interval of the target Gaussian waveform. For example, the sampling points can be selected within the 99.9% confidence interval, which is u ± 3 standard deviations.

[0063] In an optional embodiment, step S2200, which samples the target Gaussian waveform according to a set sampling strategy to obtain the target voltage waveform, may further include the following steps S2210 to S2230:

[0064] Step S2210: Determine the number of sampling points of the target Gaussian waveform and the waveform parameters of the target Gaussian waveform.

[0065] The waveform parameters may include standard deviation and voltage amplitude.

[0066] For example, the number of sampling points N, standard deviation d, and voltage amplitude Vm of the target Gaussian waveform are first determined.

[0067] Step S2220: Determine the sampling parameters based on the number of sampling points and the waveform parameters.

[0068] The sampling parameters may include eccentricity value, sampling start point, sampling end point, number of sampling points on the left side, number of sampling points on the right side, left sampling interval, and right sampling interval.

[0069] Specifically, in step S2220, determining the sampling parameters based on the number of sampling points and the waveform parameters may further include the following steps S2221 to S2224:

[0070] Step S2221: Determine the eccentricity value based on the number of sampling points.

[0071] The eccentricity value is usually used as the center position of the sampling. The eccentricity value can be the peak value of the target Gaussian waveform or other positions that deviate from the peak value of the target Gaussian waveform, depending on the number of sampling points N.

[0072] In step S2221, the eccentricity value satisfy:

[0073]

[0074] in, Indicates the number of sampling points. It is usually rounded down.

[0075] Step S2222: Determine the sampling start point and the sampling end point based on the eccentricity value and the standard deviation.

[0076] In this step S2222, the sampling start point satisfy:

[0077]

[0078] in, d represents the eccentricity value, and d represents the standard deviation.

[0079] In step S2222, the sampling endpoint satisfy:

[0080]

[0081] in, d represents the eccentricity value, and d represents the standard deviation.

[0082] Step S2223: Determine the number of sampling points on the left and the number of sampling points on the right based on the number of sampling points.

[0083] The number of sampling points on the left side is usually expressed as the eccentricity value. The number of sampling points on the left side of the center.

[0084] In step S2223, the number of sampling points on the left side... satisfy:

[0085]

[0086] N represents the number of sampling points.

[0087] The number of sampling points on the right side is usually expressed as the eccentricity value. The number of sampling points on the right side of the center.

[0088] In step S2223, the number of sampling points on the right side... satisfy:

[0089]

[0090] N represents the number of sampling points, and P1 represents the number of sampling points on the left.

[0091] Step S2224: Determine the left sampling interval based on the number of left sampling points, the eccentricity value, and the sampling start point; and determine the right sampling interval based on the number of right sampling points, the eccentricity value, and the sampling end point.

[0092] The sampling interval on the left side is usually based on the eccentric value. The sampling interval between any two left-hand sampling points centered on the center.

[0093] In step S2224, the left sampling interval satisfy:

[0094]

[0095] in, Indicates the number of sampling points on the left. Indicates the eccentricity value. Indicates the sampling start point.

[0096] The sampling interval on the right side is usually based on the eccentric value. The sampling interval between any two sampling points on the right side of the center.

[0097] In step S2224, the sampling interval on the right side... satisfy:

[0098]

[0099] in, Indicates the number of sampling points on the right. Indicates the eccentricity value. Indicates the sampling endpoint.

[0100] Based on the above steps S2221 to S2224, the eccentricity value, sampling start point, sampling end point, number of sampling points on the left, number of sampling points on the right, left sampling interval, and right sampling interval can be determined. Then, based on the eccentricity value, sampling start point, sampling end point, number of sampling points on the left, number of sampling points on the right, left sampling interval, and right sampling interval, the target Gaussian waveform is sampled to obtain the target voltage waveform.

[0101] Step S2230: Sample the target Gaussian waveform according to the sampling parameters and the waveform parameters to obtain the target voltage waveform.

