Interstellar space environment radio frequency signal test method

Abstract

The device and the method are applied to testing the internal radio-frequency signal of the satellite-borne electronic product in a simulated interstellar space environment. According to the testing method, a clamping type probe and an elastic self-locking type probe are combined, the clamping type probe is firstly used for detecting and positioning room temperature radio frequency signals, and finally the elastic self-locking type probe is used for testing the radio frequency signals of the interstellar space environment. The stress provided by the elastic deformation of the elastic self-locking probe of the elastic self-locking probe is utilized to ensure that the elastic self-locking probe is tightly contacted with a test point, the deformation of an interstellar space environment is compensated, and the radio frequency signal of the test point is reliably and effectively tested. According to the invention, various requirements of radio frequency signal detection, adaptation to shapes of various detected points, direct current blocking, elastic self-locking of a test state, fixation of a probe mounting position, standardization of an SMA coaxial interface and coupling level adjustment are met.

Description

Technical Field

[0001] The invention belongs to the field of radio frequency electronic products and relates to a method for testing internal radio frequency signals of space-borne electronic products under interstellar space environment conditions. Background Art

[0002] The mission comes from onboard electronic products, which are required to work normally in the interstellar space environment.

[0003] In the development of satellite-borne electronic products, it is often necessary to test the internal RF signals of the products in a simulated interstellar space environment to determine the debugging locations and parameter adjustments.

[0004] When conducting fault diagnosis and analysis on satellite-borne electronic products, it is also necessary to test the internal RF signals of the products in a simulated interstellar space environment.

[0005] Usually the effective approach is to solder the test cable leads to the circuit soldering points. After the test signal, debugging or troubleshooting is completed, the circuit needs to be repaired by a professional electrical technician.

[0006] Doing so will cause unnecessary damage to the product's solder joints, delaying the product's development progress. In certain special development stages (for example, when the product is removed from the satellite and returned for inspection), it will increase development risks and delay the satellite's launch progress.

[0007] The specific requirements for the interstellar space environment are: temperature range -25℃~+60℃, vacuum degree normal pressure to 1*10 -4 The confined space between the pa. Summary of the invention

[0008] The technical problem solved by the present invention is: to overcome the shortcomings of the prior art and provide a method for testing radio frequency signals in an interstellar space environment, which is applied to test internal radio frequency signals of satellite-borne electronic products in a simulated interstellar space environment, and solves the problem of welding-free signal detection in a simulated interstellar space environment.

[0009] The technical solution of the present invention is: a method for testing radio frequency signals in an interstellar space environment, comprising: using a clamping probe to test the radio frequency signals of all test points inside a satellite-borne electronic product step by step under room temperature, finding the test points where the radio frequency signals are abnormal, and determining the attenuation value of the attenuator of the elastic self-locking probe according to the maximum signal power value of the test point where the radio frequency signal is abnormal; using the elastic self-locking probe with the attenuation value to test the radio frequency signals at the test points where the radio frequency signals are abnormal inside the satellite-borne electronic product in a simulated interstellar space environment to obtain a signal spectrum.

[0010] The satellite-borne electronic product comprises a radio frequency circuit and a casing structure, the radio frequency circuit is mounted on the casing structure; the internal test point of the satellite-borne electronic product is located on the radio frequency circuit of the satellite-borne electronic product; and there is a flange fixing point on the casing structure of the satellite-borne electronic product.

[0011] The test point where the radio frequency signal is abnormal refers to a test point where the radio frequency signal power is less than 60% of the design value.

[0012] The attenuation value of the attenuator of the elastic self-locking probe is determined, including: when the maximum signal power value of the test point with abnormal radio frequency signal is not greater than 20dBm, the attenuator attenuation value is 3dB; when the maximum signal power value of the test point with abnormal radio frequency signal is greater than 20dBm, the attenuator attenuation value is an integer of the absolute value of the difference between the maximum signal power value of the test point with abnormal radio frequency signal and 17dBm.

