Method, device, electronic equipment and medium for airborne InSAR baseline solution

Abstract

The invention discloses a method, device, electronic device and medium for solving airborne InSAR baseline, which belongs to the field of synthetic aperture radar interferometry technology. The method comprises the following steps: obtaining an airborne InSAR image pair with registration parameters, and setting a main image and an auxiliary image; obtaining the main and auxiliary image sensor positions corresponding to the central pixels of each scanning line of the main image and the auxiliary image, and calculating the interference baseline parameters of each line; sequentially performing polynomial iterative fitting of the interference baseline parameters of all lines using polynomials of order one to three, until the elevation inversion error obtained by converting the error in the interference baseline parameter fitting residual is less than a threshold value or reaches a third-order polynomial; according to the polynomial iterative fitting result, outputting the fitting polynomial coefficient as the interference baseline parameter, or reporting that the interference baseline parameter fitting exceeds the limit. The invention performs high-precision fitting of the InSAR baseline, and realizes the optimization solution of the airborne multi-base station multi-flight InSAR baseline.

Description

Technical Field

[0001] The invention relates to a method, a device, an electronic device and a medium for solving an airborne InSAR baseline, and belongs to the technical field of synthetic aperture radar interferometry. Background Art

[0002] SAR (Synthetic Aperture Radar) is an active imaging sensor that can observe the earth around the clock and in all weather conditions without being restricted by natural conditions such as light and weather. It is widely used in many fields such as topographic mapping, natural resource survey and monitoring, disaster emergency response, military reconnaissance, etc. InSAR (InterferometricSAR) technology is an extension of SAR technology. It uses the mathematical relationship between interference phase and terrain elevation and is an important remote sensing technology for measuring three-dimensional surface information, especially surface deformation. The interference baseline is the vector formed by the position vectors of the main and auxiliary imaging radar antennas of the InSAR image pair. It is an important parameter in InSAR measurement. A small error in the interference baseline may cause a large error in terrain height. The accuracy of the baseline also has a great impact on the accuracy of the elevation and deformation finally extracted by InSAR.

[0003] The main large-scale InSAR observation systems currently include airborne InSAR systems and spaceborne InSAR systems. Airborne interferometric SAR systems are capable of high-resolution imaging and high-precision terrain and deformation inversion, and have great application potential. Airborne InSAR systems usually use baseline length and baseline inclination to describe the baseline. The baseline length is the spatial distance between the main and auxiliary imaging radar antennas, and the baseline inclination is the angle between the radar antenna line and the horizontal direction. There are many interferometric baseline solution methods. Depending on the different observation information that the baseline solution method relies on, there are currently three main methods. The first is the baseline solution based on the sensor trajectory position information. This method starts from the spatial geometric relationship of the baseline and uses the known sensor trajectory position information to solve the baseline component. It has the advantages of clear principle and simple calculation, and does not require known external information. The second is the baseline solution based on the interference pattern's own information. This method mainly uses the information contained in the interference pattern, such as interference fringes, interference phase difference, etc. to estimate the baseline component. This method can only be used in flat areas and has limited accuracy. The third is the baseline solution based on external information. This method relies on known external information such as DEM data or ground control points to improve the accuracy of baseline estimation. It has a more reliable accuracy guarantee, but for airborne InSAR systems, it is difficult to obtain high-precision external information. The first interference baseline solution method is the mainstream baseline solution method currently used.

[0004] Conventional airborne InSAR baseline length and baseline inclination use a constant as the baseline parameter respectively, which is reasonable for airborne single-base station InSAR. However, for airborne multi-base station multi-pass InSAR, the flight trajectory is complex and the constant baseline cannot accurately describe the interference baseline. A higher-order linear model is needed to fit the baseline. At the same time, in order to cooperate with the subsequent interference phase processing, the fitting model needs to be as simple as possible to obtain high-precision terrain and deformation inversion results. Summary of the invention

[0005] In order to solve the above problems, the present invention proposes a method, device, electronic equipment and medium for airborne InSAR baseline solution, which can realize the optimized solution of airborne multi-base station multi-flight InSAR baselines.

[0006] The technical solution adopted by the present invention to solve the technical problem is:

[0007] In a first aspect, an embodiment of the present invention provides a method for airborne InSAR baseline solution, comprising the following steps:

[0008] Step 1, obtain an airborne InSAR image pair with registration parameters and set the main image and auxiliary image;

[0009] Step 2, obtaining the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculating the interference baseline parameters of each line;

[0010] Step 3, using first-order polynomials, second-order polynomials and third-order polynomials in turn to perform polynomial iterative fitting on the interference baseline parameters of all rows until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, and the polynomial iterative fitting result is obtained;

[0011] Step 4: output the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iteration fitting results, or report that the interference baseline parameter fitting exceeds the limit.

[0012] As a possible implementation of this embodiment, step 2 includes the following steps:

[0013] For the middle pixel point of each scanning line of the main image in the airborne InSAR image pair, the corresponding pixel point on the auxiliary image is obtained according to the registration parameters, and the sensor positions corresponding to the middle pixel point on the main image and the corresponding pixel point on the auxiliary image are obtained according to the imaging parameters;

[0014] The interference baseline parameters are calculated using the sensor positions of the primary image and the secondary image to obtain the baseline parameters corresponding to each scanning line, wherein the interference baseline parameters include the baseline length and the baseline inclination.

[0015] As a possible implementation of this embodiment, step 3 includes the following steps:

[0016] Taking the row number as the independent variable, the first-order polynomial is used to fit the interference baseline parameters, and the interference baseline fitting residual is calculated. The first-order baseline fitting height inversion error caused by the baseline fitting residual is calculated according to the interference height inversion equation.

