A 630nm silicon-based PIN detector calibration method and system suitable for a wide temperature range

Abstract

The present invention discloses a 630nm silicon-based PIN detector calibration method and system suitable for a wide temperature range, which relates to the field of detector calibration technology. The system acquires an optical signal through a target signal acquisition unit and converts it into a digital signal, adds a timestamp, and then a data processing module performs waveform analysis on the original photoelectric signal sequence to calculate the first optical signal intensity difference G. cz And generate a pre-calibration command. The signal analysis module further converts it to the frequency domain through Fourier transform to identify the wavelength peak coefficient K peak , triggering the first calibration mechanism command. The environmental monitoring module collects the environmental parameters around the detector in real time for calibration adjustment coefficient Xzx to ensure that the wavelength value of the second calibration optical signal reaches the expected value. If necessary, the second calibration adjustment module further calibrates using optical filters and background light shielding coefficients. The third calibration adjustment module makes a final adjustment to the optical signal wavelength based on the waveguide efficiency coefficient Gzd to improve the accuracy and reliability of optical signal detection.

Description

Technical Field

[0001] The present invention relates to the technical field of detector calibration, and in particular to a 630nm silicon-based PIN detector calibration method and system applicable to a wide temperature range. Background Art

[0002] The 630nm silicon-based PIN detector is a photodetector based on silicon material with an operating wavelength of 630nm. The PIN detector is a semiconductor detector consisting of three layers: P-type, I-type (intrinsic) and N-type. Its working principle is that when photons enter the detector, electron-hole pairs are generated in the I-type layer. Under the action of an external electric field, these electrons and holes are collected in the P-type and N-type regions, thereby generating current signals. The wide temperature range means that the detector can work in a larger temperature range, such as from -40°C to 85°C.

[0003] In practical applications, 630nm silicon-based PIN detectors usually work together with waveguides to enhance the transmission efficiency and detection accuracy of optical signals. However, during the use of the detector, the detector and waveguide not only have to deal with the target optical signal, but also need to handle a variety of complex environmental interference and condition changes, which puts higher requirements on the performance of the detector.

[0004] First of all, background light interference is an issue that cannot be ignored. Natural light in the environment, indoor lighting, and stray light emitted by other electronic devices will be mixed into the optical signal received by the detector. These background light interferences will cause the signal noise to increase, thus affecting the detection accuracy and reliability of the detector. Without effective calibration and compensation, the signal output by the detector will not accurately reflect the actual light intensity changes.

[0005] Secondly, the temperature, humidity and air pressure of the detector's working environment will also have a significant impact on its performance. Temperature changes will cause changes in the bandgap energy of semiconductor materials, which in turn affects the detector's responsivity and noise level. Changes in humidity may cause short circuits or oxidation in the detector's internal circuits, while changes in air pressure will affect the refractive index of the optical path. The combined effect of these environmental factors greatly reduces the detector's working stability in extreme environments, and long-term reliable operation cannot be guaranteed. Summary of the invention

[0006] 1. Technical issues to be resolved

[0007] In view of the deficiencies of the prior art, the present invention provides a 630nm silicon-based PIN detector calibration method and system applicable to a wide temperature range to solve the problems mentioned in the background technology.

[0008] (II) Technical solution

[0009] To achieve the above objectives, the present invention is implemented by the following technical solution: A 630nm silicon-based PIN detector calibration method suitable for a wide temperature range comprises the following steps:

[0010] S1. Integrate the detector and the waveguide on a unified chip, package them, and use an analog-to-digital converter ADC to collect the original photoelectric signal sequence information in the detector according to a fixed time interval, including the optical signal intensity and timestamp; use the waveform analysis method to calculate the optical signal intensity difference between adjacent timestamps to construct a first optical signal intensity difference G. cz , if the first optical signal strength difference G cz When the abnormal threshold is exceeded, a first pre-calibration command is generated;

[0011] S2. After receiving the first pre-calibration command, the original photoelectric signal sequence information is converted into the frequency domain by applying Fourier transform FFT, and the wavelength peak coefficient K is constructed by obtaining the spectrum and statistically analyzing the change trend of the spectrum peak position and width. peak , determine whether further calibration and compensation are needed. If the wavelength peak coefficient K peak If the peak value threshold is exceeded, a first calibration mechanism command is triggered;

[0012] S3, after receiving the first calibration mechanism command, real-time monitoring is performed to obtain the first optical signal wavelength value bcz, and by installing a temperature sensor, a humidity sensor, and an air pressure sensor on the detector, real-time temperature value T, real-time humidity value S, and real-time air pressure value F of the current surrounding environment of the detector are collected in real time, and a calibration adjustment coefficient Xzx is constructed, and the calibration adjustment coefficient Xzx is directly multiplied by the first optical signal wavelength value bcz to perform calibration, and obtain the second calibration optical signal wavelength value bcz2;

[0013] S4. If the second calibration light signal wavelength value bcz2 is less than expected, the current ambient background light information is collected through the optical filter installed on the detector, the background light shielding coefficient Gzd is constructed, and the background light shielding coefficient Gzd is used as the second calibration command to calibrate the second calibration light signal wavelength value bcz2 in real time to obtain the third calibration light signal wavelength value bcz3;

[0014] S5. After calibration, repeat step S1 for verification. If the wavelength difference Gcz of the first optical signal in S1 still exceeds the normal threshold, collect the waveguide power data, and construct the waveguide efficiency coefficient Dbx based on the waveguide power data: if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, trigger the third calibration command, calculate the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D, obtain the first waveguide calibration difference X, multiply the third calibration optical signal wavelength value bcz3 by the first waveguide calibration difference X, perform calibration, and obtain the fourth calibration optical signal wavelength value bcz4;

[0015] S6: If the third calibration optical signal wavelength value bcz3 is still less than expected, repeat steps S3-S5 until the first optical signal intensity difference G is greater than or equal to 0. cz Until it falls below the abnormal threshold.

[0016] Preferably, the S1 comprises:

[0017] S11, using the analog-to-digital converter ADC to collect the light signal intensity I (t i and the corresponding timestamp t i , forming a photoelectric signal intensity sequence {I(t1),I(t2),...,I(t n ),} and the timestamp sequence {t1,t2,...,t n};

[0018] S12. For each adjacent timestamp pair (t i ,t i+1 ), calculate the optical signal intensity difference ΔI(t i ,t i+1 ):

[0019] ΔI(t i ,t i+1 )=I(t i+1 )-I(t i )

[0020] And construct the optical signal intensity difference sequence {ΔI(t1,t2),ΔI(t2,t3),...,ΔI(t n-1 ,t n )};

[0021] S13: construct a first optical signal strength difference G according to the optical signal strength difference sequence. cz :

[0022]

[0023] Preferably, the S1 further comprises:

[0024] S14, if the first optical signal strength difference G cz : Exceeds the normal threshold ΔI threshold , a first pre-calibration command is generated.

