A RIS reflection parameter configuration system

Abstract

The application provides a RIS reflection parameter configuration system, comprising: a data acquisition module, configured to acquire initial configuration data of a to-be-tested RIS and start the to-be-tested RIS, and collect real-time position data and a first timestamp of a test device; an electromagnetic wave field strength test module, configured to demodulate a reflected signal reflected by the to-be-tested RIS to obtain field strength data; a control module, configured to determine whether the test device reaches a test point according to the real-time position data, and obtain measured data according to the field strength data and the first timestamp after the test is completed; and a reflected antenna simulation module, configured to simulate to obtain a simulated antenna pattern according to the initial configuration data, obtain a measured antenna pattern based on the measured data, and update configuration data of the to-be-tested RIS according to the measured antenna pattern and the simulated antenna pattern.

Description

Technical Field

[0001] This invention relates to the field of electromagnetic fields and microwave technology, and in particular to a RIS reflection parameter configuration system. Background Technology

[0002] As 6G technology matures, its advanced technologies are gradually being applied in 5G networks. RIS technology is one of the earliest applied product technologies. Intelligent metasurface technology (RIS) is a new technology developed based on metamaterials, and can be seen as an interdisciplinary application of metamaterials in the field of mobile communications. Intelligent metasurfaces add control circuits to metamaterials to adjust the parameters and positions of structural units, thereby modulating the amplitude and phase distribution of electromagnetic wave reflection and transmission.

[0003] Currently, RIS technology is still in the early stages of product verification, with limited engineering methods and testing tools, and a lack of systems for optimizing and adjusting the configuration parameters of RIS products. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a RIS reflection parameter configuration system that solves the aforementioned problems in existing technologies.

[0005] According to an embodiment of the present invention, a RIS reflection parameter configuration system includes:

[0006] The data acquisition module is used to acquire the initial configuration data of the RIS under test and start the RIS under test, and collect the real-time location data and first timestamp of the test device;

[0007] The electromagnetic wave field strength testing module is used to demodulate the reflected signal of the RIS under test to obtain field strength data;

[0008] The control module determines whether the test equipment has reached the test point based on real-time location data, and obtains the measured data based on the field strength data and the first timestamp after the test is completed.

[0009] The reflection antenna simulation module is used to simulate the antenna pattern based on the initial configuration data, obtain the measured antenna pattern based on the measured data, and update the configuration data of the RIS under test based on the measured antenna pattern and the simulated antenna pattern.

[0010] As an embodiment of the present invention, the data acquisition module includes:

[0011] The spatial positioning unit, located on the RIS under test, is used to collect the real-time location data and first timestamp of the test equipment.

[0012] As an embodiment of the present invention, an electromagnetic wave field strength testing module is disposed on a testing device, and the electromagnetic wave field strength testing module includes:

[0013] A dual-polarized horn antenna is used to receive reflected signals from the RIS under test; the reflected signals include 5G signals and 5G network signaling.

[0014] The 5G signal acquisition module is electrically connected to the dual-polarized horn antenna and is used to demodulate the 5G signal and 5G network signaling transmitted by the dual-polarized horn antenna during the test to obtain field strength data; the field strength data includes a second timestamp and RSRP.

[0015] The Bluetooth module is electrically connected to the 5G signal acquisition module and the control module respectively, and is used to acquire the field strength data transmitted by the 5G signal acquisition module and transmit it to the control module.

[0016] The horn antenna focusing tracker is used to track the orientation information of the RIS under test and generate control information based on the orientation information.

[0017] A horn antenna mounting platform is placed on the test equipment. The horn antenna mounting platform is electrically connected to the horn antenna focusing tracker and is used to adjust the direction of the dual-polarized horn antenna according to control information.

[0018] As an embodiment of the present invention, the control module performs the following operations:

[0019] Determine the scanning plane and obtain the sampling resolution input by the tester;

[0020] Based on the Nyquist sampling theorem and sampling resolution, the sampling interval distances Δx and Δy are determined;

[0021] Several test points are planned based on the sampling interval distance, and the 3D coordinates corresponding to the test points are determined.

[0022] The test route is determined based on several test points, and the test equipment is controlled to move along the test route.

[0023] Determine whether the real-time location data of the test equipment meets the 3D coordinates corresponding to any test point; if it does, start the electromagnetic wave field strength test module and obtain the first timestamp.

