An automated testing method and device for BAMS equipment

Abstract

This application relates to the technical field of battery management system testing, and particularly to an automated testing method and device for a BAMS device. The method includes: generating test data in response to a test instruction input by a user, and controlling an analog BCMS to generate an analog test signal according to the test data; the analog BCMS is used to generate the analog test signal; the analog test signal is used to test the response performance of the BAMS; sending the analog test signal to the BAMS device, and monitoring the response actions of the BAMS device in response to the analog test signal; calculating a response index of the BAMS device according to the response actions, and evaluating the response performance of the BAMS device according to the response index; the response index includes response time and accuracy; the method uses an analog BCMS to perform performance testing on the BAMS device, effectively avoiding the problem of incomplete coverage when using a real BCMS device to test the BAMS device.

Description

Technical Field

[0001] This application relates to the technical field of battery management system testing, and particularly to an automated testing method and device for BAMS devices. Background Art

[0002] Energy storage systems (Battery Energy Storage System, BESS) play an important role in modern power systems and can effectively regulate the storage and output of electricity. The battery management system (Battery Management System, BMS) is a key component in the energy storage system and is used to monitor and manage the state and performance of batteries. The battery management system is usually divided into two levels: the battery cluster management system (Battery Cluster Management System, BCMS) and the battery array management system (Battery Array Management System, BAMS). Among them, the BCMS is responsible for collecting information such as voltage, current, and temperature of the battery modules in the cluster, packing and uploading them to the BAMS, and managing the battery modules in the cluster to achieve the in-cluster balancing function; while the BAMS is responsible for centrally managing the batteries of the entire energy storage battery stack, connecting to each battery cluster management unit downward, interacting with other device information upward, and feeding back the operating status information of the battery array.

[0003] During the design and maintenance of energy storage systems, it is necessary to fully test the operating strategies of BAMS devices to ensure their stability and reliability under various working conditions. However, most of the existing testing methods rely on real BCMS devices for joint debugging tests. However, during the testing process, real BCMS devices are restricted by hardware conditions and environmental factors, resulting in incomplete testing coverage of BAMS devices. Summary of the Invention

[0004] Based on this, it is necessary to provide an automated testing method and device for BAMS devices in view of the above technical problems.

[0005] In a first aspect, this application proposes an automated testing method for BAMS devices. The method includes:

[0006] In response to a test instruction input by a user, generate test data, and control the simulated BCMS to generate a simulated test signal according to the test data; the simulated BCMS is used to generate the simulated test signal; the simulated test signal is used to test the response performance of the BAMS device;

[0007] Send the simulated test signal to the BAMS device and monitor the response actions of the BAMS device in response to the simulated test signal;

[0008] Calculate the response metrics of the BAMS device according to the response actions, and evaluate the response performance of the BAMS device according to the response metrics; the response metrics include response time and accuracy rate.

[0009] In one embodiment, the steps of generating test data in response to a test instruction input by a user and controlling the simulation BCMS to generate a simulated test signal according to the test data include:

[0010] Parse the test instruction input by the user, convert it into test data and generate a test case; the test instruction includes an operation mode, environmental parameters, and fault injection; the test data is used for the simulation BCMS to generate a simulated test signal;

[0011] Verify the rationality of the test case;

[0012] Control the simulation BCMS to generate the operation status data corresponding to any test step in the test case and convert it into a simulated test signal.

[0013] In one embodiment, the method further includes:

[0014] In the case where the response time of the BAMS device exceeds the preset response time, control the simulation BCMS to repeatedly send the simulated test signal of the current test step;

[0015] If it is detected that the waiting reaction time of the response action of the BAMS device is less than the preset reaction time, continue to execute the subsequent test steps;

[0016] If the waiting reaction time is not less than the preset reaction time and the current test step is not an associated step of other test steps, skip the current test step and execute the subsequent test steps;

[0017] If the waiting reaction time is not less than the preset reaction time and the current test step is an associated step of other test steps, restart the test and execute the current test step.

[0018] In one embodiment, the method further includes:

[0019] If the response action of the BAMS device is inconsistent with the expected response action and the current test step is for fault handling, increase the simulation parameter range of the fault handling;

[0020] If the response action of the BAMS device is inconsistent with the expected response action and the current test step is for mode conversion, control the simulation BCMS to send the simulated test signal corresponding to the operation status data after the mode conversion.

