PCB electrical performance testing device

Abstract

A kind of PCB electrical performance testing device, including base assembly, hair button assembly and tail end line, the base assembly includes upper base, lower base and stud, the upper base is fixed on lower base by stud, the inner side of the upper base is provided with mounting table, the bottom surface of the mounting table is provided with mounting hole passing through upper base and lower base, the hair button assembly is fixed on base assembly by mounting hole, the tail end line is arranged below hair button assembly.The structure of base assembly and hair button assembly is provided, the function of signal transmission and external structure data exchange of testing device is realized, the electrical performance of different height PCB to be measured is quickly, accurately and non-damage tested, and the overall structure is simple, the processing technology is mature, easy to operate.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of PCB testing, in particular to a PCB electrical performance testing device. BACKGROUND

[0002] PCB, as a carrier for realizing reliable electrical connection of electronic components, is widely used in the fields of aviation, aerospace, shipbuilding, electronics and weapon equipment in the military industry. Nowadays, military PCB components are developing towards high density, small pitch and multi-layer, which leads to the bottleneck of high process difficulty and high complexity in the process of PCB component forming, and some PCBs after forming often have performance defects such as short circuit, open circuit and leakage. If the faulty parts cannot be screened in time after the PCB is formed, it will cause unnecessary cost waste in the subsequent manufacturing process. Therefore, how to quickly, accurately and non-destructively test the electrical performance of PCB during the PCB forming process has become one of the bottlenecks restricting the development of PCB manufacturing industry.

[0003] In recent years, with the development of PCB performance testing towards elastic contact and non-destructive testing, the testing technology based on the contact form of the button has become one of the key technologies leading the breakthrough of PCB performance testing, and the outstanding welding-free performance and low structure advantage of the button contact can also be applied to the electrical performance testing of PCBs with various structures.

[0004] The commonly used PCB electrical performance testing methods mainly include three kinds of testing methods: special type, general type and flying needle type. The special type test uses a special fixture for testing, which is only suitable for one type of PCB model. Its advantage is strong speciality, and its disadvantage is low universality. The basic principle of general type test is that the layout of PCB circuit is designed according to grid (i.e. circuit density), and is processed and designed according to hole position. Its advantage is that the probe can be reused, and its disadvantage is that it is only suitable for low density pitch test. The principle of flying needle test is to move two probes in X, Y and Z directions to test the two end points of each circuit one by one, so it does not need to make professional fixtures. Its advantage is that the testing method is simple, and its disadvantage is that the testing speed is slow.

[0005] As disclosed in the patent document with publication number CN220231914U, a PCB testing device is specifically disclosed, which comprises a test box, a test structure connected to the test box, a replacement structure and a pressing structure. The test structure comprises a needle plate and a mounting groove. The needle plate is detachably connected to the test box. The PCB body is installed in the mounting groove. The PCB body is fully contacted with the probe by the pressing structure. The pressing plate is quickly replaced by the limiting structure, which is suitable for applying downward pressure to PCB bodies of different sizes. The device adopts the general type test principle, which is only suitable for low density pitch test.

[0006] In summary, the current prior art generally exists poor test accuracy, low universality, slow test speed and other defects. Therefore, there is an urgent need for a test device based on the contact form test technology of the button to realize the rapid, accurate and non-destructive test of the electrical performance in the PCB forming process. SUMMARY

[0007] In view of the problems existing in the prior art, the present application provides a PCB electrical performance test device.

[0008] The present application is implemented in this way, a PCB electrical performance test device includes a base assembly, a button assembly and a tail end line, the base assembly includes an upper base, a lower base and a stud, the upper base is fixed on the lower base by the stud, the inner side of the upper base is provided with a mounting table, the bottom surface of the mounting table is provided with a mounting hole penetrating through the upper base and the lower base, the button assembly is fixed on the base assembly through the mounting hole, and the tail end line is arranged below the button assembly.

