Raman light reflector calibration device and method and atom interference gravimeter

Abstract

The embodiment of the invention discloses a Raman light reflector calibration device and method and an atom interference gravimeter applying the Raman light reflector calibration device. The Raman light reflector calibration device comprises, for example, a beam splitter; the retroreflector is arranged on one side of the beam splitter; the Raman light reflecting mirror adjusting mechanism is arranged corresponding to the beam splitter; the objective lens assembly is arranged corresponding to the beam splitter; the image sensor is arranged on one side, far away from the beam splitter, of the objective lens assembly; and the main control unit is electrically connected with the image sensor. According to the embodiment of the invention, the inclination angle of the Raman light reflector can be quickly measured and adjusted, and the working efficiency and the operation convenience are improved.

Description

Technical Field

[0001] The invention relates to the technical field of atomic interference measurement, and in particular to a Raman light reflector calibration device, a Raman light reflector calibration method and an atomic interference gravimeter. Background Art

[0002] Atomic interferometry technology can be used to achieve precise measurement of physical quantities such as time, inertia, and electromagnetic fields, and plays an important role in many fields such as basic physics, geophysics, gravity navigation, and resource exploration.

[0003] The interferometric measurement process of a general atomic interferometer gravimeter is usually achieved through the coherent manipulation of two Raman laser beams propagating in opposite directions. In gravity interferometric measurement, the misalignment of the two laser beams caused by the tilt of the Raman light reflector will affect the accuracy of gravity measurement and is the main error term of the atomic interferometer gravimeter. Therefore, before performing absolute gravity measurement, the tilt of the Raman light reflector must be measured and adjusted. Typically, the calibration of the inclination angle of the Raman light reflector is mainly achieved by modulating the direction of the Raman light beam or using a commercial autocollimator to calibrate the inclination angle of the Raman light reflector. However, these methods generally have the problems of complex operation, long time consumption and poor reliability. Summary of the invention

[0004] In order to solve the above-mentioned deficiencies and defects of the prior art, the present invention provides a Raman light reflector calibration device, a Raman light reflector calibration method and an atomic interferometer gravimeter, which can quickly and efficiently measure and adjust the tilt angle of the Raman light reflector, improve the measurement accuracy of the system, and improve work efficiency and ease of operation.

[0005] On the one hand, an embodiment of the present invention provides a Raman light reflector calibration device, which includes, for example: a beam splitter; a reflector, arranged on one side of the beam splitter; a Raman light reflector adjustment mechanism, arranged corresponding to the beam splitter; an objective lens assembly, arranged corresponding to the beam splitter; an image sensor, arranged on a side of the objective lens assembly away from the beam splitter; and a main control unit, electrically connected to the image sensor.

[0006] In one embodiment of the present invention, the beam splitter is used to separate the Raman beam of the atomic interferometer gravimeter into a reference Raman beam and a measurement Raman beam, and reflect the reference Raman beam onto the reflector, and transmit the measurement Raman beam to the Raman light reflector of the atomic interferometer gravimeter; the reflector is used to reflect the reference Raman beam reflected by the beam splitter to the objective lens assembly; the beam splitter is also used to reflect the measurement Raman beam reflected by the Raman light reflector to the objective lens assembly; the objective lens assembly is also used to respectively reflect the reference Raman beam reflected by the reflector and the measurement Raman beam reflected by the Raman light reflector to the objective lens assembly. The measuring Raman light beam reflected by the beam splitter is focused and transmitted to the image sensor; the image sensor is used to obtain measuring Raman light beam image data and reference Raman light spot image data according to the measuring Raman light beam and the reference Raman light beam; the main control unit is used to obtain the measuring Raman light spot image data and the reference Raman light spot image data, determine the spot center spacing between the reference Raman light beam and the measuring Raman light beam, and determine the inclination angle of the Raman light reflector according to the spot center spacing and the spacing between the objective lens assembly and the image sensor, so as to adjust the angle of the Raman light reflector.

[0007] In one embodiment of the present invention, the main control unit is also electrically connected to the Raman light reflector adjustment mechanism; the main control unit is also used to control the Raman light reflector adjustment mechanism to adjust the angle of the Raman light reflector according to the inclination angle of the Raman light reflector.