[0102] Specifically, step S2230, which samples the target Gaussian waveform based on the sampling parameters and the waveform parameters to obtain the target voltage waveform, may further include the following steps S2231 to S2233:

[0103] Step S2231: When the current sampling point i is less than the number of sampling points on the left, obtain the corresponding first sampling voltage based on the voltage amplitude, the sampling start point, the left sampling interval, the eccentricity value, and the standard deviation.

[0104] Where i is greater than 0 and less than or equal to N.

[0105] In this step S2231, In the case of the first sampling voltage 1 satisfies:

[0106]

[0107] in, Indicates voltage amplitude. Indicates the sampling start point. Indicates the sampling interval on the left. Indicates the eccentricity value. It represents the standard deviation.

[0108] Step S2232: If the current sampling point i is greater than or equal to the number of sampling points on the left, obtain the corresponding second sampling voltage based on the voltage amplitude, the number of sampling points on the left, the eccentricity value, the sampling interval on the right, and the standard deviation.

[0109] In this step S2232, In the case of the second sampling voltage satisfy:

[0110]

[0111] in, Indicates voltage amplitude. Indicates the sampling interval on the right. Indicates the eccentricity value. It represents the standard deviation.

[0112] Step S2233: Obtain the target voltage waveform based on the plurality of first sampled voltages and the plurality of second sampled voltages.

[0113] In step S2233, after obtaining multiple first sampled voltages and multiple second sampled voltages, the target voltage waveform can be output based on these multiple first sampled voltages and multiple second sampled voltages. (Refer to...) Figure 3 The sampling voltage 32 is obtained by sampling the target Gaussian waveform 31, and the target voltage waveform is obtained based on the sampling voltage 32.

[0114] Based on the above steps S2231 to S2233, the target voltage waveform can be output based on the target Gaussian waveform, and then the piezoelectric ceramic can be driven based on the target voltage waveform.

[0115] After performing the above step S2200, sampling the target Gaussian waveform according to the set sampling strategy to obtain the target voltage waveform, the process proceeds to:

[0116] Step S2300: Drive the piezoelectric ceramic according to the target voltage waveform.

[0117] In this embodiment, after obtaining the target voltage waveform, the piezoelectric ceramic can be driven according to the target voltage waveform. The obtained target voltage waveform can balance smoothness and strong vibration, enabling the piezoelectric ceramic to obtain both comfortable vibration feedback and greater vibration.

[0118] According to embodiments of this disclosure, a target Gaussian waveform is acquired, and a target voltage waveform is obtained by sampling the target Gaussian waveform according to a set sampling strategy. The set sampling strategy at least includes using the peak value of the target Gaussian waveform as a sampling reference, and then driving the piezoelectric ceramic based on the target voltage waveform. Because the target Gaussian waveform has smooth characteristics, and sampling is performed at least based on the peak value of the target Gaussian waveform, the obtained target voltage waveform can balance smoothness and strong vibration, enabling the piezoelectric ceramic to simultaneously obtain comfortable vibration feedback and a stronger vibration sensation.

[0119] <Example>

[0120] Next, refer to Figure 3 The diagram illustrates an example of a piezoelectric ceramic driving method, which includes:

[0121] Step 301, determine the number of sampling points Standard deviation And voltage amplitude Vm.

[0122] Step 302, based on the number of sampling points Determine the eccentricity value ,in, , It satisfies the condition of rounding down.

[0123] Step 303, based on the number of sampling points and standard deviation Determine the sampling starting point And based on the number of sampling points And standard deviation d, determine the sampling endpoint .

[0124] Step 304, based on the number of sampling points Determine the number of sampling points on the left side. And based on the number of sampling points and the number of sampling points on the left Determine the number of sampling points on the right. .

[0125] Step 305, based on the number of sampling points on the left eccentricity value and sampling start point Determine the sampling interval on the left side. And based on the number of sampling points on the right eccentricity value and sampling endpoint Determine the sampling interval on the right side. .

[0126] Step 306, if i Sampling voltage .

[0127] Step 307, if i Sampling voltage .

[0128] Step 308, output sampling voltage The target voltage waveform is obtained.

