Instrument calibration method, system, medium and device based on spectral consistency

Abstract

The present invention relates to optical instrument calibration, and discloses an instrument calibration method, system, medium and device based on spectral consistency. The method comprises: obtaining a to-be-calibrated spectrum of a standard substance for spectral calibration through an instrument; making the horizontal coordinates of the standard spectrum of the standard substance for spectral calibration and the to-be-calibrated spectrum the same through interpolation fitting; normalizing the standard spectrum after interpolation fitting and the to-be-calibrated spectrum; analyzing the similarity of the normalized standard spectrum and the to-be-calibrated spectrum by window moving mode, and obtaining the to-be-calibrated spectrum after the window moving with the highest similarity; calibrating the to-be-calibrated spectrum after the window moving with the highest similarity on the Y axis, so that the to-be-calibrated spectrum after the window moving with the highest similarity matches the light intensity of the standard spectrum. The present invention realizes the calibration of the spectral consistency of spectral measuring instruments with different errors.

Description

Technical Field

[0001] The present invention relates to the technical field of optical instrument calibration, and in particular to an instrument calibration method, system, medium and device based on spectral consistency. Background Art

[0002] In spectral measurement and analysis instruments, due to the existence of optical component processing errors, optical system installation errors, detector installation errors, and instrument comprehensive calibration errors, for the same test object, not only are there inconsistencies in the measured spectral signals between instruments of different manufacturers and models, but even between multiple instruments of the same manufacturer and the same model, there will be inconsistencies in the measured spectral signals. This inconsistency in the measured spectral signals between different devices is a systematic error, that is, the inter-instrument difference. At the same time, each spectrometer will also have a slight spectral drift after a period of time due to environmental influences, so it needs to be calibrated regularly.

[0003] For the inter-instrument difference and spectral drift of spectral measurement and analysis instruments, the current correction method usually uses a sharp line spectral lamp. The sharp line spectral lamp has multiple discrete linear spectra, and the spectral lines have been calibrated in advance and given standard values. During calibration, the spectrometer directly measures the light emitted by the spectral lamp to obtain the corresponding discrete linear characteristic spectral lines. Corresponding to different spectral measurement and analysis instruments, the horizontal coordinate values ​​corresponding to the discrete linear characteristic spectral lines may be ordinal values ​​of pixels or sampling sequences according to different instruments. A second-order polynomial relationship can be established through the standard value and the pixel (sampling sequence) ordinal value. The coefficients of the constant term, the linear term, and the quadratic term can be obtained through regression solution, thereby correcting the entire spectrum.

[0004] This method has the following shortcomings: 1. The sharp line spectral line lamp can only provide accurate values ​​for a limited number of discrete spectral lines, and the calibration corresponding to these spectral lines is accurate; however, there is no standard value for calibration in other spectral ranges, and it is only based on experience and uses a second-order polynomial fitting. 2. Since the existing spectral calibration method is to perform a second-order polynomial fitting on a series of point pairs (pi nt pair), a curve function with constant term, linear term and quadratic term coefficients I, C1, C2 is established, and the pixel (sampling sequence) ordinal value is mapped to the spectral wavelength, frequency and wave number through this function, the result is that all point pairs and the fitted curve will produce distance residuals. In other words, the fitting curve makes several discrete current characteristic spectral lines that can be accurately aligned become inaccurate. 3. The sharp line spectral line lamp provides linear discrete characteristic spectral lines. If the resolution of some spectral measurement and analysis instruments is not high (such as some handheld devices), it may not display the corresponding spectral lines at all, and the calibration procedure cannot be completed. 4. For inter-instrument difference calibration, that is, to achieve the consistency requirement of spectral signals of different instruments, the second-order polynomial fitting method, which is based on solving a finite number of discrete spectral lines, cannot guarantee that the entire spectrum between different instruments has good consistency, that is, this method cannot correct the inter-instrument difference problem well. Summary of the invention

[0005] The present invention provides an instrument calibration method based on spectral consistency, comprising:

[0006] The spectrum to be calibrated is obtained by an instrument, wherein the spectrum to be calibrated of the standard material for spectrum calibration is obtained by an instrument, wherein the abscissa of the spectrum to be calibrated is the wavelength, frequency or wave number, and the ordinate is the light intensity;

[0007] Interpolation fitting step: making the horizontal coordinates of the standard spectrum of the standard material for spectrum calibration and the spectrum to be calibrated the same through interpolation fitting;

[0008] Normalization processing step: normalizing the standard spectrum after interpolation fitting and the spectrum to be calibrated;

[0009] Similarity analysis step: using a window moving method to analyze the similarity between the normalized standard spectrum and the spectrum to be calibrated, and obtaining the spectrum to be calibrated after the window moving with the highest similarity;

[0010] Y-axis calibration step: calibrate the spectrum to be calibrated after the window with the highest similarity is moved on the Y-axis, so that the spectrum to be calibrated after the window with the highest similarity is moved and the standard spectrum intensity matches.

[0011] The present invention performs full spectrum calibration on a spectral measuring instrument through the standard spectrum of a standard substance and the spectrum to be calibrated, performs abscissa calibration through interpolation fitting, and performs ordinate calibration through normalization processing and similarity analysis, thereby realizing calibration of spectral consistency of spectral measuring instruments with different errors.

[0012] According to one aspect of the present invention, it also includes:

[0013] The standard spectrum of the standard substance is measured by a spectral metrology standard device.

