Voltage sag analysis processing method and device

Abstract

The invention discloses a voltage sag analysis processing method and device. The method comprises the following steps: acquiring voltage sampling data of a target industrial system in a voltage sag process; determining a voltage sag amplitude, voltage sag duration and a voltage sag energy index according to the sampling data, wherein the voltage sag energy index reflects energy loss in the voltage sag process; according to the voltage sag amplitude, the voltage sag duration and the voltage sag energy index, a first vector reflecting the voltage sag state, a second vector reflecting the voltage sag severity degree and a third vector reflecting the influence of the voltage sag on the industrial process parameters are determined, each of the first vector, the second vector and the third vector comprises components of an amplitude dimension, a time dimension and an energy dimension; and determining a voltage sag processing measure according to the first vector, the second vector and the third vector. The technical problem that the processing result is affected due to the fact that the state analysis of the voltage sag is not comprehensive in the prior art is solved.

Description

Technical Field

[0001] The present application relates to the technical field of power analysis, and in particular to a method and device for analyzing and processing a voltage sag. Background Art

[0002] In the IEEE (Institute of Electrical and Electronics Engineers) standard, voltage sag is defined as: the effective value of the power frequency voltage at a certain point in the power supply system suddenly drops to 10% to 90% of the rated value, and then returns to normal after a short duration of 10ms to 1min. With the rapid development of semiconductor technology, programmable logic controllers, adjustable speed drives, computers, AC contactors and other semiconductor-based sensitive devices have been widely used in industrial processes. This phenomenon has caused industrial processes to become more and more sensitive to voltage sags. In the case that industrial processes are increasingly affected by voltage, it is of great significance to conduct in-depth research on voltage sags.

[0003] At present, when analyzing the voltage sag state and evaluating the severity of the voltage sag, two characteristic parameters, voltage duration and voltage sag amplitude, are usually considered. However, the waveforms of voltage sags caused by different reasons are different. For example, the voltage sag caused by short-circuit faults are mostly rectangular voltage sags, which may appear in the form of three-phase, two-phase and single-phase voltage sags. The voltage sag caused by motor starting or transformer excitation presents a non-rectangular effective value curve due to the slow voltage recovery process. Therefore, it is impossible to fully describe the voltage sag by relying solely on these two characteristic parameters. In addition, due to the large differences in the voltage tolerance of different types of equipment, the severity of the same voltage sag for different types of equipment will also vary greatly. The current analysis scheme does not study the severity of the impact on different equipment separately. And when analyzing the severity of voltage sags, most analysis methods are currently limited to the sag level and the equipment level, lacking analysis from the level of the entire industrial process.

[0004] To address the above-mentioned problems, no effective solution has been proposed yet. Summary of the invention

[0005] The embodiments of the present application provide a method and device for analyzing and processing a voltage sag, so as to at least solve the technical problem in the related art that the state analysis of a voltage sag is incomplete and affects the processing result.

[0006] According to one aspect of an embodiment of the present application, a voltage sag analysis and processing method is provided, including: obtaining voltage sampling data of a target industrial system during a voltage sag; determining a voltage sag amplitude, a voltage sag duration, and a voltage sag energy index based on the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag; determining a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on industrial process parameters based on the voltage sag amplitude, the voltage sag duration, and the voltage sag energy index, wherein the first vector, the second vector, and the third vector all include: components of an amplitude dimension, a time dimension, and an energy dimension; and determining voltage sag processing measures for the target industrial system based on the first vector, the second vector, and the third vector.

[0007] Optionally, determining the voltage sag amplitude, voltage sag duration and voltage sag energy index according to the voltage sampling data includes: determining the voltage minimum value in the voltage sampling data as the voltage sag amplitude; determining the voltage sag duration according to the time of the starting point and the ending point of the voltage sag in the voltage sampling data; and calculating the voltage sag energy index according to the following formula: Where a, b, c represent the three-phase voltage, M is the number of sampling points during the duration of the voltage sag, ΔT is the sampling interval, V vs.j (k) is the per unit value of the effective value of the voltage of the j-th phase at the k-th sampling point.

[0008] Optionally, the process of determining the first vector includes: determining the first vector as: VVS=[t vs ,V vs ,E vs ] T , where t vs is the duration of voltage sag, V vs is the voltage sag amplitude, VVS is the first vector.

[0009] Optionally, the second vector includes: a plurality of fourth vectors corresponding to a plurality of devices in the target industrial system and used to reflect the severity of the impact of the voltage sag on the devices, and a fifth vector used to reflect the severity of the impact of the voltage sag on the industrial process.

[0010] Optionally, the process of determining the fourth vector includes: for each device, obtaining a voltage tolerance curve of the device; and determining that the time dimension component in the fourth vector corresponding to the device is: Determine the voltage dimension component in the fourth vector corresponding to the device: Determine the energy dimension component in the fourth vector corresponding to the device: Determine the fourth vector corresponding to the device: In the formula, E ref =3[1-V min ] 2 t max , represents the reference energy index, t min ,t max 、V min 、V max are the per unit values ​​of the minimum voltage sag duration, the maximum voltage sag duration, the minimum voltage sag amplitude and the maximum voltage sag amplitude in the voltage tolerance curve, respectively. VEVSS is the fourth vector corresponding to the device. They are respectively the time dimension component, voltage dimension component, and energy dimension component in the fourth vector corresponding to the device.

