Flip-top cable test fixture and test equipment

Abstract

The present invention discloses a flip-type cable test fixture and test equipment, including a base, a probe flip and a quick-change fixture, the base is provided with a fixture positioning groove and a limit lock structure, a first positioning part is provided in the fixture positioning groove, the probe flip includes a cover plate, a floating plate, a bearing plate and a probe module, the floating plate is floatingly connected to the cover plate, the bearing plate is connected to the floating plate, the probe module is mounted on the bearing plate, a positioning guide column is provided on the bearing plate, the quick-change fixture is detachably mounted in the fixture positioning groove, the quick-change fixture is provided with a second positioning part and a positioning guide hole, the second positioning part cooperates with the first positioning part to form a positioning structure, and the positioning guide hole cooperates with the positioning guide column to form a positioning guide structure. Through the floating connection between the floating plate and the cover plate, the position of the probe module is adjustable, and positioning and guiding are performed through the positioning guide hole and the positioning guide column, so that the position of the probe module is adapted to the quick-change fixture, thereby improving the alignment accuracy of the probe and the test point.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a flip-type cable testing fixture and testing equipment. Background Art

[0002] In the design of charging products, in order to save internal space and improve the compactness and portability of the product, the flexible cable often needs to be bent. This bending design not only helps to optimize the internal structure of the product, but also reduces the use of materials and reduces costs. Most of the connecting cables of charging products are straight structures or tested before pre-bending. However, the bent flexible cables may be affected by factors such as stress concentration and wear during long-term use, resulting in performance degradation or even failure. Therefore, performing a bending test is an important means to evaluate the performance stability and service life of the flexible cable in a bent state. The connecting cable of the charging product is improved from a straight structure to a 180° bending structure. The original test fixture is no longer applicable, and the manual testing efficiency is low. During the development of the new test fixture, it was found that because the test points on the connecting cable are small and dense, the probes that contact the test points are also small and dense, which easily leads to the problem of misalignment between the probes and the test points. Summary of the invention

[0003] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention provides a flip-top cable test fixture and a test device, which has a floating probe structure and can improve the alignment accuracy between the probe and the test point.

[0004] On the one hand, an embodiment of the present invention provides a flip-type cable test fixture, comprising:

[0005] The base is provided with a fixture positioning groove and a limit lock structure, and a first positioning portion is provided in the fixture positioning groove;

[0006] The probe flip cover has a first end and a second end, the first end of the probe flip cover is connected to the base, the second end of the probe flip cover can rotate relative to the base around the first end and is movably connected to the limit lock structure to cover the fixture positioning groove, the probe flip cover includes a cover plate, a floating plate, a bearing plate and a probe module, the floating plate is floatingly connected to the cover plate, the bearing plate is connected to the floating plate, the probe module is mounted on the bearing plate, and a positioning guide column is arranged on the bearing plate;

[0007] The quick-change clamp is detachably mounted in the clamp positioning groove. The quick-change clamp is provided with a second positioning portion and a positioning guide hole. The second positioning portion cooperates with the first positioning portion to form a positioning structure. The positioning guide hole cooperates with the positioning guide column to form a positioning guide structure.

[0008] According to some embodiments of the present invention, the cover plate is provided with a plurality of limit columns, the floating plate is provided with a plurality of limit holes, the floating plate is sleeved on the plurality of limit columns of the cover plate through the plurality of limit holes, and a fine-tuning gap is provided between the inner wall of the limit hole and the limit column.

[0009] According to some embodiments of the present invention, a limit frame is provided on the cover plate and located on opposite sides of the floating plate, limit rollers are installed on opposite sides of the floating plate, the limit rollers are located in the limit frame, and a first elastic member is connected between the cover plate and the floating plate.

