A miniature wavelength measuring device

Abstract

The present invention provides a miniature wavelength measurement device, including an optical probe, an optical beam splitter, a first optical fiber amplifier, a photodetector, a data processing module, a wavelength measurement silicon photonic chip, a thermistor, a back-illuminated monitoring photodetector, a second optical fiber amplifier and a display screen; a light beam generates a phase difference after being split by the wavelength measurement silicon photonic chip, and two optical signals with different intensities are obtained after being interfered by an MZ modulator; the data processing module receives the back-illuminated monitoring photodetector and processes and calculates the wavelength variation period with temperature, and on the basis of the known optical path difference, corresponds to the temperature and thermo-optic coefficient changes corresponding to different wavelengths in the database, and then obtains the wavelength of the incident light. The present device has the characteristics of high precision, miniaturization and portability, and has broad application prospects in the fields of optical communication, optical sensing, and optical wavelength measurement.

Description

Technical Field

[0001] The invention relates to the technical field of optical wavelength measurement, and in particular to a miniature wavelength measurement device. Background Art

[0002] In the research of optical communication systems, optical signals can be transmitted through different wavelengths. The accuracy of wavelength is very important for the accurate transmission of information. In the field of optical sensing, wavelength measurement can be used to measure environmental parameters and particle concentration. Accurate measurement of wavelength can be used to monitor the wavelength of the laser light source, frequency stability and other parameters, which is very important for laser calibration detection and performance evaluation. With the development of optical technology, various optical devices are gradually moving towards high precision and miniaturization, and the requirements for optical parameter performance are also getting higher and higher. Therefore, accurate monitoring of wavelength provides important technical support for optical research and application. In many fields of optical wavelength measurement, wavelength measurement devices are indispensable.

[0003] Traditional wavelength measurement devices mostly use grating spectral measurement technology or interferometer technology. The measurement devices are too large, not easy to carry and move, and are complicated to operate, requiring cumbersome operating steps and high requirements for users. Therefore, it is very important to design and invent a portable and easy-to-operate miniature wavelength measurement device. Summary of the invention

[0004] The purpose of the present invention is to provide a miniature wavelength measuring device, which solves the problems that the wavelength measuring device is large in size, not easy to carry and complicated to operate.

[0005] To achieve the above object, the present invention provides the following solutions:

[0006] The present invention provides a miniature wavelength measurement device, comprising an optical probe, wherein the optical probe is connected to an optical beam splitter, wherein the optical beam splitter is used to split a light beam into a first optical path and a second optical path, a first optical fiber amplifier receives an optical signal of the first optical path and is connected to a wavelength measurement silicon photonic chip, a photoelectric detection component detects the outgoing light intensity of the wavelength measurement silicon photonic chip and the outgoing light power information of the second optical path, the photoelectric detection component is connected to a data processing module, and the data processing module is connected to a display screen.

[0007] Preferably, the optical beam splitter is a 3dB optical splitter, and 50% of the light enters each of the first optical path and the second optical path.

[0008] Preferably, the wavelength measurement silicon photonic chip is arranged on a ceramic wafer.

[0009] Preferably, the wavelength measurement silicon photonic chip includes an edge coupler, and the edge coupler is respectively connected to the first optical fiber amplifier and the multimode interference coupler, and the multimode interference coupler is used to divide the light beam into a third optical path and a fourth optical path, and a spiral waveguide is provided on the fourth optical path. The MZ modulator receives the light signals emitted by the third optical path and the spiral waveguide, and the MZ modulator is connected to a vertical coupling grating, and the vertical coupling grating is connected to the photoelectric detection component.

[0010] Preferably, the spiral waveguide is connected to a thermistor, and the thermistor is connected to the data processing module.

[0011] Preferably, a heating electrode is provided on the wavelength measurement silicon photonic chip.

[0012] Preferably, the photoelectric detection component includes a photodetector and a back-illuminated monitoring photodetector, the photodetector detects the outgoing light power information of the second optical path and is connected to the data processing module; the back-illuminated monitoring photodetector detects the outgoing light intensity of the wavelength measurement silicon photonic chip and is connected to the data processing module through a second optical fiber amplifier.