[0008] In one embodiment of the present invention, the inclination angle of the Raman light reflector satisfies the formula: θ = arctan(d / f) / 2, among which, θ is the inclination angle of the Raman light reflector, d is the spot center distance between the measured Raman spot image and the reference Raman spot image; f is the focal length of the objective lens assembly.

[0009] In one embodiment of the present invention, the reflector is located on a side of the beam splitter away from the image sensor, and the reflector has a first reflective mirror surface and a second reflective mirror surface, the angle between the first reflective mirror surface and the second reflective mirror surface is 90°, and the first reflective mirror surface and the second reflective mirror surface are used to reflect the reference Raman light beam reflected by the beam splitter in a parallel direction to the objective lens assembly.

[0010] In one embodiment of the present invention, the splitting ratio of the beam splitter is 90:10.

[0011] In one embodiment of the present invention, the Raman light reflector calibration device further comprises a first aperture and a second aperture, wherein the first aperture is located between the retroreflector and the beam splitter; and the second aperture is located between the objective lens assembly and the beam splitter.

[0012] On the other hand, an atomic interferometer gravimeter provided by an embodiment of the present invention, for example, includes: a Raman laser generating device; a beam expander, arranged corresponding to the Raman laser generating device; a Raman light reflector, arranged corresponding to the beam expander; and a Raman light reflector calibration device as described in any of the foregoing items, arranged between the beam expander and the Raman light reflector and connected to the Raman light reflector, the Raman light reflector calibration device being used to adjust the angle of the Raman light reflector.

[0013] In one embodiment of the present invention, the beam expander and the Raman light reflector are located on opposite sides of the beam splitter, and the Raman light reflector is arranged on the Raman light reflector adjustment mechanism.

[0014] On the other hand, a Raman light reflector calibration method provided by an embodiment of the present invention is applied to the aforementioned atomic interferometer gravimeter; the Raman light reflector calibration method, for example, includes: obtaining a reference Raman beam obtained by the Raman beam passing through the beam splitter and the measurement Raman spot image data and the reference Raman spot image data obtained by irradiating the measurement Raman beam on the image sensor; determining a first spot center pixel position of the reference Raman beam and a second spot center pixel position of the measurement Raman beam according to the measurement Raman spot image data and the reference Raman spot image data; determining a spot center spacing between the first spot center pixel position and the second spot center pixel position; and determining the inclination angle of the Raman light reflector according to the spot center spacing and the focal length of the objective lens assembly to adjust the angle of the Raman light reflector.

[0015] One or more of the above technical solutions have at least the following advantages or beneficial effects: 1) The embodiment of the present invention can quickly and efficiently measure and adjust the tilt angle of the Raman light reflector by providing a Raman light reflector calibration device with a specific structure, thereby improving work efficiency and operational convenience.

[0016] 2) By integrating the main control unit with the automatic adjustment of the angle of the Raman light reflector, the workload of the user is reduced, the ease of operation is further improved, the automatic control of the angle is realized, and the accuracy of the angle control is improved. The main control unit can even periodically determine the inclination of the Raman light reflector and then dynamically adjust the angle of the Raman light, which further improves the ease of operation, realizes dynamic monitoring of the inclination, and improves accuracy.

[0017] 3) By adopting an image sensor and a main control unit, and using the main control unit to recognize the pixel position difference image of the center of the light spot, the center spacing of the light spot can be determined very accurately, thereby improving the accuracy of angle adjustment and measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solution of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0019] Figure 1 A schematic structural diagram of an atomic interferometer gravimeter provided in an embodiment of the present invention.

[0020] Figure 2 for Figure 1 A schematic structural diagram of a Raman light reflector calibration device is shown.

[0021] Figure 3 for Figure 2 An enlarged schematic diagram of the structure of the retroreflector is shown.

[0022] Figure 4 A schematic structural diagram of another atomic interferometer gravimeter provided in an embodiment of the present invention.

