A drive board batch test circuit and test method

Abstract

The application discloses a kind of drive board batch test circuit and test method, belong to drive board test technical field, including with each drive board connection control board, control board sends drive signal delay one clock test signal to each drive board in turn by PWM signal positive terminal, PWM signal negative terminal, simultaneously, the driving function of multiple drive boards is batch tested, by judging driving gate, source output high-low level missing condition, the driving function of each drive board can be quickly judged whether abnormal, and test efficiency is high. By connecting the drain terminals of all drive boards in parallel, connecting the source terminals in parallel, and then applying high voltage test overvoltage protection function, the overcurrent protection function of the drain and source series test is realized without replacing the test device. The problems of long time required and high cost during batch testing of drive boards are solved, and low-cost, batch drive board rapid testing is realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of drive board testing, and in particular to a drive board batch testing circuit and testing method. BACKGROUND

[0002] As an important component of power electronic converters, drive boards are the bridge connecting control boards and power devices, so how to determine the quality of drive boards before installation is a key step in the production process of power electronic converters. Modular drive boards are widely used in the batch production of power electronic converters due to their independent functions and ease of maintenance. For the function (turn-on and turn-off, over-voltage and over-current protection) testing of modular drive boards, the industry has proposed various testing methods, mainly divided into two categories:

[0003] (1) Manual single board testing, manually testing whether each drive board can work normally, and separately testing the over-voltage and over-current protection functions of each drive board;

[0004] (2) Automatic single board testing, using test machine control functions to divide a certain number of single boards into individual test objects, and sequentially testing different single board test items by controlling switching, so that batch testing of single boards can be completed according to the number of test machine control signals.

[0005] In the above two testing methods, each testing method has the following characteristics:

[0006] The first testing method (manual single board testing) is the simplest, and each drive board only needs to go through multiple steps to complete the function test. However, a large amount of manual intervention is required during the batch testing conversion process of drive, over-voltage and over-current protection functions, such as device function switching, installation of test single boards, etc., and a lot of time is required when switching multiple device functions, which seriously reduces the testing efficiency.

[0007] The second testing method (automatic single board testing) has increased testing efficiency compared to the first method, and uses a test machine to separately test the drive function, over-voltage and over-current protection function of the single board. During the testing process, manual or relay operation of the required equipment is required, and during the automatic testing of over-voltage and over-current protection functions, each single board and each function requires the participation of a relay, and high-voltage and high-current relays are relatively expensive, resulting in a relatively high cost of the entire testing platform.

[0008] Through comparative analysis, the second testing method is more commonly used due to its shorter testing time and batch testing of single functions. However, the above two testing methods still cannot quickly achieve batch testing of drive board testing functions, and the testing efficiency still needs to be improved. SUMMARY

[0009] The present application aims to overcome the problems of the prior art, and provides a drive board batch testing circuit and a testing method.

[0010] The present application aims to overcome the problems of the prior art, and provides a drive board batch testing circuit and a testing method.

[0011] The drive function testing method corresponding to the present example testing circuit comprises the following steps:

[0012] The testing signal is sent to each drive board in sequence, one cycle of the testing signal comprises one clock of the drive signal and multiple clocks of the non-drive signal, the clock number of the testing signal is determined according to the number of the drive boards, and the drive signal in the testing signal sent to each drive board is delayed by one clock in sequence.

[0013] If the levels of the output signals of the gate and the source of each drive board are consistent with the level of the drive signal, the drive function of the drive board is normal; if the levels of the output signals of the gate and the source of one or more drive boards are inconsistent with the level of the drive signal, the drive function of the corresponding one or more drive boards is abnormal.

[0014] In an example, the testing circuit further comprises a first switch module and a second switch module, the first switch module comprises a plurality of first switches for respectively connecting the source and the drain of each drive board in series, and the second switch module comprises a plurality of second switches for respectively connecting the source and the drain of adjacent drive boards in series; an overcurrent testing terminal is led out from the source or the drain of the first drive board, or the drain or the source of the last drive board.