[0013] Compared with the prior art, the present invention has achieved the following beneficial technical effects:

[0014] The present invention provides a miniature wavelength measurement device, including an optical probe, an optical beam splitter, a first optical fiber amplifier, a photodetector, a data processing module, a wavelength measurement silicon photonic chip, a thermistor, a back-illuminated monitoring photodetector, a second optical fiber amplifier and a display screen; the light beam generates a phase difference after being split by the wavelength measurement silicon photonic chip, and two optical signals with different intensities are obtained after being interfered by the MZ modulator. The data processing module receives the back-illuminated monitoring photodetector and processes and calculates the wavelength variation period with temperature. On the basis of the known optical path difference, the temperature and thermo-optic coefficient changes corresponding to different wavelengths in the database are corresponding, and then the incident light wavelength is obtained. The present device has the characteristics of high precision, miniaturization and portability, and has broad application prospects in the fields of optical communication, optical sensing, and optical wavelength measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0016] Figure 1 A schematic diagram of the structure of a micro wavelength measurement device provided by the present invention;

[0017] Figure 2 Schematic diagram of a wavelength measurement silicon photonic chip in a micro wavelength measurement device provided by the present invention. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] The purpose of the present invention is to provide a miniature wavelength measurement device to solve the problems existing in the prior art.

[0020] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0021] Embodiment 1:

[0022] This embodiment provides a miniature wavelength measurement device, such as Figure 1 As shown, it includes an optical probe 1, which is connected to an optical beam splitter 2. The optical beam splitter 2 is used to split the light beam into a first optical path and a second optical path. The first optical fiber amplifier 3 receives the optical signal of the first optical path and is connected to a wavelength measurement silicon photonic chip 7. The photoelectric detection component detects the outgoing light intensity of the wavelength measurement silicon photonic chip 7 and the outgoing light power information of the second optical path. The photoelectric detection component is connected to a data processing module 6, and the data processing module 6 is connected to a display screen 11.

[0023] As an implementation manner, the optical beam splitter 2 is a 3dB optical splitter, and 50% of the light enters the first optical path and the second optical path respectively.

[0024] As an implementation mode, the wavelength measurement silicon photonic chip 7 is disposed on the ceramic wafer 5 .

[0025] As an implementation method, Figure 2 As shown, the wavelength measurement silicon photonic chip 7 includes an edge coupler 71, which is respectively connected to the first optical fiber amplifier 3 and the multimode interference coupler 72. The multimode interference coupler 72 is used to divide the light beam into a third optical path and a fourth optical path. A spiral waveguide 73 is provided on the fourth optical path. An MZ modulator 74 receives the optical signals emitted by the third optical path and the spiral waveguide 73. The MZ modulator 74 is connected to a vertical coupling grating 75, and the vertical coupling grating 75 is connected to a photoelectric detection component.

[0026] The edge coupler receives the optical signal amplified by optical path 1, and splits it through the multimode interference coupler. Part of the optical signal is incident on the third optical path, and part of the optical signal is incident on the fourth optical path and enters the spiral waveguide. The length of the spiral waveguide is 1350um. When the waveguides of the third optical path and the fourth optical path are thermally adjusted at the same time, an optical path difference is generated at the spiral waveguide, causing the phases of the upper and lower paths to change. The MZ modulator is adjusted so that when a light beam without an optical path difference enters the MZ modulator, a phase difference of π is generated. At this time, the light transmitted to the vertical coupling grating is in a state of one path with light and one path without light. At this time, the waveguides of the third optical path and the fourth optical path are thermally adjusted so that the waveguide temperature rises by 30° from room temperature. ℃, the back-illuminated monitoring photodetector detects the optical power emitted by the vertically coupled grating at this time. In the data processing module, the temperature value fed back by the thermistor can be received and combined with the measured optical power data to obtain a power versus temperature curve. The power versus temperature cycle is obtained through the curve. For every cycle of power change, the third optical path and the fourth optical path will produce a phase difference of one wavelength. The change of the refractive index after thermal adjustment is obtained by measuring the temperature and power data and the known optical path difference of 1350um. By comparing the change of the refractive index of any wavelength value recorded in the data processing module when the temperature changes by 30℃, the accurate measurement value of the wavelength is obtained.

[0027] In the present invention, in order to improve the measurement accuracy, the length of the spiral waveguide can be adjusted. The longer the length of the spiral waveguide is, the more change cycles of the power-temperature curve measured by the back-illuminated monitoring photodetector are, and the higher the measurement accuracy is.

[0028] Furthermore, the spiral waveguide 73 is connected to the thermistor 8, and the thermistor 8 is connected to the data processing module 6. The thermistor senses the temperature change of the waveguide and feeds back the resistance data to the data processing module to realize accurate temperature control.

[0029] Furthermore, a heating electrode 76 is provided on the wavelength measurement silicon photonic chip 7, and the refractive index of the waveguide is adjusted by changing the temperature to achieve phase modulation.

[0030] As an embodiment, the photoelectric detection component includes a photodetector 4 and a back-illuminated monitoring photodetector 9. The photodetector 4 detects the outgoing light power information of the second optical path and is connected to the data processing module 6; the back-illuminated monitoring photodetector 9 detects the wavelength to measure the outgoing light intensity of the silicon photonic chip, and is connected to the data processing module 6 through the second optical fiber amplifier 10.

