An intelligent SSD production test system and method

Abstract

The present invention discloses an intelligent SSD production test system and method, which relates to the field of solid-state drives and solves the problem of inaccurate current production test methods for solid-state drives. It includes a test allocation module, a test setting module, a temperature test module, and a read-write test module. The test allocation module is used to allocate the test level of the test tasks corresponding to the solid-state drive to be tested. The test setting module is used to set the test parameters of the solid-state drive to be tested according to the test level. The temperature test module is used to test the read and write performance of the solid-state drive to be tested at different temperatures and generate a temperature anomaly signal or a temperature normal signal. The read-write test module is used to test the read and write performance of the solid-state drive to be tested. The present invention combines the sales data and repair data of the solid-state drive to achieve accurate testing of the solid-state drive in the corresponding adapted detection environment.

Description

Technical Field

[0001] The present invention belongs to the field of SSD production, relates to testing technology, and specifically is an intelligent SSD production testing system and method. Background Technique

[0002] SSD is the abbreviation of Solid State Drive, which is a storage device for data storage. It adopts solid-state storage technology and uses flash memory chips to store data. Unlike traditional mechanical hard drives that use rotating disks and moving heads, the main components of a solid-state drive are a series of flash memory chips and controller chips, which are connected through a high-speed bus. Flash memory chips use non-volatile memory technology and can retain data storage even when power is off, which means data will not be lost due to power failure. The controller chip is responsible for managing and controlling data read, write, and erase operations, as well as optimizing the overall performance of the solid-state drive. Therefore, production testing is required during the production of solid-state drives;

[0003] In the prior art, when conducting production testing on solid-state drives, usually only the hard drive performance of the solid-state drive is tested, and if the test is qualified, the solid-state drive is considered qualified. The current production testing method does not reasonably utilize the feedback data of the solid-state drive, that is, it does not reasonably utilize the sales data and maintenance data of the solid-state drive, resulting in the solid-state drive not being tested in its corresponding usage environment, thus causing the problem of inaccurate testing of the solid-state drive;

[0004] For this reason, we propose an intelligent SSD production testing system and method. Summary of the Invention

[0005] Aiming at the deficiencies of the prior art, the purpose of the present invention is to provide an intelligent SSD production testing system and method.

[0006] The technical problem to be solved by the present invention is:

[0007] How to accurately test a solid-state drive in its adapted detection environment based on feedback data.

[0008] To achieve the above purpose, the present invention adopts the following technical solutions:

[0009] An intelligent SSD production testing system includes a main control server and a testing cabinet for testing solid-state drives. The main control server is connected to an input terminal, a database, a testing cabinet, and a display terminal. The main control server includes a test allocation module, a test setting module, a temperature testing module, and a read-write testing module. The input terminal is used to input the model of the solid-state drive to be tested, and the model is sent to the database through the main control server; the database obtains the annual sales volume and maintenance data of the solid-state drive to be tested according to the model, and the annual sales volume and maintenance data are sent to the test allocation module through the main control server;

[0010] The test allocation module is used to allocate the test level of the test task corresponding to the solid state drive to be tested, and send the obtained test level of the solid state drive to be tested to the test setting module through the main control server. The test setting module is used to set the test parameters of the solid state drive to be tested according to the test level, and send the set test parameters of the solid state drive to be tested to the test cabinet. The test cabinet is used to test the solid state drive to be tested according to the test parameters;

[0011] The database also obtains the device standard parameters of the solid state drive to be tested according to the model, and the device standard parameters are sent to the temperature test module and the read-write test module through the main control server. The temperature test module is used to test the read-write performance of the solid state drive to be tested at different temperatures, generate a temperature anomaly signal or a temperature normal signal and feedback it to the main control server. If the main control server receives a temperature anomaly signal, it is sent to the display terminal, and the display terminal is used to display the temperature anomaly signal. If the main control server receives a temperature normal signal, it is sent to the read-write test module;

[0012] The read-write test module is used to test the read-write performance of the solid state drive to be tested, and the test generates a read-write anomaly signal or a read-write normal signal and feedbacks it to the main control server. The main control server sends the read-write anomaly signal or the read-write normal signal to the display terminal, and the display terminal is used to display the read-write anomaly signal or the read-write normal signal.

[0013] Preferably, the maintenance data is the after-sales maintenance type of solid state drives of different models and the total annual repair times of each after-sales maintenance type.