[0013] The elastic self-locking probe comprises an elastic self-locking probe probe, an elastic self-locking probe base, an elastic self-locking probe isolator and an elastic self-locking probe attenuator; one end of the elastic self-locking probe probe contacts an internal test point of a satellite-borne electronic product, and the other end is connected to one end of the elastic self-locking probe base, for extracting a radio frequency signal and outputting it to the elastic self-locking probe base; the other end of the elastic self-locking probe base is connected to one end of the elastic self-locking probe isolator, for providing a position fixing function for the elastic self-locking probe and outputting the radio frequency signal to the elastic self-locking probe isolator; the other end of the elastic self-locking probe isolator is connected to one end of the elastic self-locking probe attenuator, for DC isolation in radio frequency signal transmission; the other end of the elastic self-locking probe attenuator is connected to a radio frequency test cable, for attenuating and outputting the radio frequency signal.

[0014] The elastic self-locking probe probe comprises an elastic self-locking probe probe transition section, an elastic arc of the elastic self-locking probe probe and an elastic self-locking probe probe end; the elastic self-locking probe probe transition section is a straight line section; the elastic arc of the elastic self-locking probe probe is a part of a circular arc, and the elastic stress of the elastic self-locking probe probe material is used to compensate for various deformations in the interstellar space environment; the shape of the elastic self-locking probe probe end is a hook shape, a circle shape or a needle shape, which respectively corresponds to the three types of flat shape, protruding pin shape and hole shape of the internal test point of the on-board electronic product.

[0015] The elastic self-locking probe base adopts an SMA flange coaxial connector, one end of which is an SMA coaxial external thread interface connected to the elastic self-locking probe isolator, and the other end is a hollow cylindrical welding piece for welding the elastic self-locking probe probe. The elastic self-locking probe base flange is fixed to the flange fixing point of the casing structure of the satellite-borne electronic product using screws.

[0016] The method of using the elastic self-locking probe to test all test points of abnormal radio frequency signals inside the onboard electronic products in a simulated interstellar space environment includes:

[0017] Find the flange fixing point on the casing structure of the onboard electronic product that is closest to the test point where the radio frequency signal is abnormal;

[0018] Measure the horizontal offset between the test point where the RF signal is abnormal and the flange fixing point on the casing structure of the spaceborne electronic product closest to the test point, measure the offset of the flange fixing point of the elastic self-locking probe, and calculate the probe elastic arc offset;

[0019] Measure the vertical drop between the test point where the RF signal is abnormal and the flange fixing point on the housing structure of the spaceborne electronic product closest to the test point, measure the transition section length of the elastic self-locking probe probe, and calculate the elastic arc diameter of the probe;

[0020] According to the shape of the internal test point of the onboard electronic product, the shape of the end of the elastic self-locking probe is selected. The protruding pin shape test point adopts the ring-shaped end elastic self-locking probe probe, the hole shape test point adopts the needle-shaped end elastic self-locking probe probe, and the flat shape test point adopts the hook-shaped end elastic self-locking probe probe;

[0021] Under room temperature, assembling an elastic self-locking probe, an elastic self-locking probe attenuator, an elastic self-locking probe straightener, an elastic self-locking probe base and an elastic self-locking probe probe into an elastic self-locking probe;

[0022] Fix the base flange of the elastic self-locking probe to the flange fixing point on the casing structure of the satellite-borne electronic product closest to the test point where the RF signal is abnormal, contact the probe of the elastic self-locking probe to the test point where the RF signal is abnormal, measure the RF signal, put the connected RF circuit of the device under test and the elastic self-locking probe into a test incubator or a vacuum tank, output the RF signal to the test system with an RF cable, perform a RF signal test in a simulated interstellar space environment, and obtain a signal spectrum.

