A detection method for a radar equipment seeker master control oscillator assembly

Abstract

The present invention belongs to the field of radar signal detection technology, and specifically provides a detection method for a radar equipment seeker master oscillator component. Under the condition that the master oscillator outputs a composite signal, the excitation unit, the switching unit, and the measuring unit are connected to the master oscillator in sequence, and the signal is classified and tested. The method is easy to operate, safe and reliable, and breaks through the problem of difficult testing of technical indicators of composite signals of high-frequency components. It can simulate the seeker clock signal and the excitation signal, realize the detection of local oscillator signals, self-test signals, detection signals, pulse signals and other signals in the seeker master oscillator component, and complete the signal indicator test. The technical indicators and test methods of the subassembly are determined by this method, and the product repair process regulations and repair work cards are compiled. The results of the method of the present invention are solidified, ensuring the positioning of faulty components during the detection of the master oscillator component, and ensuring the safety and reliability of the deep repair work of the master oscillator component.

Description

Technical Field

[0001] The invention belongs to the technical field of radar signal detection, and mainly relates to a detection method for a master control oscillator component of a radar equipment seeker. Background Art

[0002] Radar systems are widely used in all aspects of civil and military fields, and with the development of information technology, the requirements for radar detection performance are getting higher and higher; the master oscillator is an important subcomponent in the introduced radar equipment seeker, and its main function is to generate composite signals such as target detection signal, local oscillator signal, Doppler frequency signal for target tracking, and self-test signal for seeker self-test and automatic parameter adjustment. Since the components generate a large number of signals and the seeker has high requirements for the generated signal indicators. In order to conduct a comprehensive test of the signal, ensure the location of the faulty components during the master oscillator component detection, and ensure the safety and reliability of the deep repair work of the master oscillator component, a detection method for the master oscillator component of the radar equipment seeker is proposed. Summary of the invention

[0003] In order to overcome the deficiencies of the prior art, the present invention provides a detection method for a radar equipment seeker master oscillator component, which is used to solve the problem of classifying and testing various signal indicators under the condition that the high-frequency component outputs more composite signals.

[0004] In order to solve the above technical problems, the present invention discloses a detection method for a master oscillator component of a radar equipment seeker. Under the condition that the master oscillator outputs a composite signal, an excitation unit, a switching unit, and a measuring unit are sequentially connected to the master oscillator. Each signal is specifically classified into: a voltage and current signal, a self-test signal, a clock pulse signal, a local oscillator signal, a detection signal, and a detection signal; and then the following steps are sequentially implemented:

[0005] S1: Voltage and current signal test: Connect the digital multimeter to the +18V, -15V, +16V and +27V power supply test interfaces on the adapter unit, turn on the "main power" switch on the adapter unit, set the "CLKen1" switch on the adapter unit to the "1" position, and observe the voltage value measured by the digital multimeter and the current consumption of the DC regulated power supply.

[0006] S2: Self-test signal test: Connect the "CH1" channel of the digital oscilloscope to the "+16Vo" of the adapter unit, connect the "CH2" channel of the digital oscilloscope to the "RF-OK" of the adapter unit, turn on the "main power" switch on the adapter unit, and use the digital oscilloscope to measure the lag time of the falling edge of the "RF-OK" signal relative to the rising edge of the +16V power supply.

[0007] S3: Clock pulse signal test: Connect the "CH1" channel of the digital oscilloscope to the clock pulse signal test point of the adapter unit, turn on the "main power" switch of the adapter unit, and use the digital oscilloscope to measure the period, duty cycle, high level and low level of the output pulse signal of the "CLKf" point of the adapter unit.

[0008] S4: Local oscillator signal test: Connect the spectrum analyzer to the local oscillator signal port of the master oscillator, turn on the "main power" switch of the adapter unit, use the "Freq Count" button of the spectrum analyzer to measure the frequency and signal power of the local oscillator signal, and use the spectrum analyzer to measure the phase noise at 5kHz and 10kHz deviation from the carrier frequency.

[0009] S5: Detection signal test: Use a spectrum analyzer to measure the power P of the center spectrum line of the detection signal at this time, connect the coaxial detector to the detection signal port, connect it to the digital oscilloscope with a coaxial cable, and set the digital oscilloscope input impedance to 50Ω. Use the digital oscilloscope to measure the modulation pulse period and duty cycle of the detection signal.