[0021] In one embodiment, the method further includes:

[0022] In the case of an abnormal failure of the BAMS device, if the BAMS device has a self-healing mechanism and the waiting recovery time for the response action of the BAMS device to return to normal is less than the preset recovery time, continue to execute the current test step;

[0023] If the waiting recovery time is less than the preset recovery time or the BAMS device does not have a self-healing mechanism, repeatedly send a restart instruction and a simulation test signal corresponding to the current test step to the BAMS device;

[0024] If the waiting recovery time is not less than the preset recovery time, skip the current test step and repeatedly send a restart instruction and a simulation test signal corresponding to the subsequent test step to the BAMS device.

[0025] In one embodiment, the method further includes:

[0026] If the parameter range of the environmental parameters in the test case exceeds the preset range of the BAMS device, reduce the step size of the environmental parameters in the test case and extend the preset response time;

[0027] If the environmental parameters corresponding to the current test step exceed the preset range of the BAMS device, increase the detection items for the BAMS device, and the detection items include current detection.

[0028] In one embodiment, the method further includes:

[0029] If the parameter range of the environmental parameters or the operating mode in the test case is less than the preset range of the BAMS device, generate an additional parameter range and insert it into the test case;

[0030] If the test duration exceeds the preset test time, give priority to testing the test steps with no associated steps in the test case and set the test order of the test steps with associated steps to be later.

[0031] In one embodiment, the method further includes:

[0032] If the operating mode in the test case needs to be repeatedly tested and the number of response action errors of the BAMS device in one operating mode test is less than the preset number, reduce the number of repeated tests of the operating mode.

[0033] In one embodiment, the method further includes:

[0034] Calculate a response index according to the response action of the BAMS device in response to the adjusted test case; the response index also includes action integrity and resource utilization rate;

[0035] Evaluate the response speed of the BAMS device to the operating mode under different working conditions according to the first response index; the first response index is calculated from the response action of the test case for the operating mode;

[0036] Evaluate the fault handling ability and response speed of the BAMS device according to the second response index; the second response index is calculated from the response actions injected by the test cases for the faults.

[0037] Evaluate the environmental adaptability of the BAMS device according to the third response index; the third response index is calculated from the response actions of the test cases for the environmental parameters.

[0038] In a second aspect, the present application proposes an automated testing device for a BAMS device, including:

[0039] A test case management module, configured to generate test data in response to a test instruction input by a user, and control the simulation BCMS to generate a simulation test signal according to the test data; the simulation BCMS is used to generate a simulation test signal; the simulation test signal is used to test the response performance of the BAMS device.

[0040] A test execution module, configured to send a simulation test signal to the BAMS device and monitor the response actions of the BAMS device in response to the simulation test signal.

[0041] A test analysis module, configured to calculate the response index of the BAMS device according to the response actions, and evaluate the response performance of the BAMS device according to the response index; the response index includes response time and accuracy rate.

[0042] An automated testing method for a BAMS device provided by the present application can generate test cases by responding to and identifying test data input by a user, and can automatically arrange test cases for the BAMS device according to the user's needs; by using a simulation BCMS to replace a real testing device and generating simulation test signals of the testing device in various operating states, complex environments and when faults occur according to the test cases, the stability of the test signals and the comprehensiveness of the test cases can be ensured; calculating the response index of the BAMS device and scoring the performance of the BAMS device according to the response index can comprehensively evaluate the performance of the BAMS device under different working conditions, and effectively avoid the problem of incomplete coverage in testing the BAMS device using real devices. Description of the Drawings

[0043] In order to more clearly illustrate the technical solutions in the embodiments of the present application or in the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0044] Figure 1 It is a step flowchart of an automated testing method for a BAMS device in an embodiment.

[0045] Figure 2 The flowchart of the steps for generating a simulation test signal by simulating BCMS in an embodiment;

[0046] Figure 3 The flowchart of the steps for fault handling of response timeout in an embodiment;

[0047] Figure 4 The flowchart of the steps for fault handling of response error in an embodiment;

[0048] Figure 5 The flowchart of the steps for fault handling of BAMS device anomaly in an embodiment;

[0049] Figure 6 The flowchart of the steps for fault handling of extreme environmental conditions in an embodiment;

[0050] Figure 7 The flowchart of the steps for fault handling of insufficient test case coverage in an embodiment;

[0051] Figure 8 The flowchart of the steps for evaluating device performance according to the response actions of BAMS devices in an embodiment;

[0052] Figure 9 The structural framework diagram of an automated test device for BAMS devices in an embodiment. Detailed implementation manners

[0053] For ease of understanding of the present application, the present application will be described more comprehensively below with reference to the relevant drawings. Embodiments of the present application are shown in the drawings. However, the present application may be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided so that the disclosure of the present application is thorough and complete.