[0025] Preferably, S2 includes:

[0026] S21, after receiving the first pre-calibration command, it indicates that there is an abnormality in the optical wave signal of the detector and the waveguide, and it is necessary to determine the judgment again. By applying Fourier transform FFT, the detector converts the original photoelectric signal sequence information into the frequency domain, and analyzes the change trend of the spectrum peak position and width through the spectrum diagram to construct the wavelength peak coefficient K peak ;

[0027] S22, the wavelength peak coefficient K peak Calculated by the following formula:

[0028]

[0029] In the formula, λ i is the i-th wavelength, I(λ i ) is the wavelength λ i The optical signal intensity at peak is the target peak wavelength, set to 630nm, FWHM represents the width of the peak in the spectrum, Δλ represents the wavelength sampling interval, N is the number of sampled wavelength points, and represents the total number of sampled wavelength points in the spectrum; It represents the sum of the optical signal intensities at all wavelengths and is used for normalization to represent the total optical signal intensity of the entire spectrum;

[0030] is the target wavelength λ peak The optical signal strength at the user and the identification target wavelength, δ(λ i -λ peak ) is the Dirac pulse function, which represents the optical signal intensity at the target wavelength;

[0031] S23, the calculated wavelength peak coefficient K peak Compared with the peak threshold, if the wavelength peak factor K peak If the peak value threshold is exceeded, it is determined that the frequency characteristic of the optical signal is abnormal and needs further calibration, thus triggering a first calibration mechanism command;

[0032] If the wavelength peak factor K peak If the peak value threshold is not exceeded, the frequency characteristic of the optical signal is judged to be qualified and no additional calibration and compensation are required;

[0033] S24. When it is determined in S23 that the frequency characteristic of the optical signal is qualified, go to step S5.

[0034] Preferably, S3 includes:

[0035] S31, installing a temperature sensor, a humidity sensor and an air pressure sensor on the detector, monitoring the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F of the environment around the detector in real time, and establishing a real-time environmental data set;

[0036] S32, performing a data cleaning step on the real-time environment data set: detecting and processing missing values, outliers or erroneous data; including filling missing values ​​and correcting outliers;

[0037] S33, converting the real-time temperature value T from Celsius to Fahrenheit, converting the real-time humidity value S from relative humidity to absolute humidity, converting the real-time air pressure value F to standard atmospheric pressure, and performing smoothing and normalization on the converted data.

[0038] Preferably, S3 further includes:

[0039] S34, for the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F, respectively calculate the difference between the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F and the standard value, and obtain the first temperature difference ΔT, the second humidity difference ΔS and the third air pressure difference ΔF:

[0040] ΔT=|TT std |;

[0041] ΔS=|SS std |;

[0042] ΔF=|FF std |;

[0043] Where, T std Indicates the standard temperature threshold, S std Indicates the standard humidity threshold, F std Indicates the standard air pressure threshold;

[0044] S35. Calculate the temperature change rate Humidity change rate and the rate of change of air pressure

[0045]

[0046] Wherein, ΔT represents the first temperature difference, which represents the deviation between the current ambient temperature and the standard temperature threshold, ΔT preev is the ambient temperature deviation at the previous time point, and Δt is the time interval between two measurements; Indicates the rate of change of the ambient temperature from the standard value; if this value is positive, it means that the speed of the temperature deviation from the standard value is increasing; if it is negative, it means that the speed is decreasing; if it is zero, it means that the speed of the temperature deviation from the standard value remains unchanged;

[0047]

[0048] Wherein, ΔS represents the second humidity difference, which indicates the deviation of the current ambient humidity from the standard humidity threshold, ΔS preevis the ambient humidity deviation at the previous time point, and Δt is the time interval between two measurements; Indicates the rate of change of ambient humidity from the standard value; similar to temperature, a positive value indicates that the speed at which humidity deviates from the standard value is increasing, a negative value indicates that the speed is decreasing, and a zero value indicates that the speed remains unchanged;

[0049]

[0050] Wherein, ΔF represents the third air pressure difference, which indicates the deviation of the current ambient air pressure from the standard air pressure threshold. ΔF preev is the ambient pressure deviation at the previous time point, and Δt is the time interval between two measurements; Indicates the rate of change of the ambient air pressure from the standard value; similarly, a positive value indicates that the speed at which the air pressure deviates from the standard value is increasing, a negative value indicates that the speed is decreasing, and a zero value indicates that the speed remains unchanged;

[0051] S36. Calculate the calibration adjustment coefficient Xzx:

[0052]

[0053] In the formula, represents the rate of temperature change, represents the humidity change rate, represents the air pressure change rate, Cr is the first correction constant, Cs is the second correction constant, CF is the third correction constant, wr, ws and wF are weight values.

[0054] Preferably, the background light shielding coefficient Gzd is obtained by the following formula:

[0055]

[0056] In the formula, I total Indicates the target optical signal strength, I signal Represents the total strategic light intensity, including background light and target light signal, I total -I signal represents the background light intensity, K represents the correction factor of the optical system;

[0057] The third calibration optical signal wavelength value bcz3 is obtained by real-time calibration using the following formula:

[0058] bcz3=bcz2×(1-Gzd).

[0059] Preferably, the steps for obtaining the waveguide efficiency coefficient Dbx are as follows:

[0060] First obtain the internal reflectivity R int , internal reflectivity R intIt is caused by reflection between different interfaces inside the waveguide. It is assumed that there are multiple interfaces i inside the waveguide, and the reflectivity of each interface i is Ri. The internal reflectivity R is calculated by the following formula int :

[0061]

[0062] Where M is the number of internal interfaces;

[0063] External reflectivity R ext is the reflectivity between the waveguide and the external environment. It is a separate value representing the reflection value between the outer surface of the waveguide and the air or other medium. Multiple reflections will cause the optical signal to be repeatedly reflected inside the waveguide, forming an attenuation coefficient α, which is expressed by the following formula:

[0064] α=1-R int ;

[0065] The attenuation after each reflection is expressed as the sum of geometric series R multi :

[0066]

[0067] Then calculate the total reflectivity R abs :

[0068] R abs =R ext +R multi -R ext *R multi

[0069] Finally, the waveguide efficiency coefficient Dbx is generated by the following formula:

[0070]

[0071] Where, T abs is the power absorbed in the waveguide, R abs It represents the total reflectivity. The waveguide efficiency coefficient Dbx characterizes the transmission efficiency of the waveguide and reflects the effective transmission capacity of the optical signal inside the waveguide. By comprehensively considering the influence of internal reflectivity, external reflectivity and multiple reflections, the waveguide efficiency coefficient Dbx represents the performance stability and transmission efficiency of the waveguide under different conditions.