[0023] The elastic arc diameter of the probe H=1.06(B-Y1), wherein B represents the vertical drop between the flange fixing points on the casing structure, and Y1 represents the transition section length of the elastic self-locking probe head.

[0024] The probe elastic arc offset X2=A-X1, wherein A represents the horizontal offset between flange fixing points, and X1 represents the offset of the elastic self-locking probe flange fixing points.

[0025] The beneficial effects of the present invention compared with the prior art are:

[0026] 1) The method of the present invention proposes to reasonably use the elastic deformation of the elastic self-locking probe probe material as a locking torque to resist the deformation of the interstellar space environment. Through simulation analysis and design, a probe device design scheme of an elastic self-locking probe probe with elastic arc design as the key technical point is given. After simulation design, a specific calculation size formula and method of the elastic self-locking probe probe are given. The detection position locking and welding-free signal detection problems under simulated interstellar space environment conditions are realized;

[0027] 2) In view of the requirement that the test system has the function of isolating DC in RF signals and being able to adjust the signal amplitude, the probe device of the present invention adopts a standard elastic self-locking probe DC isolator to solve the problem of DC signal isolation in the test method, and adopts a standard elastic self-locking probe attenuator to solve the problem of adjusting the signal amplitude in the test method. In the past, DC isolation circuits mostly used the method of welding the two ends of the DC isolation capacitor, which is neither safe nor convenient. The elastic self-locking probe DC isolator is packaged as an SMA standard interface, which is easy to install and replace, and has high reliability and safety;

[0028] 3) In order to adapt to the needs of various test points of RF circuits, the end of the elastic self-locking probe probe adopts hook-shaped, loop-shaped and needle-shaped designs according to the different characteristics of the test points of the device under test, which are respectively suitable for three conditions: flat test points (single-sided flat pads) inside satellite-borne electronic products, protruding pin test points (lead pads) and hole-shaped test points (vias or empty pads). BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 This is a schematic diagram of the clamp-on probe structure.

[0030] Figure 2 This is a schematic diagram of the elastic self-locking probe structure.

[0031] Figure 3 This is a schematic diagram of the elastic self-locking probe working in a temperature cycle environment.

[0032] Figure 4 This is a schematic diagram of the size parameters of the elastic self-locking probe.

[0033] Figure 5 It is the elastic arc model of spring steel wire. DETAILED DESCRIPTION

[0034] The present invention provides a method for testing radio frequency signals in an interstellar space environment, which is applied to the internal radio frequency signal testing of space-borne electronic products. Through the analysis of the actual needs of debugging and testing work, the testing method adopts a combination of two probes, a clamping probe and an elastic self-locking probe. The clamping probe is first used to detect and locate the room temperature radio frequency signal, and finally the elastic self-locking probe is used to implement the radio frequency signal testing in the interstellar space environment. The elastic deformation of the elastic self-locking probe probe stores stress to ensure close contact with the test point, so as to achieve reliable and effective testing of the radio frequency signal at the test point.

[0035] like Figure 1 As shown, the present invention uses a clamping probe to detect and locate room temperature RF signals. The clamping probe adopts a pen-shaped handheld shape, and the handheld elastic self-locking probe probe handle directly contacts the test point. The satellite-borne product circuit is tested and located step by step under room temperature conditions, and the amplitude and frequency of the RF signal and other indicators are confirmed. It can switch back and forth between multiple test positions, which is convenient to use.

[0036] like Figure 2 As shown, an elastic self-locking probe is used to simulate the RF signal test in the interstellar space environment. The elastic self-locking probe adopts a flange elastic self-locking probe base shape, which is convenient for fixation on the product structure. The elastic self-locking probe probe is in elastic contact with the test point. The elastic self-locking probe probe material adopts elastic material. In the simulated interstellar space environment, the elastic deformation of the elastic self-locking probe probe is used to store stress to ensure close contact with the test point, compensate for the deformation of the interstellar space environment, and realize reliable and effective testing of the RF signal of the test point.