[0011] Optionally, the process of determining the fifth vector includes: determining a voltage dimension component in the fifth vector as: Determine the time dimension component in the fifth vector as: Determine the energy dimension component in the fifth vector as: Determine the fifth vector as: Where V curve (t vs ) represents the SEMI F47 curve with t vs Voltage sag amplitude for voltage sag events of the same duration, t curve (V vs ) indicates the SEMI F47 curve with V vs The voltage sag duration of voltage sag events with the same amplitude, VPVSS is the fifth vector, They are respectively the voltage dimension component, time dimension component, and energy dimension component in the fifth vector.

[0012] Optionally, the process of determining the third vector includes: obtaining process immunity times of multiple industrial process parameters, determining the industrial process parameter with the smallest process immunity time as the target process parameter, and determining the smallest process immunity time as the target process immunity time; determining the time dimension component in the third vector as: Determine the voltage dimension component in the third vector as: Determine the energy dimension component in the third vector as: Determine the third vector: VPS = [ε P ,γ P ,κ P ] T , where P nom is the rated value of the target process parameter, P vs is the parameter value of the target process parameter at the end of the voltage sag, P limitis the limiting threshold of the target process parameter, PIT pro is the target process immunity time, VPS is the third vector, ε P , γ P , κ P They are respectively the time dimension component, voltage dimension component, and energy dimension component in the third vector.

[0013] Optionally, voltage sag processing measures for a target industrial system are determined based on the first vector, the second vector and the third vector, including: for the first vector or the second vector or the third vector, determining first weight values ​​corresponding to the amplitude dimension component, the time dimension component and the energy dimension component in the first vector or the second vector or the third vector; weighted summing the amplitude dimension component, the time dimension component and the energy dimension component according to the first weight value to obtain a vector score of the first vector or the second vector or the third vector; determining second weight values ​​corresponding to the first vector, the second vector and the third vector; weighted summing the vector scores of the first vector, the second vector and the third vector according to the second weight value to obtain a target system score of the target industrial system; and determining a target voltage sag processing measure corresponding to the target system score from a policy library, wherein the policy library stores different voltage sag processing measures corresponding to different system scores.

[0014] According to another aspect of an embodiment of the present application, a voltage sag analysis and processing device is also provided, including: an acquisition module, used to acquire voltage sampling data of a target industrial system during a voltage sag; a first determination module, used to determine a voltage sag amplitude, a voltage sag duration and a voltage sag energy index based on the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag; a second determination module, used to determine a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on industrial process parameters based on the voltage sag amplitude, the voltage sag duration and the voltage sag energy index, wherein the first vector, the second vector and the third vector all include: components of an amplitude dimension, a time dimension and an energy dimension; a third determination module, used to determine voltage sag processing measures for the target industrial system based on the first vector, the second vector and the third vector.

[0015] According to another aspect of an embodiment of the present application, an electronic device is further provided, comprising: a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to execute the above-mentioned voltage sag analysis and processing method through the computer program.

[0016] In the embodiment of the present application, the voltage sampling data of the target industrial system during the voltage sag is first obtained and analyzed. Through these data, the voltage sag amplitude and voltage sag duration are accurately determined, and the voltage sag energy index reflecting the energy loss of the system is calculated; further, the voltage sag amplitude, voltage sag duration and voltage sag energy index are integrated to construct three key vectors: the first vector describes the voltage sag state of the system in detail; the second vector evaluates the severity of the voltage sag; the third vector deeply analyzes the specific impact of the sag on the industrial process parameters. These vectors cover the three key dimensions of amplitude, time and energy, and provide the system with a comprehensive description of the voltage sag characteristics. Finally, based on the in-depth analysis of these vectors, accurate voltage sag processing measures can be formulated, thereby effectively solving the technical problem of incomplete analysis of the state of voltage sags in related technologies, which affects the processing results. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0018] Figure 1 is a flow chart of an optional voltage sag analysis and processing method according to an embodiment of the present application;

[0019] Figure 2 is a schematic diagram of an optional voltage tolerance curve and an equal energy index curve according to an embodiment of the present application;

[0020] Figure 3 is a schematic diagram of an optional process parameter variation curve and energy strain relationship according to an embodiment of the present application;

[0021] Figure 4 is a schematic structural diagram of an optional voltage sag analysis and processing device according to an embodiment of the present application;

[0022] Figure 5 It is a schematic diagram of the structure of an optional electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0023] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present application.

[0024] It should be noted that the terms "first", "second", etc. in the specification, claims and drawings of the present application are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0025] In order to better understand the embodiments of the present application, some nouns or terms that appear in the description of the embodiments of the present application are first translated and explained as follows:

[0026] Process Immunity Time (PIT): The time interval from the start of a voltage sag to the time when a process parameter exceeds the allowable limit.

[0027] Per unit value of voltage effective value: In the power system, it is used to convert the actual voltage value into a dimensionless relative value to facilitate the comparative calculation of different systems and equipment.

[0028] Example 1

[0029] According to an embodiment of the present application, a voltage sag analysis and processing method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0030] Figure 1 is a flow chart of a voltage sag analysis and processing method provided in an embodiment of the present application, such as Figure 1 As shown, the method comprises the following steps:

[0031] Step S102, obtaining voltage sampling data of the target industrial system during a voltage sag;

[0032] Step S104, determining a voltage sag amplitude, a voltage sag duration, and a voltage sag energy index according to the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag process;

[0033] Step S106, determining a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on the industrial process parameters according to the voltage sag amplitude, the voltage sag duration, and the voltage sag energy index, wherein the first vector, the second vector, and the third vector all include: components of the amplitude dimension, the time dimension, and the energy dimension;

[0034] Step S108, determining a voltage sag processing measure for the target industrial system according to the first vector, the second vector and the third vector.