[0017] A threshold judgment is made on the first-order baseline fitting elevation inversion error: if the first-order baseline fitting elevation inversion error is less than the threshold, the first-order polynomial coefficient is output as the interference baseline parameter; if the first-order baseline fitting elevation inversion error is greater than the threshold, the second-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting second-order baseline fitting elevation inversion error are calculated;

[0018] A threshold judgment is made on the second-order baseline fitting elevation inversion error: if the second-order baseline fitting elevation inversion error is less than the threshold, the second-order polynomial coefficient is output as the interference baseline parameter; if the second-order baseline fitting elevation inversion error is greater than the threshold, the third-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting third-order baseline fitting elevation inversion error are calculated;

[0019] A threshold judgment is performed on the third-order baseline fitting elevation inversion error: if the third-order baseline fitting elevation inversion error is less than the threshold, the third-order polynomial coefficients are output as the interference baseline parameters; if the third-order baseline fitting elevation inversion error is greater than the threshold, it means that the interference baseline parameter fitting exceeds the limit.

[0020] As a possible implementation of this embodiment, the acquisition of the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculation of the interference baseline parameter of each line specifically include the following steps:

[0021] Take the center pixel of each scan line of the main image, the pixel coordinates are , , is the number of rows in the main image. According to the imaging parameters of the main image, the sensor position corresponding to the central pixel is calculated and expressed in geodetic coordinates as ;

[0022] Calculate the offset of the auxiliary image point relative to the central pixel point of the main image based on the interference registration parameters , the pixel coordinates of the corresponding pixel points in the auxiliary image are obtained as , According to the auxiliary image imaging parameters, the sensor position corresponding to the image point is calculated and expressed in geodetic coordinates as ;

[0023] The main image sensor position in the geodetic coordinate system and auxiliary image sensor location The sensor position in the Gaussian coordinate system is obtained by coordinate projection calculation and ;

[0024] Calculate the interferometric baseline parameters based on the sensor position:

[0025]

[0026] in, is the baseline length, is the baseline inclination, is the angle between the projection vector of the baseline vector on the horizontal plane and the flight direction of the main image sensor;

[0027] The baseline is calculated for each scan line of the main image, and the Group intervention baseline parameters < >, .

[0028] As a possible implementation of this embodiment, the polynomial iterative fitting of the interference baseline parameters of all rows is performed in sequence using a first-order polynomial, a second-order polynomial, and a third-order polynomial until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, and the polynomial iterative fitting result is obtained, which specifically includes the following steps:

[0029] By line number As the independent variable, use a first-order polynomial to Group intervention baseline parameters < > Perform first-order interference parameter fitting:

[0030]

[0031] in, is the baseline parameter obtained by fitting the first-order interference parameters, is the first-order polynomial interference baseline fitting coefficient;

[0032] Calculate the first-order interferometric baseline fit residuals:

[0033]

[0034] in, and are the first-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0035] According to the interferometric phase sensitivity equation, the first-order baseline fitting interferometric elevation inversion errors caused by baseline length and baseline inclination errors are calculated respectively:

[0036]

[0037] in is the first-order baseline fitting interference height inversion error caused by the baseline length error, is the first-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error. is the slant distance corresponding to the central pixel of the main image, is the main image radar incident angle;

[0038] The first-order baseline fitting overall interferometric elevation inversion error caused by calculating the baseline fitting residual ;

[0039] Setting the error threshold , for the first-order baseline fitting overall interferometric height inversion error Threshold judgment is performed. If the first-order baseline fits the overall interference height inversion error < , then the output As the interferometric baseline parameter; if the first-order baseline fits the overall interferometric height inversion error > , then the second-order polynomial is used to fit the parameter interference parameters:

[0040]

[0041] in, is the baseline parameter obtained by fitting the second-order interference parameters; is the second-order polynomial interferometric baseline fitting coefficient;

[0042] Calculate interferometric baseline fit residuals and :

[0043]

[0044] in, and are the second-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0045] Calculate the second-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively:

[0046]

[0047] in is the second-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the second-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error;

[0048] The overall interferometric elevation inversion error of the second-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ;

[0049] Overall interferometric elevation inversion error for second-order baseline fitting Threshold judgment is performed. If the second-order baseline fits the overall interference height inversion error < , then the output As the interference baseline parameter; if the second-order baseline fits the overall interference height inversion error > , then the third-order polynomial is used to fit the parameter interference parameters:

[0050]

[0051] in, Baseline parameters obtained by fitting the second-order interference parameters is the third-order polynomial interference baseline fitting coefficient;

[0052] Calculate interferometric baseline fit residuals and :

[0053]

[0054] in, and are the third-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0055] Calculate the third-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively:

[0056]

[0057] in is the third-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the third-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error;

[0058] The overall interferometric elevation inversion error of the third-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ;

[0059] Overall interferometric elevation inversion error for third-order baseline fitting Threshold judgment is performed. If the third-order baseline fitting overall interference elevation inversion error < , then the output As the interference baseline parameter; if the third-order baseline fits the overall interference height inversion error > , it means that the interferometric baseline parameter fitting exceeds the limit.

[0060] As a possible implementation of this embodiment, outputting the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iterative fitting results, or reporting that the interference baseline parameter fitting exceeds the limit, specifically includes the following steps:

[0061] If the first-order baseline fits the overall interferometric height inversion error < , then the output As the interference baseline parameter;

[0062] If the second-order baseline fits the overall interferometric height inversion error < , then the output As the interference baseline parameter;

[0063] If the third-order baseline fitting overall interference height inversion error < , then the output As the interference baseline parameter;

[0064] If the third-order baseline fitting overall interference height inversion error > , it is reported that the interferometric baseline parameter fitting is out of limit.

