Device and method for detecting internal defects of electrified copper-clad aluminum material

Abstract

The invention discloses a device and a method for detecting internal defects of an electrified copper-clad aluminum material, the device transmits data to a controller through an anti-interference chip of a wireless transmitter, the problem of data interference of a magnetic field around the electrified material on the detection device is solved, and the stability of data transmission is realized; the supporting piece, the clamping mechanism, the sliding rail mechanism and the probe fixing piece are made of a nano silicon dioxide cross-linked polyethylene insulating material, the technical problem that the detection device is prone to breakdown due to high voltage is solved, and nondestructive detection is achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of nondestructive testing devices for large current conductors, and in particular to a device and method for detecting internal defects of live copper-clad aluminum materials. Background Art

[0002] The power grid industry uses a large number of copper bars as high-current conductors, and there are many problems with the connection between copper and aluminum. Considering that alternating current has a typical skin effect, in theory, the part of the conductor that does not pass high current can be replaced with aluminum to save copper resources. At the same time, copper and aluminum have a high shear strength of 50MPa after casting and rolling, and the copper-aluminum interface can form an atomic metallurgical bond, which can effectively avoid the corrosion problem caused by the connection of dissimilar metals between copper and aluminum.

[0003] Cast and rolled copper-clad aluminum composite materials have a clean copper-aluminum interface and high bonding strength, which is suitable for industrial mass production and has the conditions for large-scale promotion. The aluminum layer on the side of the cast and rolled copper-clad aluminum composite material can be re-coppered by electroplating and welding. At present, relevant tests on copper-clad aluminum materials have been carried out in China, and some aluminum busbars have been replaced in many units. There is a certain practical basis. Therefore, it can be inferred that the composite busbars and bus ducts made of cast and rolled copper-clad aluminum composite materials can be used for low-voltage conductors and copper-aluminum transition hardware in the power grid industry.

[0004] Ultrasonic waves have good propagation properties in solids. By selecting appropriate frequency, energy and coupling methods, they can detect the interface and internal state of solid materials, and measure the thickness of each layer of copper-clad aluminum composite materials, thereby achieving non-destructive testing of the interface between copper-clad aluminum busbars and transition hardware, which is convenient and quick.

[0005] It is now necessary to detect defects in copper-clad aluminum materials that are running under power, and to detect defects in the interface and the matrix. Chinese patent announcement No. CN 113848375 B discloses a live detection device for internal components of an oil-insulated transformer and an application method thereof. The detection device includes a scanning frame and a phased array detection probe movably arranged on the scanning frame. The scanning frame includes a main bracket and a slide rail mechanism provided on the main bracket. The phased array detection probe is installed on the slide rail mechanism. The bottom of the main bracket is provided with an adsorption component for adsorbing and mounting on the outer wall of the oil-insulated transformer. However, the applicant found that the technical solution detects the internal components of the transformer, and the live detection device itself is in contact with the outer wall of the transformer. No current flows through the outer wall of the transformer, and the live detection device does not contact the charged body. The live detection device can well solve the technical problem of detecting the internal components of the transformer, but the current requirement is for the materials that are running under power. The voltage strength of the charged materials is very high, up to 35kv. On the one hand, since it is running under power, a magnetic field will be generated around the charged materials, and the magnetic field will cause data interference to the detection device, resulting in inaccurate detection results. On the other hand, since the voltage strength of the charged materials is high, the detection device is in direct contact with the charged materials, and it is easy to break through the detection device, causing the detection device to fail to work. Therefore, the technical solution cannot detect defects in copper-clad aluminum materials running under power. Therefore, a device and method that can accurately detect defects in copper-clad aluminum materials running under power are needed. Summary of the invention

[0006] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a device and method for detecting internal defects of live copper-clad aluminum materials with stable data transmission and non-destructive testing.