[0037] Analyze the requirements for the test method:

[0038] In the simulated interstellar space environment, within the range of -25℃ to +60℃, due to thermal expansion and contraction, the relative position between the elastic self-locking probe and the test point will change, affecting the contact effect, requiring the test device to provide deformation compensation;

[0039] The electronic products being tested are in a closed vacuum environment, which means that the test probe cannot be modified at will after installation and must be connected reliably;

[0040] No welding is required for the test points (solder points) of electronic products, no damage, and no need for repair. It is recommended to use pressure contact between the test probe and the test point;

[0041] Adapt to various shapes of test points. Through analysis, the shapes of test points in RF circuits generally include: flat shape test points (single-sided flat pads), protruding pin shape test points (lead pads) and hole shape test points (vias or empty pads);

[0042] The test system has the function of isolating DC from RF signals and adjusting the signal amplitude, so the design of DC isolation circuit and attenuation circuit should be considered;

[0043] The test method uses the standard SMA RF interface, and the probe design considers the use of SMA coaxial standard parts as much as possible;

[0044] The test signal range is DC-500MHz (quantitative), 500MHz-1000MHz (qualitative). The processing of the elastic self-locking probe probe material needs to consider gold plating or silver plating to increase the RF signal characteristics.

[0045] After the above analysis, the elastic self-locking probe is designed as follows:

[0046] The elastic self-locking probe is composed of four parts, namely, an elastic self-locking probe probe, an elastic self-locking probe base, an elastic self-locking probe isolator and an elastic self-locking probe attenuator, which are sequentially connected in series.

[0047] The material of the elastic self-locking probe and the design of the elastic self-locking probe are the key to solving the core needs in the simulated interstellar space environment.

[0048] The material of the elastic self-locking probe is required to have good elasticity and good RF signal passability in the simulated interstellar space environment. The selection of elastic self-locking probe materials includes a variety of material options such as Kovar, stainless steel wire, spring steel wire, etc. The diameter specifications of the elastic self-locking probe include 1.0, 0.5, 0.3 and other specifications. The surface treatment of the elastic self-locking probe has experienced silver plating and gold plating. After a lot of actual tests and mechanical analysis, 0.3, spring steel wire, and gold plating were finally selected.

[0049] The elastic self-locking probe probe is bent and shaped by the above-mentioned material, and is composed of three parts in sequence: an elastic self-locking probe probe transition section, an elastic arc of the elastic self-locking probe probe and an elastic self-locking probe probe end.

[0050] The transition section of the elastic self-locking probe tip is in the shape of a straight line section.

[0051] like Figure 3 As shown, the elastic arc of the elastic self-locking probe is a specific implementation means of the test method to provide deformation compensation in a simulated interstellar space environment. The shape of the elastic arc of the elastic self-locking probe is a portion of a circular arc. The elastic arc of the elastic self-locking probe utilizes the elastic stress of the elastic self-locking probe material to compensate for various deformations in a temperature cycle environment. The bending radius of the elastic arc of the elastic self-locking probe can be adjusted according to actual conditions.

[0052] The shape of the probe tip of the elastic self-locking probe is available in three optional designs: hook, loop and needle, which correspond to the flat shape (pad), protruding pin shape (pin) and hole shape (via) of the internal test points of on-board electronic products.

[0053] The base of the elastic self-locking probe adopts: standard SMA coaxial connector, with flanges around the connector, which can be fixed to the housing structure of the electronic product under test with screws. One end of the elastic self-locking probe isolator is SMA coaxial external thread interface, and one end of the elastic self-locking probe probe is a hollow cylindrical welding piece for welding the elastic self-locking probe probe.

