Power supply method of electronic equipment and electronic equipment

Abstract

The invention discloses a power supply method of electronic equipment and the electronic equipment, and is applied to the technical field of electronics. The method comprises the steps that a first voltage of a target module in the electronic equipment at a target frequency is obtained, the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a power management integrated circuit (PMIC) module; acquiring a second voltage of the target module under the target frequency, wherein the second voltage is a voltage obtained by performing a voltage test on the target module; and under the condition that the second voltage is smaller than the first voltage, controlling the PMIC module to supply power to the target module based on the second voltage.

Description

Technical Field

[0001] The present application belongs to the field of electronic technology, and specifically relates to a power supply method for an electronic device and the electronic device. Background Art

[0002] At present, functional modules in electronic devices such as mobile phones and tablets are all powered by power management integrated circuit (PMIC) modules and work using the power supply voltage output by the PMIC modules.

[0003] When the PMIC module supplies power to the functional modules of electronic devices, the voltage will drop through the printed circuit board (PCB). The voltage drop is related to factors such as PCB process, board temperature and heat dissipation environment, and aging. Platform vendors cannot fully predict the voltage drop and usually set a higher voltage value so that the voltage value can still ensure stable operation of electronic devices even after the voltage drops.

[0004] The related technology usually directly controls the PMIC module to output a preset voltage value to power the functional modules of the electronic device. However, a higher preset voltage value will increase the overall power consumption of the electronic device and reduce the battery life of the electronic device, resulting in a problem of high power consumption of the electronic device. Summary of the invention

[0005] The present application provides a power supply method for an electronic device and an electronic device, which at least solves the problem of high power consumption of the electronic device existing in the related art.

[0006] In a first aspect, the present application provides a method for powering an electronic device, comprising: Acquire a first voltage of a target module in an electronic device at a target frequency, where the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a power management integrated circuit PMIC module; Acquire a second voltage of the target module at the target frequency, where the second voltage is a voltage obtained by performing a voltage test on the target module; When the second voltage is lower than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage.

[0007] In a second aspect, the present application provides an electronic device, comprising a processing element and a storage element, wherein the storage element stores a program or instruction running on the processing element, and when the program or instruction is executed by the processing element, the steps of the method described in the first aspect are implemented.

[0008] At least one of the above technical solutions provided in the embodiments of the present application can achieve the following technical effects: In an embodiment of the present application, a first voltage of a target module in an electronic device at a target frequency is obtained, the first voltage being a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a power management integrated circuit PMIC module; a second voltage of the target module at the target frequency is obtained, the second voltage being a voltage obtained by performing a voltage test on the target module; when the second voltage is less than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage. In this way, in the process of supplying power to the target module of the electronic device through the PMIC, the first voltage obtained based on the preset voltage of the target module at the target frequency is no longer directly used to supply power to the target module, but the second voltage obtained by voltage testing the target module at the target frequency is obtained. When the second voltage is less than the first voltage, the second voltage smaller than the first voltage can be used to supply power to the target module, which can achieve the effect of power saving and power consumption reduction, and solve the problem of high power consumption of electronic devices existing in the related art. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0010] Figure 1 is a schematic diagram of an AVS voltage regulating system provided by a related technology; Figure 2 is a flow chart of a power supply method for an electronic device provided in an embodiment of the present application; Figure 3 is a flow chart of another method for powering an electronic device provided in an embodiment of the present application; Figure 4 is a schematic diagram of a method for obtaining a second voltage using a UFS memory provided by an embodiment of the present application; Figure 5 is a schematic diagram of a method of obtaining a second voltage using a look up table (LUT) provided in an embodiment of the present application; Figure 6 It is a schematic diagram of the internal structure of an integrated circuit (IC) chip provided in an embodiment of the present application; Figure 7is a flow chart of another method for powering an electronic device provided in an embodiment of the present application; Figure 8-1 is a schematic diagram of a power supply example of a fixed voltage module provided in an embodiment of the present application; Figure 8-2 It is a schematic diagram of calling voltage logic provided by an embodiment of the present application; Fig. 9 is a flow chart of another method for powering an electronic device provided in an embodiment of the present application; Figure 10-1 is a schematic diagram of an example of power supply of a non-fixed voltage module provided in an embodiment of the present application; Figure 10-2 It is a schematic diagram of a voltage calling method of a target module supporting adaptive voltage scaling (Adaptive Voltage Scaling, AVS) provided in an embodiment of the present application; Fig.11 is a specific flow chart of a power supply method for an electronic device provided in an embodiment of the present application; Fig.12 It is a structural block diagram of a power supply device of an electronic device provided in an embodiment of the present application; Fig.13 It is a structural block diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0011] The following will be combined with the drawings in the embodiments of the present application to clearly describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0012] The terms "first", "second", etc. in the specification and claims of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described here, and the objects distinguished by "first", "second", etc. are generally of one type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" in the specification and claims represents at least one of the connected objects, and the character " / " generally indicates that the objects associated with each other are in an "or" relationship.

[0013] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0014] For reference Figure 1 , Figure 1 This is a schematic diagram of an AVS voltage regulation system provided by a related technology. Figure 1 As shown, the AVS voltage regulation system includes a system on chip (SoC) chip and a PMIC module. The SoC chip includes a central processing unit, a QFPROM memory, an arbitrator, an AVS sensor and an AVS controller. The PMIC module is used to provide power supply voltage to the SoC chip. Specifically, the voltage regulation scheme includes: the central processing unit reads the initial voltage value pre-stored in the QFPROM memory and gives the initial voltage value to the arbitrator; the arbitrator can send a voltage regulation command to the PMIC module through the SPMI (Serial Peripheral Management Interface) bus, and the voltage regulation command includes a power-on instruction and an initial voltage value; the PMIC module outputs the power voltage to the SoC chip according to the voltage regulation command; the AVS sensor detects the current power voltage, as well as sensor data such as the load and temperature in the current SoC chip and outputs them to the AVS controller; the AVS controller comprehensively determines a more appropriate voltage value based on the value of the current power voltage and sensor data such as the load and temperature in the current SoC chip, and then outputs it to the arbitrator to update the voltage value; the arbitrator sends a voltage regulation command to the PMIC module again through the SPMI bus, and the voltage regulation command includes updated voltage value information; the PMIC module adjusts the power voltage currently output by the PMIC module according to the updated voltage value information to ensure that the PMIC module outputs the updated voltage.

[0015] In the above-mentioned related technical solutions, when the PMIC module provides power supply voltage to the SoC chip, a voltage reduction value will be generated through the PCB board. This voltage reduction value is related to factors such as PCB process, power distribution network (PDN) capacitor design, board temperature heat dissipation environment and aging. Since these factors are all factors involved in the manufacturer's design and manufacturing, platform providers cannot estimate the voltage reduction caused by the PCB board, and usually preset a higher voltage value to ensure that a sufficiently large voltage margin is reserved to offset the voltage reduction caused by the PCB board. However, correspondingly, presetting a higher voltage value will also increase the power consumption of the entire machine and reduce the product's endurance competitiveness.

[0016] The power supply method of the electronic device provided in the embodiment of the present application is applied to the power supply of the device, and in particular, can be applied to the situation where the PMIC module is used for power supply. Specifically, the first voltage of the target module in the electronic device at the target frequency is first obtained, and then the voltage test is performed on the target module to obtain the second voltage of the target module obtained by the voltage test at the target frequency. When the second voltage is less than the first voltage, the second voltage smaller than the first voltage can be used to power the target module.

[0017] The power supply method for an electronic device provided in the embodiment of the present application can be executed by the electronic device, and the electronic device can be, for example, a terminal device such as a desktop computer, a mobile phone, a laptop computer, a tablet computer, or a server.