[0007] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0008] A device for detecting internal defects of a live copper-clad aluminum material, comprising a support, a clamping mechanism, a slide rail mechanism, a detection mechanism and a controller, wherein the slide rail mechanism is located between two oppositely arranged support members and arranged along the length direction of the live copper-clad aluminum material, and the clamping mechanism is connected to the support member and is used to clamp the live copper-clad aluminum material below the support member;

[0009] The detection mechanism includes a probe fixing part, a phased array detection probe, a probe driving part, and a wireless transmitter. The phased array detection probe is located on the probe fixing part. The probe fixing part slides on the slide rail mechanism under the drive of the probe driving part. The wireless transmitter sends the data detected by the phased array detection probe to the controller. The controller is wirelessly connected to the probe driving part. The wireless transmitter includes an anti-interference chip.

[0010] The support member, the clamping mechanism, the slide rail mechanism and the probe fixing member are made of nano-silicon dioxide cross-linked polyethylene insulating material.

[0011] As a further improvement of the above technical solution:

[0012] The detection mechanism also includes a travel limiter and an encoder, which are arranged on the probe fixture. The encoder is used for phased array detection of the travel distance of the probe fixture sliding on the slide rail mechanism, and the travel limiter is used to control the sliding position of the probe fixture on the slide rail mechanism.

[0013] The detection mechanism also includes a pressure sensor, and the pressure sensor is located at the lower part of both sides of the phased array detection probe.

[0014] The phased array detection probe can slide relative to the probe fixing piece along the width direction of the charged copper-clad aluminum material.

[0015] The detection mechanism also includes a probe transverse stroke device, which is located on the probe fixing member and is used to control the position of the phased array detection probe relative to the width direction of the charged copper-clad aluminum material.

[0016] The detection mechanism also includes a coupling agent spraying device, which is located on the probe fixing part and is used to spray the coupling agent on the charged copper-clad aluminum material.

[0017] A detection method for a device for detecting internal defects of a charged copper-clad aluminum material, comprising the following steps:

[0018] S1, judging whether there are defects in the appearance of the upper and lower surfaces of the material to be tested, if there are defects, then judging that the material to be tested has defects, otherwise, executing step S2;

[0019] S2. Debug the device until all parts can work normally;

[0020] S3, adjusting the phased array detection probe to the initial position, mounting the material to be detected on the clamping mechanism, and moving the phased array detection probe along the length direction of the material to be detected to obtain a detection image;

[0021] S4, judging whether the detection image meets the preset requirements, if yes, executing step S5, otherwise adjusting the phased array detection probe until the phased array detection probe fits the surface of the material to be detected and then executing step S3;

[0022] S5, moving the phased array detection probe to a preset position along the width direction of the material to be detected, and repeating steps S3 to S4 until detection images are obtained at all positions on the upper surface of the material to be detected;

[0023] S6, turning over the material to be tested and mounting it on the clamping mechanism, repeating steps S3 to S5 until test images are obtained at all positions on the upper and lower surfaces of the material to be tested;

[0024] S7. Obtain the positional relationship between the defect pattern and the material to be inspected according to the inspection image, and determine whether there is a defect inside the material to be inspected. If there is a defect, the material to be inspected has a defect, otherwise it does not exist.

[0025] As a further improvement of the above technical solution:

[0026] The step S2 comprises the following steps:

[0027] A1. Clamp the material to be tested on the clamping mechanism, drive the phased array detection probe to slide along the slide rail mechanism, and obtain the debugging detection image;

[0028] A2. Determine whether the data of the pressure sensor is correct. If so, execute step A3. Otherwise, adjust the position of the pressure sensor on the phased array detection probe or adjust the position of the phased array detection probe on the probe fixture.

[0029] A3, determine whether the debugging detection image is distorted, if yes, execute step A4, otherwise, execute step S3;

[0030] A4. Perform steps A1 to A3 after adjusting the position of the travel limiter or encoder or coupling agent spray device on the probe fixture.