[0035] The following describes the various steps of the voltage sag analysis and processing method in conjunction with a specific implementation process.

[0036] In the power system, under ideal continuous conditions, the calculation of the single-phase voltage sag energy index can be obtained by integrating the voltage RMS value. The calculation formula is as follows:

[0037]

[0038] In the above formula, V vs.j (t) is the per unit value of the effective value of the voltage of the jth phase at time t, t vs is the duration of voltage sag.

[0039] However, in practical applications, since the function of a continuous voltage signal is difficult to obtain directly, a series of discrete data points are usually obtained through sampling. These data points represent the voltage values ​​within a specific time interval. By calculating these sampled data, the energy loss of voltage sag within a certain period of time, that is, the voltage sag energy index, can be obtained. The specific calculation formula is as follows:

[0040]

[0041] a, b, c represent the voltage of three phases, M is the number of sampling points during the duration of voltage sag, ΔT is the sampling interval, V vs.j (k) is the per unit value of the voltage effective value of the j-th phase voltage at the k-th sampling point. For the three-phase balanced voltage, the voltage and current of each phase are the same, and the single-phase voltage sag energy index multiplied by 3 can get the total voltage sag energy index. For the rectangular sag, the voltage sag amplitude and voltage sag duration are known, and the above formula can be directly simplified to:

[0042] E vs =3[1-V vs ] 2 t vs

[0043] In the above formula, V vs is the voltage sag amplitude, tvs is the duration of voltage sag.

[0044] According to the above-mentioned voltage sag amplitude, voltage sag duration and voltage sag energy index, a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on the industrial process parameters are determined, wherein the first vector, the second vector and the third vector all include: components of amplitude dimension, time dimension and energy dimension.

[0045] Optionally, the voltage sag vector based on the voltage sag energy indicator, that is, the first vector VVS, can be expressed as:

[0046] VVS=[t vs ,V vs ,E vs ] T

[0047] As an optional implementation, the present application proposes a second vector that reflects the severity of a voltage sag based on a voltage sag curve, wherein a plurality of fourth vectors corresponding to a plurality of devices in a target industrial system are proposed from a device level to reflect the severity of the impact of a voltage sag on the devices, and a fifth vector that reflects the severity of the impact of a voltage sag on an industrial process is proposed from a process level.

[0048] In the process of obtaining multiple fourth vectors corresponding to multiple devices in the target industrial system and used to reflect the severity of the impact of the voltage sag on the devices, the following method may be used:

[0049] According to the existing indicators, the time dimension component in the fourth vector It can be calculated by the following formula:

[0050]

[0051] The voltage dimension component in the fourth vector It can be calculated by the following formula:

[0052]

[0053] In the above formula, t min ,t max 、V min 、V max They are respectively the minimum value of voltage sag duration, the maximum value of voltage sag duration, the minimum value of voltage sag amplitude, and the maximum value of voltage sag amplitude in the voltage tolerance curve.

[0054] Figure 2is a schematic diagram of the voltage tolerance curve and the equal energy index curve. In the figure, curves 1 and 2 are the voltage tolerance curves, curves 3 and 4 are the equal energy index curves, and T min and T max They represent the minimum and maximum voltage sag duration in the voltage tolerance curve, V min and V max They represent the minimum voltage sag amplitude and the maximum voltage sag amplitude in the voltage tolerance curve. By analyzing the figure, it can be found that when the voltage sag energy index is greater than the inflection point of curve 1 (I 1 When the energy index of the equipment is greater than the voltage drop, the equipment may fail due to the voltage drop, but I 1 The iso-energy index curve (curve 3) is located outside curve 1, such as Figure 2 As shown in Figure 2, it not only includes the points in area B (including area B1, B2 and B3) and area C, but also includes some points in area A. Therefore, selecting curve 3 as the reference energy index curve will cause a large error. 2 The equal energy index curve (curve 4) can not only include all of area C, but also include some sag points with higher energy index in areas B2 and B3. Although curve 4 does not include area B1, which may cause a certain error, the voltage sag energy index and voltage sag severity in area B1 are relatively low, so this error will be relatively small. Therefore, I is selected. 2 Point is used as the reference energy index point, according to V min and t max The reference energy index E can be obtained ref :

[0055] E ref =3[1-V min ] 2 t max

[0056] Then the energy dimension component in the fourth vector is for:

[0057]

[0058] Finally, the fourth vector VEVSS corresponding to the device can be obtained as:

[0059]

[0060] In the process of obtaining the fifth vector for reflecting the severity of the impact of voltage sag on the industrial process, the following method can be used:

[0061] At present, various semiconductor-based sensitive devices are increasingly being used in industrial processes, and the technical specification SEMI F47-0200 for semiconductor devices is gradually becoming the technical specification for the entire industrial process's ability to resist voltage sag interference. Due to the voltage sag severity index Se recommended by IEEE, and the SEMI F47 curve is selected as the reference curve of Se, the voltage dimension component of the fifth vector can be obtained It is expressed as:

[0062]

[0063] In the above formula, V curve (t vs ) represents the SEMI F47 curve with t vs The voltage sag amplitude of voltage sag events with the same duration.

[0064] Taking into account the influence of voltage sag amplitude, the time dimension component of the fifth vector for:

[0065]

[0066] In the above formula, t curve (V vs ) indicates the SEMI F47 curve with V vs The voltage sag duration of voltage sag events with the same amplitude is vs With t curve When the ratio is greater than 1, is 1.

