Device for testing long-term stability of average wavelength of high-precision light source

Abstract

The invention relates to a high-precision light source average wavelength long-term stability testing device, belongs to the field of light average wavelength testing, and solves the problems of low testing efficiency and testing precision of light source average wavelength long-term stability in the prior art. The device comprises an absolute wavelength reference module which is used for outputting a plurality of narrow-band absolute reference wavelength optical signals in a spectrum matching range of a light source to be measured; the multi-channel matrix optical switch is used for performing channel switching according to a received channel switching instruction of the light source to be measured or the absolute wavelength so as to connect the corresponding reference module of the light source to be measured or the absolute wavelength with the spectrograph; the spectrograph is used for respectively detecting spectral data of the light source to be detected and the absolute wavelength reference module according to the received data acquisition instruction; the information processing device is further used for obtaining a time curve of the average wavelength of the to-be-measured light source according to the received spectral data of the to-be-measured light source and the absolute wavelength reference module, and then evaluating the long-term stability of the average wavelength of the to-be-measured light source.

Description

Technical Field

[0001] The invention relates to the technical field of light average wavelength testing, and in particular to a testing device for the long-term stability of the average wavelength of a high-precision light source. Background Art

[0002] The long-term stability of the average wavelength of a high-precision light source is one of the most important parameters of fiber optic sensing and closed-loop fiber optic gyroscopes, especially the main factor affecting the long-term stability of the scale factor of a closed-loop fiber optic gyroscope.

[0003] The traditional test method is to directly connect the light source to the spectrometer, which can only achieve single-channel serial measurement and has low long-term monitoring efficiency. Furthermore, by switching on and off, a single spectrometer collects spectra of multiple light sources and calculates the average wavelength. This method introduces the influence of long-term creep of optical switches and spectrometers, resulting in low test accuracy and inability to reflect the long-term changes in the average wavelength of the light source with high accuracy. Summary of the invention

[0004] In view of the above analysis, an embodiment of the present invention aims to provide a high-precision light source average wavelength long-term stability testing device to solve the problems of low testing efficiency and low testing accuracy of the existing light source average wavelength long-term stability testing.

[0005] The embodiment of the present invention provides a high-precision light source average wavelength long-term stability test device, including an absolute wavelength reference module, a multi-channel matrix optical switch, a spectrometer and an information processing device;

[0006] The information processing device is used to configure the channel switching instructions, data acquisition instructions and absolute wavelength channel replacement instructions of each light source to be measured;

[0007] The absolute wavelength reference module is used to output a plurality of narrow-band absolute reference wavelength optical signals within the spectrum matching range of the light source to be measured;

[0008] The multi-channel matrix optical switch is used to switch channels according to the received channel switching instruction of the light source to be measured, so as to connect the corresponding light source to be measured with the spectrometer; and is also used to switch channels according to the received channel change instruction of the absolute wavelength, so as to connect the corresponding absolute wavelength reference module with the spectrometer;

[0009] The spectrometer is used to detect the spectrum data of the light source to be measured and the absolute wavelength reference module respectively according to the received data acquisition instruction;

[0010] The information processing device is also used to obtain a time curve of the average wavelength of the light source to be measured based on the received spectral data of the light source to be measured and the absolute wavelength reference module, and then evaluate the long-term stability of the average wavelength of the light source to be measured.

[0011] Furthermore, there are one or more light sources to be tested, and the tests are performed in a set order; there are one or more absolute wavelength reference modules; wherein the total number of all light sources to be tested and absolute wavelength reference modules is less than or equal to the number of input ports of the multi-channel matrix optical switch.

[0012] Further, each input end of the multi-channel matrix optical switch is respectively connected to the output end of each light source to be measured and the absolute wavelength reference module, and the common output end of the multi-channel matrix optical switch is connected to the detection end of the spectrometer;

[0013] The multi-channel matrix optical switch generates high and low level signals corresponding to each light source to be tested based on the received channel switching instruction of the light source to be tested, and adjusts the control voltage of the corresponding port of each light source to be tested based on the high and low level signals to connect the output end of the current light source to be tested to the detection end of the spectrometer;

[0014] The multi-channel matrix optical switch generates high and low level signals corresponding to each absolute wavelength reference module based on the received channel change instruction of the absolute wavelength, and adjusts the control voltage of the corresponding port of each absolute wavelength reference module based on the high and low level signals to connect the output end of the corresponding absolute wavelength reference module to the detection end of the spectrometer.