[0065] In a second aspect, an embodiment of the present invention provides an airborne InSAR baseline solution device, comprising:

[0066] The data acquisition module is used to obtain the airborne InSAR image pair with registration parameters and set the main image and auxiliary image;

[0067] A parameter calculation module, used to obtain the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculate the interference baseline parameter of each line;

[0068] An iterative fitting module is used to perform polynomial iterative fitting on the interference baseline parameters of all rows using first-order polynomials, second-order polynomials and third-order polynomials in sequence, until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, thereby obtaining a polynomial iterative fitting result;

[0069] The result output module is used to output the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iteration fitting results, or report that the interference baseline parameter fitting exceeds the limit.

[0070] As a possible implementation of this embodiment, the parameter calculation module includes:

[0071] The sensor position acquisition module is used to obtain the corresponding pixel point on the auxiliary image according to the registration parameters for the middle pixel point of each scanning line of the main image in the airborne InSAR image pair, and obtain the sensor position corresponding to the middle pixel point on the main image and the corresponding pixel point on the auxiliary image according to the imaging parameters;

[0072] The baseline parameter calculation module is used to calculate the interference baseline parameters using the sensor positions of the main image and the auxiliary image to obtain the baseline parameters corresponding to each scanning line, wherein the interference baseline parameters include the baseline length and the baseline inclination.

[0073] As a possible implementation of this embodiment, the iterative fitting module includes:

[0074] The first-order fitting module is used to fit the interference baseline parameters using the first-order polynomial with the row number as the independent variable, and calculate the interference baseline fitting residual, and calculate the first-order baseline fitting elevation inversion error caused by the baseline fitting residual according to the interference elevation inversion equation;

[0075] The second-order fitting module is used to make a threshold judgment on the first-order baseline fitting elevation inversion error: if the first-order baseline fitting elevation inversion error is less than the threshold, the first-order polynomial coefficient is output as the interference baseline parameter; if the first-order baseline fitting elevation inversion error is greater than the threshold, the second-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting second-order baseline fitting elevation inversion error are calculated;

[0076] The third-order fitting module is used to make a threshold judgment on the second-order baseline fitting elevation inversion error: if the second-order baseline fitting elevation inversion error is less than the threshold, the second-order polynomial coefficient is output as the interference baseline parameter; if the second-order baseline fitting elevation inversion error is greater than the threshold, the third-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting third-order baseline fitting elevation inversion error are calculated;

[0077] The third-order judgment module is used to perform threshold judgment on the third-order baseline fitting elevation inversion error: if the third-order baseline fitting elevation inversion error is less than the threshold, the third-order polynomial coefficient is output as the interference baseline parameter; if the third-order baseline fitting elevation inversion error is greater than the threshold, it means that the interference baseline parameter fitting exceeds the limit.

[0078] In a third aspect, an embodiment of the present invention provides an electronic device, comprising a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor. When the electronic device is running, the processor communicates with the memory through the bus, and the processor executes the machine-readable instructions to perform the steps of any of the above-mentioned airborne InSAR baseline solution methods.

[0079] In a fourth aspect, an embodiment of the present invention provides a storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of any of the above-mentioned airborne InSAR baseline solution methods are executed.

[0080] The beneficial effects of the technical solution of the embodiment of the present invention are as follows:

[0081] A method for solving an airborne InSAR baseline in the technical solution of an embodiment of the present invention comprises the following steps: Step 1, obtaining an airborne InSAR image pair with registration parameters, and setting a main image and an auxiliary image; Step 2, obtaining the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculating the interference baseline parameters of each line; Step 3, using first-order polynomials, second-order polynomials and third-order polynomials to perform polynomial iterative fitting on the interference baseline parameters of all lines in turn, until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, and the polynomial iterative fitting result is obtained; Step 4, according to the polynomial iterative fitting result, output the fitting polynomial coefficient as the interference baseline parameter, or report that the interference baseline parameter fitting exceeds the limit. The present invention realizes the optimization solution of the airborne multi-base station multi-flight InSAR baseline by performing high-precision fitting on the InSAR baseline.

[0082] The present invention can obtain high-precision interferometric baseline parameters by optimizing and fitting the airborne InSAR baseline using the simplest possible linear equation during the interferometric processing of SAR image data, thereby effectively overcoming the problem that the interferometric baseline cannot be accurately described by using constant baseline parameters due to the complex flight trajectories of airborne multi-base station and multi-pass InSAR. Compared with the prior art, the present invention has better technical effects. BRIEF DESCRIPTION OF THE DRAWINGS

[0083] Figure 1 is a flow chart of a method for airborne InSAR baseline solution according to an exemplary embodiment;

[0084] Figure 2 is a structural schematic diagram of a device for airborne InSAR baseline solution according to an exemplary embodiment;

[0085] Figure 3It is a specific implementation flow chart of using the device of the present invention to perform airborne InSAR baseline solution according to an exemplary embodiment. DETAILED DESCRIPTION

[0086] In order to more clearly illustrate the technical features of the solution of the present invention, the present invention is described in detail below through specific implementation methods and in conjunction with the accompanying drawings.

[0087] like Figure 1 As shown, an airborne InSAR baseline solution method provided by an embodiment of the present invention includes the following steps:

[0088] Step 1, obtain an airborne InSAR image pair with registration parameters and set the main image and auxiliary image;

[0089] Step 2, obtaining the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculating the interference baseline parameters of each line;

[0090] Step 3, using first-order polynomials, second-order polynomials and third-order polynomials in turn to perform polynomial iterative fitting on the interference baseline parameters of all rows until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, and the polynomial iterative fitting result is obtained;

[0091] Step 4: output the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iteration fitting results, or report that the interference baseline parameter fitting exceeds the limit.

