A method for monitoring thermal defects of power transformation equipment

Abstract

The application discloses a kind of power transformation equipment thermal defect monitoring methods, it is related to the technical field of fault detection, including the following steps, setting quantitative parameter, test obtains the dielectric loss factor information of equipment element, first PFM amplitude offset and second PFM amplitude offset are calculated, weighted calculation obtains integrated PFM amplitude offset, setting PFM amplitude offset threshold, the thermal defect of equipment element is classified, obtains equipment element thermal defect grade.The application can comprehensively evaluate the state of equipment element by combining temperature, dielectric loss factor and PFM amplitude, identify potential thermal defects, use mean square deviation as quantitative parameter, can more accurately monitor temperature fluctuation, optimize the operating conditions of equipment and improve monitoring accuracy by amplitude control of PFM signal, the collection of environmental information and the matching of difference value improve detection efficiency and accuracy, by thermal defect classification, it is convenient to take maintenance measures in time early warning, improve the operating reliability and safety of equipment.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of fault detection, in particular to a power transformation equipment thermal defect monitoring method. BACKGROUND

[0002] With the rapid development of electric power construction, the scale of power grid is expanding. In many aspects, the construction and equipment maintenance of power grid are becoming more and more frequent. Substation integrated automation is to use microcomputer technology to combine and optimize the functions of power transformation equipment (including measuring instruments, signal systems, relay protection, automatic devices and remote control devices, etc.), to realize the automatic monitoring, measurement, automatic control and microcomputer protection of the main equipment and transmission and distribution lines of the substation, as well as the integrated automation functions of dispatching communication.

[0003] At present, in the Chinese invention patent with the publication number CN 114018983 A, a power transformation equipment thermal defect prediction method, equipment and storable medium are disclosed, which obtains three-phase temperature measurement values of a part to be tested in the power transformation equipment through an infrared thermal imaging picture, corrects the three-phase temperature measurement values of the part to be tested according to environmental factors to obtain three-phase temperature correction values, and predicts thermal defects of the part to be tested according to the three-phase temperature correction values. However, in the related technology, the independent elements of the power transformation equipment are not evaluated for thermal defects, the monitoring is not detailed enough, and it is not checked whether the equipment needs to be repaired, which may lead to invalid evaluation and increase the amount of calculation. SUMMARY

[0004] The technical problem solved by the present application is that in the related technology, the independent elements of the power transformation equipment are not evaluated for thermal defects, the monitoring is not detailed enough, and it is not checked whether the equipment needs to be repaired, which may lead to invalid evaluation and increase the amount of calculation.

[0005] To solve the above technical problems, the present application provides the following technical solution: a power transformation equipment thermal defect monitoring method, comprising the following steps:

[0006] Step S100, the equipment is divided to obtain equipment elements, the equipment elements are numbered, the temperature of the numbered equipment elements is collected in a first time period, recorded as a first temperature, the mean value and the mean square deviation of the first temperature are calculated, and the mean square deviation is set as a quantization parameter;

[0007] Step S200, the medium loss factor information of the equipment elements is tested, the equipment element replacement signal is generated according to the medium loss factor information, the collection signal is sent after the maintenance personnel complete the replacement, the operation information corresponding to the temperature of the equipment elements in the first time period is collected, the first mapping relationship between the operation information and the quantization parameter is established, the first PFM amplitude control signal is sent, the operation information is controlled according to the corresponding quantization parameter of the operation information, and the first PFM amplitude offset is obtained.

[0008] Step S300, collect environmental information, match the difference value corresponding to the running information, obtain the quantization parameter corresponding to the difference value according to the difference value and the first mapping relationship, send the second PFM amplitude control signal, control the running information according to the quantization parameter corresponding to the difference value, and obtain the second PFM amplitude offset, calculate the first PFM amplitude offset and the second PFM amplitude offset, and obtain the comprehensive PFM amplitude offset;

[0009] Step S400, set the PFM amplitude offset threshold, and grade the thermal defects of the device element according to the PFM amplitude offset threshold and the comprehensive PFM amplitude offset, and obtain the device element thermal defect grade.