[0010] S6: Detection signal test: Use a spectrum analyzer to connect to the 5 detection signal ports of the master oscillator respectively, turn on the "main power" switch of the adapter unit, use the spectrum analyzer to measure the power of the IF and RF signals of the 5 port output signals respectively, use the "Freq Count" button of the spectrum analyzer to measure the frequency of the IF and RF signals output from the 5 ports respectively, and record the power and frequency of the IF and RF signals output from the 5 ports.

[0011] The voltage and current signals are detections of the power supply voltage and current consumption. You can first connect the power supply to the corresponding pin of the product, switch the state of the test platform, and use a digital multimeter and a DC regulated power supply to test the voltage and current.

[0012] The self-test signal is tested by adding an excitation signal to the product, switching the state of the test platform, and testing the lag time of the falling edge of the self-test signal relative to the rising edge of the +16V power supply.

[0013] The test of the clock pulse signal is to introduce the pin to be tested into the test platform, and use the oscilloscope of the test platform to measure the period and duty cycle indicators of the signal.

[0014] The test of the local oscillator signal and the detection signal introduces the interface to be tested into the test platform, and uses the spectrum analyzer of the test platform to measure the frequency, power, isolation, and phase noise indicators of the signal.

[0015] The test of the detection signal introduces the interface to be tested into the test platform, and uses the counter and oscilloscope of the test platform to measure the frequency and amplitude indicators of the signal.

[0016] Compared with the prior art, the present invention has the following beneficial effects:

[0017] The method of the present invention breaks through the problem of difficult decomposition of composite signals generated by components and difficulty in testing technical indicators. At the same time, the signal test platform designed according to the method can test the signal indicators completely. Through research on the repair technology of a certain type of imported seeker master control oscillator, the repair technical indicators of the subassembly are determined, the test method is determined, the product repair process regulations and repair work cards are compiled, and the factory instruments and equipment, repair technical documents, and the skill level and quality control measures of the repair personnel all meet the repair requirements, and the company has the ability to repair the seeker master control oscillator of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a composition block diagram of the present invention. DETAILED DESCRIPTION

[0019] The present invention is described with reference to the accompanying drawings.

[0020] like Figure 1 As shown, a detection method for a radar equipment seeker master oscillator component, under the condition that the master oscillator outputs a composite signal, the excitation unit, the switching unit, and the measuring unit are connected to the master oscillator in sequence, and each signal is specifically classified into: voltage and current signal, self-test signal, clock pulse signal, local oscillator signal, detection signal and detection signal; before the product is powered on, the local oscillator signal test port and the detection signal test port must be connected to an absorbing load to prevent microwave leakage radiation, and then the following steps are performed in sequence:

[0021] S1: Voltage and current signal test: Connect the digital multimeter to the +18V, -15V, +16V and +27V power supply test interfaces on the adapter unit, turn on the "main power" switch on the adapter unit, set the "CLKen1" switch on the adapter unit to the "1" position, and observe the voltage value measured by the digital multimeter and the current consumption of the DC regulated power supply.

[0022] S2: Self-test signal test: Connect the "CH1" channel of the digital oscilloscope to the "+16Vo" of the adapter unit, connect the "CH2" channel of the digital oscilloscope to the "RF-OK" of the adapter unit, turn on the "main power" switch on the adapter unit, and use the digital oscilloscope to measure the lag time of the falling edge of the "RF-OK" signal relative to the rising edge of the +16V power supply.

[0023] S3: Clock pulse signal test: Connect the "CH1" channel of the digital oscilloscope to the clock pulse signal test point of the adapter unit, turn on the "main power" switch of the adapter unit, and use the digital oscilloscope to measure the period, duty cycle, high level and low level of the output pulse signal of the "CLKf" point of the adapter unit.

[0024] S4: Local oscillator signal test: Connect the spectrum analyzer to the local oscillator signal port of the master oscillator, turn on the "main power" switch of the adapter unit, use the "Freq Count" button of the spectrum analyzer to measure the frequency and signal power of the local oscillator signal, and use the spectrum analyzer to measure the phase noise at 5kHz and 10kHz deviation from the carrier frequency.

[0025] S5: Detection signal test: Use a spectrum analyzer to measure the power P of the center spectrum line of the detection signal at this time, connect the coaxial detector to the detection signal port, connect it to the digital oscilloscope with a coaxial cable, and set the digital oscilloscope input impedance to 50Ω. Use the digital oscilloscope to measure the modulation pulse period and duty cycle of the detection signal.