[0023] Figure 5 A schematic diagram of the steps of a Raman light reflector calibration method provided by an embodiment of the present invention.

[0024] Figure 6 for Figure 5 Schematic diagram showing the detailed steps of the Raman optical mirror calibration method. DETAILED DESCRIPTION

[0025] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0026] It should be noted that the terms "first", "second", "one end", etc. in the specification and claims of the present invention are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the terms used in this way can be interchangeable where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, system, product, or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, products, or devices.

[0027] See also Figure 1 , an embodiment of the present invention provides an atomic interferometer gravimeter 10. The atomic interferometer gravimeter 10, for example, mainly includes: a Raman laser generating device 300, a beam expander 210, a Raman light reflector 220 and a Raman light reflector calibration device 100. Among them, the beam expander 210 is connected to the Raman laser generating device 300. Specifically, the atomic interferometer gravimeter 10 may also include an optical fiber 230. The beam expander 210 is connected to the Raman laser generating device 300 through the optical fiber 230. The Raman light reflector 220 is arranged corresponding to the beam expander 210. The Raman light reflector calibration device 100 is arranged between the beam expander 210 and the Raman light reflector 220, and the Raman light reflector calibration device 100 is connected to the Raman light reflector 220. More specifically, the Raman laser generating device 300, for example, includes two external cavity diode lasers (referred to as a main laser and an auxiliary laser). The laser generated by the Raman laser generating device 300 is transmitted to the beam expander 210. The beam expander 210 can expand the diameter of the parallel input Raman beam to a larger parallel output Raman beam. The beam expander 210 can be, for example, a Galilean laser beam expander, a Keplerian laser beam expander or other beam expanders with similar functions. Typically, the beam expander 210 includes a barrel and an objective lens and an imaging lens disposed in the barrel. In the barrel, the positions of the objective lens and the imaging lens are reversed. The further specific structure of the beam expander 210 is not repeated here. The Raman light reflector 220 is used to reflect the laser beam. The Raman light reflector calibration device 100 is used to adjust the angle of the Raman light reflector 220 so that the Raman light beam incident on the Raman reflector 220 by the beam expander 210 coincides with the direction of the Raman reflected light beam emitted from the Raman light reflector 220, so as to reduce the measurement error of the atomic interferometer gravimeter 10 and improve the measurement accuracy.

[0028] like Figure 2As shown, the Raman light reflector calibration device 100 includes, for example, a beam splitter 110, a reflector 120, an objective lens assembly 130, an image sensor 140, a main control unit 150, and a Raman light reflector adjustment mechanism 160. The reflector 120 is arranged at one side of the beam splitter 110; the Raman light reflector adjustment mechanism 160 is arranged corresponding to the beam splitter 110. The objective lens assembly 130 is arranged corresponding to the beam splitter 110. The image sensor 140 is arranged at a side of the objective lens assembly 130 away from the beam splitter 110. The main control unit 150 is electrically connected to the image sensor 140.

[0029] Specifically, the beam splitter 110 is, for example, an optical device that splits a beam of light into two or more beams of light. The beam splitter 110 is typically made of a metal film or a dielectric film. The most common shape of the beam splitter 110 is a cube, which is made of two triangular glass prisms. The beam splitter 110 is glued together on a substrate using polyester, epoxy or polyurethane adhesives. The thickness of the resin layer is adjusted so that half of the light incident through a face of a cube of the beam splitter 110 is reflected, and the other half is continued to be transmitted due to total internal reflection. In another embodiment of the present invention, the beam splitter 110 can also use a half-silvered mirror, a piece of glass or plastic, a transparent thin metal coating, and the metal coating is usually aluminum vapor deposited aluminum. By controlling the thickness of the deposit, part (usually half) of the light that is incident at a 45-degree angle and is not absorbed by the coating can be transmitted, and the rest is reflected. In addition, a dichroic optical coating can also be used instead of a metal coating. According to its characteristics, the ratio of reflection to transmission will vary as a function of the wavelength of the incident light. In another embodiment of the present invention, the beam splitter 110 may also be a dichroic mirror prism assembly.