[0014] According to one aspect of the present invention, it also includes:

[0015] Compare the resolution of the instrument with that of a spectral metrology standard;

[0016] If the resolution of the instrument is lower than the resolution of the spectral metrology standard device, the standard spectrum is downsampled to obtain a standard spectrum with the same resolution as the instrument.

[0017] According to one aspect of the present invention, the step of downsampling the standard spectrum comprises:

[0018] Decimation downsampling of the standard spectrum;

[0019] Preferably, the standard spectrum is downsampled in combination with the neighborhood average;

[0020] Further preferably, the step of downsampling the standard spectrum in combination with the neighborhood average comprises:

[0021] Set the neighborhood:

[0022] Obtain the horizontal coordinate of the spectrum line to be calibrated, and update the light intensity of the spectrum line corresponding to the standard spectrum to the average light intensity in its neighborhood;

[0023] Preferably, the standard spectrum is downsampled in combination with neighborhood weighting;

[0024] Further preferably, the step of downsampling the standard spectrum in combination with neighborhood weighting comprises:

[0025] Set the neighborhood;

[0026] The light intensity corresponding to the horizontal coordinate of the spectral line to be calibrated on the standard spectrum is updated to the weighted average of the light intensity in its neighborhood, and the weight decreases as the distance from the light intensity increases.

[0027] According to one aspect of the present invention, the step of normalizing the interpolated fitted standard spectrum and the spectrum to be calibrated comprises:

[0028] Select the peak or valley value with the largest absolute value on the Y axis in the spectrum to be calibrated to normalize the spectrum to be calibrated

[0029] p ′ cal (λ) = p cal (λ) / |k cal |

[0030] Among them, p cal (λ) is the spectrum to be calibrated before normalization, p' cal (λ) is the normalized spectrum to be calibrated, |k cal | is the normalization coefficient of the spectrum to be calibrated, which is also the peak or valley value with the largest absolute value on the Y axis of the spectrum to be calibrated;

[0031] Select a peak or valley with the largest absolute value on the Y axis in the standard spectrum to normalize the standard spectrum

[0032] p ′ std (λ) = p std (λ) / |k std |

[0033] Among them, p std (λ) is the standard spectrum before normalization, p' std (λ) is the normalized standard spectrum, |k std | is the normalization coefficient of the standard spectrum, which is also the peak or valley value with the largest absolute value on the Y axis of the standard spectrum.

[0034] According to one aspect of the present invention, the step of analyzing the similarity between the normalized standard spectrum and the spectrum to be calibrated by using a window moving method comprises:

[0035] Respectively obtaining a normalized standard spectrum and a discrete sequence of the spectrum to be calibrated;

[0036] The similarity between two discrete sequences is calculated by continuously moving and displacing the point sequence.

[0037] According to one aspect of the present invention, the step of calibrating the spectrum to be calibrated after the window with the highest similarity is moved on the Y axis comprises:

[0038] The spectrum to be calibrated after the window with the highest similarity is moved, divided by the normalization coefficient of the spectrum to be calibrated and multiplied by the normalization coefficient of the standard spectrum, and then calibrated in the Y-axis direction.

[0039] According to one aspect of the present invention, the normalization step further includes:

[0040] Spectrum sub-segment division step: divide the interpolation-fitted standard spectrum and the spectrum to be calibrated into multiple sub-segments according to the spectral range, and obtain multiple spectral sub-segments of the interpolation-fitted standard spectrum and the spectrum to be calibrated:

[0041] The normalization processing step, the similarity analysis step and the Y-axis calibration step are respectively performed on the standard spectrum after interpolation fitting and the multiple spectrum sub-segments of the spectrum to be calibrated.

[0042] According to a second aspect of the present invention, there is also provided an instrument calibration system based on spectral consistency, comprising:

[0043] A spectrum acquisition module, which acquires a spectrum to be calibrated of a standard substance for spectrum calibration measured by the instrument to be calibrated and a standard spectrum of the standard substance, wherein the horizontal coordinates of the spectrum to be calibrated and the standard spectrum are wavelength, frequency or wave number, and the vertical coordinates are light intensity;

[0044] An interpolation fitting module, which makes the horizontal coordinates of the standard spectrum of the standard material for spectrum calibration collected by the spectrum collection module and the spectrum to be calibrated obtained by the spectrum to be calibrated obtaining module to be calibrated the same through interpolation fitting;

[0045] A normalization processing module is used to perform normalization processing on the standard spectrum and the spectrum to be calibrated after interpolation fitting by the interpolation fitting module;

[0046] The similarity analysis module uses a window moving method to analyze the similarity between the standard spectrum normalized by the normalization processing module and the spectrum to be calibrated, and obtains the spectrum to be calibrated after the window moving with the highest similarity;

[0047] The Y-axis calibration module calibrates the to-be-calibrated spectrum after the window movement with the highest similarity obtained by the similarity analysis module on the Y-axis, so that the to-be-calibrated spectrum after the window movement with the highest similarity matches the light intensity of the standard spectrum.

[0048] According to the third aspect of the present invention, a computer-readable storage medium is also provided, wherein the computer-readable storage medium includes an instrument calibration program based on spectral consistency, and when the instrument calibration program based on spectral consistency is executed by a processor, the steps of the above-mentioned instrument calibration method based on spectral consistency are implemented.

[0049] According to a fourth aspect of the present invention, there is provided an electronic device comprising a memory and a processor, wherein the memory comprises an instrument calibration program based on spectral consistency, and when the instrument calibration program based on spectral consistency is executed by the processor, the steps of the above-mentioned instrument calibration method based on spectral consistency are implemented.