[0015] The overcurrent protection function testing method corresponding to the present example testing circuit comprises the following steps:

[0016] All the first switches and the second switches are turned on.

[0017] The current testing signal is input to the overcurrent testing terminal.

[0018] The testing signal is sent to each drive board in sequence, one cycle of the testing signal comprises one clock of the drive signal and multiple clocks of the non-drive signal, and the drive signal in the testing signal sent to each drive board in sequence is delayed by one clock in sequence.

[0019] When the current test signal is less than the protection current, if the levels of the output signals of the gate and source electrodes of each drive board are consistent with the level of the drive signal, the overcurrent protection function of each drive board is normal; if the levels of the output signals of the gate and source electrodes of one or more drive boards are inconsistent with the level of the drive signal, the overcurrent protection function of the corresponding one or more drive boards is abnormal.

[0020] When the current test signal is greater than the protection current, if the output signals of the gate and source electrodes of one or more drive boards are high, the overcurrent protection function of the corresponding one or more drive boards is abnormal.

[0021] In an example, the test circuit further comprises a third switch module and a fourth switch module, the third switch module comprises a plurality of third switches, one end of each third switch is connected to the drain electrode of each drive board, and the other end of each third switch is connected to each other in parallel to form an overvoltage test terminal; the fourth switch module comprises a plurality of fourth switches, one end of each fourth switch is connected to the source electrode of each drive board, and the other end of each fourth switch is connected to each other in parallel to form another overvoltage test terminal.

[0022] The overvoltage protection function test method corresponding to the test circuit in the example comprises the following steps:

[0023] Turn on all third switches and fourth switches;

[0024] Input a voltage test signal to the overvoltage test terminal;

[0025] Send the test signal to each drive board in turn, one period of the test signal comprises a drive signal of one clock and a plurality of non-drive signals of a plurality of clocks, and the drive signals in the test signals sent to each drive board in turn are delayed by one clock;

[0026] When the voltage test signal is less than the protection voltage, if the levels of the output signals of the gate and source electrodes of each drive board are consistent with the level of the drive signal, the overvoltage protection function of each drive board is normal; if the levels of the output signals of the gate and source electrodes of one or more drive boards are inconsistent with the level of the drive signal, the overvoltage protection function of the corresponding one or more drive boards is abnormal;

[0027] When the voltage test signal is greater than the protection voltage, if the output signals of the gate and source electrodes of one or more drive boards are high, the overvoltage protection function of the corresponding one or more drive boards is abnormal.

[0028] In an example, the above test circuit examples are combined to obtain a preferred test circuit, at this time, the drive function test and the overcurrent protection function test, or the drive function test and the overvoltage protection function test, or the drive function test, the overcurrent protection function test and the overvoltage protection function test can be performed based on the test circuit;

[0029] The drive function test comprises:

[0030] sending the test signals to the drive boards in sequence, one cycle of the test signals comprising a drive signal of one clock and non-drive signals of multiple clocks, the number of clocks of the test signals being determined according to the number of the drive boards, and the drive signals in the test signals sent to the drive boards being delayed by one clock in sequence;

[0031] If the levels of the output signals of the gate and the source of each drive board are consistent with the level of the drive signal, the drive function of the drive board is normal; if the levels of the output signals of the gate and the source of one or more drive boards are inconsistent with the level of the drive signal, the drive function of the corresponding one or more drive boards is abnormal;

[0032] The over-current protection function test comprises:

[0033] opening all the first switches and the second switches, and closing all the third switches and the fourth switches;

[0034] inputting a current test signal through the over-current test terminal;

[0035] sending the test signals to the drive boards in sequence, one cycle of the test signals comprising a drive signal of one clock and non-drive signals of multiple clocks, and the drive signals in the test signals sent to the drive boards being delayed by one clock in sequence;

[0036] When the current test signal is less than the protection current, if the levels of the output signals of the gate and the source of each drive board are consistent with the level of the drive signal, the over-current protection function of each drive board is normal; if the levels of the output signals of the gate and the source of one or more drive boards are inconsistent with the level of the drive signal, the over-current protection function of the corresponding one or more drive boards is abnormal;