[0015] Furthermore, each input end of the multi-channel matrix optical switch is fused with the output end pigtail of the light source to be measured or the absolute wavelength reference module through an LC optical fiber pigtail; the common output end of the multi-channel matrix optical switch is connected to the detection end of the spectrometer through an LC-FC optical fiber jumper.

[0016] Furthermore, the information processing device obtains the time curve of the average wavelength of the light source to be measured by performing the following steps:

[0017] S1. At each set time interval, execute:

[0018] S11, controlling the spectrometer to perform m light source spectrum scans respectively, obtaining spectrum data of the light source to be measured and spectrum data of each absolute reference wavelength optical signal output by the absolute wavelength reference module, and obtaining an average wavelength value of the light source to be measured for each scan based on the spectrum data of the light source to be measured and the spectrum data of each absolute reference wavelength optical signal;

[0019] S12, taking the average value of the average wavelength values ​​of the light source to be measured scanned m times as the final average wavelength of the time acquisition point;

[0020] S2. Based on the final average wavelength at each time acquisition point, a time curve of the average wavelength of the light source to be measured is obtained.

[0021] Furthermore, the signal processing device obtains the spectrum data of the light source to be measured and the spectrum data of each absolute reference wavelength optical signal output by the absolute wavelength reference module in the following manner:

[0022] The input end and the common output end of the multi-channel matrix optical switch connected to the light source to be tested are selected through the channel switching instruction of the light source to be tested, and then the spectrometer is controlled through the wavelength scanning mode to collect the spectrum data of the light source to be tested through the data acquisition instruction;

[0023] The input end and the common output end of the multi-channel matrix optical switch connected to the absolute wavelength reference module are selected through the absolute wavelength channel switching instruction, and then the spectrometer is controlled through the data acquisition instruction to collect the spectral data of each absolute reference wavelength optical signal output by the absolute wavelength reference module through the wavelength scanning mode.

[0024] Furthermore, the average wavelength value of the light source to be measured in each scan is obtained by executing the following steps:

[0025] S111, taking the wavelength value of each reference wavelength in the spectrum data of the absolute wavelength reference module as the measured wavelength value of each reference wavelength, and then taking the difference between the measured wavelength value of each reference wavelength and the corresponding theoretical wavelength value as the drift amount of each reference wavelength;

[0026] S112, taking the drift of each reference wavelength as the wavelength drift at the corresponding theoretical wavelength in the spectrometer, and then performing interpolation fitting calculation based on the set spectrum sampling interval as the standard to obtain the wavelength drift of each wavelength sampling point;

[0027] S113, based on the spectrum data and the set spectrum sampling interval, the wavelength of the light source to be measured at each wavelength sampling point is obtained, and then based on the wavelength drift of each wavelength sampling point, the average wavelength value of the scan is obtained.

[0028] Furthermore, the average wavelength value of each scan is expressed as:

[0029]

[0030] in, is the average value of the jth light source spectrum scan, N is the total number of sampling points of a single light source spectrum scan, and λ i is the wavelength of the light source 9 to be measured at the i-th wavelength sampling point, P i is the sampling power corresponding to the i-th sampling point, Δλ i is the wavelength drift of the i-th wavelength sampling point.

[0031] Furthermore, the signal processing device evaluates the long-term stability of the average wavelength of the light source to be measured in the following manner:

[0032] Based on the time curve of the average wavelength of the light source to be measured, the time curve of the average wavelength drift of the light source to be measured is obtained, and then the standard deviation of the average wavelength drift of the light source to be measured is obtained;

[0033] The smaller the standard deviation of the average wavelength drift of the light source to be measured is, the better the long-term stability of the average wavelength of the light source to be measured is.

[0034] Furthermore, the average wavelength at each time sampling point on the time curve of the average wavelength of the light source to be measured is converted into the average wavelength drift at the corresponding time sampling point on the time curve of the average wavelength drift of the light source to be measured by the following method:

[0035]

[0036] In the formula, is the average wavelength drift at the kth time sampling point, is the average wavelength of the kth time sampling point, and M is the total number of time sampling points on the time curve of the average wavelength of the light source to be measured.

