Testing Device, Testing Method, Computer Device, and Storage Medium for Battery Cells

Abstract

The present application relates to a test device, a test method, a computer device, and a storage medium for a battery cell. The battery cell includes a plurality of main grid lines and a plurality of fine grid lines. The plurality of fine grid lines are arranged at intervals along the extending direction of the main grid lines, and the plurality of main grid lines intersect with the plurality of fine grid lines. The test device for the battery cell includes: a probe assembly for contacting the plurality of main grid lines to form an electrical connection when the battery cell is being tested; a control module connected to the probe assembly. The control module is configured to obtain the resistance value per unit length between two adjacent main grid lines, and obtain the grid line conduction parameter of the battery cell according to the resistance value per unit length and the number of fine grid lines. Based on the value obtained from the resistance value per unit length and the number of fine grid lines, the conduction ability of the grid lines can be judged, thereby realizing the automated test of the conduction performance of the grid lines, reducing the complexity of the test, and improving the test efficiency and accuracy.

Description

Technical Field

[0001] The present application relates to the technical field of batteries, and particularly to a testing device, a testing method, a computer device, and a storage medium for battery wafers. Background Art

[0002] The battery grid line is one of the key components of a solar cell, and its performance directly affects the overall efficiency of the solar cell. Related technologies usually evaluate the printing process by testing the grid line parameters, but the method of testing the grid line parameters is too complex and the testing efficiency is low. Summary of the Invention

[0003] Based on this, it is necessary to provide a testing device, a testing method, a computer device, and a storage medium for battery wafers to solve the problems that the method of testing grid line parameters in the prior art is too complex and the testing efficiency is low.

[0004] To achieve the above object, the present application provides a testing device for a battery wafer. The battery wafer includes a plurality of main grid lines and a plurality of fine grid lines. The plurality of fine grid lines are arranged at intervals along the extending direction of the main grid lines, and the plurality of main grid lines intersect with the plurality of fine grid lines. The testing device for the battery wafer includes:

[0005] A probe assembly for making contact with the plurality of main grid lines to form an electrical connection when the battery wafer is being tested;

[0006] A control module connected to the probe assembly. The control module is configured to obtain the resistance value per unit length between two adjacent main grid lines, and obtain the grid line conduction parameters of the battery wafer according to the resistance value per unit length and the number of the fine grid lines.

[0007] In one embodiment, the probe assembly includes a plurality of probe rows for making contact with the plurality of main grid lines one by one to form an electrical connection. The control module includes:

[0008] A measurement unit respectively connected to each probe row for obtaining the resistance value between every two adjacent probe rows when the plurality of probe rows form an electrical connection with the plurality of main grid lines;

[0009] A data processing unit connected to the measurement unit for obtaining the resistance value per unit length between two adjacent main grid lines according to the resistance value between every two adjacent probe rows and the distance between two adjacent main grid lines, obtaining the grid line conduction parameters of the battery wafer according to the resistance value per unit length and the number of the fine grid lines, and judging the grid line conduction performance of the battery wafer according to the grid line conduction parameters.

[0010] In one embodiment, the testing device for the battery wafer further includes:

[0011] A carrier unit for placing the cell.

[0012] A first bracket connected to one end of the plurality of probe rows.

[0013] A second bracket slidably connected to the first bracket, the first bracket moving up and down along the second bracket so that the plurality of probe rows approach or move away from the plurality of main grid lines.

[0014] In one embodiment, each of the probe rows includes a plurality of telescopic probes for contacting and connecting with the main grid line when testing the cell.

[0015] In one embodiment, any two adjacent probe rows are insulated from each other.

[0016] In one embodiment, the testing device further includes:

[0017] A driving unit for driving the first bracket to reciprocate along the extending direction of the second bracket.

[0018] In one embodiment, the cell includes a heterojunction cell.

[0019] The present application provides a method for testing a cell, the cell including a plurality of main grid lines and a plurality of fine grid lines, the plurality of fine grid lines being arranged at intervals along the extending direction of the main grid lines, the plurality of main grid lines intersecting with the plurality of fine grid lines, and the testing method including:

[0020] When testing the cell, bringing a probe assembly into contact with the plurality of main grid lines to form an electrical connection.

[0021] Obtaining the resistance value per unit length between two adjacent main grid lines, and obtaining the grid line conductivity parameter of the cell according to the resistance value per unit length and the number of the fine grid lines.

[0022] The present application provides a computer device including a memory and a processor, where a computer program is stored in the memory, and when the computer program is executed by the processor, the processor executes the steps of the above method.