[0018] The power supply method for an electronic device and the electronic device provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0019] See also Figure 2 , Figure 2 1 is a flow chart of a power supply method for an electronic device provided in an embodiment of the present application. Figure 2 As shown, the method comprises the following steps: Step 210: Obtain a first voltage of a target module in an electronic device at a target frequency, wherein the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a power management integrated circuit PMIC module.

[0020] In the embodiment of the present application, the electronic device may be a terminal device such as a mobile phone, a desktop computer, and a tablet computer, and the electronic device may include a PMIC module. The target module is a module powered by the PMIC module, for example, a SoC chip is provided in the electronic device, and the target module may be each module in the fifth generation low power double data rate synchronous dynamic random access memory (LPDDR5) on the SoC chip.

[0021] Since the target module may correspond to different operating voltages when it is at different operating frequencies, the preset voltage corresponding to the target module at different frequencies may be preset, and the preset voltage is used to ensure the stable operation of the target module at a certain frequency. In fact, the preset voltage may be a voltage value preset by the platform vendor when the chip leaves the factory.

[0022] Specifically, in one embodiment of the present application, obtaining a first voltage of a target module in an electronic device at a target frequency includes: obtaining a first voltage of a target module in an electronic device at a target frequency from a read-only memory; wherein the read-only memory pre-stores a preset voltage of the target frequency at each of a plurality of frequencies, and the plurality of frequencies include the target frequency.

[0023] In the embodiment of the present application, when the chip (such as SoC chip) leaves the factory, the platform provider will perform a final test (FT) on the chip to ensure that the chip functions normally. During the FT test, the operating voltage suitable for each chip module such as CPU, GPU and DDR at different frequencies will also be tested, and the voltage results of the test will be stored. For example, the voltage results of the SoC chip test can be stored in the Qualcomm Fuse Programmable Read Only Memory (QFPROM) in the SoC chip.

[0024] In one embodiment of the present application, obtaining the first voltage of a target module in an electronic device at a target frequency includes: obtaining a power supply voltage output by the PMIC module to the target module, the power supply voltage being obtained based on a preset voltage of the target module at the target frequency; and determining the power supply voltage as the first voltage of the target module at the target frequency.

[0025] In the embodiment of the present application, Figure 1 For example, the CPU can read the pre-stored initial voltage value from the QFPROM memory and transmit the initial voltage value to the arbitrator. The arbitrator can send a voltage adjustment command to the PMIC module through the SPMI bus. The voltage adjustment command includes a power-on instruction and an initial voltage value. The PMIC module outputs the power supply voltage to the SoC chip according to the voltage adjustment command. At this time, the power supply voltage output by the PMIC module, that is, the first voltage, can be obtained through the AVS sensor.

[0026] It should be noted that the preset voltage value stored in the QFPROM memory may be the same as or different from the power supply voltage value output by the PMIC module. Specifically, when the target module is a module whose operating voltage remains fixed as the frequency changes or a module that supports dynamic voltage frequency scaling (DVFS), the preset voltage value stored in the QFPROM memory is the same as the power supply voltage value output by the PMIC module. When the target module is a module that supports AVS, the preset voltage value stored in the QFPROM memory is different from the power supply voltage value output by the PMIC module. When the preset voltage value stored in the QFPROM memory is different from the power supply voltage value output by the PMIC module, the first voltage is the power supply voltage output by the PMIC module.

[0027] Step 220: Obtain a second voltage of the target module at the target frequency, where the second voltage is a voltage obtained by performing a voltage test on the target module.

[0028] In the embodiment of the present application, when the target module is at the target frequency, after obtaining the first voltage of the target module at the target frequency, the first voltage may be output to the target module first, and the first voltage is used to ensure that the target module of the electronic device is quickly initialized and enters the working state. After the target module enters the working state and stabilizes, a voltage test may be performed on the target module to obtain a second voltage obtained by the voltage test at the target frequency.

[0029] Step 230: When the second voltage is lower than the first voltage, control the PMIC module to supply power to the target module based on the second voltage.

[0030] In the embodiment of the present application, in order to ensure the stability of power supply to the target module, a relatively sufficient voltage margin is usually reserved, that is, the first voltage obtained is relatively high. Therefore, the second voltage obtained by voltage testing the target module at the target frequency is usually lower than the first voltage. In addition, since the second voltage is obtained by voltage testing the target module at the target frequency, that is, the second voltage is measured, the stability of power supply to the target module can be ensured.

[0031] When the second voltage is less than the first voltage, the first voltage is no longer used to power the target module, but a second voltage that is less than the first voltage is used to power the target module. When the second voltage is greater than or equal to the first voltage, the PMIC module is controlled to power the target module based on the first voltage. Taking the VDD2H power supply in LPDDR5 as an example, the first voltage of VDD2H is 1.05V at a frequency of 800MHz. The second voltage can be obtained by voltage testing to be 0.8V. At this time, the second voltage is less than the first voltage, and the second voltage can be used for power supply. In this way, a better solution can be determined based on the two directions of reducing power consumption and ensuring stability, providing a better user experience of electronic equipment.

[0032] In an embodiment of the present application, a first voltage of a target module in an electronic device at a target frequency is obtained, the first voltage being a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a power management integrated circuit PMIC module; a second voltage of the target module at the target frequency is obtained, the second voltage being a voltage obtained by performing a voltage test on the target module; when the second voltage is less than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage. In this way, in the process of supplying power to the target module of the electronic device through the PMIC, the first voltage obtained based on the preset voltage of the target module at the target frequency is no longer directly used to supply power to the target module, but the second voltage obtained by voltage testing the target module at the target frequency is obtained. When the second voltage is less than the first voltage, the second voltage smaller than the first voltage can be used to supply power to the target module, which can achieve the effect of power saving and power consumption reduction, and solve the problem of high power consumption of electronic devices existing in the related art.

[0033] See also Figure 3 , Figure 3 FIG. 1 is a flow chart of another method for powering an electronic device provided in an embodiment of the present application. Figure 3 As shown, the method comprises the following steps: Step 310: Obtain a first voltage of a target module in an electronic device at a target frequency, where the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a PMIC module.

[0034] Step 320: Obtain a second voltage of the target module at a target frequency from a target element; wherein the target element stores a voltage obtained by performing a voltage test on the target module at each frequency of a plurality of frequencies, wherein the plurality of frequencies include the target frequency.

[0035] In the embodiment of the present application, the target element has a storage function. A voltage test can be performed in advance on the target module at each of the multiple frequencies to obtain the test voltage of the target module at each of the multiple frequencies, and the test voltages of the target module at different frequencies can be stored in the target element for subsequent use.

[0036] The embodiments of the present application provide two specific forms of the target element, namely, a UFS memory and a lookup table LUT. The following will introduce the case of the UFS memory and the case of the lookup table LUT respectively.

[0037] In the first case, the target element is a UFS memory, and obtaining the second voltage of the target module at the target frequency from the target element includes: the CPU obtains a target voltage matching the target frequency from the UFS through a UFS controller, and uses the target voltage as the second voltage of the target module at the target frequency.

[0038] In the embodiments of this application, please refer to Figure 4 , Figure 4 It is a schematic diagram of a method of obtaining a second voltage using a UFS memory provided in an embodiment of the present application. As a non-volatile memory, the UFS memory can provide higher read and write speeds and more reliable stability, and the UFS memory can be used to store the second voltage of the target module at the target frequency. In fact, there are multiple modules in the electronic device that are powered by a PMIC module, that is, the number of the target modules can be multiple, and the UFS memory can store the second voltage obtained by voltage testing of multiple target modules.

[0039] In one embodiment of the present application, the second voltage is obtained by a CPU disposed in a SoC chip, and the storage element is a UFS memory disposed outside the SoC chip.