[0024] As an embodiment of the present invention, the control module also performs the following operations:

[0025] Obtain the field strength data, the first timestamp, and the 3D coordinates of the test point corresponding to the first timestamp;

[0026] Align the field strength data with the 3D coordinates of the test points based on the first and second timestamps;

[0027] Anomaly cleanup was performed on the aligned field strength data and the 3D coordinates of the test points to obtain the measured data.

[0028] As an embodiment of the present invention, the reflective antenna simulation module performs the following operations:

[0029] Based on the specific structure and array parameters of the RIS under test, the signal model of a single reflector unit on the RIS under test is simulated by mathematical expressions. The signal model of a single reflector unit is as follows:

[0030]

[0031] Where, x n Let y represent the incident signal of the nth reflecting unit. n β represents the reflected signal of the nth reflecting unit. n ∈[0,1] represents the amplitude adjustment of the signal after reflection by the nth reflection unit, α n ∈[0,2π] indicates the phase adjustment of the signal after reflection by the nth reflection unit, where n=1,2…,N, and N is the total number of reflection units on the RIS under test;

[0032] The simulated antenna pattern E is established based on the signal model of a single reflector element. array The formula for calculating (θ,φ) is:

[0033]

[0034] Among them, Y n ψ represents the amplitude of the reflected signal excitation of the nth reflecting unit. n E represents the excitation phase of the reflected signal of the nth reflecting unit. n (θ,φ) represents the far-field function of the nth reflecting unit, k0 represents the phase constant, and r n Represents the nth reflecting unit (r) n ,θ n ,φ n The distance from the origin is given by (θ,φ), where j represents an imaginary number and (θ,φ) represents the emission angle of the simulated antenna pattern.

[0035] As an embodiment of the present invention, the reflective antenna simulation module also performs the following operations:

[0036] The measured antenna pattern I(i,l) is obtained based on the measured data and is expressed as follows:

[0037]

[0038] Where B0(g,m) represents the difference in field strength data between the position at point (gΔx,mΔy) and the reference position, (i,l) represents the coordinates on the Cartesian coordinate system corresponding to the 3D coordinates, Δx and Δy both represent the sampling interval distance on the scanning plane, and (g,m) represents the number of sampling interval distances in the x and y directions.

[0039] By filtering for the maximum value of |I(i,l)|, we obtain I(i max ,l max ), based on I(i max ,l max ) Calculate the measured antenna pattern emission angle. The measured antenna pattern emission angle is (i max ,l max The coordinates (Δ0, Ψ0) corresponding to Δ0 are given by the following formula:

[0040]

[0041] Based on the difference in the emission angle between the measured and simulated antenna patterns, recommended configuration parameters for the RIS under test are calculated according to the uniform linear array of the RIS. The configuration parameters of the RIS under test are then updated based on these recommended values. The formula for calculating the recommended configuration parameters of the RIS under test is as follows:

[0042]

[0043] Where Δα2 represents the recommended value of the configuration parameters of the RIS under test, Δα1 represents the current value of the configuration parameters of the RIS under test, ΔJ represents the difference in the emission angle between the measured antenna pattern and the simulated antenna pattern, d represents the distance between two adjacent reflective elements in the uniform linear array of the RIS under test, and λ represents the wavelength.

[0044] Compared with existing technologies, the present invention has the following advantages: by using testing equipment to assist in testing, the field strength data of the electromagnetic wave field strength testing module is obtained at a precise three-dimensional spatial position. Then, the measured antenna pattern and the simulated antenna pattern are compared by system software to evaluate the error of the unit configuration parameters and optimize the coverage effect of the RIS product. Attached Figure Description

[0045] Figure 1 This is a system schematic diagram according to an embodiment of the present invention;

[0046] Figure 2 This is a system structure diagram of another embodiment of the present invention;

[0047] Figure 3 This is a schematic diagram of the incident angle before and after compensation according to another embodiment of the present invention;

[0048] Figure 4This is a schematic diagram of an electromagnetic field strength testing module according to another embodiment of the present invention;

[0049] Figure 5 This is a schematic diagram of the system implementation process of another embodiment of the present invention. Detailed Implementation

[0050] The technical solutions of the present invention will be further described below with reference to the accompanying drawings and embodiments.

[0051] like Figures 1 to 5 As shown, this embodiment of the invention proposes a RIS reflection parameter configuration system, including:

[0052] The data acquisition module is used to acquire the initial configuration data of the RIS under test and start the RIS under test, and collect the real-time location data and first timestamp of the test device;

[0053] The electromagnetic wave field strength testing module is used to demodulate the reflected signal of the RIS under test to obtain field strength data;

[0054] The control module determines whether the test equipment has reached the test point based on real-time location data, and obtains the measured data based on the field strength data and the first timestamp after the test is completed.

