A crystal oscillator quality monitoring system based on artificial intelligence

Abstract

The invention discloses a crystal oscillator quality monitoring system based on artificial intelligence, which specifically relates to the field of artificial intelligence, including a time division area module, a frequency stability parameter acquisition module, a frequency stability data analysis module, a sensitivity rate parameter acquisition module, a sensitivity rate data analysis module, an environmental stability parameter acquisition module, an environmental stability data analysis module, and a comprehensive evaluation module. The invention evaluates the quality of a crystal oscillator from the dimensions of frequency stability, sensitivity, and environmental stability, thereby obtaining evaluation coefficients of the frequency stability, sensitivity, and environmental stability dimensions corresponding to the crystal oscillator, thereby monitoring the quality of the crystal oscillator from multiple dimensions, and obtaining a comprehensive evaluation coefficient through evaluation coefficients from various aspects, so as to have a further understanding of the quality of the crystal oscillator.

Description

Technical Field

[0001] The present invention relates to the field of artificial intelligence technology, and more specifically, to a crystal oscillator quality monitoring system based on artificial intelligence. Background Art

[0002] As a high-precision and high-stability oscillator, crystal oscillator is widely used in various oscillation circuits such as color TVs and computers, as well as in frequency generators in communication systems, to generate clock signals for data processing equipment and provide reference signals for specific systems. It has a significant position in the field of modern electronic technology. Its excellent clock signal generation capability enables it to play a key role in various applications. Therefore, quality monitoring of crystal oscillators has become a vital issue.

[0003] Traditional crystal oscillator quality detection systems generally include a time zone division module, a sub-zone parameter acquisition module, and a sub-zone data analysis and processing module. The time zone division module is used to divide the working time of the crystal oscillator into n equal parts, which is convenient for studying the information generated by the crystal oscillator in each time period; the sub-zone parameter acquisition module is used to obtain the parameters in the divided time sub-zones, and it is convenient and accurate to collect through multimeters, oscilloscopes, etc., and provide a large amount of data; the sub-zone data analysis and processing module analyzes and processes the collected data through artificial intelligence to understand key information such as the frequency stability of the crystal oscillator and the temperature during operation, providing a scientific basis for quality monitoring.

[0004] However, there are still some shortcomings in its actual use. For example, in the sub-region parameter acquisition module, the data accuracy is not enough, and the parameters acquired are often a single frequency. Therefore, in the sub-region data analysis and processing module, most of the traditional artificial intelligence crystal oscillator quality monitoring methods only monitor the frequency stability and power consumption, and rarely mention the internal temperature of the crystal oscillator. In fact, the internal temperature of the crystal oscillator is extremely important. For example, with the needs of scientific and technological development, crystal oscillators are used more and more in aircraft. When flying at high altitudes, aircraft often experience drastic changes in external high and low temperatures, which seriously affects the stability of the crystal oscillator. Summary of the invention

[0005] In order to overcome the above-mentioned defects of the prior art, an embodiment of the present invention provides a crystal oscillator quality monitoring system based on artificial intelligence, which solves the problems raised in the above-mentioned background technology through the following scheme.

[0006] To achieve the above object, the present invention provides the following technical solution: a crystal oscillator quality monitoring system based on artificial intelligence, comprising:

[0007] The monitoring time division area module is used to determine the monitoring time of the target crystal oscillator as the target time area, divide the target time area into various sub-time areas by equal time division, and mark them as 1, 2, ..., i in sequence;

[0008] The frequency stability parameter acquisition module is used for collecting the frequency, including the frequency deviation range of the crystal oscillator and the capacitance and inductance values ​​when the crystal oscillator starts oscillating, and transmits the collected data to the frequency stability data analysis module;

[0009] The frequency stability data analysis module is used to establish a crystal oscillator frequency stability data analysis model, import the crystal oscillator frequency data transmitted by the frequency stability parameter acquisition module into the frequency stability data analysis model, calculate the frequency stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module;

[0010] The sensitivity parameter acquisition module is used to collect the load capacitance data and sensitivity data of each sub-time zone of the crystal oscillator, and transmit the collected data to the sensitivity data analysis module;

[0011] The sensitivity data analysis module is used to analyze the data transmitted by the sensitivity parameter acquisition module, calculate the sensitivity evaluation coefficient, and transmit the analysis result to the comprehensive analysis module;

[0012] The environmental stability parameter acquisition module is used to collect the internal temperature data of the crystal oscillator in each sub-time zone, and transmit the collected data to the environmental stability data analysis module;

[0013] The environmental stability data analysis module is used to establish an environmental stability data analysis model, analyze the data transmitted by the environmental stability parameter acquisition module, calculate the environmental stability evaluation coefficient, and transmit the analysis results to the comprehensive analysis module;

[0014] The comprehensive analysis module is used to establish a comprehensive analysis model, import the data transmitted by the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module into the comprehensive analysis model, and calculate the comprehensive evaluation coefficient of the target time area.