[0031] The step S7 also includes determining the defect type inside the material to be detected, which specifically includes the following situations:

[0032] Case 1: If the inspection image of the upper surface of the material to be inspected and the inspection image of the lower surface of the material to be inspected both have defect waveforms at the same position between the two interfaces, it is determined that there is a matrix defect;

[0033] In the second case, if the detection image of one surface of the material to be detected is very close to the bonding surface or the bonding surface pattern is significantly different from the normal pattern, and at the same time, the detection image of the other surface of the material to be detected shows a higher waveform at the same position, it is determined that there is a bonding surface defect.

[0034] Before step A1, an anti-interference test and a withstand voltage test are also performed. If both the anti-interference test and the withstand voltage test are passed, step A1 is performed, otherwise the process ends.

[0035] The anti-interference test is to detect the reliability of data transmission of equipment under the condition of simulating the maximum interference of substation. If the bit error rate does not exceed 1% and the data transmission does not freeze more than 3 times within 2 hours, the anti-interference test is passed, otherwise it is failed;

[0036] The voltage withstand test is to apply a voltage of 35Kv across the two ends of the detection device. If the detection device is not broken down or flashed over within 2 hours, and all parts in the detection device can operate normally, the voltage withstand test is passed, otherwise it is failed.

[0037] Compared with the prior art, the advantages of the present invention are:

[0038] The device for detecting internal defects of charged copper-clad aluminum materials of the present invention transmits data to a controller through an anti-interference chip of a wireless transmitter, thereby solving the data interference on the detection device caused by the magnetic field around the charged material and achieving stability in data transmission. The support, clamping mechanism, slide rail mechanism, and probe fixing member are made of nano-silicon dioxide cross-linked polyethylene insulating material, thereby solving the technical problem that high voltage easily breaks through the detection device and achieving non-destructive testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a schematic structural diagram of a device for detecting internal defects of a charged copper-clad aluminum material according to the present invention.

[0040] Figure 2 It is a flow chart of the detection method of the present invention.

[0041] Figure 3 It is a schematic diagram of phased array detection of a charged copper-clad aluminum material without defects according to the present invention.

[0042] Figure 4 It is a metallographic diagram and a phased array detection schematic diagram of the charged copper-clad aluminum material with pore defects of the present invention.

[0043] Figure 5 It is a metallographic diagram and a phased array detection schematic diagram of the charged copper-clad aluminum material having a bonding surface defect of the present invention.

[0044] The symbols in the figure represent:

[0045] 1. Support member; 2. Clamping mechanism; 3. Slide rail mechanism; 4. Detection mechanism; 40. Couplant spraying device; 41. Pressure sensor; 42. Probe lateral travel device; 44. Probe fixing member; 45. Phased array detection probe; 46. Probe driving member; 47. Travel limiter; 48. Wireless transmitter; 49. Encoder; 5. Controller. DETAILED DESCRIPTION

[0046] The present invention will be described in further detail below. Unless otherwise specified, the instruments or materials used in the present invention are commercially available.

[0047] In the description of the present invention, it is necessary to understand that the orientations or positional relationships indicated by terms such as “upper”, “lower”, “front”, “back”, “top”, “bottom”, “inside” and “outside” are based on the orientations or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present invention and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0048] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0049] In the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0050] Embodiment 1

[0051] like Figure 1 As shown, the device for detecting internal defects of charged copper-clad aluminum materials of this embodiment includes a support member 1, a clamping mechanism 2, a slide rail mechanism 3, a detection mechanism 4 and a controller 5. The slide rail mechanism 3 is located between two oppositely arranged supports 1 and is arranged along the length direction of the charged copper-clad aluminum material. The clamping mechanism 2 is connected to the support member 1 and is used to clamp the charged copper-clad aluminum material below the support member 1; the detection mechanism 4 includes a probe fixing member 44, a phased array detection probe 45, a probe driving member 46, and a wireless transmitter 48. The phased array detection probe 45 is located on the probe fixing member 44, and the probe fixing member 44 slides on the slide rail mechanism 3 under the drive of the probe driving member 46. The wireless transmitter 48 sends the data detected by the phased array detection probe 45 to the controller 5. The controller 5 is wirelessly connected to the probe driving member 46, and the wireless transmitter 48 includes an anti-interference chip; the support member 1, the clamping mechanism 2, the slide rail mechanism 3, and the probe fixing member 44 are made of nano-silicon dioxide cross-linked polyethylene insulating material.