[0037] When the current test signal is greater than the protection current, if the output signals of the gate and the source of one or more drive boards are high level, the over-current protection function of the corresponding one or more drive boards is abnormal;

[0038] The over-voltage protection function test comprises:

[0039] closing all the first switches and the second switches, and opening all the third switches and the fourth switches;

[0040] inputting a voltage test signal through the over-voltage test terminal;

[0041] sending the test signals to the drive boards in sequence, one cycle of the test signals comprising a drive signal of one clock and non-drive signals of multiple clocks, and the drive signals in the test signals sent to the drive boards being delayed by one clock in sequence;

[0042] When the voltage test signal is less than the protection voltage, if the level of the output signal of the gate and the source of each drive board is consistent with the level of the drive signal, the overvoltage protection function of each drive board is normal; if the level of the output signal of the gate and the source of one or more drive boards is inconsistent with the level of the drive signal, the overvoltage protection function of the corresponding one or more drive boards is abnormal.

[0043] When the voltage test signal is greater than the protection voltage, if the output signal of the gate and the source of one or more drive boards is high, the overvoltage protection function of the corresponding one or more drive boards is abnormal.

[0044] In an example, the first switch module, the second switch module, the third switch module and the fourth switch module are connected with the control board.

[0045] Compared with the prior art, the present application has the following advantages:

[0046] 1. In an example, by sending a test signal delayed by one clock to each drive board, the drive function of a plurality of drive boards is tested in batches, and by judging the absence of high and low level output of the drive gate and source, it can be quickly determined whether the drive function of each drive board is abnormal (whether the high and low levels of the drive board are invalid), and at this time, the output signal of the gate and source of the drive board can be output in sequence and continuously, the abnormal output signal different from the drive signal can be quickly located, and the test efficiency is high.

[0047] 2. In an example, by the first switch module and the second switch module, the source and drain of all drive boards are connected in series, on this basis, a test signal delayed by one clock is sent to each drive board, and the overcurrent protection function of a plurality of drive boards is tested in batches, the size relationship between the current test signal and the protection current is combined, and the absence of high and low level output of the drive gate and source is judged, so that it can be quickly determined whether the current protection function of each drive board is abnormal, and at this time, the output signal of the gate and source of the drive board can be output in sequence and continuously, the abnormal output signal different from the drive signal can be quickly located, and the test efficiency is high. At the same time, compared with the parallel test method, the present application tests the overcurrent protection function in the form of series connection of the drain and the source, thereby reducing the output current of the power supply.

[0048] 3. In an example, all drive board source and drain are connected in parallel through the third switch module and the fourth switch module, a test signal is sent to each drive board with a delay of one clock to the drive signal, and the overvoltage protection function of the plurality of drive boards is tested in batches, the size relationship between the voltage test signal and the protection voltage is combined, and the absence of the drive gate and source output high and low level is judged, so that it can be quickly determined whether the voltage protection function of each drive board is abnormal, and at this time the output signal of the drive board gate and source can be output in sequence and continuously, the abnormal output signal of different levels from the drive signal can be quickly located, and the test efficiency is high. At the same time, compared with the series test method, the overvoltage protection function is tested in the form of drain parallel and source parallel, and the power output voltage is reduced.

[0049] 4. In an example, the drive function test, the overcurrent protection function test and the overvoltage protection function test are integrated, and all the functions to be tested of the drive board can be tested through a test circuit, without the need to replace another test device corresponding to the test function after the single test function is completed, so that the damage caused by the plugging of the drive board is greatly reduced. BRIEF DESCRIPTION OF DRAWINGS

[0050] The specific embodiments of the present application will be further described in detail below with reference to the accompanying drawings, which are provided to further understand the present application, and form a part of the present application. The same reference numerals are used to represent the same or similar parts in the accompanying drawings, and the schematic embodiments of the present application and the description thereof are used to explain the present application, and do not constitute an improper limitation on the present application.