[0054] The elastic self-locking probe DC blocker adopts: DC block circuit. In the past, homemade probes mostly used the method of welding the two ends of the DC block lead capacitor, which is neither safe nor convenient. After multiple investigations, the temperature cycle environment RF debugging test probe adopts the elastic self-locking probe DC blocker device to solve the DC isolation problem in the probe. The elastic self-locking probe DC blocker is encapsulated with the SMA standard interface, which is easy to install and replace, and has high reliability and safety. Domestic manufacturers have different frequency band shelf products to choose from, with low cost.

[0055] The elastic self-locking probe isolator is packaged with an SMA standard interface, which is easy to install and replace, and has high reliability and safety.

[0056] At the same time, in order to adjust the output level of the probe, the coaxial elastic self-locking probe attenuator with a standard SMA-JK coaxial interface can be optionally selected on the elastic self-locking probe DC isolator.

[0057] like Figure 4 The figure shows the actual installation of the elastic self-locking probe. The DUT includes the electronic product housing structure and the RF circuit board installed inside. The RF circuit board includes various electronic components, pads and printed circuit boards. The probe base flange is fixed to the screw hole on the side wall of the housing, and the probe end of the elastic self-locking probe is in close contact with the test point.

[0058] As shown in the figure, measure the relative position of the base flange fixing point and the RF circuit test point, the horizontal offset is A, and the vertical drop is B.

[0059] Next, the relevant parameters of the probe are calculated based on the relative positions of the test points of the RF circuit of the device under test and the fixed points of the housing structure of the electronic product under test. The elasticity of the probe elastic arc acts in the vertical direction of the probe, and the elastic arc diameter H of the elastic self-locking probe probe should take into account the budget of the elastic deformation margin.

[0060] The relevant dimensional parameters of the probe include: flange fixing point offset X1, elastic arc offset X2 of the elastic self-locking probe probe, transition section Y1 of the elastic self-locking probe probe and elastic arc diameter H of the elastic self-locking probe probe.

[0061] Calculation of horizontal parameters. The elastic deformation margin does not need to be considered in the horizontal direction, and the sum of the probe horizontal direction (flange fixing point offset X1, elastic self-locking probe probe elastic arc offset X2) is equal to the horizontal offset A.

[0062] That is, the formula X1+X2=A. According to the actual application, the following parameter quick comparison table is given in engineering. The flange adopts the standard SMA size.

[0063] Table 1-1 Quick comparison table of probe parameters

[0064]

[0065] Note: Unit: mm

[0066] Calculation of vertical parameters. The sum of the vertical direction of the probe (elastic self-locking probe probe transition section Y1 and elastic self-locking probe probe elastic arc diameter H) is equal to the vertical drop B. Among them, the elastic self-locking probe probe elastic arc diameter H takes into account the elastic deformation, so the budget of the elastic deformation margin should be considered.

[0067] The modeling budget for H is given as follows:

[0068] In this solution, 0.3 mm spring steel wire is used, and the applicable diameters are H=2 mm, 5 mm, 10 mm, and 15 mm. It is necessary to determine the length of the spring steel wire with different diameter arc segments after the diameter is shortened after being subjected to contact stress.

[0069] The spring wire shape model is as follows Figure 5 As shown:

[0070] The grade / specification of spring steel wire is: 65Mn GB4357-89 / diameter 0.3mm

[0071] Stress range of spring steel wire: Assuming that the spring steel wire is always in the ideal elastic deformation stage during the compression process, the boundary conditions are to ensure that there is sufficient pressure on the contact surface, the spring steel wire is in good contact with the weld (minimum stress, 15KPa, 0.001N according to experience), the weld cannot be damaged (maximum stress, the weld yield limit is 48MPa, and the safety factor is 1.5, which is 32MPa, 2.26N), and the spring steel wire cannot fail (maximum stress, the weld yield limit is 785MPa, and the safety factor is 1.5, which is 523MPa). The smaller value of weld failure and spring steel wire failure is taken.