[0030] In this embodiment, the beam splitter 110 is a parallel plate or a polarization insensitive beam splitter. The beam splitter 110 has a light splitting ratio of 90:10, for example.

[0031] In addition, the retroreflector 120 includes, for example, a reflective mirror surface, and can emit the incident light beam in a direction opposite to the transmission direction of the incident light beam.

[0032] As mentioned above, the objective lens assembly 130 is, for example, an objective lens focusing system. Specifically, the objective lens focusing system, for example, includes positive and negative lenses. The present embodiment adopts a positive and negative lens combination, and reduces spherical aberration through optical design software simulation to improve measurement accuracy. In the present embodiment, the objective lens focusing system is designed to fold the optical path to meet the needs of compact installation in the atomic interferometer gravimeter, save the space occupied by the equipment, and improve the reliability of calibration. In the present embodiment, the effective focal length of the objective lens focusing system is greater than 150mm, which can improve measurement accuracy. Optionally, the focal length of the objective lens focusing system is 250mm.

[0033] The image sensor 140, for example, utilizes the photoelectric conversion function of a photoelectric device to convert the light image on the photosensitive surface into an electrical signal that is proportional to the light image. Specifically, the image sensor 140 is a functional device that divides the light beam on its light-receiving surface into many small units and converts them into usable electrical signals. The image sensor 140 is, for example, a scientific research-grade CMOS or CCD camera, and its pixel resolution is below 5 microns. For example, the pixel size of a scientific research-grade CMOS camera is 3.45×3.45 microns. Optionally, the image plane of the image sensor 140 is at the focal length of the objective lens assembly 130.

[0034] The main control unit 150 includes, for example, a microcontroller (MCU) or a PLC or other electrical components having data processing and control functions. In this embodiment, the main control unit 150 is, for example, a computer (also called a host computer).

[0035] The Raman light reflector adjustment mechanism 160 is used to adjust the angle (or tilt angle) of the Raman light reflector 220. For example, the Raman light reflector adjustment mechanism 160 includes a motor, such as a stepper motor. The output shaft of the motor is connected to one end of the Raman light reflector 220. When the motor rotates, the Raman light reflector 220 is driven to rotate, thereby adjusting and calibrating the angle of the Raman light reflector 220. The Raman light reflector calibration device 100 provided in the embodiment of the present invention can quickly and efficiently measure and adjust the tilt angle of the Raman light reflector, improve the measurement accuracy of the system, and improve work efficiency and ease of operation.

[0036] In one embodiment of the present invention, Figure 1 and Figure 2 As shown, the beam expander 210 and the Raman light reflector 220 are located on opposite sides of the beam splitter 110 , and the Raman light reflector 220 is disposed on the Raman light reflector adjustment mechanism 160 .

[0037] like Figure 2As shown, in one embodiment of the present invention, the Raman laser generating device 300 of the atomic interferometer gravimeter 10 emits Raman laser, and the laser is transmitted to the beam expander 210 through the optical fiber 230. The beam expander 210 performs beam expansion processing on the Raman laser and emits a Raman beam L to the beam splitter 110. The beam splitter 110 is used to separate the Raman beam of the atomic interferometer gravimeter 10 into a reference Raman beam R and a measurement Raman beam M, and reflect the reference Raman beam R to the reflector 120 through the upper reflection surface of the beam splitter 110, and transmit the measurement Raman beam M to the Raman light reflector 220 of the atomic interferometer gravimeter 10. The reflector 120 is used to reflect the reference Raman beam R reflected by the beam splitter 110 to the objective lens assembly 130; the beam splitter 110 is also used to reflect the measurement Raman beam M reflected by the Raman light reflector 220 to the objective lens assembly 130 through the lower reflection surface of the beam splitter 110. The objective lens assembly 130 is also used to focus the reference Raman beam R reflected by the reflector 120 and the measuring Raman beam M reflected by the beam splitter 110, respectively, and transmit them to the image sensor 140. The image sensor 140 is used to obtain the measuring Raman beam image data and the reference Raman spot image data according to the measuring Raman beam M and the reference Raman beam R; the main control unit 150 is used to obtain the measuring Raman spot image data and the reference Raman spot image data, determine the spot center distance d of the reference Raman beam and the measuring Raman beam, and determine the spot center distance d according to the spot center distance d and the distance between the objective lens assembly 130 and the image sensor 140 (or the focal length of the objective lens assembly 130). f Determine the tilt angle of the Raman reflector θ , so that users can adjust the Raman light reflector according to its inclination angle θ To adjust the angle of the Raman light reflector 220. Specifically, the user can control the Raman light reflector adjustment mechanism 160 to rotate so that the Raman light reflector 220 rotates. θ horn ， Finally, the Raman beam incident on the Raman reflector 220 by the beam expander 210 coincides with the direction of the Raman reflected beam emitted from the Raman reflector 220 , thereby reducing the measurement error of the atomic interferometer gravimeter 10 and improving the measurement accuracy.