[0010] As a preferred scheme of the power transformation equipment thermal defect monitoring method, wherein: the step S100 comprises the following sub-steps:

[0011] Step S101, according to the components of the device, the device is divided into device elements, the device element includes transformer element, circuit breaker element, disconnecting switch element, bus element and cable element;

[0012] Step S102, number the device element, the number is a natural number, and the label of the device element is represented as X N , N is a natural number and N is distributed in [1, 5];

[0013] Step S103, collect the temperature of the numbered device element in the first time period, denoted as the first temperature, calculate the mean and mean square deviation of the first temperature, the mean and mean square deviation are the average value of the device element temperature in the first time period, and the average variance of the device element temperature in the first time period, used to represent the fluctuation degree of the device element temperature, and set the mean square deviation as the quantization parameter.

[0014] As a preferred scheme of the power transformation equipment thermal defect monitoring method, wherein: the step S200 comprises the following sub-steps:

[0015] Step S201, test the device element by the tester, obtain the dielectric loss factor information of the device element, obtain the device element type, call the device element database, input the device element type into the device element database, obtain the critical dielectric loss factor, compare the dielectric loss factor information with the critical dielectric loss factor, and generate and send the device element replacement signal when the dielectric loss factor information is greater than the critical dielectric loss factor, otherwise, send the collection signal;

[0016] Step S202, when the device element replacement signal is sent, the maintenance personnel replace the device element, and after the maintenance personnel finish replacing, a collection signal is sent to collect the running information corresponding to the temperature of the device element in the first time period, and the running information includes sound information and current information;

[0017] Step S203, a first mapping relationship between the running information and the quantization parameter is established, the running information is acquired, the quantization parameter corresponding to the running information is acquired according to the first mapping relationship, and a first PFM amplitude control signal is sent;

[0018] Step S204, the running information is first controlled according to the quantization parameter corresponding to the running information, and a first PFM amplitude offset is obtained.

[0019] As a preferred scheme of the power transformation equipment thermal defect monitoring method, the generation logic of the device element replacement signal includes:

[0020] The device element type is acquired, the device element database is called, the device element type is input into the device element database, the critical medium loss factor is acquired, the medium loss factor information is compared with the critical medium loss factor, when the medium loss factor information is greater than the critical medium loss factor, the device element replacement signal is generated and sent, otherwise, the collection signal is sent.

[0021] As a preferred scheme of the power transformation equipment thermal defect monitoring method, the calculation logic of the first PFM amplitude offset includes:

[0022] The first value is set as a quantization parameter threshold, the quantization parameter corresponding to the running information is acquired and recorded as a current quantization parameter, the PFM amplitude corresponding to the current quantization parameter is acquired and recorded as a first amplitude, the PFM amplitude is continuously controlled, when the current quantization parameter is equal to the quantization parameter threshold, the PFM amplitude corresponding to the controlled current quantization parameter is recorded as, recorded as a second amplitude, the difference between the first amplitude and the second amplitude is calculated, and the difference between the first amplitude and the second amplitude is set as the first PFM amplitude offset.

[0023] As a preferred scheme of the power transformation equipment thermal defect monitoring method, the step S300 includes the following sub-steps:

[0024] S301, environmental information is collected, and the environmental information includes environmental temperature and environmental humidity;

[0025] Step S302, an environment database is called, the environmental information is input into the environment database, and a difference value corresponding to the environmental information under the running information is matched, and the difference value corresponding to the environmental information under the running information indicates that the difference between the monitored running information and the actual running information under the environmental information.

[0026] Step S303, the difference value is taken as a running parameter, a first mapping relationship is obtained, a quantization parameter corresponding to the difference value is obtained according to the first mapping relationship, a second PFM amplitude control signal is sent, and the generation logic of the second PFM amplitude control signal is the same as that of the first PFM amplitude control signal.