[0054] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this application belongs. The terms used in the description of this application herein are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0055] In the description of this application, "a plurality" means at least two, such as two, three, etc., unless otherwise specifically defined. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features.

[0056] In this application, unless otherwise clearly specified and defined, terms such as "initial", "connected", "connected to", "fixed", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the internal communication of two components or the interaction relationship between two components, unless otherwise clearly defined. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0057] It should be noted that when an element is considered to be "connected to" another element, it can be directly connected to the other element or connected to the other element through an intermediate element. In addition, for "connection" in the following embodiments, if there is a transmission of electrical signals or data between the connected objects, it should be understood as "electrical connection", "communication connection", etc.

[0058] As used herein, the singular forms "a", "an" and "the" may also include the plural forms unless the context clearly dictates otherwise. It should also be understood that the terms "comprises / include" or "has" etc. specify the presence of the stated features, wholes, steps, operations, components, parts or combinations thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof. At the same time, the term "and / or" used in this specification includes any and all combinations of the related listed items.

[0059] A method for automated testing of a BAMS device provided by an embodiment of this application, the method includes constructing a simulated BCMS; the simulated BCMS is used to generate simulated test signals; the simulated test signals are used to test the response performance of the BAMS; as Figure 1 shown, the method includes the following steps S102 to S106:

[0060] S102, in response to a test instruction input by a user, generate test data, and control the simulated BCMS to generate simulated test signals according to the test data; the simulated BCMS is used to generate simulated test signals; the simulated test signals are used to test the response performance of the BAMS device;

[0061] Specifically, design a simulated BCMS, which has a simulation algorithm that can not only simulate the operating data of a real BCMS device according to the input battery operating state and fault state, but also receive and identify the control signals of a real BAMS device, simulate the operating data of the real BCMS device after responding to the control signals, and finally output the operating data as simulated signals to the real BAMS device. The operating data can include voltage, current and temperature.

[0062] Further, convert the test instructions input by the user into test data recognizable by the simulated BCMS, and obtain the voltage, current, and temperature data of different test steps in the test through simulation calculation by the simulated BCMS, and finally convert them into analog test signals for testing; the analog test signals also include the environmental parameters and fault injection in the test instructions.

[0063] S104. Send the analog test signal to the BAMS device and monitor the response actions of the BAMS device in response to the analog test signal.

[0064] Specifically, the simulated BCMS can communicate with the BAMS device through communication protocols applicable to energy storage systems such as Modbus and CAN bus; it can obtain the response actions of multiple target BAMS devices simultaneously and save them in the database or file system. The response actions can include extracting battery parameters, sending alarm information, and system operation commands.

[0065] S106. Calculate the response metrics of the BAMS device based on the response actions, and evaluate the response performance of the BAMS device according to the response metrics; the response metrics include response time and accuracy rate.

[0066] Specifically, perform noise reduction preprocessing on the obtained response actions; calculate the response time based on the time when the simulated BCMS sends the analog test signal and the time when the BAMS device sends the response action; judge whether each response action is correct according to the expected response results of the preset BAMS device, and calculate the accuracy rate.

[0067] Exemplarily, the response time can be the average response time :

[0068]

[0069] Among them, is the response time of the a th test step, n is the total number of response times, 0 < a ≤ n ;

[0070] The accuracy rate satisfies:

[0071]

[0072] Among them, r is the number of response actions whose response actions meet the expectations, n is the total number of response times;

[0073] Further, set the test score S :

[0074] Among them, is the average response time, is the expected average response time, is the accuracy rate, is the expected accuracy rate, is the response time weight, is the accuracy rate weight; if the test score S is not less than the preset value, it is determined that the performance of the BAMS device meets the expectation, otherwise it does not meet the expectation.