[0023] The present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0024] The above-mentioned test device, test method, computer device, and storage medium for solar cells. When the probe assembly contacts multiple main grid lines to form electrical connections during the test of the solar cell, the control module obtains the resistance value per unit length between two adjacent main grid lines, and obtains the grid line conduction parameter of the solar cell based on the resistance value per unit length and the number of fine grid lines. Taking the value obtained from the resistance value per unit length and the number of fine grid lines as a reference, the conduction ability of the grid line can be judged, thereby realizing the automated test of the grid line conduction performance, reducing the complexity of the test, and improving the test efficiency and accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present application or in the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0026] Figure 1 FIG. 9 is one of the schematic structural diagrams of the test device for solar cells provided in an embodiment;

[0027] Figure 2 FIG. 13 is another schematic structural diagram of the test device for solar cells provided in an embodiment;

[0028] Figure 3 FIG. 17 is a schematic structural diagram of a probe row provided in an embodiment;

[0029] Figure 4 FIG. 21 is a schematic flowchart of the test method for solar cells provided in an embodiment.

[0030] DESCRIPTION OF REFERENCE NUMERALS:

[0031] Solar cell: 10; Probe assembly: 100; Probe row: 110; Probe: 111; Control module: 200; Measurement unit: 210; Data processing unit: 220; Carrying unit: 300; First bracket: 400; Second bracket: 500; Main grid line: 600; Fine grid line: 700. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0032] To facilitate the understanding of the present application, the present application will be described more comprehensively below with reference to the relevant drawings. Embodiments of the present application are shown in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0033] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application.

[0034] As used herein, the singular forms "a", "an" and "the" may also include the plural forms unless the context clearly dictates otherwise. It should also be understood that the terms "comprises / comprising" or "has / including" etc. specify the presence of the stated features, wholes, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof. At the same time, in this specification, the term "and / or" includes any and all combinations of the related listed items.

[0035] In one embodiment, referring to Figure 1 , a test device for a solar cell is provided. The solar cell 10 includes a plurality of main grid lines 600 ( Figure 1 Taking the solar cell 10 having five main grid lines 600 as an example for illustration) and a plurality of fine grid lines 700. The plurality of fine grid lines 700 are arranged at intervals along the extending direction of the main grid lines 600. The plurality of main grid lines 600 intersect with the plurality of fine grid lines 700. The test device for the solar cell includes: a probe assembly 100 and a control module 200.

[0036] The probe assembly 100 is used to contact the plurality of main grid lines 600 to form an electrical connection when the solar cell 10 is being tested. The control module 200 is connected to the probe assembly 100. The control module 200 is used to obtain the resistance value per unit length between two adjacent main grid lines 600, and obtain the grid line conductivity parameter of the solar cell 10 according to the resistance value per unit length and the number of the fine grid lines 700.

[0037] Wherein, the solar cell 10 is a semiconductor device that converts solar energy into electrical energy. When sunlight shines on the surface of the solar cell 10, photons are absorbed by the semiconductor material. During the light absorption process, the energy of the photons is transferred to the electrons in the semiconductor, causing them to transition to the conduction band and form photo-generated electron-hole pairs. Due to the presence of the PN junction, the photo-generated electrons and holes are separated into different regions, thereby forming a potential difference on both sides of the PN junction. Due to the potential difference, the photo-generated electrons and holes start to move inside the solar cell 10 to form an available current. The advantages of solar cells are renewable and environmentally friendly. They are widely used for residential and commercial purposes, contributing to distributed energy and clean power supply.

[0038] The grid line of the cell 10 is an important component of the metal electrode on the front of the cell 10, which is used for collecting and deriving the current, wherein the grid line includes a main grid line 600 and a thin grid line 700, and a plurality of thin grid lines 700 are arranged at intervals along the extension direction of the main grid line 600, so that the main grid line 600 and the auxiliary grid line form a crisscross arrangement structure, and the size of the thin grid line 700 is much smaller than that of the main grid line 600, and the thin grid line 700 is used to collect the photocurrent generated by the cell 10, and collect the collected current to the main grid line 600, and the main grid line 600 then derives the current to the connected welding strip through the welding point thereon, and through the layout of the thin grid line 700 and the intersection with the main grid line 600, it is helpful to optimize the electric field distribution and photoelectric conversion performance. Therefore, the grid line assumes important roles in current collection, derivation and photoelectric conversion efficiency improvement in solar cells, and the design optimization of the grid line helps to improve the performance of solar cells, ensuring that it more effectively converts solar energy into electrical energy in practical applications, so the performance of the grid line has an important influence on the overall performance and efficiency of solar cells.