[0051] Figure 1 A test circuit diagram for drive function test provided for an example of the present application;

[0052] Figure 2 A circuit connection schematic diagram of the control board and the drive board provided for an example of the present application;

[0053] Figure 3 A test signal schematic diagram provided for an example of the present application;

[0054] Figure 4 An output signal schematic diagram when all drive board functions are normal provided for an example of the present application;

[0055] Figure 5 An output signal schematic diagram when part of the drive board function is abnormal provided for an example of the present application;

[0056] Figure 6 A test circuit diagram for overcurrent protection function test provided for an example of the present application;

[0057] Figure 7A test circuit diagram for overvoltage protection function test is provided for an example of the present application.

[0058] Figure 8 A test circuit diagram for drive function test, overcurrent protection function test and overvoltage protection function test is provided for an example of the present application. DETAILED DESCRIPTION

[0059] The technical solutions of the present application are described below in conjunction with the drawings. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0060] In the description of the present application, it should be noted that the directions or positional relationships indicated by "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like are described based on the directions or positional relationships described in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. In addition, the ordinal numbers (such as "first and second", "first to fourth", etc.) are used to distinguish objects, and are not limited to the order, and cannot be understood as indicating or implying relative importance.

[0061] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, "mounting", "connection" and "connection" should be understood in a broad sense, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the communication inside two elements. For those skilled in the art, the specific meaning of the above-mentioned terms in the present application can be understood according to the specific circumstances.

[0062] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as there is no conflict.

[0063] In an example, as shown in Figure 1 A drive board batch test circuit, which includes a control board integrated with a controller, such as an FPGA, which includes a plurality of input and output pins. Figure 2As shown, the controller is connected with the PWM signal positive end (P_1 terminal, P_2 terminal…P_n terminal, P_1 terminal in this example) and the PWM signal negative end (G_1 terminal, G_2 terminal…G_n terminal, G_1 terminal in this example) of each drive board, for example, the connection between the controller and the PWM signal positive end and the PWM signal negative end of the drive board is realized through the test cable, that is, the connection between the control board and the isolator and the driver in the drive board is realized, and the isolator and the driver are connected with the gate (G1 terminal, G2 terminal…Gn terminal, G1 terminal in this example) and the source (S1 terminal, S2 terminal…Sn terminal, S1 terminal in this example) of the switch device to be tested.

[0064] Further, the control board sends the test signal of the drive signal delayed by one clock to each drive board through the PWM signal positive end and the PWM signal negative end. One period of the test signal includes one clock of the drive signal and n-1 clocks of the non-drive signal, and the number n of clocks of the test signal is determined according to the number of drive boards. The drive signal can be a high-level signal, and the non-drive signal is a low-level signal at this time. The drive signal can also be a low-level signal, and the non-drive signal is a high-level signal at this time.

[0065] Based on the test circuit in this example, a test method for testing whether the drive function of the drive board is normal includes the following steps:

[0066] S11: sequentially sending test signals to each drive board.

[0067] Specifically, a high-level signal is sent to the PWM signal positive and negative ends of the drive board to determine whether each drive normally outputs a high level, that is, a drive signal as shown in the figure is sent to the P_1 and G_1 ends, the P_2 and G_2 ends of each drive board, and the P_n and G_n ends of other drive boards. Figure 3 The high-level drive signal of the first drive board is high at the first clock, the high level of the second drive board is delayed by one clock relative to the first drive board, the high level of the third drive board is delayed by two clocks relative to the first drive board, and so on. The high level of the nth drive board is delayed by n-1 clocks relative to the first drive board. Each of the above high-level drive signals is continuously low for n-1 clocks after output, and the high level appears with a period of n clocks.

[0068] S12: judging whether the output signals of the gate and the source of each drive board are abnormal.