[0075] Optionally, set the response time or the accuracy rate as the key indicator. In the case where the key indicator does not meet the expectation, even if the test score S is not less than the preset value, it is determined that the performance of the BAMS device does not meet the expectation.

[0076] A BAMS device automatic testing method provided by this application generates test cases by responding to and identifying test instructions input by the user, and can automatically arrange test cases for the BAMS device according to the user's requirements; by simulating the BCMS to replace the real test device, and generating simulated test signals of the test device in various operating states, complex environments and when faults occur according to the test cases, it can ensure the stability of the test signals and the comprehensiveness of the test cases; calculating the response indicators of the BAMS device and scoring the response performance of the BAMS device according to the response indicators can comprehensively evaluate the response performance of the BAMS device under different working conditions, and effectively avoid the problem of incomplete coverage of the BAMS device test using real devices.

[0077] In an exemplary embodiment, as Figure 2 shown, in response to the test instructions input by the user, generating test data and controlling the simulated BCMS to generate simulated test signals includes the following steps S202 to S206:

[0078] S202, parsing the test instructions input by the user, converting them into test data and generating test cases; the test instructions include the operating mode, environmental parameters and fault injection; the test data is used for the simulated BCMS to generate simulated test signals.

[0079] Specifically, it supports the user to select modular preset test instructions on the GUI, and can also add custom test instructions through programming languages; according to the test instructions input by the user, automatically generate test cases and present them to the user, allowing the user to preview, modify the test cases and specify the execution order of the test cases; by simulating the initial state parameters of the operating state and environmental parameters, as well as the subsequent state parameter change process, and setting the parameters of the fault injection, generate test cases corresponding to different test purposes, and the test cases can be arranged serially or in parallel.

[0080] Among them, the operating modes may include: charging mode, discharging mode, sleep mode, equalizing charge, emergency stop state, and start / stop command; the environmental parameters may include: environmental temperature, environmental humidity, and external load; the fault injection may include: battery overvoltage, battery undervoltage, abnormal temperature, abnormal current, and communication interruption.

[0081] S204, verify the rationality of the test case.

[0082] Specifically, before the test execution, the test case generated according to the test instruction input by the user and modified by the user is verified to ensure that the test data after the conversion of the test case conforms to the simulation logic of the simulated BCMS.

[0083] S206, control the simulated BCMS to generate the operating state data corresponding to any test step in the test case and convert it into a simulated test signal.

[0084] Specifically, according to the test data converted from the serial or parallel test cases, the simulated BCMS can simulate and generate the operating state data of the BCMS device under each test step in the full test process and convert it into a simulated test signal to be sent to the BAMS device.

[0085] Exemplarily, in response to the test case with the operating state being the charging mode, the simulated BCMS generates an appropriate charging voltage and charging current as the initial operating state, and at the same time generates a curve of the operating state data varying with time.

[0086] Exemplarily, in response to the test case with the fault injection being an overheat fault, if the overheat fault occurs after 5 minutes, the simulated BCMS generates the operating state data of the battery having an overheat fault after 5 minutes.

[0087] Exemplarily, in response to the test case with the environmental parameter being a temperature change, the simulated BCMS periodically sends the changed environmental temperature data.

[0088] In an exemplary embodiment, as Figure 3 shown, the method further includes the following steps S302 to S308:

[0089] S302, in the case where the response time of the BAMS device exceeds the preset response time, control the simulated BCMS to repeatedly send the simulated test signal of the current test step.

[0090] Specifically, due to the BAMS device being stuck or the communication delay between the simulated BCMS and the BAMS device, the response time of the BAMS device may exceed the preset response time; in such a case, the simulated BCMS can send the simulated test signal of the current test step multiple times at intervals to give the BAMS device additional response time and wait for the BAMS device to respond normally.

[0091] S304, if the waiting response time for the response action of the BAMS device is less than the preset response time, then continue to execute the subsequent test steps.

[0092] Specifically, set the additional response time as the preset response time; after the second time of sending the simulated test signal corresponding to the current test step, start calculating the waiting response time; if the waiting response time is less than the preset response time and it is detected that the BAMS device issues a response action, then it is determined that the BAMS device responds normally and the test can continue.

[0093] S306, if the waiting response time is not less than the preset response time and the current test step is not an associated step of other test steps, then skip the current test step and execute the subsequent test steps.