[0014] Preferably, the working process of the test allocation module is specifically as follows:

[0015] Obtain the annual sales volume and maintenance data of the solid state drive to be tested, count the after-sales maintenance types of the solid state drives corresponding to this model and the total annual repair times of each after-sales maintenance type, and obtain the high-temperature damage repair times and aging repair times of the solid state drive to be tested;

[0016] The high-temperature damage repair times divided by the annual sales volume gives the high-temperature failure rate of the solid state drive to be tested. Similarly, the aging repair times divided by the annual sales volume gives the aging failure rate of the solid state drive to be tested;

[0017] If the high-temperature failure rate is greater than or equal to the preset high-temperature failure rate or the aging failure rate is greater than or equal to the preset aging failure rate, then the corresponding solid state drive to be tested is assigned to the fourth test level;

[0018] If the high-temperature failure rate is less than the preset high-temperature failure rate and the aging failure rate is less than the preset aging failure rate, then calculate the quality evaluation value of the solid state drive to be tested, and compare the quality evaluation value with the quality evaluation threshold;

[0019] If the quality evaluation value of the solid state drive to be tested is greater than or equal to the second quality evaluation threshold, the corresponding solid state drive to be tested is assigned to the first test level;

[0020] If the quality evaluation value of the solid state drive to be tested is less than the second quality evaluation threshold and greater than or equal to the first quality evaluation threshold, the corresponding solid state drive to be tested is assigned to the second test level;

[0021] If the quality evaluation value of the solid state drive to be tested is less than the first quality evaluation threshold, the corresponding solid state drive to be tested is assigned to the third test level.

[0022] Preferably, the first quality evaluation threshold is less than the second quality evaluation threshold;

[0023] The test intensity of the fourth test level is higher than that of the third test level, the test intensity of the third test level is higher than that of the second test level, and the test intensity of the second test level is higher than that of the first test level.

[0024] Preferably, the setting process of the test setting module is specifically as follows:

[0025] Obtain the test level of the solid state drive to be tested, and set the corresponding test parameters for the solid state drive to be tested according to the test level. The test parameters are the file size and the number of test times of the test file when the solid state drive to be tested conducts a temperature test, and the read and write duration of the read and write test file when the solid state drive to be tested conducts a read and write aging test;

[0026] If the test level is the first test level, the file size of the corresponding test file of the solid state drive to be tested is the first file size, the number of test times of the test file is the first test number, and the read and write duration of the test file is the first read and write duration;

[0027] If the test level is the second test level, the file size of the corresponding test file of the solid state drive to be tested is the second file size, the number of test times of the test file is the second test number, and the read and write duration of the test file is the second read and write duration;

[0028] If the test level is the third test level, the file size of the corresponding test file of the solid state drive to be tested is the third file size, the number of test times of the test file is the third test number, and the read and write duration of the test file is the third read and write duration;

[0029] If the test level is the fourth test level, the file size of the corresponding test file of the solid state drive to be tested is the fourth file size, the number of test times of the test file is the fourth test number, and the read and write duration of the test file is the fourth read and write duration.

[0030] Preferably, the file sizes of the test files are, in ascending order: the first file size, the second file size, the third file size, and the fourth file size;

[0031] The test times of the test files are, in ascending order: the first test time, the second test time, the third test time, and the fourth test time;

[0032] The read-write durations of the test files are, in ascending order: the first read-write duration, the second read-write duration, the third read-write duration, and the fourth read-write duration.

[0033] Preferably, the device standard parameters are the temperature test range for the solid-state drive to conduct temperature tests, as well as the standard read speed and standard write speed of the solid-state drive, and the lower limit value of the number of read-write times of the solid-state drive for a specified file within a fixed duration.