[0072] Preferably, if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, it indicates that the waveguide efficiency is insufficient and unqualified, triggering the third calibration command, then the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X: X=D-Dbx; and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X, bcz4=bcz3×X for calibration, to obtain the fourth calibration optical signal wavelength value bcz4;

[0073] If the waveguide efficiency coefficient Dbx is greater than or equal to the standard waveguide threshold D, it means that the waveguide is within the expected qualified efficiency and no further calibration is required.

[0074] A 630nm silicon-based PIN detector calibration system suitable for a wide temperature range, comprising:

[0075] The target signal acquisition unit receives the optical signal and converts it into an electrical signal, converts the analog electrical signal generated by the detector into a digital signal, and adds a time stamp;

[0076] The data processing module collects the original photoelectric signal sequence information in the detector according to the fixed time interval method, including the light signal intensity and timestamp; calculates the light signal intensity difference using the waveform analysis method to construct the first light signal intensity difference G cz , store the original photoelectric signal sequence, timestamp and optical signal strength difference; if the first optical signal strength difference G cz When the abnormal threshold is exceeded, a first pre-calibration command is generated;

[0077] Further, after receiving the first pre-calibration command, the signal analysis module converts the original photoelectric signal sequence information into the frequency domain by applying Fourier transform FFT, obtains the spectrum, and statistically calculates the change trend of the spectrum peak position and width to construct the wavelength peak coefficient K. peak , determine whether further calibration and compensation are needed. If the wavelength peak coefficient K peak If the peak value threshold is exceeded, a first calibration mechanism command is triggered;

[0078] The environment monitoring module, after receiving the first calibration mechanism command, monitors and obtains the first optical signal wavelength value bcz in real time, and collects and obtains the real-time temperature value T, real-time humidity value S and real-time pressure value F of the current surrounding environment of the detector in real time by installing a temperature sensor, a humidity sensor and an air pressure sensor on the detector;

[0079] A first calibration adjustment module constructs a calibration adjustment coefficient Xzx, and directly multiplies the calibration adjustment coefficient Xzx by the first optical signal wavelength value bcz to perform calibration, thereby obtaining a second calibration optical signal wavelength value bcz2;

[0080] The second calibration adjustment module collects the current ambient background light information through the optical filter installed on the detector, constructs the background light shielding coefficient Gzd, and uses the background light shielding coefficient Gzd as the second calibration command to perform real-time calibration on the second calibration light signal wavelength value bcz2, and obtains the third calibration light signal wavelength value bcz3;

[0081] The third calibration adjustment module collects the waveguide power data and constructs the waveguide efficiency coefficient Dbx according to the waveguide power data: if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, the third calibration command is triggered, and the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X, and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X for calibration to obtain the fourth calibration optical signal wavelength value bcz4;

[0082] The feedback and verification module monitors and records the results of each calibration step in real time, provides feedback, and repeats the initial steps to verify the calibration effect, ensuring that the detector works within the expected range after calibration.

[0083] (III) Beneficial effects

[0084] The present invention provides a 630nm silicon-based PIN detector calibration method and system applicable to a wide temperature range, which has the following beneficial effects:

[0085] (1) The system acquires the optical signal through the target signal acquisition unit and converts it into a digital signal, adds a timestamp, and then the data processing module performs waveform analysis on the original photoelectric signal sequence to calculate the first optical signal intensity difference G cz And generate a pre-calibration command. The signal analysis module further converts it to the frequency domain through Fourier transform to identify the wavelength peak coefficient K peak , triggering the first calibration mechanism command. The environmental monitoring module collects the environmental parameters around the detector in real time for calibration adjustment coefficient Xzx to ensure that the wavelength value of the second calibration optical signal reaches the expected value. If necessary, the second calibration adjustment module further calibrates using optical filters and background light shielding coefficients. The third calibration adjustment module makes a final adjustment to the optical signal wavelength based on the waveguide efficiency coefficient Gzd to improve the accuracy and reliability of optical signal detection.

[0086] (2) After the verification of the waveform analysis in S1 and the spectrum peak analysis in S2, the accurate processing and analysis of the original photoelectric signal of the detector is ensured. cz and wavelength peak factor K peak The preset threshold ensures that further calibration is performed only when necessary, thus avoiding unnecessary intervention and improving the accuracy of calibration and the stability of the system.

[0087] In step S3, by real-time monitoring of the temperature, humidity and air pressure around the detector, a calibration adjustment coefficient is constructed and applied to the calibration of the wavelength value bcz of the first optical signal. This step enables the detector to dynamically adjust its response to adapt to changes under different environmental conditions, thereby improving the applicability and stability of the detector over a wide temperature range.

[0088] If the second calibration light signal wavelength value bcz2 is less than expected, the background light of the surrounding environment is collected and analyzed in real time through step S4. The background light shielding coefficient Gzd is constructed and applied to the second calibration command, and the second calibration light signal wavelength value is calibrated in real time to obtain the third calibration light signal wavelength value bcz3. This process effectively suppresses the interference of background light and further improves the signal-to-noise ratio and detection accuracy of the detector.

[0089] In the final stage of the calibration step, the waveguide power data is collected, and the third calibration command is performed based on the analysis results of the waveguide efficiency coefficient Dbx. By calculating and applying the first waveguide calibration difference X, the third calibration optical signal wavelength value bcz3 is calibrated to obtain the fourth calibration optical signal wavelength value bcz4. This step optimizes the optical signal transmission efficiency of the waveguide and improves the sensitivity and detection performance of the overall system.

[0090] After the calibration step is completed, the S6 step is repeated to verify the stability of the detector's performance and the continued effectiveness of the calibration. This continuous optimization and verification process enables the detector to work stably in various environmental conditions for a long time, ensuring the reliability and durability of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0091] Figure 1 A schematic diagram of the steps of a 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to the present invention;

[0092] Figure 2 The present invention is a block diagram of a 630nm silicon-based PIN detector calibration system suitable for a wide temperature range. DETAILED DESCRIPTION

[0093] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0094] Example 1

[0095] See also Figure 1The present invention provides a 630nm silicon-based PIN detector calibration method suitable for a wide temperature range, comprising the following steps:

[0096] S1. Integrate the detector and the waveguide on a unified chip, package them, and use an analog-to-digital converter ADC to collect the original photoelectric signal sequence information in the detector according to a fixed time interval, including the optical signal intensity and timestamp; use the waveform analysis method to calculate the optical signal intensity difference between adjacent timestamps to construct a first optical signal intensity difference G. cz , if the first optical signal strength difference G cz When the abnormal threshold is exceeded, a first pre-calibration command is generated;

[0097] S2. After receiving the first pre-calibration command, the original photoelectric signal sequence information is converted into the frequency domain by applying Fourier transform FFT, and the wavelength peak coefficient K is constructed by obtaining the spectrum and statistically analyzing the change trend of the spectrum peak position and width. peak , determine whether further calibration and compensation are needed. If the wavelength peak coefficient K peak If the peak value threshold is exceeded, a first calibration mechanism command is triggered;