[0027] Step S304, the running information is controlled according to the quantization parameter corresponding to the difference value, and a second PFM amplitude offset is obtained, the second PFM amplitude offset is added to the first PFM amplitude offset, and a comprehensive PFM amplitude offset is obtained.

[0028] As a preferred scheme of the power transformation equipment thermal defect monitoring method, the step S400 comprises the following sub-steps:

[0029] Step S401, the second value and the third value are set as a PFM amplitude offset first threshold value and a PFM amplitude offset second threshold value, and the second value is less than the third value.

[0030] Step S402, the thermal defects of the equipment element are classified according to the PFM amplitude offset threshold value and the comprehensive PFM amplitude offset, and an equipment element thermal defect grade is obtained, and the equipment element thermal defect grade comprises a first defect grade, a second defect grade and a third defect grade.

[0031] As a preferred scheme of the power transformation equipment thermal defect monitoring method, the classification logic of the thermal defect grade comprises:

[0032] The comprehensive PFM amplitude offset, the second value and the third value are obtained, when the comprehensive PFM amplitude offset is less than or equal to the second value, the thermal defect grade is set as the first defect grade, when the comprehensive PFM amplitude offset is greater than the second value and less than the third value, the thermal defect grade is set as the second defect grade, and when the comprehensive PFM amplitude offset is greater than the third value, the thermal defect grade is set as the third defect grade.

[0033] In a second aspect, the present application provides an electronic device, comprising a storage, a processor and a computer readable instruction stored in the storage, when the computer readable instruction is executed by the processor, the steps in the method according to any one of the above aspects are executed.

[0034] In a third aspect, the present application provides a storage medium, which stores a computer program, when the computer program is executed by a processor, the steps in the method according to any one of the above aspects are executed.

[0035] The application has the beneficial effects that: by combining temperature, medium loss factor and PFM amplitude, the state of the equipment element can be comprehensively evaluated, potential thermal defects can be identified, by using mean square deviation as a quantitative parameter, temperature fluctuations can be more accurately monitored, and temperature abnormalities of the equipment element can be identified, by regulating the amplitude of the PFM signal, the running state of the equipment can be adjusted in real time, the running conditions of the equipment can be optimized, and the monitoring accuracy can be improved, the collection of environmental information and the matching of difference values can make the monitoring result more accurate, avoid the interference of environmental changes on the detection result, the generation of the equipment element replacement signal and the regulation of the PFM signal can realize the automation of the monitoring process, improve the detection efficiency and accuracy, by dividing the thermal defect level, timely warning and maintenance measures can be taken, and the running reliability and safety of the equipment can be improved. BRIEF DESCRIPTION OF DRAWINGS

[0036] Figure 1 A basic flowchart of a power transformation equipment thermal defect monitoring method provided by an embodiment of the application is shown. DETAILED DESCRIPTION

[0037] In order to make the above-mentioned objects, features and advantages of the application more obvious and easy to understand, the specific embodiments of the application will be described in detail below with reference to the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the application, rather than all the embodiments.

[0038] Embodiment 1, refer to Figure 1 For an embodiment of the application, a power transformation equipment thermal defect monitoring method is provided, which includes the following steps:

[0039] Step S100, the equipment is divided to obtain equipment elements, the equipment elements are numbered, the temperature of the numbered equipment elements is collected in a first time period, which is recorded as a first temperature, the mean value and the mean square deviation of the first temperature are calculated, and the mean square deviation is set as a quantitative parameter;

[0040] Step S200, medium loss factor information of the equipment element is obtained by testing, the equipment element replacement signal is generated according to the medium loss factor information, the collection signal is sent after the maintenance personnel complete the replacement, the running information corresponding to the temperature of the equipment element in the first time period is collected, the first mapping relationship between the running information and the quantitative parameter is established, the first PFM amplitude regulation signal is sent, the running information is controlled according to the quantitative parameter corresponding to the running information, and the first PFM amplitude offset is obtained;

[0041] Step S300, collect environmental information, match the difference value corresponding to the running information, obtain the quantization parameter corresponding to the difference value according to the first mapping relationship, send the second PFM amplitude control signal, control the running information according to the quantization parameter corresponding to the difference value, and obtain the second PFM amplitude offset, and the first PFM amplitude offset and the second PFM amplitude offset are weighted and calculated to obtain the comprehensive PFM amplitude offset.