[0067] For the SEMI F47 curve, when precise calculation is not required, some literature uses it as a standard for judging whether an industrial process is interrupted after being affected by a voltage sag. However, since the SEMI F47 curve is not the actual voltage tolerance curve of sensitive equipment (or process), assuming that all sensitive equipment meets the requirements of SEMI F47-0200, the voltage tolerance curve of sensitive equipment (or process) is located below the SEMI F47 curve, and the farther away from the SEMI F47 curve, the stronger its voltage sag capability. Based on the above analysis, it can be found that using the SEMI F47 curve as a standard for judging sensitive equipment (or process) will inevitably result in errors in the judgment results, and such errors are difficult to evaluate and eliminate. In addition, according to the analysis, only using the voltage sag duration and voltage sag amplitude to evaluate the state of sensitive equipment (or process) after being affected by a voltage sag will also bring errors. It is necessary to further consider the role of the voltage sag energy index to reduce the error and improve the evaluation accuracy. Therefore, at the process level, this application proposes a method based on the SEMI F47 curve and considering the severity of the impact of voltage sag on the industrial process based on the voltage sag energy index, where the energy dimension component in the fifth vector is for:

[0068]

[0069] In the formula, It indicates the maximum energy loss caused when the system voltage sag amplitude is 0. By analyzing the above formula, it can be found that it can not only indicate the degree of energy loss during the voltage sag process, but also the average value and loss speed of energy loss during the voltage sag process.

[0070] After obtaining the voltage dimension component, time dimension component, and energy dimension component of the fifth vector, it can be determined that the fifth vector VPVSS is expressed as:

[0071]

[0072] In the process of obtaining the third vector reflecting the influence of voltage sag on industrial process parameters, the following steps may be adopted:

[0073] For an industrial process, it must include multiple physical parameters such as speed, temperature, humidity, pressure, speed, etc. Different physical parameters have different characteristics, and the speed at which they deviate from the rated value of the process parameter after being affected by voltage sag will also be different. In addition, the rated value of the process parameter under different physical parameters and the limit threshold of the process parameter are also different. Based on the above reasons, the process immunity time of different physical parameters must be different. During the production operation, any physical parameter exceeding the limit will cause problems in the quality of the products produced by the industrial process.

[0074] As an optional implementation, when voltage sag occurs, the industrial process is affected by the voltage sag, and the industrial process parameters deviate from the rated values. In order to accurately describe the degree and speed of the deviation of the industrial process parameters, this paper proposes a third vector that reflects the impact of voltage sag on the industrial process parameters, namely VPS = [ε P ,γ P ,κ P ] T , where ε P , γ P , κ P They are respectively the time dimension component, voltage dimension component, and energy dimension component in the third vector.

[0075] The process of determining the third vector is: obtaining process immunity times of multiple industrial process parameters, determining the industrial process parameter with the smallest process immunity time as the target process parameter, and determining the smallest process immunity time as the target process immunity time. Figure 3 is a schematic diagram of the relationship between process parameter change curve and energy strain, where t 1 is the time when the voltage sag occurs, t 2 is the moment when the process parameter crosses the limit threshold, P nom is the rated value of the target process parameter, P limit is the limiting threshold of the target process parameter, Δt is the process response delay, and the process immunity time PIT is defined as follows: t 2 -t 1 .

[0076] The voltage sag amplitude V vs When the voltage sag lasts longer, the process parameter deviation is greater. Therefore, the time dimension component of the third vector VPS is positively correlated with the process parameter offset. Because the dimensions of various physical quantities are not uniform, the process parameter offset must be normalized for the convenience of subsequent analysis. Based on the above analysis, the present invention normalizes the time dimension component ε of the third vector P The definition is as follows:

[0077]

[0078] In the above formula, P nom is the rated value of the target process parameter, P vs is the parameter value of the target process parameter at the end of the voltage sag, P limit is the limiting threshold of the target process parameter, P nom -P vs Indicates the deviation of process parameters.

[0079] According to the relationship between voltage and process parameters, it can be found that the voltage sag amplitude V vsThe lower it is, the deeper the sag is, the faster the process parameter shifts, and the smaller the value of the process immunity time is. The two are in direct proportion. Therefore, the value of the process immunity time is selected here to reflect the voltage dimension component of the third vector. To ensure that the dimension of this component is 1, the voltage sag duration t is selected. vs The reciprocal of is taken as the coefficient, that is, the voltage dimension component γ of the third vector P for:

[0080]

[0081] In the above formula, PIT pro is the minimum target process immunity time, PIT pro =min{PIT 1 ,PIT 2 ,PIT 3 ...}, PIT 1 ,PIT 2 ,PIT 3 The ratio is PIT value of physical parameter 1, physical parameter 2 and physical parameter 3.

[0082] For a voltage sag duration of t vs voltage sag, assuming that the process parameter drops to P at the end of the voltage sag vs ,like Figure 3 As shown in the figure, according to the influence of the voltage sag amplitude on the parameter change curve, the change of the voltage sag amplitude will cause the change of the concave and convex degree of the arc BE, thereby causing the change of the area of ​​the arc side triangle BCE. For the duration of the voltage sag, its change will cause point E to move up and down along the arc BF, and further cause the area of ​​the arc side triangle BCE to change. Analysis of the voltage sag duration t vs The voltage sag amplitude V vs Changes in voltage sag energy index E vs It is not difficult to find that the influence trend of the two on the voltage sag energy index is consistent with the influence trend on the area of ​​the arc triangle BCE. Therefore, this application selects the area of ​​the arc triangle BCE to reflect the energy dimension component in the third vector. In order to ensure that the dimension of this component is 1, the area of ​​the arc triangle BDF is selected as a reference, and the energy dimension component in the third vector is obtained as follows:

[0083]

[0084] In the above formula, S BCE and S BDF are the areas of arc-side triangles BCE and BDF respectively. BCE and S BDF It is difficult to calculate accurately at present. To simplify the calculation, the areas SACE and SADE of triangles ACE and ADF are used here to replace SBCE and S BDF ,Right now:

[0085]

[0086] In the above formula:

[0087]

[0088] That is, the energy dimension component κ in the third vector P Finally it can be expressed as:

[0089]

[0090] From the time dimension component, voltage dimension component, and energy dimension component in the third vector, the third vector is obtained as follows: VPS = [ε P ,γ P ,κ P ] T .