[0037] Compared with the prior art, the present invention can achieve at least one of the following beneficial effects:

[0038] The present invention provides a high-precision light source average wavelength long-term stability testing device, comprising an information processing device for configuring a channel switching instruction, a data acquisition instruction, and an absolute wavelength channel replacement instruction for each light source to be tested, an absolute wavelength reference module for outputting a plurality of narrow-band absolute reference wavelength optical signals within the spectral matching range of the light source to be tested, a multi-channel matrix optical switch for performing channel switching according to a received channel switching instruction of the light source to be tested or the absolute wavelength to connect the corresponding light source to be tested or the absolute wavelength reference module to the spectrometer, a spectrometer for respectively detecting the spectral data of the light source to be tested and the absolute wavelength reference module according to the received data acquisition instruction, and a plurality of channels for connecting the light source to be tested or the absolute wavelength reference module to the spectrometer through the information processing device. According to the received spectral data of the light source to be tested and the absolute wavelength reference module, the time curve of the average wavelength of the light source to be tested is obtained, and then the long-term stability of the average wavelength of the light source to be tested is evaluated; by utilizing a multi-channel matrix optical switch to realize parallel high-precision average wavelength measurement of multiple light sources to be tested, multi-channel parallel measurement is realized, and the measurement of the long-term change of the average wavelength of the device under a specific temperature environment is realized without plugging and unplugging; the drift error introduced by the test instrument is compensated by the absolute wavelength reference module, and the long-term creep error introduced by other equipment in the system can be removed, thereby obtaining the high-precision long-term change of the average wavelength of the light source, and realizing high-precision monitoring of the long-term stability of the average wavelength of the light source at the ppm level.

[0039] In the present invention, the above-mentioned technical solutions can also be combined with each other to achieve more preferred combination solutions. Other features and advantages of the present invention will be described in the subsequent description, and some advantages can become obvious from the description, or can be understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained through the contents particularly pointed out in the description and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The drawings are only for the purpose of illustrating particular embodiments and are not to be considered limiting of the present invention. Like reference symbols denote like components throughout the drawings.

[0041] Figure 1 A schematic diagram of the structure of a testing device for the long-term stability of the average wavelength of a high-precision light source provided in Example 1 of the present invention;

[0042] Figure 2 A schematic diagram of a time curve of the average wavelength drift of a light source to be measured provided in Example 1 of the present invention;

[0043] Reference numerals:

[0044] 1- DC regulated power supply; 2- high and low temperature test chamber; 3- absolute wavelength reference module; 4- multi-channel matrix optical switch; 5- spectrometer; 6- information processing equipment; 7- LC optical fiber pigtail; 8- LC-FC optical fiber jumper; 9- light source to be tested. DETAILED DESCRIPTION

[0045] The preferred embodiments of the present invention are described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of this application and are used together with the embodiments of the present invention to illustrate the principles of the present invention, but are not used to limit the scope of the present invention.

[0046] A specific embodiment of the present invention discloses a high-precision light source average wavelength long-term stability testing device, such as Figure 1 As shown, it includes an absolute wavelength reference module 3, a multi-channel matrix optical switch 4, a spectrometer 5 and an information processing device 6;

[0047] The information processing device 6 is used to configure the channel switching instructions, data acquisition instructions and absolute wavelength channel change instructions of each light source 9 to be measured;

[0048] The absolute wavelength reference module 3 is used to output a plurality of narrow-band absolute reference wavelength optical signals within the spectrum matching range of the light source 9 to be measured;

[0049] The multi-channel matrix optical switch 4 is used to switch channels according to the channel switching instruction of the light source to be measured 9 received, so as to connect the corresponding light source to be measured 9 with the spectrometer 5; and is also used to switch channels according to the channel change instruction of the absolute wavelength received, so as to connect the corresponding absolute wavelength reference module 3 with the spectrometer 5;

[0050] The spectrometer 5 is used to detect the spectrum data of the light source to be measured 9 and the absolute wavelength reference module 3 respectively according to the received data acquisition instruction;

[0051] The information processing device 6 is also used to obtain a time curve of the average wavelength of the light source 9 to be measured based on the received spectral data of the light source 9 to be measured and the absolute wavelength reference module 3, and then evaluate the long-term stability of the average wavelength of the light source 9 to be measured.

[0052] Specifically, the information processing device 6 is used for human-computer interaction, generates corresponding instructions according to the user's configuration, and controls the multi-channel matrix optical switch 4 and the spectrometer 5 in real time.