[0050] The present invention does not calibrate the entire spectrum through a limited number of discrete spectral lines, but rather performs multi-resolution, sequence similarity and other calculation processing methods on the full spectrum to achieve accurate calibration of the full spectrum, accurate calibration of instrument spectra with different resolutions, and accurate calibration of inter-instrument differences.

[0051] The present invention calibrates the spectral consistency of an instrument, and the spectral consistency calibration method includes a resolution downsampling function; a function of aligning the discrete wavelength and frequency values ​​of a standard spectrum with a spectrum to be calibrated through interpolation and fitting; a function of subdividing the spectral range into a plurality of sub-segments and performing peak or valley normalization; a function of performing sequence similarity analysis to obtain a mapping between a standard spectrum sequence sub-segment and a spectrum sequence sub-segment to be calibrated; and a function of finally merging the sub-segments to obtain a corresponding calibration mapping function relationship, so that the spectra to be measured of instruments with different error values, different precisions and resolutions are all consistent and comparable after calibration, and are consistent with the standard spectrum. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 It is a flow chart of an embodiment of the instrument calibration method based on spectral consistency of the present invention;

[0053] Figure 2 It is a schematic diagram of a block diagram of an embodiment of an instrument calibration system based on spectral consistency according to the present invention;

[0054] Figure 3 It is a schematic block diagram of an embodiment of the electronic device of the present invention.

[0055] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0056] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0057] Figure 1 FIG. 1 is a flow chart of an embodiment of the instrument calibration method based on spectral consistency of the present invention. Figure 1 As shown, the instrument calibration method based on spectral consistency includes:

[0058] Step S1, a step of obtaining a spectrum to be calibrated: obtaining a spectrum to be calibrated of a standard substance for spectrum calibration by an instrument, wherein the abscissa of the spectrum to be calibrated is wavelength, frequency or wave number, and the ordinate is light intensity; the ordinate may also be light intensity or any other measurement value equivalent to light intensity, such as digital current or voltage (output of a light detector (i.e., an instrument)); the ordinate may also be absorbance, etc.;

[0059] Step S2, interpolation fitting step: interpolation fitting is performed to make the horizontal coordinates of the standard spectrum of the standard substance for spectrum calibration and the spectrum to be calibrated the same;

[0060] Step S3, normalization processing step: normalizing the standard spectrum after interpolation fitting and the spectrum to be calibrated;

[0061] Step S4, similarity analysis step: using a window moving method to analyze the similarity between the normalized standard spectrum and the spectrum to be calibrated, and obtaining the spectrum to be calibrated after the window moving with the highest similarity;

[0062] Step S5, Y-axis calibration step: calibrate the spectrum to be calibrated after the window with the highest similarity is moved on the Y-axis, so that the spectrum to be calibrated after the window with the highest similarity is moved and the standard spectrum intensity matches.

[0063] The standard spectrum of the standard substance of the present invention can be measured by a national metrology standard device using a national standard or other standard method, thereby ensuring the stability of the standard spectrum from the source. Each spectral line of the spectral measuring instrument in the full spectral range is calibrated using the standard spectrum of the standard substance and the spectrum to be calibrated. The horizontal coordinate is calibrated by interpolation fitting, and the vertical coordinate is calibrated by normalization processing and similarity analysis, thereby realizing the calibration of the spectral consistency of spectral measuring instruments with different errors.

[0064] The normalization processing step and Y-axis calibration step of the present invention first standardize the intensity of the spectrum to be calibrated to a common reference (normalization), and then adjust it according to the actual intensity level of the standard spectrum to achieve accurate matching of the two spectra in intensity.

[0065] In some embodiments of the present invention, before step S2, the method further includes:

[0066] The standard spectrum of the standard substance is measured by a spectral metrology standard device. For example, the standard spectrum of the standard substance is measured by a standard method for measuring the standard spectrum of the standard substance by a spectral metrology standard device. The calibration method includes standard substances for spectral calibration traceable to the highest national legal metrology institution and a calibration certificate containing accurate calibration values ​​of the spectral wavelength (frequency).

[0067] The high-purity standard material for spectrum calibration in the present invention is calibrated and traced in advance by the spectrum measurement standard device of the highest legal metrology institution in the country, and the corresponding calibration result can be regarded as the standard value. As the source of the national spectrum calibration value, the spectrum measurement standard device calibrates the standard material with the highest resolution interval to ensure that the spectrum of the standard material has the highest accuracy in wavelength frequency (horizontal axis direction) and light intensity (vertical axis direction).

[0068] In some embodiments of the present invention, before step S2, the method further includes:

[0069] Compare the resolution of the instrument with that of a spectral metrology standard;

[0070] If the resolution of the instrument is lower than the resolution of the spectral metrology standard device, the standard spectrum is downsampled to obtain a standard spectrum with the same resolution as the instrument.

[0071] In some embodiments of the present invention, the step of downsampling the standard spectrum comprises:

[0072] The standard spectrum is decimated and downsampled.

[0073] The present invention can calibrate instruments with different system error values, different precisions and different resolutions. The spectrum of the standard substance with the highest resolution is downsampled, neighborhood averaged or weighted averaged to obtain a spectrum with the same resolution as the instrument to be calibrated for calibration.

[0074] In some embodiments of the present invention, the step of decimating and downsampling the standard spectrum comprises:

[0075] Downsampling of the standard spectrum combined with neighborhood averaging.