[0042] Step S400, set the PFM amplitude offset threshold, and grade the thermal defects of the device element according to the PFM amplitude offset threshold and the comprehensive PFM amplitude offset, to obtain the device element thermal defect grade.

[0043] The present application can comprehensively evaluate the state of the device element by combining temperature, medium loss factor and PFM amplitude, identify potential thermal defects, use mean square error as a quantitative parameter to more accurately monitor temperature fluctuations and identify temperature abnormalities of the device element, adjust the running state of the device in real time through the amplitude control of the PFM signal, optimize the running conditions of the device and improve the monitoring accuracy, the collection of environmental information and the matching of difference value can make the monitoring result more accurate, avoid the interference of environmental change on the detection result, the generation of device element replacement signal and the regulation of PFM signal can realize the automation of the monitoring process, improve the detection efficiency and accuracy, and through the thermal defect grade division, it is convenient to take timely warning and maintenance measures, and improve the operation reliability and safety of the device.

[0044] The step S100 comprises the following sub-steps:

[0045] Step S101, according to the components of the device, the device is divided to obtain the device element, the device element includes transformer element, circuit breaker element, disconnecting switch element, bus element and cable element;

[0046] Step S102, number the device element, the number is a natural number, and the label of the device element is represented as X N , N is a natural number and N is distributed between [1, 5];

[0047] Step S103, collect the temperature of the numbered device element in the first time period, denoted as the first temperature, calculate the mean and mean square error of the first temperature, the mean and mean square error are the average value of the device element temperature in the first time period, and the average variance of the device element temperature in the first time period, used to represent the fluctuation degree of the device element temperature, and the mean square error is set as the quantitative parameter.

[0048] In specific implementation, by dividing the device into different components such as transformer components, circuit breaker components, etc., the temperature change of each device component can be more accurately monitored, the data ambiguity problem caused by overall monitoring can be avoided, each device component is numbered and temperature is collected, the data has clear identification and standardization, which is helpful for subsequent data processing and analysis, the mean and mean square deviation of temperature are calculated, and the temperature fluctuation degree of each device component can be accurately quantified, which is crucial for identifying potential thermal defects or abnormal conditions.

[0049] The step S200 includes the following sub-steps:

[0050] In step S201, the device component is tested by the tester to obtain the medium loss factor information of the device component, the device component model is acquired, the device component database is called, the device component model is input into the device component database, the critical medium loss factor is acquired, the medium loss factor information is compared with the critical medium loss factor, when the medium loss factor information is greater than the critical medium loss factor, a device component replacement signal is generated and sent, otherwise, a collection signal is sent.

[0051] In step S202, when the device component replacement signal is sent, the device component is replaced by the maintenance personnel, after the maintenance personnel finishes replacing, the collection signal is sent, the running information corresponding to the temperature of the device component in the first time period is collected, and the running information includes sound information and current information.

[0052] In step S203, a first mapping relationship between the running information and the quantization parameter is established, the running information is acquired, the quantization parameter corresponding to the running information is acquired according to the first mapping relationship, and a first PFM amplitude control signal is sent.

[0053] In step S204, the running information is first controlled according to the quantization parameter corresponding to the running information, and a first PFM amplitude offset is obtained.

[0054] The generation logic of the device component replacement signal includes:

[0055] The device component model is acquired, the device component database is called, the device component model is input into the device component database, the critical medium loss factor is acquired, the medium loss factor information is compared with the critical medium loss factor, when the medium loss factor information is greater than the critical medium loss factor, a device component replacement signal is generated and sent, otherwise, a collection signal is sent.