[0069] Specifically, when the drive signal is high, when each drive is normal, the G1 and S1 ends, the G2 and S2 ends of each drive board, and the Gn and Sn ends of other drive boards output as shown in the figure. Figure 4(a) the high level shown. When sending a low level signal (driving signal) to determine whether each drive can normally output high level, when each drive is normal, the G1 and S1 terminals of each drive board, the G2 and S2 terminals and the GN and SN terminals of other drive boards will output as shown in Figure 4 (b) the low level shown. Alternatively, the output signals of the drive board gate and source can be detected by a detection device such as an oscilloscope, and the detected output signals can also be input to the host computer or control board for analysis, i.e. comparing whether the level of the driving signal is consistent with the level of the output signal, and further determining whether the drive function, overcurrent protection function, overvoltage protection function, etc. of the drive board is abnormal.

[0070] Further, the drive board output abnormality judgment, when sending a high level signal to the P_1 and G_1 terminals of the input drive board, the P_2 and G_2 terminals and the P_n and G_n terminals of other drive boards, when the m# drive board high level output is abnormal, it will output as low level, as shown in Figure 5 (a) at this time, by judging the position of the low level, the number of drive function abnormality can be determined (since the single period level clock sequence label corresponds to the drive board sequence label, such as the m clock level abnormality, the m drive board drive function abnormality), that is, the drive board with abnormal drive function. Similarly, when the m# drive board low level output is abnormal, it will output as high level, as shown in Figure 5 (b) at this time, by judging the position of the high level, the number of drive function abnormality can be determined, that is, the drive board with abnormal drive function.

[0071] In an example, as shown in Figure 6 The test circuit further includes a first switch module and a second switch module, the first switch module includes a plurality of first switches (C1, C2, …, Cn) for respectively connecting the source and drain of a single drive board; the second switch module includes a plurality of second switches (C11, C21, …, Cn1) for respectively connecting the source and drain of adjacent drive boards, and in this example, the last second switch Cn1 is led out from the source of the last drive board (drive board N); finally, in this example, the overcurrent test terminals are respectively led out from the drain of the first drive board (drive board 1) and the source of the last drive board, for receiving test current signals. Alternatively, each first switch and second switch can be a manual button, which has a great cost advantage in batch testing. Of course, each first switch and second switch can also be a switching device such as a transistor, MOS tube lamp, relay, etc., at this time, each first switch and second switch is connected with the controller, and the high and low levels are sent by the controller to control the on-off state of each first switch and second switch.

[0072] On the basis of the test circuit in this example, a test method for testing whether the overcurrent protection function of the drive board is normal, comprising the following steps:

[0073] S21: Turn on all the first switches and the second switches.

[0074] Specifically, the buttons required for testing the over-current protection function are pressed, when the over-current protection function of the driving board needs to be tested, the buttons corresponding to C1 of the driving board 1, the C11 button connected between the driving board 1 and the driving board 2 are pressed, and the buttons corresponding to C2, C21, C3, C31 and Cn and Cn1 of other driving boards are pressed at the same time. The simplified circuit of the over-current protection function is shown in Figure 6 , specifically, the drain and the source corresponding to all the driving boards are connected in series.

[0075] S22: The current test signal is input through the test terminal, and the test signal is sent to each driving board in turn, specifically, the high and low levels shown in Figure 3 are input.

[0076] S23: When the current test signal is less than the protection current, if the levels of the output signals of the gate and the source of each driving board are consistent with the level of the driving signal, the over-current protection function of each driving board is normal, otherwise, the over-current protection function is abnormal; when the current test signal is greater than the protection current, if the output signal of the gate and the source of one or more driving boards is high, the over-current protection function of the one or more driving boards is abnormal.

[0077] Specifically, when the current test signal is less than the protection current and the driving function of each channel is normal, when the high and low levels shown in Figure 3 are input, the G1 and S1 terminals of each driving board, the G2 and S2 terminals and the GN and SN terminals of other driving boards output the high and low levels shown in Figure 4 . When the current test signal is greater than the protection current and the driving function of each channel is normal, the over-current protection function is triggered at this time, when the high and low levels shown in Figure 3 are input, the G1 and S1 terminals of each driving board, the G2 and S2 terminals and the GN and SN terminals of other driving boards always output low levels.