[0072] By establishing a spring wire model and applying the maximum stress and minimum stress, the diameter change of spring steel wires with different elastic arc diameters can be calculated. The elastic deformation margin within the selected range in engineering is shown in the following table:

[0073] Table 1-2 Diameter changes corresponding to different elastic arc diameters

[0074]

[0075] According to the calculation results, reasonable engineering selection values ​​are selected to pre-compress the elastic arc to achieve effective contact between the elastic self-locking probe probe and the test point.

[0076] Through simulation budget, the elastic deformation margin range of H is obtained. In engineering, the elastic deformation coefficient can be taken as 1.06 by directly looking up the above table.

[0077] The formula for the vertical direction is H=1.06(B-Y1). Based on the actual application, the following parameter quick comparison table is given in engineering. The flange adopts standard SMA size.

[0078] Table 1-3 Quick comparison table of probe parameters

[0079]

[0080] Note: Unit: mm

[0081] The relevant dimensional parameters of the elastic self-locking probe can be determined according to Table 1-1 and Table 1-3 above.

[0082] Design of clamp-on probe

[0083] The clamp-on probe includes: SMA coaxial elastic self-locking probe attenuator, SMA coaxial elastic self-locking probe isolator, elastic self-locking probe probe (made of SMA coaxial semi-rigid cable), and grounding clamp (with connecting wire).

[0084] The clamping type is used for manual point-by-point testing at room temperature. It can be used to test back and forth at multiple points, which is more convenient. The clamping probe and the elastic self-locking probe are used together at room temperature, which is convenient and quick to use.

[0085] The SMA coaxial elastic self-locking probe attenuator and elastic self-locking probe DC isolator in the clamp-on probe are the same as the elastic self-locking probe.

[0086] Production of elastic self-locking probe probe in clamp-type probe: SMA coaxial semi-rigid cable is used as the main body of the probe elastic self-locking probe probe (handheld part), providing structural support and electrical signal transmission functions. At the same time, the cable head is stripped of the outer skin to expose the inner conductor tin-plated as the elastic self-locking probe probe part of the probe;

[0087] Ground clip (with wire) in clamp-on probe: The installation wire is welded on the probe body, and a welded alligator clip is led out for grounding.

[0088] The specific test implementation method is as follows:

[0089] First, at room temperature, a handheld clamp-on probe is used to test the RF signals of all test points inside the satellite-borne electronic products step by step to find out the test points where the RF signals are abnormal. The test points where the RF signals are abnormal refer to the test points where the RF signal power is less than 60% of the design value. The attenuation value of the attenuator of the elastic self-locking probe is determined according to the maximum signal power value of the test points where the RF signals are abnormal.

[0090] The method for determining the attenuation value of the attenuator of the elastic self-locking probe is: when the maximum signal power value of the test point where the RF signal is abnormal is not greater than 20dBm, the attenuation value of the attenuator is 3dB; when the maximum signal power value of the test point where the RF signal is abnormal is greater than 20dBm, the attenuation value of the attenuator is the integer of the absolute value of the difference between the maximum signal power value of the test point where the RF signal is abnormal and 17dBm.

[0091] Then, an elastic self-locking probe is used to perform a radio frequency signal test on the test point of the abnormal radio frequency signal inside the space-borne electronic product in a simulated interstellar space environment, including the following steps:

[0092] Step 1: Find the flange fixing point on the casing structure of the satellite-borne electronic product that is closest to the test point where the radio frequency signal is abnormal;

[0093] Step 2: Measure the horizontal offset A between the test point where the RF signal is abnormal and the flange fixing point on the housing structure of the spaceborne electronic product closest to the test point, measure the offset of the elastic self-locking probe flange fixing point as X1, and calculate the probe elastic arc offset X2=A-X1;

[0094] Step 3, measuring the vertical drop B between the test point where the RF signal is abnormal and the flange fixing point on the casing structure of the spaceborne electronic product closest to the test point, measuring the transition section length of the elastic self-locking probe probe as Y1, and calculating the elastic arc diameter of the probe H=1.06(B-Y1);