[0055] The reflection antenna simulation module is used to simulate the antenna pattern based on the initial configuration data, obtain the measured antenna pattern based on the measured data, and update the configuration data of the RIS under test based on the measured antenna pattern and the simulated antenna pattern.

[0056] The working principle of the above technical solution is as follows: In actual use, the initial configuration data of the RIS under test is input, causing the RIS under test to start according to the input initial configuration data. The initial configuration data includes horizontal and vertical configuration parameters. After startup, the electromagnetic field strength testing module is driven by the testing equipment to move along the test route planned by the control module, passing through multiple pre-planned test points during the movement. The real-time position data of the testing equipment collected by the data acquisition module is used to determine whether the testing equipment has reached the test point. The testing equipment is preferably a drone or a test vehicle. When the testing equipment reaches a test point, the electromagnetic field strength testing module records the current field strength data. Then, the control module processes the field strength data and the first timestamp to obtain the measured data. The processing includes data alignment based on the timestamp and abnormal data cleanup. Simultaneously, when the initial configuration data is obtained, the reflection antenna simulation module performs simulation based on the initial configuration data to obtain the simulated antenna pattern. After obtaining the measured data, the measured antenna vector map is obtained based on the measured data. Finally, the configuration data of the RIS under test is evaluated based on the measured antenna pattern and the simulated antenna pattern.

[0057] The beneficial effects of the above technical solution are as follows: By using the above technical solution and the auxiliary testing equipment, the field strength data of the electromagnetic wave field strength testing module can be obtained at a precise three-dimensional spatial position. Then, the measured antenna pattern and the simulated antenna pattern are compared by the system software to update the configuration parameters of the RIS under test and optimize the coverage effect of the RIS product.

[0058] In one embodiment, the data acquisition module includes:

[0059] The spatial positioning unit, located on the RIS under test, is used to collect the real-time location data and first timestamp of the test equipment;

[0060] The working principle and beneficial effects of the above technical solution are as follows: The spatial positioning unit adopts a high-performance 3D camera to achieve high-performance real-time position data acquisition of 0.3-5 meters. The real-time position data of the electromagnetic wave field strength testing module is realized through the internal algorithm module of the positioning unit. The 3D camera is used to quickly capture the coordinates of the testing equipment, which has the advantages of high efficiency and high accuracy. At the same time, when recording the coordinates of the testing equipment, the current time is recorded to obtain the first timestamp.

[0061] In one embodiment, the electromagnetic wave field strength testing module is disposed on the testing equipment, and the electromagnetic wave field strength testing module includes:

[0062] A dual-polarized horn antenna is used to receive reflected signals from the RIS under test; the reflected signals include 5G signals and 5G network signaling.

[0063] The 5G signal acquisition module is electrically connected to the dual-polarized horn antenna and is used to demodulate the 5G signal and 5G network signaling transmitted by the dual-polarized horn antenna during the test to obtain field strength data; the field strength data includes a second timestamp and RSRP.

[0064] The Bluetooth module is electrically connected to the 5G signal acquisition module and the control module respectively, and is used to acquire the field strength data transmitted by the 5G signal acquisition module and transmit it to the control module.

[0065] The horn antenna focusing tracker is used to track the orientation information of the RIS under test and generate control information based on the orientation information.

[0066] A horn antenna mounting gimbal is placed on the test equipment. The horn antenna mounting gimbal is electrically connected to the horn antenna focusing tracker and is used to adjust the direction of the dual-polarized horn antenna according to control information.

[0067] The working principle and beneficial effects of the above technical solution are as follows: During the test, the reflected signal from the RIS under test is received by the dual-polarized horn antenna; the reflected signal includes 5G signal and 5G network signaling; the reflected signal is then transmitted to the 5G signal acquisition module to demodulate the 5G signal and 5G network signaling transmitted by the dual-polarized horn antenna to obtain field strength data; the field strength data includes a second timestamp and RSRP; the field strength data is then transmitted to the control module for processing via Bluetooth module; simultaneously, during the movement of the test equipment, the horn antenna focus tracker is used to track the direction information of the RIS under test and generate control information based on the direction information; the direction information is determined by setting a specific band infrared light source at the RIS device, and the horn antenna focus tracker and horn antenna mounting gimbal enable the dual-polarized horn antenna to achieve precise focusing; the dual-polarized horn antenna transmits the signal to the 5G signal acquisition module via RF feeder; during the installation of the RIS under test, it is installed and powered according to the design standards of the RIS under test (electrode unit voltage, etc.).