[0078] Further, when the current test signal is greater than the protection current, when the high level signal is input to the P_1 and G_1 terminals, the P_2 and G_2 terminals and the P_n and G_n terminals of other driving boards, when the m# driving board outputs high level abnormally, it will output high level at this time, at this time, the driving board with abnormal over-current protection function can be judged by judging the position of the low level; similarly, when the m# driving board outputs low level abnormally, it will output high level at this time, at this time, the driving board with abnormal over-current protection function can be judged by judging the position of the high level.

[0079] In an example, as shown in Figure 7As shown, the test circuit also includes a third switch module and a fourth switch module. The third switch module includes several third switches (V1, V2...Vn), one end of each third switch is connected to the drain of each driver board, and the other ends are connected in parallel to form an overvoltage test terminal. The fourth switch module includes several fourth switches (V11, V21...Vn1), one end of each fourth switch is connected to the source of each driver board, and the other ends are connected in parallel to form another overvoltage test terminal, which is used to receive test voltage signals. Optionally, each third and fourth switch can be a manual button, which has a significant cost advantage in batch testing. Of course, each third and fourth switch can also be an automatic switching device such as a switching transistor (e.g., a bipolar transistor, a MOSFET lamp), a relay, etc. In this case, each third and fourth switch is connected to a controller, and the controller sends high and low levels to control the on / off state of each third and fourth switch.

[0080] Based on this example test circuit, the test method for verifying the overvoltage protection function of the driver board includes the following steps:

[0081] S31: Turn on all third and fourth switches.

[0082] Specifically, press the button required for the overvoltage protection function test. When testing the overvoltage protection function of the driver board, press the buttons corresponding to V1 and V11 on driver board 1, and the buttons corresponding to V2 and V21 on driver board 2. Simultaneously press the buttons corresponding to V3, V31, Vn, and Vn1 on other driver boards. The simplified circuit for the overvoltage protection function is as follows: Figure 7 As shown, specifically, the drains and sources of all driver boards are connected in parallel.

[0083] S32: Input voltage test signal through the voltage test terminal, and send test signals to each driver board in sequence. Specific input details are as follows: Figure 3 The high and low levels are shown.

[0084] S33: When the voltage test signal is less than the protection voltage, if the output signal level of the gate and source of each driver board is consistent with the level of the drive signal, the overvoltage protection function of each driver board is normal; otherwise, the overvoltage protection function is abnormal. When the voltage test signal is greater than the protection voltage, if the output signal of the gate and source of one or more driver boards is high, the overvoltage protection function of one or more corresponding driver boards is abnormal.

[0085] Specifically, when the voltage test signal is less than the protection voltage and all drive functions are normal, the input is as follows: Figure 3 When the high and low levels are shown, the outputs of the G1 and S1 terminals, G2 and S2 terminals of each driver board, and the GN and SN terminals of other driver boards are as follows: Figure 4The high and low levels are shown. When the voltage test signal is greater than the protection voltage and each drive function is normal, the voltage protection function is triggered at this time, and the input is high Figure 3 The high and low levels are shown. When the voltage test signal is greater than the protection voltage and each drive function is normal, the voltage protection function is triggered at this time, and the input is high

[0086] Further, when the voltage test signal is greater than the protection voltage, the high level signal is sent to the P_1 and G_1 terminals of the input drive board, the P_2 and G_2 terminals, and the P_n and G_n terminals of the other drive boards, and when the m# drive board outputs an abnormal high level, it will output a high level at this time, and the drive board with an abnormal overvoltage protection function can be determined by judging the position of the low level; similarly, when the m# drive board outputs an abnormal low level, it will output a high level at this time, and the drive board with an abnormal overvoltage protection function can be determined by judging the position of the high level.