[0052] The present invention transmits data to the controller 5 through the anti-interference chip of the wireless transmitter 48, thereby solving the data interference caused by the magnetic field around the charged material to the detection device and achieving the stability of data transmission. The support 1, the clamping mechanism 2, the slide rail mechanism 3, and the probe fixing member 44 are made of nano-silicon dioxide cross-linked polyethylene insulating material. The nano-silicon dioxide cross-linked polyethylene insulating material has high compressive strength and good mechanical and processing properties. It solves the technical problem that high voltage easily breaks through the detection device and realizes non-destructive testing.

[0053] In this embodiment, the wireless transmitter 48 adopts multi-layer shielding, filtering technology and high-performance anti-interference chips, which can effectively resist electromagnetic interference of 35 kilovolts and above, and also has powerful signal processing capabilities and data encryption functions to ensure the safe transmission of data.

[0054] In this embodiment, the detection mechanism 4 also includes a travel limiter 47 and an encoder 49. The travel limiter 47 and the encoder 49 are arranged on the probe fixing member 44. The encoder 49 is used to detect the travel distance of the probe fixing member 44 sliding on the slide rail mechanism 3, and the travel limiter 47 is used to control the sliding position of the probe fixing member 44 on the slide rail mechanism 3. In this embodiment, the length direction of the charged copper-clad aluminum material is the longitudinal direction, and the travel limiter 47 and the encoder 49 cooperate to realize that the phased array detection probe 45 reaches the corresponding longitudinal travel position. The travel limiter 47 adjusts the position of the phased array detection probe 45 according to the real-time distance value detected by the encoder 49, and the encoder 49 performs real-time detection of the distance, thereby ensuring that the detection position does not deviate. In this embodiment, the probe driving member 46 drives the probe fixing member 44 to slide on the slide rail mechanism 3 through gears. In other embodiments, it can be gear transmission, or other transmission methods such as crawler transmission.

[0055] The slide rail mechanism 3 is adjusted according to the length of the material to be inspected.

[0056] The detection mechanism 4 also includes a pressure sensor 41, which is located at the lower part of both sides of the phased array detection probe 45. The installation position of the pressure sensor 41 does not affect the detection, and also ensures that the force borne by the phased array detection probe 45 meets the detection requirements and is not damaged. In this embodiment, the upper and lower surfaces of the pressure sensor 41 are provided with a pressure-resistant material (not shown in the figure) between them and in contact with the copper-clad aluminum material. The thickness of the pressure-resistant material is 3mm. In this embodiment, the pressure-resistant material is a thin polytetrafluoroethylene material with high pressure resistance, flexibility, and good lubrication effect, so as to improve the service life of the pressure sensor 41 without affecting the detection data of the pressure sensor 41.

[0057] The phased array detection probe 45 can slide along the width direction of the charged copper-clad aluminum material relative to the probe fixing member 44. The sliding arrangement facilitates the phased array detection probe 45 to detect all positions on a certain surface of the charged copper-clad aluminum material.

[0058] The phased array detection probe 45 can move up and down relative to the probe fixing member 44 to adjust the distance between the phased array detection probe 45 and the material to be detected, so as to achieve surface bonding between the pressure sensor 41 and the material to be detected.

[0059] The detection mechanism 4 further comprises a probe transverse stroke device 42 , which is located on a probe fixture 44 and is used to control the position of a phased array detection probe 45 relative to the width direction of the charged copper-clad aluminum material.

[0060] In this embodiment, the detection mechanism 4 further includes a coupling agent spraying device 40, which is located on the probe fixing member 44 and is used to spray the coupling agent on the charged copper-clad aluminum material. The coupling agent spraying device 40 first sprays before the device starts debugging to prevent the probe from getting stuck and the detection data from being distorted.