[0026] S6: Detection signal test: Use a spectrum analyzer to connect to the 5 detection signal ports of the master oscillator respectively, turn on the "main power" switch of the adapter unit, use the spectrum analyzer to measure the power of the IF and RF signals of the 5 port output signals respectively, use the "Freq Count" button of the spectrum analyzer to measure the frequency of the IF and RF signals output from the 5 ports respectively, and record the power and frequency of the IF and RF signals output from the 5 ports. The detection signal test here can detect the following signal tests: Detection signal 1 test: Connect the spectrum analyzer to the detection 1 end of the master oscillator, turn on the "main power" switch of the adapter unit, set the "CLKen1" switch on the adapter unit to the "0" position, use the "FreqCount" button of the spectrum analyzer to measure the frequency of the detection 1 signal, use the spectrum analyzer to measure the detection 1 signal power at this time, record it as P1, which is the output signal power of the detection 1 signal; set the "CLKen1" switch on the adapter unit to the "1" position, use the spectrum analyzer to measure the detection 1 signal power at this time, record it as P1', record the value of |P1-P1'| as the switch isolation; Detection 2 signal test: Connect the spectrum analyzer to the detection 2 port of the master oscillator, turn on the "main power" switch of the adapter unit, use the spectrum analyzer to measure the power of the intermediate frequency and radio frequency signals output from the detection 2 port, and use the "Freq "Count" button to measure the frequency of the intermediate frequency and radio frequency signals output from the detection 2 port; detection 3 signal test: connect the counter to the detection 3 port of the master oscillator, set the counter input impedance to 50Ω, turn on the "main power" switch of the adapter unit, use the counter to measure the frequency of the output signal from the detection 3 port, connect the digital oscilloscope to the detection 3 port of the master oscillator with a coaxial cable, set the input impedance of the digital oscilloscope to 50Ω, and use the digital oscilloscope to measure the amplitude of the output signal from the detection 3 port; detection 4 signal test: connect the counter to the detection 4 port of the master oscillator, set the counter input impedance to 50Ω, turn on the "main power" switch of the adapter unit, and use the counter to measure the frequency of the output signal from the detection 4 port. Connect the digital oscilloscope to the detection port 4 of the master oscillator with a coaxial cable, set the input impedance of the digital oscilloscope to 50Ω, and use the digital oscilloscope to measure the amplitude of the output signal of the detection port 4; Detection 5 signal test: connect the spectrum analyzer to the detection port 5 of the master oscillator, turn on the "main power" switch of the adapter unit, and use the "Freq Count" button of the spectrum analyzer to measure the power and frequency of the output signal of the detection port 5; Detection 6 signal test: connect the counter to the detection port 6 of the master oscillator, set the input impedance of the counter to 50Ω, turn on the "main power" switch of the adapter unit, and use the counter to measure the frequency of the output signal of the detection port 6.Connect the digital oscilloscope to the detection port 6 of the master oscillator with a coaxial cable, set the input impedance of the digital oscilloscope to 50Ω, and use the digital oscilloscope to measure the amplitude of the output signal of the detection port 6.

[0027] The excitation unit mainly solves the input of component power supply and clock signal, mainly including +18V, -15V, +16V and +27V power supply and excitation signals; the adapter unit can realize convenient connection of components and fast switching of status; the measurement unit mainly tests various composite signal indicators output by components; the voltage and current signals are the detection of power supply voltage and consumption current. The power supply can be connected to the corresponding pin of the product first, the status of the test platform can be switched, and the voltage and current can be tested using a digital multimeter and a DC regulated power supply; the self-test signal is tested by adding an excitation signal to the product. , switch the state of the test platform, and test the lag time of the falling edge of the self-test signal relative to the rising edge of the +16V power supply; the test of the clock pulse signal is to introduce the pin to be tested into the test platform, and use the oscilloscope of the test platform to measure the period and duty cycle indicators of the signal; the test of the local oscillator signal and the detection signal introduces the interface to be tested into the test platform, and uses the spectrum analyzer of the test platform to measure the frequency, power, isolation, and phase noise indicators of the signal; the test of the detection signal introduces the interface to be tested into the test platform, and uses the counter and oscilloscope of the test platform to measure the frequency and amplitude indicators of the signal.

[0028] The present invention provides a method for testing composite signals of high-frequency components. The method is easy to operate, safe and reliable, and has overcome the problem of difficulty in testing technical indicators of composite signals of high-frequency components. The method can simulate a seeker clock signal and a seeker excitation signal, and realize detection of a local oscillator signal, a self-test signal, a detection signal, and a pulse signal in a seeker master oscillator component, thereby ensuring the location of faulty components during detection of the master oscillator component and ensuring the safety and reliability of in-depth repair work of the master oscillator component.