[0040] The specific workflow is as follows: Figure 4As shown, based on the target frequency, the CPU reads the first voltage of the target module at the target frequency from the QFPROM memory. The CPU transmits the first voltage to the arbitrator (e.g., ARBITER), and after receiving the first voltage, the arbitrator converts the first voltage value into the SPMI protocol format to generate an SPMI command, wherein the SPMI command includes a power-on command and a first voltage value. Then, the arbitrator sends the SPMI command to the PMIC module to ensure that the electronic device quickly completes initialization and enters a working state. For example, when the GPU module starts working, the CPU reads a first voltage of 0.8V from the QFPROM memory, and the arbitrator can generate a first SPMI command, wherein the first SPMI command includes a power-on command and a set 0.8V command. After the PMIC module receives the first SPMI command, the power supply voltage can be output based on the first SPMI command.

[0041] After the PMIC module outputs the power supply voltage to the SoC chip, the AVS sensor in the SoC chip can detect the current voltage value output by the PMIC module, and also detect the load and temperature of each module in the current SoC chip. Then, the PMIC module can transmit the detected current voltage value, the load and temperature of each module in the SoC chip to the AVS controller, which will make a comprehensive decision on a more appropriate voltage value based on the actual situation and transmit the voltage value to the arbitrator.

[0042] Taking the GPU module in the SoC as an example, when the GPU module is under different loads and different temperatures, the actual operating voltage required by the GPU module is different. The heavier the load and the lower the temperature, the higher the required operating voltage, and the lighter the load and the higher the temperature, the lower the required operating voltage. Therefore, the AVS sensor collects the real-time status of these factors, and the AVS controller makes decisions and arbitration.

[0043] After the arbitrator receives the voltage value transmitted by the AVS controller, the arbitrator can make an arbitration judgment based on the voltage value transmitted by the AVS controller and the first voltage value obtained by the CPU from the QFPROM memory, and determine a more appropriate voltage value. Then, the arbitrator can generate a second SPMI command based on the voltage value, and transmit the second SPMI command to the PMIC module, so that the PMIC module re-outputs the power supply voltage based on the second SPMI command. In the above control process, there are a first SPMI command and a second SPMI command, and the second SPMI command is only used to update the voltage value information, which is used to cover the voltage value output by the first SPMI command to control the PMIC module. For example, the first SPMI command is used to control the PMIC module to power on and output a power supply voltage of 800mV, and the second SPMI command is used to control the PMIC module to output a new power supply voltage such as 780mV or 820mV.

[0044] In the above process, the second SPMI command controls the power supply voltage output by the PMIC module to be the first voltage. When it is detected that the PMIC outputs the first voltage, the CPU obtains the second voltage from the UFS memory through the UFS controller. Before the CPU obtains the second voltage value from the UFS memory through the UFS controller, the CPU can detect the current operating frequency of the LPDDR5. When it is determined that the frequency of the LPDDR5 does not fluctuate significantly within a preset time period (for example, 1 second), the CPU can obtain the second voltage from the UFS memory through the UFS controller. After the CPU obtains the second voltage, the first voltage and the second voltage can be further compared. When the second voltage is less than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage; when the first voltage is less than or equal to the second voltage, the PMIC module is controlled to supply power to the target module based on the first voltage.

[0045] That is, the CPU selects a smaller voltage value from the first voltage and the second voltage, and controls the PMIC module to supply power to the target module based on the smaller voltage value. Specifically, the CPU transmits the determined smaller voltage value to the arbitrator. The arbitrator generates a third SPMI command based on the smaller voltage value, and transmits the third SPMI command to the PMIC module, so that the PMIC outputs an updated voltage value based on the third SPMI command.

[0046] In the second case, the target element is a lookup table LUT; obtaining the second voltage of the target module at the target frequency from the target element includes: obtaining a target voltage matching the target frequency from the LUT, and using the target voltage as the second voltage of the target module at the target frequency.

[0047] In fact, in the first case above, the algorithms are stored in the CPU module, and the second voltage of the target module can be stored in the UFS memory. This method also has the following problems: First, the CPU of an electronic device enters a dormant state after it goes into sleep mode. In this case, most low-power modules cannot use this solution, which is inconsistent with the development trend of the industry. Second, this method will cause the CPU to consume more power, and the power consumption caused by frequent calls to the CPU will reduce the benefits of this solution. Third, the CPU process is easily occupied by other processes. For example, the CPU in a mobile phone is based on the ARM-M core and does not respond in real time. When the CPU is occupied by other processes with higher priority, the algorithm of this solution cannot be performed. Fourth, when the voltage data is stored in the UFS memory, there is a power consumption problem in the process of reading the UFS voltage data through the UFS memory. Fifth, the entire loop of CPU judgment, response, taking data from the UFS and sending it to the arbitrator is too long, and there is a delay problem.

[0048] In view of the above problems, a method for using LUT to store voltage data and make voltage value decisions is proposed. The LUT is a control module with storage and processing functions. That is, the second voltages at different frequencies obtained by voltage testing of multiple target modules can be stored in the LUT. At the same time, the LUT can replace the CPU to compare the first voltage with the second voltage, and no longer depends on the operation of the CPU. Even when the CPU is in sleep mode, the first voltage and the second voltage can still be compared to determine the final voltage value of the PMIC module, which can solve the above problems.

[0049] In one embodiment of the present application, the LUT is arranged in an integrated circuit IC chip, and the IC chip includes a peripheral component interconnect express (PCIe) interface, an analog-to-digital converter and an SPMI controller; wherein the PCIe interface is connected to the target module and is used to obtain the target frequency of the target module; the analog-to-digital converter is connected to the buck BUCK interface of the PMIC module and is used to obtain the power supply voltage output by the PMIC module to the target module as the first voltage; the SPMI controller is connected to the control end of the PMIC module and is used to convert the second voltage into an SPMI format.

[0050] In the embodiments of this application, please refer to Figure 5 , Figure 5It is a schematic diagram of a method of obtaining a second voltage using a lookup table provided in an embodiment of the present application. The following describes the entire workflow of obtaining the second voltage by using a lookup table. The process of obtaining the first voltage is consistent with the process of obtaining the first voltage in the first case, and will not be repeated here. After the PMIC outputs the first voltage through the buck BUCK interface, the analog-to-digital converter in the IC chip can obtain the first voltage output by the PMIC module. At the same time, the PMIC module outputs the first voltage to the LPDDR5 in the SoC chip to ensure that the LPDDR5 is in normal working condition, and the target module is the module in the LPDDR5.

[0051] When LPDDR5 is in normal working state, the IC chip can obtain the current operating frequency of the target module, that is, the target frequency, through the PCIe interface. The voltage values ​​of the target module obtained by voltage testing at different frequencies are stored in the LUT, and the second voltage can be determined based on the target frequency.

[0052] In one embodiment of the present application, the LUT is set in an IC chip, and the IC chip includes a frequency monitoring module and a timer; the frequency monitoring module is connected to the target module and is used to obtain the target frequency of the target module; obtaining the target voltage matching the target frequency from the LUT includes: when the target frequency of the target module does not change within a preset time period, obtaining the target voltage matching the target frequency from the LUT.

[0053] In the embodiments of this application, please refer to Figure 6 , Figure 6 Schematic diagram of the internal structure of an IC chip provided in an embodiment of the present application. The IC chip includes a Flash module, a Clock module, an analog-to-digital converter, a PCIe interface, a timer, a LUT module, a power management module and an SPMI controller.