[0061] In this embodiment, the controller 5 has built-in phased array detection data acquisition system, encoder data acquisition system, mechanical control system, limit control system and control system of probe drive 46. The mechanical control system controls the pressure sensor 41 to ensure that the contact force between the phased array detection probe 45 and the material is uniform to prevent detection deviation caused by human factors. At the same time, the mechanical control system protects the phased array detection probe 45 to prevent probe damage caused by surface roughness, etc. The data acquisition system is mainly used for phased array detection data acquisition and analysis of the phased array detection probe 45, and records and alarms the material parts with problems. The control system of the automatic transmission mechanism can start, stop detection and change the detection speed according to the detection speed and the shape of the inspected component. The limit control system mainly controls the travel limiter 47 and the encoder 49 to control the moving distance of the detection probe to meet the design requirements so that all detection surfaces can be fully detected.

[0062] Embodiment 2

[0063] like Figure 2 As shown, the detection method of the device for detecting internal defects of charged copper-clad aluminum materials of the present invention comprises the following steps:

[0064] S1, judging whether there are defects in the appearance of the upper and lower surfaces of the material to be tested, if there are defects, then judging that the material to be tested has defects, otherwise, executing step S2;

[0065] S2. Debug the device until all parts can work normally;

[0066] S3, adjusting the phased array detection probe 45 to the initial position, mounting the material to be detected on the clamping mechanism 2, and moving the phased array detection probe 45 along the length direction of the material to be detected to obtain a detection image;

[0067] S4, judging whether the detection image meets the preset requirements, if yes, executing step S5, otherwise adjusting the phased array detection probe 45 until the phased array detection probe 45 and the surface of the material to be detected fit together and then executing step S3;

[0068] S5, moving the phased array detection probe 45 to a preset position along the width direction of the material to be detected, and repeating steps S3 to S4 until detection images are obtained at all positions on the upper surface of the material to be detected;

[0069] S6, turn over the material to be tested and install it on the clamping mechanism 2, and repeat steps S3 to S5 until the detection images are obtained at all positions on the upper and lower surfaces of the material to be tested;

[0070] S7. Obtain the positional relationship between the defect pattern and the material to be inspected according to the inspection image, and determine whether there is a defect inside the material to be inspected. If there is a defect, the material to be inspected has a defect, otherwise it does not exist.

[0071] Step S2 includes the following steps:

[0072] A1. Clamp the material to be tested on the clamping mechanism 2, drive the phased array detection probe 45 to slide along the slide rail mechanism 3, and obtain a debugging detection image;

[0073] A2. Determine whether the data of the pressure sensor 41 is correct. If so, execute step A3. Otherwise, adjust the position of the pressure sensor 41 on the phased array detection probe 45 or adjust the position of the phased array detection probe 45 on the probe fixture 44.

[0074] A3, determine whether the debugging detection image is distorted, if yes, execute step A4, otherwise, execute step S3;

[0075] A4. After adjusting the position of the travel limiter 47 or the encoder 49 or the coupling agent spraying device 40 on the probe fixture 44, perform steps A1 to A3.

[0076] Before step A1, an anti-interference test and a withstand voltage test are also performed. If both the anti-interference test and the withstand voltage test are passed, step A1 is executed, otherwise the process ends.

[0077] The anti-interference test is to detect the reliability of data transmission of equipment under the condition of simulating the maximum interference of the substation. If the bit error rate does not exceed 1% and the transmission data does not freeze more than 3 times within 2 hours, the anti-interference test passes, otherwise it fails.

[0078] The voltage withstand test is to apply a voltage of 35Kv across the two ends of the detection device. If the detection device is not broken down or flashed over within 2 hours, and all parts in the detection device can operate normally, the voltage withstand test is passed, otherwise it is failed.

[0079] After step S7, the method further includes determining the defect type inside the material to be detected, which specifically includes the following situations:

[0080] Case 1: If the inspection image of the upper surface of the material to be inspected and the inspection image of the lower surface of the material to be inspected both have defect waveforms at the same position between the two interfaces, then there is a matrix defect;

[0081] In the second case, if the detection image of one surface of the material to be detected is very close to the bonding surface or the bonding surface pattern is significantly different from the normal pattern, and at the same time, the detection image of the other surface of the material to be detected shows a higher waveform at the same position, then there is a bonding surface defect.