[0087] In an example, the above-mentioned test circuit is combined to obtain a preferred example of the present application as shown in Figure 8 At this time, the test circuit includes a control board connected to the PWM signal positive terminal and the PWM signal negative terminal of each drive board; the test circuit further includes a first switch module, a second switch module, a third switch module, and a fourth switch module, and at this time, the drive function test and the overcurrent protection function test can be performed, or the drive function test and the overvoltage protection function test can be performed, or the drive function test, the overcurrent protection function test, and the overvoltage protection function test can be performed. Taking the drive function test, the overcurrent protection function test, and the overvoltage protection function test as an example, at this time, the test signal is sent to the P_1 and G_1 terminals of each drive board, the P_2 and G_2 terminals, and the P_n and G_n terminals of the other drive boards through the control board, or the overvoltage and overcurrent signals are applied to the D1 and S1 terminals, the D2 and S2 terminals, and the Dn and Sn terminals of the other drive boards, and it is observed whether the G1 and S1 terminals, the G2 and S2 terminals, and the Gn and Sn terminals of the other drive boards output normally at this time. The test method includes the following steps:

[0088] S100: performing a drive function test, including the following sub-steps:

[0089] S1001: sending a test signal to each drive board in turn;

[0090] S1002: if the levels of the output signals of the gate and source of each drive board are consistent with the levels of the drive signals, the drive function of the drive board is normal; if the levels of the output signals of the gate and source of one or more drive boards are inconsistent with the levels of the drive signals, the drive function of the corresponding one or more drive boards is abnormal;

[0091] S200: performing an overcurrent protection function test, including the following sub-steps:

[0092] S2001: open all first switches and second switches, close all third switches and fourth switches;

[0093] S2002: input current test signals through the current test terminals, and send the test signals to the driving boards in sequence;

[0094] S2003: when the current test signal is less than the protection current, if the levels of the output signals of the gate and source electrodes of each driving board are consistent with the level of the driving signal, the overcurrent protection function of each driving board is normal; if the levels of the output signals of the gate and source electrodes of one or more driving boards are inconsistent with the level of the driving signal, the overcurrent protection function of the corresponding one or more driving boards is abnormal; when the current test signal is greater than the protection current, if the output signals of the gate and source electrodes of one or more driving boards are high level, the overcurrent protection function of the corresponding one or more driving boards is abnormal;

[0095] S300: perform overvoltage protection function test, including the following sub-steps:

[0096] S3001: close all first switches and second switches, open all third switches and fourth switches;

[0097] S3002: input voltage test signals through the voltage test terminals, and send the test signals to the driving boards in sequence;

[0098] S3003: when the voltage test signal is less than the protection voltage, if the levels of the output signals of the gate and source electrodes of each driving board are consistent with the level of the driving signal, the overvoltage protection function of each driving board is normal; if the levels of the output signals of the gate and source electrodes of one or more driving boards are inconsistent with the level of the driving signal, the overvoltage protection function of the corresponding one or more driving boards is abnormal; when the voltage test signal is greater than the protection voltage, if the output signals of the gate and source electrodes of one or more driving boards are high level, the overvoltage protection function of the corresponding one or more driving boards is abnormal.

[0099] The application provides a low-cost and batched drive board rapid test circuit and method, wherein during normal drive function test of the drive board, regular drive signals are sent at the positive end and the negative end of each PWM signal, then whether the high and low levels between the gate and the source of the drive board are consistent is observed to determine whether the drive function is normal, whether the overvoltage protection function of the drive board is normal is determined by connecting the drain terminals and the source terminals of all the drive boards in parallel and applying high voltage, and whether the overcurrent protection function of the drive board is normal is determined by connecting the drain and the source in series, the drive function, the overcurrent protection function and the overvoltage protection function of the drive board can be tested without replacing the test device, the problems of long test time and high test platform cost during batched drive board test are solved, and the low-cost and batched drive board rapid test is realized. In addition, the drive signals in the test signals sent to the drive board are delayed by one clock in sequence, so that the output signals of the drive boards can be continuously displayed, and the drive board corresponding to the function abnormality can be quickly determined. Figures 4-5 .