[0098] S3, after receiving the first calibration mechanism command, real-time monitoring is performed to obtain the first optical signal wavelength value bcz, and by installing a temperature sensor, a humidity sensor, and an air pressure sensor on the detector, real-time temperature value T, real-time humidity value S, and real-time air pressure value F of the current surrounding environment of the detector are collected in real time, and a calibration adjustment coefficient Xzx is constructed, and the calibration adjustment coefficient Xzx is directly multiplied by the first optical signal wavelength value bcz to perform calibration, and obtain the second calibration optical signal wavelength value bcz2;

[0099] S4. If the second calibration light signal wavelength value bcz2 is less than expected, the current ambient background light information is collected through the optical filter installed on the detector, the background light shielding coefficient Gzd is constructed, and the background light shielding coefficient Gzd is used as the second calibration command to calibrate the second calibration light signal wavelength value bcz2 in real time to obtain the third calibration light signal wavelength value bcz3;

[0100] S5. After calibration, repeat step S1 to verify. If the wavelength difference of the first optical signal G in S1 is cz When it still exceeds the normal threshold, the waveguide power data is collected, and the waveguide efficiency coefficient Dbx is constructed according to the waveguide power data: if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, the third calibration command is triggered, and the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X, and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X for calibration to obtain the fourth calibration optical signal wavelength value bcz4;

[0101] S6: If the third calibration optical signal wavelength value bcz3 is still less than expected, repeat steps S3-S5 until the first optical signal intensity difference G is greater than or equal to 0. cz Until it falls below the abnormal threshold.

[0102] In this embodiment, the waveform analysis in S1 and the spectrum peak analysis in S2 are verified to ensure accurate processing and analysis of the original photoelectric signal of the detector. cz and wavelength peak factor K peak The preset threshold ensures that further calibration is performed only when necessary, thus avoiding unnecessary intervention and improving the accuracy of calibration and the stability of the system.

[0103] In step S3, by real-time monitoring of the temperature, humidity and air pressure around the detector, a calibration adjustment coefficient is constructed and applied to the calibration of the wavelength value bcz of the first optical signal. This step enables the detector to dynamically adjust its response to adapt to changes under different environmental conditions, thereby improving the applicability and stability of the detector over a wide temperature range.

[0104] If the second calibration light signal wavelength value bcz2 is less than expected, the background light of the surrounding environment is collected and analyzed in real time through step S4. The background light shielding coefficient Gzd is constructed and applied to the second calibration command, and the second calibration light signal wavelength value is calibrated in real time to obtain the third calibration light signal wavelength value bcz3. This process effectively suppresses the interference of background light and further improves the signal-to-noise ratio and detection accuracy of the detector.

[0105] In the final stage of the calibration step, the waveguide power data is collected, and the third calibration command is performed based on the analysis results of the waveguide efficiency coefficient Dbx. By calculating and applying the first waveguide calibration difference X, the third calibration optical signal wavelength value bcz3 is calibrated to obtain the fourth calibration optical signal wavelength value bcz4. This step optimizes the optical signal transmission efficiency of the waveguide and improves the sensitivity and detection performance of the overall system.

[0106] After the calibration step is completed, the S6 step is repeated to verify the stability of the detector's performance and the continued effectiveness of the calibration. This continuous optimization and verification process enables the detector to work stably in various environmental conditions for a long time, ensuring the reliability and durability of the system.

[0107] Embodiment 2: This embodiment is an explanation of Embodiment 1. Specifically, S1 includes:

[0108] S11, using the analog-to-digital converter ADC to collect the light signal intensity I (t i and the corresponding timestamp t i, forming a photoelectric signal intensity sequence {I(t1),I(t2),...,I(t n ),} and the timestamp sequence {t1,t2,...,t n};

[0109] S12. For each adjacent timestamp pair (t i ,t i+1 ), calculate the optical signal intensity difference ΔI(t i ,t i+1 ):

[0110] ΔI(t i ,t i+1 )=I(t i+1 )-I(t i )

[0111] And construct the optical signal intensity difference sequence {ΔI(t1,t2),ΔI(t2,t3),...,ΔI(t n-1 ,t n )};

[0112] S13: construct a first optical signal strength difference G according to the optical signal strength difference sequence. cz :

[0113]

[0114] S14, if the first optical signal strength difference G cz : Exceeds the normal threshold ΔI threshold , a first pre-calibration command is generated.

[0115] In this embodiment, the system regularly samples the photodetector to obtain the intensity value of the optical signal and the corresponding timestamp. The optical signal intensity represents the light intensity received by the detector at each sampling time point, and the timestamp is used to identify the time point of each sampling, thereby forming a photoelectric signal intensity sequence and a timestamp sequence. The system processes the collected timestamp sequence and calculates the corresponding optical signal intensity difference for every two adjacent timestamps. The optical signal intensity difference represents the change in the optical signal intensity between adjacent time points, and is usually used to detect the change trend and abnormality of the optical signal. In this step, the system comprehensively considers the calculated optical signal intensity difference sequence and constructs a first optical signal intensity difference G. cz The first optical signal strength difference G cz It is a comprehensive statistic of the optical signal strength difference sequence, which is used to quantify the change of the optical signal. cz When the preset normal threshold is exceeded, it may indicate that there is an abnormal change in the optical signal received by the detector. In the last step, the system detects the difference in the intensity of the first optical signal G. czThe analysis result is used to determine whether the optical signal exceeds the preset normal variation range. cz If it does exceed the normal threshold, the system will generate the first pre-calibration command. This command usually triggers the subsequent calibration process or adjustment to correct the possible problems of the detector in optical signal detection and processing, so as to ensure the stability and accuracy of the system. Through the implementation of the above S1 step, the system can monitor and evaluate the intensity changes of the optical signal in real time, detect possible abnormalities in time, and generate corresponding pre-calibration commands. This process helps to improve the response speed and accuracy of the detector, and ensure its reliability and stability in complex environments. At the same time, the generation of pre-calibration commands also provides the necessary guidance and basis for subsequent calibration steps, effectively optimizing the performance of the overall optical signal processing system.