[0010] According to some embodiments of the present invention, the cover plate includes a first supporting frame and a second supporting frame that are nested with each other, a side edge of the first supporting frame is used as or provided with an anti-fool fitting portion, there is a distance difference between the bottom surface of the first supporting frame and the bottom surface of the second supporting frame to form an anti-fool avoidance position, and the bottom surface of the first supporting frame and the bottom surface of the second supporting frame are both facing the quick-change clamp in the rotation direction of the cover plate.

[0011] According to some embodiments of the present invention, a second avoidance position is provided on the base and adjacent to the clamp positioning groove, and an interface component is installed in the second avoidance position, and the interface component can move toward or away from the clamp positioning groove.

[0012] According to some embodiments of the present invention, a locking recess is provided at an edge of the first carrying frame, and a limit locking member is provided on the interface assembly. The limit locking member can move with the interface assembly and be locked in the locking recess.

[0013] According to some embodiments of the present invention, a push rod is disposed on the second carrying frame, and the position of the push rod is adapted to the signal interface of the target product.

[0014] According to some embodiments of the present invention, a sheath is movably mounted on the carrier plate, and a third elastic member is connected between the carrier plate and the sheath, and the sheath is sleeved on the probe module.

[0015] According to some embodiments of the present invention, the first end of the first supporting frame and the first end of the second supporting frame are connected to the same rotating shaft, a reset torsion spring is installed on the rotating shaft, and the second end of the second supporting frame abuts against the second end of the first supporting frame.

[0016] On the other hand, an embodiment of the present invention provides a testing device, including the above-mentioned flip-top cable testing fixture.

[0017] The embodiments of the present invention have at least the following beneficial effects:

[0018] The position of the probe module is adjustable through the floating connection between the floating plate and the cover plate, and the positioning guide is performed through the positioning guide holes and positioning guide pillars, so that the position of the probe module is adapted to the quick-change fixture, thereby improving the alignment accuracy of the probe and the test point.

[0019] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0021] Figure 1 This is a structural schematic diagram of a flip-top cable test fixture (with a hidden quick-change fixture) according to an embodiment of the present invention.

[0022] Figure 2 This is a second structural diagram of the flip-top cable test fixture according to an embodiment of the present invention (the probe cover is in an open state);

[0023] Figure 3 This is the third structural schematic diagram of the flip-top cable test fixture according to an embodiment of the present invention (the probe cover is in the closed state);

[0024] Figure 4 for Figure 2 One of the structural schematic diagrams of the probe cover of the flip-top cable test fixture is shown;

[0025] Figure 5 for Figure 2 The second structural schematic diagram of the probe cover of the flip-top cable test fixture is shown;

[0026] Figure 6 for Figure 2 One of the structural schematic diagrams of the quick-change fixture of the flip-top cable test fixture is shown;

[0027] Figure 7 for Figure 2 The second structural schematic diagram of the quick-change fixture of the flip-top cable test fixture is shown;

[0028] Figure 8 for Figure 2 The third structural schematic diagram of the quick-change fixture of the flip-top cable test fixture is shown (top view);

[0029] Fig. 9 for Figure 8 The cross-sectional structure diagram at the CC mark position in the middle;

[0030] Fig.10A schematic diagram of the structure of a target workpiece according to an embodiment of the present invention;

[0031] Fig.11 for Figure 5 The middle circle shows a partial enlarged view of position B.

[0032] Reference numerals:

[0033] Base 100, fixture positioning groove 101, first positioning portion 102, first avoidance position 103, clamping flange 104, second avoidance position 106, limit locking structure 110, interface assembly 130, interface module 131, connector 132, drive member 133, slide rail module 134, limit locking member 135, probe flip cover 200, cover plate 210, first bearing frame 211, limit frame 2111, locking recess 2112, rotating shaft 2113, reset torsion spring 211 4. The second supporting frame 212, the limiting column 2121, the pushing rod 2122, the floating plate 220, the limiting hole 221, the limiting roller 222, the supporting plate 230, the positioning guide column 231, the sleeve 232, the probe module 240, the quick-change fixture 300, the bottom plate 310, the guide hole 311, the second positioning part 312, the shaping plate 320, the positioning guide hole 321, the clamping piece 330, the anti-foolproof slider 340, the anti-foolproof protrusion 341, the first crimping part 342, and the clamping part 343. DETAILED DESCRIPTION