[0009] Further, the stud is arranged at four corners of the upper base and the lower base, the positioning end of the stud is placed in the lower base, the part of the stud protruding from the upper base is provided with a thread, and the middle part of the stud is provided with a square protrusion.

[0010] Further, a square groove matched with the square protrusion is formed in the bottom of the upper base, and the square protrusion is completely embedded in the square groove.

[0011] Further, the upper base and the lower base are of a through structure, and an avoiding through groove is arranged in the inner wall of the through structure.

[0012] Further, a guide pin is further arranged in the four corners of the upper base and the lower base.

[0013] Further, the button assembly includes a floating contact cap, a button contact and a needle body assembly, the floating contact cap is arranged above the button contact, the button contact is arranged above the needle body assembly, the lower end of the needle body assembly is provided with a tail end fixing glue, and the tail end line is connected with the lower end of the needle body assembly through the tail end fixing glue.

[0014] Further, the floating contact cap is a pointed corner with guiding and contacting functions, and the floating contact cap can axially float.

[0015] Further, a floating contact cap pointed corner and a floating contact cap pointed corner step are arranged at the upper end of the floating contact cap, the floating contact cap pointed corner step is below the floating contact cap pointed corner, and a round ladder column body is arranged at the tail end of the floating contact cap.

[0016] Further, the diameter of the step at the sharp corner of the floating contact cap is greater than the diameter of the metal hole of the PCB to be tested and less than 2 times the width of the center point of the mounting hole to the inner wall of the mounting platform.

[0017] Further, the upper circle diameter of the circular step column body is the same as the diameter of the hair button contact, and the lower circle diameter is the same as the diameter of the floating contact cap column body part.

[0018] In summary, the beneficial effects of the present application are that the hair button assembly can realize the functions of data exchange and signal transmission between the test device and the external structure, the floating contact cap enhances the universality of the structure, so that the test device can quickly match the design according to the height change of different PCBs, and realize accurate and non-damage test of the electrical performance of different height PCBs to be tested. The upper and lower split structure of the base assembly can realize the quick assembly of the test device, which is more flexible, convenient to install and disassemble, and has a simple overall structure, mature processing technology and easy operation. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced as follows.

[0020] Figure 1 is the overall structure schematic diagram of the present application;

[0021] Figure 2 is the structure schematic diagram of the stud of the present application;

[0022] Figure 3 is the structure schematic diagram of the hair button assembly of the present application;

[0023] Figure 4 is the structure schematic diagram of the guide pin of the present application;

[0024] Figure 5 is the structure schematic diagram of the floating contact cap of the present application;

[0025] Figure 6 is the overhead structure schematic diagram of the square bump of the present application;

[0026] Figure 7 is the embodiment schematic diagram of the present application;

[0027] BRIEF DESCRIPTION OF DRAWINGS 1-upper base; 2-lower base; 3-stud; 4-guide pin; 5-avoidance through groove; 6-floating contact cap; 7-hair button contact; 8-needle body assembly; 9-tail end fixing glue; 10-floating contact cap sharp corner; 11-floating contact cap sharp corner step; 12-floating contact cap tail end as circular step column body; 13-square bump; 14-test device tail end wire swinging; 15-thread; 16-positioning end; 17-PCB to be tested; 18-PCB test device. Detailed Implementation

[0028] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0029] Combination Figures 1 to 7 The image shows a specific embodiment of a PCB electrical performance testing device provided by the present invention, the details of which are as follows:

[0030] The PCB electrical performance testing device provided in this embodiment of the invention includes a base assembly, a snap-fit ​​assembly, and a tail wire 14. The base assembly includes an upper base 1, a lower base 2, and a stud 3. The upper base 1 is fixed to the lower base 2 by the stud 3. A mounting platform is provided on the inner side of the upper base 1. The bottom surface of the mounting platform is provided with a mounting hole that penetrates the upper base 1 and the lower base 2. The snap-fit ​​assembly is fixed to the base assembly through the mounting hole. The tail wire 14 is located below the snap-fit ​​assembly. The above device has a simple structure and is versatile. By setting the snap-fit ​​assembly, the design can be quickly matched according to the height variation of different PCBs, so as to realize accurate and non-destructive testing of the electrical performance of PCBs under test at different heights. Moreover, the base assembly is a split structure, which can realize the rapid assembly of the testing device.