[0015] Preferably, the frequency stability parameter acquisition module first collects the frequency when the crystal oscillator starts working, and the time at this time is set as t0, and the frequency of the crystal oscillator at this time is expressed as α0, and then collects the frequency of the crystal oscillator after a period of time, and the time at this time is set as t i , the frequency of the crystal oscillator is expressed as α i ;The capacitance value of the crystal oscillator when it starts oscillating is represented by C, and the inductance value is represented by L.

[0016] Preferably, the frequency stability evaluation coefficient includes the frequency deviation rate and the reactance stability rate; the frequency stability parameter acquisition module from t0 to t i The frequency deviation range within time is set to A = (α0, α i ), set the crystal oscillator preset from t0 to t i The frequency deviation range within time is set to B = (β0, β i ), at this time, the frequency offset of the crystal oscillator is A∩B, if Then the frequency deviation rate is y = 100%, if A∩B = (α i ′,β i ′), the frequency deviation rate is If A∩B=(α0, α i ), the offset range is within the preset offset range, then the offset rate is y = 0, if A∩B = (β0, β i ), the preset offset range is within the offset range, and the offset rate is The capacitance and inductance values ​​in the frequency stability parameter acquisition module are converted into the reactance value according to the reactance formula, and then the reactance value is imported into the reactance stability rate analysis model to obtain the reactance stability rate. The specific analysis formula is as follows: where x i represents the reactance value of the ith sub-time zone, represents the allowable error value of the reactance. The frequency deviation and reactance stability of the crystal oscillator are introduced into the frequency stability data analysis model to calculate the frequency stability evaluation coefficient of the i-th sub-time zone, which is specifically expressed as Where λ1 and λ2 represent the influencing factors of frequency stability and reactance stability, respectively. Indicates different offset rates selected in different situations.

[0017] Preferably, the load capacitance data and sensitivity data require additional external circuits and multimeter measurements and calculations, and the load capacitance data includes the capacitive reactance of the measured capacitance value, wherein the load capacitance reflects the sensitivity of the crystal oscillator to the external capacitance, and the smaller the load capacitance, the lower the crystal oscillator's requirements for the capacitive reactance of external components, and the easier it is to match with the external circuit.

[0018] Preferably, the sensitivity data analysis module is used to establish a sensitivity data analysis model, import the load capacitance data and sensitivity data transmitted by the sensitivity parameter acquisition module into the sensitivity data analysis model, and calculate the sensitivity evaluation coefficient of each sub-time zone. The sensitivity evaluation coefficient includes capacitive reactance sensitivity and sensitivity. The capacitive reactance sensitivity is specifically expressed as in represents the capacitive reactance of the capacitance value measured in the i-th sub-time zone, It represents the capacitive reactance sensitivity of the ith sub-time zone. The sensitivity is specifically expressed as where f i represents the starting frequency of the ith sub-time region, f i-1 represents the starting frequency of the i-1th sub-time region, G i represents the gravitational acceleration of the ith sub-time zone; the capacitive reactance sensitivity and sensitivity of the crystal oscillator are introduced into the sensitivity evaluation coefficient analysis model to calculate the sensitivity evaluation coefficient of the ith sub-time zone, which is specifically expressed as Where λ3 and λ4 represent the influencing factors of capacitive reactance sensitivity and sensitivity respectively.

[0019] Preferably, the environmental stability evaluation coefficient includes temperature fluctuation and loss, and the temperature fluctuation is specifically expressed as where q i represents the internal temperature of the crystal oscillator in the i-th sub-time zone, ψ1 represents the temperature fluctuation of the crystal oscillator in the i-th sub-time zone, Δt represents the unit time; the loss degree is specifically expressed as where t 下限 and t 上限 They represent the most suitable lower and upper temperature limits of the crystal oscillator during operation, T 低 and T 高 They represent the average minimum and average maximum external temperatures of the crystal oscillator when it is working. When the most suitable temperature of the crystal oscillator is greatly different from the external average temperature, the loss of the crystal oscillator will be greater. The temperature fluctuation and loss are introduced into the environmental stability data analysis model to obtain the environmental stability evaluation coefficient. The specific analysis formula is ψ i =λ5*lnψ1*ln(1+ψ2), where λ5 represents the influencing factor of environmental stability.