[0095] Step 4: Select the shape of the end of the elastic self-locking probe according to the shape of the internal test point of the satellite-borne electronic product, wherein the protruding pin shape test point adopts a ring-shaped end elastic self-locking probe, the hole shape test point adopts a needle-shaped end elastic self-locking probe, and the flat shape test point adopts a hook-shaped end elastic self-locking probe;

[0096] Step 5, at room temperature, assemble the elastic self-locking probe, the elastic self-locking probe attenuator, the elastic self-locking probe, the elastic self-locking probe isolator, the elastic self-locking probe base and the elastic self-locking probe probe into an elastic self-locking probe;

[0097] Step six, fix the base flange of the elastic self-locking probe to the flange fixing point on the casing structure of the satellite-borne electronic product that is closest to the test point of the RF signal abnormality, contact the probe of the elastic self-locking probe to the test point of the RF signal abnormality, put the connected RF circuit of the device under test and the elastic self-locking probe into a test incubator or vacuum tank, and use an RF cable to output the test signal to the test system to perform a RF signal test simulating the interstellar space environment.

[0098] This RF signal test method has been widely used in production lines, and its performance is stable in tests simulating interstellar space environment conditions (temperature cycle, thermal vacuum). After actual use and verification tests simulating interstellar space environment conditions, this RF signal test method meets the needs of internal RF signal debugging tests of space-borne product circuits, and is stable, reliable and easy to use.

[0099] The contents not described in detail in the specification of the present invention belong to the well-known technologies of professionals in the field.

Claims

1. A method for testing radio frequency signals in an interstellar space environment, characterized in that: include: Under room temperature, the RF signals of all test points inside the satellite-borne electronic products are tested step by step using a clamp-type probe to find out the test points with abnormal RF signals. The attenuation value of the attenuator of the elastic self-locking probe is determined according to the maximum signal power value of the test point with abnormal RF signal. The elastic self-locking probe with the attenuation value is used to test the RF signals of the test points with abnormal RF signals inside the satellite-borne electronic products in a simulated interstellar space environment to obtain the signal spectrum.

2. The method for testing radio frequency signals in an interstellar space environment according to claim 1, characterized in that: The satellite-borne electronic product comprises a radio frequency circuit and a casing structure, the radio frequency circuit is mounted on the casing structure; the internal test point of the satellite-borne electronic product is located on the radio frequency circuit of the satellite-borne electronic product; and there is a flange fixing point on the casing structure of the satellite-borne electronic product.

3. The method for testing radio frequency signals in an interstellar space environment according to claim 1, characterized in that: The test point where the radio frequency signal is abnormal refers to a test point where the radio frequency signal power is less than 60% of the design value.

4. The method for testing radio frequency signals in an interstellar space environment according to claim 1, characterized in that: The attenuation value of the attenuator of the elastic self-locking probe is determined, including: when the maximum signal power value of the test point with abnormal radio frequency signal is not greater than 20dBm, the attenuator attenuation value is 3dB; when the maximum signal power value of the test point with abnormal radio frequency signal is greater than 20dBm, the attenuator attenuation value is an integer of the absolute value of the difference between the maximum signal power value of the test point with abnormal radio frequency signal and 17dBm.

5. The method for testing radio frequency signals in an interstellar space environment according to claim 1, characterized in that: The elastic self-locking probe comprises an elastic self-locking probe probe, an elastic self-locking probe base, an elastic self-locking probe isolator and an elastic self-locking probe attenuator; one end of the elastic self-locking probe probe contacts an internal test point of a satellite-borne electronic product, and the other end is connected to one end of the elastic self-locking probe base, for extracting a radio frequency signal and outputting it to the elastic self-locking probe base; the other end of the elastic self-locking probe base is connected to one end of the elastic self-locking probe isolator, for providing a position fixing function for the elastic self-locking probe and outputting the radio frequency signal to the elastic self-locking probe isolator; the other end of the elastic self-locking probe isolator is connected to one end of the elastic self-locking probe attenuator, for DC isolation in radio frequency signal transmission; the other end of the elastic self-locking probe attenuator is connected to a radio frequency test cable, for attenuating and outputting the radio frequency signal.