[0034] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0035] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0036] In the description of the present invention, "several" means one or more, "multiple" means more than two, greater than, less than, and exceeding are understood as not including the number itself, and "above", "below", and "within" are understood as including the number itself. If there is a description of "first", "second", etc., it is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0037] In the description of the present invention, unless otherwise clearly defined, words such as “setting”, “installation” and “connection” should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above words in the present invention in combination with the specific content of the technical solution.

[0038] This embodiment discloses a test device including a flip-top cable test fixture. Figure 1 and Figure 2 The flip-top cable test fixture includes a base 100, a probe flip cover 200 and a quick-change fixture 300. The base 100 is provided with a fixture positioning groove 101 and a limit lock structure 110, and a first positioning portion 102 is provided in the fixture positioning groove 101. Please refer to Figure 1 , Figure 2 and Figure 3 The probe flip cover 200 has a first end and a second end. The first end of the probe flip cover 200 is connected to the base 100. The second end of the probe flip cover 200 can rotate relative to the base 100 around the first end and is movably connected to the limiting locking structure 110 to cover the fixture positioning groove 101. The limiting locking structure 110 can be designed according to actual application needs. For example, the limiting locking structure 110 can be a snap-fit ​​part. When the probe flip cover 200 covers the fixture positioning groove 101, the snap-fit ​​part can be snap-fitted to the edge snap-fit ​​connection of the probe flip cover 200. For example, the limiting locking structure 110 is a screw-on component (not shown in the figure). When the probe flap 200 covers the fixture positioning slot 101, the screw-on component rotates a certain angle to limit the edge of the probe flap 200. For another example, the limiting locking structure 110 is a locking hole (not shown in the figure) provided on the base 100. The probe flap 200 is provided with a corresponding snap-on component or screw-on component. When the probe flap 200 covers the fixture positioning slot 101, the snap-on component or screw-on component on the probe flap 200 is inserted into the locking hole and cooperates with the locking hole for limiting. It should be conceivable that when the probe flap 200 covers the fixture positioning slot 101, the first end and the second end of the probe flap 200 are respectively located on opposite sides of the fixture positioning slot 101, for example, with the length direction of the fixture positioning slot 101 as the first direction (such as Figure 1 The left and right directions indicated in the figure), with the width direction of the fixture positioning groove 101 as the second direction (such as Figure 1 The first end and the second end of the probe flip cover 200 are respectively located on opposite sides of the second direction of the fixture positioning groove 101. Figure 2 , Figure 4 and Figure 5 The probe flip cover 200 includes a cover plate 210, a floating plate 220, a carrier plate 230 and a probe module 240. The floating plate 220 is floatingly connected to the cover plate 210, the carrier plate 230 is connected to the floating plate 220, the probe module 240 is installed on the carrier plate 230, and a positioning guide column 231 is provided on the carrier plate 230.

[0039] Please refer to Figure 1 and Figure 2 The quick-change fixture 300 can be detachably installed in the fixture positioning slot 101. Please refer to Figure 1 , Figure 6 and Figure 7 The quick-change fixture 300 is provided with a second positioning portion 312 and a positioning guide hole 321. The second positioning portion 312 cooperates with the first positioning portion 102 to form a positioning structure. For example, the first positioning portion 102 and the second positioning portion 312 are mutually adapted protrusions and recesses. For example, the first positioning portion 102 is a protrusion disposed on the base 100, and the second positioning portion 312 is a recess disposed at the bottom of the quick-change fixture 300; for another example, the first positioning portion 102 is a recess disposed on the base 100, and the second positioning portion 312 is a protrusion disposed at the bottom of the quick-change fixture 300. Please refer to Figure 2 The positioning guide hole 321 cooperates with the positioning guide column 231 to form a positioning guide structure.