[0038] See also Figure 2The Raman beam emitted by the beam expander 210 is divided into two beams - a reference Raman beam and a measurement Raman beam. The reflected light of the measurement Raman beam through the beam splitter 110 is incident on the objective lens assembly at an angle of 2θ. The beam passes through the objective lens system of the objective lens assembly and is focused on point B on the image plane of the image sensor (the center position of the measurement Raman spot image). The reference Raman beam passes through the objective lens system and is focused on point A on the image plane of the image sensor (the center position of the reference Raman spot image). The distance between point A and point B is the spot center spacing. d .

[0039] More specifically, in one embodiment of the present invention, the inclination angle of the Raman light reflector satisfies the following formula (1): θ = arctan(d / f) / 2, (1) in, θ is the inclination angle of the Raman light reflector, d is the spot center distance between the measured Raman spot image and the reference Raman spot image, f is the focal length of the objective lens assembly 130. θ =1arc sec, d =0.002424mm.

[0040] Furthermore, if Figures 1 to 3 As shown, in one embodiment of the present invention, the reflector 120 is located on a side of the beam splitter 110 away from the image sensor 140, and the reflector 120 has a first reflective mirror surface 121 and a second reflective mirror surface 122. The angle between the first reflective mirror surface 121 and the second reflective mirror surface 122 is 90°, that is, the first reflective mirror surface 121 and the second reflective mirror surface 122 are arranged vertically. The first reflective mirror surface 121 and the second reflective mirror surface 122 are used to reflect the reference Raman light beam R reflected by the beam splitter 110 to the objective lens assembly 130 in a parallel direction.

[0041] Furthermore, if Figure 4 In one embodiment of the present invention, the main control unit 150 is also electrically connected to the Raman light reflector adjustment mechanism 160. The main control unit 150 is also used to adjust the Raman light reflector according to the inclination angle of the Raman light reflector. θ The Raman light reflector adjustment mechanism 160 is controlled to adjust the angle of the Raman light reflector 220. Specifically, the main control unit 150 is electrically connected to the motor of the Raman light reflector adjustment mechanism 160, and the main control unit 150 adjusts the angle of the Raman light reflector according to the inclination angle of the Raman light reflector. θGenerate corresponding control instructions to control the rotation and angle of the motor, so as to realize automatic control of the angle of the Raman light reflector 220, reduce the workload of the user, further improve the ease of operation, realize automatic calibration of the angle, and improve the accuracy of the angle control. Even more, the main control unit 150 can periodically determine the inclination of the Raman light reflector 220, and then dynamically adjust the angle of the Raman light reflector 220, further improve the ease of operation, realize dynamic monitoring of the inclination, and improve the accuracy.

[0042] In addition, if Figure 4 As shown, in one embodiment of the present invention, the Raman light reflector calibration device 100 further includes a first diaphragm 170 and a second diaphragm 180. The first diaphragm 170 is located between the reflector 120 and the beam splitter 110; the second diaphragm 180 is located between the objective lens assembly 130 and the beam splitter 110. In this embodiment, the first diaphragm 170 and the second diaphragm 180 are, for example, adjustable pinhole diaphragms. The first diaphragm 170 is, for example, used to limit the spot size of the reference Raman light beam R and change the light intensity to meet actual needs. The second diaphragm 180 is, for example, used to limit the spot range of the measurement Raman light beam M so that it is transmitted to the image sensor 140.