[0076] In some embodiments of the present invention, the step of downsampling the standard spectrum combined with the neighborhood average comprises:

[0077] A neighborhood is set, the neighborhood being not less than the resolution of the instrument divided by the resolution of the spectral metrology standard device. Preferably, the size of the neighborhood is 1-1.5 times the ratio of the resolution of the instrument to be calibrated divided by the resolution of the spectral metrology standard device. For example, if the resolution of the spectral metrology standard device is 0.1 wavenumber and the resolution of the target instrument is 0.5 wavenumber, the neighborhood size is 5 or 7. If the neighborhood is too small, the accuracy of the resolution alignment between the spectrum to be calibrated and the standard spectrum is reduced. If the neighborhood is too large, the amount of calculation is too large, resulting in waste.

[0078] The horizontal coordinate of the spectrum line to be calibrated is obtained, and the light intensity of the spectrum line corresponding to the standard spectrum is updated to the average light intensity in its neighborhood.

[0079] In some embodiments of the present invention, the step of decimating and downsampling the standard spectrum comprises:

[0080] Downsampling of the standard spectrum combined with neighborhood weighting.

[0081] In some embodiments of the present invention, the step of downsampling the standard spectrum in combination with neighborhood weighting includes:

[0082] Set the neighborhood;

[0083] The light intensity of the horizontal coordinate of the spectral line to be calibrated on the standard spectrum is updated to the weighted average of the light intensity in its neighborhood. The weight decreases as the distance from the light intensity increases. The weight usually decreases with increasing distance, which means that values ​​closer to the center point in the neighborhood have a greater impact on the final average result.

[0084] For the edge positions of the spectrum, i.e., the first and last values ​​in the sequence, since they have no neighbors on both sides, only the neighbors on one side can be used for weighted average calculation.

[0085] The present invention measures the spectrum to be calibrated obtained by measuring the standard material for spectrum calibration for a spectrum measuring instrument with a resolution lower than that of a spectrum measurement standard device. The first step is to downsample the original highest resolution spectrum to the same spectral resolution as the instrument, and this step is mainly achieved by downsampling. Because the low spectral resolution may be caused by sparse sampling intervals (such as small pixels, but large gaps between pixels), or a large sampling area (such as close arrangement between pixels, but large pixel bins), the downsampling process can be simple decimation downsampling, and also includes neighborhood averaging or more complex neighborhood weighted calculation. The present invention can achieve the consistency of instrument spectrum correction under different error and resolution conditions.

[0086] In some embodiments of the present invention, step S3 includes:

[0087] Select the peak or valley value with the largest absolute value on the Y axis in the spectrum to be calibrated to normalize the spectrum to be calibrated

[0088] p ′ cal (λ) = p cal (λ) / |k cal |

[0089] Among them, p cal (λ) is the spectrum to be calibrated before normalization, p' cal (λ) is the normalized spectrum to be calibrated, |k cal | is the normalization coefficient of the spectrum to be calibrated, which is also the peak or valley value with the largest absolute value on the Y axis of the spectrum to be calibrated;

[0090] Select a peak or valley with the largest absolute value on the Y axis in the standard spectrum to normalize the standard spectrum

[0091] p ′ std (λ) = p std (λ) / |k std |

[0092] Among them, p std (λ) is the standard spectrum before normalization, p' std (λ) is the normalized standard spectrum, |k std | is the normalization coefficient of the standard spectrum, which is also the peak or valley value with the largest absolute value on the Y axis of the standard spectrum.

[0093] In practice, the discrete values ​​of the standard spectrum after downsampling and the spectrum of the instrument to be calibrated still differ in the coordinates of the X-axis (wavelength, frequency or wave number), so the standard spectrum after downsampling needs to be interpolated and fitted to ensure that the X-coordinate values ​​of the two spectral discrete sampling point sequences are exactly the same. The spectrum alignment step in the present invention can also be used for spectra and spectral lines with uneven sampling or spectra with specific wavelengths, frequencies and wave numbers that require special calibration.

[0094] When the standard spectrum is downsampled to have the same resolution as the spectrum to be measured by the instrument, the present invention can ensure that the X-coordinate values ​​of the two spectrum sequences are exactly the same by performing polynomial fitting, spline interpolation and other methods at the discrete sampling point sequence of the spectrum to be measured by the instrument.

[0095] The present invention divides the standard spectrum of the standard substance and the spectrum to be calibrated obtained by measuring the standard substance with the spectrum measuring instrument into the corresponding spectrum interval, and the absolute value of the peak or valley value in this interval|k std |,|k cal |, and get the normalized curve.

[0096] In some embodiments of the present invention, step S4 includes:

[0097] Respectively obtaining a normalized standard spectrum and a discrete sequence of the spectrum to be calibrated;

[0098] The similarity between two discrete sequences is calculated by continuously moving and displacing the point sequence.

[0099] The present invention can also accurately align the standard spectrum for uneven sampling, or spectra and spectral lines that require special calibration for specific wavelengths, frequencies and wave numbers, thereby realizing calibration of the spectrum to be measured.

[0100] In some embodiments of the present invention, step S5 includes:

[0101] The spectrum to be calibrated after the window with the highest similarity is moved, divided by the normalization coefficient of the spectrum to be calibrated and multiplied by the normalization coefficient of the standard spectrum, and then calibrated in the Y-axis direction.

