Voltage test device for IGBT power devices

By connecting the voltage detection component and the IGBT power parts using DuPont wire, the problem of inaccurate gate voltage signal measurement of IGBT power parts in the prior art is solved, and a higher measurement accuracy and simplified installation process is achieved.

CN118641795BActive Publication Date: 2025-03-18HISENSE HOME APPLIANCES GRP CO LTD
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Patent Information

Application Number
CN202410637843.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-05-21
Publication Date
2025-03-18
Estimated Expiration
2044-05-21

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Abstract

The present invention discloses a voltage testing device for an IGBT power device, comprising: a control board, a heat sink and a voltage detection component, wherein a first plug interface and a second plug interface are formed on the control board, a gate pin of the IGBT power device is suitable for plugging into the first plug interface, and an emitter pin of the IGBT power device is suitable for plugging into the second plug interface; the heat sink is arranged on a side of the IGBT power device away from the control board; the voltage detection component comprises a detection probe and a spring probe, one end of the detection probe is connected to an end of the gate pin adjacent to the gate through a first DuPont line, the other end of the detection probe is suitable for connecting to a voltage detection device through a connecting line, and the spring probe is connected to an end of the emitter pin adjacent to the emitter through a second DuPont line. According to the voltage testing device of the present invention, the influence of gate voltage oscillation on the gate voltage signal can be reduced, so that the gate voltage signal measured by the voltage detection component is closer to the actual gate voltage signal of the IGBT power device, and the measurement accuracy of the gate line signal is improved.
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Citation Information

Patent Citations

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