[0129] <Device Embodiment>

[0130] Figure 4This is a schematic diagram of a piezoelectric ceramic drive device according to one embodiment. Figure 4 As shown, the piezoelectric ceramic driving device 400 includes an acquisition module 410, a sampling module 420, and a driving module 430.

[0131] Acquisition module 410 is used to acquire the target Gaussian waveform;

[0132] The sampling module 420 is used to sample the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein the set sampling strategy includes at least using the peak value of the target Gaussian waveform as a sampling reference;

[0133] The driving module 430 is used to drive the piezoelectric ceramic according to the target voltage waveform.

[0134] In one embodiment, the sampling strategy further includes sampling points located within a first confidence interval of the target Gaussian waveform.

[0135] In one embodiment, the sampling module 420 is specifically used to determine the number of sampling points and the waveform parameters of the target Gaussian waveform; determine the sampling parameters based on the number of sampling points and the waveform parameters; and sample the target Gaussian waveform based on the sampling parameters and the waveform parameters to obtain the target voltage waveform.

[0136] In one embodiment, the waveform parameters include standard deviation and voltage amplitude;

[0137] The sampling parameters include eccentricity value, sampling start point, sampling end point, number of sampling points on the left side, number of sampling points on the right side, left sampling interval, and right sampling interval.

[0138] In one embodiment, the sampling module 420 is specifically configured to: determine the eccentricity value based on the number of sampling points; determine the sampling start point and the sampling end point based on the eccentricity value and the standard deviation; determine the number of sampling points on the left and the number of sampling points on the right based on the number of sampling points; determine the left sampling interval based on the number of sampling points on the left, the eccentricity value and the sampling start point; and determine the right sampling interval based on the number of sampling points on the right, the eccentricity value and the sampling end point.

[0139] In one embodiment, the sampling module 420 is specifically configured to: when the current sampling point i is less than the number of sampling points on the left, obtain a corresponding first sampling voltage based on the voltage amplitude, the sampling start point, the left sampling interval, the eccentricity value, and the standard deviation; wherein i is greater than 0 and less than or equal to N; when the current sampling point i is greater than or equal to the number of sampling points on the left, obtain a corresponding second sampling voltage based on the voltage amplitude, the eccentricity value, the right sampling interval, and the standard deviation; and obtain the target voltage waveform based on multiple first sampling voltages and multiple second sampling voltages.

[0140] According to embodiments of this disclosure, a target Gaussian waveform is acquired, and a target voltage waveform is obtained by sampling the target Gaussian waveform according to a set sampling strategy. The set sampling strategy at least includes using the peak value of the target Gaussian waveform as a sampling reference, and then driving the piezoelectric ceramic based on the target voltage waveform. Because the target Gaussian waveform has smooth characteristics, and sampling is performed at least based on the peak value of the target Gaussian waveform, the obtained target voltage waveform can balance smoothness and strong vibration, enabling the piezoelectric ceramic to simultaneously obtain comfortable vibration feedback and a stronger vibration sensation.

[0141] <System Implementation>

[0142] Figure 5 This is a schematic diagram of the hardware structure of an electronic device according to one embodiment. For example... Figure 5 As shown, the electronic device 500 includes a processor 510 and a memory 520.

[0143] The memory 520 can be used to store executable computer instructions.

[0144] The processor 510 can be used to execute the piezoelectric ceramic driving method according to the method embodiments of this disclosure, under the control of the executable computer instructions.

[0145] The electronic device 500 can be as follows: Figure 1 The electronic device 1000 shown can also be a device with other hardware structures, which are not limited here.

[0146] In another embodiment, the electronic device 500 may include the piezoelectric ceramic drive device 400 described above.