[0102] The present invention is characterized in that the normalized standard spectrum sub-segment and the spectrum sub-segment to be calibrated are subjected to sequence similarity calculation to obtain a mapping relationship between the two sequences when the similarity between the standard spectrum sequence sub-segment and the spectrum sequence sub-segment to be calibrated is the highest. The mapping relationship is divided by |k cal |, then multiply by |k std |, calibrate in the Y-axis direction.

[0103] In some embodiments of the present invention, before step S3, the method further includes:

[0104] Spectrum sub-segment division step: divide the interpolation-fitted standard spectrum and the spectrum to be calibrated into multiple sub-segments according to the spectral range, and obtain multiple spectral sub-segments of the interpolation-fitted standard spectrum and the spectrum to be calibrated:

[0105] The normalization processing step, the similarity analysis step and the Y-axis calibration step are respectively performed on the standard spectrum after interpolation fitting and the multiple spectrum sub-segments of the spectrum to be calibrated.

[0106] The spectral range is subdivided into several sub-segments, and then in a sub-segment, a peak or valley with the most obvious features is selected for normalization; the similarity of the two sequences in the sub-segment is calculated, and the similarity calculation is not limited to the minimum Euclidean distance and other methods. The two spectral discrete point sequences are used to continuously move and displace to calculate the similarity until the mapping with the highest similarity between the standard spectral sequence sub-segment and the spectral sequence sub-segment to be calibrated is obtained. The mapping must be surjective, but not necessarily injective. The mapping relationship between the two spectral sequence sub-segments obtained in this step should also be divided by |k cal | and then multiply by |k std |, calibrate in the Y-axis direction. For all corresponding spectral sub-segments, the calculation is completed by first performing normalization correction, then mapping the horizontal point sequence under the condition of maximum similarity, and finally calibrating in the Y-axis direction. Finally, all sub-segments are merged to obtain the corresponding calibration mapping function relationship of the full spectrum segment. When the spectral measurement instrument measures other objects after completing the spectral calibration, the obtained spectrum is substituted into the full spectrum segment calibration mapping function to obtain the result, which is the spectrum of other objects after calibrating the instrument system error.

[0107] For spectral measuring instruments with different systematic errors and different resolutions, a method is invented that can convert different precisions and resolutions, can establish a calibration relationship with the corresponding spectral line of the standard spectrum at the same resolution for each pixel (sampling point) in the full spectral range, and ensure the consistency of the spectra after calibration between different instruments. An algorithm that can calibrate spectral measuring instruments with different resolutions and achieve spectral consistency after instrument calibration. The algorithm includes a resolution downsampling function; a function of aligning the discrete wavelength and frequency values ​​of the standard spectrum with the spectrum to be calibrated through interpolation and fitting; a function of subdividing the spectral range into several sub-segments and normalizing the peak or valley value; a function of calculating sequence similarity to obtain a mapping between the standard spectrum sequence sub-segments and the spectrum sequence sub-segments to be calibrated; and a function of merging the sub-segments to obtain the corresponding calibration mapping function relationship. For the spectra of other measured objects measured by the calibrated instrument, the result obtained by substituting the calibration mapping function is the spectrum of the other measured objects after the instrument system error is calibrated.

[0108] Figure 2 FIG. 1 is a schematic block diagram of an embodiment of the instrument calibration system based on spectral consistency of the present invention. Figure 2As shown, the instrument calibration system based on spectral consistency includes:

[0109] A spectrum acquisition module 10, wherein the spectrum acquisition module 10 is used to acquire a spectrum to be calibrated and a standard spectrum of a standard substance for spectrum calibration, wherein the horizontal coordinates of the spectrum to be calibrated and the standard spectrum are wavelength, frequency or wave number, and the vertical coordinates are light intensity, for example, the spectrum to be calibrated is obtained by measuring the standard substance by the instrument to be calibrated and transmitted to the spectrum acquisition module 10; the standard spectrum of the standard substance is measured by the spectrum metrology standard device and transmitted to the spectrum acquisition module 10;

[0110] An interpolation fitting module 20, wherein the interpolation fitting module 20 makes the horizontal coordinates of the standard spectrum of the standard material for spectrum calibration collected by the spectrum collection module 10 and the spectrum to be calibrated obtained by the spectrum to be calibrated obtaining module to be calibrated the same through interpolation fitting;

[0111] A normalization processing module 40, wherein the normalization processing module 40 performs normalization processing on the standard spectrum and the spectrum to be calibrated after interpolation and fitting by the interpolation and fitting module 20;

[0112] A similarity analysis module 50, wherein the similarity analysis module 50 uses a window moving method to analyze the similarity between the standard spectrum normalized by the normalization processing module 40 and the spectrum to be calibrated, and obtains the spectrum to be calibrated after the window moving with the highest similarity;

[0113] The Y-axis calibration module 60 calibrates the to-be-calibrated spectrum after the window movement with the highest similarity obtained by the similarity analysis module 50 on the Y-axis, so that the to-be-calibrated spectrum after the window movement with the highest similarity matches the light intensity of the standard spectrum.

[0114] In some embodiments of the present invention, the instrument calibration system based on spectral consistency further includes a division module 30, which divides the standard spectrum and the spectrum to be calibrated after interpolation fitting by the interpolation fitting module 20 into a plurality of sub-segments to obtain a plurality of spectral sub-segments of the standard spectrum and the spectrum to be calibrated after interpolation fitting;

[0115] The normalization processing module 40, the similarity analysis module 50 and the Y-axis calibration module 60 respectively perform normalization processing, similarity analysis and Y-axis calibration on the multiple spectrum sub-segments of the standard spectrum and the spectrum to be calibrated divided by the dividing module 30.