[0020] Preferably, the evaluation coefficients of the crystal oscillator in the frequency stability dimension, the sensitivity dimension and the environmental stability dimension are the comprehensive evaluation coefficients corresponding to the crystal oscillators of the same level, and the analysis formula thereof is expressed as: Where Z represents the comprehensive evaluation coefficient of the crystal oscillator, ξ i represents the frequency stability evaluation coefficient of the ith sub-time region, represents the sensitivity evaluation coefficient of the i-th sub-time zone, ψ i represents the environmental stability evaluation coefficient of the ith sub-time zone, a, b, c represent the weight coefficients corresponding to the frequency stability dimension, sensitivity dimension, and environmental stability dimension, respectively, and a+b+c=1.

[0021] Technical effects and advantages of the present invention:

[0022] The present invention evaluates the quality of the crystal oscillator from the dimensions of frequency stability, sensitivity and environmental stability, so as to obtain evaluation coefficients of the frequency stability, sensitivity and environmental stability dimensions corresponding to the crystal oscillator, and combines the above-obtained evaluation coefficients to statistically calculate the comprehensive evaluation coefficients corresponding to the crystal oscillator quality monitoring. This evaluation method realizes a multi-dimensional comprehensive evaluation of the quality of the crystal oscillator, greatly avoiding the disadvantage of low quality monitoring accuracy caused by a single-dimensional evaluation, and thus provides a real and reliable reference basis for the quality optimization of the crystal oscillator. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a schematic diagram of the overall structure of the present invention. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0025] As attached Figure 1 An artificial intelligence-based crystal oscillator quality monitoring system is shown, comprising a time division area module, a frequency stability parameter acquisition module, a frequency stability data analysis module, a sensitivity parameter acquisition module, a sensitivity data analysis module, an environmental stability parameter acquisition module, an environmental stability data analysis module, and a comprehensive evaluation module.

[0026] The output end of the time division area module is telecommunication connected to the input ends of the frequency stability parameter acquisition module, the sensitivity parameter acquisition module and the environmental stability parameter acquisition module, the output end of the frequency stability parameter acquisition module is telecommunication connected to the input end of the frequency stability data analysis module, the output end of the sensitivity parameter acquisition module is telecommunication connected to the input end of the sensitivity data analysis module, the output end of the environmental stability parameter acquisition module is telecommunication connected to the input end of the environmental stability data analysis module, and the input end of the comprehensive evaluation module is telecommunication connected to the output ends of the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module respectively.

[0027] The monitoring time division area module is used to determine the monitoring time of the target crystal oscillator as the target time area, divide the target time area into various sub-time areas by equal time division, and mark them as 1, 2, ..., i in sequence.

[0028] The frequency stability parameter acquisition module is used for collecting frequency, including the frequency deviation range of the crystal oscillator and the capacitance and inductance values ​​when the crystal oscillator starts oscillating, and transmits the collected data to the frequency stability data analysis module.

[0029] In this embodiment, it should be specifically explained that the frequency stability parameter acquisition module first collects the frequency when the crystal oscillator starts working, and the time at this time is set to t0, and the frequency of the crystal oscillator at this time is represented by α0, and then collects the frequency of the crystal oscillator after a period of time, and the time at this time is set to t i , the frequency of the crystal oscillator is expressed as α i ;The capacitance value of the crystal oscillator when it starts oscillating is represented by C, and the inductance value is represented by L.

[0030] The frequency stability data analysis module is used to establish a crystal oscillator frequency stability data analysis model, import the crystal oscillator frequency data transmitted by the frequency stability parameter acquisition module into the frequency stability data analysis model, calculate the frequency stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.