[0040] Before testing the target product, pre-load the target product into the quick-change fixture 300. Please refer to Fig.10 The target product is a cable with a 180° bending structure. The target product is preloaded by the quick-change fixture 300; please refer to Figure 1 and Figure 7 When testing is required, the quick-change fixture 300 preloaded with the target product is installed in the fixture positioning groove 101 of the base 100. During the installation process, the quick-change fixture 300 and the base 100 are positioned by the second positioning portion 312 and the first positioning portion 102 to improve the convenience and accuracy of installation, so that the test point of the target product is located at or close to the expected position. Next, the probe flip cover 200 is covered on the fixture positioning groove 101. During the covering process, the positioning guide hole 321 guides the positioning guide column 231 to drive the floating plate 220 to fine-tune the position through the positioning guide column 231, so that the position of the probe module 240 can be well adapted to the position of the quick-change fixture 300, so that the probe module 240 and the test point of the target product are accurately aligned. The limit lock structure 110 on the base 100 cooperates with the probe flip cover 200 to fix it, preventing the probe flip cover 200 from displacement during the test and maintaining good contact between the probe and the test point, which is conducive to improving the reliability of the test.

[0041] Therefore, through the floating connection between the floating plate 220 and the cover plate 210, the position of the probe module 240 can be adjusted, and positioning guidance is performed through the positioning guide hole 321 and the positioning guide column 231, so that the position of the probe module 240 is adapted to the quick-change fixture 300, thereby improving the alignment accuracy of the probe and the test point.

[0042] Please refer to Figure 5 and Fig.11 , the cover plate 210 is provided with a plurality of limiting posts 2121, the floating plate 220 is provided with a plurality of limiting holes 221, the floating plate 220 is sleeved on the plurality of limiting posts 2121 of the cover plate 210 through the plurality of limiting holes 221, and a fine-tuning gap is provided between the inner wall of the limiting hole 221 and the limiting post 2121. Exemplarily, the floating plate 220 is a rectangular parallelepiped structure, and the limiting holes 221 are provided at the four corners of the floating plate 220. Accordingly, four limiting posts 2121 are provided on the cover plate 210, wherein the limiting posts 2121 are fasteners such as screws or bolts, and the aperture of the limiting hole 221 is slightly larger than the diameter of the limiting post 2121, so that a fine-tuning gap is provided between the inner wall of the limiting hole 221 and the limiting post 2121, so that the floating plate 220 can move relative to the cover plate 210 in different directions.

[0043] Please refer to Figure 4 and Figure 5 , a limit frame 2111 is set on the cover plate 210 and located on the opposite sides of the floating plate 220, and limit rollers 222 are installed on the opposite sides of the floating plate 220, and the limit rollers 222 are located in the limit frame 2111, and a first elastic member is connected between the cover plate 210 and the floating plate 220, and the first elastic member is a spring. The first elastic member can apply an elastic force to the floating plate 220, so that the floating plate 220 has a tendency to move away from the cover plate 210, and the cooperation of the limit roller 222 and the limit frame 2111 can keep a certain distance between the floating plate 220 and the cover plate 210, and can avoid the end of the limit column 2121 directly limiting the floating plate 220, and the friction between the limit roller 222 and the limit frame 2111 is rolling friction, and the friction force is small, which is conducive to reducing the friction force on the floating plate 220, so that the floating plate 220 and the cover plate 210 can move relative to each other more easily, so that the probe module 240 can perform fine position adjustment.