[0054] Among them, the FLASH module includes a flash memory (Flash) for storing IC firmware, and the Flash content can be written and erased through the Joint Test Action Group (JTAG) interface; the power management (Power Management) module is used for the power supply management of the IC internal analog part 3.3V, the digital interface part 1.8V and the digital CORE part 0.9V. In the case of power supply abnormality or power-on timing error, the power management module also has the function of resetting the IC hardware; the CLOCK module is used to provide a reference clock for the internal circuit of the IC chip, and its operating frequency determines the processing speed of the custom IC; the analog-to-digital converter is used to monitor the power supply voltage value and supports multiplexing (mux) function. One analog-to-digital converter can support multiple external ADC interfaces, saving the production cost of the IC chip; the timer is associated with the ADC module, used to record the current voltage duration, and can provide time data.

[0055] The frequency monitoring module may include the PCIe interface, which can be used to obtain the operating frequency information of each module from the LPDDR5 and can be used as the input of the internal algorithm of the custom IC; the LUT is used to store the first voltage value of different modules at different frequencies and the second voltage value information obtained by the test. The PCIe interface can input the current frequency information to the LUT, the ADC module can input the current voltage value, the timer recording frequency and the duration of the voltage to the LUT, and the SPMI controller (SPMI Controller Master) is used to send the output value of the LUT to the PMIC module in the SPMI format.

[0056] After the LUT receives the current operating frequency, current operating voltage and duration of the target module, it can first determine whether the duration of the current operating frequency remaining stable exceeds a preset time period (for example, 1 second). If the duration exceeds the preset time period, the second voltage of the target module at the current operating frequency is searched from the LUT based on the current operating frequency, the second voltage is compared with the current operating voltage, a lower voltage value is selected from the first voltage and the second voltage, and the lower voltage value is converted into the SPMI format. Specifically, please refer to the following schematic table of LUT:

[0057] Table 1: Schematic diagram of LUT As shown in Table 1 above, when the input of the LUT is: the current operating frequency is 800MHz, the current operating voltage is 1.05V, and the duration is 1000ms; the output of the LUT is: the lower voltage value is 0.8V, which is converted to the SPMI format as 0x95C9C000.

[0058] Step 330: When the second voltage is lower than the first voltage, control the PMIC module to supply power to the target module based on the second voltage.

[0059] In an embodiment of the present application, the target module may be voltage tested at each of a plurality of frequencies in advance, and the voltages corresponding to the different frequencies obtained from the tests may be stored in the target element, so as to facilitate subsequent search for the second voltage of the target frequency from the target element.

[0060] See also Figure 7 , Figure 7 FIG. 1 is a flow chart of another method for powering an electronic device provided in an embodiment of the present application, and the method is applicable to the power supply logic of a fixed voltage module. Figure 7 As shown, the method comprises the following steps: Step 710: Obtain a first voltage of a target module in an electronic device at a target frequency, wherein the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, the target module is a module powered by a PMIC module, and the target module is a module whose operating voltage remains fixed as the frequency changes.

[0061] In an embodiment of the present application, the target module may be a module whose operating voltage remains fixed as the frequency changes, such as the VDD2H power supply module in LPDDR5. The embodiment of the present application will be introduced using the VDD2H power supply as an example, but the target module is not limited to the VDD2H power supply.

[0062] In the process of testing the second voltage of the target module in different working scenarios, due to the various working scenarios, it will take a lot of testing time and invest a lot of resources, which is a difficult task to complete. In fact, returning to the origin of the work of the target module, the working frequency of the target module in the daily work process can be selected for testing. For example, all scenarios of LPDDR5 will only work at the following frequencies as shown in Table 2, usually low frequency for light load and high frequency for heavy load. Therefore, it is only necessary to traverse the test to obtain the test voltage at the working frequency in Table 2.

[0063]

[0064] Table 2: Original voltage of VDD2H power module at different operating frequencies As shown in Table 2, Table 2 records the original voltage of the VDD2H power module at different operating frequencies. The operating frequency recorded in Table 2 includes the target frequency, and the original voltage in Table 2 includes the first voltage.

[0065] Step 720: When the target module operates at the target frequency as the operating frequency and at the preset voltage as the operating voltage, perform a voltage test on the target module.

[0066] In the embodiment of the present application, during the voltage test process in step 720 to step 730, the following method can be specifically adopted: when the target module uses the target frequency as the operating frequency and the preset voltage as the operating voltage to operate, the target module is subjected to a voltage test. When the target module can pass the voltage test, the operating voltage of the target module is reduced from the preset voltage to the first test voltage; when the target module uses the target frequency as the operating frequency and the first test voltage as the operating voltage to operate, the target module is subjected to a voltage test. When the target module cannot pass the voltage test, the preset voltage is used as the lowest test voltage of the target module at the target frequency.

[0067] After the target module is subjected to a voltage test with the target frequency as the operating frequency and the first test voltage as the operating voltage, if the target module can pass the voltage test, the operating voltage of the target module is reduced from the first test voltage to the second test voltage; when the target module operates with the target frequency as the operating frequency and the second test voltage as the operating voltage, the voltage test is performed on the target module. If the target module cannot pass the voltage test, the first test voltage is used as the lowest test voltage of the target module at the target frequency.

[0068] After performing a voltage test on the target module with the target frequency as the operating frequency and the second test voltage as the operating voltage, if the target module can pass the voltage test, continue to reduce the operating voltage of the target module for voltage testing until a minimum test voltage that can pass the voltage test is obtained.

[0069] The following examples and Figure 8-1 Give a detailed introduction, Figure 8-1 is a schematic diagram of a power supply example of a fixed voltage module provided in an embodiment of the present application. Figure 8-1As shown, when the electronic device is turned on and the target module is in working state, the preset voltage of the target module at the target frequency, that is, the first voltage, can be obtained through the QFPROM memory. In the process of voltage testing, the operating frequencies shown in Table 2 above can be traversed for testing. For example, the second voltage of the target module in the working scenario with a frequency of 800MHz can be tested first, and then the second voltage of the target module in the working scenario with a frequency of 1600MHz can be tested, and the second voltages corresponding to all the operating frequencies in Table 2 can be obtained by testing in sequence.

[0070] Take 800MHz as an example Figure 8-1 To be specific, the working frequency of the target module can be locked to 800MHz (for example, using the abc command to lock the frequency), and the PMIC module outputs a power supply voltage of 1.05V to the target module, so that the target module is in normal working state. Then a test scenario can be built (for example, using the AnTuTu test tool), so that the target module uses 800MHz as the working frequency and 1.05V as the working voltage for a period of time (for example, 1 minute) to perform voltage testing.

[0071] Step 730: When the target module can pass the voltage test, reduce the operating voltage of the target module, and continue to perform voltage test on the target module until a minimum test voltage at which the target module can pass the voltage test is obtained.

[0072] In the embodiment of the present application, when the target module passes the voltage test, it can be determined that the current operating voltage has a voltage margin for the target module at the current operating frequency. At this time, the operating voltage of the target module can be reduced, the operating frequency remains unchanged, and the voltage test is continued. When it is reduced to a certain voltage, if the voltage is further reduced, the voltage test cannot be passed, and the lowest test voltage at which the target module can pass the voltage test can be obtained.

[0073] In the process of reducing the operating voltage of the target module, you can reduce the voltage by a fixed value at one time, or you can flexibly adjust the voltage value each time you reduce it. Figure 8-1 As shown, the voltage value can be reduced by 0.05V at a time. The target module is in a working scenario with an operating frequency of 800MHz and an operating voltage of 1.05V. If the target module completes the voltage test in this working scenario, the operating voltage can be reduced to 1V, the operating frequency remains unchanged, and the voltage test continues; if the target module cannot complete the voltage test in this working scenario, 1.05V is directly used as the minimum test voltage of the target module at 800MHz.

[0074] In the working scenario where the target module is in an operating frequency of 800MHz and an operating voltage of 1V, if the target module can still complete the voltage test, it means that the voltage margin of the first voltage is greater than 50mV, and the operating voltage can be further reduced to 0.95V, the operating frequency remains unchanged, and the voltage test is continued. If the target module cannot complete the voltage test in this working scenario, 1.05V is directly used as the minimum test voltage of the target module at 800MHz.