[0091] Based on the above-mentioned first vector, second vector and third vector, the voltage sag processing measures for the target industrial system are determined, and the determination process of the processing measures can be carried out in the following manner: first, for the first vector or the second vector or the third vector, determine the first weight values ​​corresponding to the amplitude dimension component, the time dimension component and the energy dimension component in the first vector or the second vector or the third vector; then, perform weighted summation on the amplitude dimension component, the time dimension component and the energy dimension component according to the first weight value to obtain the vector score of the first vector or the second vector or the third vector; at the same time, determine the second weight values ​​corresponding to the first vector, the second vector and the third vector; and, perform weighted summation on the vector scores of the first vector, the second vector and the third vector according to the second weight value to obtain the target system score of the target industrial system; finally, determine the target voltage sag processing measures corresponding to the target system score from the policy library, wherein the policy library stores different voltage sag processing measures corresponding to different system scores, for example: installing voltage sag mitigation equipment, adjusting industrial processes, regular inspection and maintenance, etc.

[0092] In the embodiment of the present application, the voltage sampling data of the target industrial system during the voltage sag is first obtained and analyzed. Through these data, the voltage sag amplitude and voltage sag duration are accurately determined, and the voltage sag energy index reflecting the energy loss of the system is calculated; further, the voltage sag amplitude, voltage sag duration and voltage sag energy index are integrated to construct three key vectors: the first vector describes the voltage sag state of the system in detail; the second vector evaluates the severity of the voltage sag; the third vector deeply analyzes the specific impact of the sag on the industrial process parameters. These vectors cover the three key dimensions of amplitude, time and energy, and provide the system with a comprehensive description of the voltage sag characteristics. Finally, based on the in-depth analysis of these vectors, accurate voltage sag processing measures can be formulated, thereby effectively solving the technical problem of incomplete analysis of the state of voltage sags in related technologies, which affects the processing results.

[0093] Example 2

[0094] According to an embodiment of the present application, a voltage sag analysis and processing device for implementing the voltage sag analysis and processing method in Embodiment 1 is also provided. Figure 4 As shown, the voltage sag analysis and processing device at least includes: an acquisition module 41, a first determination module 42, a second determination module 43, and a third determination module 44, wherein:

[0095] An acquisition module 41 is used to acquire voltage sampling data of a target industrial system during a voltage sag;

[0096] A first determination module 42 is used to determine the voltage sag amplitude, voltage sag duration and voltage sag energy index according to the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag process;

[0097] A second determination module 43 is used to determine a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on the industrial process parameters according to the voltage sag amplitude, the voltage sag duration, and the voltage sag energy index, wherein the first vector, the second vector, and the third vector all include: components of the amplitude dimension, the time dimension, and the energy dimension;

[0098] The third determination module 44 is used to determine a voltage sag processing measure for the target industrial system according to the first vector, the second vector and the third vector.

[0099] The functions of each module of the voltage sag analysis and processing device are described below in conjunction with a specific implementation process.

[0100] First, the acquisition module obtains a series of discrete data points through sampling, which represent the voltage values ​​within a specific time interval.

[0101] The first determination module determines the voltage sag amplitude and voltage sag duration according to the voltage sampling data and calculates a voltage sag energy index, where the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag process.

[0102] Among them, for the voltage sag energy index, the corresponding calculation can be performed by these voltage sampling data. The specific calculation formula is as follows:

[0103]

[0104] In the above formula, a, b, c represent the three-phase voltage, M is the number of sampling points during the duration of the voltage sag, ΔT is the sampling interval, V vs.j (k) is the per unit value of the voltage RMS value of the j-th phase voltage at the k-th sampling point. For three-phase balanced voltage, the voltage and current of each phase are the same. The single-phase voltage sag energy index is multiplied by 3 to get the total voltage sag energy index. For rectangular sag, the voltage sag amplitude V is known. vs and voltage sag duration t vs , the above formula can be directly simplified to:

[0105] E vs =3[1-(V vs )] 2 t vs

[0106] The second determination module determines a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on industrial process parameters based on the voltage sag amplitude, the voltage sag duration, and the voltage sag energy index, wherein the first vector, the second vector, and the third vector all include components of amplitude dimension, time dimension, and energy dimension.

[0107] The first vector is represented as:

[0108] VVS=[t vs ,V vs ,E vs ] T

[0109] As an optional embodiment, the present application proposes a second vector that reflects the severity of a voltage sag based on a voltage sag curve, and the second vector includes: a plurality of fourth vectors VEVSS corresponding to a plurality of devices in a target industrial system, for reflecting the severity of the impact of a voltage sag on the devices, and a fifth vector VPVSS for reflecting the severity of the impact of a voltage sag on an industrial process.