[0082] The present invention will be further described in detail below by taking a 60×6×50 mm copper-clad aluminum sheet as the material to be tested.

[0083] Before the formal test, a test block with corresponding defects is made according to the needs of conventional ultrasonic phased array testing to determine the size and nature of the defects. The detection method of the device for detecting internal defects of charged copper-clad aluminum materials in this embodiment includes the following steps:

[0084] (1) Determine the parameters of the material to be tested, including the thickness of copper and aluminum. The design thickness of copper is 0.6 mm and the design thickness of aluminum is 4.8 mm.

[0085] (2) Select one side of the surface as the test surface and observe whether there are any defects on the surface. If there are scratches, pits, exposed aluminum, delamination, bubbles and other defects on the surface, no inspection is required and the material is unqualified.

[0086] (3) Preparation before testing:

[0087] ① Clean the test surface to meet the requirements of ultrasonic phased array testing;

[0088] ② Probe and wedge selection. A 16-element 5MHz one-dimensional linear array probe is selected as the phased array detection probe 45, the probe chip spacing is 0.5mm, and the total length of the probe is 20×20mm; a wedge is selected, the wedge and the phased array detection probe 45 are connected by conventional bolts, and the wedge is made of nano-silicon dioxide cross-linked polyethylene insulation material;

[0089] ③Selection of testing instruments. The testing instrument selected on site is MENTORJ20 produced by General Motors;

[0090] ④ Instrument calibration. The phased array is calibrated on a 6mm copper-clad aluminum standard pattern;

[0091] ⑤ Verification of the encoder 49, pressure sensor 41, travel limiter 47, and coupling agent spraying device 40. Turn on the coupling agent spraying device 40, turn on the probe driving part 46 to drive the phased array detection probe 45 to move, observe the flexibility of the encoder 49, pressure sensor 41, and travel limiter 47 (quick response during walking), whether the data of the pressure sensor 41 installed at the bottom of the phased array detection probe 45 is accurate, whether the phased array detection probe 45 is in good contact with the material to be detected, observe whether there is distortion in the detection image in the controller 5, and verify it at the same time. After the verification is completed, the fixing device of the phased array detection probe 45 moves to the starting position;

[0092] (4) Implementation of testing

[0093] ① Position the probe along the length direction of the material, adjust the phased array detection probe 45 to the initial position, reset the encoder 49, turn on the probe driver 46, set the transmission rate of the phased array detection probe 45 to 20 mm / s, observe the changes in the detection image in the controller 5, and adjust the distance between the phased array detection probe 45 and the material to be detected to ensure that the phased array detection probe 45 can fit the surface of the material to be detected during the movement;

[0094] Observe the image display and waveform display in the controller 5. If an abnormal waveform appears, mark the questionable part of the material to be tested. After the phased array detection probe 45 moves to the end of the material to be tested and saves the test data, detect other parts of the material, while ensuring that there is an overlap area of ​​about 5 mm between the tested part and the new test part.

[0095] Since the size difference of the inspected materials is obvious, some copper-clad aluminum materials need to be inspected multiple times before they can be completed. When a part of the material is inspected, the phased array inspection probe 45 is controlled to move left and right. To prevent missed inspections, the moving distance ensures that the inspection surfaces overlap by 5mm, and then the inspection of a new inspected material is started;

[0096] ② Repeat step ① until the entire surface is fully inspected. After confirming that the data is recorded completely, turn the inspected material over and fix it, and repeat steps ①-② until both the upper and lower surfaces of the entire material are inspected to fully discover the defects inside the material.

[0097] ③ After the test is completed, observe the waveform and graph section by section, especially the mark position. If there is still doubt, it is necessary to conduct repeated tests until the defect is confirmed or eliminated.