[0031] In this embodiment, the studs 3 are disposed at the four corners of the upper base 1 and the lower base 2. The positioning end 16 of the studs 3 is placed in the lower base 2. The part of the studs 3 protruding from the upper base 1 is provided with threads 15. The middle part of the studs 3 is provided with square protrusions 13. By providing threads on the studs 3, the PCB under test and the testing device can be reliably locked. By providing the positioning end 16 of the studs 3, the studs 3 can be fixed in the base assembly, making it less prone to displacement and making the fit with the PCB under test more reliable. The square protrusions 13 make it less prone to rotation of the studs 3.

[0032] In this embodiment, a square groove is formed at the bottom of the upper base 1 to cooperate with the square protrusion 13. The square protrusion 13 is completely embedded in the square groove. The cooperation between the square protrusion 13 and the square groove ensures that the stud 3 will not rotate when the PCB under test is locked with the test device, thus playing a role in preventing rotation and improving the locking effect.

[0033] In this embodiment, the upper base 1 and the lower base 2 are connected by a through structure, and the inner wall of the through structure is provided with an avoidance groove 5, which can realize the avoidance function of the non-test area of ​​the PCB under test.

[0034] In the embodiment, the four corners of the upper base 1 and the lower base 2 are further provided with guide pins 4, which can reliably fix the upper base 1 and the lower base 2. The guide pins 4 are arranged in the four corners, so that the stress of each guide pin 4 is uniform during the assembly and use, and the fixing effect is better.

[0035] In the embodiment, the hair button assembly includes a floating contact cap 6, a hair button contact 7, and a needle body assembly 8. The floating contact cap 6 is arranged above the hair button contact 7, the hair button contact 7 is arranged above the needle body assembly 8, the lower end of the needle body assembly 8 is provided with a tail end fixing glue 9, and the tail end wire 14 is connected to the lower end of the needle body assembly 8 through the tail end fixing glue 9. The hair button assembly is reliably fixed by being arranged in the mounting hole of the upper base 1 and the lower base 2. One end of the hair button assembly is axially floating, and the other end is the tail end wire 14 of the wire swinging structure. The tail end wire 14 can be connected to an external test interface, so as to realize the function of data exchange and signal transmission between the test device and the external structure.

[0036] In the embodiment, the floating contact cap 6 is a pointed corner with guiding and contacting functions. The floating contact cap 6 can axially float, so as to ensure the position accuracy and contacting reliability of the test device during the test.

[0037] In the embodiment, the upper end of the floating contact cap 6 is provided with a floating contact cap pointed corner 10 and a floating contact cap pointed corner step 11. The floating contact cap pointed corner step 11 is below the floating contact cap pointed corner 10. The tail end of the floating contact cap 6 is provided with a round ladder column body 12. The floating contact cap pointed corner step 11 has a limiting function through the arrangement of the floating contact cap pointed corner 10 and the floating contact cap pointed corner step 11. The floating contact cap pointed corner 10 can axially float, and can be used with different PCB height changes. The tail end of the floating contact cap 6 is provided with a round ladder column body 12 structure, which can be fixed in the mounting hole of the upper base 1 by stamping, and has better stability.

[0038] In the embodiment, the diameter of the floating contact cap pointed corner step 11 is greater than the metal hole diameter of the PCB to be tested and less than twice the width of the center point of the mounting hole of the inner wall of the mounting table. The design diameter is greater than the metal hole diameter of the PCB to be tested, which can ensure that the PCB to be tested will not damage the test fixture after being locked with the test device, so as to realize the reusability of the test device and reduce the test cost.