[0034] Preferably, the test process of the temperature test module is as follows:

[0035] First, fully format the solid-state drive to be tested to clear the data files in the solid-state drive to be tested;

[0036] Then, obtain the temperature test range when the solid-state drive to be tested conducts temperature tests, as well as the test parameters of the solid-state drive to be tested;

[0037] Obtain the file size and test times of the test files corresponding to the solid-state drive to be tested based on the test parameters;

[0038] Set a temperature test at each of the temperatures corresponding to the left and right endpoints of the temperature test range, and then equally divide the temperature test range according to the remaining test times, and set temperature tests at the temperatures corresponding to the division points; where when the temperature test range cannot be equally divided, that is, when the temperature difference between the left and right endpoints cannot be divided evenly, then use the rounding method to round to two decimal places for division;

[0039] Conduct temperature tests in ascending order of temperature. When the solid-state drive to be tested is at the corresponding temperature, perform the read-write work of the test file, and record the working rate of performing the read-write work of the test file during this temperature test. The working rate includes the real-time read speed and real-time write speed of the test file during this temperature test;

[0040] If the real-time read speed is less than the standard read speed or the real-time write speed is less than the standard write speed, then generate a temperature anomaly signal;

[0041] If the real-time read speed is greater than or equal to the standard read speed, and the real-time write speed is greater than or equal to the standard write speed, then clear the test files in the solid-state drive to be tested. After clearing, perform the read-write work of the test file at another temperature again until the solid-state drive to be tested completes the temperature tests corresponding to the test times;

[0042] If the real-time read speed corresponding to each temperature test is greater than or equal to and less than the standard read speed, and the real-time write speed corresponding to each temperature test is greater than or equal to the standard write speed, then a normal temperature signal is generated;

[0043] If the real-time read speed corresponding to any one temperature test is less than the standard read speed, or if the real-time write speed corresponding to any one temperature test is less than the standard write speed, then a temperature anomaly signal is generated.

[0044] Preferably, the test process of the read-write test module is specifically as follows:

[0045] Obtain the lower limit value of the number of read-write times of the specified file by the solid-state drive to be tested within a fixed duration according to the model;

[0046] Obtain the file size of the test file corresponding to the solid-state drive to be tested at the current test level, and compare the file size of the test file with the file size of the specified file;

[0047] If the file size of the test file is equal to the file size of the specified file, no operation is performed;

[0048] If the file size of the test file is greater than the file size of the specified file, then reduce the file size of the test file until it is equal to the file size of the specified file. If the file size of the test file is less than the file size of the specified file, then increase the file size of the test file until it is equal to the file size of the specified file;

[0049] Then, according to the read-write duration, repeatedly read and write the test file of the solid-state drive to be tested until the read-write duration is reached;

[0050] Record the real-time read-write times of the test file by the solid-state drive to be tested within the read-write duration;

[0051] If the real-time read-write times are less than the lower limit value of the read-write times, then a read-write anomaly signal is generated;

[0052] If the real-time read-write times are greater than or equal to the lower limit value of the read-write times, then a read-write normal signal is generated.

[0053] In a second aspect, an intelligent SSD production test method is as follows:

[0054] Step S101, the user inputs the model of the solid-state drive to be tested, obtains the annual sales volume and maintenance data of the solid-state drive to be tested according to the model, and then allocates the test level of the corresponding test task of the solid-state drive to be tested;

[0055] Step S102, set the test parameters of the solid-state drive to be tested according to the test level, and test the solid-state drive to be tested according to the test parameters;

[0056] Step S103: Obtain the device standard parameters corresponding to the solid state drive to be tested according to the model, and test the read and write performance of the solid state drive to be tested at different temperatures in combination with the device standard parameters, and generate a temperature anomaly signal or a temperature normal signal.

[0057] Step S104: Test the read and write performance of the solid state drive to be tested based on the device standard parameters, and generate a read / write anomaly signal or a read / write normal signal.

[0058] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are as follows:

[0059] The present invention first inputs the model of the solid state drive to be tested, obtains the annual sales volume and maintenance data of the solid state drive to be tested according to the model, then allocates the test level of the test task corresponding to the solid state drive to be tested, and sets the test parameters of the solid state drive to be tested according to the test level. On the one hand, test the read and write performance of the solid state drive to be tested at different temperatures, and generate a temperature anomaly signal or a temperature normal signal. On the other hand, test the read and write performance of the solid state drive to be tested, and generate a read / write anomaly signal or a read / write normal signal. The present invention combines the sales data and maintenance data of the solid state drive to realize accurate testing of the solid state drive in the corresponding adapted detection environment. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] For the convenience of those skilled in the art to understand, the present invention will be further described below with reference to the accompanying drawings.