[0044] Please continue to refer to Figure 4 and Figure 5 The cover plate 210 includes a first carrier frame 211 and a second carrier frame 212 which are nested with each other. One side edge of the first carrier frame 211 is used as or provided with a foolproof mating portion (such as Figure 2 As shown by the mark P1 in the figure, there is a distance difference between the bottom surface of the first supporting frame 211 and the bottom surface of the second supporting frame 212 (such as Figure 4 The bottom surface of the first carrier frame 211 and the bottom surface of the second carrier frame 212 are both oriented toward the quick-change fixture 300 in the rotation direction of the cover plate 210. For example, the cover plate 210 can be rotated counterclockwise to cover the fixture positioning groove 101. Figure 4From the top (as indicated by the arc-shaped double-directional arrow in the middle), the bottom surface of the first carrier frame 211 and the bottom surface of the second carrier frame 212 face the quick-change fixture 300. The first carrier frame 211 and the second carrier frame 212 are both rectangular parallelepiped structures, the middle of the first carrier frame 211 is hollowed out to leave a frame, and the second carrier frame 212 is sleeved in the middle of the first carrier frame 211. During the rotation process, one side edge of the first carrier frame 211 is used as or provided with an anti-fool fitting portion.

[0045] Please refer to Figure 1 The fixture positioning groove 101 of the base 100 is provided with a first avoidance position 103, and the inner wall of the first avoidance position 103 is provided with a clamping flange 104, please refer to Figures 6 to 9 The quick-change fixture 300 includes a base plate 310, a shaping plate 320, a pressing member 330 and an anti-foolproof slider 340. The base plate 310 is provided with a guide hole 311 and a second positioning portion 312. The shaping plate 320 is installed on the base plate 310. At least one of the base plate 310 and the shaping plate 320 is provided with a positioning guide hole 321. For example, the base plate 310 is provided with a positioning guide hole 321, or for example, the shaping plate 320 is provided with a positioning guide hole 321, or for example, the base plate 310 and the shaping plate 320 are both provided with a positioning guide hole 321. The positioning guide hole 321 cooperates with the positioning guide column 231 to form a positioning guide structure. The shaping plate 320 is used to shape the target product, wherein the pressing member 330 is movably installed on the base plate 310 and can cooperate with the first side of the shaping plate 320 to form a first product limiting structure. Please refer to Figure 1 , Figure 8 and Fig. 9 The anti-fool slide block 340 is slidably installed in the guide hole 311 and partially penetrates the first avoidance position 103. The anti-fool slide block 340 has a first working position and a second working position. In the first working position, the anti-fool slide block 340 and the anti-fool matching part form an anti-fool structure; in the second working position, the anti-fool slide block 340 avoids the anti-fool matching part and is clamped on the clamping flange 104 and cooperates with the second side of the shaping plate 320 to form a second product limiting structure. When the target product needs to be loaded into the quick-change fixture 300, the first product gap (such as Figure 6 or Fig. 9 As shown in the figure marked P2), it is suitable for placing the first part of the target product (such as Fig.10 As shown by the mark L1 in the figure, the shaping plate 320 is suitable for placing the second part of the target product (such as Fig.10 In the placement process, the first part of the target product is inserted into the first product gap from front to back, and the second part of the target product is bent and placed after passing the shaping plate 320 from the side of the shaping plate 320 (as shown in the mark L2 in the figure). Fig.10 Insert the part marked L3 into Figure 6 or Fig. 9The target product is positioned at the position indicated by the mark P3 in the figure, that is, the shaping plate 320 is located between the first part and the second part of the target product, so as to support and shape the target product. In order to prevent the target product from rebounding or loosening, the pressing member 330 cooperates with the first side of the shaping plate 320 to form a first product limiting structure, which can limit and fix the target product.