[0116] Embodiment 2: This embodiment is an explanation of Embodiment 1. Specifically, S2 includes:

[0117] S21, after receiving the first pre-calibration command, it indicates that there is an abnormality in the optical wave signal of the detector and the waveguide, and it is necessary to determine the judgment again. By applying Fourier transform FFT, the detector converts the original photoelectric signal sequence information into the frequency domain, and analyzes the change trend of the spectrum peak position and width through the spectrum diagram to construct the wavelength peak coefficient K peak ;

[0118] S22, the wavelength peak coefficient K peak Calculated by the following formula:

[0119]

[0120] In the formula, λ i is the i-th wavelength, I(λ i ) is the wavelength λ i The optical signal intensity at peak is the target peak wavelength, set to 630nm, FWHM represents the width of the peak in the spectrum, Δλ represents the wavelength sampling interval, N is the number of sampled wavelength points, and represents the total number of sampled wavelength points in the spectrum; It represents the sum of the optical signal intensities at all wavelengths and is used for normalization to represent the total optical signal intensity of the entire spectrum; is the target wavelength λ peak The optical signal strength at the user and the identification target wavelength, δ(λ i -λ peak ) is the Dirac pulse function, which represents the optical signal intensity at the target wavelength;

[0121] λ peakThe target peak wavelength is set to 630nm because the absorption coefficient of silicon varies with wavelength. Silicon has a high absorption coefficient for light with a wavelength between 400nm and 1100nm. For light with a wavelength of 630nm, silicon has a moderate absorption coefficient and can effectively absorb photons and generate electron-hole pairs. The band gap energy of silicon is about 1.12 electron volts, and the corresponding absorption edge is around 1100nm. The energy of a photon at 630nm (about 1.97 electron volts) is sufficient to cross the band gap of silicon, resulting in light absorption and carrier generation. The thickness of the I region and the doping concentration of the P and N regions of the PIN detector are optimized for a specific wavelength. For light with a wavelength of 630nm, these parameters can be designed just right so that photons can be effectively absorbed in the I region without being absorbed too much in the P or N regions. Some pollutants or chemicals have specific absorption characteristics at a wavelength of 630nm, which is convenient for detection and analysis; silicon materials have a moderate absorption coefficient and good photoelectric conversion efficiency at a wavelength of 630nm. The structure and design parameters of the detector (such as I zone thickness, P / N zone doping concentration, anti-reflection coating) are optimized for this wavelength. The 630nm wavelength is important in many application fields, which leads to a high demand for detectors in this wavelength range.

[0122] S23, the calculated wavelength peak coefficient K peak Compared with the peak threshold, if the wavelength peak factor K peak If the peak value threshold is exceeded, it is determined that the frequency characteristic of the optical signal is abnormal and needs further calibration, thus triggering a first calibration mechanism command;

[0123] If the wavelength peak factor K peak If the peak value threshold is not exceeded, the frequency characteristic of the optical signal is judged to be qualified and no additional calibration and compensation are required;

[0124] S24. When it is determined in S23 that the frequency characteristic of the optical signal is qualified, go to step S5.

[0125] In this embodiment, in this step, the system calculates the wavelength peak coefficient K peak Compare with the preset peak threshold. If the wavelength peak factor K peak If the wavelength peak coefficient K exceeds the set peak value, the system will determine that the frequency characteristics of the optical signal are abnormal and need to trigger the first calibration mechanism command for further calibration to correct the problem. peak If the peak value does not exceed the set threshold, it indicates that the frequency characteristics of the optical signal meet the requirements and no additional calibration and compensation are required. peak If the peak value does not exceed the peak threshold), the system will directly jump to step S5 to continue the subsequent verification and processing process.

[0126] Embodiment 3: This embodiment is an explanation of Embodiment 1. Specifically, S3 includes:

[0127] S31, installing a temperature sensor, a humidity sensor and an air pressure sensor on the detector, monitoring the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F of the environment around the detector in real time, and establishing a real-time environmental data set;

[0128] S32, performing a data cleaning step on the real-time environment data set: detecting and processing missing values, outliers or erroneous data; including filling missing values ​​and correcting outliers;

[0129] S33, converting the real-time temperature value T from Celsius to Fahrenheit, converting the real-time humidity value S from relative humidity to absolute humidity, converting the real-time air pressure value F to standard atmospheric pressure, and performing smoothing and normalization on the converted data.

[0130] S34, for the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F, respectively calculate the difference between the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F and the standard value, and obtain the first temperature difference ΔT, the second humidity difference ΔS and the third air pressure difference ΔF:

[0131] ΔT=|TT std |;

[0132] ΔS=|SS std |;

[0133] ΔF=|FF std |;

[0134] Where, T std Indicates the standard temperature threshold, S std Indicates the standard humidity threshold, F std Indicates the standard air pressure threshold;

[0135] S35. Calculate the temperature change rate Humidity change rate and the rate of change of air pressure

[0136]

[0137] Wherein, ΔT represents the first temperature difference, which represents the deviation between the current ambient temperature and the standard temperature threshold, ΔT preev is the ambient temperature deviation at the previous time point, and Δt is the time interval between two measurements; Indicates the rate of change of the ambient temperature from the standard value; if this value is positive, it means that the speed of the temperature deviation from the standard value is increasing; if it is negative, it means that the speed is decreasing; if it is zero, it means that the speed of the temperature deviation from the standard value remains unchanged;

[0138]

[0139] Wherein, ΔS represents the second humidity difference, which indicates the deviation of the current ambient humidity from the standard humidity threshold. ΔS preev is the ambient humidity deviation at the previous time point, and Δt is the time interval between two measurements; Indicates the rate of change of ambient humidity from the standard value; similar to temperature, a positive value indicates that the speed at which humidity deviates from the standard value is increasing, a negative value indicates that the speed is decreasing, and a zero value indicates that the speed remains unchanged;

[0140]

[0141] Wherein, ΔF represents the third air pressure difference, which indicates the deviation of the current ambient air pressure from the standard air pressure threshold. ΔF preev is the ambient pressure deviation at the previous time point, and Δt is the time interval between two measurements; Indicates the rate of change of the ambient air pressure from the standard value; similarly, a positive value indicates that the speed at which the air pressure deviates from the standard value is increasing, a negative value indicates that the speed is decreasing, and a zero value indicates that the speed remains unchanged;

[0142] S36. Calculate the calibration adjustment coefficient Xzx:

[0143]

[0144] In the formula, represents the rate of temperature change, represents the humidity change rate, represents the rate of change of air pressure, Cr is the first correction constant, Cs is the second correction constant, CF is the third correction constant, wr, ws and wF are weight values.

[0145] In this embodiment, by implementing the above S3 step, the system can monitor the temperature, humidity and air pressure of the environment around the detector in real time, and perform detailed analysis and processing on these environmental parameters. The calculated difference and rate of change of temperature, humidity and air pressure, as well as the final calibration adjustment coefficient, can provide real-time environmental compensation for the detector, thereby effectively eliminating the influence of environmental factors on the measurement of optical signals. Doing so can greatly improve the performance stability and measurement accuracy of the detector in complex environments, and ensure its long-term reliable operation.