[0116] In some embodiments of the present invention, the normalization processing module 40 includes a spectrum normalization unit 41 to be calibrated and a standard spectrum normalization unit 42, wherein:

[0117] The spectrum normalization unit 41 selects the peak value or valley value with the largest absolute value on the Y axis of the spectrum to be calibrated to perform normalization processing on the spectrum to be calibrated.

[0118] p ′ cal (λ) = p cal (λ) / |k cal |

[0119] Among them, p cal (λ) is the spectrum to be calibrated before normalization, p' cal (λ) is the normalized spectrum to be calibrated, |k cal | is the normalization coefficient of the spectrum to be calibrated, which is also the peak or valley value with the largest absolute value on the Y axis of the spectrum to be calibrated;

[0120] The standard spectrum normalization unit 42 selects a peak value or a valley value with the largest absolute value of the Y axis in the standard spectrum to perform normalization processing on the standard spectrum.

[0121] p ′ std (λ) = p std (λ) / |k std |

[0122] Among them, p std (λ) is the standard spectrum before normalization, p' std (λ) is the normalized standard spectrum, |k std | is the normalization coefficient of the standard spectrum, which is also the peak or valley value with the largest absolute value on the Y axis of the standard spectrum.

[0123] In some embodiments of the present invention, the similarity analysis module 50 includes a discrete unit 51 and a shift dislocation similarity analysis unit 52, wherein:

[0124] The discrete unit 51 obtains the normalized standard spectrum and the discrete sequence of the spectrum to be calibrated respectively;

[0125] The shifting similarity analysis unit 52 calculates the similarity of two discrete sequences by shifting the point sequence continuously.

[0126] The spectra to be measured by the instruments with different error values, different precisions and resolutions of the present invention can all be calibrated with standard spectra and traced back to the national metrological standard device. After calibration, the spectra to be measured by the instruments with different error values, different precisions and resolutions are all consistent and comparable, and are consistent with the standard spectra.

[0127] The above-mentioned instrument calibration methods based on spectral consistency of the present invention can be applied to the electronic device 1. Figure 3 , which is a schematic diagram of the application environment of a preferred embodiment of the instrument calibration method based on spectral consistency of the present invention.

[0128] In this embodiment, the electronic device 1 may be a terminal device with computing functions, such as a server, a smart phone, a tablet computer, a portable computer, or a desktop computer.

[0129] The electronic device 1 includes: a processor 12 and a memory 11 , and may also include a network interface 13 , a communication bus 14 and the like.

[0130] The memory 11 includes at least one type of readable storage medium. The at least one type of readable storage medium may be a non-volatile storage medium such as a flash memory, a hard disk, a multimedia card, a card-type memory, etc. In some embodiments, the readable storage medium may be an internal storage unit of the electronic device 1, such as a hard disk of the electronic device 1. In other embodiments, the readable storage medium may also be an external memory of the electronic device 1, such as a plug-in hard disk equipped on the electronic device 1, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc.

[0131] In this embodiment, the readable storage medium of the memory 11 is generally used to store the instrument calibration program 110 based on spectral consistency, standard substances and data sets of standard substances installed in the electronic device 1. The memory 11 can also be used to temporarily store data that has been output or is to be output.

[0132] In some embodiments, the processor 12 may be a central processing unit (CPU), a microprocessor or other data processing chip, used to run program codes or process data stored in the memory 11, such as executing an instrument calibration program 110 based on spectral consistency.

[0133] The network interface 13 may optionally include a standard wired interface, a wireless interface (such as a WI-FI interface), and is generally used to establish a communication connection between the electronic device 1 and other electronic devices.

[0134] The communication bus 14 is used to realize the connection and communication between these components.

[0135] Figure 3 The electronic device 1 is shown only with components 11 - 14 , but it should be understood that implementation of all of the components shown is not required, and more or fewer components may alternatively be implemented.

[0136] Optionally, the electronic device 1 may further include a user interface, which may include an input unit such as a keyboard, a voice input device such as a microphone and other devices with voice recognition function, a voice output device such as a speaker, headphones, etc. Optionally, the user interface may also include a standard wired interface or a wireless interface.

[0137] Optionally, the electronic device 1 may further include a display, which may also be referred to as a display screen or a display unit. In some embodiments, it may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, and an organic light-emitting diode (OLED) touch device. The display is used to display information processed in the electronic device 1 and to display a visual user interface.

[0138] Optionally, the electronic device 1 further includes a touch sensor. The area provided by the touch sensor for the user to perform a touch operation is called a touch control area. In addition, the touch sensor described here may be a resistive touch sensor, a capacitive touch sensor, etc. Moreover, the touch sensor includes not only a contact touch sensor, but also a proximity touch sensor, etc. In addition, the touch sensor may be a single sensor or a plurality of sensors arranged in an array, for example.

[0139] In addition, the area of ​​the display of the electronic device 1 can be the same as or different from the area of ​​the touch sensor. Optionally, the display and the touch sensor are stacked to form a touch display screen. The device detects touch operations triggered by the user based on the touch display screen.

[0140] Optionally, the electronic device 1 may further include a radio frequency (RF) circuit, a sensor, an audio circuit, etc., which will not be described in detail here.