[0094] It can be understood that not all functions in the BAMS device are independent of each other, but are related. The implementation of the latter function may depend on the implementation of several previous functions; the test steps corresponding to these conditional functions and result functions are related test steps; the related steps should be complete and orderly in the test, otherwise there will be a problem of incomplete test scope coverage.

[0095] Specifically, after the second time of sending the simulated test signal, if the waiting response time is not less than the preset response time, and the BAMS device still does not issue a response action, and the current test step has no associated steps, then the current test step can be skipped, the subsequent test steps can be executed first, and the order of the current test step can be placed behind.

[0096] S308, if the waiting response time is not less than the preset response time and the current test step is an associated step of other test steps, restart the test and execute the current test step.

[0097] Specifically, after the second time of sending the simulated test signal, if the waiting response time is not less than the preset response time, and the BAMS device still does not issue a response action, but the current test step has associated steps, then send a restart instruction and the simulated test signal corresponding to the current test step to the BAMS device.

[0098] In an exemplary embodiment, as Figure 4 shown, the method further includes the following steps S402 to S404:

[0099] S402, if the response action of the BAMS device is inconsistent with the expected response action and the current test step is for fault handling, increase the range of simulated parameters for fault handling.

[0100] Specifically, due to incorrect judgment of the current operating state of the battery or incorrect signal processing of the BCMS device, the BAMS device may have a problem that the response action is inconsistent with the expected response action. When detecting such a problem, if the current test step is to test the fault handling ability of the BAMS device, the fault simulation intensity can be continuously increased until the BAMS device reports an error, so as to test the ultimate tolerance of the BAMS device to this fault.

[0101] S404. If the response action of the BAMS device is inconsistent with the expected response action and the current test step is for mode conversion, control the simulated BCMS to send a simulated test signal corresponding to the operating state data after mode conversion.

[0102] Specifically, if the current test step is an associated step of subsequent test steps and the BAMS device has a problem that the response action is inconsistent with the expected action in the current test step, it indicates that the function of the BAMS device corresponding to the current test step may not be correctly triggered. However, for the smooth progress of the test process, the simulated BCMS can record the error log and directly output the simulated test signal of the subsequent test step.

[0103] Exemplarily, if the purpose of the current test step is to make the BAMS device enter the standby mode, but in the current test step, the BAMS device does not correctly send a response action to switch to the standby mode, at this time, the simulated BCMS can be controlled to normally output a simulated test signal corresponding to the operating state data after the BAMS device successfully switches modes.

[0104] In an exemplary embodiment, as Figure 5 shown, the method further includes the following steps S502 to S506:

[0105] S502. In the case of an abnormal fault of the BAMS device, if the BAMS device has a self-healing mechanism and the waiting recovery time for the response action of the BAMS device to return to normal is less than the preset recovery time, continue to execute the current test step.

[0106] It can be understood that in order to prevent the battery from being unusable due to the failure of the BAMS device, the BAMS device may have a self-healing mechanism, which can detect the cause of the fault and repair it when a fault occurs in itself, so that the BAMS device automatically returns to normal and ensures that the battery can be used for a long time.

[0107] Specifically, during the testing process, before the operating parameters of the testing steps approach the limits of the BAMS device, the BAMS device may still issue an error signal or experience a communication interruption due to hardware overload or other situations. In this case, if the BAMS device has a self-healing mechanism, it can wait for the BAMS device to self-heal until the BAMS device and the simulated BCMS stop reporting errors or resume communication. Starting from the time when the error action of the BAMS device is received or the communication interruption of the BAMS device is detected, when the waiting recovery time is less than the preset recovery time, after waiting for the BAMS to self-heal, record the self-healing time, and then execute the current testing step again.

[0108] S504, if the waiting recovery time is less than the preset recovery time or the BAMS device does not have a self-healing mechanism, repeatedly send a restart instruction and the simulated test signal corresponding to the current testing step to the BAMS device.

[0109] Specifically, if the BAMS device does not have a self-healing mechanism, when the waiting recovery time is less than the preset recovery time, send the restart instruction and the simulated test signal corresponding to the current testing step multiple times at intervals. After the BAMS device restarts and resumes normal communication, continue to execute the current testing step.

[0110] S506, if the waiting recovery time is not less than the preset recovery time, skip the current testing step, and repeatedly send a restart instruction and the simulated test signal corresponding to the subsequent testing steps to the BAMS device.