[0056] The calculation logic of the first PFM amplitude offset includes:

[0057] The first value is set as a quantization parameter threshold, the running information corresponding quantization parameter is obtained, denoted as a current quantization parameter, the PFM amplitude corresponding to the current quantization parameter is obtained, denoted as a first amplitude, the PFM amplitude is continuously regulated, when the current quantization parameter is equal to the quantization parameter threshold, the PFM amplitude corresponding to the regulated current quantization parameter is denoted as, denoted as a second amplitude, the difference between the first amplitude and the second amplitude is calculated, and the difference between the first amplitude and the second amplitude is set as a first PFM amplitude offset.

[0058] In specific implementation, by testing the medium loss factor and comparing it with the critical value, the equipment element that needs to be replaced can be accurately identified, thereby improving the accuracy of detection and maintenance, generating an equipment element replacement signal and replacing the equipment element in time, avoiding potential equipment failure caused by too high medium loss factor, improving the reliability and safety of the equipment, collecting running information such as temperature, sound and current, and comprehensively understanding the running state of the equipment element, providing rich data support for subsequent analysis and adjustment, by establishing the mapping relationship between the running information and the quantization parameter, the PFM amplitude can be more accurately controlled, the equipment running state can be optimized, and the equipment performance and efficiency can be improved.

[0059] The step S300 includes the following sub-steps:

[0060] S301, collecting environment information, the environment information including environment temperature and environment humidity;

[0061] Step S302, calling an environment database, inputting the environment information into the environment database, matching a difference value corresponding to the environment information under the running information, the difference value corresponding to the environment information under the running information representing the difference between the monitored running information and the actual running information under the environment information;

[0062] Step S303, taking the difference value as a running parameter, obtaining a first mapping relationship, obtaining a quantization parameter corresponding to the difference value according to the first mapping relationship, and sending a second PFM amplitude control signal, the generation logic of the second PFM amplitude control signal being the same as that of the first PFM amplitude control signal;

[0063] Step S304, performing a second control on the running information according to the quantization parameter corresponding to the difference value, and obtaining a second PFM amplitude offset, the second PFM amplitude offset being the same as the second PFM amplitude offset, the first PFM amplitude offset and the second PFM amplitude offset being weighted calculated to obtain a comprehensive PFM amplitude offset.

[0064] In specific implementation, by collecting and analyzing environmental information, the influence of the environment on the operation of the device is better understood, so that the operation state of the device is more accurately adjusted, and by weighted calculation of the first and second PFM amplitude offset, the regulation and control requirements under different conditions can be considered comprehensively, the operation state of the device is further optimized, the overall performance is improved, the influence of the environment on the operation of the device is accurately evaluated and compensated, which helps to prolong the service life of the device and reduce the failure rate, improve the reliability and stability of the device.

[0065] The step S400 comprises the following sub-steps:

[0066] In step S401, the second value and the third value are set as the PFM amplitude offset first threshold and the PFM amplitude offset second threshold, and the second value is smaller than the third value.

[0067] In step S402, the thermal defect of the device element is classified according to the PFM amplitude offset threshold and the comprehensive PFM amplitude offset, and the device element thermal defect grade is obtained, which comprises a first defect grade, a second defect grade and a third defect grade.

[0068] The logic of the thermal defect grade comprises:

[0069] The comprehensive PFM amplitude offset, the second value and the third value are obtained, when the comprehensive PFM amplitude offset is less than or equal to the second value, the thermal defect grade is set as the first defect grade, when the comprehensive PFM amplitude offset is greater than the second value and less than the third value, the thermal defect grade is set as the second defect grade, and when the comprehensive PFM amplitude offset is greater than the third value, the thermal defect grade is set as the third defect grade.