[0053] Specifically, the absolute wavelength reference module 3 outputs a specific number of absolute reference wavelength optical signals, and different absolute wavelength reference modules 3 have different configurations. Therefore, the absolute wavelength reference module 3 is adapted and selected according to the spectrum width of the light source 9 to be measured, and the absolute wavelength reference module does not need external settings after selection. Among them, the number of narrow-band absolute reference wavelength optical signals within the spectrum matching range of the light source 9 to be measured output by the absolute wavelength reference module 3 is determined by the absolute wavelength reference module 3 itself. It should be noted that the more the number of absolute reference wavelength optical signals, the more accurate the subsequent measurement.

[0054] Preferably, if the multiple light sources 9 to be measured are all one light source with a certain range of spectral width, an adapted absolute wavelength reference module 3 is selected; if the multiple light sources 9 to be measured are multiple light sources without a certain range of spectral width, an absolute wavelength reference module 3 adapted to each light source is selected.

[0055] Exemplarily, the absolute wavelength reference module 3 can ensure a long-term measurement accuracy of ±1 pm within a temperature range of -10 to 55°C.

[0056] Exemplarily, the spectrum matching range of the light source to be measured is 1550-1565 nm, and the absolute reference wavelength optical signal output by the selected absolute wavelength reference module includes 1552, 1556, and 1558 nm.

[0057] It can be understood that by adding the absolute wavelength reference module 3, the error influence caused by the long-term creep of the multi-channel matrix optical switch 4 and the spectrometer 5 can be removed in the test device with the help of the wavelength calibration method, thereby obtaining the long-term change of the average wavelength of the light source itself, making the test result more accurate.

[0058] Specifically, there are one or more light sources 9 to be tested, which are tested in a set order; there are one or more absolute wavelength reference modules 3; wherein the total number of all light sources 9 to be tested and absolute wavelength reference modules 3 is less than or equal to the number of input ports of the multi-channel matrix optical switch 4.

[0059] Specifically, the detection wavelength range of the spectrometer 5 is 600-1700 nm, the wavelength resolution is 0.02 nm, and it has a single optical signal input terminal.

[0060] During implementation, each input end of the multi-channel matrix optical switch 4 is connected to each light source to be measured 9 and the output end of the absolute wavelength reference module 3, and the common output end of the multi-channel matrix optical switch 4 is connected to the detection end of the spectrometer 5;

[0061] The multi-channel matrix optical switch 4 generates high and low level signals corresponding to each light source 9 to be tested based on the received channel switching instruction of the light source 9 to be tested, and adjusts the control voltage of the corresponding port of each light source 9 to be tested based on the high and low level signals to connect the output end of the current light source 9 to be tested with the detection end of the spectrometer 5;

[0062] The multi-channel matrix optical switch 4 generates high and low level signals corresponding to each absolute wavelength reference module 3 based on the received channel change instruction of the absolute wavelength, and adjusts the control voltage of the corresponding port of each absolute wavelength reference module 3 based on the high and low level signals to connect the output end of the corresponding absolute wavelength reference module 3 to the detection end of the spectrometer 5.

[0063] That is to say, if the control end of the port connecting the multi-channel matrix optical switch 4 and the light source 9 to be tested receives a high-level signal, the control voltage of the control end of the port is adjusted to a high level, so that the output end of the light source 9 to be tested connected to the port is connected to the detection end of the spectrometer 5; if the control end of the port connecting the multi-channel matrix optical switch 4 and the output end of the light source 9 to be tested receives a low-level signal, the control voltage of the control end of the port is adjusted to a low level, so that the output end of the light source 9 to be tested connected to the port is disconnected from the detection end of the spectrometer 5; similarly,

[0064] If the control end of the port connecting the multi-channel matrix optical switch 4 and the absolute wavelength reference module 3 receives a high-level signal, the control voltage of the control end of the port is adjusted to a high level, so that the output end of the absolute wavelength reference module 3 connected to the port is connected to the detection end of the spectrometer 5; if the control end of the port connecting the multi-channel matrix optical switch 4 and the output end of the absolute wavelength reference module 3 receives a low-level signal, the control voltage of the control end of the port is adjusted to a low level, so that the output end of the absolute wavelength reference module 3 connected to the port is disconnected from the detection end of the spectrometer 5.

[0065] It should be noted that the multi-channel matrix optical switch is a prior art technology, and the existing optical switch can be adopted, and no further details are given.