[0092] As a possible implementation of this embodiment, step 2 includes the following steps:

[0093] For the middle pixel point of each scanning line of the main image in the airborne InSAR image pair, the corresponding pixel point on the auxiliary image is obtained according to the registration parameters, and the sensor positions corresponding to the middle pixel point on the main image and the corresponding pixel point on the auxiliary image are obtained according to the imaging parameters;

[0094] The interference baseline parameters are calculated using the sensor positions of the primary image and the secondary image to obtain the baseline parameters corresponding to each scanning line, wherein the interference baseline parameters include the baseline length and the baseline inclination.

[0095] As a possible implementation of this embodiment, step 3 includes the following steps:

[0096] Taking the row number as the independent variable, the first-order polynomial is used to fit the interference baseline parameters, and the interference baseline fitting residual is calculated. The first-order baseline fitting height inversion error caused by the baseline fitting residual is calculated according to the interference height inversion equation.

[0097] A threshold judgment is made on the first-order baseline fitting elevation inversion error: if the first-order baseline fitting elevation inversion error is less than the threshold, the first-order polynomial coefficient is output as the interference baseline parameter; if the first-order baseline fitting elevation inversion error is greater than the threshold, the second-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting second-order baseline fitting elevation inversion error are calculated;

[0098] A threshold judgment is made on the second-order baseline fitting elevation inversion error: if the second-order baseline fitting elevation inversion error is less than the threshold, the second-order polynomial coefficient is output as the interference baseline parameter; if the second-order baseline fitting elevation inversion error is greater than the threshold, the third-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting third-order baseline fitting elevation inversion error are calculated;

[0099] A threshold judgment is performed on the third-order baseline fitting elevation inversion error: if the third-order baseline fitting elevation inversion error is less than the threshold, the third-order polynomial coefficients are output as the interference baseline parameters; if the third-order baseline fitting elevation inversion error is greater than the threshold, it means that the interference baseline parameter fitting exceeds the limit.

[0100] As a possible implementation of this embodiment, the acquisition of the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculation of the interference baseline parameter of each line specifically include the following steps:

[0101] Take the center pixel of each scan line of the main image, the pixel coordinates are , , is the number of rows in the main image. According to the imaging parameters of the main image, the sensor position corresponding to the central pixel is calculated and expressed in geodetic coordinates as ;

[0102] Calculate the offset of the auxiliary image point relative to the central pixel point of the main image based on the interference registration parameters , the pixel coordinates of the corresponding pixel points in the auxiliary image are obtained as , , according to the auxiliary image imaging parameters, the sensor position corresponding to the image point is calculated and expressed in geodetic coordinates as ;

[0103] The main image sensor position in the geodetic coordinate system and auxiliary image sensor location The sensor position in the Gaussian coordinate system is obtained by coordinate projection calculation and ;

[0104] Calculate the interferometric baseline parameters based on the sensor position:

[0105]

[0106] in, is the baseline length, is the baseline inclination, is the angle between the projection vector of the baseline vector on the horizontal plane and the flight direction of the main image sensor;

[0107] The baseline is calculated for each scan line of the main image, and the Group intervention baseline parameters < >, .

[0108] As a possible implementation of this embodiment, the polynomial iterative fitting of the interference baseline parameters of all rows is performed in sequence using a first-order polynomial, a second-order polynomial, and a third-order polynomial until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, and the polynomial iterative fitting result is obtained, which specifically includes the following steps:

[0109] By line number As the independent variable, use a first-order polynomial to Group intervention baseline parameters < > Perform first-order interference parameter fitting:

[0110]

[0111] in, is the baseline parameter obtained by fitting the first-order interference parameters, is the first-order polynomial interference baseline fitting coefficient;

[0112] Calculate the first-order interferometric baseline fit residuals:

[0113]

[0114] in, and are the first-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0115] According to the interferometric phase sensitivity equation, the first-order baseline fitting interferometric elevation inversion errors caused by baseline length and baseline inclination errors are calculated respectively:

[0116]

[0117] in is the first-order baseline fitting interference height inversion error caused by the baseline length error, is the first-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error. is the slant distance corresponding to the central pixel of the main image, is the main image radar incident angle;

[0118] The first-order baseline fitting overall interferometric elevation inversion error caused by calculating the baseline fitting residual ;

[0119] Setting the error threshold , for the first-order baseline fitting overall interferometric height inversion error Threshold judgment is performed. If the first-order baseline fits the overall interference height inversion error < , then the output As the interferometric baseline parameter; if the first-order baseline fits the overall interferometric height inversion error > , then the second-order polynomial is used to fit the parameter interference parameters:

[0120]

[0121] in, is the baseline parameter obtained by fitting the second-order interference parameters; is the second-order polynomial interferometric baseline fitting coefficient;

[0122] Calculate interferometric baseline fit residuals and :

[0123]

[0124] in, and are the second-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0125] Calculate the second-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively:

[0126]

[0127] in is the second-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the second-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error;

[0128] The overall interferometric elevation inversion error of the second-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ;

[0129] Overall interferometric elevation inversion error for second-order baseline fitting Threshold judgment is performed. If the second-order baseline fits the overall interference height inversion error < , then the output As the interference baseline parameter; if the second-order baseline fits the overall interference height inversion error > , then the third-order polynomial is used to fit the parameter interference parameters:

[0130]

[0131] in, Baseline parameters obtained by fitting the second-order interference parameters is the third-order polynomial interference baseline fitting coefficient;

[0132] Calculate interferometric baseline fit residuals and :

[0133]

[0134] in, and are the third-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0135] Calculate the third-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively:

[0136]

[0137] in is the third-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the third-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error;

[0138] The overall interferometric elevation inversion error of the third-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ;

[0139] Overall interferometric elevation inversion error for third-order baseline fitting Threshold judgment is performed. If the third-order baseline fitting overall interference elevation inversion error < , then the output As the interference baseline parameter; if the third-order baseline fits the overall interference height inversion error > , it means that the interferometric baseline parameter fitting exceeds the limit.