[0070] In specific implementation, by comparing the comprehensive PFM amplitude offset with the preset threshold, the thermal defect grade of the device is clearly determined, which helps to quickly identify the state of the device, and the grading of the thermal defect grade can provide clear decision basis for maintenance personnel, helping them to formulate corresponding maintenance strategies and priorities.

[0071] The present application can comprehensively evaluate the state of the device element by combining temperature, medium loss factor and PFM amplitude, identify potential thermal defects, use mean square deviation as a quantitative parameter to more accurately monitor temperature fluctuations and identify temperature abnormalities of the device element, adjust the operation state of the device in real time through amplitude control of the PFM signal, optimize the operation conditions of the device and improve the monitoring accuracy, the collection of environmental information and the matching of difference values can make the monitoring result more accurate, avoid the interference of environmental changes on the detection result, the generation of device element replacement signal and the regulation of PFM signal can realize the automation of the monitoring process, improve the detection efficiency and accuracy, and through the classification of thermal defect grade, timely warning and maintenance measures can be taken to improve the operation reliability and safety of the device.

[0072] Those skilled in the art will appreciate that embodiments of the present application can be readily used as a method, a system or a computer program product. Accordingly, the present application can take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application can take the form of a computer program product on one or more computer-usable storage media (or computer- readable storage media) having computer-usable program code embodied in the medium. The medium may Figure 1 The functions of the various elements shown or described in connection with the figures can be provided within dedicated hardware or software-controlled circuitry. The Figure 1 The functions of the various elements shown or described in connection with the figures can be provided within dedicated hardware or software-controlled circuitry. The

[0073] It should be noted that the above-mentioned embodiments are only used to illustrate but not to limit the technical solutions of the present application. Although the present application is described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present application can be modified or equivalent replaced without departing from the spirit and scope of the technical solutions of the present application, which should be covered in the scope of claims of the present application.

Claims

1. A method for monitoring thermal defects in power equipment, characterized in that, Includes the following steps: Step S100: Divide the device into device elements, number the device elements, collect the temperature of the numbered device elements in the first time period and record it as the first temperature, calculate the mean and standard deviation of the first temperature, and set the standard deviation as a quantization parameter. Step S200: The dielectric loss factor information of the equipment element is obtained through testing. A replacement signal for the equipment element is generated based on the dielectric loss factor information. After the maintenance personnel complete the replacement, a data acquisition signal is sent to acquire the operating information corresponding to the temperature of the equipment element within the first time period. A first mapping relationship between the operating information and the quantization parameters is established. A first PFM amplitude control signal is sent. The operating information is controlled according to the quantization parameters corresponding to the operating information, and a first PFM amplitude offset is obtained. The calculation logic for the first PFM amplitude offset includes: Set the first value as the quantization parameter threshold, obtain the quantization parameter corresponding to the running information, and record it as the current quantization parameter. Obtain the PFM amplitude corresponding to the current quantization parameter and record it as the first amplitude. Continuously adjust the PFM amplitude. When the current quantization parameter is equal to the quantization parameter threshold, record the PFM amplitude corresponding to the adjusted current quantization parameter as the second amplitude. Calculate the difference between the first amplitude and the second amplitude and set the difference between the first amplitude and the second amplitude as the first PFM amplitude offset. Step S300: Collect environmental information, match the difference value corresponding to the operation information, obtain the quantization parameter corresponding to the difference value according to the difference value and the first mapping relationship, send a second PFM amplitude control signal, perform second control on the operation information according to the quantization parameter corresponding to the difference value, and obtain a second PFM amplitude offset, and perform a weighted calculation on the first PFM amplitude offset and the second PFM amplitude offset to obtain a comprehensive PFM amplitude offset; Step S300 includes the following sub-steps: Step S301: Collect environmental information, including ambient temperature and ambient humidity; Step S302: Call the environment database, input the environment information into the environment database, and match the difference value corresponding to the environment information under the running information. The difference value corresponding to the environment information under the running information is represented as the difference between the monitored running information and the actual running information under the environment information. Step S303: Use the difference value as an operating parameter to obtain a first mapping relationship, obtain the quantization parameter corresponding to the difference value according to the first mapping relationship, and send a second PFM amplitude control signal. The generation logic of the second PFM amplitude control signal is the same as that of the first PFM amplitude control signal. Step S304: Perform second control on the running information according to the quantization parameters corresponding to the difference value, and obtain the second PFM amplitude offset. Perform weighted calculation on the first PFM amplitude offset and the second PFM amplitude offset to obtain the comprehensive PFM amplitude offset. Step S400: Set the PFM amplitude offset threshold. Based on the PFM amplitude offset threshold and the comprehensive PFM amplitude offset, classify the thermal defects of the equipment element to obtain the thermal defect level of the equipment element.