[0110] In the process of obtaining a plurality of fourth vectors corresponding to a plurality of devices in the target industrial system and used to reflect the severity of the impact of the voltage sag on the devices, the time dimension component in the fourth vector It can be calculated by the following formula:

[0111]

[0112] The voltage dimension component in the fourth vector It can be calculated by the following formula:

[0113]

[0114] In the above formula, t min ,t max 、V min 、V max They are the minimum voltage sag duration, maximum voltage sag duration, minimum voltage sag amplitude, and maximum voltage sag amplitude in the voltage tolerance curve respectively.

[0115] According to V min and t max The reference energy index Eref can be obtained:

[0116] E ref =3[1-V min ] 2 t max

[0117] Then the energy dimension component in the fourth vector is for:

[0118]

[0119] Finally, the fourth vector VEVSS corresponding to the device can be obtained as:

[0120]

[0121] The fifth vector can be obtained by:

[0122] In the process of obtaining the fifth vector for reflecting the severity of the impact of voltage sag on the industrial process, the following method can be used:

[0123] At present, various semiconductor-based sensitive devices are increasingly being used in industrial processes, and the technical specification SEMI F47-0200 for semiconductor devices is gradually becoming the technical specification for the entire industrial process's ability to resist voltage sag interference. Due to the voltage sag severity index Se recommended by IEEE, and the SEMI F47 curve is selected as the reference curve of Se, the voltage dimension component of the fifth vector can be obtained It is expressed as:

[0124]

[0125] In the above formula, V curve (t vs ) represents the SEMI F47 curve with t vs The voltage sag amplitude of voltage sag events with the same duration.

[0126] Taking into account the influence of voltage sag amplitude, the time dimension component of the fifth vector for:

[0127]

[0128] In the above formula, t curve (V vs ) indicates the SEMI F47 curve with V vs The voltage sag duration of voltage sag events with the same amplitude is vs With t curve When the ratio is greater than 1, is 1.

[0129] Energy dimension component in the fifth vector for:

[0130]

[0131] In the formula, It indicates the maximum energy loss caused when the system voltage sag amplitude is 0. By analyzing the above formula, it can be found that it can not only indicate the degree of energy loss during the voltage sag process, but also the average value and loss speed of energy loss during the voltage sag process.

[0132] After obtaining the voltage dimension component, time dimension component, and energy dimension component of the fifth vector, it can be determined that the fifth vector VPVSS is expressed as:

[0133]

[0134] As an optional implementation, when voltage sag occurs, the industrial process is affected by the voltage sag, and the industrial process parameters deviate from the rated values. In order to accurately describe the degree and speed of the deviation of the industrial process parameters, this paper proposes a third vector that reflects the impact of voltage sag on the industrial process parameters, namely VPS = [ε P ,γ P ,κ P ] T , where ε P , γ P , κ P They are respectively the time dimension component, voltage dimension component, and energy dimension component in the third vector.

[0135] The process of determining the third vector is: obtaining process immunity times of multiple industrial process parameters, determining the industrial process parameter with the smallest process immunity time as the target process parameter, and determining the smallest process immunity time as the target process immunity time.

[0136] When the voltage sag amplitude is constant, the longer the duration, the greater the deviation of the process parameter. Therefore, the time dimension component of the third vector is positively correlated with the process parameter offset. Because the dimensions of various physical quantities are not uniform, the process parameter offset must be normalized for the convenience of subsequent analysis. Based on the above analysis, the present invention normalizes the time dimension component ε of the third vector. P The definition is as follows:

[0137]

[0138] In the above formula, P nom is the rated value of the target process parameter, P vs is the parameter value of the target process parameter at the end of the voltage sag, P limit is the limiting threshold of the target process parameter, P nom -P vs Indicates the deviation of process parameters.

[0139] According to the relationship between voltage and process parameters, it can be found that the lower the voltage sag amplitude, that is, the deeper the sag, the faster the process parameter offset, and the smaller the value of the process immunity time. The two are in a proportional relationship. Therefore, the value of the process immunity time is selected here to reflect the time-voltage dimension component of the third vector. In order to ensure that the dimension of this component is 1, the voltage sag duration t is selected. vs The reciprocal of is taken as the coefficient, that is, the voltage dimension component γ in the third vector P for:

[0140]

[0141] In the above formula, PIT pro is the minimum target process immunity time, PIT pro =min{PIT1 ,PIT 2 ,PIT 3 ...}, PIT 1 ,PIT 2 ,PIT 3 The ratio is PIT value of physical parameter 1, physical parameter 2 and physical parameter 3.

[0142] For a voltage sag duration of t vs If the process parameter drops to P at the end of the temporary drop, vs ,like Figure 3 As shown in the figure, according to the influence of the voltage sag amplitude on the parameter change curve, the change of the voltage sag amplitude will cause the change of the concave and convex degree of the arc BE, thereby causing the change of the area of ​​the arc side triangle BCE. For the duration of the voltage sag, its change will cause point E to move up and down along the arc BF, and further cause the area of ​​the arc side triangle BCE to change. Analysis of the voltage sag duration t vs The voltage sag amplitude V vs Changes in voltage sag energy index E vs It is not difficult to find that the influence trend of the two on the voltage sag energy index is consistent with the influence trend on the area of ​​the arc triangle BCE. Therefore, this application selects the area of ​​the arc triangle BCE to reflect the energy dimension component in the third vector. In order to ensure that the dimension of this component is 1, the area of ​​the arc triangle BDF is selected as a reference, and the energy dimension component in the third vector is obtained as follows:

[0143]

[0144] In the above formula, S BCE and S BDF are the areas of arc-side triangles BCE and BDF respectively. BCE and S BDF It is difficult to calculate accurately at present. To simplify the calculation, the areas SACE and SADE of triangles ACE and ADF are used here to replace S BCE and S BDF ,Right now:

[0145]

[0146] In the above formula:

[0147]

[0148] That is, the energy dimension component κ in the third vector P Finally it can be expressed as:

[0149]

[0150] From the time dimension component, voltage dimension component, and energy dimension component in the third vector, the third vector is obtained as follows: VPS = [ε P ,γ P ,κ P ] T .