[0141] In addition, an embodiment of the present invention also provides a computer-readable storage medium, which includes an instrument calibration program based on spectral consistency. When the instrument calibration program based on spectral consistency is executed by a processor, the steps of the instrument calibration method based on spectral consistency of the above-mentioned embodiments are implemented.

[0142] The specific implementation of the computer-readable storage medium of the present invention is substantially the same as the specific implementation of the instrument calibration method and electronic device based on spectral consistency described above, and will not be described in detail herein.

[0143] The present invention uses standard materials with the highest resolution, whose wavelength, frequency and wave value are calibrated and traceable in the full spectral range, as calibration references; the spectral range of the standard materials used for calibration is larger than the spectral range of the instrument measurement; it is ensured that each spectral line in the full spectral range of the instrument is calibrated.

[0144] The present invention can calibrate instruments with different precision and resolution. By downsampling or averaging (averaging downsampling) the spectrum of the standard material with the highest resolution that has been calibrated and traced, a downsampled standard spectrum with different precision and resolution that is the same as that of different instruments can be obtained, and this spectrum has been calibrated and traced.

[0145] The present invention can also be used for spectra and spectral lines with uneven sampling, or spectra and spectral lines with specific wavelengths, frequencies and wavenumbers that require special calibration. In the neighborhood of the spectra and spectral lines that need to be calibrated, the original highest resolution standard spectrum is used to obtain the spectra by methods including but not limited to polynomial fitting, spline interpolation, etc.

[0146] The present invention calculates the standard spectrum obtained after downsampling and fitting alignment of the standard substance and the spectrum of the standard substance after being measured by the instrument to be calibrated, subdivides the spectral range into a number of sub-segments, performs peak or valley normalization, and calculates sequence similarity to obtain a mapping between the standard spectrum sequence sub-segments and the spectrum sequence sub-segments to be calibrated, and finally merges the sub-segments to obtain a corresponding calibration mapping function relationship.

[0147] The present invention calibrates all instruments with different precision and resolution. The reference spectrum is the original spectrum of the standard material with the highest resolution and its down-sampling at different resolutions. Therefore, the spectral consistency between the instruments with different precision and resolution after calibration is guaranteed, and the calibrated spectrum is traceable to the highest national measurement standard, ensuring the accuracy of the calibration spectrum.

[0148] In the several embodiments provided by the present invention, it should be understood that the disclosed devices, apparatuses and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of the modules is only a logical function division, and there may be other division methods in actual implementation.

[0149] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0150] In addition, each functional module in each embodiment of the present invention may be integrated into one processing unit, each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of hardware plus software functional modules.

[0151] It is obvious to those skilled in the art that the present invention is not limited to the details of the above exemplary embodiments, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention.

[0152] Therefore, no matter from which point of view, the embodiments should be regarded as illustrative and non-restrictive, and the scope of the present invention is limited by the appended claims rather than the above description, so it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims are included in the present invention. Any attached figure mark in the claims should not be regarded as limiting the claims involved.

[0153] In addition, it is clear that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices stated in the system claim can also be implemented by one unit or device through software or hardware. The second and other words are used to indicate names, but not to indicate any particular order.

[0154] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present invention.

Claims

1. An instrument calibration method based on spectral consistency, characterized in that: include: The spectrum to be calibrated is obtained by an instrument, wherein the spectrum to be calibrated of the standard material for spectrum calibration is obtained by an instrument, wherein the abscissa of the spectrum to be calibrated is the wavelength, frequency or wave number, and the ordinate is the light intensity; Interpolation fitting step: making the horizontal coordinates of the standard spectrum of the standard material for spectrum calibration and the spectrum to be calibrated the same through interpolation fitting; Normalization processing step: normalizing the standard spectrum after interpolation fitting and the spectrum to be calibrated; Similarity analysis step: using a window moving method to analyze the similarity between the normalized standard spectrum and the spectrum to be calibrated, and obtaining the spectrum to be calibrated after the window moving with the highest similarity; Y-axis calibration step: calibrate the spectrum to be calibrated after the window with the highest similarity is moved on the Y-axis, so that the spectrum to be calibrated after the window with the highest similarity is moved and the standard spectrum intensity matches; The method further includes: measuring the standard spectrum of the standard substance by using a spectrum metrology standard device; Among them, it also includes: Compare the resolution of the instrument with that of a spectral metrology standard; If the resolution of the instrument is lower than the resolution of the spectral metrology standard device, the standard spectrum is downsampled to obtain a standard spectrum with the same resolution as the instrument; Wherein, the step of downsampling the standard spectrum comprises: Downsampling the standard spectrum combined with the neighborhood weighting, the step of downsampling the standard spectrum combined with the neighborhood weighting comprises: Set the neighborhood; The light intensity corresponding to the horizontal coordinate of the spectral line to be calibrated on the standard spectrum is updated to the weighted average of the light intensity in its neighborhood, and the weight decreases as the distance from the light intensity increases.