[0140] As a possible implementation of this embodiment, outputting the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iterative fitting results, or reporting that the interference baseline parameter fitting exceeds the limit, specifically includes the following steps:

[0141] If the first-order baseline fits the overall interferometric height inversion error < , then the output As the interference baseline parameter;

[0142] If the second-order baseline fits the overall interferometric height inversion error < , then the output As the interference baseline parameter;

[0143] If the third-order baseline fitting overall interference height inversion error < , then the output As the interference baseline parameter;

[0144] If the third-order baseline fitting overall interference height inversion error > , it is reported that the interferometric baseline parameter fitting is out of limit.

[0145] like Figure 2 As shown, an airborne InSAR baseline solution device provided by an embodiment of the present invention includes:

[0146] The data acquisition module is used to obtain the airborne InSAR image pair with registration parameters and set the main image and auxiliary image;

[0147] A parameter calculation module, used to obtain the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculate the interference baseline parameter of each line;

[0148] An iterative fitting module is used to perform polynomial iterative fitting on the interference baseline parameters of all rows using first-order polynomials, second-order polynomials and third-order polynomials in sequence, until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, thereby obtaining a polynomial iterative fitting result;

[0149] The result output module is used to output the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iteration fitting results, or report that the interference baseline parameter fitting exceeds the limit.

[0150] As a possible implementation of this embodiment, the parameter calculation module includes:

[0151] The sensor position acquisition module is used to obtain the corresponding pixel point on the auxiliary image according to the registration parameters for the middle pixel point of each scanning line of the main image in the airborne InSAR image pair, and obtain the sensor position corresponding to the middle pixel point on the main image and the corresponding pixel point on the auxiliary image according to the imaging parameters;

[0152] The baseline parameter calculation module is used to calculate the interference baseline parameters using the sensor positions of the main image and the auxiliary image to obtain the baseline parameters corresponding to each scanning line, wherein the interference baseline parameters include the baseline length and the baseline inclination.

[0153] As a possible implementation of this embodiment, the iterative fitting module includes:

[0154] The first-order fitting module is used to fit the interference baseline parameters using the first-order polynomial with the row number as the independent variable, and calculate the interference baseline fitting residual, and calculate the first-order baseline fitting elevation inversion error caused by the baseline fitting residual according to the interference elevation inversion equation;

[0155] The second-order fitting module is used to make a threshold judgment on the first-order baseline fitting elevation inversion error: if the first-order baseline fitting elevation inversion error is less than the threshold, the first-order polynomial coefficient is output as the interference baseline parameter; if the first-order baseline fitting elevation inversion error is greater than the threshold, the second-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting second-order baseline fitting elevation inversion error are calculated;

[0156] The third-order fitting module is used to make a threshold judgment on the second-order baseline fitting elevation inversion error: if the second-order baseline fitting elevation inversion error is less than the threshold, the second-order polynomial coefficient is output as the interference baseline parameter; if the second-order baseline fitting elevation inversion error is greater than the threshold, the third-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting third-order baseline fitting elevation inversion error are calculated;

[0157] The third-order judgment module is used to perform threshold judgment on the third-order baseline fitting elevation inversion error: if the third-order baseline fitting elevation inversion error is less than the threshold, the third-order polynomial coefficient is output as the interference baseline parameter; if the third-order baseline fitting elevation inversion error is greater than the threshold, it means that the interference baseline parameter fitting exceeds the limit.

[0158] like Figure 3 As shown, the specific process of using the device of the present invention to perform airborne InSAR baseline solution is as follows.

[0159] Step S1, obtaining an airborne InSAR interferometric image pair with registration parameters, setting one of the images as the primary image and the other as the secondary image.

[0160] Step S2, obtaining the sensor position corresponding to the central pixel of each scanning line of the main image and the sensor position corresponding to the corresponding pixel of the auxiliary image, and calculating the interference baseline parameter of each line according to the sensor positions of the main and auxiliary images.

[0161] In the specific implementation, take the center pixel of each scan line of the main image, the pixel coordinate is ( , The sensor position corresponding to the central pixel is calculated according to the imaging parameters of the main image and expressed in geodetic coordinates as .

[0162] Calculate the offset of the auxiliary image point relative to the central pixel point of the main image based on the interference registration parameters , the pixel coordinates of the corresponding pixel points in the auxiliary image are obtained as ( ), according to the auxiliary image imaging parameters, the sensor position corresponding to the image point is calculated and expressed in geodetic coordinates as .

[0163] The sensor position in the geodetic coordinate system , The sensor position in the Gaussian coordinate system is obtained by coordinate projection calculation , , according to the sensor position, the interference baseline parameters and baseline length can be calculated and the baseline inclination , the calculation formula is as follows:

[0164]

[0165] in is the angle between the projection vector of the baseline vector on the horizontal plane and the flight direction of the main image sensor. The baseline is calculated for each scanning line of the main image, and the result is Group intervention baseline parameters < >( ).

[0166] Step S3, performing polynomial iterative fitting on the interference baseline parameters of all rows in turn using first to third order polynomials until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third order polynomial.