[0031] In this embodiment, it should be specifically explained that the frequency stability evaluation coefficient includes the frequency deviation rate and the reactance stability rate; the frequency stability parameter acquisition module from t0 to t i The frequency deviation range within time is set to A = (α0, α i ), set the crystal oscillator preset from t0 to t i The frequency deviation range within time is set to B = (β0, β i ), at this time, the frequency offset of the crystal oscillator is A∩B, if Then the frequency deviation rate is y = 100%, if A∩B = (α i ′,β i ′), the frequency deviation rate is If A∩B=(α0, α i ), the offset range is within the preset offset range, then the offset rate is y = 0, if A∩B = (β0, β i ), the preset offset range is within the offset range, and the offset rate is The capacitance and inductance values ​​in the frequency stability parameter acquisition module are converted into the reactance value according to the reactance formula, and then the reactance value is imported into the reactance stability rate analysis model to obtain the reactance stability rate. The specific analysis formula is as follows: where x i represents the reactance value of the ith sub-time zone, represents the allowable error value of the reactance. The frequency deviation and reactance stability of the crystal oscillator are introduced into the frequency stability data analysis model to calculate the frequency stability evaluation coefficient of the i-th sub-time zone, which is specifically expressed as Where λ1 and λ2 represent the influencing factors of frequency stability and reactance stability, respectively. Indicates different offset rates selected in different situations.

[0032] The sensitivity parameter acquisition module is used to collect the load capacitance data and sensitivity data of each sub-time zone of the crystal oscillator, and transmit the collected data to the sensitivity data analysis module.

[0033] In this embodiment, it should be specifically noted that both the load capacitance data and the sensitivity data require an additional external circuit and a multimeter to measure and calculate, the load capacitance data includes the capacitive reactance of the measured capacitance value, wherein the load capacitance reflects the sensitivity of the crystal oscillator to the external capacitance, the smaller the load capacitance, the lower the crystal oscillator's requirements for the capacitive reactance of external components, and the easier it is to match with the external circuit, and the sensitivity data includes the starting frequency and the acceleration of gravity.

[0034] The sensitivity data analysis module is used to analyze the data transmitted by the sensitivity parameter acquisition module, calculate the sensitivity evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.

[0035] In this embodiment, it should be specifically explained that the sensitivity data analysis module is used to establish a sensitivity data analysis model, import the load capacitance data and frequency data transmitted by the sensitivity parameter acquisition module into the sensitivity data analysis model, and calculate the sensitivity evaluation coefficient of each sub-time zone. The sensitivity evaluation coefficient includes capacitive reactance sensitivity and sensitivity. The capacitive reactance sensitivity is specifically expressed as in represents the capacitive reactance of the capacitance value measured in the i-th sub-time zone, It represents the capacitive reactance sensitivity of the ith sub-time zone. The sensitivity is specifically expressed as where f i represents the starting frequency of the ith sub-time region, f i-1 represents the starting frequency of the i-1th sub-time region, G i represents the gravitational acceleration in the ith sub-time zone, and the capacitive reactance sensitivity and sensitivity of the crystal oscillator are introduced into the sensitivity evaluation coefficient analysis model to calculate the sensitivity evaluation coefficient of the ith sub-time zone, which is specifically expressed as Where λ3 and λ4 represent the influencing factors of capacitive reactance sensitivity and sensitivity respectively.

[0036] The environmental stability parameter acquisition module is used to collect the internal temperature data of the crystal oscillator in each sub-time zone, and transmit the collected data to the environmental stability data analysis module.

[0037] The environmental stability data analysis module is used to establish an environmental stability data analysis model, analyze the data transmitted by the environmental stability parameter acquisition module, calculate the environmental stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module.

[0038] In this embodiment, it should be specifically explained that the environmental stability evaluation coefficient includes temperature fluctuation and loss. The temperature fluctuation is specifically expressed as where q i represents the internal temperature of the crystal oscillator in the i-th sub-time zone, ψ1 represents the temperature fluctuation of the crystal oscillator in the i-th sub-time zone, Δt represents the unit time; the loss degree is specifically expressed as where t 下限 and t 上限 They represent the most suitable lower and upper temperature limits of the crystal oscillator during operation, T 低 and T 高 They represent the average minimum and average maximum external temperatures of the crystal oscillator when it is working. When the most suitable temperature of the crystal oscillator is greatly different from the external average temperature, the loss of the crystal oscillator will be greater. The temperature fluctuation and loss are introduced into the environmental stability data analysis model to obtain the environmental stability evaluation coefficient. The specific analysis formula is ψ i =λ5*lnψ1*ln(1+ψ2), where λ5 represents the influencing factor of environmental stability.

[0039] The comprehensive analysis module is used to establish a comprehensive analysis model, import the data transmitted by the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module into the comprehensive analysis model, and calculate the comprehensive evaluation coefficient of the target time area.