[0111] Specifically, if the function of the BAMS device still cannot return to normal after the waiting recovery time exceeds the preset recovery time, it may be due to a contradiction between the simulated test signal corresponding to this testing step and the program of the BAMS device. In this case, record the fault log of this testing step, skip the current testing step, issue a restart instruction and the simulated test signal of the subsequent testing steps. If the current testing step has associated steps, delete the other associated testing steps, and report an error to the user and output the fault log after the test.

[0112] In an exemplary embodiment, as Figure 6 shown, the method further includes the following steps S602 to S604:

[0113] S602, if the parameter range of the environmental parameters in the test case exceeds the preset range of the BAMS device, reduce the step size of the environmental parameters in the test case and extend the preset response time.

[0114] Specifically, in order to test the adaptability of the BAMS device in extreme environments, the range of environmental parameters set by the user in the test case may exceed the response range preset by the program in the BAMS device; when the test environmental parameters exceed the preset response range, the BAMS device may experience a lag in response actions; in this case, reduce the change step of the environmental parameters in the test case and extend the waiting time for the BAMS device to respond to ensure that the BAMS device has enough time to adapt to environmental changes until the BAMS device reaches its limit and issues an error message.

[0115] S604, if the environmental parameters corresponding to the current test step exceed the preset range of the BAMS device, add detection items for the BAMS device, and the detection items include current detection.

[0116] Specifically, if the environmental parameters corresponding to the current test step are already outside the preset response range of the BAMS device, additional detection items for certain modules in the BAMS device, such as current detection, can be added to check whether the response actions of certain modules of the BAMS device under extreme environments meet expectations.

[0117] In an exemplary embodiment, as Figure 7 shown, the method further includes the following steps S702 to S704:

[0118] S702, if the parameter range of the environmental parameters or the operating mode in the test case is smaller than the preset range of the BAMS device, generate an additional parameter range and insert it into the test case;

[0119] Specifically, if the change range of the environmental parameters and the operating mode parameters in the test case is smaller than the preset response range of the BAMS device, the test case has a problem of insufficient coverage and cannot comprehensively detect the performance of the BAMS device; in this case, the non-overlapping range between the current test case and the preset response range of the BAMS device can be generated and inserted into the test case to complete the parameter range of the BAMS device test case.

[0120] Exemplarily, in the charge and discharge test, if a certain voltage test interval is missing from the test case, insert this voltage interval into the test case and control the simulated BCMS to generate a simulated test signal for this voltage test interval to ensure that this voltage parameter interval is fully verified.

[0121] S704, if the test duration exceeds the preset test time, give priority to testing the test steps with no associated steps in the test case and set the test order of the test steps with associated steps to be later.

[0122] Specifically, because related test steps may encounter problems in testing, which may cause multiple related steps to need to be re-triggered, resulting in a significant increase in the actual test time. In actual testing, the total test time is often preset. When the test time exceeds the preset total test time, the test will be interrupted to prevent possible program errors in the BAMS device from causing a test loop. However, interrupting the test will result in insufficient coverage of the BAMS device function test. In this case, the test steps without related steps can be tested first, and then the test order of the related test steps can be adjusted to ensure the test coverage of the BAMS device function.

[0123] In an exemplary embodiment, the method further includes:

[0124] If the running mode in the test case needs to be repeatedly tested and the number of incorrect response actions of the BAMS device in a single running mode test is less than the preset number, reduce the number of repeated tests of the running mode.

[0125] Specifically, for the purpose of reducing the actual test time, during the test of the running mode, if after a complete test, it is determined that the number of incorrect response actions of the BAMS device is less than the preset number, reduce the number of repeated tests of the running mode by a certain number or directly skip the repeated test of the running mode.

[0126] In an exemplary embodiment, as Figure 8 shown, the method further includes the following steps S802 to S808:

[0127] S802, calculate the response index according to the response action of the BAMS device in response to the adjusted test case; the response index also includes action integrity and resource utilization rate.

[0128] It can be understood that during the test, adjusting the test case in real time can not only improve the test flexibility, reduce the occurrence of faults, handle the occurring faults in a timely manner, and improve the test efficiency, but also make the performance of the BAMS device in the test closer to the actual working conditions and obtain more accurate test results.