6. The method for testing radio frequency signals in an interstellar space environment according to claim 5, characterized in that: The elastic self-locking probe probe comprises an elastic self-locking probe probe transition section, an elastic arc of the elastic self-locking probe probe and an elastic self-locking probe probe end; the elastic self-locking probe probe transition section is a straight line section; the elastic arc of the elastic self-locking probe probe is a part of a circular arc, and the elastic stress of the elastic self-locking probe probe material is used to compensate for various deformations in the interstellar space environment; the shape of the elastic self-locking probe probe end is a hook shape, a circle shape or a needle shape, which respectively corresponds to the three types of flat shape, protruding pin shape and hole shape of the internal test point of the on-board electronic product.

7. The method for testing radio frequency signals in an interstellar space environment according to claim 5, characterized in that: The elastic self-locking probe base adopts an SMA flange coaxial connector, one end of which is an SMA coaxial external thread interface connected to the elastic self-locking probe isolator, and the other end is a hollow cylindrical welding piece for welding the elastic self-locking probe probe. The elastic self-locking probe base flange is fixed to the flange fixing point of the casing structure of the satellite-borne electronic product using screws.

8. The method for testing radio frequency signals in an interstellar space environment according to claim 5, characterized in that: The method of using the elastic self-locking probe to test all test points of abnormal radio frequency signals inside the onboard electronic products in a simulated interstellar space environment includes: Find the flange fixing point on the casing structure of the onboard electronic product that is closest to the test point where the radio frequency signal is abnormal; Measure the horizontal offset between the test point where the RF signal is abnormal and the flange fixing point on the casing structure of the spaceborne electronic product closest to the test point, measure the offset of the flange fixing point of the elastic self-locking probe, and calculate the probe elastic arc offset; Measure the vertical drop between the test point where the RF signal is abnormal and the flange fixing point on the housing structure of the spaceborne electronic product closest to the test point, measure the transition section length of the elastic self-locking probe probe, and calculate the elastic arc diameter of the probe; According to the shape of the internal test point of the onboard electronic product, the shape of the end of the elastic self-locking probe is selected. The protruding pin shape test point adopts the ring-shaped end elastic self-locking probe probe, the hole shape test point adopts the needle-shaped end elastic self-locking probe probe, and the flat shape test point adopts the hook-shaped end elastic self-locking probe probe; Under room temperature, assembling an elastic self-locking probe, an elastic self-locking probe attenuator, an elastic self-locking probe straightener, an elastic self-locking probe base and an elastic self-locking probe probe into an elastic self-locking probe; Fix the base flange of the elastic self-locking probe to the flange fixing point on the casing structure of the satellite-borne electronic product closest to the test point where the RF signal is abnormal, contact the probe of the elastic self-locking probe to the test point where the RF signal is abnormal, measure the RF signal, put the connected RF circuit of the device under test and the elastic self-locking probe into a test incubator or a vacuum tank, output the RF signal to the test system with an RF cable, perform a RF signal test in a simulated interstellar space environment, and obtain a signal spectrum.

9. The method for testing radio frequency signals in an interstellar space environment according to claim 8, characterized in that: The elastic arc diameter of the probe H=1.06(B-Y1), wherein B represents the vertical drop between the flange fixing points on the casing structure, and Y1 represents the transition section length of the elastic self-locking probe.

10. The method for testing radio frequency signals in an interstellar space environment according to claim 8, characterized in that: The probe elastic arc offset X2=A-X1, wherein A represents the horizontal offset between flange fixing points, and X1 represents the offset of the elastic self-locking probe flange fixing points.

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