[0066] Specifically, each input end of the multi-channel matrix optical switch 4 is fused with the output end pigtail of the light source to be measured 9 or the absolute wavelength reference module 3 through the LC optical fiber pigtail 7; the common output end of the multi-channel matrix optical switch 4 is connected to the detection end of the spectrometer 5 through the LC-FC optical fiber jumper 8.

[0067] Specifically, the output end pigtail of the light source to be tested 9 and the bare fiber end of the LC fiber pigtail 7 are fused by a fiber fusion splicer in a core-aligned manner, and the output end pigtail of the absolute wavelength reference module 3 and the bare fiber end of another LC fiber pigtail 7 are fused in the same manner; the LC ends of the LC fiber pigtail 7 are respectively connected to the input ends of the multi-channel matrix optical switch 4; wherein, Figure 1 In the figure, “×” indicates welding.

[0068] Specifically, the multi-channel matrix optical switch 4 uses a compact piezoelectric device to achieve a low-loss connection between the input end and the common output end, and through the information processing device 6, the rapid switching between online control channels can be achieved, so that the spectra of multiple light sources 9 to be measured are output to the spectrometer 5 through the same optical fiber port without plugging and unplugging the LC optical fiber pigtail 7 and the LC-FC optical fiber jumper 8.

[0069] More specifically, the multi-channel matrix optical switch 4 operates in a band of 1260-1675 nm, with a connection stability lower than ±0.1 dB and a typical insertion loss of 1.5 dB.

[0070] It can be understood that multi-channel parallel measurement is achieved through the multi-channel matrix optical switch 4, and the measurement and evaluation of the long-term change of the average wavelength of the device is achieved without plugging and unplugging.

[0071] During implementation, the information processing device 6 obtains the time curve of the average wavelength of the light source 9 to be measured by performing the following steps:

[0072] S1. At each set time interval, execute:

[0073] S11, controlling the spectrometer 5 to perform m light source spectrum scans respectively, obtaining the spectrum data of the light source to be measured 9 and the spectrum data of each absolute reference wavelength light signal output by the absolute wavelength reference module 3, and obtaining the average wavelength value of the light source to be measured of each scan based on the spectrum data of the light source to be measured 9 and the spectrum data of each absolute reference wavelength light signal;

[0074] S12, taking the average value of the average wavelength values ​​of the light source 9 to be measured scanned m times as the final average wavelength of the time acquisition point;

[0075] S2. Based on the final average wavelength at each time acquisition point, a time curve of the average wavelength of the light source 9 to be measured is obtained.

[0076] Specifically, the time interval and the number of light source spectrum scans are set according to the user's test requirements for high-precision light sources.

[0077] Exemplarily, the time interval is set to 1 day, and the number of light source spectrum scans is 10 times.

[0078] In specific implementation, the signal processing device obtains the spectrum data of the light source to be measured 9 and the spectrum data of each absolute reference wavelength optical signal output by the absolute wavelength reference module 3 in the following manner:

[0079] The input end and the common output end of the multi-channel matrix optical switch 4 connected to the light source 9 to be tested are selected by the channel switching instruction of the light source 9 to be tested, and then the spectrometer 5 is controlled by the data acquisition instruction to collect the spectrum data of the light source 9 to be tested in the wavelength scanning mode;

[0080] The input end and the common output end of the multi-channel matrix optical switch 4 connected to the absolute wavelength reference module 3 are selected through the absolute wavelength channel switching instruction, and then the spectrometer 5 is controlled through the data acquisition instruction to collect the spectral data of each absolute reference wavelength optical signal output by the absolute wavelength reference module 3 through the wavelength scanning mode.

[0081] In specific implementation, the average wavelength value of the light source to be measured in each scan is obtained by executing the following steps:

[0082] S111, taking the wavelength value of each reference wavelength in the spectrum data of the absolute wavelength reference module 3 as the measured wavelength value of each reference wavelength, and then taking the difference between the measured wavelength value of each reference wavelength and the corresponding theoretical wavelength value as the drift amount of each reference wavelength;

[0083] S112, taking the drift amount of each reference wavelength as the wavelength drift amount at the corresponding theoretical wavelength in the spectrometer 5, and then performing interpolation fitting calculation based on the set spectrum sampling interval as the standard to obtain the wavelength drift amount of each wavelength sampling point;

[0084] S113, based on the spectrum data and the set spectrum sampling interval, the wavelength of the light source 9 to be measured at each wavelength sampling point is obtained, and then based on the wavelength drift of each wavelength sampling point, the average wavelength value of the scan is obtained.