[0129] Specifically, during the test, due to various possible problems, it is necessary to adjust the parameter range or execution order of the test case. After the test, calculate the response time, accuracy rate, action integrity, and resource utilization rate according to the response action of the BAMS device obtained by testing with the adjusted test case. Based on these response indexes, the response performance of the BAMS device can be evaluated more accurately.

[0130] Among them, action integrity refers to whether the response action types of the BAMS device cover all the preset response action types, which can be obtained by the ratio of the response action types to the preset response action types; resource utilization rate refers to the occupancy of system resources and network resources by the BAMS device when responding to test cases.

[0131] S804, evaluate the response speed of the BAMS device to the operation mode under different working conditions according to the first response index; the first response index is calculated from the response actions of the test cases for the operation mode.

[0132] Specifically, according to the response actions of the BAMS device when executing test cases including the operation mode, calculate the response time and accuracy rate, and the response speed of the BAMS device to the simulated test signals of different operation modes under different operation times and different environmental parameters can be evaluated. The response speed can include the number of times of accurately responding to the simulated BCMS per unit time.

[0133] S806, evaluate the processing ability and response speed of the BAMS device to faults according to the second response index; the second response index is calculated from the response actions of the test cases for fault injection.

[0134] Specifically, according to the response actions of the BAMS device when executing test cases including fault injection, calculate the response time, accuracy rate, response integrity and resource utilization rate, and the processing ability of the BAMS device to different faults under different operation modes and environmental parameters can be comprehensively evaluated.

[0135] Among them, the response time can reflect the recognition and processing speed of the BMAS device to faults; the accuracy rate can reflect the recognition ability and processing ability of the BAMS device to faults; the response integrity can reflect the parallel processing ability of the BAMS device for processes such as sending instructions to the BCMS, adjusting resource configuration, and reporting errors to the superior device; the resource utilization rate can reflect the software and hardware system performance of the BAMS device.

[0136] S808, evaluate the environmental adaptability of the BAMS device according to the third response index; the third response index is calculated from the response actions of the test cases for environmental parameters.

[0137] Specifically, according to the response actions of the BAMS device when executing test cases including changes in environmental parameters, calculate the response time, accuracy rate, response integrity and resource utilization rate, and the environmental adaptability of the BAMS device under different working conditions to different environments can be comprehensively evaluated.

[0138] It should be understood that although Figures 1 - 8The steps in the flowchart are shown in sequence according to the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figures 1 - 8 At least some of the steps may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or in rotation with at least some of the steps or stages in other steps or other steps.

[0139] Based on the same inventive concept, an embodiment of the present application also provides an automated test device 900 for a BAMS device involved above. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the automated test device for a BAMS device provided below can refer to the limitations on the automated test method for a BAMS device in the above text, and will not be repeated here.

[0140] An automated test device 900 for a BAMS device, as Figure 9 shown, includes the following modules 901 to 903:

[0141] Module 901, a test case management module, is used to generate test data in response to a test instruction input by a user, and control the simulation BCMS to generate a simulation test signal according to the test data. The simulation BCMS is used to generate a simulation test signal; the simulation test signal is used to test the response performance of the BAMS device;

[0142] Module 902, a test execution module, is used to send a simulation test signal to the BAMS device and monitor the response actions of the BAMS device in response to the simulation test signal.

[0143] Module 903, a test analysis module, is used to calculate the response index of the BAMS device according to the response actions, and evaluate the response performance of the BAMS device according to the response index; the response index includes response time and accuracy rate.

[0144] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, storage, database, or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0145] In the description of this specification, the description of reference terms such as "some embodiments", "other embodiments", "ideal embodiments", etc. means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic description of the above terms does not necessarily refer to the same embodiment or example.

[0146] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0147] The above-described embodiments merely represent several implementation manners of this application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of this application, several modifications and improvements can still be made, and these all belong to the protection scope of this application. Therefore, the protection scope of the patent of this application should be subject to the appended claims.