[0098] The positional relationship between the defect pattern and the inspected copper-clad aluminum material is analyzed and obtained, and based on the positional relationship between the defect pattern and the inspected copper-clad aluminum material, it is determined whether there are defects inside the inspected copper-clad aluminum material and the defect type.

[0099] (5) Test results

[0100] After testing, it was found that there were pore defects inside the tested material, such as Figure 4 As shown, Figure 4 (a) Figure 5 (c) is the metallographic diagram, Figure 4 (b) is a schematic diagram of phased array detection; at the same time, a defect signal appears at the copper-aluminum interface of the material, and it is finally confirmed that the aluminum material is peeled off near the interface, such as Figure 5 As shown, Figure 5 (a) Figure 5 (c) is the metallographic diagram, Figure 5 (b) is a schematic diagram of phased array detection. If there are no defects inside the material, the phased array detection diagram is as follows Figure 3 shown.

[0101] It should be understood by those skilled in the art that the embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-readable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code. The present invention is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present invention. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, may be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the functions in the process. Figure 1 A process or multiple processes and / or boxes Figure 1 These computer program instructions can also be stored in a computer-readable memory that can guide a computer or other programmable data processing device to work in a specific way, so that the instructions stored in the computer-readable memory produce a product including an instruction device, which implements the functions specified in the process. Figure 1 A process or multiple processes and / or boxes Figure 1These computer program instructions can also be loaded onto a computer or other programmable data processing device, so that a series of operation steps are executed on the computer or other programmable device to produce a computer-implemented process, so that the instructions executed on the computer or other programmable device provide for implementing the process in the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0102] Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any technician familiar with the art can make many possible changes and modifications to the technical solution of the present invention by using the technical content disclosed above without departing from the scope of the technical solution of the present invention, or modify it into an equivalent embodiment of equivalent changes. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present invention without departing from the content of the technical solution of the present invention should fall within the scope of protection of the technical solution of the present invention.

Claims

1. A device for detecting internal defects of charged copper-clad aluminum materials, characterized in that: The invention comprises a support member (1), a clamping mechanism (2), a slide rail mechanism (3), a detection mechanism (4) and a controller (5); the slide rail mechanism (3) is located between two oppositely arranged support members (1) and arranged along the length direction of the charged copper-clad aluminum material; the clamping mechanism (2) is connected to the support member (1) and is used to clamp the charged copper-clad aluminum material below the support member (1); The detection mechanism (4) comprises a probe fixing part (44), a phased array detection probe (45), a probe driving part (46), and a wireless transmitter (48); the phased array detection probe (45) is located on the probe fixing part (44); the probe fixing part (44) slides on the slide rail mechanism (3) under the drive of the probe driving part (46); the wireless transmitter (48) sends the data detected by the phased array detection probe (45) to the controller (5); the controller (5) is wirelessly connected to the probe driving part (46); and the wireless transmitter (48) comprises an anti-interference chip; The support member (1), the clamping mechanism (2), the slide rail mechanism (3) and the probe fixing member (44) are made of nano-silicon dioxide cross-linked polyethylene insulating material.

2. The device for detecting internal defects of charged copper-clad aluminum materials according to claim 1, characterized in that: The detection mechanism (4) further comprises a travel limiter (47) and an encoder (49), wherein the travel limiter (47) and the encoder (49) are arranged on the probe fixing member (44), the encoder (49) is used for phased array detection of the travel distance of the probe fixing member (44) sliding on the slide rail mechanism (3), and the travel limiter (47) is used for controlling the sliding position of the probe fixing member (44) on the slide rail mechanism (3).

3. The device for detecting internal defects of charged copper-clad aluminum materials according to claim 1, characterized in that: The detection mechanism (4) further comprises a pressure sensor (41), wherein the pressure sensor (41) is located at the lower parts of both sides of the phased array detection probe (45).

4. The device for detecting internal defects of charged copper-clad aluminum materials according to claim 1, characterized in that: The phased array detection probe (45) is slidable relative to the probe fixing member (44) along the width direction of the charged copper-clad aluminum material.