[0147] In one embodiment, each module of the piezoelectric ceramic driving device 400 can be implemented by the processor 410 running computer instructions stored in the memory 420. According to an embodiment of this disclosure, a target Gaussian waveform is acquired, and a target voltage waveform is obtained by sampling the target Gaussian waveform according to a set sampling strategy. The set sampling strategy at least includes using the peak value of the target Gaussian waveform as a sampling reference, and then driving the piezoelectric ceramic according to the target voltage waveform. Because the target Gaussian waveform has smooth characteristics, and sampling is performed at least with the peak value of the target Gaussian waveform as the sampling reference, the obtained target voltage waveform can balance smoothness and strong vibration, enabling the piezoelectric ceramic to simultaneously obtain comfortable vibration feedback and a stronger vibration sensation.

[0148] Computer-readable storage media

[0149] This disclosure also provides a computer-readable storage medium storing computer instructions that, when executed by a processor, perform the piezoelectric ceramic driving method provided in this disclosure.

[0150] This disclosure can be a system, method, and / or computer program product. A computer program product may include a computer-readable storage medium having computer-readable program instructions loaded thereon for causing a processor to implement various aspects of this disclosure.

[0151] Computer-readable storage media can be tangible devices capable of holding and storing instructions for use by an instruction execution device. Computer-readable storage media can be, for example—but not limited to—electrical storage devices, magnetic storage devices, optical storage devices, electromagnetic storage devices, semiconductor storage devices, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of computer-readable storage media include: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), portable compact disc read-only memory (CD-ROM), digital multifunction disc (DVD), memory sticks, floppy disks, mechanical encoding devices, such as punch cards or recessed protrusions storing instructions thereon, and any suitable combination of the foregoing. The computer-readable storage media used herein are not to be construed as transient signals themselves, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through waveguides or other transmission media (e.g., light pulses through fiber optic cables), or electrical signals transmitted through wires.

[0152] The computer-readable program instructions described herein can be downloaded from computer-readable storage media to various computing / processing devices, or downloaded via a network, such as the Internet, local area network, wide area network, and / or wireless network, to an external computer or external storage device. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. A network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards them to the computer-readable storage media in the respective computing / processing device.

[0153] Computer program instructions used to perform the operations of this disclosure may be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, status setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk, C++, etc., and conventional procedural programming languages ​​such as the "C" language or similar programming languages. The computer-readable program instructions may execute entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving a remote computer, the remote computer may be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN)—or may be connected to an external computer (e.g., via the Internet using an Internet service provider). In some embodiments, electronic circuitry, such as programmable logic circuitry, field-programmable gate arrays (FPGAs), or programmable logic arrays (PLAs), is personalized by utilizing the status information of the computer-readable program instructions to implement various aspects of this disclosure.

[0154] Various aspects of this disclosure are described herein with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this disclosure. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer-readable program instructions.

[0155] These computer-readable program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that, when executed by the processor of the computer or other programmable data processing apparatus, they create means for implementing the functions / actions specified in one or more blocks of the flowchart and / or block diagram. These computer-readable program instructions can also be stored in a computer-readable storage medium that causes a computer, programmable data processing apparatus, and / or other device to operate in a particular manner; thus, the computer-readable medium storing the instructions comprises an article of manufacture that includes instructions for implementing aspects of the functions / actions specified in one or more blocks of the flowchart and / or block diagram.

[0156] Computer-readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the instructions executed on the computer, other programmable data processing apparatus, or other device to perform the functions / actions specified in one or more boxes of a flowchart and / or block diagram.

[0157] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of an instruction containing one or more executable instructions for implementing a specified logical function. In some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions. It will be known to those skilled in the art that implementation in hardware, implementation in software, and implementation in a combination of software and hardware are equivalent.

[0158] The various embodiments of this disclosure have been described above. These descriptions are exemplary and not exhaustive, and are not limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen to best explain the principles, practical application, or technical improvements to the embodiments in the market, or to enable others skilled in the art to understand the embodiments disclosed herein. The scope of this disclosure is defined by the appended claims.