[0043] In addition, an embodiment of the present invention further provides a Raman light reflector calibration method. The Raman light reflector calibration method is applied to the aforementioned atomic interferometer gravimeter 10, and specifically to the main control unit 150 of the Raman light reflector calibration device 100. More specifically, as Figure 5 As shown, the Raman light reflector calibration method includes, for example: S10: acquiring a reference Raman beam obtained by the Raman beam passing through the beam splitter and measurement Raman spot image data and the reference Raman spot image data obtained by irradiating the measurement Raman beam on the image sensor; S30: determining a first spot center pixel position of the reference Raman beam and a second spot center pixel position of the measurement Raman beam according to the measurement Raman spot image data and the reference Raman spot image data; S50: Determine the spot center distance between the first light spot center pixel position and the second light spot center pixel position; S70: Determine the inclination angle of the Raman light reflector according to the center distance of the light spots and the focal length of the objective lens assembly to adjust the angle of the Raman light reflector.

[0044] In order to more conveniently understand the Raman light reflector calibration method provided by the embodiment of the present invention, the embodiment of the present invention is combined with Figure 6 The Raman light reflector calibration method is described in detail.

[0045] First, install the Raman light reflector calibration device 100 to the Raman light output end in the atomic interferometer gravimeter 10, and confirm that the computer is connected to the image sensor. Next, turn on the Raman laser generating device 300, turn on the laser system, and confirm the spot pixel position of the measured Raman beam displayed in the image sensor. After that, open the first aperture so that the reference Raman beam is irradiated onto the image sensor, and confirm the spot pixel position of the reference Raman beam displayed in the image sensor. The collected spot image data (including the measured Raman spot image data and the reference Raman spot image data) is transmitted to the computer. The computer performs image recognition processing on the measured Raman spot image data and the reference Raman spot image data. Specifically, the computer identifies and determines the first spot center pixel position of the reference Raman beam and the second spot center pixel position of the measured Raman beam according to the measured Raman spot image data and the reference Raman spot image data, and calculates the pixel position difference of the spot center, that is, determines the spot center spacing of the first spot center pixel position and the second spot center pixel position. d Afterwards, the computer calculates the inclination angle of the Raman light reflector according to the above formula (1): θ Finally, the computer calculates the inclination angle of the Raman light reflector. θ The angle of the Raman light reflector is dynamically adjusted to complete the tilt calibration of the Raman light reflector.

[0046] In summary, the embodiment of the present invention can quickly and efficiently measure the tilt angle of the Raman light reflector by setting a Raman light reflector calibration device with a specific structure, thereby improving the measurement accuracy of the system, and improving work efficiency and ease of operation. By integrating the main control unit with the automatic adjustment of the rotation angle of the Raman light reflector, the workload of the user is reduced, the ease of operation is further improved, the automatic control of the rotation angle is also achieved, and the accuracy of the rotation angle control is improved. Even more, the main control unit can periodically determine the tilt angle of the Raman light reflector, and then dynamically adjust the angle of the Raman light beam, which further improves the ease of operation, realizes dynamic monitoring of the tilt angle, and improves accuracy. By adopting an image sensor and a main control unit, and using the main control unit to recognize the pixel position difference image of the center of the light spot, the center spacing of the light spot can be determined very accurately, and the accuracy of angle adjustment and measurement is improved.

[0047] In addition, it can be understood that the aforementioned embodiments are only exemplary illustrations of the present invention. Under the premise that the technical features do not conflict, are not contradictory, and do not violate the purpose of the present invention, the technical solutions of the various embodiments can be arbitrarily combined and used in combination.

[0048] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A Raman light reflector calibration device, characterized in that: include: Beam splitters; A retroreflector, disposed on one side of the beam splitter; A Raman light reflector adjustment mechanism is arranged corresponding to the beam splitter; an objective lens assembly, arranged corresponding to the beam splitter; An image sensor is arranged on a side of the objective lens assembly away from the beam splitter; as well as A main control unit is electrically connected to the image sensor.