5. The device for detecting internal defects of charged copper-clad aluminum materials according to claim 4, characterized in that: The detection mechanism (4) further comprises a probe transverse stroke device (42), wherein the probe transverse stroke device (42) is located on the probe fixing member (44) and is used to control the position of the phased array detection probe (45) relative to the width direction of the charged copper-clad aluminum material.

6. The device for detecting internal defects of charged copper-clad aluminum materials according to claim 1, characterized in that: The detection mechanism (4) also includes a coupling agent spraying device (40), which is located on the probe fixing member (44) and is used to spray the coupling agent on the charged copper-clad aluminum material.

7. A detection method for an internal defect detection device for a charged copper-clad aluminum material, characterized in that: The following steps are involved: S1, judging whether there are defects in the appearance of the upper and lower surfaces of the material to be tested, if there are defects, then judging that the material to be tested has defects, otherwise, executing step S2; S2. Debug the device until all parts can work normally; S3, adjusting the phased array detection probe (45) to an initial position, mounting the material to be detected on the clamping mechanism (2), and moving the phased array detection probe (45) along the length direction of the material to be detected to obtain a detection image; S4, judging whether the detected image meets the preset requirements, if so, executing step S5, otherwise, adjusting the phased array detection probe (45) until the phased array detection probe (45) fits the surface of the material to be detected, and then executing step S3; S5, moving the phased array detection probe (45) to a preset position along the width direction of the material to be detected, and repeating steps S3 to S4 until detection images are obtained at all positions on the upper surface of the material to be detected; S6, turning over the material to be tested and mounting it on the clamping mechanism (2), and repeating steps S3 to S5 until test images are obtained at all positions on the upper and lower surfaces of the material to be tested; S7. Obtain the positional relationship between the defect pattern and the material to be inspected according to the inspection image, and determine whether there is a defect inside the material to be inspected. If there is a defect, the material to be inspected has a defect, otherwise it does not exist.

8. The detection method according to claim 7, characterized in that: The step S2 comprises the following steps: A1. Clamp the material to be tested on the clamping mechanism (2), drive the phased array detection probe (45) to slide along the slide rail mechanism (3), and obtain a debugging detection image; A2, determining whether the data of the pressure sensor (41) is correct, if so, executing step A3, otherwise, adjusting the position of the pressure sensor (41) on the phased array detection probe (45) or adjusting the position of the phased array detection probe (45) on the probe fixture (44); A3, determine whether the debugging detection image is distorted, if yes, execute step A4, otherwise, execute step S3; A4. After adjusting the position of the travel limiter (47) or the encoder (49) or the coupling agent spraying device (40) on the probe fixture (44), perform steps A1 to A3.

9. The detection method according to claim 7, characterized in that: The step S7 also includes determining the defect type inside the material to be detected, which specifically includes the following situations: Case 1: If the inspection image of the upper surface of the material to be inspected and the inspection image of the lower surface of the material to be inspected both have defect waveforms at the same position between the two interfaces, it is determined that there is a matrix defect; In the second case, if the detection image of one surface of the material to be detected is very close to the bonding surface or the bonding surface pattern is significantly different from the normal pattern, and at the same time, the detection image of the other surface of the material to be detected shows a higher waveform at the same position, it is determined that there is a bonding surface defect.

10. The detection method according to claim 8, characterized in that: Before step A1, an anti-interference test and a withstand voltage test are also performed. If both the anti-interference test and the withstand voltage test are passed, step A1 is performed, otherwise the process ends. The anti-interference test is to detect the reliability of data transmission of equipment under the condition of simulating the maximum interference of substation. If the bit error rate does not exceed 1% and the data transmission does not freeze more than 3 times within 2 hours, the anti-interference test is passed, otherwise it is failed; The voltage withstand test is to apply a voltage of 35Kv across the two ends of the detection device. If the detection device is not broken down or flashed over within 2 hours, and all parts in the detection device can operate normally, the voltage withstand test is passed, otherwise it is failed.

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