Claims

1. A piezoelectric ceramic driving method, characterized in that, The method includes: Obtain the target Gaussian waveform; According to the set sampling strategy, the target Gaussian waveform is sampled to obtain the target voltage waveform; wherein, the set sampling strategy includes at least using the peak value of the target Gaussian waveform as the sampling reference, and the sampling points are selected to be sampled at equal intervals on both sides symmetrical to the peak value of the target Gaussian waveform; Drive the piezoelectric ceramic according to the target voltage waveform; The step of sampling the target Gaussian waveform to obtain the target voltage waveform includes: determining the number of sampling points and waveform parameters of the target Gaussian waveform, wherein the waveform parameters include standard deviation and voltage amplitude; determining sampling parameters based on the number of sampling points and the waveform parameters, wherein the sampling parameters include eccentricity value, sampling start point, sampling end point, number of sampling points on the left, number of sampling points on the right, left sampling interval, and right sampling interval; and determining sampling parameters based on the number of sampling points i on the left when the current sampling point i is less than the number of sampling points on the left. Determine the corresponding first sampling voltage 1, among which, Indicates voltage amplitude. Indicates the sampling start point. Indicates the sampling interval on the left. Indicates the eccentricity value. Indicates the standard deviation; when the current sampling point i is greater than or equal to the number of sampling points on the left, according to Determine the corresponding second sampling voltage ,in, Indicates voltage amplitude. P1 represents the sampling interval on the right and the number of sampling points on the left. Indicates the eccentricity value. The standard deviation is represented by the target voltage waveform obtained based on a plurality of first sampled voltages and a plurality of second sampled voltages.

2. The method according to claim 1, characterized in that, The sampling strategy also includes sampling points located in the first confidence interval of the target Gaussian waveform.

3. The method according to claim 1, characterized in that, The step of determining the sampling parameters based on the number of sampling points and the waveform parameters includes: The eccentricity value is determined based on the number of sampling points; The sampling start point and the sampling end point are determined based on the eccentricity value and the standard deviation. Based on the number of sampling points, determine the number of sampling points on the left and the number of sampling points on the right; The left sampling interval is determined based on the number of sampling points on the left, the eccentricity value, and the sampling start point; and the right sampling interval is determined based on the number of sampling points on the right, the eccentricity value, and the sampling end point.

4. A piezoelectric ceramic driving device, characterized in that, The device includes: The acquisition module is used to acquire the target Gaussian waveform; A sampling module is used to sample the target Gaussian waveform according to a set sampling strategy to obtain a target voltage waveform; wherein, the set sampling strategy includes at least using the peak value of the target Gaussian waveform as the sampling reference, and selecting sampling points at equal intervals on both sides symmetrical to the peak value of the target Gaussian waveform; A drive module is used to drive the piezoelectric ceramic according to the target voltage waveform; The sampling module is used to determine the number of sampling points and waveform parameters of the target Gaussian waveform, including standard deviation and voltage amplitude; based on the number of sampling points and waveform parameters, it determines sampling parameters, including eccentricity, sampling start point, sampling end point, number of sampling points on the left, number of sampling points on the right, left sampling interval, and right sampling interval; when the current sampling point i is less than the number of sampling points on the left, it further determines the sampling parameters based on... Determine the corresponding first sampling voltage ,in, Indicates voltage amplitude. Indicates the sampling start point. Indicates the sampling interval on the left. Indicates the eccentricity value. Indicates the standard deviation; when the current sampling point i is greater than or equal to the number of sampling points on the left, according to Determine the corresponding second sampling voltage 2, of which, Indicates voltage amplitude. P1 represents the sampling interval on the right and the number of sampling points on the left. Indicates the eccentricity value. The standard deviation is represented by the target voltage waveform obtained based on a plurality of first sampled voltages and a plurality of second sampled voltages.

5. The apparatus according to claim 4, characterized in that, The sampling strategy also includes sampling voltages located within the first confidence interval of the target Gaussian waveform.

6. An electronic device, characterized in that, include: Memory is used to store executable computer instructions; A processor, configured to execute the piezoelectric ceramic driving method according to any one of claims 1-3, under the control of the executable computer instructions.

7. A computer-readable storage medium having stored thereon computer instructions, which, when executed by a processor, perform the piezoelectric ceramic driving method according to any one of claims 1-3.

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