[0151] The third determination module determines the voltage sag processing measures for the target industrial system based on the above-mentioned first vector, second vector and third vector. The determination process of the processing measures can be carried out in the following manner: first, for the first vector or the second vector or the third vector, determine the first weight values ​​corresponding to the amplitude dimension component, the time dimension component and the energy dimension component in the first vector or the second vector or the third vector; then, perform weighted summation on the amplitude dimension component, the time dimension component and the energy dimension component according to the first weight value to obtain the vector score of the first vector or the second vector or the third vector; at the same time, determine the second weight values ​​corresponding to the first vector, the second vector and the third vector respectively; and, perform weighted summation on the vector scores of the first vector, the second vector and the third vector according to the second weight value to obtain the target system score of the target industrial system; finally, determine the target voltage sag processing measures corresponding to the target system score from the policy library, wherein the policy library stores different voltage sag processing measures corresponding to different system scores, for example: installing voltage sag mitigation equipment, adjusting industrial processes, regular inspection and maintenance, etc.

[0152] It should be noted that the modules in the voltage sag analysis and processing device in the embodiment of the present application correspond one-to-one to the implementation steps of the voltage sag analysis and processing method in Example 1. Since a detailed description has been given in Example 1, some details not reflected in this embodiment can be referred to Example 1 and will not be repeated here.

[0153] Example 3

[0154] According to an embodiment of the present application, a computer program product is further provided. The computer program product includes a computer program. When the computer program is executed by a processor, the voltage sag analysis and processing method in Embodiment 1 is implemented.

[0155] According to an embodiment of the present application, an electronic device is further provided, comprising: a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to execute the voltage sag analysis and processing method in Example 1 through the computer program.

[0156] Specifically, when the computer program is running, the following steps are executed: obtaining voltage sampling data and voltage sag duration of the target industrial system during a voltage sag; determining the voltage sag amplitude, voltage sag duration and voltage sag energy index based on the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag; determining a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on industrial process parameters based on the voltage sag amplitude, voltage sag duration and voltage sag energy index, wherein the first vector, the second vector and the third vector all include: components of amplitude dimension, time dimension and energy dimension; and determining voltage sag processing measures for the target industrial system based on the first vector, the second vector and the third vector.

[0157] As an optional implementation, the electronic device may be in the form of a mobile terminal, a computer terminal or a similar computing device. Figure 5 The hardware structure block diagram of an electronic device for implementing a voltage sag analysis and processing method is shown. Figure 5 As shown, the electronic device 50 may include one or more (502a, 502b, ..., 502n are used to illustrate) processors 502 (the processor 502 may include but is not limited to a processing device such as a microprocessor MCU or a programmable logic device FPGA), a memory 504 for storing data, and a transmission device 506 for communication functions. In addition, it may also include: a display, an input / output interface (I / O interface), a universal serial bus (USB) port (which may be included as one of the ports of the BUS bus), a network interface, a power supply and / or a camera. It can be understood by those skilled in the art that Figure 5 The structure shown is only for illustration and does not limit the structure of the above electronic device. Figure 5 More or fewer components as shown, or with Figure 5 Different configurations shown.

[0158] It should be noted that the one or more processors 502 and / or other data processing circuits described above may generally be referred to herein as "data processing circuits". The data processing circuits may be embodied in whole or in part as software, hardware, firmware, or any other combination thereof. In addition, the data processing circuit may be a single independent processing module, or may be incorporated in whole or in part into any of the other components in the electronic device 50. As described in the embodiments of the present application, the data processing circuit acts as a processor control (e.g., selection of a variable resistor terminal path connected to an interface).

[0159] The memory 504 can be used to store software programs and modules of application software, such as the program instructions / data storage device corresponding to the voltage sag analysis and processing method in the embodiment of the present application. The processor 502 executes various functional applications and data processing by running the software programs and modules stored in the memory 504, that is, to implement the vulnerability detection method of the above-mentioned application. The memory 504 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 504 may further include a memory remotely arranged relative to the processor 502, and these remote memories may be connected to the electronic device 50 via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0160] The transmission device 506 is used to receive or send data via a network. The specific example of the above network may include a wireless network provided by a communication provider of the electronic device 50. In one example, the transmission device 506 includes a network adapter (Network Interface Controller, NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 506 can be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0161] The display may be, for example, a touch screen liquid crystal display (LCD) that enables a user to interact with a user interface of the electronic device 50 .

[0162] The serial numbers of the above embodiments are only for description and do not represent the advantages or disadvantages of the embodiments.

[0163] In the above embodiments of the present application, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, please refer to the relevant description of other embodiments.

[0164] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0165] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed over multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0166] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0167] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or all or part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server or network device, etc.) to perform all or part of the steps of each embodiment method of the present application. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk, etc. Various media that can store program codes.

[0168] The above are only preferred implementations of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A voltage sag analysis and processing method, characterized in that: include: Obtain voltage sampling data of the target industrial system during voltage sag; Determine the voltage sag amplitude, voltage sag duration and voltage sag energy index according to the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag process; Determine, according to the voltage sag amplitude, the voltage sag duration and the voltage sag energy index, a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on industrial process parameters, wherein the first vector, the second vector and the third vector all include: components of amplitude dimension, time dimension and energy dimension; A voltage sag processing measure for the target industrial system is determined according to the first vector, the second vector, and the third vector.