2. The Raman light reflector calibration device according to claim 1, characterized in that: The beam splitter is used to separate the Raman beam of the atomic interferometer gravimeter into a reference Raman beam and a measurement Raman beam, and reflect the reference Raman beam onto the retroreflector, and transmit the measurement Raman beam to the Raman light reflector of the atomic interferometer gravimeter; The retroreflector is used to reflect the reference Raman beam reflected by the beam splitter to the objective lens assembly; The beam splitter is also used to reflect the measuring Raman light beam reflected by the Raman light reflector to the objective lens assembly; The objective lens assembly is also used to focus the reference Raman beam reflected by the retroreflector and the measurement Raman beam reflected by the beam splitter, respectively, and transmit them to the image sensor; The image sensor is used to obtain measurement Raman beam image data and reference Raman spot image data according to the measurement Raman beam and the reference Raman beam; The main control unit is used to obtain the measured Raman spot image data and the reference Raman spot image data, determine the spot center spacing between the reference Raman beam and the measured Raman beam, and determine the inclination angle of the Raman light reflector according to the spot center spacing and the spacing between the objective lens assembly and the image sensor, so as to adjust the angle of the Raman light reflector.

3. The Raman light reflector calibration device according to claim 2, characterized in that: The main control unit is also electrically connected to the Raman light reflector adjustment mechanism; the main control unit is also used to control the Raman light reflector adjustment mechanism to adjust the angle of the Raman light reflector according to the inclination angle of the Raman light reflector.

4. The Raman light reflector calibration device according to claim 2, characterized in that: The inclination angle of the Raman light reflector satisfies the formula: θ = arctan(d / f) / 2, among which, θ is the inclination angle of the Raman light reflector, d is the spot center distance between the measured Raman spot image and the reference Raman spot image; f is the focal length of the objective lens assembly.

5. The Raman light reflector calibration device according to claim 2, characterized in that: The reflector is located on a side of the beam splitter away from the image sensor, and has a first reflective mirror surface and a second reflective mirror surface, wherein the included angle between the first reflective mirror surface and the second reflective mirror surface is 90°, and the first reflective mirror surface and the second reflective mirror surface are used to reflect the reference Raman light beam reflected by the beam splitter in a parallel direction to the objective lens assembly.

6. The Raman light reflector calibration device according to claim 1, characterized in that: The beam splitter has a splitting ratio of 90:

10.

7. The Raman light reflector calibration device according to claim 1, characterized in that: The Raman light reflector calibration device further comprises a first aperture and a second aperture, wherein the first aperture is located between the retroreflector and the beam splitter; and the second aperture is located between the objective lens assembly and the beam splitter.

8. An atomic interferometer gravimeter, characterized in that: include: Raman laser generating device; A beam expander, arranged corresponding to the Raman laser generating device; A Raman light reflector, arranged corresponding to the beam expander; The Raman light reflector calibration device according to any one of claims 1 to 7 is arranged between the beam expander and the Raman light reflector and is connected to the Raman light reflector, and the Raman light reflector calibration device is used to adjust the angle of the Raman light reflector.

9. The atomic interferometer gravimeter according to claim 8, characterized in that: The beam expander and the Raman light reflector are located on two opposite sides of the beam splitter, and the Raman light reflector is arranged on the Raman light reflector adjustment mechanism.

10. A Raman light reflector calibration method, applied to the atomic interferometer gravimeter as claimed in claim 8 or 9, characterized in that: include: Acquire a reference Raman beam obtained by the Raman beam passing through the beam splitter and measurement Raman spot image data and the reference Raman spot image data obtained by irradiating the measurement Raman beam on the image sensor; Determine a first spot center pixel position of the reference Raman beam and a second spot center pixel position of the measurement Raman beam according to the measurement Raman spot image data and the reference Raman spot image data; Determine the spot center distance between the first light spot center pixel position and the second light spot center pixel position; as well as The inclination angle of the Raman light reflector is determined according to the center distance of the light spots and the focal length of the objective lens assembly to adjust the angle of the Raman light reflector.

Images