[0146] Embodiment 4: This embodiment is an explanation of Embodiment 1. Specifically, the background light shielding coefficient Gzd is obtained by the following formula:

[0147]

[0148] In the formula, I total Indicates the target optical signal strength, Isignal Represents the total strategic light intensity, including background light and target light signal, I total -I signal represents the background light intensity, K represents the correction factor of the optical system;

[0149] The third calibration optical signal wavelength value bcz3 is obtained by real-time calibration using the following formula:

[0150] bcz3=bcz2×(1-Gzd).

[0151] In this embodiment, the optical filter installed on the detector will be used to collect background light information in the current environment. This information includes background light signals generated by natural light and other light sources in the environment. The background light shielding coefficient Gzd is calculated by the collected background light information. This coefficient reflects the shielding effect of background light on the intensity of the target light signal. Usually, this coefficient is obtained by the ratio of the background light intensity to the target light signal intensity, taking into account the correction factor K of the optical system. The background light shielding coefficient Gzd is applied as the second calibration command to the wavelength value bcz2 of the light signal after the second calibration. This means that the system will adjust or correct bcz2 to compensate for the influence of the background light on the signal, thereby obtaining a more accurate third calibration light signal wavelength value bcz3. Through the execution of the above S4 step, the system can respond immediately and perform real-time calibration when it is detected that the wavelength value bcz2 of the light signal after the second calibration is not up to standard. Collecting and processing the ambient background light information and adjusting bcz2 according to the background light shielding coefficient Gzd can effectively reduce the influence of background light on the signal measurement accuracy. This real-time calibration strategy can improve the accuracy and stability of the detector and ensure its reliability and long-term performance in complex environments.

[0152] Embodiment 5: This embodiment is an explanation of Embodiment 1. Specifically, the steps for obtaining the waveguide efficiency coefficient Dbx are as follows:

[0153] First obtain the internal reflectivity R int , internal reflectivity R int It is caused by reflection between different interfaces inside the waveguide. It is assumed that there are multiple interfaces i inside the waveguide, and the reflectivity of each interface i is Ri. The internal reflectivity R is calculated by the following formula int :

[0154]

[0155] Where M is the number of internal interfaces;

[0156] External reflectivity R extis the reflectivity between the waveguide and the external environment. It is a separate value representing the reflection value between the outer surface of the waveguide and the air or other medium. Multiple reflections will cause the optical signal to be repeatedly reflected inside the waveguide, forming an attenuation coefficient α, which is expressed by the following formula:

[0157] α=1-R int ;

[0158] The attenuation after each reflection is expressed as the sum of geometric series R multi :

[0159]

[0160] Then calculate the total reflectivity R abs :

[0161] R abs =R ext +R multi -R ext *R multi

[0162] Finally, the waveguide efficiency coefficient Dbx is generated by the following formula:

[0163]

[0164] Where, T abs is the power absorbed in the waveguide, R abs It represents the total reflectivity. The waveguide efficiency coefficient Dbx characterizes the transmission efficiency of the waveguide and reflects the effective transmission capacity of the optical signal inside the waveguide. By comprehensively considering the influence of internal reflectivity, external reflectivity and multiple reflections, the waveguide efficiency coefficient Dbx represents the performance stability and transmission efficiency of the waveguide under different conditions.

[0165] Specifically, if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, it indicates that the waveguide efficiency is insufficient and unqualified, triggering the third calibration command, then the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X: X=D-Dbx; and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X, bcz4=bcz3×X for calibration, to obtain the fourth calibration optical signal wavelength value bcz4;

[0166] If the waveguide efficiency coefficient Dbx is greater than or equal to the standard waveguide threshold D, it means that the waveguide is within the expected qualified efficiency and no further calibration is required.

[0167] In this embodiment, Dbx reflects the transmission efficiency of the optical signal inside the waveguide. When Dbx is less than the standard waveguide threshold D, it means that the optical signal transmission efficiency of the waveguide is insufficient and calibration is required to improve performance. If Dbx is less than the standard waveguide threshold D, the system will trigger the third calibration command. At this time, the difference X between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated, and the third calibration optical signal wavelength value bcz3 is multiplied by X for calibration to obtain the fourth calibration optical signal wavelength value bcz4. If Dbx is greater than or equal to the standard waveguide threshold D, it means that the waveguide is within the expected transmission efficiency range and no additional calibration is required. This ensures that unnecessary calibration operations are avoided when the performance is stable, thereby improving the efficiency and reliability of the system. If Dbx is greater than or equal to the standard waveguide threshold D, it means that the waveguide is within the expected transmission efficiency range and no additional calibration is required. This ensures that unnecessary calibration operations are avoided when the performance is stable, thereby improving the efficiency and reliability of the system.

[0168] Example 6, please refer to Figure 2 , a 630nm silicon-based PIN detector calibration system suitable for a wide temperature range, comprising,

[0169] The target signal acquisition unit receives the optical signal and converts it into an electrical signal, converts the analog electrical signal generated by the detector into a digital signal, and adds a time stamp;

[0170] The data processing module collects the original photoelectric signal sequence information in the detector according to the fixed time interval method, including the light signal intensity and timestamp; calculates the light signal intensity difference using the waveform analysis method to construct the first light signal intensity difference G cz , store the original photoelectric signal sequence, timestamp and optical signal strength difference; if the first optical signal strength difference G cz When the abnormal threshold is exceeded, a first pre-calibration command is generated;

[0171] Further, after receiving the first pre-calibration command, the signal analysis module converts the original photoelectric signal sequence information into the frequency domain by applying Fourier transform FFT, obtains the spectrum, and statistically calculates the change trend of the spectrum peak position and width to construct the wavelength peak coefficient K. peak , determine whether further calibration and compensation are needed. If the wavelength peak coefficient K peak If the peak value threshold is exceeded, a first calibration mechanism command is triggered;

[0172] The environment monitoring module, after receiving the first calibration mechanism command, monitors and obtains the first optical signal wavelength value bcz in real time, and collects and obtains the real-time temperature value T, real-time humidity value S and real-time pressure value F of the current surrounding environment of the detector in real time by installing a temperature sensor, a humidity sensor and an air pressure sensor on the detector;

[0173] A first calibration adjustment module constructs a calibration adjustment coefficient Xzx, and directly multiplies the calibration adjustment coefficient Xzx by the first optical signal wavelength value bcz to perform calibration, thereby obtaining a second calibration optical signal wavelength value bcz2;

[0174] The second calibration adjustment module collects the current ambient background light information through the optical filter installed on the detector, constructs the background light shielding coefficient Gzd, and uses the background light shielding coefficient Gzd as the second calibration command to perform real-time calibration on the second calibration light signal wavelength value bcz2, and obtains the third calibration light signal wavelength value bcz3;

[0175] The third calibration adjustment module collects the waveguide power data and constructs the waveguide efficiency coefficient Dbx according to the waveguide power data: if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, the third calibration command is triggered, and the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X, and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X for calibration to obtain the fourth calibration optical signal wavelength value bcz4;

[0176] The feedback and verification module monitors and records the results of each calibration step in real time, provides feedback, and repeats the initial steps to verify the calibration effect, ensuring that the detector works within the expected range after calibration.