[0039] This embodiment is explained by taking the cell 10 as a photovoltaic heterojunction cell (HJT) as an example. Due to the particularity of the front-end process of the photovoltaic heterojunction cell, the process temperature is limited. In the metallization process, the electrode slurry (such as silver paste) cannot be sintered at high temperature to form a grid electrode. Therefore, the metallization process of the heterojunction cell usually uses an organic solvent to stick the metal powder together, for example, a resin or other adhesive is used to stick the silver powder together to form a low-temperature slurry, and fix it to the surface of the cell 10. However, in this process, there will be gaps between the silver powders, especially the current low-temperature slurry contains more silver flake powder, which further increases the gaps between the powders. The presence of such gaps will increase the resistance of the grid line itself, thereby affecting the conductivity of the grid line, so that the grid line is greatly affected by the current collection process, so the test and analysis of the grid line resistance is crucial to the optimization of the heterojunction cell. However, the related art has the problem that the test and analysis method for the grid line resistance is complicated and requires manual operation and calculation, resulting in low test efficiency. Therefore, this embodiment provides an automated test device with simple calculation to overcome the defects in the related art.

[0040] When testing the cell 10, the probe assembly 100 can be automatically pressed down to contact multiple busbars 600 on the cell 10 at the same time to establish a stable electrical connection. In one embodiment, the probe assembly 100 includes multiple probe rows, and the number of probe rows corresponds to the number of busbars 600, for example. Figure 1 The probe assembly 100 is shown to include five probe rows, and the depressed position of each probe row corresponds to a busbar 600 position of the cell 10. Further, the probe assembly 100 and the control module 200 can be electrically connected via a wire, and the probe assembly 100 transmits the test signal to the control module 200.

[0041] Among them, the control module 200 transmits test signals about multiple main grid lines 600 through the probe assembly 100, can obtain the resistance value per unit length between every two adjacent main grid lines 600, and calculates the grid line conduction parameter of the solar cell 10 according to the resistance value per unit length and the number of fine grid lines 700. The grid line conduction parameter can be the grid line resistance. By obtaining the grid line resistance, the conduction ability of the grid line on the solar cell 10 can be judged. The evaluated conduction ability is not only affected by the resistivity of the silver paste that makes up the grid line itself, but also affected by the grid line morphology on the solar cell 10 during the grid line manufacturing process on the grid line resistance. Therefore, the obtained grid line resistance is a key parameter for evaluating the grid line conduction ability. Thus, according to the obtained grid line resistance, the voids in the low-temperature paste are filled correspondingly to reduce the grid line resistance, thereby improving the working efficiency of the solar cell 10.

[0042] Based on this, through the electrical connection between the probe assembly 100 and the main grid lines 600 on the solar cell 10, the control module 200 automatically obtains the conduction parameters of the grid lines of the solar cell 10 in a simple calculation method, improves the degree of test automation, data comparison can be made when the test conditions are the same before and after, and the test results can be consistent before and after, and the test repeatability is high.

[0043] In the above test device for the solar cell 10, the probe assembly 100 contacts multiple main grid lines 600 to form an electrical connection when the solar cell 10 is being tested. The control module 200 obtains the resistance value per unit length between every two adjacent main grid lines 600, and obtains the grid line conduction parameter of the solar cell 10 according to the resistance value per unit length and the number of fine grid lines 700. Based on the values obtained from the resistance value per unit length and the number of fine grid lines 700, the conduction ability of the grid line can be judged. Thus, the automatic test of the grid line conduction performance is realized, the complexity of the test is reduced, and the test efficiency and accuracy are improved.

[0044] In one embodiment, as Figure 2 shown, the probe assembly includes a plurality of probe rows 110, and the plurality of probe rows 110 are used to contact multiple main grid lines one by one to form an electrical connection. The control module includes: a measurement unit 210 and a data processing unit 220.

[0045] The measurement unit 210 is respectively connected to each probe row 110, and is used to obtain the resistance value between every two adjacent probe rows 110 when the plurality of probe rows 110 form an electrical connection with the multiple main grid lines. The data processing unit 220 is connected to the measurement unit 210, and is used to obtain the resistance value per unit length between every two adjacent main grid lines according to the resistance value between every two adjacent probe rows 110 and the distance between every two adjacent main grid lines, obtain the grid line conduction parameter of the solar cell according to the resistance value per unit length and the number of fine grid lines, and judge the grid line conduction performance of the solar cell according to the grid line conduction parameter.