[0029] The preferred embodiments of the present invention are described in detail above, but the present invention is not limited to the specific details in the above embodiments. Within the technical concept of the present invention, various equivalent transformations can be made to the technical scheme of the present invention, and these equivalent transformations all belong to the protection scope of the present invention.

Claims

1. A method for detecting a master oscillator assembly of a radar equipment seeker, characterized in that: Under the condition that the master oscillator outputs a composite signal, the excitation unit, the transfer unit, and the measurement unit are connected to the master oscillator in sequence. Each signal is specifically classified into: voltage and current signal, self-test signal, clock pulse signal, local oscillator signal, detection signal, and detection signal; then the following steps are implemented in sequence: S1: Voltage and current signal test: Connect the digital multimeter to the +18V, -15V, +16V and +27V power supply test interfaces on the adapter unit, turn on the "main power" switch on the adapter unit, set the "CLKen1" switch on the adapter unit to the "1" position, and observe the voltage value measured by the digital multimeter and the current consumption of the DC regulated power supply; S2: Self-test signal test: Connect the "CH1" channel of the digital oscilloscope to the "+16Vo" of the adapter unit, connect the "CH2" channel of the digital oscilloscope to the "RF-OK" of the adapter unit, turn on the "main power" switch on the adapter unit, and use the digital oscilloscope to measure the lag time of the falling edge of the "RF-OK" signal relative to the rising edge of the +16V power supply; S3: Clock pulse signal test: Connect the "CH1" channel of the digital oscilloscope to the clock pulse signal test point of the transfer unit, turn on the "main power" switch of the transfer unit, and use the digital oscilloscope to measure the period, duty cycle, high level and low level of the output pulse signal of the "CLKf" point of the transfer unit; S4: Local oscillator signal test: Connect the spectrum analyzer to the local oscillator signal port of the master oscillator, turn on the "main power" switch of the adapter unit, use the "Freq Count" button of the spectrum analyzer to measure the frequency and signal power of the local oscillator signal, and use the spectrum analyzer to measure the phase noise at 5kHz and 10kHz deviation from the carrier frequency; S5: Detection signal test: Use a spectrum analyzer to measure the power P of the center spectrum line of the detection signal at this time, connect the coaxial detector to the detection signal port, connect it to the digital oscilloscope with a coaxial cable, and set the input impedance of the digital oscilloscope to 50Ω, and use the digital oscilloscope to measure the modulation pulse period and duty cycle of the detection signal; S6: Detection signal test: Use a spectrum analyzer to connect to the 5 detection signal ports of the master oscillator respectively, turn on the "main power" switch of the adapter unit, use the spectrum analyzer to measure the power of the IF and RF signals output by the 5 ports respectively, use the "Freq Count" button of the spectrum analyzer to measure the frequency of the IF and RF signals output by the 5 ports respectively, and record the power and frequency of the IF and RF signals output by the 5 ports.

2. The detection method of the radar equipment seeker master oscillator assembly according to claim 1, characterized in that: The voltage and current signals are detections of the power supply voltage and current consumption. You can first connect the power supply to the corresponding pin of the product, switch the state of the test platform, and use a digital multimeter and a DC regulated power supply to test the voltage and current.

3. The detection method of the radar equipment seeker master oscillator assembly according to claim 1, characterized in that: The self-test signal is tested by adding an excitation signal to the product, switching the state of the test platform, and testing the lag time of the falling edge of the self-test signal relative to the rising edge of the +16V power supply.

4. The detection method of the radar equipment seeker master oscillator assembly according to claim 1, characterized in that: The test of the clock pulse signal is to introduce the pin to be tested into the test platform, and use the oscilloscope of the test platform to measure the period and duty cycle indicators of the signal.

5. The detection method of the radar equipment seeker master oscillator assembly according to claim 1, characterized in that: The test of the local oscillator signal and the detection signal introduces the interface to be tested into the test platform, and uses the spectrum analyzer of the test platform to measure the frequency, power, isolation, and phase noise indicators of the signal.

6. The detection method of the radar equipment seeker master oscillator assembly according to claim 1, characterized in that: The test of the detection signal introduces the interface to be tested into the test platform, and uses the counter and oscilloscope of the test platform to measure the frequency and amplitude indicators of the signal.

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