[0068] In one embodiment, the control module performs the following operations:

[0069] Determine the scanning plane and obtain the sampling resolution input by the tester;

[0070] Based on the Nyquist sampling theorem and sampling resolution, the sampling interval distances Δx and Δy are determined;

[0071] Several test points are planned based on the sampling interval distance, and the 3D coordinates corresponding to the test points are determined.

[0072] The test route is determined based on several test points, and the test equipment is controlled to move along the test route.

[0073] Determine whether the real-time location data of the test equipment meets the 3D coordinates corresponding to any test point; if it does, obtain the first timestamp and start the electromagnetic wave field strength test module.

[0074] The control module also performs the following operations:

[0075] Obtain the field strength data, the first timestamp, and the 3D coordinates of the test point corresponding to the first timestamp;

[0076] Align the field strength data with the 3D coordinates of the test points based on the first and second timestamps;

[0077] Anomaly cleanup was performed on the aligned field strength data and the 3D coordinates of the test points to obtain the measured data.

[0078] The working principle and beneficial effects of the above technical solution are as follows: In actual use, the scanning plane is determined, and the sampling resolution input by the tester is obtained; based on the Nyquist sampling theorem and the sampling resolution, the sampling interval distances Δx and Δy are determined, where Δx is the horizontal sampling interval distance and Δy is the vertical sampling interval distance; during the test, the control module records the real-time position data collected by the spatial positioning unit and the corresponding first timestamp, as well as the field strength data of the electromagnetic wave field strength testing module, and then connects and aligns the data according to the first and second timestamps; abnormal data is cleaned up, such as blank data, garbled characters, out-of-range data, etc.; where 3D coordinates are coordinate points on the spherical coordinate system.

[0079] In one embodiment, the control module also performs the following operations:

[0080] Obtain the field strength data, the first timestamp, and the 3D coordinates of the test point corresponding to the first timestamp;

[0081] Align the field strength data with the 3D coordinates of the test points based on the first and second timestamps;

[0082] Anomaly cleanup was performed on the aligned field strength data and the 3D coordinates of the test points to obtain the measured data.

[0083] The reflection antenna simulation module performs the following operations:

[0084] Based on the specific structure and array parameters of the RIS under test, the signal model of a single reflector unit on the RIS under test is simulated by mathematical expressions. The signal model of a single reflector unit is as follows:

[0085]

[0086] Where, x n Let y represent the incident signal of the nth reflecting unit. n β represents the reflected signal of the nth reflecting unit. n ∈[0,1] represents the amplitude adjustment of the signal after reflection by the nth reflection unit, α n ∈[0,2π] indicates the phase adjustment of the signal after reflection by the nth reflection unit, where n=1,2…,N, and N is the total number of reflection units on the RIS under test;

[0087] The simulated antenna pattern E is established based on the signal model of a single reflector element. array The formula for calculating (θ,φ) is:

[0088]

[0089] Among them, Y nψ represents the amplitude of the reflected signal excitation of the nth reflecting unit. n E represents the excitation phase of the reflected signal of the nth reflecting unit. n (θ,φ) represents the far-field function of the nth reflecting unit, k0 represents the phase constant, and r n Represents the nth reflecting unit (r) m ,θ n ,φ n The distance between the antenna and the origin is given by j, where j represents an imaginary number, and (θ,φ) represents the emission angle of the simulated antenna pattern.

[0090] The reflection antenna simulation module also performs the following operations:

[0091] The measured antenna pattern I(i,l) is obtained based on the measured data and is expressed as follows:

[0092]

[0093] Where B0(g,m) represents the difference in field strength data between the position at point (gΔx,mΔy) and the reference position, (i,l) represents the coordinates in the Cartesian coordinate system corresponding to the 3D coordinates, Δx and Δy both represent the sampling interval distance on the scanning plane, and (g,m) represents the number of sampling interval distances in the x and y directions; and i = gΔx, l = mΔy; the reference position is any specified point;

[0094] By filtering for the maximum value of |I(i,l)|, we obtain I(i max ,l max ), based on I(i max ,l max ) Calculate the measured antenna pattern emission angle. The measured antenna pattern emission angle is (i max ,l max The coordinates (Δ0, Ψ0) corresponding to Δ0 are given by the following formula:

[0095]

[0096] Step S1: Based on the difference in the emission angle between the measured antenna pattern and the simulated antenna pattern, calculate the recommended configuration parameters of the RIS under test according to the uniform linear array of the RIS, and update the configuration parameters of the RIS under test based on the recommended configuration parameters. The formula for calculating the recommended configuration parameters of the RIS under test is as follows:

[0097]

[0098] Where Δα2 represents the recommended value of the configuration parameters of the RIS under test, Δα1 represents the current value of the configuration parameters of the RIS under test, ΔJ represents the difference in the emission angle between the measured antenna pattern and the simulated antenna pattern, d represents the distance between two adjacent reflective elements in the uniform linear array of the RIS under test, and λ represents the wavelength.

[0099] The working principle and beneficial effects of the above technical solution are as follows: A simulated antenna pattern is obtained by simulating the initial configuration data using a reflection antenna simulation module. A measured antenna pattern is obtained based on the measured data. The configuration data of the RIS under test is updated according to the measured and simulated antenna patterns. Δα1 represents the current value of the configuration parameters of the RIS under test (the initial configuration data). Wherein, ΔJ = Δ0 - θ. The recommended horizontal configuration parameter value of the RIS under test is calculated in step S1. Similarly, step S1 is repeated to make ΔJ = Ψ0 - φ, and then the recommended vertical configuration parameter value of the RIS under test is obtained. The RIS under test is then configured according to the recommended horizontal and vertical configuration parameter values.

[0100] Furthermore, during the simulation of the RIS under test, information such as the initial configuration parameters, the specific structure of the RIS under test, the array parameters, and the array unit voltage needs to be input into the reflection simulation module for simulation.

[0101] In one embodiment, the implementation steps of the present invention are as follows:

[0102] Set the parameters of the RIS under test and start the RIS under test;

[0103] Input the initial configuration parameters of the RIS under test into the reflection antenna simulation module to calculate the simulated antenna pattern;

[0104] Based on the resolution requirements of the sampling theorem, determine the moving distance, plan the 3D coordinates of the test points, and plan the moving route for the drone or test vehicle;

[0105] The spatial positioning unit is activated to begin locating the electromagnetic wave field strength testing module, and transmits the real-time positioning data and the first timestamp to the control module via USB in real time.

[0106] The electromagnetic field strength testing module starts testing, performs a three-dimensional spatial traversal test driven by a drone or test vehicle, and transmits the field strength data to the control module via Bluetooth; the tracker controls the gimbal to align with the RIS under test.

[0107] The control module aligns the 3D coordinates with the field strength data over time; it also cleans up abnormal data (such as blank data, garbled characters, out-of-range data, etc.).

[0108] The measured antenna pattern is calculated based on actual measurement data; based on the difference in the emission angle between the simulated antenna vector pattern and the measured antenna vector pattern, recommended values ​​for the RIS configuration parameters are calculated according to the uniform phase difference between each array; such as Figure 3 As shown, ΔΦ is the phase deviation value of each element after incident angle compensation, and the incident angle can be adjusted.

[0109] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. A RIS reflection parameter configuration system, characterized in that, include: The data acquisition module is used to acquire the initial configuration data of the RIS under test and start the RIS under test, and collect the real-time location data and first timestamp of the test device; The electromagnetic wave field strength testing module is used to demodulate the reflected signal of the RIS under test to obtain field strength data; The control module determines whether the test equipment has reached the test point based on real-time location data, and obtains the measured data based on the field strength data and the first timestamp after the test is completed. The reflection antenna simulation module is used to simulate the antenna pattern based on the initial configuration data, obtain the measured antenna pattern based on the measured data, and update the configuration data of the RIS under test based on the measured antenna pattern and the simulated antenna pattern.

2. The RIS reflection parameter configuration system as described in claim 1, characterized in that, The data acquisition module includes: The spatial positioning unit, located on the RIS under test, is used to collect the real-time location data and first timestamp of the test equipment.