[0167] In the specific implementation, for the step S2 obtained Group intervention baseline parameters < >( ), firstly, the first-order polynomial is used to fit the parameter interference parameters, with the row number As the independent variable, the first-order fitting polynomial is as follows:

[0168]

[0169] in is the baseline parameter obtained by fitting the first-order interference parameters, is the first-order polynomial interference baseline fitting coefficient;

[0170] Calculate the first-order interferometric baseline fit residuals:

[0171]

[0172] in, and are the first-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0173] According to the interferometric phase sensitivity equation, the interferometric elevation inversion errors caused by baseline length and baseline inclination errors are calculated respectively:

[0174]

[0175] in is the first-order baseline fitting interference height inversion error caused by the baseline length error, is the first-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error. is the slant distance corresponding to the central pixel of the main image, is the main image radar incident angle;

[0176] The first-order baseline fitting overall interferometric elevation inversion error caused by calculating the baseline fitting residual ;

[0177] Then the first-order baseline is fitted to the overall interferometric elevation inversion error Perform threshold judgment and set the error threshold as needed , if the first-order baseline fits the overall interferometric height inversion error < , then the output As the interferometric baseline parameter; if the first-order baseline fits the overall interferometric height inversion error > , then the second-order polynomial is used to fit the parameter interference parameters:

[0178]

[0179] in, is the baseline parameter obtained by fitting the second-order interference parameters; is the second-order polynomial interferometric baseline fitting coefficient;

[0180] Recalculate the interference baseline fitting residual and :

[0181]

[0182] in, and are the second-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0183] Calculate the second-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively:

[0184]

[0185] in is the second-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the second-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error;

[0186] The overall interferometric elevation inversion error of the second-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ;

[0187] Then, the second-order baseline is fitted to the overall interference height inversion error Threshold judgment is performed. If the second-order baseline fits the overall interference height inversion error < , then the output As the interference baseline parameter; if the second-order baseline fits the overall interference height inversion error > , then the third-order polynomial is used to fit the parameter interference parameters:

[0188]

[0189] in, Baseline parameters obtained by fitting the second-order interference parameters is the third-order polynomial interference baseline fitting coefficient;

[0190] Calculate interferometric baseline fit residuals and :

[0191]

[0192] in, and are the third-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively;

[0193] Calculate the third-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively:

[0194]

[0195] in is the third-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the third-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error;

[0196] The overall interferometric elevation inversion error of the third-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ;

[0197] Then, the third-order baseline is fitted to the overall interference height inversion error Threshold judgment is performed. If the third-order baseline fitting overall interference elevation inversion error < , then the output As the interference baseline parameter; if the third-order baseline fits the overall interference height inversion error > , it means that the interferometric baseline parameter fitting exceeds the limit.

[0198] Step S4, outputting the fitting polynomial coefficients that meet the conditions as interference baseline parameters for subsequent processing, or reporting that the interference baseline parameter fitting exceeds the limit.

[0199] In the specific implementation, according to the processing result of step S3, if the first-order baseline fitting overall interference elevation inversion error < , then the output Used as interference baseline parameters for subsequent processing;

[0200] If the second-order baseline fits the overall interferometric height inversion error < , then the output Used as interference baseline parameters for subsequent processing;

[0201] If the third-order baseline fitting overall interference height inversion error < , then the output Used as interference baseline parameters for subsequent processing;

[0202] If the third-order baseline fitting overall interference height inversion error > , it is reported that the interferometric baseline parameter fitting is out of limit.

[0203] The present invention first obtains an airborne InSAR image pair with registration parameters and sets a main image and an auxiliary image, then obtains the sensor position corresponding to the central pixel of each scanning line of the main image and the sensor position corresponding to the corresponding pixel of the auxiliary image, calculates the interference baseline parameter of each line according to the sensor position corresponding to the main and auxiliary images, and then sequentially uses first to third order polynomials to perform polynomial iterative fitting on the interference baseline parameters of all lines until the elevation inversion error obtained by converting the interference baseline parameter fitting residual is less than a threshold or reaches a third order polynomial, outputs the fitting polynomial coefficients as the interference baseline parameter or reports that the interference baseline parameter fitting exceeds the limit, thereby realizing the optimization and solution of the airborne multi-base station multi-flight InSAR baseline parameters.

[0204] An electronic device provided by an embodiment of the present invention includes a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor. When the device is running, the processor communicates with the memory via the bus, and the processor executes the machine-readable instructions to perform the steps of any of the above-mentioned airborne InSAR baseline solution methods.

[0205] Specifically, the above-mentioned memory and processor can be general-purpose memory and processor, which are not specifically limited here. When the processor runs the computer program stored in the memory, the above-mentioned airborne InSAR baseline solution method can be executed.

[0206] Those skilled in the art will appreciate that the structure of the electronic device does not limit the electronic device and may include more or fewer components than shown in the figure, or combine or split certain components, or arrange the components differently.

[0207] In some embodiments, the electronic device may also include a touch screen that can be used to display a graphical user interface (e.g., a startup interface of an application) and receive user operations on the graphical user interface (e.g., startup operations on an application). The specific touch screen may include a display panel and a touch panel. The display panel may be configured in the form of LCD (Liquid Crystal Display), OLED (Organic Light-Emitting Diode), etc. The touch panel may collect the user's contact or non-contact operations on or near it, and generate pre-set operation instructions, for example, the user uses any suitable object such as a finger, stylus, or accessories on or near the touch panel. In addition, the touch panel may include two parts: a touch detection device and a touch controller. The touch detection device detects the user's touch position and posture, detects the signal brought by the touch operation, and transmits the signal to the touch controller; the touch controller receives the touch information from the touch detection device, converts it into information that the processor can process, and then sends it to the processor, and can receive and execute commands from the processor. In addition, the touch panel can be implemented by various types such as resistive, capacitive, infrared and surface acoustic wave, and any technology developed in the future can also be used to implement the touch panel. Further, the touch panel can cover the display panel, and the user can operate on or near the touch panel covered on the display panel according to the graphical user interface displayed on the display panel. After the touch panel detects the operation on or near it, it is transmitted to the processor to determine the user input, and then the processor provides corresponding visual output on the display panel in response to the user input. In addition, the touch panel and the display panel can be implemented as two independent components or integrated.