[0075] In the working scenario where the target module is in an operating frequency of 800MHz and an operating voltage of 0.95V, if the target module can still complete the voltage test, it means that the voltage margin of the first voltage is greater than 100mV, and the operating voltage can be further reduced to 0.9V, and the operating frequency remains unchanged, and the voltage test continues. In the case that the target module cannot complete the voltage test in this working scenario, 1V is directly used as the minimum test voltage of the target module at 800MHz. The following is by analogy, and no further details are given here.

[0076] Through the above method, the minimum test voltage of the target module at 800MHz can be obtained. For example, the minimum test voltage of the target module at 800MHz can be obtained to be 0.8V, and the voltage margin is 250mV. Figure 8-1 As shown, after obtaining the minimum test voltage of 0.8V of the target module at 800MHz, the frequency can be locked to 1600MHz, and the same method is used to obtain the minimum test voltage of 0.83V of the target module at 1600MHz. The minimum test voltage of the target module at all frequencies in Table 2 is obtained in turn, and the test is completed.

[0077] Step 740: Use the lowest test voltage as the second voltage of the target module at the target frequency and store it in the target component.

[0078] In the embodiment of the present application, the second voltage of the target module at different frequencies can be obtained by the above method, and the second voltage can be stored in the target element. See Table 3 below, which records the original voltage and test voltage of the VDD2H power module at different operating frequencies. The original voltage is read from the QFPROM memory, including the first voltage. For example, the first voltage of the VDD2H power module at 800MHz is 1.05V, and the second voltage is 0.8V.

[0079]

[0080] Table 3: Original voltage and test voltage of VDD2H power supply at different operating frequencies Step 750: Obtain a second voltage of the target module at a target frequency from a target element; wherein the target element stores a voltage obtained by performing a voltage test on the target module at each frequency of a plurality of frequencies, wherein the plurality of frequencies include the target frequency.

[0081] Step 760: When the second voltage is lower than the first voltage, control the PMIC module to supply power to the target module based on the second voltage.

[0082] In an embodiment of the present application, in the process of reducing voltage and saving power by calling the second voltage, the stability of the operation must also be considered. Specifically, the calling rules of the second voltage are as follows. First, do not pay attention to the user scenario, only monitor the operating frequency of the target module. Second, to ensure system stability, first call the first voltage of the corresponding frequency stored in the QFPROM memory for initialization. Third, if the operating frequency does not change after working for 1s, the second voltage can be called to reduce voltage and save power. If the operating frequency changes after working for 1s, the timing is reset.

[0083] Through the above method, power consumption can be saved as much as possible under the premise of ensuring stability. As shown in Table 4 below, Table 4 records the expected benefits that can be achieved by calling the test voltage of the VDD2H power module.

[0084]

[0085] Table 4: Expected benefits of VDD2H power module For the above method of calling the test voltage, please refer to Figure 8-2 , Figure 8-2 This is a schematic diagram of calling voltage logic provided in an embodiment of the present application.

[0086] like Figure 8-2 As shown, when the electronic device is turned on and the target module is in working state, the preset voltage (original voltage), that is, the first voltage, of the target module at the target frequency can be obtained through the QFPROM memory. At this time, wait for 1 second so that the target module can complete initialization and be in a stable state. If the voltage does not change with the frequency within 1 second, it can be determined that the target module is in a stable state; if the voltage changes with the frequency before lasting 1 second, the timing is reset. When the target module is in a stable state, the second voltage (test voltage) of the target module at the target frequency can be read from the target element to determine whether the second voltage is less than the first voltage. When the second voltage is less than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage; when the second voltage is greater than the first voltage, the first voltage currently controlled to output the PMIC module is maintained, and the voltage adjustment is completed.

[0087] In an embodiment of the present application, when the target module uses the target frequency as the operating frequency and the preset voltage as the operating voltage to operate, the target module is subjected to a voltage test; when the target module can pass the voltage test, the operating voltage of the target module is reduced, and the voltage test is continued on the target module until the lowest test voltage at which the target module can pass the voltage test is obtained; the lowest test voltage is used as the second voltage of the target module at the target frequency and stored in the target element. In this way, by continuously reducing the voltage to perform a voltage test on the target module, the lowest test voltage at which the target module can pass the voltage test can be obtained. This method reduces the voltage as much as possible while ensuring that the voltage test is passed, and can reduce the power consumption of the target module as much as possible while ensuring the stability of the target module.

[0088] See also Fig. 9 , Fig. 9 FIG. 1 is a flow chart of another method for powering an electronic device provided in an embodiment of the present application. The method is applicable to a module supporting DVFS or a module supporting AVS. Fig. 9 As shown, the method comprises the following steps: Step 910: Obtain a first voltage of a target module in an electronic device at a target frequency, where the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, the target module is a module powered by a PMIC module, and the target module is a module supporting DVFS or a module supporting AVS.

[0089] In the embodiments of the present application, in order to ensure stability, the platform vendor usually reserves a sufficient voltage margin and sets a higher first voltage, that is, the PMIC module outputs a higher voltage. Therefore, after actual measurement in combination with the actual design application, a lower actual required voltage, that is, the second voltage, can often be obtained. At this time, calling the second voltage will have power consumption benefits. But at the same time, there is also a situation where there is an excessive pursuit of high energy efficiency and long battery life. In this case, the initial voltage (first voltage) is set low, and the actual required voltage (second voltage) obtained by actual measurement will not be lower than the initial voltage.

[0090] In the embodiment of the present application, the module supporting DVFS or the module supporting AVS are both non-fixed voltage modules. For the target module supporting DVFS, different voltages are provided for it according to different operating frequencies, low voltage is provided at low frequency, and high voltage is provided at high frequency. The target module supporting DVFS corresponds to different preset voltage values ​​at different operating frequencies, such as the VMDDR power module in LPDDR5. Please refer to Table 5 below, which records the original voltage (preset voltage) of the VMDDR power supply at different frequencies.

[0091]

[0092] Table 5: Original voltage of VMDDR power supply at different frequencies As shown in Table 5 above, the first voltage corresponding to the target module supporting DVFS is quite different when it is at low frequency and high frequency. At this time, in a specific user scenario, the target module will switch between high and low frequencies. Therefore, when testing the second voltage of the target module, the user scenario can be covered by switching between low and high frequencies, and the voltage test process of the target module whose operating voltage remains fixed with frequency changes can be optimized.

[0093] For target modules that support AVS, the AVS mechanism will fine-tune the voltage based on the current temperature, physical condition and other information. Target modules that support AVS also support DVFS, such as the VCORE power module in LPDDR5. Please refer to Table 6 below, which records the preset voltage of the VCORE power supply at different frequencies, that is, the original voltage in Table 6 below. At the same time, the algorithm for AVS to fine-tune the voltage is also relatively complex, and it is difficult to cover factors such as PCB board and PDN design. In actual application scenarios, stability problems caused by insufficient voltage margin are prone to occur.

[0094]

[0095] Table 6: Original voltage of VCORE power module at different frequencies Step 920: When the target module operates at the target frequency as the operating frequency and at the preset voltage as the operating voltage, perform a voltage test on the target module.

[0096] In the embodiment of the present application, during the voltage test process in step 920 to step 960, the following method can be specifically adopted: when the target module uses the target frequency as the operating frequency and the preset voltage as the operating voltage to operate, the target module is subjected to a voltage test. When the target module can pass the voltage test, the operating voltage of the target module is reduced from the preset voltage to a third test voltage; when the target module uses the target frequency as the operating frequency and the third test voltage as the operating voltage to operate, the target module is subjected to a voltage test. When the target module cannot pass the voltage test, the preset voltage is used as the lowest target voltage of the target module at the target frequency.