[0085] Exemplarily, the number of reference wavelengths output by the absolute wavelength reference module 3 is ten.

[0086] Specifically, in step S112, the wavelength drift of each spectrum sampling point is obtained by fitting and calculating using the cubic spline interpolation method.

[0087] It can be understood that according to the wavelength drift at each theoretical wavelength, a coordinate graph can be obtained with the wavelength sampling point as the data horizontal coordinate and the wavelength drift as the vertical coordinate. The difference between adjacent numbers of the data horizontal coordinates is the spectral sampling interval. Therefore, the wavelength drift at each theoretical wavelength is fitted and calculated by the cubic spline interpolation method to obtain the wavelength drift of each wavelength sampling point.

[0088] Specifically, the average wavelength value of each scan is expressed as:

[0089]

[0090] in, is the average value of the jth light source spectrum scan, N is the total number of sampling points of a single light source spectrum scan, and λ i is the wavelength of the light source 9 to be measured at the i-th wavelength sampling point, P i is the sampling power corresponding to the i-th sampling point, Δλ i is the wavelength drift of the i-th wavelength sampling point.

[0091] Specifically, the sampling power is the ordinate of the spectrum of the light source 9 to be measured.

[0092] During implementation, the signal processing device evaluates the long-term stability of the average wavelength of the light source 9 to be measured in the following manner:

[0093] Based on the time curve of the average wavelength of the light source 9 to be measured, the time curve of the average wavelength drift of the light source 9 to be measured is obtained, and then the standard deviation of the average wavelength drift of the light source 9 to be measured is obtained;

[0094] The smaller the standard deviation of the average wavelength drift of the light source 9 to be measured is, the better the long-term stability of the average wavelength of the light source 9 to be measured is.

[0095] Specifically, the medium- to long-term period of the average wavelength long-term stability is determined according to specific needs. Exemplarily, the time is greater than 1 month and less than 1 year.

[0096] When implementing it, Figure 2 As shown, the average wavelength at each time sampling point on the time curve of the average wavelength of the light source 9 to be measured is converted into the average wavelength drift at the corresponding time sampling point on the time curve of the average wavelength drift of the light source 9 to be measured by the following method:

[0097]

[0098] In the formula, is the average wavelength drift at the kth time sampling point, is the average wavelength of the kth time sampling point, and M is the total number of time sampling points on the time curve of the average wavelength of the light source 9 to be measured.

[0099] Preferably, the testing device further comprises a high and low temperature test chamber 2 for providing a uniform temperature field within a set range to the absolute wavelength reference module 3 and the light source to be tested 9.

[0100] Specifically, the high and low temperature test chamber 2 is a vibration isolation platform that provides a uniform temperature field within the range of -70 to +180°C; the absolute wavelength reference module 3 and the light source to be tested 9 are stably and fixedly placed in the high and low temperature test chamber 2, and the power cord and pigtail fusion jumper of the light source to be tested 9 and the absolute wavelength reference module 3 are all led out through the side lead-in port of the high and low temperature test chamber 2; temperature adjustment is achieved through a temperature control system, and the parameters are set to the required temperature for the test during adjustment.

[0101] It can be understood that the high and low temperature test chamber 2 provides an average wavelength measurement environment for the light source 9 to be tested under a constant temperature condition, while avoiding the absolute wavelength reference module 3 from being affected by the ambient temperature. The high and low temperature test chamber 2 can be used to measure and evaluate the long-term changes in the average wavelength of the device under a specific temperature environment.

[0102] During implementation, the test device further includes a DC stabilized power supply 1 for outputting a stable +5V voltage with a voltage stability of ≤0.01%+2mV, and providing voltage for the light source 9 to be tested and the absolute wavelength reference module 3 .

[0103] Specifically, the positive and negative electrodes of the power supply end of the DC regulated power supply 1 are connected to the positive and negative electrodes of the power supply line of the light source to be measured 9 and the absolute wavelength reference module 3 respectively.

[0104] More specifically, each first output voltage of the DC regulated power supply 1 is adjusted to a voltage matching the light source 9 to be tested, the positive terminal is connected to the positive lead of the mainboard of the light source 9 to be tested, and the negative terminal is connected to the negative lead of the mainboard of the light source 9 to be tested; each second output voltage of the DC regulated power supply 1 is adjusted to a voltage matching the absolute wavelength reference module 3, the positive terminal is connected to the positive lead of the absolute wavelength reference module 3, and the negative terminal is connected to the negative lead of the absolute wavelength reference module 3.