[0061] Figure 1 is the overall system block diagram of the present invention;

[0062] Figure 2 is the module composition diagram of the main control server in the present invention;

[0063] Figure 3 is the method flow chart of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0064] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0065] Embodiment 1: Please refer to Figure 1 and Figure 2As shown in the figure, the present invention provides an intelligent SSD production test system, including a main control server and a test cabinet for testing solid-state hard drives. The main control server is connected to an input terminal, a database, a test cabinet, and a display terminal. The main control server includes a test allocation module, a test setting module, a temperature test module, and a read / write test module;

[0066] The input terminal is used for the user to input the model of the solid-state hard drive to be tested into the main control server, and the main control server sends the model to the database;

[0067] In this embodiment, the database is used to store the annual sales volume and maintenance data of solid-state hard drives of different models. The database sends the annual sales volume and maintenance data of the solid-state hard drive to the main control server according to the model, and the main control server sends the annual sales volume and maintenance data of the solid-state hard drive to the test allocation module;

[0068] Among them, the maintenance data is the after-sales maintenance type of solid-state hard drives of different models and the total annual repair times of each after-sales maintenance type. The after-sales maintenance type specifically includes high-temperature module damage, hard drive aging, and storage data loss or damage, etc. It should be noted that in this embodiment, if the high-temperature module damage or storage data loss of the solid-state hard drive is caused by physical damage, it is not included in the statistics. For example, if the solid-state hard drive is collided or squeezed, causing damage to the heat sink, which in turn leads to damage to the high-temperature module of the solid-state hard drive;

[0069] The test allocation module is used to allocate the test level of the corresponding test task for the solid-state hard drive to be tested. The specific working process is as follows:

[0070] Obtain the annual sales volume and maintenance data of the solid-state hard drive to be tested, count the after-sales maintenance type of the corresponding solid-state hard drive of this model and the total annual repair times of each after-sales maintenance type, and obtain the high-temperature damage repair times and aging repair times of the solid-state hard drive to be tested; in this embodiment, only the high-temperature damage times and aging times of the solid-state hard drive are counted;

[0071] The high-temperature damage repair times are compared with the annual sales volume to obtain the high-temperature failure rate WLg of the solid-state hard drive to be tested. Similarly, the aging repair times are compared with the annual sales volume to obtain the aging failure rate WLl of the solid-state hard drive to be tested;

[0072] If the high-temperature failure rate is greater than or equal to the preset high-temperature failure rate or the aging failure rate is greater than or equal to the preset aging failure rate, the corresponding solid-state hard drive to be tested is allocated to the fourth test level. If the high-temperature failure rate is less than the preset high-temperature failure rate and the aging failure rate is less than the preset aging failure rate, the next step is entered;

[0073] Calculate the quality evaluation value ZP of the solid-state hard drive to be tested through the formula. The specific formula is as follows:

[0074] ZP = e / (A1 × WLg + A2 × WLl), where e is the natural constant, both A1 and A2 are proportionality coefficients with fixed values, and the values of A1 and A2 are both greater than zero;

[0075] If the quality evaluation value of the solid-state drive to be tested is greater than or equal to the second quality evaluation threshold, the corresponding solid-state drive to be tested will be assigned to the first test level. If the quality evaluation value of the solid-state drive to be tested is less than the second quality evaluation threshold and greater than or equal to the first quality evaluation threshold, the corresponding solid-state drive to be tested will be assigned to the second test level. If the quality evaluation value of the solid-state drive to be tested is less than the first quality evaluation threshold, the corresponding solid-state drive to be tested will be assigned to the third test level;

[0076] Among them, the first quality evaluation threshold is less than the second quality evaluation threshold. The test intensity of the fourth test level is higher than that of the third test level. The test intensity of the third test level is higher than that of the second test level. The test intensity of the second test level is higher than that of the first test level;

[0077] The test allocation module feeds back the test level of the solid-state drive to be tested to the main control server, and the server sends the test level of the solid-state drive to be tested to the test setting module.