[0177] In this embodiment, this 630nm silicon-based PIN detector calibration system suitable for a wide temperature range achieves accurate optical signal calibration through multi-module collaboration. The system first acquires the optical signal through the target signal acquisition unit and converts it into a digital signal, attaches a timestamp, and then the data processing module performs waveform analysis on the original photoelectric signal sequence, calculates the optical signal intensity difference and generates a pre-calibration command. Further, the signal analysis module converts to the frequency domain through Fourier transform, identifies the spectral peak, and triggers the calibration mechanism command. The environmental monitoring module collects the environmental parameters around the detector in real time for calibration adjustment coefficients to ensure that the wavelength value of the second calibration optical signal reaches the expected value. If necessary, the second calibration adjustment module uses optical filters and background light shielding coefficients for further calibration. Finally, the third calibration adjustment module makes a final adjustment to the wavelength of the optical signal based on the waveguide efficiency coefficient, while the feedback and verification module ensures the calibration effect and records the results. By integrating the functions of each module, the system can ensure that the detector works stably over a wide temperature range and improve the accuracy and reliability of optical signal detection.

[0178] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A 630nm silicon-based PIN detector calibration method suitable for a wide temperature range, characterized in that: The following steps are involved: S1. Integrate the detector and the waveguide on a unified chip, package them, and use an analog-to-digital converter ADC to collect the original photoelectric signal sequence information in the detector at a fixed time interval, including the optical signal intensity and timestamp; The optical signal strength difference between adjacent timestamps is calculated using the waveform analysis method to construct the first optical signal strength difference G cz , if the first optical signal strength difference G cz When the abnormal threshold is exceeded, a first pre-calibration command is generated; S2. After receiving the first pre-calibration command, the original photoelectric signal sequence information is converted into the frequency domain by applying Fourier transform FFT, and the wavelength peak coefficient K is constructed by obtaining the spectrum and statistically analyzing the change trend of the spectrum peak position and width. peak , determine whether further calibration and compensation are needed. If the wavelength peak coefficient K peak If the peak value threshold is exceeded, a first calibration mechanism command is triggered; S3, after receiving the first calibration mechanism command, real-time monitoring is performed to obtain the first optical signal wavelength value bcz, and by installing a temperature sensor, a humidity sensor, and an air pressure sensor on the detector, real-time temperature value T, real-time humidity value S, and real-time air pressure value F of the current surrounding environment of the detector are collected in real time, and a calibration adjustment coefficient Xzx is constructed, and the calibration adjustment coefficient Xzx is directly multiplied by the first optical signal wavelength value bcz to perform calibration, and obtain the second calibration optical signal wavelength value bcz2; S4. If the second calibration light signal wavelength value bcz2 is less than expected, the current ambient background light information is collected through the optical filter installed on the detector, the background light shielding coefficient Gzd is constructed, and the background light shielding coefficient Gzd is used as the second calibration command to calibrate the second calibration light signal wavelength value bcz2 in real time to obtain the third calibration light signal wavelength value bcz3; S5. After calibration, repeat step S1 for verification. If the wavelength difference Gcz of the first optical signal in S1 still exceeds the normal threshold, collect the waveguide power data, and construct the waveguide efficiency coefficient Dbx based on the waveguide power data: if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, trigger the third calibration command, calculate the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D, obtain the first waveguide calibration difference X, multiply the third calibration optical signal wavelength value bcz3 by the first waveguide calibration difference X, perform calibration, and obtain the fourth calibration optical signal wavelength value bcz4; S6: If the third calibration optical signal wavelength value bcz3 is still less than expected, repeat steps S3-S5 until the first optical signal intensity difference G is greater than or equal to 0. cz Until it falls below the abnormal threshold.

2. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 1, characterized in that: The S1 includes: S11, using the analog-to-digital converter ADC to collect the light signal intensity I (t i ) and the corresponding timestamp t i , forming a photoelectric signal intensity sequence {I(t1), I(t2), ..., I(t n ),} and the timestamp sequence {t1, t2, ..., t n }; S12. For each adjacent timestamp pair (t i , t i+1 ), calculate the optical signal intensity difference ΔI(t i , t i+1 ): ΔI(t i ,t i+1 )=I(t i+1 )-I(t i ) And construct the optical signal intensity difference sequence {ΔI(t1, t2), ΔI(t2, t3), ..., ΔI(t n-1 , t n )}; S13: construct a first optical signal strength difference G according to the optical signal strength difference sequence. cz :

3. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 2, characterized in that: The S1 further comprises: S14, if the first optical signal strength difference G cz : Exceeds the normal threshold ΔI threshold , a first pre-calibration command is generated.

4. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 1, characterized in that: The S2 includes: S21, after receiving the first pre-calibration command, it indicates that there is an abnormality in the optical wave signal of the detector and the waveguide, and it is necessary to determine the judgment again. By applying Fourier transform FFT, the detector converts the original photoelectric signal sequence information into the frequency domain, and analyzes the change trend of the spectrum peak position and width through the spectrum diagram to construct the wavelength peak coefficient K peak ; S22, the wavelength peak coefficient K peak Calculated by the following formula: In the formula, λ i is the i-th wavelength, I(λ i ) is the wavelength λ i The optical signal intensity at peak is the target peak wavelength, set to 630nm, FWHM represents the width of the peak in the spectrum, Δλ represents the wavelength sampling interval, N is the number of sampled wavelength points, and represents the total number of sampled wavelength points in the spectrum; It represents the sum of the optical signal intensities at all wavelengths and is used for normalization to represent the total optical signal intensity of the entire spectrum; is the target wavelength λ peak The optical signal intensity at i -λ peak ) is the Dirac pulse function, which represents the optical signal intensity at the target wavelength; S23, the calculated wavelength peak coefficient K peak Compared with the peak threshold, if the wavelength peak factor K peak If the peak value threshold is exceeded, it is determined that the frequency characteristic of the optical signal is abnormal and needs further calibration, thus triggering a first calibration mechanism command; If the wavelength peak factor K peak If the peak value threshold is not exceeded, the frequency characteristic of the optical signal is judged to be qualified and no additional calibration and compensation are required; S24. When it is determined in S23 that the frequency characteristic of the optical signal is qualified, go to step S5.

5. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 1, characterized in that: The S3 includes: S31, installing a temperature sensor, a humidity sensor and an air pressure sensor on the detector, monitoring the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F of the environment around the detector in real time, and establishing a real-time environmental data set; S32, performing a data cleaning step on the real-time environment data set: detecting and processing missing values, outliers or erroneous data; including filling missing values ​​and correcting outliers; S33, converting the real-time temperature value T from Celsius to Fahrenheit, converting the real-time humidity value S from relative humidity to absolute humidity, converting the real-time air pressure value F to standard atmospheric pressure, and performing smoothing and normalization on the converted data.

6. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 5, characterized in that: The S3 further includes: S34, for the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F, respectively calculate the difference between the real-time temperature value T, the real-time humidity value S and the real-time air pressure value F and the standard value, and obtain the first temperature difference ΔT, the second humidity difference ΔS and the third air pressure difference ΔF: ΔT=|T-T std |; ΔS=|S-S std |; ΔF=|F-F std |; Where, T std Indicates the standard temperature threshold, S std Indicates the standard humidity threshold, F std Indicates the standard air pressure threshold; S35. Calculate the temperature change rate Humidity change rate and the rate of change of air pressure Wherein, ΔT represents the first temperature difference, which represents the deviation between the current ambient temperature and the standard temperature threshold, ΔT preev是 The ambient temperature deviation at the last time point, Δt is the time interval between two measurements; Wherein, ΔS represents the second humidity difference, which indicates the deviation of the current ambient humidity from the standard humidity threshold, ΔS preev is the ambient humidity deviation at the previous time point, and Δt is the time interval between two measurements; Wherein, ΔF represents the third air pressure difference, which indicates the deviation of the current ambient air pressure from the standard air pressure threshold. ΔF preev is the ambient pressure deviation at the previous time point, and Δt is the time interval between two measurements; S36. Calculate the calibration adjustment coefficient Xzx: In the formula, represents the rate of temperature change, represents the humidity change rate, represents the air pressure change rate, Cr is the first correction constant, Cs is the second correction constant, CF is the third correction constant, wr, ws and wF are weight values.

7. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 1, characterized in that: The background light shielding coefficient Gzd is obtained by the following formula: In the formula, I total Indicates the target optical signal strength, I signal Represents the total strategic light intensity, including background light and target light signal, I total -I signal represents the background light intensity, K represents the correction factor of the optical system; The third calibration optical signal wavelength value bcz3 is obtained by real-time calibration using the following formula: bcz3=bcz2×(1-Gzd).

8. The 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 1, characterized in that: The steps for obtaining the waveguide efficiency coefficient Dbx are as follows: First obtain the internal reflectivity R int , internal reflectivity R int It is caused by reflection between different interfaces inside the waveguide. It is assumed that there are multiple interfaces i inside the waveguide, and the reflectivity of each interface i is Ri. The internal reflectivity R is calculated by the following formula int : Where M is the number of internal interfaces; External reflectivity R ext is the reflectivity between the waveguide and the external environment. It is a separate value representing the reflection value between the outer surface of the waveguide and the air or other medium. Multiple reflections will cause the optical signal to be repeatedly reflected inside the waveguide, forming an attenuation coefficient α, which is expressed by the following formula: α＝1-R int ； The attenuation after each reflection is expressed as the sum of geometric series R multi : Then calculate the total reflectivity R abs : R abs =R ext +R multi -R ext *R multi Finally, the waveguide efficiency coefficient Dbx is generated by the following formula: Where, T abs is the power absorbed in the waveguide, R abs It represents the total reflectivity. The waveguide efficiency coefficient Dbx characterizes the transmission efficiency of the waveguide and reflects the effective transmission capacity of the optical signal inside the waveguide. By comprehensively considering the influence of internal reflectivity, external reflectivity and multiple reflections, the waveguide efficiency coefficient Dbx represents the performance stability and transmission efficiency of the waveguide under different conditions.

9. A 630nm silicon-based PIN detector calibration method applicable to a wide temperature range according to claim 8, characterized in that: If the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, it means that the waveguide efficiency is insufficient and unqualified, triggering the third calibration command, then the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X: X=D-Dbx; and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X, bcz4=bcz3×X for calibration, to obtain the fourth calibration optical signal wavelength value bcz4; If the waveguide efficiency coefficient Dbx is greater than or equal to the standard waveguide threshold D, it means that the waveguide is within the expected qualified efficiency and no further calibration is required.

10. A 630nm silicon-based PIN detector calibration system applicable to a wide temperature range, applied to a 630nm silicon-based PIN detector calibration method applicable to a wide temperature range as claimed in any one of claims 1 to 9, characterized in that: include, The target signal acquisition unit receives the optical signal and converts it into an electrical signal, converts the analog electrical signal generated by the detector into a digital signal, and adds a time stamp; The data processing module collects the original photoelectric signal sequence information in the detector according to a fixed time interval, including the light signal intensity and time stamp; The optical signal strength difference is calculated by using the waveform analysis method to construct the first optical signal strength difference G cz , storing the original photoelectric signal sequence, timestamp and optical signal intensity difference; If the first optical signal strength difference G cz When the abnormal threshold is exceeded, a first pre-calibration command is generated; Further, after receiving the first pre-calibration command, the signal analysis module converts the original photoelectric signal sequence information into the frequency domain by applying Fourier transform FFT, obtains the spectrum, and statistically calculates the change trend of the spectrum peak position and width to construct the wavelength peak coefficient K. peak , determine whether further calibration and compensation are needed. If the wavelength peak coefficient K peak If the peak value threshold is exceeded, a first calibration mechanism command is triggered; The environment monitoring module, after receiving the first calibration mechanism command, monitors and obtains the first optical signal wavelength value bcz in real time, and collects and obtains the real-time temperature value T, real-time humidity value S and real-time pressure value F of the current surrounding environment of the detector in real time by installing a temperature sensor, a humidity sensor and an air pressure sensor on the detector; A first calibration adjustment module constructs a calibration adjustment coefficient Xzx, and directly multiplies the calibration adjustment coefficient Xzx by the first optical signal wavelength value bcz to perform calibration, thereby obtaining a second calibration optical signal wavelength value bcz2; The second calibration adjustment module collects the current ambient background light information through the optical filter installed on the detector, constructs the background light shielding coefficient Gzd, and uses the background light shielding coefficient Gzd as the second calibration command to perform real-time calibration on the second calibration light signal wavelength value bcz2, and obtains the third calibration light signal wavelength value bcz3; The third calibration adjustment module collects the waveguide power data and constructs the waveguide efficiency coefficient Dbx according to the waveguide power data: if the waveguide efficiency coefficient Dbx is less than the standard waveguide threshold D, the third calibration command is triggered, and the difference between the waveguide efficiency coefficient Dbx and the standard waveguide threshold D is calculated to obtain the first waveguide calibration difference X, and the third calibration optical signal wavelength value bcz3 is multiplied by the first waveguide calibration difference X for calibration to obtain the fourth calibration optical signal wavelength value bcz4; The feedback and verification module monitors and records the results of each calibration step in real time, provides feedback, and repeats the initial steps to verify the calibration effect, ensuring that the detector works within the expected range after calibration.

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