[0046] Among them, each probe row 110 of the probe assembly corresponds to a main grid line on the battery cell, and is used to contact the main grid line to form an electrical connection. The measuring unit 210 is connected to each probe row 110. When multiple probe rows 110 are in corresponding contact with multiple main grid lines to form an electrical connection, the resistance values between every two adjacent probe rows 110 are respectively obtained. Thus, during the testing process, the measuring unit 210 respectively measures that the resistance value between the first probe row 110 and the second probe row 110 is R1, the resistance value between the second probe row 110 and the third probe row 110 is R2, the resistance value between the third probe row 110 and the fourth probe row 110 is R3, and the resistance value between the fourth probe row 110 and the fifth probe row 110 is R4, and so on.

[0047] Furthermore, the data processing unit 220 can obtain the average value R0 of the resistance values between every two adjacent main grid lines according to the number of main grid lines and the resistance values between every two adjacent main grid lines. The calculation of R0 can refer to formula (1), where n is the number of main grid lines.

[0048] R0 = (R1 + R2 + R3 + … + Rn) / n --- (1)

[0049] Furthermore, according to the resistance values between every two adjacent probe rows 110 and the distance between two adjacent main grid lines, the resistance value per unit length between two adjacent main grid lines is obtained. Specifically, it can refer to formula (2), where the resistance value per unit length between two adjacent main grid lines is denoted as Rx, the distance between two adjacent main grid lines is denoted as d, with the unit of millimeter, and the resistance value between every two adjacent probe rows 110 is the average value R0 calculated by formula (1).

[0050] Rx = R0 / d --- (2)

[0051] Furthermore, according to the resistance value per unit length and the number of fine grid lines, the grid line conduction parameter of the battery cell is obtained. Specifically, it can refer to formula (3).

[0052] Grid line conduction parameter = Rx * M = (R0 / d) * M --- (3)

[0053] Among them, M is the number of fine grid lines, and the value obtained according to formula (3) is the grid line resistance value, with the unit of Ω / mm. Thus, according to the level of the grid line conduction parameter value, the conduction ability of the grid line on the battery cell can be judged. This conduction ability not only includes the resistivity of the silver paste that makes up the grid line itself, but also includes the grid line resistance affected by the grid line morphology during the manufacturing process of the battery. Therefore, this grid line conduction parameter is a key parameter for evaluating the conduction ability of the grid line.

[0054] Optionally, the measuring unit 210 can be a resistance tester.

[0055] In one embodiment, with continued reference to Figure 2 , the test device for the solar cell further includes: a carrier unit 300, a first bracket 400, and a second bracket 500.

[0056] The carrier unit 300 is used to place the solar cell 10. The first bracket 400 is connected to one end of a plurality of probe rows 110. The second bracket 500 is slidably connected to the first bracket 400, and the first bracket 400 moves up and down along the second bracket 500 so that the plurality of probe rows 110 approach or move away from the plurality of main grid lines.

[0057] Among them, the carrier unit 300, as the part that supports and fixes the solar cell 10, in one implementation, the carrier unit 300 can be an insulating tabletop made of insulating materials such as a marble tabletop. The first bracket 400 connects the same end of the plurality of probe rows 110 to fix and support the plurality of probe rows 110, and the first bracket 400 can move up and down along the second bracket 500, so that the distance between the probe rows 110 and the plurality of main grid lines on the solar cell 10 can be freely adjusted. In the case of testing the solar cell 10, the first bracket 400 drives the plurality of probe rows 110 to automatically press down in the direction close to the solar cell 10 until they contact the plurality of main grid lines to ensure stable electrical connection. After the testing of the solar cell 10 is completed, the first bracket 400 drives the plurality of probe rows 110 to automatically rise in the direction away from the solar cell 10.

[0058] Based on this, the automatic test bench provided in this embodiment can freely adjust the positions of the probe rows 110 and the main grid lines on the solar cell 10 to meet different test requirements or the design of the solar cell 10. Through the up and down movement operation of the bracket, the contact position of the probe rows 110 can be controlled to ensure accurate resistance testing. For the solar cells 10 of the same batch, the front and back test conditions can be kept consistent for convenient data comparison and analysis.