[0046] Please refer to Figure 4 There is a distance difference between the bottom surface of the first supporting frame 211 and the bottom surface of the second supporting frame 212 (eg Figure 4 As shown by mark D in the figure, that is, the bottom surface of the first supporting frame 211 and the bottom surface of the second supporting frame 212 are not flush, and when the anti-foolproofing slider 340 is in the first working position, the anti-foolproofing slider 340 can interfere with the edge of the first supporting frame 211, thereby playing an anti-foolproofing role; when the anti-foolproofing slider 340 is switched to the second working position, the anti-foolproofing slider 340 is staggered with the edge of the first supporting frame 211, and the position of the anti-foolproofing slider 340 is adapted to the second supporting frame 212. Since there is a distance difference between the bottom surface of the first supporting frame 211 and the bottom surface of the second supporting frame 212, the anti-foolproofing slider 340 will not abut against the bottom surface of the second supporting frame 212, that is, the second supporting frame 212 will not interfere with the anti-foolproofing slider 340, and the probe flip cover 200 can be smoothly closed. Among them, one side edge of the first carrier frame 211 can be used as a foolproof mating part, that is, the foolproof slider 340 can interfere with the edge of the first carrier frame 211 in the first working position; or, one side edge of the first carrier frame 211 is provided with a foolproof mating part, for example, the edge of the first carrier frame 211 is provided with a foolproof protrusion (not shown) used as a foolproof mating part, and the foolproof slider 340 can interfere with the foolproof protrusion. The limit column 2121 is installed on the second carrier frame 212, and the limit frame 2111 is installed on the first carrier frame 211.

[0047] Please refer to Figures 6 to 9 The fool-proof slider 340 is provided with a fool-proof convex portion 341, a first crimping portion 342 and a clamping portion 343. The fool-proof convex portion 341 and the first crimping portion 342 are both located on the upper side of the bottom plate 310, and the clamping portion 343 is located on the lower side of the bottom plate 310. In the first working position, the fool-proof convex portion 341 and the fool-proof matching portion form a fool-proof structure. In the second working position, the clamping portion 343 and the bottom plate 310 are respectively located on the opposite sides of the clamping flange 104 (such as Figure 1The upper and lower sides shown in the figure are clamped to the clamping flange 104, and the first crimping portion 342 cooperates with the second side of the shaping plate 320 to form a second product limiting structure. The structure of the foolproof slider 340 is simple, but it can not only realize the foolproof function to prevent the probe module 240 from being damaged due to misoperation, but also realize the clamping and fixing between the quick-change fixture 300 and the base 100 to prevent the quick-change fixture 300 from being displaced due to misoperation and causing damage to the probe module 240 or poor contact, and can also cooperate with the shaping plate 320 to clamp and fix the target product so that the target product can be shaped.

[0048] Please refer to Figure 2 and Figure 3 A second avoidance position 106 is provided on the base 100 and adjacent to the fixture positioning groove 101. An interface assembly 130 is installed in the second avoidance position 106. The interface assembly 130 can move toward or away from the fixture positioning groove 101. The interface assembly 130 is adapted to the signal interface on the target product. After the quick-change fixture 300 is installed in the fixture positioning groove 101, the probe flap 200 is closed, and the interface assembly 130 moves toward the direction close to the fixture positioning groove 101, so as to dock with the signal interface on the target product. The second avoidance position 106 is used to provide space for the installation and movement of the interface assembly 130.

[0049] Please continue to refer to Figure 2 and Figure 3 , a locking recess 2112 is provided on the edge of the first bearing frame 211, and a limited locking member 135 is provided on the interface assembly 130, and the limited locking member 135 can move with the interface assembly 130 and be clamped in the locking recess 2112. Exemplarily, the locking recess 2112 is an arc-shaped notch recess, and the limited locking member 135 is a columnar structure with a flange at the end. When the interface assembly 130 moves in the opposite direction toward the fixture positioning groove 101, the limited locking member 135 moves with the interface assembly 130 and is clamped in the locking recess 2112, thereby preventing the first bearing frame 211 from opening during the test. It should be noted that the cooperation between the limited locking member 135 and the locking recess 2112 can prevent the operator from triggering the limited locking structure 110 on the base 100 due to misoperation during the test, thereby preventing the first bearing frame 211 from opening, which is conducive to improving the reliability of the test.