[0097] After performing a voltage test on the target module with the target frequency as the operating frequency and the third test voltage as the operating voltage, if the target module can pass the voltage test, continue to reduce the operating voltage of the target module for voltage testing until a minimum target voltage that can pass the voltage test is obtained.

[0098] After obtaining the lowest target voltage, the operating frequency is switched from the target frequency to the highest frequency; when the target module operates with the highest frequency as the operating frequency and the lowest target voltage as the operating voltage, a voltage test is performed on the target module. When the target module can pass the voltage test, the lowest target voltage is used as the lowest test voltage of the target module at the target frequency. When the target module cannot pass the voltage test, the operating voltage of the target module is increased from the lowest target voltage to a fourth test voltage; when the target module operates with the highest frequency as the operating frequency and the fourth test voltage as the operating voltage, a voltage test is performed on the target module.

[0099] If the target module can pass the voltage test, the fourth test voltage is used as the lowest test voltage of the target module at the target frequency. If the target module cannot pass the voltage test, the operating voltage of the target module is continuously increased to perform the voltage test until the lowest test voltage that can pass the voltage test is obtained.

[0100] Since the voltage test process of modules supporting AVS and modules supporting DVFS is the same, the following takes the VMDDR power module supporting DVFS as an example for detailed introduction. Figure 10-1 , Figure 10-1 is a schematic diagram of an example of power supply of a non-fixed voltage module provided in an embodiment of the present application. Figure 10-1 As shown, when the electronic device is turned on and the VMDDR power module is in working state, the preset voltage of the target module at the target frequency, that is, the first voltage, can be obtained through the QFPROM memory. In the process of voltage testing, the operating frequencies shown in Table 5 above can be traversed for testing. For example, the second voltage of the target module in the working scenario with a frequency of 800MHz can be tested first, and then the second voltage of the target module in the working scenario with a frequency of 1600MHz can be tested, and the second voltages corresponding to all the operating frequencies in Table 5 can be obtained by testing in sequence.

[0101] Take 800MHz as an example Figure 10-1 To be specific, the operating frequency of the VMDDR power module can be locked to 800MHz (for example, using the abc command to lock the frequency), and the PMIC module outputs a power voltage of 550mV to the target module, so that the target module is in normal working state. Then a test scenario can be built to make the VMDDR power module use 800MHz as the operating frequency and 1.05V as the operating voltage for a period of time (for example, 1 minute) for voltage testing.

[0102] Step 930: When the target module can pass the voltage test, reduce the operating voltage of the target module, and continue to perform voltage test on the target module until a minimum target voltage at which the target module can pass the voltage test is obtained.

[0103] In an embodiment of the present application, when the target module can pass the voltage test, the operating voltage of the target module is reduced and the voltage test is continued on the target module; when the target module cannot pass the voltage test, the first voltage is directly determined as the lowest target voltage of the target module at the target frequency.

[0104] like Figure 10-1 As shown, when the VMDDR power module passes the voltage test, it can be determined that the current operating voltage has a voltage margin for the target module at the current operating frequency. At this time, the operating voltage of the target module can be reduced, the operating frequency remains unchanged, and the voltage test continues. Until it is reduced to a certain voltage, if the voltage is further reduced, the voltage test cannot be passed, and it can be determined that the voltage is the minimum test voltage. In the above manner, it can be determined that the minimum target voltage of the VMDDR power module at a frequency of 800MHz is 510mV, and the voltage margin is 40mV.

[0105] Step 940: Switch the operating frequency of the target module from the target frequency to the highest frequency.

[0106] Step 950: When the target module operates at the highest frequency as the operating frequency and at the lowest target voltage as the operating voltage, perform a voltage test on the target module.

[0107] In the embodiment of the present application, after determining the lowest target voltage of the target module at the target frequency, the operating frequency of the target module can be switched from the target frequency to the highest frequency. Figure 10-1 As shown, the VMDDR power module is switched from 800 MHz to 8533 MHz, and the voltage is maintained at the lowest target voltage of 510 mV corresponding to 800 MHz to continue the voltage test.

[0108] Step 960: if the target module fails to pass the voltage test, gradually increase the operating voltage of the target module, and continue to perform voltage tests on the target module until a minimum test voltage at which the target module can pass the voltage test is obtained; In the embodiment of the present application, when the target module can pass the voltage test, the minimum target voltage is determined as the minimum test voltage at which the target module can pass the voltage test. When the target module cannot pass the voltage test, the minimum test voltage is increased to continue the voltage test until the minimum test voltage at which the target module can pass the voltage test is obtained.

[0109] like Figure 10-1 As shown, the VMDDR power module is in a working scenario with an operating frequency of 8533 MHz and an operating voltage of the minimum target voltage of 510 mV. When the VMDDR power module completes the voltage test in this working scenario, 510 mV can be directly used as the minimum test voltage of the VMDDR power module at 800 MHz. When the VMDDR power module cannot complete the voltage test in this working scenario, the operating voltage is increased to 520 mV, the operating frequency is maintained at 8533 MHz, and the voltage test is continued.

[0110] When the VMDDR power module is in a working scenario with an operating frequency of 8533MHz and an operating voltage of 520mV, if the VMDDR power module can complete the voltage test, 520mV is directly used as the minimum test voltage of the target module at 800MHz; if the VMDDR power module cannot complete the voltage test in this working scenario, it means that the voltage margin of the first voltage is greater than 50mV, and the operating voltage can be further increased to 530mV, the operating frequency is maintained at 8533MHz, and the voltage test is continued.

[0111] Through the above method, it can be determined that the minimum test voltage of the VMDDR power module at the target frequency of 800MHz is 530mV, and the voltage margin is 20mV. Then the minimum test voltage of the VMDDR power module at 1600MHz can be tested, which is consistent with the test method in the 800MHz scenario and will not be repeated here.

[0112] Step 970: Storing the lowest test voltage in the target component as the second voltage of the target module at the target frequency.

[0113] In the embodiment of the present application, the second voltage of the target module at different frequencies can be determined by the above method, and the second voltage of the target module at different frequencies can be stored in the target element. For example, the test voltage of the VMDDR power module at different frequencies can be obtained, as shown in Table 7 below, which may include the second voltage of the VMDDR power module at the target frequency.

[0114]

[0115] Table 7: Original voltage and test voltage of VMDDR power module at different frequencies Step 980: Obtain a second voltage of the target module at a target frequency from a target element; wherein the target element stores a voltage obtained by performing a voltage test on the target module at each frequency of a plurality of frequencies, wherein the plurality of frequencies include the target frequency.

[0116] Step 990: When the second voltage is lower than the first voltage, control the PMIC module to supply power to the target module based on the second voltage.

[0117] In the embodiment of the present application, for a target module supporting DVFS, the method of calling the test voltage of the target module can refer to the method of calling the test voltage of the fixed voltage module, that is, Figure 8-2 The method shown. When the target module starts working, the original voltage stored in the QFPROM memory is still called initially to ensure the stability of the target module. If the operating voltage of the target module does not change with the frequency after 1 second, the test voltage value stored in the target component is called to achieve the effect of reducing voltage and power consumption. If the operating voltage changes with the frequency within 1 second, the timing is restarted. In the above method, the expected benefits of calling the test voltage of the VMDDR power module can be referred to Table 8 below.

[0118]

[0119] Table 8: Expected benefits of VMDDR power modules For target modules that support AVS, the method of calling the test voltage of the target module is slightly different. Figure 10-2 , Figure 10-2 It is a schematic diagram of a method for voltage calling of a target module supporting AVS provided in an embodiment of the present application.