[0059] In one embodiment, as Figure 3 shown, each probe row 110 includes a plurality of telescopic probes 111, and the probes 111 are used to contact and connect with the main grid lines when testing the solar cell. Among them, the telescopic probes 111 can be understood as using a spring mechanism or other mechanical designs to make the probes 111 have the function of stretching or contracting, and the probes 111 in a single probe row 110 are electrically conductive. By using the telescopic probes 111, the test device can adapt to solar cells of different sizes and shapes while maintaining good electrical connection with the main grid lines, thereby improving the applicability and flexibility of the test.

[0060] Optionally, the probes 111 can be made of a conductive material with a relatively low resistivity. For example, the probes 111 can be gold-plated copper probes.

[0061] In one embodiment, any two adjacent probe rows are insulated from each other. Among them, maintaining relative insulation between the probe rows can ensure that the electrical connection between each probe row and the main grid line remains relatively independent, avoiding the introduction of electromagnetic interference and affecting the stability of the test signal, which is beneficial to improving the accuracy and reliability of the test.

[0062] In one embodiment, the test device further includes: a driving unit, which is used to drive the first bracket to reciprocate along the extending direction of the second bracket.

[0063] Optionally, the driving unit may include a motor or other actuators for providing power and driving motion. Thus, the driving unit is responsible for controlling the first bracket to reciprocate in the extending direction of the second bracket, so as to adjust the distance between the probe row and the main grid line on the battery cell during the test, ensuring accurate electrical connection and completing the test operation.

[0064] In one embodiment, the battery cell includes a heterojunction battery cell. As a high-efficiency crystalline silicon solar cell structure, the heterojunction battery is a hybrid solar cell made of a crystalline silicon substrate and an amorphous silicon thin film, and has the advantages of high conversion efficiency, simple structure, low process temperature, good passivation effect, high open-circuit voltage, good temperature characteristics, bifacial power generation, etc. However, due to the particularity of the front-end process of the photovoltaic heterojunction battery, the process temperature is limited. During the metallization process, the electrode paste (such as silver paste) cannot be sintered at a high temperature to form a grid line electrode. Therefore, in the metallization process of the heterojunction battery, organic solvents are usually used to bond metal powders together. For example, adhesives such as resins are used to bond silver powders together to form a low-temperature paste and fix it on the surface of the battery cell. However, in this process, there will be voids between the silver powders. Especially at present, the low-temperature paste contains more silver flake powders, resulting in a further increase in the voids between the powders. The existence of such voids will increase the resistance of the grid line itself, thus affecting the conductivity of the grid line and greatly affecting the current collection process of the grid line. Therefore, the test and analysis of the grid line resistance are crucial for the optimization of the heterojunction battery.

[0065] Based on this, the probe assembly contacts multiple main grid lines to form an electrical connection when testing the battery cell. The control module obtains the resistance value per unit length between two adjacent main grid lines, and obtains the grid line conductivity parameter of the battery cell according to the resistance value per unit length and the number of fine grid lines. The conductivity of the grid line can be judged based on the value obtained from the resistance value per unit length and the number of fine grid lines, thereby realizing the automatic test of the grid line conductivity performance of the heterojunction battery cell.

[0066] In one embodiment, as Figure 4As shown, a test method for a solar cell is provided. The solar cell includes a plurality of main grid lines and a plurality of fine grid lines. The plurality of fine grid lines are arranged at intervals along the extending direction of the main grid lines, and the plurality of main grid lines intersect with the plurality of fine grid lines. The test method for the solar cell includes step S102 and step S104.

[0067] Step S102: When the solar cell is being tested, contact the probe assembly with the plurality of main grid lines to form an electrical connection.

[0068] Step S104: Obtain the resistance value per unit length between two adjacent main grid lines, and obtain the grid line conductivity parameter of the solar cell according to the resistance value per unit length and the number of fine grid lines.

[0069] For the test method of the solar cell provided in this embodiment, please refer to the relevant descriptions in the above embodiments, which will not be elaborated here. In the test method of the above solar cell, when the solar cell is being tested, the probe assembly is contacted with the plurality of main grid lines to form an electrical connection, and the resistance value per unit length between two adjacent main grid lines is obtained. The grid line conductivity parameter of the solar cell is obtained according to the resistance value per unit length and the number of fine grid lines. The conductivity of the grid line can be judged based on the value obtained from the resistance value per unit length and the number of fine grid lines, thereby realizing the automatic test of the grid line conductivity performance, reducing the complexity of the test, and improving the test efficiency and accuracy.

[0070] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps of the method as described above are implemented.