[0050] For example, please refer to Figure 2The interface assembly 130 includes an interface module 131, a connector 132, a driver 133 and a slide rail module 134. The interface module 131 is mounted on the connector 132. The slide rail module 134 is mounted on the base 100 and is located on one side of the second avoidance position 106. The connector 132 is connected to the driver 133 and the slide rail module 134 respectively. The driver 133 adopts a cylinder or a motor. The slide rail module 134 includes a slide rail and a slider mounted on the slide rail. The slide rail is mounted on the base 100. The driver 133 is used to drive the connector 132 to move under the guidance of the slide rail module 134, so that the interface module 131 can be docked with a signal interface on the target product. The interface module 131 includes a circuit board and an interface device connected to the circuit board. The limit locking member 135 is mounted on the connector 132.

[0051] Please refer to Figure 2 and Figure 4 A push rod 2122 is provided on the second bearing frame 212. The position of the push rod 2122 is adapted to the signal interface of the target product. The push rod 2122 is used to abut and fix the signal interface of the target product. After the probe flip cover 200 is closed, the push rod 2122 can abut the signal interface of the target product from above, thereby fixing the signal interface of the target product, ensuring that the interface assembly 130 can smoothly dock with the signal interface of the target product, and ensuring that the signal interface of the target product will not be displaced during the docking process, which is conducive to improving the reliability of docking.

[0052] Please refer to Figure 4 , a sheath 232 is movably mounted on the carrier plate 230, and a third elastic member is connected between the carrier plate 230 and the sheath 232, and the sheath 232 is sleeved on the probe module 240. Before the probe flip cover 200 is not connected to the limit lock structure 110, the sheath 232 is sleeved on the outside of the probe module 240 to protect the probe module 240. When the probe flip cover 200 is in a fully covered state and connected to the limit lock structure 110, the end of the sheath 232 abuts against the target product. Under the reaction force of the target product, the sheath 232 moves in the opposite direction and compresses the third elastic member to expose the probe module 240, so that the probe module 240 can contact the test point of the target product. In this way, the probe module 240 can be protected by the sheath 232, reducing the probability of the probe module 240 being damaged due to misoperation. Among them, the third elastic member is a spring.

[0053] Please continue to refer to Figure 4, the first end of the first carrier frame 211 and the first end of the second carrier frame 212 are connected to the same rotating shaft 2113, a reset torsion spring 2114 is installed on the rotating shaft 2113, and the second end of the second carrier frame 212 abuts against the second end of the first carrier frame 211. The reset torsion spring 2114 is used to provide a reset elastic force for the second carrier frame 212. When the locking restriction between the limit lock structure 110 and the probe flip cover 200 is released, the second carrier frame 212 rotates in the opposite direction under the action of the reset torsion spring 2114. Since the second end of the second carrier frame 212 abuts against the second end of the first carrier frame 211, the second carrier frame 212 can drive the first carrier frame 211 to rotate synchronously, thereby realizing the automatic opening of the probe flip cover 200. Among them, the rotating shaft 2113 is directly or indirectly installed on the base 100, so that the first carrier frame 211 and the second carrier frame 212 can rotate relative to the base 100.

[0054] The embodiments of the present invention are described in detail above in conjunction with the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the relevant technical field without departing from the purpose of the present invention.