[0120] like Figure 10-2As shown, when the electronic device is turned on and the target module is in working state, the preset voltage of the target module at the target frequency, that is, the first voltage, can be obtained through the QFPROM memory. At this time, wait for 1 second so that the target module completes initialization and is in a stable state. If the voltage does not change with the frequency within 1 second, it can be determined that the target module is in a stable state; if the voltage changes with the frequency before 1 second, the timing is reset. If the target module is in a stable state, the second voltage of the target module at the target frequency can be read from the target element to determine whether the second voltage is less than the first voltage. If the second voltage is greater than the first voltage, the second voltage can be called to ensure stability; if the second voltage is less than or equal to the first voltage, continue to determine whether the second voltage is less than the first voltage. If the second voltage is less than the first voltage, the second voltage is called, and the PMIC module is controlled to supply power to the target module based on the second voltage to achieve the purpose of power saving; if the second voltage is equal to the first voltage, the first voltage currently controlling the output of the PMIC module is maintained, and the voltage adjustment is completed. In the above manner, the expected benefits of the VCORE power module calling the test voltage can be referred to Table 9 below.

[0121]

[0122] Table 9: Expected benefits of VCORE power modules As shown in Table 9, it can be observed through actual measurement that the AVS original voltage at some frequencies is too low, such as 800MHz, 4100MHz, 5500MHz and 6400MHz. By raising the AVS original voltage at these frequencies, the stability of the VCORE power module can be guaranteed. At the same time, it can be observed that there is still room for optimization of the AVS original voltage at some frequencies, such as 3094MHz, 7500MHz and 8533MHz. By reducing the AVS original voltage at these frequencies, the purpose of reducing power consumption can be achieved.

[0123] In an embodiment of the present application, a voltage testing method for a target module that supports AVS and DVFS is provided. This method takes into account voltage changes at different frequencies and uses a low-frequency and high-frequency switching method to complete the voltage test of the target module. This can reduce the power consumption of the target module while ensuring the stability of the target module, thereby improving the user experience.

[0124] Please refer to Fig.11 , Fig.11 FIG. 1 is a specific flow chart of a power supply method for an electronic device provided in an embodiment of the present application. Fig.11 As shown, the method comprises the following steps: Step 1110: Obtain a power supply voltage output by the PMIC module to the target module, where the power supply voltage is obtained based on a preset voltage of the target module at a target frequency.

[0125] Step 1120: Determine the power supply voltage as the first voltage of the target module at the target frequency.

[0126] Step 1130: Obtain a second voltage of the target module at a target frequency from a target element; wherein the target element stores a voltage obtained by performing a voltage test on the target module at each frequency of a plurality of frequencies, wherein the plurality of frequencies include the target frequency.

[0127] In an embodiment of the present application, the target element may be a UFS memory or a LUT. When the target element is a UFS memory, the CPU obtains a target voltage matching the target frequency from the UFS through a UFS controller, and uses the target voltage as the second voltage of the target module at the target frequency. When the target element is a LUT, a target voltage matching the target frequency is obtained from the LUT, and the target voltage is used as the second voltage of the target module at the target frequency.

[0128] Wherein, the LUT is arranged in an IC chip, and the IC chip includes a PCIe interface, an analog-to-digital converter and an SPMI controller, the PCIe interface is connected to the target module and is used to obtain the target frequency of the target module; the analog-to-digital converter is connected to the buck BUCK interface of the PMIC and is used to obtain the power supply voltage output by the PMIC to the target module as the first voltage; the SPMI controller is connected to the control end of the PMIC and is used to convert the second voltage into the SPMI format.

[0129] In the embodiment of the present application, the target module may be a module whose operating voltage remains fixed as the frequency changes, a module supporting DVFS, or a module supporting AVS.

[0130] In the case where the target module is a module whose operating voltage remains fixed as the frequency changes, the second voltage of the target module at the target frequency can be obtained in the following manner: when the target module operates with the target frequency as the operating frequency and with the preset voltage as the operating voltage, a voltage test is performed on the target module; when the target module can pass the voltage test, the operating voltage of the target module is reduced, and the voltage test is continued on the target module until a minimum test voltage at which the target module can pass the voltage test is obtained; and the minimum test voltage is used as the second voltage of the target module at the target frequency and stored in the target element.

[0131] In the case where the target module is a module supporting DVFS or a module supporting AVS, the second voltage of the target module at the target frequency can be obtained in the following manner: when the target module uses the target frequency as the operating frequency and uses the preset voltage as the operating voltage, performing a voltage test on the target module; when the target module can pass the voltage test, reducing the operating voltage of the target module, and continuing to perform a voltage test on the target module until a minimum target voltage at which the target module can pass the voltage test is obtained; switching the operating frequency of the target module from the target frequency to the maximum frequency; when the target module uses the maximum frequency as the operating frequency and uses the minimum target voltage as the operating voltage, performing a voltage test on the target module; when the target module cannot pass the voltage test, gradually increasing the operating voltage of the target module, and continuing to perform a voltage test on the target module until a minimum test voltage at which the target module can pass the voltage test is obtained; using the minimum test voltage as the second voltage of the target module at the target frequency, and storing it in the target element.

[0132] Step 1140: When the second voltage is lower than the first voltage, control the PMIC module to supply power to the target module based on the second voltage.

[0133] In an embodiment of the present application, when the target module is a module that supports AVS, the power supply method of the electronic device, in addition to the above-mentioned steps 1110 to 1140, further includes: when the second voltage is greater than the first voltage, controlling the PMIC module to supply power to the target module based on the second voltage.

[0134] In an embodiment of the present application, a first voltage of a target module in an electronic device at a target frequency is obtained, the first voltage being a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a PMIC module; a second voltage of the target module at the target frequency is obtained, the second voltage being a voltage obtained by performing a voltage test on the target module; and when the second voltage is less than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage. In this way, in the process of supplying power to the target module of the electronic device through the PMIC, the first voltage obtained based on the preset voltage of the target module at the target frequency is no longer directly used to supply power to the target module, but the second voltage obtained by voltage testing the target module at the target frequency is obtained. When the second voltage is less than the first voltage, the second voltage smaller than the first voltage can be used to supply power to the target module, which can achieve the effect of power saving and reducing power consumption, and solve the problem of high power consumption of electronic devices existing in the related art.

[0135] It is important to understand that Figures 1 to 11 The explanations of the same or corresponding steps in the above may refer to each other. For example, Figure 2 The explanation of step 210 and step 230 in Figure 3 Step 310 and step 330 in .

[0136] At the same time, it should be understood that the power supply method of an electronic device provided in the embodiment of the present application can have the following beneficial effects: First, the power supply method of an electronic device provided in the embodiment of the present application can further test the voltage of the AVS solution of the platform provider on the production line to ensure the system stability of the whole machine, improve the user experience, and effectively solve the user pain points. Second, a method for integrating the voltage margin of industry platform providers, PCB board manufacturers, device manufacturers, and original equipment manufacturers is proposed to find out the real voltage margin of each whole machine under different combinations. For whole machines with high voltage margins, the voltage value is reduced to save power consumption and improve the competitiveness of battery life; for whole machines with small voltage margins, the voltage value is raised to ensure stability, improve user experience and product reputation, and benefits can be obtained in battery life and stability according to the situation.

[0137] See also Fig.12 , Fig.12 1 is a structural block diagram of a power supply device of an electronic device provided in an embodiment of the present application. Fig.12 As shown, an embodiment of the present application provides a power supply device 500 for an electronic device, and the power supply device 1200 for an electronic device includes: an acquisition module 1210 , a test module 1220 and a power supply module 1230 .

[0138] The acquisition module 1210 is used to acquire a first voltage of a target module in the electronic device at a target frequency, where the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a PMIC module; The test module 1220 is used to obtain a second voltage of the target module at the target frequency, where the second voltage is a voltage obtained by performing a voltage test on the target module.