2. The method according to claim 1, characterized in that Determining the voltage sag amplitude, voltage sag duration and voltage sag energy index according to the voltage sampling data includes: Determine the voltage minimum value in the voltage sampling data as the voltage sag amplitude; Determining the duration of the voltage sag according to the time of the starting point and the ending point of the voltage sag in the voltage sampling data; The voltage sag energy index is calculated according to the following formula: Where a, b, and c represent the three-phase voltage, M is the number of sampling points during the duration of the voltage sag, ΔT is the sampling interval, and Vvs.j(k) is the per-unit value of the effective value of the voltage of the j-th phase at the k-th sampling point.

3. The method according to claim 2, characterized in that The process of determining the first vector includes: The first vector is determined as: VVS=[tvs,Vvs,Evs]T In the formula, tv s is the duration of the voltage sag, Vv s is the voltage sag amplitude, and VVS is the first vector.

4. The method according to claim 3, characterized in that The second vector includes: a plurality of fourth vectors corresponding to a plurality of devices in the target industrial system and used to reflect the severity of the impact of the voltage sag on the devices, and a fifth vector used to reflect the severity of the impact of the voltage sag on the industrial process.

5. The method according to claim 4, characterized in that The process of determining the fourth vector includes: For each device, obtaining a voltage tolerance curve of the device; Determine the time dimension component in the fourth vector corresponding to the device as: Determine the voltage dimension component in the fourth vector corresponding to the device as: Determine the energy dimension component in the fourth vector corresponding to the device as: Determine the fourth vector corresponding to the device as: In the formula, E ref =3[1-V min ] 2 t max , represents the reference energy index, t min ,t max 、V min 、V max are the per unit values ​​of the minimum voltage sag duration, the maximum voltage sag duration, the minimum voltage sag amplitude and the maximum voltage sag amplitude in the voltage tolerance curve, respectively; VEVSS is the fourth vector corresponding to the device, They are respectively the time dimension component, voltage dimension component, and energy dimension component in the fourth vector corresponding to the device.

6. The method according to claim 4, characterized in that The process of determining the fifth vector includes: The voltage dimension component in the fifth vector is determined as: The time dimension component in the fifth vector is determined as: The energy dimension component in the fifth vector is determined as: The fifth vector is determined as: Where Vcurv e (tv s ) indicates that the SEMI F47 curve is consistent with tv s Voltage sag amplitude for voltage sag events of the same duration, tcurv e (Vv s ) indicates the SEMI F47 curve with Vv s The voltage sag duration of voltage sag events with the same amplitude, VPVSS is the fifth vector, They are respectively the voltage dimension component, time dimension component, and energy dimension component in the fifth vector.

7. The method according to claim 3, characterized in that The process of determining the third vector includes: Obtaining process immunity time of multiple industrial process parameters, and determining the industrial process parameter with the smallest process immunity time as the target process parameter, and determining the smallest process immunity time as the target process immunity time; The time dimension component in the third vector is determined as: The voltage dimension component in the third vector is determined as: The energy dimension component in the third vector is determined as: The third vector is determined as: VPS=[εp,Yp,κp] Where Pno m is the rated value of the target process parameter, Pv s is the parameter value of the target process parameter at the end of the voltage sag, Plimit is the limit threshold of the target process parameter, PITpro is the target process immunity time, VPS is the third vector, ε P , γ P , κ P They are respectively the time dimension component, voltage dimension component, and energy dimension component in the third vector.

8. The method according to claim 1, characterized in that Determining a voltage sag processing measure for the target industrial system according to the first vector, the second vector, and the third vector includes: For the first vector, the second vector, or the third vector, determine first weight values ​​corresponding to the amplitude dimension component, the time dimension component, and the energy dimension component in the first vector, the second vector, or the third vector, respectively; Performing weighted summation on the amplitude dimension component, the time dimension component, and the energy dimension component according to the first weight value to obtain a vector score of the first vector, the second vector, or the third vector; Determine second weight values ​​corresponding to the first vector, the second vector, and the third vector respectively; performing a weighted summation of the vector scores of the first vector, the second vector, and the third vector according to the second weight value to obtain a target system score of the target industrial system; A target voltage sag processing measure corresponding to the target system score is determined from a policy library, wherein the policy library stores different voltage sag processing measures corresponding to different system scores.

9. A voltage sag analysis and processing device, characterized in that: include: An acquisition module is used to acquire voltage sampling data of a target industrial system during a voltage sag; A first determination module is used to determine a voltage sag amplitude, a voltage sag duration, and a voltage sag energy index according to the voltage sampling data, wherein the voltage sag energy index is used to reflect the energy loss of the target industrial system during the voltage sag process; a second determination module, configured to determine, according to the voltage sag amplitude, the voltage sag duration, and the voltage sag energy index, a first vector reflecting the voltage sag state of the target industrial system, a second vector reflecting the severity of the voltage sag, and a third vector reflecting the impact of the voltage sag on industrial process parameters, wherein the first vector, the second vector, and the third vector all include: components of amplitude dimension, time dimension, and energy dimension; The third determination module is used to determine a voltage sag processing measure for the target industrial system according to the first vector, the second vector and the third vector.

10. An electronic device, characterized in that: include: A memory and a processor, wherein the memory stores a computer program, and the processor is configured to execute the voltage sag analysis and processing method according to any one of claims 1 to 8 through the computer program.

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