[0078] In this embodiment, the test cabinet is configured with test files for temperature testing and read-write aging testing of the solid-state drive. The test files include but are not limited to text files, image files, video files, etc.;

[0079] Before the test, the test setting module is used to set the test parameters of the solid-state drive to be tested according to the test level. The specific setting process is as follows:

[0080] Obtain the test level of the solid-state drive to be tested, and set the corresponding test parameters of the solid-state drive to be tested according to the test level. The test parameters are the file size and the number of test times of the test file when the solid-state drive to be tested conducts temperature testing, and the read-write duration of the read-write test file when the solid-state drive to be tested conducts read-write aging testing;

[0081] If the test level is the first test level, the file size of the corresponding test file of the solid-state drive to be tested is the first file size, the number of test times of the test file is the first test number, and the read-write duration of the test file is the first read-write duration;

[0082] If the test level is the second test level, the file size of the corresponding test file of the solid-state drive to be tested is the second file size, the number of test times of the test file is the second test number, and the read-write duration of the test file is the second read-write duration;

[0083] If the test level is the third - level test level, the file size of the test file corresponding to the solid - state drive to be tested is the third file size, the number of test times of the test file is the third number of test times, and the read - write duration of the test file is the third read - write duration;

[0084] If the test level is the fourth - level test level, the file size of the test file corresponding to the solid - state drive to be tested is the fourth file size, the number of test times of the test file is the fourth number of test times, and the read - write duration of the test file is the fourth read - write duration;

[0085] Among them, the file sizes of the test files are, from small to large: the first file size, the second file size, the third file size, and the fourth file size; the numbers of test times of the test files are, from few to many: the first number of test times, the second number of test times, the third number of test times, and the fourth number of test times; the read - write durations of the test files are, from short to long: the first read - write duration, the second read - write duration, the third read - write duration, and the fourth read - write duration;

[0086] For example, the first file size can be 4GB, the second file size can be 8GB, the third file size can be 16GB, the fourth file size can be 32GB, the first number of test times can be 100 times, the second number of test times can be 200 times, the third number of test times can be 300 times, and the fourth number of test times can be 400 times;

[0087] The test - setting module sends the test parameters of the solid - state drive to be tested to the test cabinet, and the test cabinet is used to test the solid - state drive to be tested according to the test parameters.

[0088] In this embodiment, the database is also used to store the device standard parameters and test data of solid - state drives of different models. The database sends the corresponding device standard parameters to the main control server according to the model, and the main control server sends the device standard parameters to the temperature - test module and the read - write test module;

[0089] It should be specifically noted that the device standard parameters are the temperature - test range for the solid - state drive to perform temperature tests, the standard read speed and standard write speed of the solid - state drive, and the lower limit value of the number of read - write times of the solid - state drive for a specified file within a fixed duration;

[0090] In this embodiment, the temperature - test module is used to test the read - write performance of the solid - state drive to be tested at different temperatures. The specific test process is as follows:

[0091] First, format the entire disk of the solid - state drive to be tested to clear the data files in the solid - state drive to be tested;

[0092] Then, obtain the temperature - test range when the solid - state drive to be tested is performing temperature tests, and the test parameters of the solid - state drive to be tested;

[0093] Obtain the file size and the number of test times of the test file corresponding to the solid state drive to be tested according to the test parameters;

[0094] Set a temperature test at the temperatures corresponding to the left and right endpoints of the temperature test interval respectively, and then equally divide the temperature test interval according to the remaining number of test times, and set a temperature test at the temperature corresponding to the division point; among them, when the temperature test interval cannot be equally divided, that is, when the temperature difference between the left and right endpoints cannot be divided exactly, then use the rounding method to round to two decimal places for division;

[0095] Illustratively, the number of test times of the solid state drive to be tested is 3 times, and the temperature test interval is [10°C, 20°C]. First, set a temperature test at the temperatures corresponding to the left and right endpoints of the temperature test interval respectively, and then set a temperature test at 15°C;

[0096] Perform temperature tests in ascending order of temperature. When the solid state drive to be tested is at the corresponding temperature, perform the read and write operations of the test file, and record the working rate of the read and write operations of the test file during this temperature test. The working rate includes the real-time read speed and the real-time write speed of the test file during this temperature test;

[0097] If the real-time read speed is less than the standard read speed or the real-time write speed is less than the standard write speed, then generate a temperature anomaly signal;

[0098] If the real-time read speed is greater than or equal to the standard read speed and the real-time write speed is greater than or equal to the standard write speed, then clear the test file in the solid state drive to be tested. After the clearing is completed, perform the read and write operations of the test file again at another temperature until the solid state drive to be tested completes the temperature test corresponding to the number of test times;

[0099] If the real-time read speed corresponding to each temperature test is greater than or equal to and less than the standard read speed, and the real-time write speed corresponding to each temperature test is greater than or equal to the standard write speed, then generate a temperature normal signal;

[0100] If the real-time read speed corresponding to any one temperature test is less than the standard read speed, or if the real-time write speed corresponding to any one temperature test is less than the standard write speed, then generate a temperature anomaly signal;

[0101] The temperature test module feeds back the temperature anomaly signal or the temperature normal signal to the main control server. If the main control server receives the temperature anomaly signal, it sends it to the display terminal, and the display terminal is used to display the temperature anomaly signal. If the main control server receives the temperature normal signal, it sends it to the read and write test module, that is, to perform the subsequent test steps.