[0100] The above specific embodiments are detailed descriptions of the application, and cannot be considered as limitations of the specific embodiments of the application. For ordinary skilled in the art to which the application belongs, some simple deductions and substitutions can be made without departing from the concept of the application, and all of them shall be considered as falling within the protection scope of the application.

Claims

1. A method for driving batch testing of a board, characterized by, The test circuit comprises a control board connected with the PWM signal positive terminal and the PWM signal negative terminal of each drive board, and the control board sends the test signal of which the drive signal is delayed by one clock to each drive board through the PWM signal positive terminal and the PWM signal negative terminal in sequence; one cycle of the test signal comprises the drive signal of one clock and the non-drive signal of multiple clocks, and the clock number of the test signal is determined according to the number of the drive boards; The test circuit further comprises a first switch module and a second switch module, the first switch module comprises a plurality of first switches for respectively connecting the source and the drain of each drive board in series, and the second switch module comprises a plurality of second switches for respectively connecting the source and the drain of adjacent drive boards in series; an overcurrent test terminal is led out from the source or the drain of the first drive board, the drain or the source of the last drive board, respectively; And / or, The test circuit further comprises a third switch module and a fourth switch module, the third switch module comprises a plurality of third switches, one end of each third switch is connected with the drain of each drive board, and the other end of each third switch is connected with each other in parallel to form an overvoltage test terminal; the fourth switch module comprises a plurality of fourth switches, one end of each fourth switch is connected with the source of each drive board, and the other end of each fourth switch is connected with each other in parallel to form another overvoltage test terminal; The test method is applied to the test circuit to perform the drive function test, the overcurrent protection function test and / or the overvoltage protection function test; The drive function test comprises the following steps: The test signal is sent to each drive board in sequence, one cycle of the test signal comprises the drive signal of one clock and the non-drive signal of multiple clocks, and the clock number of the test signal is determined according to the number of the drive boards, and the drive signal in the test signal sent to each drive board is delayed by one clock in sequence; If the level of the output signal of the gate and the source of each drive board is consistent with the level of the drive signal, the drive function of the drive board is normal; if the level of the output signal of the gate and the source of one or more drive boards is inconsistent with the level of the drive signal, the drive function of the corresponding one or more drive boards is abnormal; The overcurrent protection function test comprises: All the first switches and the second switches are opened; The current test signal is input through the overcurrent test terminal; The test signal is sent to each drive board in sequence, one cycle of the test signal comprises the drive signal of one clock and the non-drive signal of multiple clocks, and the drive signal in the test signal sent to each drive board is delayed by one clock in sequence; When the current test signal is less than the protection current, if the level of the output signal of the gate and the source of each drive board is consistent with the level of the drive signal, the overcurrent protection function of each drive board is normal; if the level of the output signal of the gate and the source of one or more drive boards is inconsistent with the level of the drive signal, the overcurrent protection function of the corresponding one or more drive boards is abnormal; When the current test signal is greater than the protection current, if the output signal of the gate and the source of one or more drive boards is high, the overcurrent protection function of the corresponding one or more drive boards is abnormal; The overvoltage protection function test comprises: All the third switches and the fourth switches are opened; The voltage test signal is input through the overvoltage test terminal; The test signals are sent to the driving boards in sequence, one cycle of the test signals includes one clock driving signal and multiple clock non-driving signals, and the driving signals in the test signals sent to the driving boards in sequence are delayed by one clock in sequence; When the voltage test signal is less than the protection voltage, if the levels of the output signals of the gates and the sources of the driving boards are consistent with the level of the driving signal, the overvoltage protection function of the driving boards is normal, and if the levels of the output signals of the gates and the sources of one or more driving boards are inconsistent with the level of the driving signal, the overvoltage protection function of the corresponding one or more driving boards is abnormal; When the voltage test signal is greater than the protection voltage, if the output signals of the gates and the sources of one or more driving boards are high level, the overvoltage protection function of the corresponding one or more driving boards is abnormal.

2. The method of claim 1, wherein, The first switch module, the second switch module, the third switch module, the fourth switch module and the control board are connected.

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