[0040] In this embodiment, it is necessary to specifically explain that the evaluation coefficients of the crystal oscillator in the frequency stability dimension, the sensitivity dimension and the environmental stability dimension are the comprehensive evaluation coefficients corresponding to the crystal oscillators of the same level, and the analysis formula thereof is expressed as follows: Where Z represents the comprehensive evaluation coefficient of the crystal oscillator, ξ i represents the frequency stability evaluation coefficient of the ith sub-time region, represents the sensitivity evaluation coefficient of the i-th sub-time zone, ψ i represents the environmental stability evaluation coefficient of the ith sub-time zone, a, b, c represent the weight coefficients corresponding to the frequency stability dimension, the sensitivity dimension, and the environmental stability dimension, respectively, and a+b+c=1.

[0041] The present invention evaluates the quality of the crystal oscillator from the dimensions of frequency stability, sensitivity and environmental stability, so as to obtain evaluation coefficients of the frequency stability, sensitivity and environmental stability dimensions corresponding to the crystal oscillator. This evaluation method realizes a multi-dimensional comprehensive evaluation of the quality of the crystal oscillator, greatly avoiding the disadvantage of low quality monitoring accuracy caused by a single-dimensional evaluation, and thus provides a real and reliable reference basis for the quality optimization of the crystal oscillator.

[0042] Secondly: In the drawings of the embodiments disclosed in the present invention, only the structures related to the embodiments disclosed in the present invention are involved, and other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of the present invention can be combined with each other;

[0043] Finally: The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A crystal oscillator quality monitoring system based on artificial intelligence, comprising a monitoring time division area module, a frequency stability parameter acquisition module, a frequency stability data analysis module, a sensitivity parameter acquisition module, a sensitivity data analysis module, an environmental stability parameter acquisition module, an environmental stability data analysis module, and a comprehensive evaluation module, characterized in that: The monitoring time division area module is used to determine the monitoring time of the target crystal oscillator as the target time area, divide the target time area into various sub-time areas by equal time division, and mark them as 1, 2, ..., i in sequence; The frequency stability parameter acquisition module is used for collecting the frequency, including the frequency deviation range of the crystal oscillator and the capacitance and inductance values ​​when the crystal oscillator starts oscillating, and transmits the collected data to the frequency stability data analysis module; The frequency stability data analysis module is used to establish a crystal oscillator frequency stability data analysis model, import the crystal oscillator frequency data transmitted by the frequency stability parameter acquisition module into the frequency stability data analysis model, calculate the frequency stability evaluation coefficient, and transmit the analysis result to the comprehensive analysis module; The sensitivity parameter acquisition module is used to collect the load capacitance data and sensitivity data of each sub-time zone of the crystal oscillator, and transmit the collected data to the sensitivity data analysis module; The sensitivity data analysis module is used to analyze the data transmitted by the sensitivity parameter acquisition module, calculate the sensitivity evaluation coefficient, and transmit the analysis result to the comprehensive analysis module; The environmental stability parameter acquisition module is used to collect the internal temperature data of the crystal oscillator in each sub-time zone, and transmit the collected data to the environmental stability data analysis module; The environmental stability data analysis module is used to establish an environmental stability data analysis model, analyze the data transmitted by the environmental stability parameter acquisition module, calculate the environmental stability evaluation coefficient, and transmit the analysis results to the comprehensive analysis module; The comprehensive analysis module is used to establish a comprehensive analysis model, import the data transmitted by the frequency stability data analysis module, the sensitivity data analysis module and the environmental stability data analysis module into the comprehensive analysis model, and calculate the comprehensive evaluation coefficient of the target time area.

2. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The frequency stability parameter acquisition module uses a multimeter, an external circuit, an oscilloscope and other acquisition parameters. First, the frequency of the crystal oscillator when it starts working is acquired. The time at this time is set as t0. The frequency of the crystal oscillator at this time is expressed as α0. Secondly, the frequency of the crystal oscillator after a period of time is acquired. The time at this time is set as t i , the frequency of the crystal oscillator is expressed as α i ;The capacitance value of the crystal oscillator when it starts oscillating is represented by C, and the inductance value is represented by L.

3. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: In the frequency stability data analysis module, the frequency stability evaluation coefficient includes the frequency deviation rate and the reactance stability rate; the frequency stability parameter acquisition module from t0 to t i The frequency deviation range within time is set to A = (α0, α i ), set the crystal oscillator preset from t0 to t i The frequency deviation range within time is set to B = (β0, β i ), at this time, the frequency offset of the crystal oscillator is A∩B, if Then the frequency deviation rate is y = 100%, if A∩B = (α i ′,β i ′), the frequency deviation rate is If A∩B=(α0,α i ), the offset range is within the preset offset range, then the offset rate is y = 0, if A∩B = (β0, β i ), the preset offset range is within the offset range, and the offset rate is The capacitance and inductance values ​​in the frequency stability parameter acquisition module are converted into the reactance value according to the reactance formula, and then the reactance value is imported into the reactance stability rate analysis model to obtain the reactance stability rate. The specific analysis formula is as follows: where x i represents the reactance value of the ith sub-time zone, represents the allowable error value of the reactance. The frequency deviation and reactance stability of the crystal oscillator are introduced into the frequency stability data analysis model to calculate the frequency stability evaluation coefficient of the i-th sub-time zone, which is specifically expressed as Where λ1 and λ2 represent the influencing factors of frequency stability and reactance stability, respectively. Indicates different offset rates selected in different situations.

4. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: In the sensitivity parameter acquisition module, the sensitivity parameters include load capacitance data and sensitivity data. The load capacitance data includes the capacitive reactance of the measured capacitance value, wherein the load capacitance reflects the sensitivity of the crystal oscillator to the external capacitance. The smaller the load capacitance, the lower the crystal oscillator's requirement on the capacitive reactance of the external components, and the easier it is to match with the external circuit. The sensitivity data includes the starting frequency and the acceleration of gravity.

5. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The sensitivity data analysis module is used to establish a sensitivity data analysis model, import the load capacitance data and sensitivity data transmitted by the sensitivity parameter acquisition module into the sensitivity data analysis model, and calculate the sensitivity evaluation coefficient of each sub-time zone. The sensitivity evaluation coefficient includes capacitive reactance sensitivity and sensitivity. The capacitive reactance sensitivity is specifically expressed as Where X Ci represents the capacitive reactance of the capacitance value measured in the i-th sub-time zone, It represents the capacitive reactance sensitivity of the ith sub-time zone. The sensitivity is specifically expressed as where f i represents the starting frequency of the ith sub-time region, f i-1 represents the starting frequency of the i-1th sub-time region, G i represents the gravitational acceleration of the ith sub-time zone; the capacitive reactance sensitivity and sensitivity of the crystal oscillator are introduced into the sensitivity evaluation coefficient analysis model to calculate the sensitivity evaluation coefficient of the ith sub-time zone, which is specifically expressed as Where λ3 and λ4 represent the influencing factors of capacitive reactance sensitivity and sensitivity respectively.

6. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The environmental stability evaluation coefficient includes temperature fluctuation and loss. The temperature fluctuation is specifically expressed as: where q i represents the internal temperature of the crystal oscillator in the i-th sub-time region, ψ1 represents the temperature fluctuation of the crystal oscillator in the i-th sub-time region, and Δt represents the unit time; The loss is specifically expressed as where t 下限 and t 上限 They represent the most suitable lower and upper temperature limits of the crystal oscillator during operation, T 低 and T 高 They represent the average minimum and average maximum external temperatures of the crystal oscillator when it is working. When the most suitable temperature of the crystal oscillator is greatly different from the external average temperature, the loss of the crystal oscillator will be greater. The temperature fluctuation and loss are introduced into the environmental stability data analysis model to obtain the environmental stability evaluation coefficient. The specific analysis formula is ψ i =λ5*lnψ1*ln(1+ψ2), where λ5 represents the influencing factor of environmental stability.

7. The crystal oscillator quality monitoring system based on artificial intelligence according to claim 1, characterized in that: The evaluation coefficients of the crystal oscillator in the frequency stability dimension, sensitivity dimension and environmental stability dimension are the comprehensive evaluation coefficients corresponding to the crystal oscillator of the same level, and the analysis formula is expressed as follows: Where Z is the comprehensive evaluation coefficient, ξ i represents the frequency stability evaluation coefficient of the ith sub-time region, represents the sensitivity evaluation coefficient of the i-th sub-time zone, ψ i represents the environmental stability evaluation coefficient of the ith sub-time zone, a, b, c represent the weight coefficients corresponding to the frequency stability dimension, the sensitivity dimension, and the environmental stability dimension, respectively, and a+b+c=1.

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