[0105] Compared with the prior art, the present embodiment provides a high-precision light source average wavelength long-term stability testing device, including an information processing device for configuring a channel switching instruction, a data acquisition instruction, and an absolute wavelength channel replacement instruction for each light source to be tested, an absolute wavelength reference module for outputting a plurality of narrow-band absolute reference wavelength optical signals within the spectral matching range of the light source to be tested, a multi-channel matrix optical switch for performing channel switching according to the received channel switching instruction of the light source to be tested or the absolute wavelength to connect the corresponding light source to be tested or the absolute wavelength reference module to the spectrometer, a spectrometer for respectively detecting the spectral data of the light source to be tested and the absolute wavelength reference module according to the received data acquisition instruction, and a The processing equipment obtains the time curve of the average wavelength of the light source to be tested based on the received spectral data of the light source to be tested and the absolute wavelength reference module, and then evaluates the long-term stability of the average wavelength of the light source to be tested; by utilizing a multi-channel matrix optical switch to realize parallel high-precision average wavelength measurement of multiple light sources to be tested, multi-channel parallel measurement is realized, and the measurement of the long-term change of the average wavelength of the device under a specific temperature environment is realized without plugging and unplugging; the drift error introduced by the test instrument is compensated by the absolute wavelength reference module, and the long-term creep error introduced by other equipment in the system can be removed, thereby obtaining the high-precision long-term change of the average wavelength of the light source, and realizing high-precision monitoring of the long-term stability of the average wavelength of the light source at the ppm level.

[0106] Those skilled in the art will appreciate that all or part of the processes of the above-mentioned embodiments can be implemented by instructing related hardware through a computer program, and the program can be stored in a computer-readable storage medium, wherein the computer-readable storage medium is a disk, an optical disk, a read-only storage memory, or a random access memory, etc.

[0107] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by any technician familiar with the technical field within the technical scope disclosed by the present invention should be covered within the protection scope of the present invention.

Claims

1. A high-precision light source average wavelength long-term stability test device, characterized in that: Includes absolute wavelength reference module, multi-channel matrix optical switch, spectrometer and information processing equipment; The information processing device is used to configure the channel switching instructions, data acquisition instructions and absolute wavelength channel replacement instructions of each light source to be measured; The absolute wavelength reference module is used to output a plurality of narrow-band absolute reference wavelength optical signals within the spectrum matching range of the light source to be measured; The multi-channel matrix optical switch is used to switch channels according to the received channel switching instruction of the light source to be measured, so as to connect the corresponding light source to be measured with the spectrometer; and is also used to switch channels according to the received channel change instruction of the absolute wavelength, so as to connect the corresponding absolute wavelength reference module with the spectrometer; The spectrometer is used to detect the spectrum data of the light source to be measured and the absolute wavelength reference module respectively according to the received data acquisition instruction; The information processing device is also used to obtain a time curve of the average wavelength of the light source to be measured based on the received spectral data of the light source to be measured and the absolute wavelength reference module, and then evaluate the long-term stability of the average wavelength of the light source to be measured.

2. A high-precision light source average wavelength long-term stability testing device according to claim 1, characterized in that: There are one or more light sources to be tested, and the tests are performed in a set order; there are one or more absolute wavelength reference modules; wherein the total number of all light sources to be tested and absolute wavelength reference modules is less than or equal to the number of input ports of the multi-channel matrix optical switch.

3. A high-precision light source average wavelength long-term stability testing device according to claim 1, characterized in that: Each input end of the multi-channel matrix optical switch is connected to the output end of each light source to be measured and the absolute wavelength reference module respectively, and the common output end of the multi-channel matrix optical switch is connected to the detection end of the spectrometer; The multi-channel matrix optical switch generates high and low level signals corresponding to each light source to be tested based on the received channel switching instruction of the light source to be tested, and adjusts the control voltage of the corresponding port of each light source to be tested based on the high and low level signals to connect the output end of the current light source to be tested to the detection end of the spectrometer; The multi-channel matrix optical switch generates high and low level signals corresponding to each absolute wavelength reference module based on the received channel change instruction of the absolute wavelength, and adjusts the control voltage of the corresponding port of each absolute wavelength reference module based on the high and low level signals to connect the output end of the corresponding absolute wavelength reference module to the detection end of the spectrometer.