[0031] The present invention provides a miniature wavelength measurement device, the working principle of which is as follows: an external light beam with unknown wavelength is incident on a laser probe, and is split by 3dB through an optical beam splitter, 50% of the light signal enters the first optical fiber amplifier of the first optical path, and is amplified 10 times by the optical fiber amplifier, and 50% of the light signal enters the photoelectric detector of the second optical path, and the wavelength measurement silicon photonic chip receives the amplified light signal from the first optical path. The light beam after passing through the wavelength measurement silicon photonic chip is vertically coupled and then emitted in a direction perpendicular to the chip, and is incident on the back-illuminated monitoring photoelectric detector, and the optical power change at this time is transmitted to the data processing module, the data processing module receives the optical power change, and combines it with the temperature data fed back by the thermistor to form a power-temperature change curve, and obtains the power-temperature change cycle, and performs calibration and matching according to the wavelength information already contained in the data processing module, and obtains the wavelength of the incident light; at the same time, the data processing module simultaneously receives the optical power transmitted in the second optical path, and expands it to 2 times to obtain the power of the original optical signal; the data processing module transmits the obtained power size and wavelength value to the display screen, and displays them on the display screen.

[0032] The present invention proposes a miniature wavelength measurement device that can measure the wavelength of light incident into the device. The wavelength measurement silicon photonic chip, which is the core of the invention, is relatively small in size, greatly reducing the volume of the miniature wavelength measurement device. The device is also easy to operate, solving the problem that traditional wavelength measurement instruments are large in size, difficult to carry, and complex to operate.

[0033] The present invention uses specific examples to illustrate the principles and implementation methods of the present invention. The above examples are only used to help understand the method and core ideas of the present invention. At the same time, for those skilled in the art, according to the ideas of the present invention, there will be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A miniature wavelength measurement device, characterized in that: It includes an optical probe, the optical probe is connected to an optical beam splitter, the optical beam splitter is used to split the light beam into a first optical path and a second optical path, a first optical fiber amplifier receives the optical signal of the first optical path and is connected to a wavelength measurement silicon photonic chip, a photoelectric detection component detects the outgoing light intensity of the wavelength measurement silicon photonic chip and the outgoing light power information of the second optical path, the photoelectric detection component is connected to a data processing module, and the data processing module is connected to a display screen; An external light beam with unknown wavelength is incident on the optical probe and split by the optical beam splitter. 50% of the light signal enters the first optical fiber amplifier of the first optical path and is amplified 10 times by the optical fiber amplifier. 50% of the light signal enters the photodetector of the second optical path. The wavelength measurement silicon photonic chip receives the amplified light signal from the first optical path. The light beam after the wavelength measurement silicon photonic chip is vertically coupled and then emitted in a direction perpendicular to the chip and incident on the back-illuminated monitoring photodetector. The light power change at this time is transmitted to the data processing module. The data processing module receives the light power change and combines it with the temperature data fed back by the thermistor to form a power versus temperature curve, and obtains the power versus temperature cycle. The wavelength information already contained in the data processing module is used for calibration and matching to obtain the wavelength of the incident light. The data processing module simultaneously receives the optical power transmitted in the second optical path and amplifies it by 2 times to obtain the power of the original optical signal; The data processing module transmits the obtained power and wavelength values ​​to the display screen, where they are displayed.

2. The micro wavelength measurement device according to claim 1, characterized in that: The optical beam splitter is a 3dB optical splitter, and 50% of the light enters the first optical path and the second optical path respectively.

3. The micro wavelength measurement device according to claim 1, characterized in that: The wavelength measurement silicon photonic chip is arranged on a ceramic sheet.

4. The micro wavelength measurement device according to claim 3, characterized in that: The wavelength measurement silicon photonic chip includes an edge coupler, which is respectively connected to the first optical fiber amplifier and the multimode interference coupler, and the multimode interference coupler is used to divide the light beam into a third optical path and a fourth optical path. A spiral waveguide is provided on the fourth optical path. An MZ modulator receives light signals emitted by the third optical path and the spiral waveguide, and the MZ modulator is connected to a vertical coupling grating, and the vertical coupling grating is connected to the photoelectric detection component.

5. The micro wavelength measurement device according to claim 4, characterized in that: The spiral waveguide is connected to a thermistor, and the thermistor is connected to the data processing module.

6. The micro wavelength measurement device according to claim 4, characterized in that: The wavelength measurement silicon photonic chip is provided with a heating electrode.

7. The micro wavelength measurement device according to any one of claims 1 to 6, characterized in that: The photoelectric detection component includes a photodetector and a back-illuminated monitoring photodetector. The photodetector detects the outgoing light power information of the second optical path and is connected to the data processing module; the back-illuminated monitoring photodetector detects the outgoing light intensity of the wavelength measurement silicon photonic chip and is connected to the data processing module through a second optical fiber amplifier.

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