[0102] In this embodiment, the read-write test module is used to test the read-write performance of the solid-state drive to be tested. The specific test process is as follows:

[0103] Obtain the lower limit value of the number of read-write times of the solid-state drive to be tested for a specified file within a fixed duration according to the model;

[0104] Obtain the file size of the test file corresponding to the solid-state drive to be tested at the current test level, and compare the file size of the test file with the file size of the specified file;

[0105] If the file size of the test file is equal to the file size of the specified file, do nothing;

[0106] If the file size of the test file is greater than the file size of the specified file, reduce the file size of the test file by means such as compression until it is equal to the file size of the specified file. If the file size of the test file is less than the file size of the specified file, increase the file size of the test file by means such as file addition until it is equal to the file size of the specified file;

[0107] Then, according to the read-write duration, repeatedly read and write the test file of the solid-state drive to be tested until the read-write duration is reached;

[0108] Record the real-time read-write times of the test file by the solid-state drive to be tested within the read-write duration;

[0109] If the real-time read-write times are less than the lower limit value of the read-write times, generate a read-write abnormal signal;

[0110] If the real-time read-write times are greater than or equal to the lower limit value of the read-write times, generate a read-write normal signal;

[0111] The read-write test module feeds back the read-write abnormal signal or the read-write normal signal to the main control server, and the main control server sends the read-write abnormal signal or the read-write normal signal to the display terminal. The display terminal is used to display the read-write abnormal signal or the read-write normal signal;

[0112] In this application, if there are corresponding calculation formulas, the above calculation formulas are all calculated by taking the numerical value without dimension. For the coefficients such as the weight coefficient and the proportionality coefficient in the formula, the set size is a result value obtained by quantifying each parameter. Regarding the size of the weight coefficient and the proportionality coefficient, as long as it does not affect the proportional relationship between the parameter and the result value.

[0113] Embodiment 2: Based on another concept of the same invention, please refer to Figure 3 As shown, another intelligent SSD production test method is proposed. The specific method is as follows:

[0114] Step S101: The user inputs the model of the solid-state drive to be tested, obtains the annual sales volume and maintenance data of the solid-state drive to be tested according to the model, and then allocates the test level for the corresponding test task of the solid-state drive to be tested.

[0115] Step S102: Set the test parameters of the solid-state drive to be tested according to the test level, and test the solid-state drive to be tested according to the test parameters.

[0116] Step S103: At the same time, obtain the device standard parameters corresponding to the solid-state drive to be tested according to the model, and test the read and write performance of the solid-state drive to be tested at different temperatures in combination with the device standard parameters, and generate a temperature anomaly signal or a temperature normal signal.

[0117] Step S104: Test the read and write performance of the solid-state drive to be tested based on the device standard parameters, and generate a read and write anomaly signal or a read and write normal signal.

[0118] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the present invention to the specific implementation manners. Obviously, many modifications and variations can be made according to the content of this specification. These embodiments are selected and specifically described in this specification to better explain the principle and practical application of the present invention, so that those skilled in the art in the relevant technical field can well understand and utilize the present invention. The present invention is only limited by the claims and their full scope and equivalents.