[0208] Corresponding to the method for starting the above application, an embodiment of the present invention further provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned methods for airborne InSAR baseline solution are executed.

[0209] The application startup device provided in the embodiment of the present application can be specific hardware on the device or software or firmware installed on the device. The device provided in the embodiment of the present application, its implementation principle and the technical effect produced are the same as those in the aforementioned method embodiment. For the sake of brief description, the parts not mentioned in the device embodiment can refer to the corresponding contents in the aforementioned method embodiment. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the systems, devices and units described above can all refer to the corresponding processes in the aforementioned method embodiment, and will not be repeated here.

[0210] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.

[0211] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of modules is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0212] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0213] In addition, each functional module in the embodiments provided in the present application may be integrated into one processing module, or each module may exist physically separately, or two or more modules may be integrated into one module.

[0214] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0215] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0216] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0217] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for airborne InSAR baseline solution, characterized in that: The steps include: Step 1, obtain an airborne InSAR image pair with registration parameters and set the main image and auxiliary image; Step 2, obtaining the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculating the interference baseline parameters of each line; Step 3, using first-order polynomials, second-order polynomials and third-order polynomials in turn to perform polynomial iterative fitting on the interference baseline parameters of all rows until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, and the polynomial iterative fitting result is obtained; Step 4: output the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iteration fitting results, or report that the interference baseline parameter fitting exceeds the limit; The step 2 comprises the following steps: For the middle pixel point of each scanning line of the main image in the airborne InSAR image pair, the corresponding pixel point on the auxiliary image is obtained according to the registration parameters, and the sensor positions corresponding to the middle pixel point on the main image and the corresponding pixel point on the auxiliary image are obtained according to the imaging parameters; The interference baseline parameters are calculated using the sensor positions of the primary image and the secondary image to obtain the baseline parameters corresponding to each scanning line, wherein the interference baseline parameters include the baseline length and the baseline inclination; The step 3 comprises the following steps: Taking the row number as the independent variable, the first-order polynomial is used to fit the interference baseline parameters, and the interference baseline fitting residual is calculated. The first-order baseline fitting height inversion error caused by the baseline fitting residual is calculated according to the interference height inversion equation. A threshold judgment is performed on the first-order baseline fitting elevation inversion error: if the first-order baseline fitting elevation inversion error is less than the threshold, the first-order polynomial coefficient is output as the interference baseline parameter; If the first-order baseline fitting elevation inversion error is greater than the threshold, the second-order polynomial is used to fit the interferometric baseline, and the interferometric baseline fitting residual and the resulting second-order baseline fitting elevation inversion error are calculated; A threshold judgment is performed on the second-order baseline fitting elevation inversion error: if the second-order baseline fitting elevation inversion error is less than the threshold, the second-order polynomial coefficient is output as the interference baseline parameter; If the second-order baseline fitting elevation inversion error is greater than the threshold, a third-order polynomial is used to fit the interferometric baseline, and the interferometric baseline fitting residual and the resulting third-order baseline fitting elevation inversion error are calculated; A threshold judgment is performed on the third-order baseline fitting elevation inversion error: if the third-order baseline fitting elevation inversion error is less than the threshold, the third-order polynomial coefficient is output as the interferometric baseline parameter; if the third-order baseline fitting elevation inversion error is greater than the threshold, it indicates that the interferometric baseline parameter fitting exceeds the limit; The method of obtaining the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculating the interference baseline parameter of each line, specifically includes the following steps: Take the center pixel of each scan line of the main image, the pixel coordinates are , , is the number of rows in the main image. According to the imaging parameters of the main image, the sensor position corresponding to the central pixel is calculated and expressed in geodetic coordinates as ; Calculate the offset of the auxiliary image point relative to the central pixel point of the main image based on the interference registration parameters , the pixel coordinates of the corresponding pixel points in the auxiliary image are obtained as , , according to the auxiliary image imaging parameters, the sensor position corresponding to the image point is calculated and expressed in geodetic coordinates as ; The main image sensor position in the geodetic coordinate system and auxiliary image sensor location The sensor position in the Gaussian coordinate system is obtained by coordinate projection calculation and ; Calculate the interferometric baseline parameters based on the sensor position: in, is the baseline length, is the baseline inclination, is the angle between the projection vector of the baseline vector on the horizontal plane and the flight direction of the main image sensor; The baseline is calculated for each scan line of the main image, and the Group intervention baseline parameters < >, ; The polynomial iterative fitting is performed on the interference baseline parameters of all rows by using the first-order polynomial, the second-order polynomial and the third-order polynomial in sequence until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold value or reaches the third-order polynomial, and the polynomial iterative fitting result is obtained, which specifically includes the following steps: By line number As the independent variable, use a first-order polynomial to Group intervention baseline parameters < > Perform first-order interference parameter fitting: in, is the baseline parameter obtained by fitting the first-order interference parameters, is the first-order polynomial interference baseline fitting coefficient; Calculate the first-order interferometric baseline fit residuals: in, and are the first-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively; According to the interferometric phase sensitivity equation, the first-order baseline fitting interferometric elevation inversion errors caused by baseline length and baseline inclination errors are calculated respectively: in is the first-order baseline fitting interference height inversion error caused by the baseline length error, is the first-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error. is the slant distance corresponding to the central pixel of the main image, is the main image radar incident angle; The first-order baseline fitting overall interferometric elevation inversion error caused by calculating the baseline fitting residual ; Setting the error threshold , for the first-order baseline fitting overall interferometric height inversion error Threshold judgment is performed. If the first-order baseline fits the overall interference height inversion error < , then the output As the interferometric baseline parameter; if the first-order baseline fits the overall interferometric height inversion error > , then the second-order polynomial is used to fit the parameter interference parameters: in, is the baseline parameter obtained by fitting the second-order interference parameters; is the second-order polynomial interferometric baseline fitting coefficient; Calculate interferometric baseline fit residuals and : in, and are the second-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively; Calculate the second-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively: in is the second-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the second-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error; The overall interferometric elevation inversion error of the second-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ; Overall interferometric elevation inversion error for second-order baseline fitting Threshold judgment is performed. If the second-order baseline fits the overall interference height inversion error < , then the output As the interference baseline parameter; if the second-order baseline fits the overall interference height inversion error > , then the third-order polynomial is used to fit the parameter interference parameters: in, Baseline parameters obtained by fitting the second-order interference parameters is the third-order polynomial interference baseline fitting coefficient; Calculate interferometric baseline fit residuals and : in, and are the third-order interferometric baseline fitting residuals of baseline length and baseline inclination, respectively; Calculate the third-order baseline fitting interferometric elevation inversion error caused by baseline length and baseline inclination errors respectively: in is the third-order baseline fitting interference elevation inversion error caused by the baseline length error. It is the third-order baseline fitting interferometric elevation inversion error caused by the baseline inclination error; The overall interferometric elevation inversion error of the third-order baseline fitting caused by calculating the baseline fitting residual according to the interferometric phase sensitivity equation ; Overall interferometric elevation inversion error for third-order baseline fitting Threshold judgment is performed. If the third-order baseline fitting overall interference elevation inversion error < , then the output As the interference baseline parameter; if the third-order baseline fits the overall interference height inversion error > , it means that the interferometric baseline parameter fitting exceeds the limit.