Claims

1. A flip-top cable test fixture, characterized in that: include: The base (100) is provided with a clamp positioning groove (101) and a position limiting lock structure (110), wherein a first positioning portion (102) and a first avoidance position (103) are provided in the clamp positioning groove (101); A probe flip cover (200) having a first end and a second end, wherein the first end of the probe flip cover (200) is connected to the base (100), and the second end of the probe flip cover (200) can rotate relative to the base (100) around the first end and is movably connected to the limit lock structure (110) to cover the fixture positioning groove (101). The probe flip cover (200) comprises a cover plate (210), a floating plate (220), a bearing plate (230) and a probe module (240), wherein the floating plate (220) is floatingly connected to the cover plate (210), the bearing plate (230) is connected to the floating plate (220), and the probe module (240) is mounted on the bearing plate (230), and a positioning guide column (231) is provided on the bearing plate (230); A quick-change fixture (300) is detachably mounted in the fixture positioning groove (101), the quick-change fixture (300) comprising a base plate (310), a shaping plate (320), a pressing member (330) and an anti-foolproof slider (340), the base plate (310) being provided with a guide hole (311) and a second positioning portion (312), the second positioning portion (312) and the first positioning portion (102) cooperating to form a positioning structure, the shaping plate (320) being mounted on the base plate (310), the At least one of the bottom plate (310) and the shaping plate (320) is provided with a positioning guide hole (321), and the positioning guide hole (321) cooperates with the positioning guide column (231) to form a positioning guide structure. The pressing member (330) is movably mounted on the bottom plate (310) and can cooperate with the first side of the shaping plate (320) to form a first product limiting structure. The anti-foolproof slider (340) is slidably mounted on the guide hole (311) and partially penetrates to the first avoidance position (103).

2. The flip-top cable test fixture according to claim 1, characterized in that: The cover plate (210) is provided with a plurality of limiting columns (2121), the floating plate (220) is provided with a plurality of limiting holes (221), the floating plate (220) is sleeved on the plurality of limiting columns (2121) of the cover plate (210) through the plurality of limiting holes (221), and a fine-tuning gap is provided between the inner wall of the limiting hole (221) and the limiting column (2121).

3. The flip-top cable test fixture according to claim 2, characterized in that: A limit frame (2111) is provided on the cover plate (210) and located on two opposite sides of the floating plate (220); limit rollers (222) are installed on two opposite sides of the floating plate (220); the limit rollers (222) are located in the limit frame (2111); and a first elastic member is connected between the cover plate (210) and the floating plate (220).

4. The flip-top cable test fixture according to claim 1, 2 or 3, characterized in that: The cover plate (210) comprises a first supporting frame (211) and a second supporting frame (212) which are nested with each other, a side edge of the first supporting frame (211) is used as or provided with an anti-foolproof mating portion, a distance difference is provided between the bottom surface of the first supporting frame (211) and the bottom surface of the second supporting frame (212) to form an anti-foolproof avoidance position, and the bottom surface of the first supporting frame (211) and the bottom surface of the second supporting frame (212) are both facing the quick-change clamp (300) in the rotation direction of the cover plate (210).

5. The flip-top cable test fixture according to claim 4, characterized in that: A second avoidance position (106) is provided on the base (100) and is located adjacent to the clamp positioning groove (101), and an interface component (130) is installed in the second avoidance position (106). The interface component (130) can move in a direction approaching or away from the clamp positioning groove (101).

6. The flip-top cable test fixture according to claim 5, characterized in that: A locking recess (2112) is provided on the edge of the first supporting frame (211), and a limit locking member (135) is provided on the interface assembly (130); the limit locking member (135) is capable of moving with the interface assembly (130) and being locked in the locking recess (2112).

7. The flip-top cable test fixture according to claim 5 or 6, characterized in that: The second carrying frame (212) is provided with a pressing rod (2122), and the position of the pressing rod (2122) is adapted to the signal interface of the target product.

8. The flip-top cable test fixture according to any one of claims 1 to 3, 5 or 6, characterized in that: A protective sleeve (232) is movably mounted on the carrier plate (230), and a third elastic member is connected between the carrier plate (230) and the protective sleeve (232), and the protective sleeve (232) is sleeved on the probe module (240).

9. The flip-top cable test fixture according to claim 4, characterized in that: The first end of the first supporting frame (211) and the first end of the second supporting frame (212) are connected to the same rotating shaft (2113), a return torsion spring (2114) is installed on the rotating shaft (2113), and the second end of the second supporting frame (212) is in abutment with the second end of the first supporting frame (211).

10. A testing device, characterized in that: It comprises the flip-top cable testing fixture as described in any one of claims 1 to 9.

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