Claims

1. An automated test method for a BAMS device, characterized in that The method includes: In response to a test instruction input by a user, generating test data and controlling an analog BCMS to generate an analog test signal according to the test data; the analog BCMS is used to generate the analog test signal; the analog test signal is used to test the response performance of the BAMS device; The step of, in response to a test instruction input by a user, generating test data and controlling the analog BCMS to generate an analog test signal according to the test data includes: Parsing the test instruction input by the user, converting it into test data and generating a test case; the test instruction includes an operation mode, environmental parameters, and fault injection; the test data is used for the analog BCMS to generate the analog test signal; Checking the rationality of the test case; Controlling the analog BCMS to generate operation state data corresponding to any test step in the test case and converting it into the analog test signal; Sending the analog test signal to the BAMS device and monitoring the response actions of the BAMS device in response to the analog test signal; the response actions include extracting battery parameters, sending alarm information, and system operation commands; During the test, if the parameter range of the environmental parameters or operation mode in the test case is smaller than the preset range of the BAMS device, generating additional parameter ranges and inserting them into the test case; If the test duration exceeds the preset test time, giving priority to testing the test steps with no associated steps in the test case and setting the test order of the test steps with associated steps to be later; Calculating response metrics of the BAMS device according to the response actions and evaluating the response performance of the BAMS device according to the response metrics; the response metrics include response time and accuracy rate; Calculating the response metrics according to the response actions of the BAMS device in response to the adjusted test case; the response metrics further include action integrity and resource utilization rate; Evaluating the response speed of the BAMS device to the operation mode under different working conditions according to the first response metric; the first response metric is calculated from the response actions of the test case for the operation mode; Evaluating the fault handling ability and response speed of the BAMS device according to the second response metric; the second response metric is calculated from the response actions of the test case for fault injection; Evaluating the environmental adaptability of the BAMS device according to the third response metric; the third response metric is calculated from the response actions of the test case for environmental parameters.

2. The method according to claim 1, wherein The method further includes: In the case where the response time of the BAMS device exceeds the preset response time, controlling the analog BCMS to repeatedly send the analog test signal of the current test step; If it is detected that the waiting reaction time of the response action of the BAMS device is less than the preset reaction time, continuing to execute the subsequent test steps; If the waiting reaction time is not less than the preset reaction time and the current test step is not an associated step of other test steps, skipping the current test step and executing the subsequent test steps; If the waiting reaction time is not less than the preset reaction time and the current test step is an associated step of the other test steps, restart the test and execute the current test step.

3. The method according to claim 1, wherein The method further includes: If the response action of the BAMS device is inconsistent with the expected response action and the current test step is for fault handling, increase the range of simulation parameters for the fault handling. If the response action of the BAMS device is inconsistent with the expected response action and the current test step is for mode conversion, control the simulated BCMS to send a simulated test signal corresponding to the operating state data after the mode conversion.

4. The method according to claim 1, wherein The method further includes: When an abnormal fault occurs in the BAMS device, if the BAMS device has a self-healing mechanism and the waiting recovery time for the response action of the BAMS device to return to normal is less than the preset recovery time, continue to execute the current test step. If the waiting recovery time is less than the preset recovery time or the BAMS device does not have a self-healing mechanism, repeatedly send a restart instruction and a simulated test signal corresponding to the current test step to the BAMS device. If the waiting recovery time is not less than the preset recovery time, skip the current test step and repeatedly send a restart instruction and a simulated test signal corresponding to the subsequent test steps to the BAMS device.

5. The method according to claim 1, characterized in that The method further includes: If the parameter range of the environmental parameters in the test case exceeds the preset range of the BAMS device, reduce the step size of the environmental parameters in the test case and extend the preset response time. If the environmental parameters corresponding to the current test step exceed the preset range of the BAMS device, increase the detection items for the BAMS device, and the detection items include current detection.

6. The method according to claim 1, wherein The method further includes: If the operating mode in the test case needs to be repeatedly tested and the number of times of incorrect response actions of the BAMS device in one test of the operating mode is less than the preset number of times, reduce the number of repeated tests of the operating mode.

7. An automated test device for a BAMS device, characterized in that, Implemented based on the method according to any one of claims 1-6, the device includes: A test case management module, configured to generate test data in response to a test instruction input by a user, and control the simulated BCMS to generate a simulated test signal according to the test data; the simulated BCMS is used to generate the simulated test signal; the simulated test signal is used to test the response performance of the BAMS device. A test execution module, configured to send the simulated test signal to the BAMS device and monitor the response action of the BAMS device in response to the simulated test signal. A test analysis module, configured to calculate a response index of the BAMS device according to the response action and evaluate the response performance of the BAMS device according to the response index; the response index includes response time and accuracy rate.

Images