3. The RIS reflection parameter configuration system as described in claim 1, characterized in that, The electromagnetic wave field strength testing module is located on the testing equipment and includes: A dual-polarized horn antenna is used to receive reflected signals from the RIS under test; the reflected signals include 5G signals and 5G network signaling. The 5G signal acquisition module is electrically connected to the dual-polarized horn antenna and is used to demodulate the 5G signal and 5G network signaling transmitted by the dual-polarized horn antenna during the test to obtain field strength data; the field strength data includes a second timestamp and RSRP. The Bluetooth module is electrically connected to the 5G signal acquisition module and the control module respectively, and is used to acquire the field strength data transmitted by the 5G signal acquisition module and transmit it to the control module. The horn antenna focusing tracker is used to track the orientation information of the RIS under test and generate control information based on the orientation information. A horn antenna mounting platform is placed on the test equipment. The horn antenna mounting platform is electrically connected to the horn antenna focusing tracker and is used to adjust the direction of the dual-polarized horn antenna according to control information.

4. The RIS reflection parameter configuration system as described in claim 1, characterized in that, The control module performs the following operations: Determine the scanning plane and obtain the sampling resolution input by the tester; Based on the Nyquist sampling theorem and sampling resolution, the sampling interval distances Δx and Δy are determined; Several test points are planned based on the sampling interval distance, and the 3D coordinates corresponding to the test points are determined. The test route is determined based on several test points, and the test equipment is controlled to move along the test route. Determine whether the real-time location data of the test equipment meets the 3D coordinates corresponding to any test point; if it does, start the electromagnetic wave field strength test module and obtain the first timestamp.

5. A RIS reflection parameter configuration system as described in claim 4, characterized in that, The control module also performs the following operations: Obtain the field strength data, the first timestamp, and the 3D coordinates of the test point corresponding to the first timestamp; Align the field strength data with the 3D coordinates of the test points based on the first and second timestamps; Anomaly cleanup was performed on the aligned field strength data and the 3D coordinates of the test points to obtain the measured data.

6. The RIS reflection parameter configuration system as described in claim 1, characterized in that, The reflection antenna simulation module performs the following operations: Based on the specific structure and array parameters of the RIS under test, the signal model of a single reflector unit on the RIS under test is simulated by mathematical expressions. The signal model of a single reflector unit is as follows: Where, x n Let y represent the incident signal of the nth reflecting unit. n β represents the reflected signal of the nth reflecting unit. n ∈[0,1] represents the amplitude adjustment of the signal after reflection by the nth reflection unit, α n ∈[0,2π] indicates the phase adjustment of the signal after reflection by the nth reflection unit, where n=1,2…,N, and N is the total number of reflection units on the RIS under test; The simulated antenna pattern E is established based on the signal model of a single reflector element. array The formula for calculating (θ,φ) is: Among them, Y n ψ represents the amplitude of the reflected signal excitation of the nth reflecting unit. n E represents the excitation phase of the reflected signal of the nth reflecting unit. n (θ,φ) represents the far-field function of the nth reflecting unit, k0 represents the phase constant, and r n Represents the nth reflecting unit (r) n ,θ n ,φ n The distance from the origin is given by (Δ,φ), where j represents an imaginary number and (Δ,φ) represents the emission angle of the simulated antenna pattern.

7. A RIS reflection parameter configuration system as described in claim 6, characterized in that, The reflection antenna simulation module also performs the following operations: The measured antenna pattern I(i,l) is obtained based on the measured data and is expressed as follows: Where B0(g,m) represents the difference in field strength data between the position at point (gΔx,mΔy) and the reference position, (i,l) represents the coordinates on the Cartesian coordinate system corresponding to the 3D coordinates, Δx and Δy both represent the sampling interval distance on the scanning plane, and (g,m) represents the number of sampling interval distances in the x and y directions. By filtering for the maximum value of |I(i,l)|, we obtain I(i max ,l max ), based on I(i max ,l max ) Calculate the measured antenna pattern emission angle. The measured antenna pattern emission angle is (i max ,l max The coordinates (Δ0, Ψ0) corresponding to Δ0 are given by the following formula: Based on the difference in the emission angle between the measured and simulated antenna patterns, recommended configuration parameters for the RIS under test are calculated according to the uniform linear array of the RIS. The configuration parameters of the RIS under test are then updated based on these recommended values. The formula for calculating the recommended configuration parameters of the RIS under test is as follows: Where Δα2 represents the recommended value of the configuration parameters of the RIS under test, Δα1 represents the current value of the configuration parameters of the RIS under test, ΔJ represents the difference in the emission angle between the measured antenna pattern and the simulated antenna pattern, d represents the distance between two adjacent reflective elements in the uniform linear array of the RIS under test, and λ represents the wavelength.

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