[0139] The power supply module 1230 is used to control the PMIC module to supply power to the target module based on the second voltage when the second voltage is lower than the first voltage.

[0140] In an embodiment of the present application, a first voltage of a target module in an electronic device at a target frequency is obtained, the first voltage being a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a PMIC module; a second voltage of the target module at the target frequency is obtained, the second voltage being a voltage obtained by performing a voltage test on the target module; and when the second voltage is less than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage. In this way, in the process of supplying power to the target module of the electronic device through the PMIC, the first voltage obtained based on the preset voltage of the target module at the target frequency is no longer directly used to supply power to the target module, but the second voltage obtained by voltage testing the target module at the target frequency is obtained. When the second voltage is less than the first voltage, the second voltage smaller than the first voltage can be used to supply power to the target module, which can achieve the effect of power saving and reducing power consumption, and solve the problem of high power consumption of electronic devices existing in the related art.

[0141] The power supply device of the electronic device provided in the embodiment of the present application can implement each process implemented in the above method embodiment, and will not be described again here to avoid repetition.

[0142] like Fig.13 As shown, an embodiment of the present application also provides an electronic device 1300. The electronic device 1300 includes: a processing element 1310 and a storage element 1320, and the storage element 1320 stores a program or instruction, and when the program or instruction is executed by the processing element 1310, the steps of any of the methods described above are implemented. For example, when the program is executed by the processing element 1310, the following process is implemented: obtaining a first voltage of a target module in the electronic device at a target frequency, the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a PMIC module; obtaining a second voltage of the target module at the target frequency, the second voltage is a voltage obtained by performing a voltage test on the target module; when the second voltage is less than the first voltage, controlling the PMIC module to supply power to the target module based on the second voltage. In this way, in the process of supplying power to the target module of the electronic device through the PMIC, the first voltage obtained based on the preset voltage of the target module at the target frequency is no longer directly used to power the target module. Instead, the second voltage obtained by voltage testing the target module at the target frequency is obtained. When the second voltage is lower than the first voltage, the second voltage lower than the first voltage can be used to power the target module, which can achieve the effect of saving power and reducing power consumption, and solves the problem of high power consumption of electronic devices existing in the related art.

[0143] An embodiment of the present application also provides a readable storage medium, on which a program or instruction is stored. When the program or instruction is executed by a processor, the steps of each embodiment of the power supply method of an electronic device are implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0144] The processor is a processing element in the electronic device described in the above embodiment. The readable storage medium includes a computer readable storage medium, such as a computer read-only memory ROM, a random access memory RAM, a magnetic disk or an optical disk.

[0145] An embodiment of the present application further provides a chip, which includes a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is used to run programs or instructions to implement the various processes of the above-mentioned method embodiment, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0146] An embodiment of the present application provides a computer program product, which is stored in a storage medium. The program product is executed by at least one processor to implement the various processes of the above-mentioned method embodiment and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0147] It should be noted that, in this article, the terms "comprise", "include" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise one..." do not exclude the presence of other identical elements in the process, method, article or device including the element. In addition, it should be pointed out that the scope of the methods and devices in the embodiments of the present application is not limited to performing functions in the order shown or discussed, and may also include performing functions in a substantially simultaneous manner or in reverse order according to the functions involved, for example, the described method may be performed in an order different from that described, and various steps may also be added, omitted, or combined. In addition, the features described with reference to certain examples may be combined in other examples.

[0148] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a computer software product, which is stored in a storage medium (such as ROM / RAM, a magnetic disk, or an optical disk), and includes a number of instructions for enabling a terminal (which can be a mobile phone, a computer, a server, or a network device, etc.) to execute the methods described in each embodiment of the present application.

[0149] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A power supply method for an electronic device, characterized in that: include: Acquire a first voltage of a target module in an electronic device at a target frequency, where the first voltage is a voltage obtained based on a preset voltage of the target module at the target frequency, and the target module is a module powered by a power management integrated circuit PMIC module; Acquire a second voltage of the target module at the target frequency, where the second voltage is a voltage obtained by performing a voltage test on the target module; When the second voltage is lower than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage.

2. The method according to claim 1, characterized in that The obtaining of a first voltage of a target module in the electronic device at a target frequency includes: Acquire a power supply voltage output by the PMIC module to the target module, where the power supply voltage is obtained based on a preset voltage of the target module at the target frequency; The power supply voltage is determined as a first voltage of the target module at a target frequency.

3. The method according to claim 1, characterized in that The obtaining a second voltage of the target module at the target frequency includes: A second voltage of the target module at a target frequency is obtained from a target element; wherein the target element stores a voltage obtained by performing a voltage test on the target module at each frequency of a plurality of frequencies, wherein the plurality of frequencies include the target frequency.

4. The method according to claim 3, characterized in that The target element is a universal flash memory UFS, and obtaining the second voltage of the target module at the target frequency from the target element includes: The CPU obtains a target voltage matching the target frequency from the UFS through the UFS controller, and uses the target voltage as a second voltage of the target module at the target frequency.

5. The method according to claim 3, characterized in that: The target element is a lookup table LUT; and obtaining the second voltage of the target module at the target frequency from the target element includes: A target voltage matching the target frequency is acquired from the LUT, and the target voltage is used as a second voltage of the target module at the target frequency.

6. The method according to claim 5, characterized in that The LUT is arranged in an integrated circuit IC chip, and the IC chip includes a peripheral device interconnect bus PCIe interface, an analog-to-digital converter and a serial peripheral device management interface SPMI controller; Among them, the PCIe interface is connected to the target module and is used to obtain the target frequency of the target module; the analog-to-digital converter is connected to the buck BUCK interface of the PMIC module and is used to obtain the power supply voltage output by the PMIC module to the target module as the first voltage; the SPMI controller is connected to the control end of the PMIC module and is used to convert the second voltage into the SPMI format.

7. The method according to claim 3, characterized in that The target module is a module whose operating voltage remains fixed as the frequency changes; before obtaining the second voltage of the target module at the target frequency, the method further includes: When the target module operates at the target frequency as the operating frequency and at the preset voltage as the operating voltage, performing a voltage test on the target module; If the target module can pass the voltage test, lower the operating voltage of the target module, and continue to perform voltage test on the target module until a minimum test voltage at which the target module can pass the voltage test is obtained; The lowest test voltage is used as a second voltage of the target module at the target frequency and stored in the target component.

8. The method according to claim 3, characterized in that The target module is a module supporting dynamic voltage frequency adjustment DVFS or a module supporting adaptive voltage regulation AVS; Before acquiring the second voltage of the target module at the target frequency, the method further includes: When the target module operates at the target frequency as the operating frequency and at the preset voltage as the operating voltage, performing a voltage test on the target module; If the target module can pass the voltage test, lower the operating voltage of the target module, and continue to perform voltage test on the target module until a minimum target voltage at which the target module can pass the voltage test is obtained; Switching the operating frequency of the target module from the target frequency to a maximum frequency; When the target module operates at the highest frequency as the operating frequency and at the lowest target voltage as the operating voltage, performing a voltage test on the target module; In the case that the target module cannot pass the voltage test, gradually increasing the operating voltage of the target module, and continuing to perform voltage tests on the target module until a minimum test voltage at which the target module can pass the voltage test is obtained; The lowest test voltage is used as a second voltage of the target module at the target frequency and stored in the target component.

9. The method according to claim 1, characterized in that: The target module is a module supporting AVS; the method further comprises: When the second voltage is greater than the first voltage, the PMIC module is controlled to supply power to the target module based on the second voltage.

10. An electronic device, characterized in that: The method comprises a processing element and a storage element, wherein the storage element stores a program or instruction running on the processing element, and when the program or instruction is executed by the processing element, the steps of the method according to any one of claims 1 to 9 are implemented.

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