[0039] In the embodiment, the upper round diameter of the round ladder column body 12 is the same as the diameter of the hair button contact 7, and the lower round diameter is the same as the diameter of the column part of the floating contact cap 6. The inclined surface structure of the round ladder column body 12 has a structure with one end larger and one end smaller, which has a anti-falling function, so as to ensure that the floating contact cap 6 will not fall out after being stamped and arranged in the mounting hole of the upper base 1.

[0040] In the embodiment, the test device is provided with a button joint, realizes the function of data exchange and signal transmission between the test device and external structure, and is provided with a floating contact cap, enhances the universality of the structure, so that the test device can be quickly matched according to the height change of different PCBs, realizes accurate and non-damage test of the electrical performance of different height PCBs to be tested, and is provided with an upper and lower split structure of the base joint, realizes quick assembly of the test device, enhances the flexibility of the device, is convenient to install and disassemble, and has simple overall structure, mature processing technology and convenient operation. The test device can realize quick, accurate and non-damage test of the electrical performance of the PCB in the forming process.

[0041] The above is only the preferred embodiment of the present application, and does not limit the patent scope of the present application, and any equivalent structural transformation, direct / indirect application in other related technical fields within the concept of the present application, and the contents of the present application specification and drawings are included in the patent protection scope of the present application.

Claims

1. A PCB electrical performance testing apparatus, characterized by: The utility model relates to a base assembly, button assembly and tail end wire (14), the base assembly includes upper base (1), lower base (2) and stud (3), the upper base (1) is fixed on lower base (2) through stud (3), the inboard of upper base (1) is provided with mounting platform, the bottom surface of mounting platform is provided with the mounting hole of passing through upper base (1) and lower base (2), button assembly is fixed on base assembly through mounting hole, tail end wire (14) is arranged below button assembly, button assembly includes floating contact cap (6), button contact piece (7) and needle body assembly (8), floating contact cap (6) is arranged above button contact piece (7), button contact piece (7) is arranged above needle body assembly (8), the lower end of needle body assembly (8) is provided with tail end fixed glue (9), tail end wire (14) is connected with the lower end of needle body assembly (8) through tail end fixed glue (9), floating contact cap (6) is the pointed angle with the function of guiding and contacting, and floating contact cap (6) can be axially floating, floating contact cap (6) upper end is provided with floating contact cap pointed angle (10) and floating contact cap pointed angle place step (11), floating contact cap pointed angle place step (11) is located below floating contact cap pointed angle (10), the tail end of floating contact cap (6) is provided with round ladder column body (12).

2. The PCB electrical performance test apparatus of claim 1, wherein: The stud (3) is arranged at the four corners of the upper base (1) and the lower base (2), the positioning end (16) of the stud (3) is placed in the lower base (2), the part of the stud (3) protruding from the upper base (1) is provided with threads (15), and the middle part of the stud (3) is provided with a square protrusion (13).

3. The PCB electrical performance test apparatus of claim 2, wherein: The bottom of the upper base (1) is provided with a square groove matched with the square protrusion (13), and the square protrusion (13) is completely embedded in the square groove.

4. The PCB electrical performance test apparatus of claim 1, wherein: The upper base (1) and the lower base (2) are provided with a through structure in the middle, and the inner wall of the through structure is provided with an avoiding through groove (5).

5. The PCB electrical performance testing apparatus of any one of claims 1-4, wherein: The four corners of the upper base (1) and the lower base (2) are further provided with guide pins (4) inside.

6. The PCB electrical performance test apparatus of claim 1, wherein: The diameter of the floating contact cap pointed angle place step (11) is greater than the diameter of the PCB metal hole to be measured and less than twice the width of the center point of the mounting hole of the inner wall of the mounting platform.

7. The PCB electrical performance test apparatus of claim 6, wherein: The upper circle diameter of the round ladder column body (12) is the same as the diameter of the button contact piece (7), and the lower circle diameter is the same as the diameter of the column part of the floating contact cap (6).

Images