Claims

1. An intelligent SSD production test system, comprising a main control server and a test cabinet for testing solid-state drives. The main control server is connected to an input terminal, a database, the test cabinet and a display terminal, and is characterized in that The main control server includes a test allocation module, a test setting module, a temperature test module, and a read-write test module. The input terminal is used to input the model of the solid-state drive to be tested, and the model is sent to the database by the main control server. The database obtains the annual sales volume and maintenance data of the solid-state drive to be tested according to the model, and the annual sales volume and maintenance data are sent to the test allocation module by the main control server; The test allocation module is used to allocate the test level of the test task corresponding to the solid-state drive to be tested. The specific working process is as follows: Obtain the annual sales volume and maintenance data of the solid-state drive to be tested, count the after-sales maintenance types of the solid-state drives corresponding to this model and the total annual repair times of each after-sales maintenance type, and obtain the high-temperature damage repair times and aging repair times of the solid-state drive to be tested; The high-temperature damage repair times are divided by the annual sales volume to obtain the high-temperature failure rate of the solid-state drive to be tested. Similarly, the aging repair times are divided by the annual sales volume to obtain the aging failure rate of the solid-state drive to be tested; If the high-temperature failure rate is greater than or equal to the preset high-temperature failure rate or the aging failure rate is greater than or equal to the preset aging failure rate, the corresponding solid-state drive to be tested is allocated to the fourth test level; If the high-temperature failure rate is less than the preset high-temperature failure rate and the aging failure rate is less than the preset aging failure rate, calculate the quality evaluation value of the solid-state drive to be tested, and compare the quality evaluation value with the quality evaluation threshold; If the quality evaluation value of the solid-state drive to be tested is greater than or equal to the second quality evaluation threshold, the corresponding solid-state drive to be tested is allocated to the first test level; If the quality evaluation value of the solid-state drive to be tested is less than the second quality evaluation threshold and greater than or equal to the first quality evaluation threshold, the corresponding solid-state drive to be tested is allocated to the second test level; If the quality evaluation value of the solid-state drive to be tested is less than the first quality evaluation threshold, the corresponding solid-state drive to be tested is allocated to the third test level; The test allocation module sends the obtained test level of the solid-state drive to be tested to the test setting module through the main control server. The test setting module is used to set the test parameters of the solid-state drive to be tested according to the test level, and send the set test parameters of the solid-state drive to be tested to the test cabinet. The test cabinet is used to test the solid-state drive to be tested according to the test parameters. Specifically: Obtain the test level of the solid-state drive to be tested, and set the corresponding test parameters of the solid-state drive to be tested according to the test level. The test parameters are the file size and test times of the test file when the solid-state drive to be tested conducts temperature tests, and the read-write duration of the read-write test file when the solid-state drive to be tested conducts read-write aging tests; The database also obtains the device standard parameters of the solid-state drive to be tested according to the model, and the device standard parameters are sent to the temperature test module and the read-write test module by the main control server. The temperature test module is used to test the read-write performance of the solid-state drive to be tested at different temperatures, generate a temperature anomaly signal or a temperature normal signal and feedback it to the main control server. If the main control server receives a temperature anomaly signal, it is sent to the display terminal, and the display terminal is used to display the temperature anomaly signal. If the main control server receives a temperature normal signal, it is sent to the read-write test module; The read-write test module is used to test the read-write performance of the solid-state drive to be tested, and generates a read-write abnormal signal or a read-write normal signal to feedback to the main control server. The main control server sends the read-write abnormal signal or the read-write normal signal to the display terminal, and the display terminal is used to display the read-write abnormal signal or the read-write normal signal.

2. The intelligent SSD production test system according to claim 1, wherein, The maintenance data is the after-sales maintenance types of solid-state drives of different models and the total annual repair times of each after-sales maintenance type.

3. An intelligent SSD production test system according to claim 1, characterized in that, The first quality judgment threshold is less than the second quality judgment threshold; The test intensity of the fourth test level is higher than that of the third test level, the test intensity of the third test level is higher than that of the second test level, and the test intensity of the second test level is higher than that of the first test level.

4. An intelligent SSD production test system according to claim 1, characterized in that, The setting process of the test setting module is specifically as follows: If the test level is the first test level, the file size of the test file corresponding to the solid-state drive to be tested is the first file size, the number of test times of the test file is the first test time, and the read-write duration of the test file is the first read-write duration; If the test level is the second test level, the file size of the test file corresponding to the solid-state drive to be tested is the second file size, the number of test times of the test file is the second test time, and the read-write duration of the test file is the second read-write duration; If the test level is the third test level, the file size of the test file corresponding to the solid-state drive to be tested is the third file size, the number of test times of the test file is the third test time, and the read-write duration of the test file is the third read-write duration; If the test level is the fourth test level, the file size of the test file corresponding to the solid-state drive to be tested is the fourth file size, the number of test times of the test file is the fourth test time, and the read-write duration of the test file is the fourth read-write duration.