2. The method for monitoring thermal defects in power equipment as described in claim 1, characterized in that: Step S100 includes the following sub-steps: Step S101: Based on the components that make up the equipment, the equipment is divided into equipment elements, which include transformer elements, circuit breaker elements, disconnector elements, busbar elements and cable elements. Step S102: Number the device elements, where the number is a natural number, and the device element label is represented as X. N N is a natural number and N is distributed between [1,5]. Step S103: Collect the temperature of the numbered equipment element within the first time period and record it as the first temperature. Calculate the mean and standard deviation of the first temperature. The mean and standard deviation are the average value of the equipment element temperature within the first time period and the average variance of the equipment element temperature within the first time period, which are used to represent the degree of fluctuation of the equipment element temperature. Set the standard deviation as a quantization parameter.

3. The method for monitoring thermal defects in power equipment as described in claim 1, characterized in that: Step S200 includes the following sub-steps: Step S201: Test the device element with a tester to obtain the dielectric loss factor information of the device element, obtain the device element model, retrieve the device element database, input the device element model into the device element database, obtain the critical dielectric loss factor, compare the dielectric loss factor information with the critical dielectric loss factor, when the dielectric loss factor information is greater than the critical dielectric loss factor, generate and send a device element replacement signal, otherwise, send a collection signal. Step S202: When a device replacement signal is issued, the maintenance personnel replace the device. After the replacement is completed, the maintenance personnel issue a collection signal to collect the operating information corresponding to the temperature of the device within the first time period. The operating information includes sound information and current information. Step S203: Establish a first mapping relationship between operating information and quantization parameters, obtain operating information, obtain the quantization parameters corresponding to the operating information according to the first mapping relationship, and send the first PFM amplitude control signal. Step S204: Perform first control on the running information according to the quantization parameters corresponding to the running information, and obtain the first PFM amplitude offset.

4. The method for monitoring thermal defects in power equipment as described in claim 1, characterized in that: Step S400 includes the following sub-steps: Step S401: Set the second value and the third value to the first threshold for PFM amplitude offset and the second threshold for PFM amplitude offset, respectively, wherein the second value is less than the third value; Step S402: Based on the PFM amplitude offset threshold and the comprehensive PFM amplitude offset, the thermal defects of the equipment element are classified into levels to obtain the thermal defect levels of the equipment element. The thermal defect levels of the equipment element include a first defect level, a second defect level, and a third defect level.

5. The method for monitoring thermal defects in power equipment as described in claim 4, characterized in that: The logic for classifying thermal defect levels includes: Obtain the overall PFM amplitude offset, the second value, and the third value. When the overall PFM amplitude offset is less than or equal to the second value, set the thermal defect level to the first defect level. When the overall PFM amplitude offset is greater than the second value and less than the third value, set the thermal defect level to the second defect level. When the overall PFM amplitude offset is greater than the third value, set the thermal defect level to the third defect level.

6. An electronic device comprising a storage device, a processor, and a computer program stored in the storage device and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method for monitoring thermal defects in power equipment as described in any one of claims 1-5.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, which, when executed by a processor, implements the method for monitoring thermal defects in power equipment as described in any one of claims 1-5.

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