2. An airborne InSAR baseline solution device, characterized in that: The method according to claim 1 is performed, wherein the device comprises: The data acquisition module is used to obtain the airborne InSAR image pair with registration parameters and set the main image and auxiliary image; A parameter calculation module, used to obtain the main image sensor position and the auxiliary image sensor position corresponding to the central pixel of each scanning line of the main image and the auxiliary image, and calculate the interference baseline parameter of each line; An iterative fitting module is used to perform polynomial iterative fitting on the interference baseline parameters of all rows using first-order polynomials, second-order polynomials and third-order polynomials in sequence, until the elevation inversion error converted from the error in the interference baseline parameter fitting residual is less than a threshold or reaches a third-order polynomial, thereby obtaining a polynomial iterative fitting result; The result output module is used to output the fitting polynomial coefficients as the interference baseline parameters according to the polynomial iteration fitting results, or report that the interference baseline parameter fitting exceeds the limit.

3. The device for airborne InSAR baseline solution according to claim 2, characterized in that: The parameter calculation module comprises: The sensor position acquisition module is used to obtain the corresponding pixel point on the auxiliary image according to the registration parameters for the middle pixel point of each scanning line of the main image in the airborne InSAR image pair, and obtain the sensor position corresponding to the middle pixel point on the main image and the corresponding pixel point on the auxiliary image according to the imaging parameters; The baseline parameter calculation module is used to calculate the interference baseline parameters using the sensor positions of the main image and the auxiliary image to obtain the baseline parameters corresponding to each scanning line, wherein the interference baseline parameters include the baseline length and the baseline inclination.

4. The device for airborne InSAR baseline solution according to claim 3, characterized in that: The iterative fitting module comprises: The first-order fitting module is used to fit the interference baseline parameters using the first-order polynomial with the row number as the independent variable, and calculate the interference baseline fitting residual, and calculate the first-order baseline fitting elevation inversion error caused by the baseline fitting residual according to the interference elevation inversion equation; The second-order fitting module is used to make a threshold judgment on the first-order baseline fitting elevation inversion error: if the first-order baseline fitting elevation inversion error is less than the threshold, the first-order polynomial coefficient is output as the interference baseline parameter; if the first-order baseline fitting elevation inversion error is greater than the threshold, the second-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting second-order baseline fitting elevation inversion error are calculated; The third-order fitting module is used to make a threshold judgment on the second-order baseline fitting elevation inversion error: if the second-order baseline fitting elevation inversion error is less than the threshold, the second-order polynomial coefficient is output as the interference baseline parameter; if the second-order baseline fitting elevation inversion error is greater than the threshold, the third-order polynomial is used to fit the interference baseline, and the interference baseline fitting residual and the resulting third-order baseline fitting elevation inversion error are calculated; The third-order judgment module is used to perform threshold judgment on the third-order baseline fitting elevation inversion error: if the third-order baseline fitting elevation inversion error is less than the threshold, the third-order polynomial coefficient is output as the interference baseline parameter; if the third-order baseline fitting elevation inversion error is greater than the threshold, it means that the interference baseline parameter fitting exceeds the limit.

5. An electronic device, characterized in that: The electronic device comprises a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor communicates with the memory via the bus, and the processor executes the machine-readable instructions to perform the steps of the method for airborne InSAR baseline solution as described in claim 1.

6. A storage medium, characterized in that: The storage medium stores a computer program, which, when executed by a processor, executes the steps of the method for airborne InSAR baseline solution as claimed in claim 1.

Images