[0071] In one embodiment, a computer device is provided, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, the steps of the method provided in the above embodiment are implemented.

[0072] Any reference in this application to a memory, storage, database, or other medium may include non-volatile and / or volatile memory. Suitable non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM), which is used as an external cache. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rmbus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0073] It should be understood that although the steps in the flowchart are shown sequentially in the direction of the arrows, these steps are not necessarily executed sequentially in the order indicated by the arrows. Unless otherwise clearly stated in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, at least some of the steps in the flowchart may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or in turn with at least some of the steps or stages in other steps or other steps. In the description of this specification, the descriptions referring to terms such as "some embodiments", "other embodiments", "ideal embodiments", etc. mean that the specific features, structures, materials or features described in connection with the embodiment or example are included in at least one embodiment or example of this application. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

[0074] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features of the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered to be within the scope described in this specification.

[0075] The above-described embodiments only represent several implementation manners of this application, and the description thereof is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patent application. It should be noted that for those of ordinary skill in the art, without departing from the concept of this application, several modifications and improvements can still be made, and these all belong to the protection scope of this application. Therefore, the protection scope of the patent of this application should be subject to the appended claims.

Claims

1. A battery cell testing device, characterized in that: The battery cell comprises a plurality of main grid lines and a plurality of fine grid lines, wherein the plurality of fine grid lines are arranged at intervals along the extension direction of the main grid lines, and the plurality of main grid lines intersect with the plurality of fine grid lines, and the battery cell testing device comprises: A probe assembly, used for contacting the plurality of busbars to form an electrical connection when the cell is tested; the probe assembly comprises a plurality of probe rows, and the plurality of probe rows are used for contacting the plurality of busbars one by one to form an electrical connection; A control module connected to the probe assembly, the control module is used to obtain the resistance value per unit length between two adjacent main grid lines, and obtain the grid line conductive parameters of the battery cell according to the resistance value per unit length and the number of the thin grid lines; A carrying unit, used for placing the battery cell; A first bracket connected to one end of the plurality of probe rows; The second bracket is slidably connected to the first bracket, and the first bracket is lifted and moved along the second bracket to make the multiple probe rows approach or move away from the multiple main grid lines.

2. The battery cell testing device according to claim 1, characterized in that: The control module comprises: A measuring unit, connected to each of the probe rows, for obtaining a resistance value between each two adjacent probe rows when the plurality of probe rows are electrically connected to the plurality of main grid lines; A data processing unit is connected to the measuring unit, and is used to obtain the resistance value per unit length between two adjacent main grid lines according to the resistance value between each two adjacent probe rows and the spacing between two adjacent main grid lines, obtain the grid line conductive parameters of the battery cell according to the resistance value per unit length and the number of the fine grid lines, and judge the grid line conductive performance of the battery cell according to the grid line conductive parameters.

3. The battery cell testing device according to claim 1, characterized in that: Each of the probe rows includes a plurality of retractable probes, and the probes are used to contact and connect with the main grid lines when the battery cell is tested.

4. The battery cell testing device according to claim 2, characterized in that: Any two adjacent probe rows are insulated from each other.

5. The battery cell testing device according to any one of claims 1 to 4, characterized in that: The testing device also includes: A driving unit is used to drive the first bracket to reciprocate along the extending direction of the second bracket.

6. The battery cell testing device according to any one of claims 1 to 4, characterized in that: The battery cell includes a heterojunction battery cell.

7. A method for testing a battery cell, characterized in that: The battery cell comprises a plurality of main grid lines and a plurality of fine grid lines, the plurality of fine grid lines are arranged at intervals along the extension direction of the main grid lines, the plurality of main grid lines intersect with the plurality of fine grid lines, and the testing method comprises: When the battery cell is tested, the probe assembly is brought into contact with the plurality of main grid lines to form an electrical connection; the battery cell is placed on a carrying unit; the probe assembly comprises a plurality of probe rows, and the plurality of probe rows are used to contact with the plurality of main grid lines one by one to form an electrical connection; one end of the plurality of probe rows is connected to a first bracket; the first bracket is slidably connected to the second bracket, and the first bracket is lifted and moved along the second bracket to make the plurality of probe rows approach or move away from the plurality of main grid lines; The resistance value per unit length between two adjacent main grid lines is obtained, and the grid line conductive parameters of the battery cell are obtained according to the resistance value per unit length and the number of the thin grid lines.

8. A computer device, characterized in that: The method comprises a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the processor executes the steps of the method as claimed in claim 7.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to claim 7 are implemented.

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