4. A high-precision light source average wavelength long-term stability testing device according to claim 3, characterized in that: Each input end of the multi-channel matrix optical switch is fused with the output end pigtail of the light source to be measured or the absolute wavelength reference module through the LC optical fiber pigtail; the common output end of the multi-channel matrix optical switch is connected to the detection end of the spectrometer through the LC-FC optical fiber jumper.

5. The high-precision light source average wavelength long-term stability testing device according to claim 1, characterized in that: The information processing device obtains the time curve of the average wavelength of the light source to be measured by performing the following steps: S1. At each set time interval, execute: S11, controlling the spectrometer to perform m light source spectrum scans respectively, obtaining spectrum data of the light source to be measured and spectrum data of each absolute reference wavelength optical signal output by the absolute wavelength reference module, and obtaining an average wavelength value of the light source to be measured for each scan based on the spectrum data of the light source to be measured and the spectrum data of each absolute reference wavelength optical signal; S12, taking the average value of the average wavelength values ​​of the light source to be measured scanned m times as the final average wavelength of the time acquisition point; S2. Based on the final average wavelength at each time acquisition point, a time curve of the average wavelength of the light source to be measured is obtained.

6. A high-precision light source average wavelength long-term stability testing device according to claim 5, characterized in that: The signal processing device obtains the spectrum data of the light source to be measured and the spectrum data of each absolute reference wavelength optical signal output by the absolute wavelength reference module in the following manner: The input end and the common output end of the multi-channel matrix optical switch connected to the light source to be tested are selected through the channel switching instruction of the light source to be tested, and then the spectrometer is controlled through the wavelength scanning mode to collect the spectrum data of the light source to be tested through the data acquisition instruction; The input end and the common output end of the multi-channel matrix optical switch connected to the absolute wavelength reference module are selected through the absolute wavelength channel switching instruction, and then the spectrometer is controlled through the data acquisition instruction to collect the spectral data of each absolute reference wavelength optical signal output by the absolute wavelength reference module through the wavelength scanning mode.

7. A high-precision light source average wavelength long-term stability testing device according to claim 6, characterized in that: The average wavelength of the light source to be measured in each scan is obtained by performing the following steps: S111, taking the wavelength value of each reference wavelength in the spectrum data of the absolute wavelength reference module as the measured wavelength value of each reference wavelength, and then taking the difference between the measured wavelength value of each reference wavelength and the corresponding theoretical wavelength value as the drift amount of each reference wavelength; S112, taking the drift of each reference wavelength as the wavelength drift at the corresponding theoretical wavelength in the spectrometer, and then performing interpolation fitting calculation based on the set spectrum sampling interval as the standard to obtain the wavelength drift of each wavelength sampling point; S113, based on the spectrum data and the set spectrum sampling interval, the wavelength of the light source to be measured at each wavelength sampling point is obtained, and then based on the wavelength drift of each wavelength sampling point, the average wavelength value of the scan is obtained.

8. A high-precision light source average wavelength long-term stability testing device according to claim 7, characterized in that: The average wavelength value for each scan is expressed as: in, is the average value of the jth light source spectrum scan, N is the total number of sampling points of a single light source spectrum scan, and λ i is the wavelength of the light source 9 to be measured at the i-th wavelength sampling point, P i is the sampling power corresponding to the i-th sampling point, Δλ i is the wavelength drift of the i-th wavelength sampling point.

9. The high-precision light source average wavelength long-term stability testing device according to claim 5, characterized in that: The signal processing device evaluates the long-term stability of the average wavelength of the light source under test by: Based on the time curve of the average wavelength of the light source to be measured, the time curve of the average wavelength drift of the light source to be measured is obtained, and then the standard deviation of the average wavelength drift of the light source to be measured is obtained; The smaller the standard deviation of the average wavelength drift of the light source to be measured is, the better the long-term stability of the average wavelength of the light source to be measured is.

10. The high-precision light source average wavelength long-term stability testing device according to claim 9, characterized in that: The average wavelength at each time sampling point on the time curve of the average wavelength of the light source to be measured is converted into the average wavelength drift at the corresponding time sampling point on the time curve of the average wavelength drift of the light source to be measured by the following method: In the formula, is the average wavelength drift at the kth time sampling point, is the average wavelength of the kth time sampling point, and M is the total number of time sampling points on the time curve of the average wavelength of the light source to be measured.

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