2. An instrument calibration method based on spectral consistency, characterized in that: include: The spectrum to be calibrated is obtained by an instrument, wherein the spectrum to be calibrated of the standard material for spectrum calibration is obtained by an instrument, wherein the abscissa of the spectrum to be calibrated is the wavelength, frequency or wave number, and the ordinate is the light intensity; Interpolation fitting step: making the horizontal coordinates of the standard spectrum of the standard material for spectrum calibration and the spectrum to be calibrated the same through interpolation fitting; Normalization processing step: normalizing the standard spectrum after interpolation fitting and the spectrum to be calibrated; Similarity analysis step: using a window moving method to analyze the similarity between the normalized standard spectrum and the spectrum to be calibrated, and obtaining the spectrum to be calibrated after the window moving with the highest similarity; Y-axis calibration step: calibrate the spectrum to be calibrated after the window with the highest similarity is moved on the Y-axis, so that the spectrum to be calibrated after the window with the highest similarity is moved and the standard spectrum intensity matches; The method further includes: measuring the standard spectrum of the standard substance by a spectral metrology standard device; Among them, it also includes: Compare the resolution of the instrument with that of a spectral metrology standard; If the resolution of the instrument is lower than the resolution of the spectral metrology standard device, the standard spectrum is downsampled to obtain a standard spectrum with the same resolution as the instrument; Wherein, the step of downsampling the standard spectrum comprises: Downsampling the standard spectrum combined with the neighborhood average, the step of downsampling the standard spectrum combined with the neighborhood average comprises: Set the neighborhood; The horizontal coordinate of the spectrum line to be calibrated is obtained, and the light intensity of the spectrum line corresponding to the standard spectrum is updated to the average light intensity in its neighborhood.

3. The instrument calibration method based on spectral consistency according to claim 1 or 2, characterized in that: The step of normalizing the interpolation-fitted standard spectrum and the spectrum to be calibrated comprises: Select the peak or valley value with the largest absolute value on the Y axis in the spectrum to be calibrated to normalize the spectrum to be calibrated p ′ cal (λ)=p cal (λ) / |k cal | Among them, p cal (λ) is the spectrum to be calibrated before normalization, p' cal (λ) is the normalized spectrum to be calibrated, |k cal | is the normalization coefficient of the spectrum to be calibrated, which is also the peak or valley value with the largest absolute value on the Y axis of the spectrum to be calibrated; Select a peak or valley with the largest absolute value on the Y axis in the standard spectrum to normalize the standard spectrum p ′ std (λ)=p std (λ) / |k std | Among them, p std (λ) is the standard spectrum before normalization, p' std (λ) is the normalized standard spectrum, |k std | is the normalization coefficient of the standard spectrum, which is also the peak or valley value with the largest absolute value on the Y axis of the standard spectrum.

4. The instrument calibration method based on spectral consistency according to claim 3, characterized in that: The step of analyzing the similarity between the normalized standard spectrum and the spectrum to be calibrated by using a window moving method comprises: Respectively obtaining a normalized standard spectrum and a discrete sequence of the spectrum to be calibrated; The similarity between two discrete sequences is calculated by continuously moving and displacing the point sequence.

5. The instrument calibration method based on spectral consistency according to claim 4, characterized in that: The step of calibrating the spectrum to be calibrated after the window with the highest similarity is moved on the Y axis comprises: The spectrum to be calibrated after the window with the highest similarity is moved, divided by the normalization coefficient of the spectrum to be calibrated and multiplied by the normalization coefficient of the standard spectrum, and then calibrated in the Y-axis direction.

6. The instrument calibration method based on spectral consistency according to claim 1 or 2, characterized in that: The normalization step also includes: Spectrum sub-segment division step: divide the interpolation-fitted standard spectrum and the spectrum to be calibrated into multiple sub-segments according to the spectral range, and obtain multiple spectral sub-segments of the interpolation-fitted standard spectrum and the spectrum to be calibrated: The normalization processing step, the similarity analysis step and the Y-axis calibration step are respectively performed on the standard spectrum after interpolation fitting and the multiple spectrum sub-segments of the spectrum to be calibrated.

7. An instrument calibration system based on spectral consistency, characterized in that: include: A spectrum acquisition module, which acquires a spectrum to be calibrated of a standard substance for spectrum calibration measured by the instrument to be calibrated and a standard spectrum of the standard substance, wherein the horizontal coordinates of the spectrum to be calibrated and the standard spectrum are wavelength, frequency or wave number, and the vertical coordinates are light intensity; An interpolation fitting module, which makes the horizontal coordinates of the standard spectrum of the standard material for spectrum calibration collected by the spectrum collection module and the spectrum to be calibrated obtained by the spectrum to be calibrated obtaining module to be calibrated the same through interpolation fitting; A normalization processing module is used to perform normalization processing on the standard spectrum and the spectrum to be calibrated after interpolation fitting by the interpolation fitting module; The similarity analysis module uses a window moving method to analyze the similarity between the standard spectrum normalized by the normalization processing module and the spectrum to be calibrated, and obtains the spectrum to be calibrated after the window moving with the highest similarity; A Y-axis calibration module, calibrating the spectrum to be calibrated after the window with the highest similarity obtained by the similarity analysis module is moved on the Y-axis, so that the spectrum to be calibrated after the window with the highest similarity is moved and the standard spectrum intensity matches; Wherein, the instrument calibration system based on spectral consistency implements the steps of the instrument calibration method based on spectral consistency as described in any one of claims 1-6.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes an instrument calibration program based on spectral consistency. When the instrument calibration program based on spectral consistency is executed by a processor, the steps of the instrument calibration method based on spectral consistency as described in any one of claims 1 to 6 are implemented.

9. An electronic device, characterized in that: It comprises a memory and a processor, wherein the memory comprises an instrument calibration program based on spectral consistency, and when the instrument calibration program based on spectral consistency is executed by the processor, the steps of the instrument calibration method based on spectral consistency as described in any one of claims 1-6 are implemented.

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