5. An intelligent SSD production test system according to claim 4, characterized in that, The file sizes of the test files are in ascending order: the first file size, the second file size, the third file size, and the fourth file size; The number of test times of the test files is in ascending order: the first test time, the second test time, the third test time, and the fourth test time; The read-write durations of the test files are in ascending order: the first read-write duration, the second read-write duration, the third read-write duration, and the fourth read-write duration.

6. The intelligent SSD production test system according to claim 1, characterized in that, The device standard parameters are the temperature test range for the temperature test of the solid-state drive, the standard read speed and standard write speed of the solid-state drive, and the lower limit value of the number of read-write times of the solid-state drive for a specified file within a fixed duration.

7. An intelligent SSD production test system according to claim 6, characterized in that, The test process of the temperature test module is specifically as follows: First, format the entire disk of the solid-state drive to be tested to clear the data files in the solid-state drive to be tested; Then, obtain the temperature test range when the solid-state drive to be tested is undergoing a temperature test, and the test parameters of the solid-state drive to be tested; Obtain the file size and number of test times of the test file corresponding to the solid-state drive to be tested according to the test parameters; Set a temperature test at the temperatures corresponding to the left and right endpoints of the temperature test range respectively, and then equally divide the temperature test range according to the remaining number of test times, and set temperature tests at the temperatures corresponding to the division points; Perform temperature tests in ascending order of temperature. When the solid state drive (SSD) to be tested is at the corresponding temperature, perform the read and write operations of the test file, and record the working rate of the read and write operations of the test file during this temperature test. The working rate includes the real-time read speed and real-time write speed of the test file during this temperature test. If the real-time read speed is less than the standard read speed or the real-time write speed is less than the standard write speed, generate a temperature anomaly signal. If the real-time read speed is greater than or equal to the standard read speed and the real-time write speed is greater than or equal to the standard write speed, delete the test file in the SSD to be tested. After deletion, perform the read and write operations of the test file again at another temperature until the SSD to be tested completes the temperature tests for the corresponding number of tests. If the real-time read speed corresponding to each temperature test is greater than or equal to and less than the standard read speed, and the real-time write speed corresponding to each temperature test is greater than or equal to the standard write speed, generate a temperature normal signal. If the real-time read speed corresponding to any one temperature test is less than the standard read speed, or if the real-time write speed corresponding to any one temperature test is less than the standard write speed, generate a temperature anomaly signal.

8. An intelligent SSD production test system according to claim 7, characterized in that, The test process of the read / write test module is specifically as follows: Obtain the lower limit value of the read / write times of the SSD to be tested for a specified file within a fixed duration according to the model. Obtain the file size of the test file corresponding to the SSD to be tested at the current test level, and compare the file size of the test file with the file size of the specified file. If the file size of the test file is equal to the file size of the specified file, do nothing. If the file size of the test file is greater than the file size of the specified file, reduce the file size of the test file until it is equal to the file size of the specified file. If the file size of the test file is less than the file size of the specified file, increase the file size of the test file until it is equal to the file size of the specified file. Then, repeatedly read and write the test file of the SSD to be tested according to the read / write duration until the read / write duration is reached. Record the real-time read / write times of the test file by the SSD to be tested within the read / write duration. If the real-time read / write times are less than the lower limit value of the read / write times, generate a read / write anomaly signal. If the real-time read / write times are greater than or equal to the lower limit value of the read / write times, generate a read / write normal signal.

9. An intelligent SSD production and testing method, characterized in that, Based on the intelligent SSD production test system according to any one of claims 1-8, the method is specifically as follows: Step S101: The user inputs the model of the SSD to be tested, obtains the annual sales volume and maintenance data of the SSD to be tested according to the model, and then assigns the test level of the corresponding test task for the SSD to be tested. Step S102: Set the test parameters of the SSD to be tested according to the test level, and test the SSD to be tested according to the test parameters. Step S103: At the same time, obtain the device standard parameters corresponding to the SSD to be tested according to the model, and test the read and write performance of the SSD to be tested at different temperatures in combination with the device standard parameters, and generate a temperature anomaly signal or a temperature normal signal. Step S104: Based on the device standard parameters, test the read and write performance of the solid state drive to be tested, and generate a read / write abnormal signal or a read / write normal signal during the test.

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